JPH03215968A - Semiconductor cooling device - Google Patents

Semiconductor cooling device

Info

Publication number
JPH03215968A
JPH03215968A JP2010641A JP1064190A JPH03215968A JP H03215968 A JPH03215968 A JP H03215968A JP 2010641 A JP2010641 A JP 2010641A JP 1064190 A JP1064190 A JP 1064190A JP H03215968 A JPH03215968 A JP H03215968A
Authority
JP
Japan
Prior art keywords
heat sink
header
cooling
ring
cooling fluid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2010641A
Other languages
Japanese (ja)
Inventor
Noriyuki Ashiwake
芦分 範行
Takahiro Oguro
崇弘 大黒
Shizuo Zushi
頭士 鎮夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2010641A priority Critical patent/JPH03215968A/en
Publication of JPH03215968A publication Critical patent/JPH03215968A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/851Dispositions of multiple connectors or interconnections
    • H10W72/874On different surfaces
    • H10W72/877Bump connectors and die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

PURPOSE:To enable a cooling device to be improved in cooling power and easily assembled or disassembled and to surely trap a cooling fluid inside it by a method wherein a heat sink is fixed to a semiconductor device, a base which is long in an axial direction is provided to the heat sink, and the side face of the base is connected to a cooling fluid feed header with a an O-ring. CONSTITUTION:Heat released from a semiconductor device 3 is conducted to a heat sink 4 through the intermediary of a solder layer 5. The heat sink 4 is connected to a header 7 with a base 6 and an O-ring 9, and heat transferred to the heat sink 4 is removed by fluid which is made to flow into the heat sink 4 through a nozzle 10. The fluid flowing out of the heat sink 4 is made to flow into the lower jacket of the header 7 of a double structure and discharged outside of the header 7. The trapping of the cooling fluid is made through the O-ring 9 between the side face of the heat sink base 6 and the side of a header opening 8. By this setup, a cooling device of this design can be improved n cooling capacity and easily assembled or disassembled and a cooling fluid can surely be trapped.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は機器の冷却に係り、特に、高発熱密度の半導体
チップ、又は、パッケージの冷却に好適である半導体冷
却装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to cooling equipment, and more particularly to a semiconductor cooling device suitable for cooling semiconductor chips or packages with high heat generation density.

〔従来の技術〕[Conventional technology]

多層配線基板上に多数搭載されたLSIチップ」二に、
チップ面に垂直な平板フィンで構成されたヒートシンク
を装着し、これに冷却流体を流入,流出させるための楕
円断面をもつベローズ状の管を二本取り付けた構造がU
 S P 4686606に記載されている。この従来
技術では、上記ベローズは冷却流体を供給するためのヘ
ッダ底面に半田等により金属的に固着される。
``LSI chips mounted in large numbers on multilayer wiring boards'' Second,
U has a structure in which a heat sink consisting of flat fins perpendicular to the chip surface is attached, and two bellows-shaped tubes with elliptical cross sections are attached to this for cooling fluid to flow in and out.
It is described in S P 4686606. In this prior art, the bellows is metallically fixed by solder or the like to the bottom surface of a header for supplying cooling fluid.

これに対し、ベローズをOリングを用いて冷却水供給ヘ
ッダにねし止めする構造が、例えば、特開昭61− 7
1650号公報に記載されている。
On the other hand, a structure in which the bellows is screwed onto the cooling water supply header using an O-ring is proposed, for example, in JP-A-61-7.
It is described in Publication No. 1650.

また、半導体素子上に冷媒だめを取り付け、冷媒だめの
先端を冷媒供給ヘッダ部に設けられたシーリング材に突
き当てて冷媒をシールする構造が特開昭60−7225
2号公報に開示されている。
In addition, a structure in which a refrigerant reservoir is mounted on a semiconductor element and the tip of the refrigerant reservoir is brought into contact with a sealing material provided in a refrigerant supply header section to seal the refrigerant is disclosed in Japanese Patent Laid-Open No. 60-7225.
It is disclosed in Publication No. 2.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上記従来技術には次のような問題があった。 The above conventional technology has the following problems.

