JPH0322596A - Structure for and method of cooling integrated circuit device - Google Patents
Structure for and method of cooling integrated circuit deviceInfo
- Publication number
- JPH0322596A JPH0322596A JP1155898A JP15589889A JPH0322596A JP H0322596 A JPH0322596 A JP H0322596A JP 1155898 A JP1155898 A JP 1155898A JP 15589889 A JP15589889 A JP 15589889A JP H0322596 A JPH0322596 A JP H0322596A
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- circuit element
- cooling
- nozzle
- coolant
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Cooling Or The Like Of Electrical Apparatus (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔概要〕
集積回路素子の冷却構造、及びその冷却方法に係り、特
に集積回路素子面に対して冷風をノズルより噴射して集
積回路素子の冷却を行う集積回路素子の冷却構造、及び
その冷却方法に関し、冷却時のバラッキを無くし、且つ
異なる発熱量を持つ部品が実装された基板を効率良く冷
却することを目的とし、
第1の発明を基板上に実装された集積回路素子に対して
、ノズルより冷媒を噴出させて該集積回路素子を冷却し
てなる集積回路素子の冷却構造において、
前記ノズルより噴射された前記冷媒が前記集積回路素子
に衝突した後、平行移動する平行噴流を遮断するフェン
スを該集積回路素子上に形成して構威し、
及び第2の発明を集積回路素子と、該集積回路素子の発
熱量より小さな発熱量を持つ部品とを混在実装してなる
基板と、冷媒を噴射するノズルが形成された冷媒通路を
有するチャンバとを有してなる集積回路素子の冷却構造
において、該基板上に実装された該集積回路素子に対し
て、該ノズルより該冷媒を衝突させて該集積回路素子を
冷却してなる集積回路素子の冷却方法であって、前記ノ
ズルより噴射された前記冷媒が前記集積回路素子に衝突
した後、平行移動する第1の発明の平行流を用いて該部
品の冷却を行うように構或する。[Detailed Description of the Invention] [Summary] This invention relates to a cooling structure for an integrated circuit element and a method for cooling the same, and in particular to a cooling structure for an integrated circuit element in which the integrated circuit element is cooled by jetting cold air from a nozzle onto the surface of the integrated circuit element. The first invention relates to a cooling structure and a cooling method thereof, and is aimed at eliminating variations during cooling and efficiently cooling a board on which components having different calorific values are mounted. In a cooling structure for an integrated circuit element, which cools the integrated circuit element by jetting a refrigerant from a nozzle to the circuit element, the refrigerant jetted from the nozzle collides with the integrated circuit element, and then moves in parallel. A fence is formed on the integrated circuit element to block the parallel jet flow generated by the integrated circuit element, and the second invention is implemented by co-mounting the integrated circuit element and a component having a heat generation amount smaller than that of the integrated circuit element. In the cooling structure for an integrated circuit device, the cooling structure includes a substrate made of A method for cooling an integrated circuit device comprising colliding the refrigerant from a nozzle to cool the integrated circuit device, the method comprising a first step in which the refrigerant injected from the nozzle moves in parallel after colliding with the integrated circuit device. The parallel flow of the invention is used to cool the component.
本発明は、集積回路素子の冷却構造、及びその冷却方法
に係り、特に集積回路素子面に対して冷風をノズルより
噴射して集積回路素子の冷却を行う集積回路素子の冷却
構造、及びその冷却方法に関するものである。The present invention relates to a cooling structure for an integrated circuit element and a method for cooling the same, and more particularly to a cooling structure for an integrated circuit element that cools the integrated circuit element by jetting cold air from a nozzle onto the surface of the integrated circuit element, and for cooling the integrated circuit element. It is about the method.
第5図は従来の冷却構造を示すものであり、41は基板
、42は集積回路素子、43はバンプ、44は吸気ファ
ン、45はチャンバ、46は冷媒通路、47はノズル、
48は終端抵抗、49は後壁、F4は冷媒、F5は平行
流、F6は衝突噴流をそれぞれ示している。FIG. 5 shows a conventional cooling structure, in which 41 is a substrate, 42 is an integrated circuit element, 43 is a bump, 44 is an intake fan, 45 is a chamber, 46 is a coolant passage, 47 is a nozzle,
48 is a terminal resistor, 49 is a rear wall, F4 is a refrigerant, F5 is a parallel flow, and F6 is a colliding jet.
