JPH0260226B2 - - Google Patents
Info
- Publication number
- JPH0260226B2 JPH0260226B2 JP61149267A JP14926786A JPH0260226B2 JP H0260226 B2 JPH0260226 B2 JP H0260226B2 JP 61149267 A JP61149267 A JP 61149267A JP 14926786 A JP14926786 A JP 14926786A JP H0260226 B2 JPH0260226 B2 JP H0260226B2
- Authority
- JP
- Japan
- Prior art keywords
- crystal growth
- substrate
- melt
- melt material
- holding jig
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Electroluminescent Light Sources (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】
〔概要〕
本発明はHg1-xCdxTe等からなる化合物半導体
結晶層を液相エピタキシヤル結晶成長により形成
するための基板保持治具であつて、所定長さの円
柱の外周部中央の一部を該円柱の中心方向に切り
欠いた切り欠き凹部内に具備した被結晶成長用基
板を横架する形に保持し、外周部にメルト表面膜
除去用のメルト流出孔を有するメルト材料収容部
材を設けた構成とし、該メルト材料収容部材内に
て溶融した結晶成長用メルト材料をメルト流出孔
より、そのメルト材料表面結晶された酸化膜等か
らなる表面膜を残して被結晶成長用基板面へ流出
させるようにして、メルト表面膜の被着に起因す
る結晶欠陥の発生を防止するようにしたものであ
る。[Detailed Description of the Invention] [Summary] The present invention is a substrate holding jig for forming a compound semiconductor crystal layer composed of Hg 1-x Cd x Te etc. by liquid phase epitaxial crystal growth. A part of the center of the outer periphery of the cylinder is cut out in the direction of the center of the cylinder, and a substrate for crystal growth is held horizontally in a notched recess, and a melt for removing the melt surface film is placed on the outer periphery. The structure includes a melt material storage member having an outflow hole, and the melt material for crystal growth melted in the melt material storage member is passed through the melt outflow hole to form a surface film consisting of an oxide film or the like crystallized on the surface of the melt material. This is to prevent the occurrence of crystal defects due to adhesion of the melt surface film by leaving the melt remaining and flowing out onto the surface of the substrate for crystal growth.
本発明は液相エピタキシヤル結晶成長用基板保
持治具の改良に係り、特に易蒸発性の成分元素を
含む化合物半導体結晶の液相エピタキシヤル成長
に好適な基板保持治具に関するものである。
The present invention relates to improvements in a substrate holding jig for liquid phase epitaxial crystal growth, and particularly to a substrate holding jig suitable for liquid phase epitaxial growth of compound semiconductor crystals containing easily evaporable component elements.
液相エピタキシヤル結晶成長は一般に複数の組
成元素からなる半導体結晶、例えば砒化ガリウム
(GaAs)、ガリウム・アルミニウム・砒素
(GaAlAs)等の化合物半導体結晶を構成材料と
して発光素子、レーザ素子、或いは受光素子等を
形成するのに用いられている。また近年において
は鉛・錫・テルル(Pb1-xSnxTe)や易蒸発性の
Hgからなる成分元素を含むエネルギーギヤツプ
の狭い水銀・カドミウム・テルル(Hg1-xCdx
Te)等の化合物半導体結晶を構成材料として、
赤外線検知素子や赤外半導体レーザ素子などの光
電変換素子を形成するのに用いられていることが
周知である。 Liquid phase epitaxial crystal growth is generally used to grow light-emitting devices, laser devices, or light-receiving devices using semiconductor crystals made of multiple elements, such as compound semiconductor crystals such as gallium arsenide (GaAs) and gallium-aluminum-arsenic (GaAlAs). It is used to form etc. In addition, in recent years, lead, tin, tellurium (Pb 1-x Sn x Te) and easily evaporable
Mercury, cadmium, tellurium (Hg 1-x Cd x
Using compound semiconductor crystals such as Te) as constituent materials,
It is well known that it is used to form photoelectric conversion elements such as infrared detection elements and infrared semiconductor laser elements.
