JPH03242549A - Metallic component analyzer - Google Patents
Metallic component analyzerInfo
- Publication number
- JPH03242549A JPH03242549A JP3872590A JP3872590A JPH03242549A JP H03242549 A JPH03242549 A JP H03242549A JP 3872590 A JP3872590 A JP 3872590A JP 3872590 A JP3872590 A JP 3872590A JP H03242549 A JPH03242549 A JP H03242549A
- Authority
- JP
- Japan
- Prior art keywords
- concentration
- liquid supply
- column
- switching valve
- metal ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000007788 liquid Substances 0.000 claims abstract description 82
- 229910021645 metal ion Inorganic materials 0.000 claims abstract description 32
- 239000012086 standard solution Substances 0.000 claims description 39
- 239000003480 eluent Substances 0.000 claims description 31
- 239000002184 metal Substances 0.000 claims description 27
- 229910052751 metal Inorganic materials 0.000 claims description 27
- 238000011282 treatment Methods 0.000 claims description 4
- 239000000523 sample Substances 0.000 description 38
- 238000010828 elution Methods 0.000 description 7
- 238000005070 sampling Methods 0.000 description 7
- 238000004040 coloring Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 5
- 238000000926 separation method Methods 0.000 description 5
- 239000012295 chemical reaction liquid Substances 0.000 description 4
- 238000009833 condensation Methods 0.000 description 4
- 230000005494 condensation Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 230000008602 contraction Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000012488 sample solution Substances 0.000 description 3
- 238000002835 absorbance Methods 0.000 description 2
- 239000003153 chemical reaction reagent Substances 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 230000032258 transport Effects 0.000 description 2
- 235000017166 Bambusa arundinacea Nutrition 0.000 description 1
- 235000017491 Bambusa tulda Nutrition 0.000 description 1
- 241001330002 Bambuseae Species 0.000 description 1
- 235000015334 Phyllostachys viridis Nutrition 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 239000011425 bamboo Substances 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000012468 concentrated sample Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000004821 distillation Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000005342 ion exchange Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 229910021642 ultra pure water Inorganic materials 0.000 description 1
- 239000012498 ultrapure water Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Landscapes
- Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
Abstract
Description
【発明の詳細な説明】
「産業上の利用分野」
この発明は、イオン交換分離性を用いて、特に、超純水
中の微量な金属成分を効率良く分析できる金属成分の分
析装置に関するものである。[Detailed Description of the Invention] "Industrial Application Field" This invention relates to a metal component analyzer that can efficiently analyze minute amounts of metal components in ultrapure water using ion exchange separation. be.
「従来の技術」
従来の液体成分分析装置として、例えば特願昭63−1
80521号公報に示される技術が知られている。"Prior art" As a conventional liquid component analyzer, for example,
A technique disclosed in Japanese Patent No. 80521 is known.
この液体成分分析装置について第3図を参照して説明す
ると、まず、図中符号1は自動流路切換弁である。This liquid component analyzer will be described with reference to FIG. 3. First, reference numeral 1 in the figure is an automatic flow path switching valve.
この自動流路切換弁1の出口には試料l夜供給路30が
接続され、この試料l夜供給路30には、]二流か与下
流に向かって順次、加圧ポンプ2、反応謂3、オーバー
フロー容訝4、三方自動切換弁5、加圧ポンプ6、圧力
スイッチ6Aが取り付けられている。そしてこの試料液
供給路30は最終的に第1四方切換弁7に接続されてい
る。A sample supply channel 30 is connected to the outlet of the automatic flow path switching valve 1, and the sample supply channel 30 is equipped with a pressurizing pump 2, a reaction so-called 3, An overflow capacity 4, a three-way automatic switching valve 5, a pressurizing pump 6, and a pressure switch 6A are attached. This sample liquid supply path 30 is finally connected to the first four-way switching valve 7.
この第1四方切換弁7には、第1a縮カラム8への流入
路8aと第2濃縮カラム9への流入路9aと処理i(l
供給路31か接続されている。処理液供給路31には、
圧力スイノチ17Aと加圧ポンプ17と溶離液貯留部1
8かそれぞれ設けられている。This first four-way switching valve 7 has an inflow path 8a to the 1a condensation column 8, an inflow path 9a to the second concentration column 9, and a treatment i(l
The supply path 31 is also connected. The processing liquid supply path 31 includes
Pressure switch 17A, pressurization pump 17, and eluent reservoir 1
There are 8 each.