従来、集積回路素子42と、集積回路素子の発熱量より
その発熱量が小である部品、例えば終端抵抗48とが混
在実装されてなる基板41を冷却する方法として、端部
に冷媒F4を吸引する吸気ファン44を有し、且つその
冷媒F4が通る冷媒通路46及びその冷媒通路46の一
側面から突出3一
−4
してなるノズル47が形成されたチャンバ45を基板4
1上に装着し、基板41上に実装された各集積回路素子
42及び終端抵抗48に対してノズル47より冷媒F4
を噴射させ、集積回路素子42及′び終端抵抗48から
発する熱を強制的に冷却していた。Conventionally, as a method for cooling a board 41 on which an integrated circuit element 42 and a component whose heat value is smaller than that of the integrated circuit element, such as a terminating resistor 48, are mounted together, coolant F4 is sucked into the end. A chamber 45 is attached to the substrate 4, and has an intake fan 44, and a refrigerant passage 46 through which the refrigerant F4 passes, and a nozzle 47 protruding from one side of the refrigerant passage 46.
Refrigerant F4 is applied from the nozzle 47 to each integrated circuit element 42 and the terminating resistor 48 mounted on the substrate 41.
was injected to forcibly cool down the heat generated from the integrated circuit element 42 and the terminating resistor 48.
しかしながら従来では、ノズルから噴射された冷媒が集
積回路素子もしくは終端抵抗に衝突した後に平行移動す
る平行流が、風下側の衝突噴流に干渉し冷却にバラツキ
が発生する問題があった。However, in the past, there was a problem in that the parallel flow that moves in parallel after the refrigerant injected from the nozzle collides with the integrated circuit element or the terminating resistor interferes with the colliding jet flow on the leeward side, causing variations in cooling.
つまり、本来、集積回路素子(終端抵抗)の中心とノズ
ルの中心とを一直線上に配置して集積回路素子(終端抵
抗)に衝突した後の衝突噴流が集積回路素子表面を左右
均一に移行してゆくようにすることで、左右の冷却にバ
ラツキが発生しないようにしている。しかし平行流が風
下側の衝突噴流に干渉することで、上記一直線の関係が
壊れてしまい、冷却にバラツキが発生していた。In other words, originally, the center of the integrated circuit element (terminal resistor) and the center of the nozzle were arranged in a straight line so that the collision jet after colliding with the integrated circuit element (terminal resistor) would move uniformly from side to side over the surface of the integrated circuit element. This prevents variations in cooling between the left and right sides. However, as the parallel flow interferes with the impinging jet on the lee side, the linear relationship described above is broken, causing variations in cooling.
更に、従来は基板上に実装される部品(集積回路素子及
び終端抵抗)全てにノズルからの冷媒を噴射していたた
め、基板に実装された各部品対応に最適冷却を行うこと
が困難であった。つまり、集積回路素子と終端抵抗とは
その発熱量が異なっているため、各部品の発熱量に対応
して風量を調節することが困難であった。風量を調節す
る方法としてノズル径を可変する等が考えられるが、こ
れでは構造自体が複雑になるという欠点があった。Furthermore, in the past, refrigerant was injected from a nozzle onto all components mounted on the board (integrated circuit elements and terminating resistors), making it difficult to provide optimal cooling for each component mounted on the board. . In other words, since the amount of heat generated by the integrated circuit element and the terminating resistor are different, it has been difficult to adjust the air volume in accordance with the amount of heat generated by each component. One possible way to adjust the air volume is to vary the nozzle diameter, but this has the disadvantage of complicating the structure itself.
従って、冷却時のバラツキを無くし、且つ異なる発熱量
を持つ部品が実装された基板を効率良く冷却することを
百的とするものである。Therefore, the objective is to eliminate variations in cooling and to efficiently cool a board on which components having different amounts of heat are mounted.