特に易蒸発性のHgからなる成分元素を含む水
銀・カドミウム・テルル(Hg1-xCdxTe)等の化
合物半導体結晶を液相エピタキシヤル成長により
形成する方法としては、本発明者等により既に提
案されている密閉回転式の液相エピタキシヤル結
晶成長法が用いられている。 In particular, the present inventors have already described a method for forming compound semiconductor crystals of mercury, cadmium, tellurium (Hg 1-x Cd x Te), etc., containing a component element consisting of easily evaporable Hg, by liquid phase epitaxial growth. A proposed closed rotation liquid phase epitaxial crystal growth method is used.
これらの液相エピタキシヤル結晶成長において
は、一枚の結晶基板から数多くの素子形成が得ら
れるように大型の被結晶基板に均一な組成比の結
晶層を形成することは勿論のこと、結晶欠陥のな
い結晶層を容易に形成し得ることが要求される。 In these liquid phase epitaxial crystal growth processes, it is necessary to form a crystal layer with a uniform composition ratio on a large crystal substrate so that a large number of devices can be formed from a single crystal substrate, and also to eliminate crystal defects. It is required to be able to easily form a crystal layer free of crystals.
このため、結晶欠陥の発生原因の一要因として
溶融した結晶成長用メルト材料の表面に形成され
る酸化膜等の表面膜の基板表面への付着を防止し
て、欠陥のない結晶層を容易に形成し得る液相エ
ピタキシヤル結晶成長用の基板保持治具が必要と
されている。 For this reason, it is possible to prevent surface films such as oxide films that are formed on the surface of the melt material for crystal growth, which is one of the causes of crystal defects, from adhering to the substrate surface, and to easily form a defect-free crystal layer. There is a need for a substrate holding jig for liquid phase epitaxial crystal growth that can be formed.
従来の密閉回転式の液相エピタキシヤル結晶成
長法に用いられている治具、即ち基板保持治具は
第3図に示すように、後述する石英アンプル内に
内接する外径と所定長さの、例えば石英ガラス、
或いはカーボン材からなる円柱1の外周部中央の
一部を該円柱1の中心軸A方向に切り欠いた切り
欠き凹部2を有し、該切り欠き凹部2内の対向壁
面間に被結晶成長用基板3を水平に横架する形に
保持する構成からなつている。
As shown in Figure 3, the jig used in the conventional closed rotation type liquid phase epitaxial crystal growth method, that is, the substrate holding jig, has an outer diameter and a predetermined length inscribed in a quartz ampoule, which will be described later. , e.g. quartz glass,
Alternatively, a notch recess 2 is formed by cutting out a part of the center of the outer circumference of a cylinder 1 made of a carbon material in the direction of the central axis A of the cylinder 1, and a part for crystal growth is provided between opposing wall surfaces in the notch recess 2. The structure is such that the substrate 3 is held horizontally.
そして液相エピタキシヤル結晶成長に際して
は、図示のように当該治具11の切り欠き凹部2
内に、例えばCdTeからなる被結晶成長用基板3
を水平に架け渡した形に保持し、この基板保持治
具11と、予め所定組成比に秤量されたHg1-x
CdxTeからなる結晶成長用メルト材料5とを共に
石英アンプル4内に挿設し、内部を排気した状態
で該基板保持治具11が内部で動かないように気
密に封止する。 During liquid phase epitaxial crystal growth, the notched recess 2 of the jig 11 is used as shown in the figure.
A substrate 3 for crystal growth made of CdTe, for example, is provided inside.
This substrate holding jig 11 and Hg 1-x weighed in advance to a predetermined composition ratio are held in a horizontally extending manner.
A crystal growth melt material 5 made of Cd x Te is inserted into a quartz ampoule 4, and the substrate holding jig 11 is hermetically sealed so that it does not move inside while the inside is evacuated.