前記第11農縮カラム8からの流出路8bと第21農縮
カラム9からの流出路9bは第2四方切換弁10に接続
されている。この第2四方切換弁10には、さらに分離
カラム11と吸光光度計12とからなる分析手段32に
つなかるライン33と排水路34につなかるライン35
か接続されている。The outflow path 8b from the eleventh agricultural contraction column 8 and the outflow path 9b from the twenty-first agricultural contraction column 9 are connected to a second four-way switching valve 10. This second four-way switching valve 10 further includes a line 33 connected to an analysis means 32 consisting of a separation column 11 and an absorption photometer 12, and a line 35 connected to a drainage channel 34.
or connected.
ライン35には流量計19か取り付けられている。A flow meter 19 is attached to the line 35.
また試料液供給路30の反応器3の上流側には、試料液
中の金属をイオン化する試薬を供給する反応液di:給
路37か接続されている。そしてこの反応液供給路37
には加圧ポンプ16と反応酸味留部15か設けSれてい
る。Further, a reaction liquid di: supply path 37 is connected to the upstream side of the reactor 3 of the sample liquid supply path 30 to supply a reagent for ionizing metals in the sample liquid. And this reaction liquid supply path 37
A pressurizing pump 16 and a reaction sour distillation section 15 are provided therein.
さらに分析手段32の分離カラム11と吸光光度計12
との間には、金属イオンを発色させる試薬を供給ための
発色液供給路38か接続されている。この発色液供給路
38には、加圧ポンプ20と発色液貯留部21が設けら
れている。Furthermore, the separation column 11 of the analysis means 32 and the spectrophotometer 12
A coloring liquid supply path 38 for supplying a reagent for coloring metal ions is connected between the two. This coloring liquid supply path 38 is provided with a pressure pump 20 and a coloring liquid storage section 21 .
つぎにこの金属成分分析装置の動作を説明する。Next, the operation of this metal component analyzer will be explained.
前記自動流路切換弁1には、6つの試料1ffl流入路
IA〜IFが接続されている。そしてこれら試料を夜席
入路IA−IFの一つが試料液供給路30に選択的に接
続される。Six sample 1ffl inflow paths IA to IF are connected to the automatic flow path switching valve 1. One of the night seat entry paths IA-IF is selectively connected to the sample liquid supply path 30 for these samples.
試料液供給路30に流入した試料l夜は加圧ポンプ2に
よって反応器3に送られる。その間に試料液には反応液
供給路37から反応液が添加される。The sample flowing into the sample liquid supply path 30 is sent to the reactor 3 by the pressurizing pump 2. During this time, a reaction liquid is added to the sample liquid from the reaction liquid supply path 37.
この反応液か添加された試料液は反応器3中で所定を黒
度で混合される。The reaction solution and the sample solution added thereto are mixed in the reactor 3 at a predetermined blackness.
この反応器3を通過した試料液はオーバーフロー容器4
に一旦貯留されるとともに、一定の貯留量を越えた試料
液は符号り、で示すラインを通じて排水路34に′fJ
l:出される。オーバーフロー容器4を通過した試料液
は三方切換弁5に達する。三方自動切換弁5は、試料液
供給路30を流れる試料液の一部を、符号L3て示すラ
インを通じてυ[水路34に導くものである。すなわち
前記自動流路切換弁1か切り換えられて別の試料液か供
給された場合に、まず、ラインL、側に流路を切り換え
て、自動流路切換弁1と三方切換弁5との間に残留して
いた先の試料液を完全に洗い流す。そしてこの後、流路
を切り換えて試料l戊を試料液供給路30に沿って流す
。The sample liquid that has passed through this reactor 3 is transferred to an overflow container 4.
