JPH03197880A - Output display method for defective data by in-circuit tester - Google Patents

Abstract

PURPOSE:To perform debugging operation smoothly and speedily and to improve the operability by displaying inspection data which do not match standards as defective data in the decreasing order of the difference between measurement data and reference data. CONSTITUTION:A measurement test is conducted first through a measurement part 24 in measurement steps according to a specific procedure and the measurement data are compared with the reference data stored in the memory 23 of a CPU 21 through an arithmetic control part 22 to decide whether or not the data meet the set standards. Then it is decided that the measurement data do not meet the set standards of the reference data, the differences between the measurement data and reference data are found. Then the data are displayed as defective data on a display means 25 in the decreasing order of the differences. Consequently, a measurement step to be confirmed preferentially can be known immediately in the debugging operation, which is carried out smoothly and speedily according to a data list to improve the operability.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a method for outputting and displaying defective data by an in-circuit tester, and more specifically, the present invention relates to a method for outputting and displaying defective data by an in-circuit tester. The present invention relates to a method for outputting and displaying defective data using an in-circuit tester, which is capable of outputting and displaying measurement data determined to be defective data as defective data in descending order of the difference between them and reference data.

[Prior Art] In testing a circuit board using an in-circuit tester, a board fixing device called a fixture is used.

This fixture is equipped with multiple probe bins that correspond to measurement points on the board to be tested, and provides measurement signals through these probe bins, and also outputs the response signals as measurement data. By comparing this measurement data with standard data obtained from the non-defective data that has been previously absorbed from the corresponding location on a non-defective board, it is possible to determine whether the measurement point is good or bad. The defective data that has been sorted can be output and displayed via a display or printer.

FIG. 4 shows a conventional example of an output display pattern of defective data by this type of in-circuit tester. According to the figure, the display section 1 displays a measurement step number display field 2, a bin number display field 3, a measured value display field 4, a sufficiency rate display field 5, an allowable range value display field 6, etc. It looks like this.

Of these, the step number display column 2 indicates the measurement step in which measurement data that does not match the standard was detected among the measurement steps predetermined in relation to the board to be inspected, and the bin number display column 3 is adapted to teach the number of the probe bin used in the measurement step in which measurement data that does not match the criteria was detected.

In addition, the measured value display field 4 displays impedance, which is the measurement data actually measured in the measurement step,
The sufficiency rate display field 5 displays, for example, the rate at which the measured data displayed in the measured value display field 4 suffices with respect to the impedance as reference data, which is pre-absorbed from a corresponding location on a non-defective board. It has become.

Furthermore, the allowable range value display field 6 displays the allowable range regarding the sufficiency rate of the actually measured data with respect to the reference data absorbed from the non-defective board.

Therefore, the display unit 1 can display the defective data 8 in the order of the measurement steps. Therefore, by checking the data list output and displayed on the display unit 1, the measurement person can It is now possible to individually identify defective measurement points among the measurement points in .

[Problems to be Solved by the Invention] By the way, according to the above-mentioned conventional method, it is possible to list and display defective data in the order of measurement steps, and it can be said that it is excellent in listability in that respect.

On the other hand, the defect data includes data that is far from the acceptable sufficiency rate, as well as data that is very far from the allowable sufficiency rate, making it difficult to intuitively grasp the priority of points that need to be checked during debugging. It has been pointed out that there are disadvantages such as ease of use and poor workability.

[Means for Solving the Problems] The present invention has been made in view of the above-mentioned problems of the conventional method, and its structural feature is that measurement data can be acquired in the order of measurement steps from the board to be inspected. an arithmetic control section that compares and calculates each measurement data taken in through this measurement section with each corresponding reference data; and an arithmetic control section that compares and calculates each measurement data taken in through this measurement section and each corresponding reference data, and inspects the comparison results between the measurement data and the corresponding reference data for each measurement step. It has a memory that can be stored as data and an output means that is output-controlled, and each of the measurement data taken in through the measurement section has a relationship with reference data that is set in advance corresponding to each measurement step. The quality of the test data is determined by
The purpose is to output and display defective data in descending order of the difference between it and the corresponding reference data.

[Function] For this reason, each measurement data obtained from each measurement point of the board to be inspected in the order of measurement steps is compared with corresponding reference data set in advance, and stored in the memory as inspection data that can be judged as good or bad. can do.

In addition, inspection data that does not meet the standards can be output and displayed as defective data via the display means in the order of the difference between the measured data and the standard data, so it can be inspected with priority when depacking. The necessary measurement steps can be known immediately, and the depacking work can be performed smoothly and quickly in accordance with this data list, thereby improving work efficiency.

[Embodiment] Hereinafter, an embodiment of the present invention will be described in detail with reference to the accompanying drawings.

FIG. 1 is a functional block diagram showing an example of the essential configuration of an in-circuit tester used to implement the method of the present invention. The CPU (
The comparison calculation is performed via the calculation control unit 22 that constitutes the central processing unit) 11, and the test data obtained as a result is
The series of test data stored in this way can be stored in the memory 23, and all or only the defective data 18 can be stored on the CRT as a data list.
It is possible to output and display the information on display means 25, which is comprised of a display device such as a printer, etc., or a printer.