しかる後、前記石英アンプル4を図示しないエ
ピタキシヤル結晶成長炉内に配置し、結晶成長温
度よりも高い所定温度に加熱して該石英アンプル
4内の結晶成長用メルト材料5を溶融し、前記石
英アンプル4を180度回転して、前記基板3面に
溶融した結晶成長用メルト材料5を接触させると
共に、加熱温度を所定結晶成長温度に低下させて
該基板3上にHg1-xCdxTeからなる結晶層を成長
させている。 Thereafter, the quartz ampule 4 is placed in an epitaxial crystal growth furnace (not shown) and heated to a predetermined temperature higher than the crystal growth temperature to melt the crystal growth melt material 5 in the quartz ampule 4, and the quartz The ampoule 4 is rotated 180 degrees to bring the molten crystal growth melt material 5 into contact with the surface of the substrate 3, and the heating temperature is lowered to a predetermined crystal growth temperature to deposit Hg 1-x Cd x Te on the substrate 3. A crystal layer consisting of is grown.
また、所定の厚さの結晶層が形成された時点で
該石英アンプル4を再び180度反転して、元の状
態に戻すことにより該基板3上の前記メルト材料
5を除去して結晶成長を停止させ、その後、冷却
された石英アンプル4を成長炉内より引き出して
開封し、該治具11よりHg1-xCdxTeからなる結
晶層が形成された基板3を取り出している。 Further, when a crystal layer of a predetermined thickness is formed, the quartz ampoule 4 is turned over again by 180 degrees to return to its original state, thereby removing the melt material 5 on the substrate 3 and allowing the crystal growth to proceed. After stopping, the cooled quartz ampoule 4 is pulled out from inside the growth furnace and unsealed, and the substrate 3 on which the crystal layer made of Hg 1-x Cd x Te is formed is taken out from the jig 11.
ところで、このような従来の基板保持治具11
を用いて被結晶成長用基板3表面に液相エピタキ
シヤル結晶成長を行う方法においては、該基板3
を保持した基板保持治具11と共に、前記結晶成
長用メルト材料5を封入した石英アンプル4を
180度回転して、前記基板3面に溶融した結晶成
長用メルト材料5を接触させる際に、該メルト材
料5の表面に形成された酸化膜等からなる表面膜
が該基板表面に付着し、これに起因して形成され
るエピタキシヤル結晶層に欠陥が発生するといつ
た欠点があつた。
By the way, such a conventional substrate holding jig 11
In the method of performing liquid phase epitaxial crystal growth on the surface of the substrate 3 for crystal growth using
A quartz ampoule 4 filled with the crystal growth melt material 5 is placed together with the substrate holding jig 11 holding the crystal growth melt material 5.
When rotating 180 degrees and bringing the molten crystal growth melt material 5 into contact with the surface of the substrate 3, a surface film formed on the surface of the melt material 5, such as an oxide film, adheres to the surface of the substrate, Due to this, there was a drawback that defects occurred in the epitaxial crystal layer formed.
このような欠陥の発生は該結晶層内は言うに及
ばず、その表面にも異常成長突起やピツトが発生
し、素子形成に用いることが出来ない。 The occurrence of such defects not only occurs within the crystal layer, but also abnormal growth protrusions and pits occur on its surface, making it impossible to use it for device formation.
本発明は上記のような従来の欠点を解消するた
め、結晶成長用基板を保持する治具自身に、溶融
した結晶成長用メルト材料の表面に形成される酸
化膜等からなる表面膜を除去する手段を設け、メ
ルト材料に形成される表面膜の基板表面への付着
に起因する成長結晶層の結晶欠陥の発生を防止し
た新規な液相エピタキシヤル結晶成長用基板保持
治具を提供することを目的とするものである。 In order to eliminate the above-mentioned conventional drawbacks, the present invention removes a surface film such as an oxide film formed on the surface of the melt material for crystal growth on the jig itself that holds the substrate for crystal growth. An object of the present invention is to provide a novel substrate holding jig for liquid phase epitaxial crystal growth, which prevents the occurrence of crystal defects in a growing crystal layer due to adhesion of a surface film formed on a melt material to the substrate surface. This is the purpose.