The sample liquid that exceeds a certain storage amount is temporarily stored in
l: Served. The sample liquid that has passed through the overflow container 4 reaches the three-way switching valve 5. The three-way automatic switching valve 5 guides a part of the sample liquid flowing through the sample liquid supply path 30 to the υ water channel 34 through a line indicated by the symbol L3. That is, when the automatic flow path switching valve 1 is switched and another sample liquid is supplied, the flow path is first switched to the line L side, and the flow path is switched between the automatic flow path switching valve 1 and the three-way switching valve 5. Completely wash away any remaining sample solution. Thereafter, the flow path is switched to allow the sample liquid to flow along the sample liquid supply path 30.
三方切換弁5を通過した試料液は加圧ポンプ6により再
び加圧される。加圧ポンプ6で加圧された試料液は、第
1四方切換弁7によって第1?a縮カラム8あるいは第
2濃縮カラム9に供給される。The sample liquid that has passed through the three-way switching valve 5 is pressurized again by the pressure pump 6. The sample liquid pressurized by the pressurizing pump 6 is transferred to the first four-way switching valve 7 by the first four-way switching valve 7. It is supplied to a condensation column 8 or a second concentration column 9.
この第1四方切換弁7と第2四方切換弁10は、試料液
供給路30から供給される試料液を濃縮カラム8あるい
は9を通過せしめたあとライン35を経て排水路34に
導く金属イオンl農縮工程の流路と、処理液供給路31
から供給される溶離illを濃縮カラA 9あるいは8
を通過せしめたあと分析手段32に導く金属イオン溶離
工程の流路とを、濃縮カラム8,9に対して交互に形成
するものである。この四方切換弁7.IOの切り換えは
、流量計19を通過する試料液の流量4iffが設定の
値になったときに制御部Cから発信される信号によって
行なわれる。The first four-way switching valve 7 and the second four-way switching valve 10 allow the sample liquid supplied from the sample liquid supply path 30 to pass through the concentration column 8 or 9, and then lead to the drain path 34 via the line 35. Agricultural shrinkage process flow path and processing liquid supply path 31
Concentrate the elution ill supplied from A 9 or 8
A flow path for the metal ion elution step, through which the metal ions pass through and then leads to the analysis means 32, is formed alternately with respect to the concentration columns 8 and 9. This four-way switching valve7. The IO switching is performed by a signal sent from the control section C when the flow rate 4iff of the sample liquid passing through the flowmeter 19 reaches a set value.
試料液か濃縮カラム8あるいは9を通過すると試料液中
の金属イオンがカラム8あるいは9に吸着される。この
カラム8あるいは9に吸着された金属イオンは、処理液
供給路31から供給される溶離液によりカラム8あるい
は9から溶離されて分析手段32に運ばれる。When the sample liquid passes through the concentration column 8 or 9, metal ions in the sample liquid are adsorbed by the column 8 or 9. The metal ions adsorbed on the column 8 or 9 are eluted from the column 8 or 9 by the eluent supplied from the processing liquid supply path 31 and transported to the analysis means 32.
分析手段32に運ばれた金属イオンは、分離カラム11
で分離された後、時系列的に成分毎に溶出し、発色液供
給路38からの発色液により発色され、吸光光度計12
で濃度測定される。The metal ions carried to the analysis means 32 are transferred to the separation column 11
After separation, each component is eluted in time series, and the color is developed by the coloring liquid from the coloring liquid supply path 38.
The concentration is measured at
「発明が解決しようとする課題」
ところで、上記のように構成された金属成分分析装置で
は、濃縮カラム8・9の濃縮効率、つまり試料液中に含
有される金属イオンか濃縮カラム8・9に捕捉される効
率か異なり、これにより吸光光度計12において検出誤
差が発生し、正確な分析がてきないという問題があった
。"Problems to be Solved by the Invention" By the way, in the metal component analyzer configured as described above, the concentration efficiency of the concentration columns 8 and 9, that is, the concentration efficiency of the concentration columns 8 and 9, that is, the concentration efficiency of the concentration columns 8 and 9, that is, the concentration efficiency of the concentration columns 8 and 9, that is, the concentration efficiency of the concentration columns 8 and 9, There was a problem in that the efficiency with which the particles were captured was different, which caused detection errors in the spectrophotometer 12, making accurate analysis impossible.
