JPS634626A - Substrate holding jig for liquid phase epitaxial crystal growth - Google Patents
Substrate holding jig for liquid phase epitaxial crystal growthInfo
- Publication number
- JPS634626A JPS634626A JP61149267A JP14926786A JPS634626A JP S634626 A JPS634626 A JP S634626A JP 61149267 A JP61149267 A JP 61149267A JP 14926786 A JP14926786 A JP 14926786A JP S634626 A JPS634626 A JP S634626A
- Authority
- JP
- Japan
- Prior art keywords
- crystal growth
- substrate
- melt
- melt material
- holding jig
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Electroluminescent Light Sources (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
Description
【発明の詳細な説明】
〔概 要〕
本発明はHg+−xCdx Te等からなる化合物半導
体結晶層を液相エピタキシャル結晶成長により形成する
ための基板保持治具であって、所定長さの円柱の外周部
中央の一部を該円柱の中心方向に切り欠いた切り欠き凹
部内に具備した被結晶成長用基板を横架する形に保持し
、外周部にメルト表面膜除去用のメルト流出孔を有する
メルト材料収容部材を設けた構成とし、該メルト材料収
容部材内にて溶融した結晶成長用メルト材料をメルト流
出孔より、そのメルト材料表面結晶された酸化膜等から
なる表面膜を残して被結晶成長用基板面へ流出させるよ
うにして、メルト表面膜の被着に起因する結晶欠陥の発
生を防止するようにしたものである。[Detailed Description of the Invention] [Summary] The present invention is a substrate holding jig for forming a compound semiconductor crystal layer made of Hg+-xCdxTe etc. by liquid phase epitaxial crystal growth. A substrate for crystal growth, which is provided in a notched recess in which a part of the center of the outer periphery is cut out in the direction of the center of the cylinder, is held horizontally, and a melt outflow hole for removing the melt surface film is provided in the outer periphery. The melt material for crystal growth melted in the melt material containing member is passed through the melt outflow hole leaving a surface film of crystallized oxide film etc. on the surface of the melt material. This is made to flow out onto the surface of the substrate for crystal growth, thereby preventing the occurrence of crystal defects due to the adhesion of the melt surface film.
本発明は液相エピタキシャル結晶成長用基板保持治具の
改良に係り、特に易蒸発性の成分元素を含む化合物半導
体結晶の液相エピタキシャル成長に好適な基板保持治具
に関するものである。The present invention relates to improvements in a substrate holding jig for liquid phase epitaxial crystal growth, and particularly to a substrate holding jig suitable for liquid phase epitaxial growth of compound semiconductor crystals containing easily evaporable component elements.
液相エピタキシャル結晶成長は一般に複数の組成元素か
らなる半導体結晶、例えば砒化ガリウム(GaAs)、
ガリウム・アルミニウム・砒素(GaA7As)等の化
合物半導体結晶を構成材料として発光素子、レーザ素子
、或いは受光素子等を形成するのに用いられている。ま
た近年においては鉛・錫・テルル(Pb、−xSnx
Te)や易蒸発性のHgからなる成分元素を含むエネル
ギーギャップの狭い水銀・カドミウム・テルル(Hgl
−ウCdxTe)等の化合物半導体結晶を構成材料とし
て、赤外線検知素子や赤外半導体レーザ素子などの光電
変換素子を形成するのに用いられていることが周知であ
る。Liquid phase epitaxial crystal growth generally involves semiconductor crystals consisting of multiple compositional elements, such as gallium arsenide (GaAs),
Compound semiconductor crystals such as gallium-aluminum-arsenic (GaA7As) are used as constituent materials to form light-emitting elements, laser elements, light-receiving elements, and the like. In recent years, lead, tin, tellurium (Pb, -xSnx
Mercury, cadmium, tellurium (Hgl) with a narrow energy gap, including component elements consisting of Te) and easily evaporable Hg.
It is well known that compound semiconductor crystals such as CdxTe) are used as constituent materials to form photoelectric conversion elements such as infrared detection elements and infrared semiconductor laser elements.