本発明は上記目的を達成するため、所定長さの
円柱の外周部中央の一部を該円柱の中心方向に切
り欠いた切り欠き凹部内に、被結晶成長用基板を
横架する形に保持すると共に、これと平行して外
周部にメルト表面膜除去用のメルト流出孔を設け
たメルト材料収容部材を配備した治具構成とす
る。
In order to achieve the above object, the present invention holds a substrate for crystal growth horizontally in a notched recess formed by cutting out a part of the center of the outer periphery of a cylinder of a predetermined length in the direction of the center of the cylinder. At the same time, the jig has a structure in which a melt material storage member having a melt outflow hole for removing a melt surface film is provided in the outer peripheral portion in parallel therewith.
本発明の液相エピタキシヤル結晶成長用の基板
保持治具は、その切り欠き凹部内に設けられた被
結晶成長用基板を横架する形に保持すると共に、
これと平行して外周部にメルト表面膜除去用のメ
ルト流出孔を設けたメルト材料収容部材が配備さ
れているため、前記被結晶成長用基板を保持し、
メルト材料収容部材内に結晶成長用メルト材料を
収容した状態の当該治具を石英アンプル内に嵌
入・密封し、該石英アンプルを加熱して該メルト
材料を溶融すれば、溶融したメルト材料はメルト
流出孔より石英アンプル側に流出される。
The substrate holding jig for liquid phase epitaxial crystal growth of the present invention horizontally holds the substrate for crystal growth provided in the notch recess, and
In parallel with this, a melt material storage member having a melt outflow hole for removing the melt surface film on the outer periphery is provided, so that the substrate for crystal growth is held,
If the jig with the melt material for crystal growth stored in the melt material storage member is inserted into a quartz ampoule and sealed, and the quartz ampoule is heated to melt the melt material, the melted melt material will be melted. It flows out from the outflow hole to the quartz ampoule side.
この時、メルト材料表面に形成された酸化膜等
からなる表面膜は、該メルト流出孔にて堰き止め
られて流出が阻止される。 At this time, the surface film formed on the surface of the melt material, such as an oxide film, is dammed up by the melt outflow hole and prevented from flowing out.
従つて、この状態で前記石英アンプルを従来と
同様に180度回転すれば、前記基板面上に表面膜
が除去された結晶成長用メルト材料のみが接触さ
れ、該基板上に表面膜の付着に起因する結晶欠陥
の発生の無い極めて良好な成長結晶層を容易に形
成することが可能となる。 Therefore, if the quartz ampoule is rotated 180 degrees in this state as before, only the melt material for crystal growth from which the surface film has been removed will come into contact with the substrate surface, and the surface film will not adhere to the substrate surface. It becomes possible to easily form an extremely well-grown crystal layer without the occurrence of crystal defects.
以下図面を用いて本発明の実施例について詳細
に説明する。
Embodiments of the present invention will be described in detail below with reference to the drawings.
第1図は本発明に係る液相エピタキシヤル結晶
成長用の基板保持治具の一実施例を示す要部断面
図である。 FIG. 1 is a sectional view of a main part showing an embodiment of a substrate holding jig for liquid phase epitaxial crystal growth according to the present invention.
図において、22は石英アンプル内に内接する
所定長さの石英ガラス、或いはカーボン材などか
らなる所定長さの円柱の外周部中央の一部を該円
柱の中心方向に切り欠いた切り欠き凹部23を有
する治具本体であり、該切り欠き凹部23内には
被結晶成長用基板26を横架する形に保持し、こ
れと平行して外周部にメルト表面膜除去用のメル
ト流出孔25を設けた蒲鉾形のメルト材料収容部
材24が図示るような形に配設された治具構成と
なつている。 In the figure, reference numeral 22 denotes a notch recess 23 which is a part of the center of the outer circumference of a cylinder of a specified length made of quartz glass or carbon material inscribed in a quartz ampoule and cut out in the direction of the center of the cylinder. A substrate 26 for crystal growth is held horizontally in the cutout recess 23, and a melt outflow hole 25 for removing the melt surface film is provided in parallel to the outer periphery. The jig has a structure in which the provided semicylindrical melt material storage member 24 is arranged in the shape shown in the figure.