そして、このような問題を解決するために、上記金属成
分分析装置では、(−)試料液人流路IA〜lFの一つ
から既知l農度の金属を含有する標準液を注入する、(
ニ)前記標準を夜を試料液供給路30を通して各濃縮カ
ラム8・9に対してそれぞれ供給する、(三)各濃縮カ
ラム8・9に捕捉された前記標準液中の金属イオンをt
@離させて分析手段32において吸光度をそれぞれ測定
するといった工程を順次繰た後、分析手段32において
測定された吸光度を基に、以降の検出値を各1農縮カラ
ム8・9毎に校正させるようにしている。In order to solve such a problem, the metal component analyzer described above injects a standard solution containing a metal with a known concentration from one of the (-) sample liquid flow paths IA to IF.
d) The standard is supplied to each of the concentration columns 8 and 9 through the sample liquid supply path 30 at night; (3) The metal ions in the standard solution captured in each of the concentration columns 8 and 9 are
After sequentially repeating the steps of separating the columns and measuring their absorbances in the analysis means 32, the subsequent detected values are calibrated for each agricultural contraction column 8 and 9 based on the absorbance measured in the analysis means 32. That's what I do.
しかしなから、上記のように構成された金属成分分析装
置では、上記(−)・(ニ)で示すように金属イオン濃
度か既知である標準液か、濃縮カラム8・9に(共給さ
れるまでに必要な工程が多く、よってその供給時間も多
く掛かり、作業能率か低下するという問題かあった。However, in the metal component analyzer configured as above, as shown in (-) and (d) above, standard solutions whose metal ion concentrations are known are not supplied to the concentration columns 8 and 9 (co-fed). There are many steps required to prepare the product, and therefore, it takes a long time to supply the product, resulting in a problem of decreased work efficiency.
この発明は、上記の事情に鑑みてなされたものであって
、分析手段の検出値を校正するための標準液を〆農相カ
ラムに効率良く供給することができ、金属成分の判定開
始までの準備時間を短縮化して、作業能率の向上を図っ
た金属成分分析装置の提供を目的とする。This invention was made in view of the above circumstances, and it is possible to efficiently supply a standard solution for calibrating the detection value of the analysis means to the final phase column, and to prepare for the start of determination of metal components. The purpose of this invention is to provide a metal component analyzer that reduces time and improves work efficiency.
1課題を解決するための手段」
上記目的を達成するために、本発明では、金属イオンを
含有する試料液を供給する試料液供給手段と、前記試料
液中の金属イオンを吸着する濃縮手段と、この濃縮手段
に吸着された金属イオンを溶出させる溶離液等の処理液
を供給する処理液供給手段と、前記濃縮手段から溶出さ
れた金属イオンを分析する分析手段と、前記濃縮手段の
直前に設けられて、前記濃縮手段に対して前記試料液供
給手段からの試料液と前記処理液供給手段からの処理液
とを、選択的に供給する切換弁とを具備し、前記処理l
夜供給手段に、前記濃縮手段に対して溶離液を供給する
溶離液供給手段と、前記濃縮手段に対して既知濃度の金
属イオンか含有される標準液を供給する標準液供給手段
とを設けるようにしている。In order to achieve the above object, the present invention provides a sample liquid supply means for supplying a sample liquid containing metal ions, and a concentration means for adsorbing metal ions in the sample liquid. , a processing liquid supply means for supplying a processing liquid such as an eluent for eluting the metal ions adsorbed by the concentration means, an analysis means for analyzing the metal ions eluted from the concentration means, and immediately before the concentration means. a switching valve that selectively supplies the sample liquid from the sample liquid supply means and the processing liquid from the processing liquid supply means to the concentration means;
The night supply means is provided with an eluent supply means for supplying an eluent to the concentration means, and a standard solution supply means for supplying a standard solution containing metal ions of a known concentration to the concentration means. I have to.