特に易蒸発性のHgからなる成分元素を含む水銀・カド
ミウム・テルル(Hgl−xCdx Te)等の化合物
半導体結晶を液相エピタキシャル成長により形成する方
法としては、本発明者等により既に提案されている密閉
回転式の液相エピタキシャル結晶成長法が用いられてい
る。In particular, as a method for forming compound semiconductor crystals of mercury, cadmium, tellurium (Hgl-xCdx Te), etc. containing a component element consisting of easily evaporable Hg by liquid phase epitaxial growth, the hermetic sealing method already proposed by the present inventors has been proposed. A rotary liquid phase epitaxial crystal growth method is used.
これらの液相エピタキシャル結晶成長においては、−枚
の結晶基板から数多くの素子形成が得られるように大型
の被結晶基板に均一な組成比の結晶層を形成することは
勿論のこと、結晶欠陥のない結晶層を容易に形成し得る
ことが要求される。In these liquid phase epitaxial crystal growth processes, it is necessary not only to form a crystal layer with a uniform composition ratio on a large substrate to be crystallized so that a large number of elements can be formed from a single crystal substrate, but also to prevent crystal defects. It is required that it be possible to easily form a crystal layer with no crystalline structure.
このため、結晶欠陥の発生原因の一要因として熔融した
結晶成長用メルト材料の表面に形成される酸化膜等の表
面膜の基板表面への付着を防止して、欠陥のない結晶層
を容易に形成し得る液相エピタキシャル結晶成長用の基
板保持治具が必要とされている。For this reason, it is possible to prevent surface films such as oxide films that are formed on the surface of the melt material for crystal growth, which is one of the causes of crystal defects, from adhering to the substrate surface, and to easily form a defect-free crystal layer. There is a need for a substrate holding jig for liquid phase epitaxial crystal growth that can be formed.
C従来の技術〕
従来の密閉回転式の液相エピタキシャル結晶成長法に用
いられている治具、即ち基板保持治具は第3図に示すよ
うに、後述する石英アンプル内に内接する外径と所定長
さの、例えば石英ガラス、或いはカーボン材からなる円
柱1の外周部中央の一部を該円柱lの中心軸A方向に切
り欠いた切り欠き凹部2を有し、該切り欠き凹部2内の
対向壁面間に被結晶成長用基板3を水平に横架する形に
保持する構成からなっている。C. Prior Art] As shown in Figure 3, the jig used in the conventional closed rotation type liquid phase epitaxial crystal growth method, that is, the substrate holding jig, has an outer diameter that is inscribed in a quartz ampoule, which will be described later. A cylinder 1 of a predetermined length made of quartz glass or carbon material, for example, has a notch recess 2 formed by cutting out a part of the center of the outer periphery in the direction of the central axis A of the cylinder l. The substrate 3 for crystal growth is held horizontally between opposing wall surfaces.
そして液相エピタキシャル結晶成長に際しては、図示の
ように当該治具11の切り欠き凹部2内に、例えばCd
Teからなる被結晶成長用基板3を水平に架は渡した形
に保持し、この基板保持治具11と、予め所定組成比に
秤量されたHg、xCdx Teからなる結晶成長用メ
ルト材料5とを共に石英アンプル4内に挿設し、内部を
排気した状態で該基板保持治具11が内部で動かないよ
うに気密に封止する。。During liquid phase epitaxial crystal growth, for example, Cd
A substrate 3 for crystal growth made of Te is held horizontally on a rack, and this substrate holding jig 11 and a melt material 5 for crystal growth made of Hg, xCdxTe, weighed in advance to a predetermined composition ratio. Both are inserted into a quartz ampoule 4, and with the inside evacuated, the substrate holding jig 11 is hermetically sealed so that it does not move inside. .
しかる後、前記石英アンプル4を図示しないエピタキシ
ャル結晶成長炉内に配置し、結晶成長温度よりも高い所
定温度に加熱して該石英アンプル4内の結晶成長用メル
ト材料5を溶融し、前記石英アンプル4を180度回転
して、前記基板3面に熔融した結晶成長用メルト材料5
を接触させると共に、加熱温度を所定結晶成長温度に低
下させて該基板3上にIlg、xCdxTeからなる結
晶層を成長させている。Thereafter, the quartz ampule 4 is placed in an epitaxial crystal growth furnace (not shown) and heated to a predetermined temperature higher than the crystal growth temperature to melt the crystal growth melt material 5 in the quartz ampule 4, 4 is rotated 180 degrees, and the crystal growth melt material 5 is melted on the surface of the substrate 3.
