JPH026902A - Microlens and its manufacturing method - Google Patents

Microlens and its manufacturing method

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Publication number
JPH026902A
JPH026902A JP19373988A JP19373988A JPH026902A JP H026902 A JPH026902 A JP H026902A JP 19373988 A JP19373988 A JP 19373988A JP 19373988 A JP19373988 A JP 19373988A JP H026902 A JPH026902 A JP H026902A
Authority
JP
Japan
Prior art keywords
microlens
manufacturing
film
quartz substrate
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19373988A
Other languages
Japanese (ja)
Inventor
Mitsugi Hanabusa
英 貢
Atsushi Takaura
淳 高浦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP19373988A priority Critical patent/JPH026902A/en
Publication of JPH026902A publication Critical patent/JPH026902A/en
Pending legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、マイクロレンズ及びその製造方法に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a microlens and a method for manufacturing the same.

[従来の技術] 基板に光を照射し、所定のプログラムで基板上のエネル
ギー分布をコントロールし、CVDにより所望の膜厚分
布を有する物質膜を形成し、この物質膜をレンズとして
使用するという技術が提案されている(例えば特開昭6
2−260104号公報)。
[Conventional technology] A technology in which a substrate is irradiated with light, the energy distribution on the substrate is controlled by a predetermined program, a material film with a desired thickness distribution is formed by CVD, and this material film is used as a lens. has been proposed (for example, in Japanese Unexamined Patent Publication No. 6
2-260104).

周知の如く、レーザー光はガウス分布に従う強度分布を
もっているので基板にレーザー光を照射することにより
ガウス分布に従うプロフィルをもつ物質膜を形成できる
。この物質膜はその最大膜厚部近傍をレンズ面として使
用することが出来るし、また必要によりエツチングで所
望のレンズ面加工を行うことによって所望の面形状のレ
ンズとして形成できると考えられる。
As is well known, laser light has an intensity distribution that follows a Gaussian distribution, so by irradiating a substrate with the laser light, a material film having a profile that follows a Gaussian distribution can be formed. It is believed that the vicinity of the maximum thickness of this material film can be used as a lens surface, and if necessary, by etching the desired lens surface, it can be formed into a lens with a desired surface shape.

[発明が解決しようとする課題] 発明者は、上記の如きレーザーCVDを利用してマイク
ロレンズを作製することを研究してきたが、その途上に
於いて、石英基板上に513N、aの物質膜として所望
の形状のマイクロレンズを作製することに成功した。し
かし、このSi3N4物質膜のマイクロレンズはその成
膜後に割扛ることが多く、製造の歩留まりが悪いという
問題があった8本発明は、上述した事情に鑑みてなされ
たものであって、新規なマイクロレンズ及びその製造方
法の提供2目的とする。
[Problems to be Solved by the Invention] The inventor has been researching the production of microlenses using laser CVD as described above, and in the process, a material film of 513N,a was deposited on a quartz substrate. We succeeded in fabricating a microlens with the desired shape. However, microlenses made of this Si3N4 material film are often broken after the film is formed, resulting in a problem of poor manufacturing yield.8 The present invention was made in view of the above circumstances, and is The second object of the present invention is to provide a microlens and a method for manufacturing the same.

[課題をKf);するための手段] 以下、本発明を特徴する 請求項lの発明は、マイクロレンズの製造方法であって
、以下の如き特徴を持つ。
[Means for Achieving the Problem Kf)] The invention of claim 1, which characterizes the present invention, is a method for manufacturing a microlens, which has the following features.

即ち、石英基板上にCO,レーザー光を集束せし2め、
5IH4、NofNH3を略1;5:30の割合で混合
してなる材料ガスを用い、1ノーザーCVDにより上記
石英基板上に、上記CO,レーザ・−光照射による温度
分布に従って膜厚の変化したSiONの膜を形成するの
である。
That is, CO and laser light are focused on a quartz substrate, and
Using a material gas consisting of a mixture of 5IH4 and NofNH3 in a ratio of approximately 1:5:30, 1Noser CVD was used to deposit SiON on the above quartz substrate, the film thickness of which was changed according to the temperature distribution due to the above CO and laser light irradiation. It forms a film of

請求項2の発明もマイクロ1ノンズの製造方法Cあって
、その特徴とする所は、IZ記請求項1の発明に於いて
、石英基板りこ照射するCo21.、/−ザー光として
、波長10.2μmの成分を選択的に用いる点にある。
The invention of claim 2 also includes a method C for manufacturing micro 1 nons, and its feature is that in the invention of claim 1 described in IZ, Co21. ,/- The point is that a component with a wavelength of 10.2 μm is selectively used as the laser light.