FIG. 2 is a flowchart showing an example of the processing procedure of the method for outputting and displaying defective data according to the present invention.

That is, according to the figure, a measurement test is first performed on the board to be inspected via the measurement unit 24 in accordance with a predetermined procedure for each measurement step, and the measurement data obtained as a result is The data is compared with standard data acquired from corresponding locations on the non-defective board and stored in the memory 23 via the arithmetic control section 22, and it is determined whether or not the set standard has been reached.

At this time, if it is determined that the measurement data reaches the set standard in relation to the corresponding reference data, the result is stored in the memory 23 as inspection data, and then the measurement test of the next measurement step is started. After that, the same process is repeated until the final measurement step.

On the other hand, if it is determined that the measured data does not meet the set standard in relation to the corresponding reference data, a process is performed to find the difference between the measured data and the reference data.

In this way, after determining the difference between the measurement data and the reference data, data items with larger differences are displayed as defective data 18 on the display unit 11 in order of magnitude.

FIG. 3 shows the defective data 1 displayed on the display section 11 at this time.
8 shows an example of display pattern No. 8.

According to the figure, the display unit 11 includes a measurement step number display field 12 in addition to defective data 18, as well as a bin number display field 13.
, a measured value display field 14, a sufficiency rate display field 15, an acceptable range value display field 16, and a disparity display field 17 are displayed.

Among these, the step number display column 12 indicates the measurement step in which measurement data that does not match the standard was detected among the measurement steps predetermined in relation to the board to be inspected, and the bin number display column 13 is adapted to teach the number of the probe bin used in the measurement step in which measurement data that does not match the criteria was detected.

In addition, the measured value display column 14 displays the impedance, which is the measurement data actually measured in the measurement step, and the sufficiency rate display column 15 displays the impedance, which is the measurement data actually measured in the relevant measurement step, and the sufficiency rate display column 15 displays the impedance, which is the reference data that has been absorbed in advance from the corresponding location on the non-defective board. The ratio of the measurement data displayed in the measurement value display field 14 to the impedance is displayed.

Furthermore, the tolerance range value display column 16 displays the tolerance range for the sufficiency rate of the actually measured measurement data with respect to the reference data absorbed from the non-defective board, and the disparity display 1
1117 displays the disparity between the numerical value displayed in the sufficiency rate display column 15 and the closest numerical value displayed in the allowable range value display column 16.

After displaying the defective data 18 on the display section 11 using such a display pattern, the process moves to the next measurement step, a measurement test, and thereafter, the same process is repeated until the final measurement step.

Since the output display method according to the present invention is performed as described above, each measurement data obtained from each measurement point of the board to be inspected in the order of the measurement steps is matched with preset reference data. It can be compared via the arithmetic control unit 22 and stored in the memory 23 as inspection data that allows determination of quality.

Moreover, as shown in FIG. 3, inspection data that does not meet the standards is the difference between the measured data and the standard data, and in the example, the numerical value displayed in the sufficiency rate display column 15 and the allowable range value display column. The disparity (displayed in the disparity display column 17 in the figure) between the numerical values that are more similar to those displayed in 16 is displayed as defective data 18 in descending order of numerical value via the display section 11 constituting the display means 25. The output can be displayed.

Therefore, during depacking, it is possible to immediately know which measurement steps should be inspected with priority, and according to this data list, the depacking work can be carried out smoothly and quickly to improve work efficiency. .

[Effects of the Invention] As described above, according to the method of the present invention, each measurement data obtained from each measurement point of the board to be inspected in the order of the measurement steps is stored in the memory as inspection data that can be used to determine whether it is good or bad. In addition, the inspection data that does not meet the standard can be output and displayed as defective data through the display means in the order of the difference between the measured data and the standard data, so when depacking the , it is possible to immediately know which measurement steps are to be prioritized for confirmation, and it is possible to perform depacking work smoothly and quickly in accordance with this data list, thereby improving work efficiency.

[Brief explanation of drawings]

FIG. 1 is a functional block diagram showing an example of the main part configuration of an in-circuit tester used for carrying out the method of the present invention, and FIG.
3 is an explanatory diagram showing an example of a display pattern of defective data on a display unit constituting an in-circuit tester;
The figure is an explanatory diagram showing an example of a display pattern of defective data according to a conventional method. 11...Display section, 12...Step number display column, 13...Bin number display column, 14...Measurement value display column, 15...Sufficiency rate display column, 16...Tolerance range value Display field, 17...Disparity display field, 21...CPU
, 22... Arithmetic control unit, 23... Memory, 24
...Measurement unit, 25...Display means Fig. 1 Fig. 3 Fig. 2 Fig. 4

Claims (1)

[Claims] (1) A measurement unit that can take in measurement data from the board to be inspected in the order of measurement steps, and a calculation control unit that compares and calculates each measurement data taken in through this measurement unit and each corresponding reference data. , a memory capable of storing comparison results between the measurement data and the corresponding reference data as inspection data for each measurement step, and an output means whose output is controlled, and each of the measurement data taken in through the measurement section The quality of inspection data is determined based on the relationship with standard data set in advance for each measurement step, and inspection data that does not meet the standards are classified as defective data in descending order of the difference between them and the corresponding standard data. A method for outputting and displaying defective data using an in-circuit tester, which is characterized by displaying the output.