At the same time, the heating temperature is lowered to a predetermined crystal growth temperature to grow a crystal layer made of Ilg and xCdxTe on the substrate 3.
また、所定の厚さの結晶層が形成された時点で該石英ア
ンプル4を再び180度反軸反転、元の状態に戻すこと
により該基板3上の前記メルト材料5を除去して結晶成
長を停止させ、その後、冷却された石英アンプル4を成
長炉内より引き出して開封し、該治具11よりFIgl
−xCdx Teからなる結晶層が形成された基f!3
を取り出している。Further, when a crystal layer of a predetermined thickness is formed, the quartz ampoule 4 is reversed 180 degrees counter-axis again to return to its original state, thereby removing the melt material 5 on the substrate 3 and causing crystal growth. After that, the cooled quartz ampoule 4 is pulled out from inside the growth furnace and unsealed, and the FIgl is removed from the jig 11.
-xCdx Group f in which a crystal layer consisting of Te is formed! 3
is being taken out.
ところで、このような従来の基板保持治具11を用いて
被結晶成長用基板3表面に液相エピタキシャル結晶成長
を行う方法においては、該基板3を保持した基板保持治
具11と共に、前記結晶成長用メルト材料5を封入した
石英アンプル4を180度回転して、前記基板3面に溶
融した結晶成長用メルト材料5を接触させる際に、該メ
ルト材料5の表面に形成された酸化膜等からなる表面膜
が該基板表面に付着し、これに起因して形成されるエピ
タキシャル結晶層に欠陥が発生するといった欠点があっ
た。By the way, in a method of performing liquid phase epitaxial crystal growth on the surface of the substrate 3 for crystal growth using such a conventional substrate holding jig 11, the substrate holding jig 11 holding the substrate 3 and the crystal growth When the quartz ampoule 4 containing the melt material 5 for crystal growth is rotated 180 degrees to bring the molten melt material 5 for crystal growth into contact with the surface of the substrate 3, an oxide film etc. formed on the surface of the melt material 5 is removed. There is a drawback that a surface film adheres to the surface of the substrate, which causes defects in the epitaxial crystal layer formed.
このような欠陥の発生は該結晶層内は言うに及ばず、そ
の表面にも異常成長突起やピットが発生し、素子形成に
用いることが出来ない。The occurrence of such defects not only occurs within the crystal layer, but also abnormal growth protrusions and pits occur on its surface, making it impossible to use it for device formation.
本発明は上記のような従来の欠点を解消するため、結晶
成長用基板を保持する治具自身に、溶融した結晶成長用
メルト材料の表面に形成される酸化膿等からなる表面膜
を除去する手段を設け、メルト材料に形成される表面膜
の基板表面への付着に起因する成長結晶層の結晶欠陥の
発生を防止した新規な液相エピタキシャル結晶成長用基
板保持治具を提供することを目的とするものである。In order to eliminate the above-mentioned conventional drawbacks, the present invention removes a surface film of oxidized pus, etc. formed on the surface of the melt material for crystal growth on the jig itself that holds the substrate for crystal growth. An object of the present invention is to provide a novel substrate holding jig for liquid phase epitaxial crystal growth that prevents the occurrence of crystal defects in a growing crystal layer due to adhesion of a surface film formed on a melt material to the substrate surface. That is.
本発明は上記目的を達成するため、所定長さの円柱の外
周部中央の一部を該円柱の中心方向に切り欠いた切り欠
き凹部内に、被結晶成長用基板を横架する形に保持する
と共に、これと平行して外周部にメルト表面膜除去用の
メルト流出孔を設けたメルト材料収容部材を配備した治
具構成とする。In order to achieve the above object, the present invention holds a substrate for crystal growth horizontally in a notched recess formed by cutting out a part of the center of the outer periphery of a cylinder of a predetermined length in the direction of the center of the cylinder. At the same time, the jig has a structure in which a melt material storage member having a melt outflow hole for removing a melt surface film is provided in the outer peripheral portion in parallel therewith.