「作用」
この発明によれば、濃縮手段の直前に、該濃縮手段に対
して溶離i(t、あるいは既知濃度の金属イオンが含有
される標準液を選択的にlj給する処理液供給手段が設
けられていることから、判定開始までの間に、標準液を
供給して該標準液中の金属イオンを濃縮手段に捕捉させ
、この後に、該標準r夜に替えて溶離液を供給して、前
記濃縮手段に捕捉された金属イオンを溶離させて分析手
段に供給させることができる。そして、この分析手段に
おいて、前記標準液に含有される既知濃度の金属イオン
の濃度を測定して、前記濃縮手段の濃縮効率を求め、更
にこのlR縮縮小率ら、実際の測定時における分析手段
の測定値を校iトさせることができる。つまり、この発
明では、70縮手段の直前に設けられた処理液供給手段
により、分析手段の検出値を校正するための校正用の標
準液を濃縮カラムに効率良く供給することかできる。"Operation" According to the present invention, immediately before the concentration means, the processing liquid supply means selectively supplies the elution i(t) or the standard solution lj containing a known concentration of metal ions to the concentration means. Since this is provided, a standard solution is supplied and the metal ions in the standard solution are captured by the concentration means before the start of the judgment, and after this, an eluent is supplied in place of the standard solution. The metal ions captured by the concentration means can be eluted and supplied to the analysis means.Then, the analysis means can measure the concentration of metal ions of known concentration contained in the standard solution, and The concentration efficiency of the concentration means can be determined, and the measured value of the analysis means at the time of actual measurement can be calibrated based on this 1R reduction ratio.In other words, in this invention, the The processing liquid supply means can efficiently supply a calibration standard solution for calibrating the detection value of the analysis means to the concentration column.
「実施例」
以下、第1図及び第2図を参訳して本発明の金属成分分
析装置を詳細に説明する。"Example" Hereinafter, the metal component analyzer of the present invention will be described in detail with reference to FIGS. 1 and 2.
なお、本実施例に示す金属成分分析装置は、従来例に示
す金属成分分析装置と基本構成が同一てあり、よって構
成を共通とする部分に同一符号を付し説明を簡略化する
。The metal component analyzer shown in this embodiment has the same basic configuration as the metal component analyzer shown in the conventional example, so parts having the same structure are given the same reference numerals to simplify the explanation.
第1図において符号100で示すものは濃縮カラム8・
9の直前に設けられた処理液供給手段である。In FIG. 1, the symbol 100 indicates the concentration column 8.
9 is a processing liquid supply means provided immediately before.
この処理液供給手段100は、濃縮カラム8・9に対し
て該濃縮カラム8・9に吸着された金属イオンを溶出さ
せる溶離液を供給する溶離液供給手段40と、既知濃度
の金属イオンが含有される標準1夜を供給する標準液供
給手段41とからなるものであって、前記溶離液供給手
段40と標準液供給手段41との間には、前記溶離液供
給手段40からの溶離液、前記標準液供給手段41から
の標li iiを選択的に処理’tR供給路42に案内
する第3四方切換弁42か設けられている。The processing liquid supply means 100 includes an eluent supply means 40 for supplying an eluent to the concentration columns 8 and 9 to elute the metal ions adsorbed in the concentration columns 8 and 9, and an eluent supply means 40 that supplies the concentration columns 8 and 9 with an eluent that elutes metal ions adsorbed in the concentration columns 8 and 9. and a standard solution supplying means 41 for supplying a standard solution to be used, and between the eluent supplying means 40 and the standard solution supplying means 41, an eluent from the eluent supplying means 40, A third four-way switching valve 42 is provided for selectively guiding the reference liquid from the standard solution supply means 41 to the processing 'tR supply path 42.
具体的には、前記溶離液供給手段40は、溶離、夜か貯
留される溶離肢貯留部43と、この溶離夜貯留部43と
第3の四方切換弁42とを接続する溶離液供給路44と
、この溶離を戊貯留部43内の溶離液を輸送する加圧ポ
ンプ45と、前記溶離?夜供給路44の途中に設けられ
て、該溶離液供給路44内の圧力が一定値以上になった
ことを検知する圧力センサ46とから構成されるもので
ある。Specifically, the eluent supply means 40 includes an eluate storage section 43 in which elution and night storage are performed, and an eluent supply path 44 that connects this elution storage section 43 and the third four-way switching valve 42. , a pressurizing pump 45 that transports the eluent in the reservoir 43 , and the eluent? The pressure sensor 46 is provided in the middle of the eluent supply path 44 and detects when the pressure within the eluent supply path 44 exceeds a certain value.