U S P4686606において開示されている技術
では、フィンと冷却流体との間の熱抵抗は極めて小さく
することが可能であるため、この冷却性能を生かすため
にはチップとヒートシンク間の熱抵抗を十分小さく押え
ることが重要である。チップとヒートシンク間の熱抵抗
をヒートシンク側の冷却性能に充分見合う程度に小さく
押える方法としては現在のところ半田等により金属的に
固着する方法が最も有望である。この従来技術では、ヒ
ートシンクに取り付けられるベローズが冷却流体供給ヘ
ッダに固着されているため、この構成をとろうとすると
固着箇所がヘツダベローズ間及びヒー1一シンクーチツ
プ間の二ケ所になるため組立及び分解が非常に難しくな
るという問題が生じる。一般に、大型の基板に多数搭載
されたLSIは保守作業の必要が生じることが多いため
この問題は極めて重大である。
With the technology disclosed in USP 4,686,606, the thermal resistance between the fins and the cooling fluid can be made extremely small, so in order to take advantage of this cooling performance, the thermal resistance between the chip and the heat sink must be made sufficiently small. It is important to hold down. At present, the most promising method for keeping the thermal resistance between the chip and the heat sink low enough to match the cooling performance of the heat sink is to bond them metallically using solder or the like. In this conventional technology, the bellows attached to the heat sink is fixed to the cooling fluid supply header, so if this configuration is attempted, there will be two fixed points: between the header bellows and between the heat sink and the sink chip, making assembly and disassembly very difficult. The problem arises that it becomes difficult to Generally, this problem is extremely serious because a large number of LSIs mounted on a large board often require maintenance work.

特開昭60−71650号公報に記載されている従来技
術においても、ベローズと半導体素子間の接触熱抵抗を
充分小さい値に下げるためにはベローズと半導体素子間
を金属的に固着する方法が有効であるが、この冷却技術
ではベローズを○リングを用いて冷却水供給ヘッダにね
じ止めしているため、この構成をとった場合に組立,分
解が極めて困難になる。
Even in the conventional technology described in JP-A-60-71650, a method of metallically fixing the bellows and the semiconductor element is effective in reducing the contact thermal resistance between the bellows and the semiconductor element to a sufficiently small value. However, in this cooling technology, the bellows are screwed to the cooling water supply header using a circle ring, so this configuration makes assembly and disassembly extremely difficult.

3 特開昭60 − 72252号に開示されている技術で
は、組み立て、分解は容易であるが、シーリング材に冷
媒だめ先端部を突き当ててシールしているため、シール
に必要な圧力が、直接、半導体素子に加わる。半導体素
子は微小な半田ボールを介して基板上に搭載されること
が多く、この場合、一般に半田ボールには大きな圧力を
かけることができないため、シールの充分な信頼性を保
つのに必要な圧力を確保することが困難である。また、
基板の反りや個々の半導体素子の傾きや高さのばらつき
によって、シーリング材に加わる圧力が個々の半導体素
子に取り付けられた冷媒だめ毎に微妙に変化するため、
シール信頼性の点で問題が生じる可能性もある。
3 The technique disclosed in JP-A-60-72252 is easy to assemble and disassemble, but because the tip of the refrigerant reservoir is sealed against the sealing material, the pressure required for sealing is not applied directly. , added to semiconductor devices. Semiconductor devices are often mounted on a substrate via tiny solder balls, and in this case, it is generally not possible to apply large pressure to the solder balls, so the pressure required to maintain sufficient seal reliability is limited. It is difficult to ensure that Also,
The pressure applied to the sealant varies slightly depending on the refrigerant reservoir attached to each semiconductor element, due to the warpage of the substrate and variations in the tilt and height of individual semiconductor elements.
Problems may also arise in terms of seal reliability.

