JPH0256945A - Electronic parts mounting device - Google Patents

Electronic parts mounting device

Info

Publication number
JPH0256945A
JPH0256945A JP63207647A JP20764788A JPH0256945A JP H0256945 A JPH0256945 A JP H0256945A JP 63207647 A JP63207647 A JP 63207647A JP 20764788 A JP20764788 A JP 20764788A JP H0256945 A JPH0256945 A JP H0256945A
Authority
JP
Japan
Prior art keywords
flip chip
chip
board
substrate
transfer head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63207647A
Other languages
Japanese (ja)
Other versions
JP2725701B2 (en
Inventor
Manabu Goto
学 後藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP63207647A priority Critical patent/JP2725701B2/en
Publication of JPH0256945A publication Critical patent/JPH0256945A/en
Application granted granted Critical
Publication of JP2725701B2 publication Critical patent/JP2725701B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Supply And Installment Of Electrical Components (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To precisely perform mounting on a board by reversing the inside and outside of a flip chip equipped to a chip supply part and mounting the flip chip on the board after a detected position discrepancy is corrected by a visual inspection device. CONSTITUTION:XY directional moving devices 8, 9 are driven to move a camera 17 upward of a board 4 and a position discrepancy of a printed is detected, pattern. When an suction part 27 of an edge part of an arm 26 approaches a wafer 5, a pin 7a projects to push up a flip chip F, the flip chip F is taken up by the suction part 27, and the inside and outside of the flip chip F is reversed by the arm 26 to take up. Next, a transfer head 6 is moved to a visual inspection device 21 to observe a position discrepancy of a previously detected xytheta-direction of the flip chip F and XY directional moving devices 8, 9 and a theta directional driving device 18 are controlled so that the xytheta-directional position discrepancy of a printed pattern of the board 4 can be corrected. Thereby mounting can precisely be performed on the board 4.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は電子部品実装装置に係り、フリップチップを表
裏反転させ、その位置ずれを補正したうえで、基板に移
送搭載するようにしたものである。
[Detailed Description of the Invention] (Industrial Application Field) The present invention relates to an electronic component mounting apparatus, in which a flip chip is turned upside down, its positional deviation is corrected, and then the flip chip is transferred and mounted on a board. be.

(従来の技術) 電子部品の一種として、ダイに半田などによりバンプ(
突出電極)を突設したフリップチップが知られている。
(Conventional technology) As a type of electronic component, bumps (
Flip chips with protruding electrodes are known.

第4図はこの種フリップチップを基板に実装する従来手
段を示すものであって、ウェハー101の下面に、フリ
ップチップ102がバンプ103の形成面を表面にして
装備されており、作業者が突き棒104を手に保持し、
顕微鏡105により作業点を視認しながら、ピン106
でチップ102を下方に突き落して基板107に実装す
る。
FIG. 4 shows a conventional means for mounting this type of flip chip on a substrate, in which a flip chip 102 is mounted on the bottom surface of a wafer 101 with the surface on which bumps 103 are formed facing up, and an operator can push it. Hold the stick 104 in your hand,
While visually checking the work point with the microscope 105, press the pin 106.
The chip 102 is pushed down and mounted on the substrate 107.

(発明が解決しようとする課題) しかしながら上記従来手段は手作業であるため、実装能
率や実装精度があがらない問題があった。
(Problems to be Solved by the Invention) However, since the above-mentioned conventional means is performed manually, there is a problem that mounting efficiency and mounting accuracy cannot be improved.

したがって本発明は、ウェハーなどにバンプ形成面を表
面にして装備されたフリップチップを、基板に精度よく
自動実装できる装置を提供することを目的とする。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide an apparatus that can automatically and accurately mount a flip chip mounted on a wafer or the like with the bump formation surface facing up onto a substrate.

(課題を解決するための手段) このために本発明は、フリップチップをバンプ形成面を
表面にして装備するチップ供給部と、このフリップチッ
プをティクアップして表裏反転させる表裏反転装置と、
表裏反転されたフリップチップのバンプ非形成面に吸着
し、これをティクアップして基板に移送搭載する移送ヘ
ッドと、表裏反転装置からこの基板への移送路の途中に
あって、フリップチップの位置ずれを観察する外観検査
装置と、この観察結果に基いて、位置ずれ補正装置を制
御する制御装置とから電子部品実装装置を構成している
(Means for Solving the Problems) To this end, the present invention provides a chip supply section equipped with a flip chip with the bump forming surface facing up, a front-back reversing device for ticking up the flip chip and reversing the flip chip,
There is a transfer head that adsorbs the non-bump-formed surface of the flipped flip chip, picks it up, and transfers and mounts it on the board. An electronic component mounting apparatus is composed of an appearance inspection device that observes deviations and a control device that controls a positional deviation correction device based on the observation results.