また、前記標準液供給手段40は、既知濃度の金属イオ
ンか含有される標準液が貯留される標準液貯留部47と
、この標準液貯留部47と第3の四方切換弁42とを接
続する標準l夜供給路48と、この標準液貯留部47内
の標準液を輸送する加圧ポンプ49とから構成されるも
のである。Further, the standard solution supply means 40 connects a standard solution storage section 47 in which a standard solution containing metal ions of a known concentration is stored, and this standard solution storage section 47 and the third four-way switching valve 42. It is composed of a standard supply channel 48 and a pressurizing pump 49 that transports the standard solution in the standard solution storage section 47.
なお、前記標準液供給路48には特に圧力センサか設け
られていないが、加圧ポンプ49の吐出圧力か一定値以
上とならないように該圧力センサを設けるようにしても
良い。また、前記第3四方切換弁42には、排水路34
に通しるラインL4か接続されており、このラインr、
4によって処理を夜供給路31に導かれない溶離液、標
準l夜を排出するようにしている。Although a pressure sensor is not particularly provided in the standard solution supply path 48, a pressure sensor may be provided to prevent the discharge pressure of the pressurizing pump 49 from exceeding a certain value. The third four-way switching valve 42 also includes a drainage channel 34.
The line L4 passing through is connected, and this line r,
4, the eluent, which is not introduced into the supply path 31, is discharged.
次に、上記にように構成された金属成分分析装置による
第1濃縮カラム8、第2濃縮カラム9の濃縮効率測定工
程について説明する。なお、この工程は、通常の金属成
分分析工程を行う前に行うものである。Next, a process of measuring the concentration efficiency of the first concentration column 8 and the second concentration column 9 using the metal component analyzer configured as described above will be explained. Note that this step is performed before performing a normal metal component analysis step.
まず、第1濃度カラム8の濃縮効率測定工程について(
−)〜(三)を参照して説明する。First, regarding the concentration efficiency measurement process of the first concentration column 8 (
This will be explained with reference to -) to (3).
(−)第3四方切換弁42を点線で示す位置に、第1四
方切換弁7を点線で示す位置に、第2四方切換弁10を
実線で示す位置にそれぞれ切り換え、標準1夜貯留部4
7に貯留されている標準液を、標rX、液供給路48、
処理液供給路31.流入路8aを経て濃縮カラム8に供
給し、この濃縮カラム8において、標準液中の金属イオ
ンを捕捉させる。(-) The third four-way switching valve 42 is switched to the position shown by the dotted line, the first four-way switching valve 7 is switched to the position shown by the dotted line, and the second four-way switching valve 10 is switched to the position shown by the solid line.
The standard solution stored in 7 is labeled rX, liquid supply path 48,
Processing liquid supply path 31. The standard solution is supplied to the concentration column 8 through the inflow path 8a, and the metal ions in the standard solution are captured in the concentration column 8.
なお、濃縮カラム8において金属イオンか捕捉された後
の標準液(ドレン)は、ライン35、排水路34を通し
て排出される。また、前記濃縮カラム8への標準?皮の
供給は、その供給量を一定にするために一定時間行うも
のとする。Note that the standard solution (drain) after metal ions have been captured in the concentration column 8 is discharged through the line 35 and the drainage channel 34. Also, the standard for the concentration column 8? The skin is supplied for a certain period of time to keep the supply amount constant.
(ニ)第3四方切換弁42を実線で示す位置に、第1四
方切換弁7を点線で示す位置に、第2四方切換弁10を
点線で示す位置にそれぞれ切り換え、溶離液貯留部43
に貯留されている溶離液を、溶離液供給路44、処理液
供給路31、流入路8aヲ経て濃縮カラム8に供給する
。そして、この濃縮カラム8においては、該濃縮カラム
8にf;li I’Elされていた金属イオンが溶離さ
れ、更に溶離された金属イオンは溶離液とともに、流出
路8b、ライン33に案内される。(d) The third four-way switching valve 42 is switched to the position shown by the solid line, the first four-way switching valve 7 is switched to the position shown by the dotted line, and the second four-way switching valve 10 is switched to the position shown by the dotted line, and the eluent reservoir 43
The eluent stored in is supplied to the concentration column 8 via the eluent supply path 44, the processing liquid supply path 31, and the inflow path 8a. Then, in this concentration column 8, the metal ions that were f;li I'El in the concentration column 8 are eluted, and the eluted metal ions are guided to the outflow path 8b and line 33 together with the eluent. .