かかる目的は、第1に基板上に実装された集積回路素子
に対して、ノズルより冷媒を噴出させて該集積回路素子
を冷却してなる集積回路素子の冷却構造において、
前記ノズルより噴射された前記冷媒が前記集積回路素子
に衝突した後、平行移動する平行噴流を5
6
遮断するフェンスを該集積回路素子上に形成したことを
特徴とする集積回路素子の冷却構造、及び第2に集積回
路素子と、該集積回路素子の発熱量より小さな発熱量を
持つ部品とを混在実装してなる基板と、冷媒を噴射する
ノズルが形成された冷媒通路を有するチャンバとを有し
てなる集積回路素子の冷却構造において、該基板上に実
装された該集積回路素子に対して、該ノズルより該冷媒
を衝突させて該集積回路素子を冷却してなる集積回路素
子の冷却方法でちって、
前記ノズルより噴射された前記冷媒が前記集積回路素子
に衝突した後、平行移動する請求項1記載の平行流を用
いて該部品の冷却を行うことを特徴とする集積回路素子
の冷却方法、により達威される。This purpose is firstly to provide an integrated circuit device cooling structure in which a refrigerant is ejected from a nozzle to cool the integrated circuit device mounted on a substrate. A cooling structure for an integrated circuit device, characterized in that a fence is formed on the integrated circuit device to block parallel jets that move in parallel after the refrigerant collides with the integrated circuit device; An integrated circuit element comprising: a substrate on which a component and a component having a calorific value smaller than the calorific value of the integrated circuit element are mounted; and a chamber having a refrigerant passage in which a nozzle for injecting refrigerant is formed. A method of cooling an integrated circuit element by colliding the refrigerant from the nozzle against the integrated circuit element mounted on the substrate to cool the integrated circuit element. A method for cooling an integrated circuit device, characterized in that the component is cooled using a parallel flow according to claim 1, wherein the refrigerant injected from the cooling medium moves in parallel after colliding with the integrated circuit device. be done.
上記構威及び方法とすることにより本発明では、集積回
路素子に衝突した後風下側に向かって平行移行する平行
流は、風下側の集積回路素子表面に設けられたフェンス
によりその平行流の移行が制限され、風下側の集積回路
素子に噴射される噴射噴流に干渉を及ぼすことが軽減さ
れる。By employing the above structure and method, in the present invention, the parallel flow that moves in parallel toward the leeward side after colliding with the integrated circuit element can be moved by a fence provided on the surface of the integrated circuit element on the leeward side. is restricted, and interference with the jet stream injected to the integrated circuit element on the leeward side is reduced.
更に本発明では、基板上に実装された部品の内で発熱量
の比較的大きい発熱体である集積回路素子のみにノズル
からの冷媒を噴射による冷却を行い、集積回路素子に衝
突した風下側に向かって平行移行する平行流を使用して
発熱量の比較的小さい終端抵抗等の部品を冷却すること
で基板上に実装された各部品の発熱量に対応した冷却を
行うことが可能となる。Furthermore, in the present invention, coolant is jetted from a nozzle to cool only the integrated circuit element, which is a heat generating element with a relatively large amount of heat among the components mounted on the board, and the coolant is injected from the nozzle to the leeward side that collides with the integrated circuit element. By cooling components such as a terminating resistor that generate a relatively small amount of heat using a parallel flow that moves parallel to the substrate, it becomes possible to perform cooling corresponding to the amount of heat generated by each component mounted on the board.
以下、本発明の第1及び第2の実施例を詳細にに説明す
る。Hereinafter, first and second embodiments of the present invention will be described in detail.
第1図は本発明の第lの実施例を示す図であり、第2図
は本発明の第2の実施例を示す図である。FIG. 1 is a diagram showing a first embodiment of the invention, and FIG. 2 is a diagram showing a second embodiment of the invention.
第1図及び第2図において、1は基板、2は集積回路素
子、3はバンプ、4は第1の吸気ファン、5はチャンバ
、6は冷媒通路、7はノズル、8は7
8
フェンス、9は接着剤、10は第2の吸気ファン、l1
は終端抵抗、F1は冷媒、F2は平行流、F3は衝突噴
流をそれぞれ示す。1 and 2, 1 is a substrate, 2 is an integrated circuit element, 3 is a bump, 4 is a first intake fan, 5 is a chamber, 6 is a refrigerant passage, 7 is a nozzle, 8 is a 7 8 fence, 9 is the adhesive, 10 is the second intake fan, l1
is a terminal resistance, F1 is a refrigerant, F2 is a parallel flow, and F3 is a colliding jet.
尚、第1図及び第2図において同一符号を付したものは
同一対象物を示す。Note that the same reference numerals in FIG. 1 and FIG. 2 indicate the same objects.
まず第1の実施例について説明する。First, a first example will be described.