本発明の目的は、上記従来技術の問題点を解決するため
の冷却装置を提供することにある。即ち、ヒートシンク
を半導体素子に、直接、固着して冷却性能を高め、且つ
、組立,分解が容易であり、さらに冷却流体のシールが
確実である冷却装置を提供することにある。
An object of the present invention is to provide a cooling device for solving the problems of the prior art described above. That is, the object of the present invention is to provide a cooling device that improves cooling performance by directly fixing a heat sink to a semiconductor element, is easy to assemble and disassemble, and has reliable sealing of cooling fluid.

4 〔課題を解決するための手段〕 上記目的は、ヒートシンクに冷却流体を導入するための
管にある程度の長さの口金部を設け、この口金部を冷却
流体供給ヘッダに設けられた開孔部に挿入し、口金部の
側面をOリングでシールすることにより達成される。
4 [Means for Solving the Problems] The above purpose is to provide a pipe with a certain length for introducing cooling fluid into a heat sink, and to connect this cap to an opening provided in a cooling fluid supply header. This is achieved by inserting the cap into the cap and sealing the side of the mouthpiece with an O-ring.

さらに、シール性を向上するにはOリングを二本用いた
ダブルリング構造にするのが効果的である。
Furthermore, in order to improve the sealing performance, it is effective to use a double ring structure using two O-rings.

半導体素子に加わる応力を低減するには、冷却流体供給
ヘッダの開孔部にベローズを取り付け.この先端に、円
筒面にOリングをもつ円筒状のカプラを取り付けるのが
9k#!−的である。
To reduce the stress applied to semiconductor devices, a bellows is installed in the opening of the cooling fluid supply header. Attach a cylindrical coupler with an O-ring on the cylindrical surface to the tip of this 9k#! - It is true.

〔作用〕[Effect]

ヒートシンクに冷却流体を導入するための管に設けられ
た、ある程度の軸方向長さを有する口金部は、その側面
において、冷却流体の供給ヘッダの開孔部に設けられた
Oリングに、冷却流体をシールするのに必要、且つ、十
分な半径方向の圧カを与えるように作用するとともに、
軸方向には0リングとの接触面で容易にすべるようなす
べり面を形成するように作用する。また、口金部はある
程度の軸方向長さをもっているため、半導体素子を搭載
する基板のそりや搭載高さのばらつき等の寸法誤差を容
易に吸収し、かつ、Oリングのシール圧をこれらの寸法
誤差に影響されず、常に、定に保つように作用する。こ
れにより,冷却装置の組立時には、口金部を冷却流体供
給ヘッダの開孔部に単に挿入するだけでOリングには必
要、且つ、充分で均一なシール圧力をかけることができ
るとともに、半導体素子面には過大な軸応力を与えない
ようにすることができる。従って、個々の半導体素子に
過大な応力をかけることなく冷匍流体を確実にシールし
、且つ、組み立て作業が極めて容易になる。さらに,装
置の分解時には口金部を開孔部から抜き取るだけである
から、半導体素子に過大な応力を加えることなく極めて
容易に作業ができる。
A mouthpiece having a certain axial length provided on a pipe for introducing cooling fluid into the heat sink has a side surface that connects the cooling fluid to the O-ring provided in the opening of the cooling fluid supply header. act to provide the necessary and sufficient radial pressure to seal the
In the axial direction, it acts to form a sliding surface that easily slides on the contact surface with the O-ring. In addition, since the cap has a certain length in the axial direction, it can easily absorb dimensional errors such as warpage of the board on which the semiconductor element is mounted and variations in the mounting height. It is not affected by errors and always works to keep it constant. As a result, when assembling the cooling device, by simply inserting the mouthpiece into the opening of the cooling fluid supply header, it is possible to apply the necessary and sufficient uniform sealing pressure to the O-ring, and to protect the semiconductor element surface. It is possible to avoid applying excessive axial stress to the Therefore, the cold fluid can be reliably sealed without applying excessive stress to the individual semiconductor elements, and assembly work can be extremely facilitated. Furthermore, when disassembling the device, since the base portion is simply pulled out from the opening, the work can be done extremely easily without applying excessive stress to the semiconductor element.