本発明の液相エピタキシャル結晶成長用の基板保持治具
は、その切り欠き凹部内に設けられた被結晶成長用基板
を横架する形に保持すると共に、これと平行して外周部
にメルト表面膜除去用のメルト流出孔を設けたメルト材
料収容部材が配備されているため、前記被結晶成長用基
板を保持し、メルト材料収容部材内に結晶成長用メルト
材料を収容した状態の当該治具を石英アンプル内に嵌入
・密封し、該石英アンプルを加熱して該メルト材料を溶
融すれば、熔融したメルト材料はメルト流出孔より石英
アンプル側に流出される。The substrate holding jig for liquid phase epitaxial crystal growth of the present invention holds the substrate for crystal growth provided in the notch recess in a horizontal manner, and also has a melt surface on the outer periphery in parallel with this. Since a melt material accommodating member provided with a melt outflow hole for film removal is provided, the jig holds the substrate for crystal growth and stores the melt material for crystal growth in the melt material accommodating member. is inserted into and sealed in a quartz ampoule, and the quartz ampoule is heated to melt the melt material, and the melted melt material flows out from the melt outflow hole toward the quartz ampoule side.
この時、メルト材料表面に形成された酸化膜等からなる
表面膜は、該メルト流出孔にて堰き止められて流出が阻
止される。At this time, the surface film formed on the surface of the melt material, such as an oxide film, is dammed up by the melt outflow hole and prevented from flowing out.
従って、この状態で前記石英アンプルを従来と同様に1
80度回転すれば、前記基板面上に表面膜が除去された
結晶成長用メルト材料のみが接触され、該基板上に表面
膜の付着に起因する結晶欠陥の発生の無い極めて良好な
成長結晶層を容易に形成することが可能となる。Therefore, in this state, the quartz ampoule is
By rotating the substrate by 80 degrees, only the melt material for crystal growth from which the surface film has been removed is brought into contact with the substrate surface, resulting in an extremely well-grown crystal layer free from crystal defects caused by the adhesion of the surface film on the substrate. can be easily formed.
以下図面を用いて本発明の実施例について詳細に説明す
る。Embodiments of the present invention will be described in detail below with reference to the drawings.
第1図は本発明に係る液相エピタキシャル結晶成長用の
基板保持治具の一実施例を示す要部断面図である。FIG. 1 is a sectional view of a main part showing an embodiment of a substrate holding jig for liquid phase epitaxial crystal growth according to the present invention.
図において、22は石英アンプル内に内接する所定長さ
の石英ガラス、或いはカーボン材などからなる所定長さ
の円柱の外周部中央の一部を該円柱の中心方向に切り欠
いた切り欠き凹部23を有する治具本体であり、該切り
火き凹部23内には被結晶成長用基板26を横架する形
に保持し、これと平行して外周部にメルト表面膜除去用
のメルト流出孔25を設けた蒲鉾形のメルト材料収容部
材24が図示るような形に配設された治具構成となって
いる。In the figure, reference numeral 22 denotes a notch recess 23 which is a part of the center of the outer circumference of a cylinder of a specified length made of quartz glass or carbon material inscribed in a quartz ampoule and cut out in the direction of the center of the cylinder. A substrate 26 for crystal growth is held horizontally in the opening recess 23, and a melt outflow hole 25 for removing the melt surface film is provided at the outer periphery in parallel with this. The jig has a structure in which a semi-cylindrical melt material storage member 24 is arranged in the shape shown in the figure.
尚、前記円柱形状の治具本体22はブロック状、または
中空状であってもよい。Note that the cylindrical jig main body 22 may be block-shaped or hollow.
次に上記のような構成の本発明の基板保持治具21の使
用例を説明する。Next, an example of use of the substrate holding jig 21 of the present invention having the above-described structure will be described.
先ず第2図に示すように前記基板保持治具21の切り欠
き凹部23内に、例えばCdTeからなる被結晶成長用
基板26を横架する形に保持する。First, as shown in FIG. 2, a substrate 26 for crystal growth made of, for example, CdTe is held horizontally in the cutout recess 23 of the substrate holding jig 21.
またメルト表面膜除去用のメルト流出孔25を外周部に
設けた蒲鉾形のメルト材料収容部材24内には、予め所
定組成比に秤量したHg+−xCdx Teからなる結
晶成長用メルト材料27を収容し、このメルト材料収容
部材24は前記切り火き凹部23内に図示のように配設
する。Further, a crystal growth melt material 27 made of Hg+-xCdx Te weighed in advance at a predetermined composition ratio is stored in a semi-cylindrical melt material storage member 24 having a melt outflow hole 25 for removing a melt surface film on the outer periphery. The melt material storage member 24 is disposed within the opening recess 23 as shown in the figure.