尚、前記円柱形状の治具本体22はブロツク
状、または中空状であつてもよい。 The cylindrical jig main body 22 may be block-shaped or hollow.
次に上記のような構成の本発明の基板保持治具
21の使用例を説明する。 Next, an example of use of the substrate holding jig 21 of the present invention having the above-described structure will be described.
先ず第2図に示すように前記基板保持治具21
の切り欠き凹部23内に、例えばCdTeからなる
被結晶成長用基板26を横架する形に保持する。 First, as shown in FIG. 2, the substrate holding jig 21 is
A crystal growth substrate 26 made of, for example, CdTe is held horizontally in the cutout recess 23 .
またメルト表面膜除去用のメルト流出孔25を
外周部に設けた蒲鉾形のメルト材料収容部材24
内には、予め所定組成比に秤量したHg1-xCdxTe
からなる結晶成長用メルト材料27を収容し、こ
のメルト材料収容部材24は前記切り欠き凹部2
3内に図示のように配設する。 Further, a semicylindrical melt material storage member 24 is provided with a melt outflow hole 25 on the outer periphery for removing the melt surface film.
Inside is Hg 1-x Cd x Te weighed in advance to a predetermined composition ratio.
The melt material accommodating member 24 accommodates a crystal growth melt material 27 consisting of the notch recess 2.
3 as shown in the figure.
しかる後、かかる基板保持治具21を石英アン
プル28内に挿設して内部を排気した後、該治具
21が内部で動かないように気密に封止する。 Thereafter, the substrate holding jig 21 is inserted into the quartz ampoule 28, the inside is evacuated, and the jig 21 is hermetically sealed so that it does not move inside.
次にこの石英アンプル28を図示しないエピタ
キシヤル結晶成長炉内に挿入し、結晶成長温度よ
りも若干高い所定温度に加熱して該石英アンプル
28内の結晶成長用メルト材料27を溶融させ
る。 Next, this quartz ampoule 28 is inserted into an epitaxial crystal growth furnace (not shown) and heated to a predetermined temperature slightly higher than the crystal growth temperature to melt the crystal growth melt material 27 within the quartz ampoule 28.
この際、メルト材料収容部材24内で溶融され
た結晶成長用メルト材料27は、メルト流出孔2
5より石英アンプル28側に流出され、この時メ
ルト材料27の表面に形成された酸化膜等からな
る表面膜は該メルト流出孔25にて堰き止められ
て流出が阻止される。 At this time, the crystal growth melt material 27 melted within the melt material storage member 24 is transferred to the melt outlet hole 2.
5 to the quartz ampoule 28 side, and at this time, the surface film formed on the surface of the melt material 27, such as an oxide film, is dammed up by the melt outflow hole 25, and the outflow is prevented.
その後、この状態の石英アンプル28を従来と
同様に180度回転して、前記基板26面にメルト
材料27を接触させると共に、加熱温度を所定結
晶成長温度に低下させて該基板26上にHg1-x
CdxTeからなる結晶層を成長させることにより、
該基板26上に表面膜付着に起因する結晶欠陥の
発生の無い良好な成長結晶層を容易に形成するこ
とが可能となる。 Thereafter, the quartz ampoule 28 in this state is rotated 180 degrees in the same manner as before to bring the melt material 27 into contact with the surface of the substrate 26, and the heating temperature is lowered to a predetermined crystal growth temperature to deposit Hg 1 on the substrate 26. -x
By growing a crystal layer consisting of Cd x Te,
It becomes possible to easily form a well-grown crystal layer on the substrate 26 without generating crystal defects due to surface film adhesion.
この時、酸化膜等からなる表面膜は流出が阻止
されてメルト材料収容部材24内に残留されてい
る。 At this time, the surface film made of an oxide film or the like is prevented from flowing out and remains in the melt material storage member 24.