また、冷却流体供給ヘッダの開孔部に取り付けられたべ
ローズは、半導体素子に加わる面内応力を低減する作用
がある。
Further, the bellows attached to the opening of the cooling fluid supply header has the effect of reducing in-plane stress applied to the semiconductor element.

〔実施例〕〔Example〕

以下、本発明の実施例を第1図及び第2図により説明す
る。多層配線基板1上に微小な半田ポール2を介して半
導体素子34搭載される。半導体素子3の上面にはヒー
トシンク4が半田5により固着される。ヒートシンク4
は軸方向にある程度の長さをもつ口金部6をもった。配
線基板1には冷却流体を供給するためのヘツダ7が取り
付けられ、ヘツダ7の底面には、個々の半感体素子1の
搭載位置に対応する位置に開孔部8が設けられ、その内
面にOリング9が設けられる。ヘツダ7は二重構造にな
っており、上側のジャケツ1・から個個にヒートシンク
4に向かってノズル10が伸びている。
Embodiments of the present invention will be described below with reference to FIGS. 1 and 2. A semiconductor element 34 is mounted on a multilayer wiring board 1 via minute solder poles 2. A heat sink 4 is fixed to the upper surface of the semiconductor element 3 with solder 5. heat sink 4
has a cap portion 6 having a certain length in the axial direction. A header 7 for supplying cooling fluid is attached to the wiring board 1, and an opening 8 is provided on the bottom surface of the header 7 at a position corresponding to the mounting position of each semi-sensor element 1. An O-ring 9 is provided. The header 7 has a double structure, and nozzles 10 extend individually from the upper jacket 1 toward the heat sink 4.

次に、本実施例の作用を説明する。半導体素子]で発生
した熱は半田層5を介してヒー1・シンク4に伝えられ
る。ヒー1・シンク4は、口金6と○リング9によりヘ
ツダ7に接続される。ヒートシンクに伝えられた熱はノ
ズル10によりヒートシ7 ンク4に流入した流体により除去される。ヒートシンク
4より流出した流体は、二重構造を有するヘッダの下側
ジャケットに流入しヘッダ外部に排出される。冷却流体
のシールは、ヒートシンクロ金部6の側面と、ヘッダ開
孔部8の側面間で○リング9により構成される。第2図
は口金構造の拡大図である。
Next, the operation of this embodiment will be explained. The heat generated in the semiconductor element is transferred to the heat sink 4 via the solder layer 5. The heat sink 1 and the sink 4 are connected to the header 7 by a base 6 and a ring 9. The heat transferred to the heat sink is removed by the fluid flowing into the heat sink 4 through the nozzle 10. The fluid flowing out from the heat sink 4 flows into the lower jacket of the header having a double structure and is discharged to the outside of the header. A cooling fluid seal is formed by a ring 9 between the side surface of the heat sink metal part 6 and the side surface of the header opening 8. FIG. 2 is an enlarged view of the cap structure.

第3図に本発明の第二の実施例を示す。○リングを二個
用いたダブルリング構造にしたものであり、冷却流体の
シール信頼性が増す。
FIG. 3 shows a second embodiment of the invention. ○It has a double ring structure using two rings, increasing the seal reliability of the cooling fluid.

第4図に本発明の第三の実施例を示す。Oリングをヒー
トシンクの口金側レ;設けたものであり、Oリングを取
り付けが容易になる。
FIG. 4 shows a third embodiment of the present invention. The O-ring is provided on the base side of the heat sink, making it easy to attach the O-ring.