(三) ライン33に案内された金属イオンを分析手段
32において測定し、前記標準液貯留部47に貯留され
ている標準液の金属イオン濃度とどれ程のIn度差かあ
るか(つまり、第1濃縮カラム8の濃縮効率)を演算に
より求め、更に、このように求めた第1濃縮カラl、
Bの濃縮効率に基づき、実際の測定侍における分析手段
32の、’flll定ffEを演算により校正させるよ
うにしている。(3) The metal ions guided to the line 33 are measured by the analysis means 32, and the degree of In difference is determined from the metal ion concentration of the standard solution stored in the standard solution storage section 47. 1 concentration column 8) is calculated by calculation, and further, the first concentration column 8 calculated in this way,
Based on the concentration efficiency of B, the 'full constant ffE of the analysis means 32 in the actual measurement is calibrated by calculation.
(四)前記(−)〜(三)の処理を第2濃縮カラl、
9について同様に行って、第2濃縮カラム9の濃縮効率
を演算により求め、更に、このように測定した第2濃縮
カラト9の濃縮効率に基づき、実際の測定時における分
析手段32の副定値を演算により校正させるようにして
いる。(4) The above-mentioned (-) to (3) treatments are carried out in a second condensing column.
9, the concentration efficiency of the second concentration column 9 is determined by calculation, and further, based on the concentration efficiency of the second concentration column 9 measured in this way, the sub-determined value of the analysis means 32 at the time of actual measurement is determined. It is calibrated by calculation.
以上詳細に説明したように本実施例に示す金属成分分析
装置によれば、濃縮カラム8・9の直前に、分析手段3
2の検出値を校正するための標準?皮を供給する処理液
供給手段100を設けたので、■ 濃縮カラム8・9の
濃縮効率を能率良く測定でき、実際の金属成分の分析開
始までの準備時間を短縮化して、作業能率の向上を図る
ことが可能となる、
■ 標準液が試料1皮供給路30等の他の経路を通るこ
とかなく、試料液供給路30等の経路か標準液に汚染さ
れること(例えば、標準液の濃度が高い場合など)か防
止される。また、同様に標準酸が試料液供給路30に残
留していた試料液に汚染(例えば、濃度の高い試料液か
除去されず残留していた場合など)されることもない、
■ 四方切換弁7・10により順次切り換えることによ
り、複数のメ農度カラム8・9の濃縮効率を求めること
かでき、四方切換弁7・10の増設により更に多くの濃
縮カラムの濃縮効率を測定できるという効果が得られる
。As described above in detail, according to the metal component analyzer shown in this embodiment, the analysis means 3
Standard for calibrating the detected value of 2? Since the treatment liquid supply means 100 for supplying the skin is provided, the concentration efficiency of the concentration columns 8 and 9 can be efficiently measured, and the preparation time before starting the actual analysis of metal components can be shortened, improving work efficiency. ■ The standard solution does not pass through other routes such as the sample 1 skin supply route 30, and the routes such as the sample solution supply route 30 are contaminated with the standard solution (for example, the standard solution does not pass through other routes such as the sample 1 skin supply route 30). (e.g., at high concentrations). Similarly, the standard acid does not contaminate the sample liquid remaining in the sample liquid supply path 30 (for example, when a highly concentrated sample liquid remains without being removed). ■ Four-way switching valve By sequentially switching between 7 and 10, the concentration efficiency of multiple concentration columns 8 and 9 can be determined, and by adding four-way switching valves 7 and 10, the concentration efficiency of even more concentration columns can be measured. can get.
次に、本発明の第2実施例について第2図を参pぺして
説明する。Next, a second embodiment of the present invention will be described with reference to FIG.