基板1上には複数の集積回路素子2が実装されており、
その接合部分はバンプ3を介することにより電気的導通
がとられている。一方、この基板1の上方にはその集積
回路素子2を空冷にて冷却させるため、第1図中左方よ
り吸気ファン4より冷媒F1を取り込み、その冷媒F1
が通る冷媒通路6を有し、冷媒通路6の集積回路素子側
2側面に集積回路素子2の実装位置に対応し、且つ集積
回路素子2表面に対して垂直に配置されたノズル7が形
成されたチャンバ5が設けられている。そして、冷媒通
路6を通った冷媒F1はノズル7から集積回路素子2表
面に噴射され、その噴射噴流F3により集積回路素子2
から発された熱が奪われ、集積回路素子2の冷却が行わ
れる。集積回路素子2に衝突した冷媒F3は図示してい
ないが、第1図の右方に設けられている排気ファンの排
気作用により、右方に平行流F2として移行してゆく。A plurality of integrated circuit elements 2 are mounted on a substrate 1,
Electrical continuity is established between the bonded portions via the bumps 3. On the other hand, in order to cool the integrated circuit element 2 by air cooling, a coolant F1 is taken in from the left side in FIG.
A nozzle 7 is formed on two side surfaces of the refrigerant passage 6 on the integrated circuit element side, corresponding to the mounting position of the integrated circuit element 2 and arranged perpendicularly to the surface of the integrated circuit element 2. A chamber 5 is provided. The refrigerant F1 that has passed through the refrigerant passage 6 is injected from the nozzle 7 onto the surface of the integrated circuit element 2, and the jet stream F3 causes the integrated circuit element 2 to
The heat emitted from the integrated circuit element 2 is removed, and the integrated circuit element 2 is cooled. Although not shown, the coolant F3 that has collided with the integrated circuit element 2 moves to the right as a parallel flow F2 due to the exhaust action of the exhaust fan provided on the right side of FIG.
基板l上には複数の集積回路素子2が実装されており、
これら集積回路素子2に対応してノズル7が設けられて
いることから、この平行流F2が風下側の衝突噴流F3
と干渉を引き起こし冷却に問題が発生してくる。このた
め、集積回路素子2の表面にこの平行流F2の移行を制
限する四方を枠で囲んだボックス上のフェンス8を設け
ている。この接合部は第2図に示すように熱伝導性に優
れた接着剤9によりその固着を行う構造の他、フェンス
の一端を延長し、かつその延長部にノッチを設けておき
、このノッチで集積回路素子の側面を押圧する圧接構造
としてもよい。更に、このフェンス8とノズル7の高さ
方向の位置関係は、冷却効率の向上等を考慮した上で、
第1図に示すようにフェンス8の一端とノズル7の一端
とが長さl程度に重なるようにしている。A plurality of integrated circuit elements 2 are mounted on the substrate l,
Since the nozzles 7 are provided corresponding to these integrated circuit elements 2, this parallel flow F2 is caused by the colliding jet flow F3 on the lee side.
This causes interference and causes problems with cooling. For this reason, a box-like fence 8 is provided on the surface of the integrated circuit element 2, which is surrounded by a frame on all sides and restricts the migration of the parallel flow F2. As shown in Figure 2, this joint has a structure in which it is fixed using an adhesive 9 with excellent thermal conductivity, as well as a structure in which one end of the fence is extended and a notch is provided in the extension. It may also be a pressure contact structure that presses the side surface of the integrated circuit element. Furthermore, the positional relationship in the height direction between the fence 8 and the nozzle 7 is determined by considering improvements in cooling efficiency, etc.
As shown in FIG. 1, one end of the fence 8 and one end of the nozzle 7 overlap each other by a length l.
又、本発明の第2の実施例については第3図を9 10 用いて説明する。Regarding the second embodiment of the present invention, FIG. 10 I will explain using
第3図における基板1は集積回路素子2の他その実装密
度を考慮した上で終端抵抗l1が複数実装されている(
例えば集積回路素子間)。この終端抵抗l1は集積回路
素子2よりその発熱量は一般的に小さい。本発明はこの
点に着目してノズル7から噴射される冷媒F3を用いた
所詮、噴射冷却というのは冷却効率が良いことが知られ
ている)、終端抵抗l1につ、いてはその実装位置には
ノズル7を形成せずに、集積回路素子2に衝突した後、
平行移動する平行流F2を用いて終端抵抗11の冷却を
行うようにしている。この平行流F2は集積回路素子2
が発する熱を奪ってやや温まっているものの、1から発
された熱を奪い、終端抵抗l1を冷却を行うことは充分
可能である。The board 1 in FIG. 3 has a plurality of terminating resistors l1 mounted thereon in consideration of the integrated circuit element 2 and its mounting density (
e.g. between integrated circuit elements). The amount of heat generated by this terminating resistor l1 is generally smaller than that of the integrated circuit element 2. The present invention focuses on this point and uses the refrigerant F3 injected from the nozzle 7 (after all, injection cooling is known to have good cooling efficiency), and also determines the mounting position of the terminating resistor l1. After colliding with the integrated circuit element 2 without forming a nozzle 7,
The terminating resistor 11 is cooled using the parallel flow F2 that moves in parallel. This parallel flow F2 is connected to the integrated circuit element 2.