請求項3の発明もマイクロレンズの製造方法であって、
その特徴とするところは、上記請求項1または2の方法
で得られるSiONの膜にエツチングを施して、所望の
レンズ面形状を得る点にある。
The invention of claim 3 is also a method for manufacturing a microlens,
The feature of this method is that a desired lens surface shape is obtained by etching the SiON film obtained by the method of claim 1 or 2 above.

請求項4の発明は、上記請求項1または2または3の方
法で製造されるマイタロレンズそ九自体である。
The invention according to claim 4 is a mitalo lens itself manufactured by the method according to claim 1, 2, or 3 above.

また、請求項5の発明は請求項4のマイクロ1ノンズの
組成を特定したものであり7その組成比は略、Si;7
2〜25at11%、N;20−25atd、O;50
〜56atm%の原子量組成比である。
In addition, the invention of claim 5 specifies the composition of the micro 1 nons of claim 4, and the composition ratio is approximately Si;
2-25at11%, N; 20-25atd, O; 50
The atomic weight composition ratio is ~56 atm%.

[作  用コ 前述したSi3N、物質膜によるマイクロレンズに割れ
が発生しやすいのはSi3N、と石英基板との間の熱膨
張率の差が大きいためであると老犬られるい即ち、5.
13N4の物質膜を形成したのち全体が昂却する過程で
石英基板とSi、tL物質膜との熱膨張率差のため両者
の冷却に伴う収縮量に大きな差が生ずる。この差は当初
Si3N4の物質膜にスI・レスとして吸収さ九るがス
トレスがある程度以[−となると割れが発生するのであ
る。
[Function] It is widely accepted that cracks tend to occur in the microlens made of the Si3N material film mentioned above because of the large difference in thermal expansion coefficient between the Si3N and the quartz substrate.
During the entire cooling process after forming the 13N4 material film, a large difference occurs in the amount of shrinkage caused by cooling of the quartz substrate and the Si, tL material film due to the difference in thermal expansion coefficient between the two. This difference is initially absorbed by the Si3N4 material film as scratches, but when the stress exceeds a certain level, cracks occur.

そこで本発明では、マイクロレンズを構成する物質膜と
して石英基板との熱膨張率の差の小さいSiONを用い
ることにより、」二記問題に解決した。
Therefore, in the present invention, the second problem is solved by using SiON, which has a small difference in thermal expansion coefficient from the quartz substrate, as the material film constituting the microlens.

かかるSiONの物質膜を形成するために51ノーザー
光どしてはCO2レーザー光が用いらJz、  レーザ
ーCVD(7JtJI物質ど[、y−rはS、iH,、
No、NH,(7)混合ガスが用いら九る。これらのガ
スの混合比(分圧比)はSiH4:NO:NJ:1:5
:30の近傍の値が選択される。混合比&:おけるNO
の分圧が小さく例六ば−1−記分圧比におLプる値5に
対1..t ”c コ程度とすると、石英基板との熱膨
張率の差が然程小さくならず、やはりストレスLこよる
割れが発生してしまう。またNOの分圧比の値が大きく
成りすぎると、物質膜の表面形状が温度分布に対して忠
実でなくなり、膜の裾野が広がった形状とな−、てマイ
クロ1ノンズとしての適性に欠けたものとなってしまう
、また、CO2レーザーは10.2μmの波長のものの
ばか10.6μm等、他の波長のものも発振できる。
In order to form such a SiON material film, CO2 laser light such as 51 norther light is used, and laser CVD (7JtJI material etc., yr is S, iH, . . .
No, NH, (7) mixed gas is used. The mixing ratio (partial pressure ratio) of these gases is SiH4:NO:NJ:1:5
: Values near 30 are selected. Mixing ratio &: NO
If the partial pressure of is small, then the partial pressure ratio L is 5 to 1. .. If the value of t ``c'' is about 1, the difference in thermal expansion coefficient with the quartz substrate will not become small enough, and cracks will still occur due to the stress L. Also, if the value of the partial pressure ratio of NO becomes too large, the material The surface shape of the film is no longer faithful to the temperature distribution, and the base of the film becomes wide, making it unsuitable for use as micro-1 nons. It can also oscillate at other wavelengths, such as a wavelength of 10.6 μm.

これらの光の内、波長10.6μmの17−ザー光は。Among these lights, 17-zer light with a wavelength of 10.6 μm.

