JPH0536731A - Jig for growing liquid phase epitaxial crystal and method for manufacturing multi-element semiconductor crystal using the jig - Google Patents
Jig for growing liquid phase epitaxial crystal and method for manufacturing multi-element semiconductor crystal using the jigInfo
- Publication number
- JPH0536731A JPH0536731A JP18772891A JP18772891A JPH0536731A JP H0536731 A JPH0536731 A JP H0536731A JP 18772891 A JP18772891 A JP 18772891A JP 18772891 A JP18772891 A JP 18772891A JP H0536731 A JPH0536731 A JP H0536731A
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- Japan
- Prior art keywords
- crystal growth
- jig
- quartz ampoule
- melt material
- crystal
- Prior art date
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- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は液相エピタキシャル結晶
成長用治具及び該治具を用いた多元半導体結晶の製造方
法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a jig for liquid phase epitaxial crystal growth and a method for producing a multi-element semiconductor crystal using the jig.
【0002】複数の組成元素からなる多元半導体結晶、
例えばガリウム・砒素、ガリウム・アルミニウム・砒素
等の化合物半導体結晶を結晶基板上に成長させる方法の
一つに、これらの半導体を溶質とした溶液を高温で結晶
基板に接触させた後、次第に温度を下げ半導体結晶を基
板上に析出成長させるようにした方法がある。A multi-element semiconductor crystal composed of a plurality of compositional elements,
For example, one of the methods for growing a compound semiconductor crystal of gallium / arsenic, gallium / aluminum / arsenic, etc. on a crystal substrate is to bring a solution of these semiconductors as a solute into contact with the crystal substrate at a high temperature and then gradually increase the temperature. There is a method in which a lowered semiconductor crystal is deposited and grown on a substrate.
【0003】この方法は一般に液相エピタキシャル結晶
成長法と称され、高純度で結晶性の良好な単結晶を成長
させる方法として、特に半導体工業の分野で広く採用さ
れている。また、近年においては、鉛・錫・テルルや易
蒸発性の成分元素を含む水銀・カドミウム・テルル等の
化合物半導体結晶を構成材料として、赤外線検知素子や
赤外線半導体レーザ素子等の光電変換素子を製造するの
に上記方法は用いられている。This method is generally called a liquid phase epitaxial crystal growth method, and is widely adopted as a method for growing a single crystal having high purity and good crystallinity, particularly in the field of semiconductor industry. In recent years, photoelectric conversion elements such as infrared detection elements and infrared semiconductor laser elements have been manufactured using compound semiconductor crystals such as lead, tin, tellurium, and mercury, cadmium, tellurium, etc. containing easily evaporative constituent elements as constituent materials. The above method has been used to do this.
【0004】特に易蒸発性の成分元素を含む多元半導体
結晶を液相エピタキシャル成長により製造する場合に
は、蒸発により溶液濃度が変化することを防止するため
に、石英アンプル等の密閉容器内で結晶成長させる必要
があり、その方法の最適化が模索されている。In particular, when a multi-element semiconductor crystal containing easily vaporizable component elements is manufactured by liquid phase epitaxial growth, in order to prevent the solution concentration from changing due to evaporation, crystal growth is performed in a closed container such as a quartz ampoule. And the optimization of the method is being sought.
【0005】[0005]
【従来の技術】図3により、液相エピタキシャル結晶成
長による従来の多元半導体結晶の製造方法の例を説明す
る。1は液相エピタキシャル結晶成長用治具であり、こ
の治具は、石英アンプル2内に内接する外径と所定長さ
の例えば石英ガラス或いはカーボン材からなる円柱の外
周部中央の一部を切り欠いた切り欠き凹部3を有し、こ
の切り欠き凹部3内の対向壁面に結晶成長用基板4を横
架する形に水平に保持する構成からなっている。2. Description of the Related Art An example of a conventional method for producing a multi-element semiconductor crystal by liquid phase epitaxial crystal growth will be described with reference to FIG. Reference numeral 1 is a liquid phase epitaxial crystal growth jig. This jig cuts a part of the center of the outer circumference of a cylinder made of, for example, quartz glass or carbon material and having an outer diameter inscribed in a quartz ampoule 2 and a predetermined length. It has a notched recessed portion 3 that is cut out, and is configured to horizontally hold the crystal growth substrate 4 horizontally across the opposing wall surfaces in the notched recessed portion 3.