第5図に本発明の第四の実施例を示す。開孔部8にベロ
ーズ11を取り付け、その先端に、円筒面にOリングを
設けた円筒状のカプラ12を設けた。本実施例では、半
導体素子4に加わる面内応力を低減する効果がある。
FIG. 5 shows a fourth embodiment of the present invention. A bellows 11 was attached to the opening 8, and a cylindrical coupler 12 with an O-ring provided on the cylindrical surface was provided at the tip of the bellows 11. This embodiment has the effect of reducing in-plane stress applied to the semiconductor element 4.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、半導体素子に固着されたヒー8− トシンクをヒートシンクに設けた袖方向長さをもつ口金
部の側面においてOリングで冷却流体をシールするよう
にしたので、冷却性能が高く、且つ、組立,分解が容易
であり、冷却流体のシールが確実である。
According to the present invention, the heat sink fixed to the semiconductor element is provided on the heat sink, and the cooling fluid is sealed with an O-ring on the side surface of the cap part having the length in the sleeve direction, so that the cooling performance is high. Furthermore, it is easy to assemble and disassemble, and the sealing of the cooling fluid is reliable.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例の断面図、第2図はその部分
詳細図、第3図は本発明の第二の実施例の断面図、第4
図は本発明の第三の実施例の断面図、第5図は本発明の
第四の実施例の断面図である。 1・・多層配線基板、2・・・半田ボール、3・・半導
体素子、4・・・ヒートシンク、5・・・半田、6・・
口金部、7・・・ヘッダ、8・・・開孔部、9・・・○
リング、1o・・・1 特開乎 3 215968 (5)
FIG. 1 is a cross-sectional view of one embodiment of the present invention, FIG. 2 is a partial detailed view thereof, FIG. 3 is a cross-sectional view of a second embodiment of the present invention, and FIG.
The figure is a sectional view of a third embodiment of the invention, and FIG. 5 is a sectional view of a fourth embodiment of the invention. 1...Multilayer wiring board, 2...Solder ball, 3...Semiconductor element, 4...Heat sink, 5...Solder, 6...
Base part, 7... Header, 8... Opening part, 9...○
Ring, 1o...1 JP3 215968 (5)

Claims (1)

【特許請求の範囲】 1、基板状に搭載された半導体素子と、基板に取り付け
られた冷却流体供給ヘッダによつて構成される半導体冷
却装置において、 前記半導体素子にヒートシンクを固着し、かつ、前記ヒ
ートシンクに軸方向長さを有する口金部を設け、前記口
金部の側面をOリングによつて冷却流体供給ヘッダに接
続することを特徴とする半導体冷却装置。
[Scope of Claims] 1. A semiconductor cooling device comprising a semiconductor element mounted on a substrate and a cooling fluid supply header attached to the substrate, further comprising: a heat sink fixed to the semiconductor element; A semiconductor cooling device characterized in that a heat sink is provided with a base portion having an axial length, and a side surface of the base portion is connected to a cooling fluid supply header by an O-ring.
JP2010641A 1990-01-22 1990-01-22 Semiconductor cooling device Pending JPH03215968A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010641A JPH03215968A (en) 1990-01-22 1990-01-22 Semiconductor cooling device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010641A JPH03215968A (en) 1990-01-22 1990-01-22 Semiconductor cooling device

Publications (1)

Publication Number Publication Date
JPH03215968A true JPH03215968A (en) 1991-09-20

Family

ID=11755842

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010641A Pending JPH03215968A (en) 1990-01-22 1990-01-22 Semiconductor cooling device

Country Status (1)

Country Link
JP (1) JPH03215968A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5880524A (en) * 1997-05-05 1999-03-09 Intel Corporation Heat pipe lid for electronic packages
US6243944B1 (en) * 1997-12-08 2001-06-12 Unisys Corporation Residue-free method of assembling and disassembling a pressed joint with low thermal resistance
EP0630046B1 (en) * 1993-06-21 2002-02-27 Nec Corporation Cooling apparatus for integrated circuit chips

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0630046B1 (en) * 1993-06-21 2002-02-27 Nec Corporation Cooling apparatus for integrated circuit chips
US5880524A (en) * 1997-05-05 1999-03-09 Intel Corporation Heat pipe lid for electronic packages
US6243944B1 (en) * 1997-12-08 2001-06-12 Unisys Corporation Residue-free method of assembling and disassembling a pressed joint with low thermal resistance

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