Iニ記材料ガスに良くエネルギーを吸収されるが、この
波長の成分の光で!ノー・ザーCVDを行うと、SiO
N物質膜の表面1、ニスバイク状の膜成長が生じてマイ
クロレンズの光学性能上の欠点となる場合がある。こ九
を避けるにはCO2レーザーの放射光のうちで材料ガス
に吸収されにくい波長のものを用いるのが良い。特に6
波長+0.2.、口nの1ノ一ザー光成分で1か−ザー
CV l)を行うと、−1−記入バイ))状の膜成長を
完全に防1[、できる。
I. Energy is well absorbed by the material gas, but light with this wavelength component! When performing no-zero CVD, SiO
Varnish-like film growth may occur on the surface 1 of the N material film, which may be a drawback in terms of the optical performance of the microlens. In order to avoid this problem, it is better to use a wavelength of CO2 laser radiation that is less likely to be absorbed by the material gas. Especially 6
Wavelength +0.2. If 1-zer CV l) is performed with 1 laser light component of 1-n, it is possible to completely prevent the film growth of -1-input bi)).

石英基板上を一形成される物質I!傭は、前述の如くガ
ウス型のプロフィルを持つので子れ自体4マイクロI/
ンズと12で用いることが可能であるが、さらにJ二記
物質F2にエツー、T−ング@だ(,1,て所望のiメ
ンズ面形状を実現することができる。。
A substance I formed on a quartz substrate! As mentioned above, the mercury has a Gaussian profile, so the child itself has 4 micro I/
It is possible to use it with lenses and 12, but it is also possible to realize the desired i-mens surface shape by using Etsu and T-ng@(,1,.

[実施例] 以下1図面を参照しながら具体的な実施側番こ即して説
明する。
[Example] A specific example of implementation will be described below with reference to one drawing.

第1図は、レーザーCVDによりマイクロレンズを製造
するための装置を説明図的に示して−る。
FIG. 1 schematically shows an apparatus for manufacturing microlenses by laser CVD.

符号1はCO,レーザー、符号2はガイド光用光源であ
るHe−Neレーザー、符号3はZn5e板、符号4は
ミラー、符号5はZn5e集光レンズ(f=200mm
)。
1 is a CO laser, 2 is a He-Ne laser that is a light source for guide light, 3 is a Zn5e plate, 4 is a mirror, and 5 is a Zn5e condenser lens (f = 200 mm
).

符号6はZn5e窓、符号゛7はナヤンバー・、符号8
は真空ゲージ、符号9はガス漂入管、符号lOは石英基
板、符号11はロータリーポンプ、符号12はグレーテ
ィングを示す。
Code 6 is Zn5e window, code 7 is Nayan bar, code 8
9 is a vacuum gauge, 9 is a gas inlet tube, 1O is a quartz substrate, 11 is a rotary pump, and 12 is a grating.

(具体的な作製例1) チャンバー7内にガス導入管9により材料ガスとして、
 SiH4,NO,NHsを1:5:30の混合比に混
合したものを導入し、全圧7.2・103Paで封じ込
めた。
(Specific Preparation Example 1) A material gas is introduced into the chamber 7 through the gas introduction pipe 9.
A mixture of SiH4, NO, and NHs at a mixing ratio of 1:5:30 was introduced and sealed at a total pressure of 7.2·103 Pa.

CO□レーザー1の放射レーザー光の内、波長10.2
μmのものをグレーティング12により選択し、これを
Zn5eレンズ5により石英基板10上にスポット経略
0.85+a+oのスポットとして集束させ、レーザー
CVDによりSiONの物質膜を形成した。この物質膜
のプロフィルを第2図に実線にて示す、膜の表面形状は
レーザー光の持つガウス型の分布に良く従った形状とな
っている。この物質膜は1石英基板10に近い熱膨張率
を持ち、冷却の過程でも割れが発生することがなかった
Of the laser light emitted by CO□Laser 1, the wavelength is 10.2
A micrometer was selected using the grating 12, and this was focused on the quartz substrate 10 by the Zn5e lens 5 as a spot with a spot diameter of approximately 0.85+a+o, and a SiON material film was formed by laser CVD. The profile of this material film is shown by the solid line in FIG. 2, and the surface shape of the film closely follows the Gaussian distribution of laser light. This material film had a coefficient of thermal expansion close to that of the quartz substrate 10, and no cracks occurred during the cooling process.