【0006】そして液相エピタキシャル結晶成長に際し
ては、切り欠き凹部3内にCdTeからなる結晶成長用
基板4を水平に架け渡した形に保持し、この治具1と、
予め所定組成比に秤量されたHg,Cd,Teからなる
結晶成長用のメルト材料5とを図示のように石英アンプ
ル2内に配設し、アンプル内部を排気した後この石英ア
ンプルを気密に封止する。During the liquid phase epitaxial crystal growth, a crystal growth substrate 4 made of CdTe is held horizontally in the notched recess 3 and the jig 1 and
A melt material 5 for crystal growth composed of Hg, Cd, and Te, which has been weighed in a predetermined composition ratio in advance, is placed in a quartz ampoule 2 as shown in the figure, and the quartz ampoule is hermetically sealed after exhausting the inside of the ampoule. Stop.
【0007】しかる後、石英アンプル2を図示しない電
気炉内に配置し、結晶成長温度よりも高い所定温度に加
熱して石英アンプル2内のメルト材料5を溶融させ、石
英アンプル2を180°回転して、結晶成長用基板4の
表面に溶融したメルト材料を接触させるとともに、加熱
温度を所定結晶成長温度に低下させて結晶成長用基板4
上にHg1-x Cdx Teからなる単結晶層を成長させ
る。Thereafter, the quartz ampoule 2 is placed in an electric furnace (not shown) and heated to a predetermined temperature higher than the crystal growth temperature to melt the melt material 5 in the quartz ampoule 2 and rotate the quartz ampoule 2 by 180 °. Then, the melted melt material is brought into contact with the surface of the crystal growth substrate 4 and the heating temperature is lowered to a predetermined crystal growth temperature to thereby bring the crystal growth substrate 4 into contact.
A single crystal layer of Hg 1-x Cd x Te is grown on top.
【0008】次に、所定厚みの単結晶層が形成された時
点で石英アンプル2を再び180°回転することによ
り、結晶成長用基板4上のメルト材料を除去して結晶成
長を停止させ、その後炉内より石英アンプル2を徐冷し
ながら引出し、石英アンプル2を開封して、単結晶層が
形成された基板4を取り出している。Next, when the single crystal layer having a predetermined thickness is formed, the quartz ampoule 2 is rotated again by 180 ° to remove the melt material on the crystal growth substrate 4 and stop the crystal growth. The quartz ampoule 2 is pulled out from the furnace while being gradually cooled, the quartz ampoule 2 is opened, and the substrate 4 on which the single crystal layer is formed is taken out.
【0009】[0009]
【発明が解決しようとする課題】ところで、上記従来方
法においては、石英アンプル内を真空に排気した後、メ
ルト材料を加熱により溶融させたときに、排気しきれな
かった残留酸素の影響によって、溶融メルト材料の表面
にわずかではあるが酸化膜が形成される。By the way, in the above-mentioned conventional method, when the inside of the quartz ampoule is evacuated to a vacuum and the melt material is melted by heating, it is melted by the influence of residual oxygen that cannot be exhausted. A slight oxide film is formed on the surface of the melt material.
【0010】溶融メルト材料の表面に酸化膜が形成され
た状態で、石英アンプルを回転させて、結晶成長用基板
を溶融メルト材料に接触させると、結晶成長用基板が溶
融メルト材料に徐々に浸漬されるに際して、酸化膜の破
片が結晶成長用基板の表面に付着し、結晶成長した単結
晶層に結晶欠陥が生じるという問題がある。When the quartz ampoule is rotated to bring the substrate for crystal growth into contact with the molten melt material with the oxide film formed on the surface of the molten melt material, the substrate for crystal growth is gradually dipped in the molten melt material. In doing so, there is a problem that a fragment of the oxide film adheres to the surface of the crystal growth substrate and a crystal defect occurs in the crystal-grown single crystal layer.
【0011】発明者の実験によると、0.2ppm 程度の
残留酸素の影響によって結晶欠陥が生じることが判明し
た。本発明はこのような問題に対処するために創作され
たもので、酸化膜の影響により結晶欠陥が生じることを
防止することを目的としている。According to experiments conducted by the inventor, it has been found that crystal defects occur due to the influence of residual oxygen of about 0.2 ppm. The present invention was created to deal with such a problem, and an object thereof is to prevent occurrence of crystal defects due to the influence of an oxide film.