結晶成長終了後は石英アンプル28を元の状態
に再び180度反転して基板26上のメルト材料2
7を除去して降温化し、その後成長炉内より石英
アンプル28を引出して開封し、基板保持治具2
1よりHg1-xCdxTeからなる結晶層が形成された
基板26を取り出す。 After the crystal growth is completed, the quartz ampoule 28 is turned 180 degrees to its original state and the melt material 2 on the substrate 26 is removed.
7 is removed and the temperature is lowered, and then the quartz ampoule 28 is pulled out from inside the growth furnace and unsealed, and the substrate holding jig 2 is removed.
A substrate 26 on which a crystal layer made of Hg 1-x Cd x Te is formed is taken out from No. 1 .
尚、以上の実施例ではメルト材料収容部材24
に設けられたメルト表面膜除去用のメルト流出孔
25は、一つの孔の場合について説明したが、複
数の孔、即ちメツシユ状の孔とすれば、メルト材
料27に生じる表面膜の除去効果はより大きくな
る。 In addition, in the above embodiment, the melt material storage member 24
The melt outflow hole 25 for removing the melt surface film provided in the melt material 27 has been described in the case of one hole, but if a plurality of holes, that is, a mesh-like hole is used, the removal effect of the surface film generated on the melt material 27 will be improved. Become bigger.
以上の説明から明らかなように、本発明に係る
液相エピタキシヤル結晶成長用の基板保持治具に
よれば、切り欠き凹部内に被結晶成長用基板と共
に配設したメルト材料収容部材により、被結晶成
長用基板の表面に接触させるべく溶融した結晶成
長用メルト材料の表面に形成された酸化膜等から
なる表面膜が除去され、該基板面に対して表面膜
のない清浄な結晶成長用メルト材料のみが成長に
供せられることから、表面膜の付着に起因する結
晶欠陥の発生の無い良好な成長結晶層を容易に形
成することが可能となる優れた利点を有する。
As is clear from the above description, according to the substrate holding jig for liquid phase epitaxial crystal growth according to the present invention, the melt material accommodating member disposed together with the substrate for crystal growth in the notch recess allows the substrate to be A surface film such as an oxide film formed on the surface of the crystal growth melt material that is melted to be in contact with the surface of the crystal growth substrate is removed, resulting in a clean crystal growth melt with no surface film on the substrate surface. Since only the material is subjected to growth, it has the excellent advantage that it is possible to easily form a well-grown crystal layer free from crystal defects caused by adhesion of surface films.
従つて、Hg1-xCdxTeからなる結晶層の液相エ
ピタキシヤル結晶成長に限らず、この種の化合物
半導体結晶層の液相エピタキシヤル結晶成長に適
用して極めて有利である。 Therefore, it is extremely advantageous to apply not only to liquid phase epitaxial crystal growth of a crystal layer made of Hg 1-x Cd x Te but also to liquid phase epitaxial crystal growth of this type of compound semiconductor crystal layer.
第1図は本発明に係る液相エピタキシヤル結晶
成長用の基板保持治具の一実施例を示す斜視図、
第2図は本発明に係る液相エピタキシヤル結晶成
長用基板保持治具の使用例を説明するための要部
断面図、第3図は従来の液相エピタキシヤル結晶
成長用の基板保持治具を説明するための要部断面
図である。
第1図乃至第2図において、21は基板保持治
具、22は治具本体、23は切り欠き凹部、24
はメルト材料収容部材、25はメルト流出孔、2
6は被結晶成長用基板、27はメルト材料、28
は石英アンプルをそれぞれ示す。
FIG. 1 is a perspective view showing an embodiment of a substrate holding jig for liquid phase epitaxial crystal growth according to the present invention;
FIG. 2 is a sectional view of a main part for explaining an example of use of the substrate holding jig for liquid phase epitaxial crystal growth according to the present invention, and FIG. 3 is a conventional substrate holding jig for liquid phase epitaxial crystal growth. FIG. 1 and 2, 21 is a substrate holding jig, 22 is a jig main body, 23 is a notch recess, and 24
2 is a melt material storage member, 25 is a melt outflow hole, and 2
6 is a substrate for crystal growth, 27 is a melt material, 28
indicates a quartz ampoule, respectively.