(作用) 上記構成において、表裏反転装置が、ウェハーなどのチ
ップ供給部に装備されたフリップチップをティクアップ
して表裏反転させる。次に移送ヘッドが表裏反転された
このフリップチップに接近し、バンプ非形成面に吸着し
てこれをティクアップし、外観検査装置へ移送し、ここ
でフリップチップの位置ずれを検出する。次に位置ずれ
補正装置を駆動してこの位置ずれを補正したうえで、フ
リップチップを基板に搭載する。
(Function) In the above configuration, the front-back reversing device ticks up a flip chip installed in a chip supply unit such as a wafer and reverses the flip chip. Next, a transfer head approaches this flipped chip, ticks it up by adsorbing it to the non-bump-formed surface, and transfers it to a visual inspection device, where a positional shift of the flip chip is detected. Next, the positional deviation correction device is driven to correct this positional deviation, and then the flip chip is mounted on the substrate.

(実施例) 次に、図面を参照しながら本発明の詳細な説明する。(Example) Next, the present invention will be described in detail with reference to the drawings.

第1図は電子部品実装装置を示すものであって、1はテ
ーブル、2はテーブル上に設置された本体ボックスであ
る。3は無端チェノから成る基板4の搬送路であって、
電子部品を実装する基板4をテーブル上に搬入し、また
ここから搬出する。14は搬送路3に設けられた基板4
の位置決め部であって、クランプ板から成っている。5
はコンベヤ3の前方の台部13に配置されたチップ供給
部としてのウェハーであって、その上面にはフリップチ
ップが多数装備されている。6は移送ヘッドであって、
フリップチップを吸着するノズル6aが突出している。
FIG. 1 shows an electronic component mounting apparatus, where 1 is a table and 2 is a main body box placed on the table. 3 is a conveyance path for a board 4 consisting of an endless chain;
A board 4 on which electronic components are mounted is carried onto a table and taken out from there. 14 is a substrate 4 provided on the conveyance path 3
The positioning part consists of a clamp plate. 5
is a wafer serving as a chip supply unit placed on a platform 13 in front of the conveyor 3, and a large number of flip chips are mounted on the upper surface of the wafer. 6 is a transfer head,
A nozzle 6a protrudes to attract the flip chip.

8゜9は移送ヘッド6をXY力方向移動させるためのX
Y方向移動装置、10.11はその駆動用モータである
。18は移送ヘッド6に装備されたθ方向駆動装置であ
って、モータ18aとベルl−18bから成っており、
ノズル6aをその軸心を中心にθ方向に回転させる。1
7は移送ヘッド6に一体的に装備されたカメラであり、
移送ヘッド6と一体的に移動して、基板4の印刷パター
ン゛の位置ずれなどを観察する。7はウェハー5の下方
に配設されたダイエジェクタ、7aはそのビンであって
、このピン7aにより、ウェハー5上のフリップチップ
を突き上げる。
8°9 is an X point for moving the transfer head 6 in the XY force direction.
The Y direction moving device, 10.11 is its driving motor. 18 is a θ direction drive device installed in the transfer head 6, and is composed of a motor 18a and a bell l-18b.
The nozzle 6a is rotated in the θ direction around its axis. 1
7 is a camera integrally equipped with the transfer head 6;
It moves together with the transfer head 6 to observe the positional deviation of the printed pattern on the substrate 4. Reference numeral 7 denotes a die ejector disposed below the wafer 5, and 7a denotes a bottle thereof. The flip chip on the wafer 5 is pushed up by this pin 7a.

20はウェハー5の側方にあって、フリップチップの表
裏反転装置が収納されたボックス、21は外観検査装置
であり、次に第2図を参照しながら、これらを詳細に説
明する。
Reference numeral 20 is a box located on the side of the wafer 5 in which a flip-chip reversing device is housed, and 21 is an appearance inspection device.Next, these will be described in detail with reference to FIG.