【0012】[0012]
【課題を解決するための手段】本発明の液相エピタキシ
ャル結晶成長用治具は、円柱の外周部中央の一部を該円
柱の中心軸方向に切り欠いた切り欠き凹部を有し、該切
り欠き凹部内に結晶成長用基板を保持してメルト材料と
共に石英アンプル内に封入する治具であって、上記石英
アンプルの内壁に沿って上記切り欠き凹部内に酸化膜除
去板を横架して構成される。A jig for liquid phase epitaxial crystal growth according to the present invention has a notched concave portion formed by cutting out a part of the center of the outer peripheral portion of a cylinder in the direction of the central axis of the cylinder. A jig for holding a substrate for crystal growth in a notched recess and enclosing it in a quartz ampoule together with a melt material, wherein an oxide film removal plate is laid horizontally in the notched recess along the inner wall of the quartz ampoule. Composed.
【0013】この液相エピタキシャル結晶成長用治具を
用いた本発明の多元半導体結晶の製造方法は、上記治具
を上記結晶成長用基板及び上記メルト材料と共に上記石
英アンプル内に真空封入するステップと、上記切り欠き
凹部が下方を向くように上記石英アンプルを水平に支持
して加熱により上記メルト材料を溶融させるステップ
と、該溶融メルト材料に上記酸化膜除去板が上記結晶成
長用基板よりも先に接触するような回転方向で上記石英
アンプルを180°回転させ、上記溶融メルト材料を上
記結晶成長用基板に接触させて結晶成長を行うステップ
と、上記石英アンプルを再び180°回転させて上記溶
融メルト材料が上記結晶成長用基板に接触しないように
するステップとを含んで構成される。The method for producing a multi-source semiconductor crystal of the present invention using this jig for liquid phase epitaxial crystal growth comprises the step of vacuum-sealing the jig together with the crystal growth substrate and the melt material in the quartz ampoule. A step of horizontally supporting the quartz ampoule so that the cutout recess faces downward and melting the melt material by heating, and the oxide film removing plate is placed on the melt melt material before the crystal growth substrate. Rotating the quartz ampoule by 180 ° in a rotation direction so as to contact with the substrate, bringing the molten melt material into contact with the substrate for crystal growth to perform crystal growth, and rotating the quartz ampoule again by 180 ° to melt the melt. Preventing the melt material from coming into contact with the crystal growth substrate.
【0014】[0014]
【作用】本発明の液相エピタキシャル結晶成長用治具に
あっては、石英アンプルの内壁に沿って切り欠き凹部内
に酸化膜除去板を横架しているので、本発明方法に従っ
てこの治具を使用したときに、次のような特有の作用を
生ずる。In the liquid phase epitaxial crystal growth jig of the present invention, since the oxide film removing plate is horizontally provided in the notch recess along the inner wall of the quartz ampoule, this jig is used in accordance with the method of the present invention. When used, the following unique effects occur.
【0015】即ち、酸化膜除去板が溶融メルト材料に結
晶成長用基板よりも先に接触するような回転方向で石英
アンプルを180°回転させるときに、溶融メルト材料
の表面の酸化膜は酸化膜除去板に邪魔されて結晶成長用
基板に接触することがなく、結晶欠陥が生じることが防
止される。That is, when the quartz ampoule is rotated by 180 ° in such a rotating direction that the oxide film removing plate comes into contact with the molten melt material before the crystal growth substrate, the oxide film on the surface of the molten melt material is an oxide film. The removal plate does not interfere with the crystal growth substrate to prevent the crystal defects from occurring.
【0016】[0016]
【実施例】以下本発明の望ましい実施例を図面に基づい
て説明する。図1は本発明の望ましい実施例を示す液相
エピタキシャル結晶成長用治具等の分解斜視図であり、
この治具1は、石英ガラスからなる円柱の外周部中央の
一部を該円柱の中心軸方向に切り欠いた切り欠き凹部3
を有している。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT A preferred embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is an exploded perspective view of a jig for liquid phase epitaxial crystal growth showing a preferred embodiment of the present invention,
This jig 1 has a notched recess 3 formed by cutting out a part of the center of the outer peripheral part of a cylinder made of quartz glass in the direction of the central axis of the cylinder.
have.
【0017】CdTeからなる結晶成長用基板4は、こ
の実施例では、基板支持台6により支持されて、この基
板支持台6を切り欠き凹部3の対向壁面に形成された溝
7に嵌合することによって、基板は切り欠き凹部3内に
横架される。In this embodiment, the crystal growth substrate 4 made of CdTe is supported by the substrate support base 6, and the substrate support base 6 is fitted into the groove 7 formed in the notched recess 3 on the opposite wall surface. As a result, the substrate is laid horizontally in the cutout recess 3.