Claims (1)
の中心方向に切り欠いた切り欠き凹部23内に、
被結晶成長用基板26を横架する形に保持し、結
晶成長用メルト材料と共に、石英アンプル内に封
入する基板保持治具であつて、 上記切り欠き凹部23内に、前記基板26に連
通し、かつ外周部にメルト表面膜除去用のメルト
流出孔25を設けたメルト材料収容部材24を備
えてなることを特徴とする液相エピタキシヤル結
晶成長用基板保持治具。[Scope of Claims] 1. A part of the center of the outer circumference of a cylinder having a predetermined length is cut out in the direction of the center of the cylinder.
A substrate holding jig for holding a substrate 26 for crystal growth horizontally and sealing it in a quartz ampoule together with a melt material for crystal growth, the notch recess 23 communicating with the substrate 26. A substrate holding jig for liquid phase epitaxial crystal growth, comprising: a melt material storage member 24 having a melt outflow hole 25 for removing a melt surface film on the outer periphery thereof.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61149267A JPS634626A (en) | 1986-06-24 | 1986-06-24 | Substrate holding jig for liquid phase epitaxial crystal growth |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61149267A JPS634626A (en) | 1986-06-24 | 1986-06-24 | Substrate holding jig for liquid phase epitaxial crystal growth |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS634626A JPS634626A (en) | 1988-01-09 |
| JPH0260226B2 true JPH0260226B2 (en) | 1990-12-14 |
Family
ID=15471503
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61149267A Granted JPS634626A (en) | 1986-06-24 | 1986-06-24 | Substrate holding jig for liquid phase epitaxial crystal growth |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS634626A (en) |
-
1986
- 1986-06-24 JP JP61149267A patent/JPS634626A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS634626A (en) | 1988-01-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0260226B2 (en) | ||
| JPH0348431A (en) | Liquid epitaxial crystal deposition device | |
| JP4870859B2 (en) | Liquid phase epitaxial growth apparatus and growth method | |
| JPH0516222Y2 (en) | ||
| JPH0278233A (en) | Liquid-phase epitaxial growth method and device therefor | |
| JPH0352241A (en) | Liquid-phase epitaxy | |
| JPH02312248A (en) | Liquid phase epitaxial growth | |
| JPS634627A (en) | Jig for liquid phase epitaxial crystal growth | |
| JPH02123735A (en) | Liquid-phase epitaxy method | |
| JPH042689A (en) | Method for hetero-epitaxial liquid phase growth | |
| JP2574122B2 (en) | Compound semiconductor crystal growth method and crystal growth apparatus | |
| JPH0625955Y2 (en) | Liquid phase epitaxial growth system | |
| US4774904A (en) | Multiple-layer growth of plural semiconductor devices | |
| JPH0536732A (en) | Jig for growing liquid phase epitaxial crystal and method for manufacturing multi-element semiconductor crystal using the jig | |
| JPH0348432A (en) | Liquid epitaxial crystal deposition device | |
| JPS60218851A (en) | Manufacture of semiconductor device | |
| JPH027918B2 (en) | ||
| JPH0536731A (en) | Jig for growing liquid phase epitaxial crystal and method for manufacturing multi-element semiconductor crystal using the jig | |
| JPH02308521A (en) | Liquid-phase epitaxial crystal growth method | |
| JP2556159B2 (en) | Method for manufacturing semiconductor crystal | |
| JPH04187589A (en) | Jig for liquid-phase epitaxial crystal growth and production of multiple semiconductor crystal using the same jig | |
| JPH02143538A (en) | Liquid phase epitaxial growth device | |
| JPS62214627A (en) | Liquid phase epitaxial growth process | |
| JPH0247436B2 (en) | EKISOEPITAKISHARUSEICHOSOCHI | |
| JPS6350392A (en) | Epitaxy |