この物質膜は、これ自体でもマイクロレンズとしての使
用が可能である(膜厚最大部分の表面形状は球面に適合
し得る。この実施例で得られた第2図の物質膜の上記部
分の曲率半径は5■である)が必要とあらばエツチング
等の処理で所望のレンズ面形状を加工すれば良い。
This material film itself can be used as a microlens (the surface shape of the thickest part of the film can be adapted to a spherical surface). If a radius of 5 cm is required, the desired lens surface shape can be processed by etching or the like.

この実施例では、16BHFによりエツチングを行い、
第2図に破線で示すような曲率半径4mmの球面形状の
レンズ面を作製した。このエツチングの過程においても
ストレスによる割れは発生しなかった。
In this example, etching was performed using 16BHF.
A spherical lens surface with a radius of curvature of 4 mm as shown by the broken line in FIG. 2 was prepared. No cracking due to stress occurred during this etching process.

なお、波長10.6μmのレーザー光でレーザーCVD
を行うと前述のごとくスパイク状の膜成長が生ずること
があるが、かかるスパイク状の膜成長が生じた場合には
、研磨等によりスパイク状部分を除去することができる
In addition, laser CVD is performed using a laser beam with a wavelength of 10.6 μm.
If this is done, spike-like film growth may occur as described above, but if such spike-like film growth occurs, the spike-like portion can be removed by polishing or the like.

(具体的な製造例2) 第1図の装置のチャンバー7内にガス導入管9により、
材料ガスとしてS]H4tNOtNHaをSiH。
(Specific production example 2) A gas introduction pipe 9 is used to introduce the chamber 7 of the apparatus shown in FIG.
S]H4tNOtNHa is used as a material gas.

:NO:NHs =]:5:30の分圧比に混合したも
のを導入し、全圧2.9・10’ Paで封じ込めた。
A mixture of :NO:NHs=]:5:30 was introduced and sealed at a total pressure of 2.9·10' Pa.

この状態で。In this condition.

CO□レーザー1の放射レーザー光のうち波長10.2
μmの光をグレーティング12により選択し、Zn5e
レンズ5により石英基板10の基板表面にスポット経略
1mmのスポットとして集光照射し、SiON膜を作製
した。
Wavelength 10.2 of the emitted laser light of CO□Laser 1
μm light is selected by grating 12, and Zn5e
The surface of the quartz substrate 10 was irradiated with condensed light as a spot with a spot diameter of approximately 1 mm using the lens 5 to produce a SiON film.

このように作製したSiON膜の形状は先の製造例1の
場合と同様であり、このSiON膜をそれ自体で、ある
いは必要に応じてエツチングにより所望のレンズ面形状
に加工してマイクロレンズとすることができる。
The shape of the SiON film produced in this way is the same as in the case of Production Example 1, and this SiON film is processed into the desired lens surface shape by itself or by etching as necessary to form a microlens. be able to.

このようにして形成されたSiONMの組成を、オージ
ェ分光分析により分析した。その結果を第3図に示す。
The composition of the SiONM thus formed was analyzed by Auger spectroscopy. The results are shown in FIG.

第3図(I)は、膜の中心部、第3図(III)は膜の
周辺部、第3図(II)は、上記第3図(I)、 (I
II)の中間部の分析結果を示している。この図から分
かるように、膜の中心部から周辺へ向かうにつれて、N
の原子量組成比が減少し、それに対応して膜の屈折率が
中心から周辺へ向かって次第に低下する傾向がうかがえ
る。
Figure 3 (I) shows the central part of the membrane, Figure 3 (III) shows the peripheral part of the membrane, and Figure 3 (II) shows the above Figure 3 (I).
The analysis results of the middle part of II) are shown. As can be seen from this figure, N
It can be seen that the atomic weight composition ratio of the film decreases, and correspondingly, the refractive index of the film gradually decreases from the center to the periphery.

分析結果によればSiON膜に於けるSi、O,Nの組
成比は、 Si;2(1−25atm%、N;20〜2
5atri%、0;50〜56atm2であった。
According to the analysis results, the composition ratio of Si, O, and N in the SiON film is as follows: Si: 2 (1-25 atm%, N: 20-2
5atri%, 0; 50-56 atm2.

[発明の効果コ 以上、本発明によれば新規なマイクロレンズ及びその製
造方法を提供できる。
[Effects of the Invention] As described above, according to the present invention, a novel microlens and a method for manufacturing the same can be provided.