Although it is slightly warmed by taking away the heat emitted by 1, it is sufficiently possible to take away the heat emitted from 1 and cool down the terminating resistor l1.
しかし、第3図において(先に説明した第1図において
も同様であるが)、第3図中右方には排気ファンが設け
られており、この排気ファンの排気動作に基づいて温ま
った冷媒を冷却装置外部に排気するわけであるが、第4
図に示されるように、平行流の影響によりその排気ファ
ン13の近傍に冷媒の流れの澱みが発生し(第4図中、
破線で囲まれた領域)、冷却能率に悪影響を与える問題
がある。このため、本例ではその排気能力を向上させる
ためにフェンス8を設け、その平行流F2の影響を少な
くして上述の流れの澱みを無くすようにしている。However, in Fig. 3 (the same is true in Fig. 1 explained earlier), an exhaust fan is provided on the right side of Fig. 3, and the refrigerant is heated by the exhaust operation of this exhaust fan. is exhausted to the outside of the cooling device.
As shown in the figure, stagnation of the refrigerant flow occurs near the exhaust fan 13 due to the influence of the parallel flow (in Figure 4,
(area surrounded by a broken line), there is a problem that adversely affects cooling efficiency. For this reason, in this example, a fence 8 is provided in order to improve the exhaust capacity, thereby reducing the influence of the parallel flow F2 and eliminating the above-mentioned flow stagnation.
更に第2の吸気ファンlOを設けることにより、尚一層
の冷却能力の向上がはかれる。Furthermore, by providing a second intake fan IO, the cooling capacity can be further improved.
〔発明の効果〕
以上詳細に説明したように本発明においては、以下のよ
うな長所がある。[Effects of the Invention] As described above in detail, the present invention has the following advantages.
■平行流と衝突噴流との干渉をなくすためにフェンスを
設けたため、冷却能力が安定する。■ Cooling capacity is stabilized because a fence is installed to eliminate interference between parallel flow and colliding jets.
■集積回路素子のみノズルからの噴射を行い、集積回路
素子より発熱量が小である終端抵抗については、平行流
の排気を兼ねて平行噴流を用いて冷却を行っているので
、従来と比較して装置自体の構造の簡略化を望める。■Only the integrated circuit element is injected from the nozzle, and the terminating resistor, which generates less heat than the integrated circuit element, is cooled using parallel jets that also serve as parallel flow exhaust, so compared to conventional methods, Therefore, the structure of the device itself can be simplified.
11 1211 12
第1図は本発明の第lの実施例を示す図、第2図は本発
明のフェンス接合構造を示す図、第3図は本発明の第2
の実施例を示す図、第4図は本発明における冷媒の流れ
を示す図、第5図は従来の冷却構造を示す図である。
図において、
lは基板、
2は集積回路素子、
5はチャンバ、
6は冷媒通路、
7はノズル、
8はフェンス、
11は部品(終端抵抗)、
F1は冷媒、
F2は平行流、
F3は噴射噴流をそれぞれ示す。
13
$ 1 11 1=布゛け乃オj基の沌ネ,港 ネオ
図第4図FIG. 1 is a diagram showing a first embodiment of the present invention, FIG. 2 is a diagram showing a fence joining structure of the present invention, and FIG. 3 is a diagram showing a second embodiment of the present invention.