しかる後、かかる基板保持治具21を石英アンプル28
内に挿設して内部を排気した後、該治具21が内部で動
かないように気密に封止する。After that, the substrate holding jig 21 is placed in a quartz ampoule 28.
After the jig 21 is inserted into the interior and the interior is evacuated, the jig 21 is hermetically sealed so that it does not move inside.
次にこの石英アンプル28を図示しないエピタキシャル
結晶成長炉内に挿入し、結晶成長温度よりも若干高い所
定温度に加熱して該石英アンプル28内の結晶成長用メ
ルト材料27を溶融させる。Next, this quartz ampoule 28 is inserted into an epitaxial crystal growth furnace (not shown) and heated to a predetermined temperature slightly higher than the crystal growth temperature to melt the crystal growth melt material 27 within the quartz ampoule 28.
この際、メルト材料収容部材24内で溶融された結晶成
長用メルト材料27は、メルト流出孔25より石英アン
プル28側に流出され、この時メルト材料27の表面に
形成された酸化膜等からなる表面膜は該メルト流出孔2
5にて堰き止められて流出が阻止される。At this time, the crystal growth melt material 27 melted within the melt material storage member 24 flows out from the melt outflow hole 25 to the quartz ampoule 28 side, and the oxide film etc. formed on the surface of the melt material 27 at this time flows out. The surface film is the melt outflow hole 2
5, it is dammed and the outflow is prevented.
その後、この状態の石英アンプル28を従来と同様に1
80度回転して、前記基板26面にメルト材料27を接
触させると共に、加熱温度を所定結晶成長温度に低下さ
せて該基板26上にHg、XCd、 Teからなる結晶
層を成長させることにより、該基板26上に表面膜付着
に起因する結晶欠陥の発生の無い良好な成長結晶層を容
易に形成することが可能となる。Thereafter, the quartz ampoule 28 in this state is
By rotating the substrate 26 by 80 degrees and bringing the melt material 27 into contact with the surface of the substrate 26, the heating temperature is lowered to a predetermined crystal growth temperature to grow a crystal layer consisting of Hg, XCd, and Te on the substrate 26. It becomes possible to easily form a well-grown crystal layer on the substrate 26 without generating crystal defects due to surface film adhesion.
この時、酸化膜等からなる表面膜は流出が阻止されてメ
ルト材料収容部材24内に残留されている。At this time, the surface film made of an oxide film or the like is prevented from flowing out and remains in the melt material storage member 24.
結晶成長終了後は石英アンプル28を元の状態に再び1
80度反軸反転基f!26上のメルト材料27を除去し
て降温化し、その後成長炉内より石英アンプル2日を引
出して開封し、基板保持治具21よりHg+−xCdx
Teからなる結晶層が形成された基板26を取り出す。After the crystal growth is completed, the quartz ampoule 28 is returned to its original state.
80 degrees anti-axis inversion base f! The melt material 27 on the substrate holder 26 is removed and the temperature is lowered, and then the quartz ampoule is pulled out from inside the growth furnace and opened, and Hg+-xCdx is removed from the substrate holding jig 21.
The substrate 26 on which the crystal layer made of Te is formed is taken out.
尚、以上の実施例ではメルト材料収容部材24に設けら
れたメルト表面膜除去用のメルト流出孔25は、一つの
孔の場合について説明したが、複数の孔、即ちメツシュ
状の孔とすれば、メルト材料27に生じる表面膜の除去
効果はより大きくなる。In the above embodiments, the melt outflow hole 25 for removing the melt surface film provided in the melt material storage member 24 was explained as a single hole, but it may be formed as a plurality of holes, that is, a mesh-like hole. , the effect of removing the surface film formed on the melt material 27 becomes greater.
以上の説明から明らかなように、本発明に係る液相エピ
タキシャル結晶成長用の基板保持治具によれば、切り欠
き凹部内に被結晶成長用基板と共に配設したメルト材料
収容部材により、被結晶成長用基板の表面に接触させる
べく溶融した結晶成長用メルト材料の表面に形成された
酸化膜等からなる表面膜が除去され、該基板面に対して
表面膜のない清浄な結晶成長用メルト材料のみが成長に
供せられることから、表面膜の付着に起因する結晶欠陥
の発注の無い良好な成長結晶層を容易に形成することが
可能となる優れた利点を有する。As is clear from the above description, according to the substrate holding jig for liquid phase epitaxial crystal growth according to the present invention, the melt material storage member disposed together with the crystal growth substrate in the notch recess allows the crystal growth target to be A surface film such as an oxide film formed on the surface of the melt material for crystal growth that is melted to be brought into contact with the surface of the growth substrate is removed, resulting in a clean melt material for crystal growth with no surface film on the surface of the substrate. It has the excellent advantage that a well-grown crystal layer without crystal defects caused by adhesion of a surface film can be easily formed because only the crystals are subjected to growth.