請求項1の発明によれば、従来問題となっていた製造過
程における物質膜の割れの問題が完全に解消され、請求
項2の発明によれば、請求項1の効果に加えてさらにス
パイク状膜成長の問題を解消できる。また、請求項3の
発明によれば上記請求項1または2の発明の効果に加え
て、所望のレンズ面形状を形成でき、請求項4,5のマ
イクロレンズは製造が容易でしかも歩留まりが高いとい
う効果を有する。
According to the invention of claim 1, the conventional problem of cracking of the material film during the manufacturing process is completely solved, and according to the invention of claim 2, in addition to the effect of claim 1, the spike-like The problem of film growth can be solved. Further, according to the invention of claim 3, in addition to the effects of the invention of claim 1 or 2, a desired lens surface shape can be formed, and the microlenses of claims 4 and 5 are easy to manufacture and have a high yield. It has this effect.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明のンイクロレンズを製造するための装
Vの要部を示す説明図、第211は石英基板上に形成さ
、!1.るSiONの物質膜のプT」フィル(実M)と
エッヂフグ後のプロフィル(破m)を示す図5第3図は
マイクロ1ノンズの組成分析結果の1−例を示す図であ
る。 1 、、、 co、レー・ザー、7゜。7チヤンバー、
fffl!、。
FIG. 1 is an explanatory diagram showing the main parts of a device V for manufacturing the microlens of the present invention, and No. 211 is formed on a quartz substrate. 1. Figure 3 shows an example of the composition analysis results of Micro 1 Nons. 1,,, co, laser, 7°. 7 chambers,
fffl! ,.

Claims (1)

【特許請求の範囲】 1、石英基板上にCO_2レーザー光を集束せしめ、S
iH_4、NO、NH_3を略1:5:30の割合で混
合してなる材料ガスを用い、レーザーCVDにより上記
石英基板上に、上記CO_2レーザー光照射による温度
分布に従って膜厚の変化したSiONの膜を形成するこ
とを特徴とする、マイクロレンズの製造方法。 2、請求項1に於いて、CO_2レーザー光の波長10
.2μmの成分が選択的に石英基板上に集束されること
を特徴とするマイクロレンズの製造方法。 3、請求項1または2の方法で得られるSiONの膜に
エッチングを施して、所望のレンズ面形状を得ることを
特徴とするマイクロレンズの製造方法。 4、請求項1または2または3の方法で製造されるマイ
クロレンズ。 5、略、Si;22〜25atm%、N;20〜25a
tm%、0;50〜56%の原子量組成比を持つことを
特徴とする請求項4記載のマイクロレンズ。
[Claims] 1. CO_2 laser light is focused on a quartz substrate, and S
Using a material gas consisting of a mixture of iH_4, NO, and NH_3 in a ratio of approximately 1:5:30, a SiON film whose thickness changes according to the temperature distribution due to the CO_2 laser beam irradiation is formed on the quartz substrate by laser CVD. A method for manufacturing a microlens, characterized by forming a microlens. 2. In claim 1, the wavelength of the CO_2 laser light is 10
.. A method for manufacturing a microlens, characterized in that a 2 μm component is selectively focused onto a quartz substrate. 3. A method for manufacturing a microlens, comprising etching the SiON film obtained by the method according to claim 1 or 2 to obtain a desired lens surface shape. 4. A microlens manufactured by the method according to claim 1, 2 or 3. 5, abbreviated, Si; 22-25 atm%, N; 20-25a
5. The microlens according to claim 4, having an atomic weight composition ratio of 50 to 56%.
JP19373988A 1988-03-22 1988-08-03 Microlens and its manufacturing method Pending JPH026902A (en)

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JP63-67690 1988-03-22
JP6769088 1988-03-22
JP19373988A JPH026902A (en) 1988-03-22 1988-08-03 Microlens and its manufacturing method

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH026903A (en) * 1988-03-22 1990-01-11 Ricoh Co Ltd Microlens and its manufacturing method
US8253142B1 (en) * 1999-08-27 2012-08-28 Sony Corporation Solid-state imaging device and method of fabricating the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH026903A (en) * 1988-03-22 1990-01-11 Ricoh Co Ltd Microlens and its manufacturing method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH026903A (en) * 1988-03-22 1990-01-11 Ricoh Co Ltd Microlens and its manufacturing method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH026903A (en) * 1988-03-22 1990-01-11 Ricoh Co Ltd Microlens and its manufacturing method
US8253142B1 (en) * 1999-08-27 2012-08-28 Sony Corporation Solid-state imaging device and method of fabricating the same
US8729650B2 (en) 1999-08-27 2014-05-20 Sony Corporation Solid-state imaging device and method of fabricating the same

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