【0018】石英からなる酸化膜除去板8は、同じく切
り欠き凹部3の対向壁面に形成された溝9,9間に横架
される。溝9の形状は、横架された酸化膜除去板8が治
具1の中心軸と平行になるように設定されている。The oxide film removing plate 8 made of quartz is likewise laid across the grooves 9 formed on the opposite wall surfaces of the notch recess 3. The shape of the groove 9 is set so that the horizontally-extending oxide film removing plate 8 is parallel to the central axis of the jig 1.
【0019】治具1は、上述のように結晶成長用基板
4、基板支持台6及び酸化膜除去板8をセットされた状
態で、治具1の外径よりもわずかに大きい内径を有する
石英アンプル2内に挿入される。このとき、治具1と共
にメルト材料5もこのメルト材料が切り欠き凹部3内に
位置するように石英アンプル2内に挿入される。メルト
材料5の成分元素はHg,Cd,Teであり、その組成
比は製造すべき多元半導体結晶の組成比に応じて設定さ
れる。The jig 1 is a quartz having an inner diameter slightly larger than the outer diameter of the jig 1 with the crystal growth substrate 4, the substrate support 6 and the oxide film removal plate 8 set as described above. It is inserted into the ampoule 2. At this time, the melt material 5 together with the jig 1 is inserted into the quartz ampoule 2 so that the melt material is located in the notch recess 3. The constituent elements of the melt material 5 are Hg, Cd, and Te, and the composition ratio thereof is set according to the composition ratio of the multi-source semiconductor crystal to be manufactured.
【0020】10は石英アンプル2を封止するための蓋
部材であり、この蓋部材10は排気管11と一体に石英
から形成されている。蓋部材10を石英アンプル2の端
部に溶接した後に、排気管11を介して石英アンプル2
内を真空に吸引する。その後、排気管11を例えばその
途中部分で封止することによって、石英アンプルを気密
に封止することができる。Reference numeral 10 denotes a lid member for sealing the quartz ampoule 2, and the lid member 10 is made of quartz integrally with the exhaust pipe 11. After welding the lid member 10 to the end of the quartz ampoule 2, the quartz ampoule 2 is connected via the exhaust pipe 11.
A vacuum is drawn inside. After that, the quartz ampoule can be hermetically sealed by sealing the exhaust pipe 11 in the middle thereof, for example.
【0021】図2により本実施例における液相エピタキ
シャル結晶成長のプロセスを説明する。まず、結晶成長
用基板4及びメルト材料5を治具1と共に封入してなる
石英アンプル2を結晶成長炉内で結晶成長温度よりも高
い所定の温度に加熱して、図2(A)に示すように、石
英アンプル2内のメルト材料5を溶融させ、溶融メルト
材料5′とする。このとき、石英アンプル2内に残留し
た酸素の影響によって、溶融メルト材料5′の表面には
わずかに酸化膜12が形成される。The process of liquid phase epitaxial crystal growth in this embodiment will be described with reference to FIG. First, the quartz ampoule 2 in which the crystal growth substrate 4 and the melt material 5 are enclosed together with the jig 1 is heated to a predetermined temperature higher than the crystal growth temperature in the crystal growth furnace, and shown in FIG. In this way, the melt material 5 in the quartz ampoule 2 is melted to form a melt material 5 '. At this time, due to the influence of oxygen remaining in the quartz ampoule 2, a slight oxide film 12 is formed on the surface of the molten melt material 5 '.
【0022】次いで、図2(B)に示すように、石英ア
ンプル2を図中時計回り方向に回転させてゆく。尚、図
2(A)に示された断面においては、酸化膜除去板8は
石英アンプル2の右側壁面に沿って設けられているもの
とする。石英アンプル2を回転させると、これに伴って
石英アンプル2内の治具1、結晶成長用基板4及び酸化
膜除去板8も回転する。Next, as shown in FIG. 2B, the quartz ampoule 2 is rotated clockwise in the figure. In the cross section shown in FIG. 2A, the oxide film removing plate 8 is provided along the right wall surface of the quartz ampoule 2. When the quartz ampoule 2 is rotated, the jig 1, the crystal growth substrate 4 and the oxide film removal plate 8 in the quartz ampoule 2 are also rotated accordingly.