22は上記ボックス20の内部に配設された表裏反転装
置であって、23は扇形のギヤ、24はこのギヤ23に
噛み合い、これに沿って回動するギヤ、25は回動杆で
ある。26はギヤ24から延出するアームであって、そ
の先端部に吸着部27が装着されている。Fはウェハー
5上に装備されたフリップチップ、Bはそのバンプであ
って、フリップチップFはバンプ形成面を表面にしてウ
ェハー5上に並設されている。
Reference numeral 22 denotes a front-back reversing device disposed inside the box 20, 23 a fan-shaped gear, 24 a gear that meshes with and rotates along this gear 23, and 25 a rotation rod. Reference numeral 26 denotes an arm extending from the gear 24, and a suction section 27 is attached to the tip end of the arm. F is a flip chip mounted on the wafer 5, B is a bump thereof, and the flip chips F are arranged in parallel on the wafer 5 with the bump forming surface facing up.

上記移送ヘッド6のノズル6aは、この表裏反転装置2
2により表裏反転されたフリップチップFに接近し、バ
ンプ非形成面に吸着してティクアップする。
The nozzle 6a of the transfer head 6 is connected to this front-back reversing device 2.
2, it approaches the flip chip F which has been turned upside down, sticks to the bump-free surface, and ticks up.

上記外観検査装置21は、カメラ21aと接眼部21b
と光源部21cから成っている。フリップチップFをテ
ィクアップした移送ヘッド6は、XY方向移動装置8.
9に駆動されて接眼部21b上に移動してそこで一旦停
止し、フリップチップFを下方から観察してそのxyθ
方向の位置ずれを検出する。30はコンピュータのよう
な制御装置であって、カメラ17,21aに接続されて
おり、その観察結果に基いて、フリップチップFの位置
ずれ補正装置としての上記各モータ10,11.18a
を制御する。
The appearance inspection device 21 includes a camera 21a and an eyepiece 21b.
and a light source section 21c. The transfer head 6 that has picked up the flip chip F is transferred to an XY direction moving device 8.
9, moves onto the eyepiece section 21b, stops there, observes the flip chip F from below, and determines its xyθ.
Detect positional deviation in the direction. Reference numeral 30 denotes a control device such as a computer, which is connected to the cameras 17 and 21a, and based on the observation results, controls the respective motors 10 and 11.18a as a positional deviation correction device for the flip chip F.
control.

本装置は上記のような構成より成り、次に動作を説明す
る。
This device has the above-mentioned configuration, and its operation will be explained next.

まずXY方向移動装置8.9を駆動して、カメラ17を
位置決め部14に位置決めされた基板4の上方に移動さ
せ、基板4に印刷された印刷パターンの位置ずれを検出
しておく。さて、第2図において、モータMの駆動によ
りアーム26が時計方向に回動して、その先端部の吸着
部27がウェハー5に接近すると、下方のグイニジエフ
タフのピン7aが突出してウェハー5上のフリップチッ
プFを突き上げ、吸着部27はバンプ形成面に吸着して
このフリップチップFをティクアップする(図中符号■
)。次にアーム26は反時計方向に回動し、フリップチ
ップFを表裏反転する(符号■)。そこで移送ヘッド6
のノズル6aがこれに接近し、このフリップチップFを
ティクアップする(符号■)。
First, the XY direction moving device 8.9 is driven to move the camera 17 above the substrate 4 positioned by the positioning section 14, and the positional shift of the print pattern printed on the substrate 4 is detected. Now, in FIG. 2, when the arm 26 is rotated clockwise by the drive of the motor M and the suction part 27 at the tip approaches the wafer 5, the pin 7a of the lower Guinigieftuff protrudes and is placed on the wafer 5. The flip chip F is pushed up, and the suction unit 27 attracts the bump forming surface to tick up the flip chip F (indicated by the symbol ■ in the figure).
). Next, the arm 26 rotates counterclockwise to turn the flip chip F upside down (symbol ■). Then the transfer head 6
The nozzle 6a approaches this and ticks up this flip chip F (symbol ■).

この場合、上記のようにしてフリップチップFは表裏反
転しているので、バンプ形成面を下側にしてノズル6a
に吸着される。
In this case, since the flip chip F is turned over as described above, the nozzle 6a is inserted with the bump forming surface facing downward.
is adsorbed to.

