JPH02722U - - Google Patents

Info

Publication number
JPH02722U
JPH02722U JP7742588U JP7742588U JPH02722U JP H02722 U JPH02722 U JP H02722U JP 7742588 U JP7742588 U JP 7742588U JP 7742588 U JP7742588 U JP 7742588U JP H02722 U JPH02722 U JP H02722U
Authority
JP
Japan
Prior art keywords
ammonia water
cleaning liquid
semiconductor wafer
cleaning apparatus
wafer cleaning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7742588U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7742588U priority Critical patent/JPH02722U/ja
Publication of JPH02722U publication Critical patent/JPH02722U/ja
Pending legal-status Critical Current

Links

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  • Cleaning By Liquid Or Steam (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、本考案の一実施例の半導体ウエハー
の洗浄装置の概略構成図である。第2図は、該一
実施例の洗浄液中アンモニア水の濃度の経時変化
図、第3図は、従来の装置による洗浄液中アンモ
ニア水の濃度の経時変化図である。 1……洗浄槽、2……洗浄液供給配管、3……
洗浄液排液配管、4……過酸化水素水補充配管、
5……アンモニア水補充配管、6……エア式駆動
弁制御装置、7……エア式駆動弁。
FIG. 1 is a schematic diagram of a semiconductor wafer cleaning apparatus according to an embodiment of the present invention. FIG. 2 is a graph showing the change over time in the concentration of ammonia water in the cleaning liquid according to the embodiment, and FIG. 3 is a graph showing the change over time in the concentration of ammonia water in the cleaning liquid according to the conventional apparatus. 1...Cleaning tank, 2...Cleaning liquid supply piping, 3...
Cleaning liquid drain pipe, 4...Hydrogen peroxide replenishment pipe,
5...Ammonia water replenishment piping, 6...Air-driven valve control device, 7...Air-driven valve.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] アンモニア水と過酸化水素水の混合液を洗浄液
として使用する半導体ウエハーの洗浄装置におい
て、洗浄液の中にアンモニア水を定期的又は連続
的に補充する機構を有することを特徴とする半導
体ウエハーの洗浄装置。
A semiconductor wafer cleaning apparatus that uses a mixture of ammonia water and hydrogen peroxide as a cleaning liquid, the semiconductor wafer cleaning apparatus having a mechanism for periodically or continuously replenishing the cleaning liquid with ammonia water. .
JP7742588U 1988-06-10 1988-06-10 Pending JPH02722U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7742588U JPH02722U (en) 1988-06-10 1988-06-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7742588U JPH02722U (en) 1988-06-10 1988-06-10

Publications (1)

Publication Number Publication Date
JPH02722U true JPH02722U (en) 1990-01-05

Family

ID=31302410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7742588U Pending JPH02722U (en) 1988-06-10 1988-06-10

Country Status (1)

Country Link
JP (1) JPH02722U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5946032A (en) * 1982-09-09 1984-03-15 Hitachi Ltd Cleaning device
JPS61281532A (en) * 1985-06-07 1986-12-11 Hitachi Ltd Method and device for adjusting concentration of semiconductor cleaning liquid

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5946032A (en) * 1982-09-09 1984-03-15 Hitachi Ltd Cleaning device
JPS61281532A (en) * 1985-06-07 1986-12-11 Hitachi Ltd Method and device for adjusting concentration of semiconductor cleaning liquid

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