従って、Hg+−xCdx Teからなる結晶層の液相
エピタキシャル結晶成長に限らず、この種の化合物半導
体結晶層の液相エピタキシャル結晶成長に通用して極め
て有利である。Therefore, it is extremely advantageous not only for liquid phase epitaxial crystal growth of a crystal layer made of Hg+-xCdx Te but also for liquid phase epitaxial crystal growth of this type of compound semiconductor crystal layer.
第1図は本発明に係る液相エピタキシャル結晶成長用の
基板保持治具の一実施例を示
す斜視図、
第2図は本発明に係る液相エピタキシャル結晶成長用基
板保持治具の使用例を説明す
るための要部断面図、
第3図は従来の液相エピタキシャル結晶成長用の基板保
持治具を説明するための要部
断面図である。
第1図乃至第2図において、
21は基板保持治具、22は治具本体、23は切り欠き
凹部、24はメルト材料収容部材、25はメルト流出孔
、26は被結晶成長用基板、27はメルト材料、28は
石英アンプル第1図
本―小始シfk例を−fifj Pf?酢面こ第2図
イ11fl’J’e 2プビe月!13禰ミ等イ(2C
ゴ第3図Fig. 1 is a perspective view showing an embodiment of the substrate holding jig for liquid phase epitaxial crystal growth according to the present invention, and Fig. 2 shows an example of use of the substrate holding jig for liquid phase epitaxial crystal growth according to the present invention. FIG. 3 is a sectional view of a main part for explaining a conventional substrate holding jig for liquid phase epitaxial crystal growth. 1 and 2, 21 is a substrate holding jig, 22 is a jig main body, 23 is a notch recess, 24 is a melt material storage member, 25 is a melt outlet hole, 26 is a substrate for crystal growth, 27 is the melt material, 28 is the quartz ampoule, Fig. 1 Book - Beginning of the fk example - fifj Pf? Vinegar 2nd figure 11fl'J'e 2 Pubi e month! 13 Nemi etc. (2C
Figure 3
Claims (1)
に切り欠いた切り欠き凹部(23)内に、被結晶成長用
基板(26)を横架する形に保持し、結晶成長用メルト
材料と共に、石英アンプル内に封入する基板保持治具で
あって、 上記切り欠き凹部(23)内に、前記基板(26)に連
通し、かつ外周部にメルト表面膜除去用のメルト流出孔
(25)を設けたメルト材料収容部材(24)を備えて
なることを特徴とする液相エピタキシャル結晶成長用基
板保持治具。[Scope of Claims] A substrate for crystal growth (26) is horizontally suspended in a cutout recess (23) formed by cutting out a part of the center of the outer periphery of a cylinder of a predetermined length in the direction of the center of the cylinder. A substrate holding jig which is held in a quartz ampoule together with a melt material for crystal growth, the notch recess (23) communicating with the substrate (26), and having a melt surface on the outer periphery. A substrate holding jig for liquid phase epitaxial crystal growth, comprising a melt material storage member (24) provided with a melt outflow hole (25) for film removal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61149267A JPS634626A (en) | 1986-06-24 | 1986-06-24 | Substrate holding jig for liquid phase epitaxial crystal growth |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61149267A JPS634626A (en) | 1986-06-24 | 1986-06-24 | Substrate holding jig for liquid phase epitaxial crystal growth |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS634626A true JPS634626A (en) | 1988-01-09 |
| JPH0260226B2 JPH0260226B2 (en) | 1990-12-14 |
Family
ID=15471503
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61149267A Granted JPS634626A (en) | 1986-06-24 | 1986-06-24 | Substrate holding jig for liquid phase epitaxial crystal growth |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS634626A (en) |
-
1986
- 1986-06-24 JP JP61149267A patent/JPS634626A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0260226B2 (en) | 1990-12-14 |
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