次に移送ヘッド6は外観検査装置21へ移動して接眼部
21bの上方で一旦停止し、その状態でノズル6aに吸
着されたフリップチップFのxyθ方向の位置ずれが観
察される(符号■。
Next, the transfer head 6 moves to the visual inspection device 21 and temporarily stops above the eyepiece 21b, and in this state, the positional shift in the xyθ directions of the flip chip F adsorbed by the nozzle 6a is observed (symbol ■ .

■)。次に移送ヘッド6は位置決め部14に位置決めさ
れた基板4上に移動し、フリップチップFをこの基板4
に実装する(符号■)。この場合、上記のように外観検
査装置21により検出されたxyθ方向の位置ずれ、及
び上記カメラ17により予め検出された基板4の印刷パ
ターンのxyθ方向の位置ずれを補正するよう、XY方
向移動装置8,9やθ方向駆動装置18のモータ10,
11,18aを制御して、フリップチップ6を基板4上
に実装する。このように本手段によれば、ウェハー5に
バンプ形成面を表面にして装備されたフリップチップF
を表裏反転させて位置補正を行ったうえで、精度よ(基
板4に実装することができる。なおフリップチップFは
、第3図に示すようにトレイ28に装備されたものでも
よい。
■). Next, the transfer head 6 moves onto the substrate 4 positioned by the positioning section 14, and transfers the flip chip F onto the substrate 4.
(symbol ■). In this case, the XY direction moving device is configured to correct the positional deviation in the xyθ directions detected by the appearance inspection device 21 as described above and the positional deviation in the xyθ directions of the printed pattern of the substrate 4 detected in advance by the camera 17. 8, 9 and the motor 10 of the θ direction drive device 18,
11 and 18a to mount the flip chip 6 on the substrate 4. As described above, according to the present means, the flip chip F mounted on the wafer 5 with the bump forming surface facing up
After correcting the position by reversing the front and back sides of the flip chip F, the flip chip F can be mounted on the substrate 4 with high accuracy.The flip chip F may be mounted on a tray 28 as shown in FIG.

(発明の効果) 以上説明したように本発明は、フリップチップをバンプ
形成面を表面にして装備するチップ供給部と、このフリ
ップチップをティクアップして表裏反転させる表裏反転
装置と、表裏反転されたフリップチップのバンプ非形成
面に吸着し、これをティクアップして基板に移送搭載す
る移送ヘッドと、上記表裏反転装置からこの基板への移
送路の途中にあって、フリップチップの位置ずれを観察
する外観検査装置と、この観察結果に基いて、位置ずれ
補正装置を制御する制御装置とから電子部品実装装置を
構成しているので、バンプ形成面を表面にしてチップ供
給部に装備されたフリップチップを、表裏反転させて精
度よ(基板に実装することができる。
(Effects of the Invention) As described above, the present invention includes a chip supply unit that is equipped with a flip chip with the bump forming surface facing up, a front-back reversing device that picks up the flip chip and flips it inside out, and a flip-chip that is turned upside down. There is a transfer head that adsorbs the non-bumped surface of the flip chip, picks it up, and transfers and mounts it on the substrate, and a transfer head that is located in the middle of the transfer path from the above-mentioned flipping device to the substrate to prevent misalignment of the flip chip. The electronic component mounting equipment consists of an external appearance inspection device that performs observation and a control device that controls the misalignment correction device based on the observation results. Flip chips can be mounted on a board with high accuracy by flipping them upside down.

【図面の簡単な説明】[Brief explanation of the drawing]

図は本発明の実施例を示すものであって、第1図は電子
部品実装装置の全体斜視図、第2図は作業状態を示す展
開図、第3図はチップ供給部の他の実施例の側面図、第
4図は従来手段の側面図である。 4・・・基板 5.28・・・チップ供給部 6・・・移送ヘッド 10.11.18a・・・位置ずれ補正装置21・・・
外観検査装置 22・・・表裏反転装置 30・・・制御装置 B・・・ハ゛ンプ F・・・フリップチップ
The drawings show an embodiment of the present invention, in which Fig. 1 is an overall perspective view of an electronic component mounting apparatus, Fig. 2 is a developed view showing a working state, and Fig. 3 is another embodiment of a chip supply section. FIG. 4 is a side view of a conventional means. 4... Substrate 5.28... Chip supply unit 6... Transfer head 10.11.18a... Positional deviation correction device 21...
Appearance inspection device 22...Front/back reversing device 30...Control device B...Hump F...Flip chip

Claims (1)