【0023】このとき、溶融メルト材料5′の液面は水
平面を維持しているので、酸化膜12は酸化膜除去板8
に邪魔されて、図2(B)において酸化膜除去板8の右
側には移動していかない。At this time, since the liquid surface of the molten melt material 5'maintains a horizontal surface, the oxide film 12 becomes the oxide film removing plate 8 '.
2B, it does not move to the right side of the oxide film removing plate 8 in FIG. 2B.
【0024】この実施例においては、酸化膜除去板8の
円柱の中心軸側の縁部には基板4と反対の側に向けて段
差8aが形成されているので、効果的に酸化膜12を除
去することができる。In this embodiment, since the step 8a is formed at the edge portion on the central axis side of the cylinder of the oxide film removing plate 8 toward the side opposite to the substrate 4, the oxide film 12 is effectively removed. Can be removed.
【0025】そして、回転角が180°となるまで石英
アンプル2を回転させて、図2(C)に示すように、溶
融メルト材料5′を結晶成長用基板4に接触させる。こ
の状態で炉内温度を所定の結晶成長温度に低下させる
と、結晶成長用基板4の表面には、Hg1-x Cdx Te
からなる結晶層13が成長する。このとき、母材となる
結晶成長用基板4の表面にはメルト材料の酸化膜が付着
していないので、結晶層13に結晶欠陥が生じる恐れが
ない。Then, the quartz ampoule 2 is rotated until the rotation angle becomes 180 °, and the molten melt material 5'is brought into contact with the crystal growth substrate 4 as shown in FIG. 2 (C). When the temperature in the furnace is lowered to a predetermined crystal growth temperature in this state, Hg 1-x Cd x Te is formed on the surface of the crystal growth substrate 4.
The crystal layer 13 of is grown. At this time, since the oxide film of the melt material is not attached to the surface of the substrate 4 for crystal growth, which is a base material, there is no risk of crystal defects occurring in the crystal layer 13.
【0026】その後、所定厚みの結晶層13が形成され
た時点で、図2(D)に示すように、石英アンプル2を
再び180°回転させることにより、溶融メルト材料
5′が結晶成長用基板4に接触しないようにして、結晶
成長を停止させる。After that, when the crystal layer 13 having a predetermined thickness is formed, as shown in FIG. 2D, the quartz ampoule 2 is rotated again by 180 ° so that the molten melt material 5'is converted into a crystal growth substrate. The crystal growth is stopped by making no contact with No. 4.
【0027】そして最後に、図示はしないが、炉内から
石英アンプル2を徐冷しながら引出し、石英アンプル2
を開封し、結晶層13が形成された結晶成長用基板4を
基板支持台6から取り外す。Finally, although not shown, the quartz ampoule 2 is pulled out from the furnace while being gradually cooled, and the quartz ampoule 2 is removed.
And the crystal growth substrate 4 on which the crystal layer 13 is formed is removed from the substrate support base 6.
【0028】本実施例によると、結晶層に欠陥が生じに
くいので、大型な結晶成長用基板を用いて多数の赤外線
受光素子等を製造する場合に、製造歩留りが飛躍的に向
上する。According to this embodiment, defects are less likely to occur in the crystal layer, so that the manufacturing yield is greatly improved when a large number of infrared light receiving elements or the like are manufactured using a large-sized crystal growth substrate.
【0029】[0029]
【発明の効果】以上説明したように、本発明によると、
特定構成の治具を用いて多元半導体結晶を製造するとき
に、酸化膜の影響により結晶欠陥が生じることが防止さ
れるという効果を奏する。As described above, according to the present invention,
When manufacturing a multi-element semiconductor crystal using a jig having a specific structure, it is possible to prevent the occurrence of crystal defects due to the influence of the oxide film.
【図1】本発明の望ましい実施例を示す液相エピタキシ
ャル結晶成長用治具等の分解斜視図である。FIG. 1 is an exploded perspective view of a jig for liquid phase epitaxial crystal growth showing a preferred embodiment of the present invention.
【図2】液相エピタキシャル結晶成長のプロセス説明図
である。FIG. 2 is an explanatory diagram of a process of liquid phase epitaxial crystal growth.
【図3】従来技術の説明図である。FIG. 3 is an explanatory diagram of a conventional technique.
