JPH0317580U - - Google Patents

Info

Publication number
JPH0317580U
JPH0317580U JP7812289U JP7812289U JPH0317580U JP H0317580 U JPH0317580 U JP H0317580U JP 7812289 U JP7812289 U JP 7812289U JP 7812289 U JP7812289 U JP 7812289U JP H0317580 U JPH0317580 U JP H0317580U
Authority
JP
Japan
Prior art keywords
lead
insulating substrate
semiconductor
semiconductor device
contactor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7812289U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7812289U priority Critical patent/JPH0317580U/ja
Publication of JPH0317580U publication Critical patent/JPH0317580U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】
第１図は本考案の実施例を示す要部側断面図、
第２図は本考案装置のソケツトへの半導体装置の
着脱を説明する要部側断面図、第３図は従来の半
導体製造装置の要部側断面図である。

Claims (1)

    【実用新案登録請求の範囲】
  1. 半導体ペレツトを被覆した外装材の側壁より複
    数本のリードを導出し各リードの中間部を同一方
    向に折り曲げ半導体装置の各リード中間部乃至遊
    端外面を絶縁基板に植立した接触子と接触させ通
    電試験する半導体製造装置において、上記絶縁基
    板に半導体装置を貫通する穴を穿設したことを特
    徴とする半導体製造装置。
JP7812289U 1989-06-30 1989-06-30 Pending JPH0317580U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7812289U JPH0317580U (ja) 1989-06-30 1989-06-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7812289U JPH0317580U (ja) 1989-06-30 1989-06-30

Publications (1)

Publication Number Publication Date
JPH0317580U true JPH0317580U (ja) 1991-02-21

Family

ID=31621113

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7812289U Pending JPH0317580U (ja) 1989-06-30 1989-06-30

Country Status (1)

Country Link
JP (1) JPH0317580U (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015166734A (ja) * 2014-02-13 2015-09-24 セイコーインスツル株式会社 Ｉｃ検査用ソケットおよびそれを用いた検査方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015166734A (ja) * 2014-02-13 2015-09-24 セイコーインスツル株式会社 Ｉｃ検査用ソケットおよびそれを用いた検査方法

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