【特許請求の範囲】[Claims]  フリツプチップをバンプ形成面を表面にして装備する
チップ供給部と、このフリップチップをテイクアップし
て表裏反転させる表裏反転装置と、表裏反転されたフリ
ツプチツプのバンプ非形成面に吸着し、これをテイクア
ップして基板に移送搭載する移送ヘッドと、上記表裏反
転装置からこの基板への移送路の途中にあって、フリッ
プチップの位置ずれを観察する外観検査装置と、この観
察結果に基いて、位置ずれ補正装置を制御する制御装置
とから成ることを特徴とする電子部品実装装置。
A chip supply unit that equips a flip chip with the bump forming side facing up; a flipping device that takes up the flip chip and flips it inside out; and a flip chip that attracts the flipped chip to the non-bumped side and takes it up. A transfer head that transfers and mounts the flip chip onto the substrate, an appearance inspection device that is located on the transfer path from the above-mentioned flipping device to the substrate, and that observes the positional deviation of the flip chip; An electronic component mounting apparatus comprising: a control device that controls a correction device;
JP63207647A 1988-08-22 1988-08-22 Electronic component mounting equipment Expired - Lifetime JP2725701B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63207647A JP2725701B2 (en) 1988-08-22 1988-08-22 Electronic component mounting equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63207647A JP2725701B2 (en) 1988-08-22 1988-08-22 Electronic component mounting equipment

Publications (2)

Publication Number Publication Date
JPH0256945A true JPH0256945A (en) 1990-02-26
JP2725701B2 JP2725701B2 (en) 1998-03-11

Family

ID=16543242

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63207647A Expired - Lifetime JP2725701B2 (en) 1988-08-22 1988-08-22 Electronic component mounting equipment

Country Status (1)

Country Link
JP (1) JP2725701B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000069241A1 (en) * 1999-05-06 2000-11-16 Matsushita Electric Industrial Co., Ltd. Component mounting apparatus and method therefor
KR100370844B1 (en) * 1998-08-31 2003-07-07 앰코 테크놀로지 코리아 주식회사 Marking method for manufacturing semiconductor package
WO2006011563A1 (en) * 2004-07-30 2006-02-02 Hitachi, Ltd. Method of mounting semiconductor device
US7007377B2 (en) 2003-02-25 2006-03-07 Matsushita Electric Industrial Co., Ltd. Electronic component placement method
CN111739834A (en) * 2020-04-30 2020-10-02 甬矽电子(宁波)股份有限公司 Flip chip device, system and method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2079574B1 (en) * 2006-10-31 2017-03-08 Modilis Holdings LLC Method and arrangement for manufacturing optical products with complex three-dimensional forms

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Publication number Priority date Publication date Assignee Title
JPS5824016A (en) * 1981-08-06 1983-02-12 Sumitomo Bakelite Co Ltd Method and metal fittings for connecting nets for civil work
JPS59186334A (en) * 1983-04-07 1984-10-23 Matsushita Electric Ind Co Ltd Bonding apparatus
JPS6224635A (en) * 1985-07-24 1987-02-02 Matsushita Electric Ind Co Ltd Flip chip bonder

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5824016A (en) * 1981-08-06 1983-02-12 Sumitomo Bakelite Co Ltd Method and metal fittings for connecting nets for civil work
JPS59186334A (en) * 1983-04-07 1984-10-23 Matsushita Electric Ind Co Ltd Bonding apparatus
JPS6224635A (en) * 1985-07-24 1987-02-02 Matsushita Electric Ind Co Ltd Flip chip bonder

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100370844B1 (en) * 1998-08-31 2003-07-07 앰코 테크놀로지 코리아 주식회사 Marking method for manufacturing semiconductor package
WO2000069241A1 (en) * 1999-05-06 2000-11-16 Matsushita Electric Industrial Co., Ltd. Component mounting apparatus and method therefor
US6839959B1 (en) 1999-05-06 2005-01-11 Matsushita Electric Industrial Co., Ltd. Component mounting apparatus
US7007377B2 (en) 2003-02-25 2006-03-07 Matsushita Electric Industrial Co., Ltd. Electronic component placement method
US7191511B2 (en) 2003-02-25 2007-03-20 Matsushita Electric Industrial Co., Ltd. Electronic component placement machine having camera units with vertically overlaid apertures
WO2006011563A1 (en) * 2004-07-30 2006-02-02 Hitachi, Ltd. Method of mounting semiconductor device
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