1 液相エピタキシャル結晶成長用治具 2 石英アンプル 3 切り欠き凹部 4 結晶成長用基板 5 メルト材料 5′ 溶融メルト材料 8 酸化膜除去板 1 Jig for liquid phase epitaxial crystal growth 2 quartz ampoule 3 Notch recess 4 Crystal growth substrate 5 Melt material 5'Melted melt material 8 Oxide film removal plate
Claims (4)
軸方向に切り欠いた切り欠き凹部(3) を有し、該切り欠
き凹部内に結晶成長用基板(4) を保持してメルト材料
(5) と共に石英アンプル(2) 内に封入する治具であっ
て、 上記石英アンプル(2) の内壁に沿って上記切り欠き凹部
(3) 内に酸化膜除去板(8) を横架したことを特徴とする
液相エピタキシャル結晶成長用治具。1. A notch recess (3) is formed by cutting out a part of the center of the outer periphery of the cylinder in the direction of the central axis of the cylinder, and a crystal growth substrate (4) is held in the notch recess. Melt material
A jig for enclosing the quartz ampoule (2) together with (5), the cutout recess along the inner wall of the quartz ampoule (2).
A jig for liquid phase epitaxial crystal growth, characterized in that an oxide film removing plate (8) is horizontally installed inside (3).
軸側の縁部には上記基板(4) と反対の側に向けて段差(8
a)が形成されていることを特徴とする請求項1に記載の
液相エピタキシャル結晶成長用治具。2. A step (8) is formed on an edge of the oxide film removing plate (8) on the central axis side of the cylinder toward the side opposite to the substrate (4).
The jig for liquid phase epitaxial crystal growth according to claim 1, wherein a) is formed.
ャル結晶成長用治具を用いた多元半導体結晶の製造方法
であって、 上記治具(1) を上記結晶成長用基板(4) 及び上記メルト
材料(5) と共に上記石英アンプル(2) 内に真空封入する
ステップと、 上記切り欠き凹部(3) が下方を向くように上記石英アン
プル(2) を水平に支持して加熱により上記メルト材料
(5) を溶融させるステップと、 該溶融メルト材料(5′) に上記酸化膜除去板(8) が上記
結晶成長用基板(4) よりも先に接触するような回転方向
で上記石英アンプルを180°回転させ、上記溶融メル
ト材料(5′) を上記結晶成長用基板(4) に接触させて結
晶成長を行うステップと、 上記石英アンプル(2) を再び180°回転させて上記溶
融メルト材料(5′) が上記結晶成長用基板(4) に接触し
ないようにするステップとを含むことを特徴とする多元
半導体結晶の製造方法。3. A method for producing a multi-source semiconductor crystal using the jig for liquid phase epitaxial crystal growth according to claim 1 or 2, wherein the jig (1) comprises the substrate (4) for crystal growth and The step of vacuum-sealing the quartz ampoule (2) together with the melt material (5), the quartz ampoule (2) is horizontally supported so that the cutout recess (3) faces downward, and the melt is heated by heating. material
(5) is melted, and the quartz ampoule is rotated in a rotating direction such that the oxide film removal plate (8) comes into contact with the molten melt material (5 ′) before the crystal growth substrate (4). Rotating 180 °, bringing the molten melt material (5 ′) into contact with the crystal growth substrate (4) for crystal growth, and rotating the quartz ampoule (2) 180 ° again to melt the molten melt material. (5 ') is prevented from coming into contact with the crystal growth substrate (4).
なり、上記メルト材料(5) の成分元素はHg,Cd,T
eであることを特徴とする請求項3に記載の多元半導体
結晶の製造方法。4. The crystal growth substrate (4) is made of CdTe, and the constituent elements of the melt material (5) are Hg, Cd, and T.
The method for producing a multi-source semiconductor crystal according to claim 3, wherein the method is e.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18772891A JPH0536731A (en) | 1991-07-26 | 1991-07-26 | Jig for growing liquid phase epitaxial crystal and method for manufacturing multi-element semiconductor crystal using the jig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18772891A JPH0536731A (en) | 1991-07-26 | 1991-07-26 | Jig for growing liquid phase epitaxial crystal and method for manufacturing multi-element semiconductor crystal using the jig |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0536731A true JPH0536731A (en) | 1993-02-12 |
Family
ID=16211144
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18772891A Withdrawn JPH0536731A (en) | 1991-07-26 | 1991-07-26 | Jig for growing liquid phase epitaxial crystal and method for manufacturing multi-element semiconductor crystal using the jig |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0536731A (en) |
-
1991
- 1991-07-26 JP JP18772891A patent/JPH0536731A/en not_active Withdrawn
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 19981008 |