FIG. 4 is a diagram showing the flow of refrigerant in the present invention, and FIG. 5 is a diagram showing a conventional cooling structure. In the figure, l is the substrate, 2 is the integrated circuit element, 5 is the chamber, 6 is the coolant passage, 7 is the nozzle, 8 is the fence, 11 is the component (terminal resistor), F1 is the coolant, F2 is the parallel flow, and F3 is the injection The jets are shown respectively. 13 $ 1 11 1 = Chaos of Cloth, Minato Neo
Figure 4
Claims (2)
に対して、ノズル(7)より冷媒(F1)を噴射させて
該集積回路素子(2)を冷却してなる集積回路素子の冷
却構造において、 前記ノズル(7)より噴射された前記冷媒(F1)が前
記集積回路素子(2)に衝突した後、平行移動する平行
流(F2)を遮断するフェンス(8)を該集積回路素子
(2)に形成したことを特徴とする集積回路素子の冷却
構造。(1). Integrated circuit element (2) mounted on substrate (1)
In contrast, in a cooling structure for an integrated circuit element in which the integrated circuit element (2) is cooled by injecting a refrigerant (F1) from a nozzle (7), the refrigerant (F1) injected from the nozzle (7) ) collides with the integrated circuit element (2), and a fence (8) is formed on the integrated circuit element (2) to block the parallel flow (F2) moving in parallel. structure.
の発熱量より小さな発熱量を持つ部品(11)とを混在
実装してなる基板(1)と、冷媒(F1)を噴射するノ
ズル(7)が形成された冷媒通路(6)を有するチャン
バ(5)とを有してなる集積回路素子の冷却構造におけ
る該基板(1)上に実装された該集積回路素子(2)に
対して、該ノズル(7)より該冷媒(F1)を衝突させ
て該集積回路素子(2)を冷却してなる集積回路素子の
冷却方法であって、 前記ノズル(7)より噴射された前記冷媒(F1)が前
記集積回路素子(2)に衝突した後、平行移動する請求
項1記載の平行流(F2)を用いて該部品(11)の冷
却を行うことを特徴とする集積回路素子の冷却方法。(2). integrated circuit element (2) and the integrated circuit element (2)
A chamber (1) having a substrate (1) formed by co-mounting components (11) having a calorific value smaller than the calorific value of 5) Colliding the coolant (F1) from the nozzle (7) against the integrated circuit element (2) mounted on the substrate (1) in the integrated circuit element cooling structure comprising: A method for cooling an integrated circuit element, comprising: cooling the integrated circuit element (2) by cooling the integrated circuit element (2), the method comprising: after the refrigerant (F1) injected from the nozzle (7) collides with the integrated circuit element (2); A method for cooling an integrated circuit device, characterized in that the component (11) is cooled using the parallel flow (F2) according to claim 1, which moves in parallel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1155898A JP2738563B2 (en) | 1989-06-20 | 1989-06-20 | Cooling structure of integrated circuit element and cooling method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1155898A JP2738563B2 (en) | 1989-06-20 | 1989-06-20 | Cooling structure of integrated circuit element and cooling method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0322596A true JPH0322596A (en) | 1991-01-30 |
| JP2738563B2 JP2738563B2 (en) | 1998-04-08 |
Family
ID=15615922
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1155898A Expired - Fee Related JP2738563B2 (en) | 1989-06-20 | 1989-06-20 | Cooling structure of integrated circuit element and cooling method thereof |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2738563B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010230430A (en) * | 2009-03-26 | 2010-10-14 | Fujifilm Corp | Radiation detector |
| CN106535589A (en) * | 2017-01-03 | 2017-03-22 | 上海理工大学 | Impact jet device for heat dissipation of electronic component |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6428896A (en) * | 1987-07-23 | 1989-01-31 | Fujitsu Ltd | Cooling device for semiconductor element |
| JPH0268956A (en) * | 1988-09-02 | 1990-03-08 | Nec Corp | Cooling structure of integrated circuit |
| JPH02237200A (en) * | 1989-03-10 | 1990-09-19 | Nec Corp | Cooling structure of integrated circuit |
-
1989
- 1989-06-20 JP JP1155898A patent/JP2738563B2/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6428896A (en) * | 1987-07-23 | 1989-01-31 | Fujitsu Ltd | Cooling device for semiconductor element |
| JPH0268956A (en) * | 1988-09-02 | 1990-03-08 | Nec Corp | Cooling structure of integrated circuit |
| JPH02237200A (en) * | 1989-03-10 | 1990-09-19 | Nec Corp | Cooling structure of integrated circuit |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010230430A (en) * | 2009-03-26 | 2010-10-14 | Fujifilm Corp | Radiation detector |
| CN106535589A (en) * | 2017-01-03 | 2017-03-22 | 上海理工大学 | Impact jet device for heat dissipation of electronic component |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2738563B2 (en) | 1998-04-08 |
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