第2□□□に示す金属成分分析装置が第1図に示す金属
!成分分析装置と構成を兄にする点は、符号101で示
す処理Z夜供給手段の構成である。The metal component analyzer shown in 2nd □□□ is the metal shown in Figure 1! The difference in configuration from that of the component analyzer is the configuration of the processing Z night supply means indicated by reference numeral 101.
この処理i(l供給手段101は、処理液供給路31と
溶離岐供給路44、標準液供給路48との間に六方切竹
弁50が設けられたものであって、この六方切換弁50
には更に排水路34に通じるルートL、と、サンプリン
グルート51とが設けられている。なお、このサンプリ
ングルート51は、内部の容量が一定に設定され、一定
量の標準液をサンプリングする際に用いられるものであ
る。This processing i(l supply means 101 is provided with a hexagonal bamboo valve 50 between the processing liquid supply path 31, elution branch supply path 44, and standard solution supply path 48.
Further, a route L leading to the drainage channel 34 and a sampling route 51 are provided. Note that this sampling route 51 has a constant internal capacity and is used when sampling a constant amount of standard solution.
以」二のように構成された処理液供給手段101の作用
について説明すると、通常の分析時には、前記六方切替
弁50は図に示す実線位置にセットしておき、濃縮カラ
ム8・9内の金属イオンを溶離させる溶離液を供給させ
ることのみ行うようにする。To explain the operation of the processing liquid supply means 101 configured as follows, during normal analysis, the six-way switching valve 50 is set to the solid line position shown in the figure, and the metal in the concentration columns 8 and 9 is Only the eluent that elutes the ions is supplied.
また、測定の開始前には、
(−)前記六方切替弁50を図に示す実線位置にセ、ト
シた状態において、加圧ポンプ49を駆動してサンプリ
ングルート51内に一定量の標/$液を貯留させるよう
にする。なお、このサンプリングルート51の容量以上
に供給された標ifiMはラインL4を通じて外部の系
に排出される。Also, before starting the measurement, (-) with the six-way switching valve 50 set to the solid line position shown in the figure, the pressurizing pump 49 is driven to pump a certain amount of sample/$ into the sampling route 51. Allow fluid to accumulate. Note that the target ifiM supplied in excess of the capacity of the sampling route 51 is discharged to the external system through the line L4.
(ニ) この後、前記六方切替弁50を点線で示す位置
に切り換え、加圧ポンプ45により供給された溶離l&
により、前記(−)においてサンプリングルート51内
に貯留された標Q’t&を処理液供給路3■に押し出す
。(d) After this, the hexagonal switching valve 50 is switched to the position shown by the dotted line, and the eluent l &
As a result, the mark Q't& stored in the sampling route 51 at (-) is pushed out to the processing liquid supply path 3■.
なお、このとき、メインルートの第1四方切換弁7は、
標準液、溶離液を第1を層線カラム8に導く場合に図に
点線で示す位置に、また、標準1夜、溶離液を第2を層
線カラム9に導く場合に図に実線で示す位置に設定する
。この動作は第1実施例に示す金属成分分析装置と同じ
である。In addition, at this time, the first four-way switching valve 7 of the main route is
When the first standard solution and eluent are introduced into the layer line column 8, the positions are shown in dotted lines in the figure, and when the standard solution and eluent are introduced into the second layer line column 9, the positions are shown with solid lines in the figure. Set to position. This operation is the same as that of the metal component analyzer shown in the first embodiment.
以上説明したような、第2実施例に示す金属成分分析装
置によれば、第1実施例に示す金属成分分析装置と同様
の効果が得られるとともに、処理液供給手段101に設
けられたサンプリングルート51により一定量の標準液
が定量されて、各濃縮カラム8・9の濃縮効率を正確に
求めることができるという効果が得られる。According to the metal component analyzer shown in the second embodiment as described above, the same effects as the metal component analyzer shown in the first embodiment can be obtained, and the sampling route provided in the processing liquid supply means 101 is 51, a certain amount of the standard solution is quantified, and the effect is that the concentration efficiency of each concentration column 8, 9 can be determined accurately.
「発明の効果」
以上説明したように、この発明の金属成分分析装置によ
れば、濃縮手段の直前に設けられた処理液供給手段によ
り、分析手段の検出値を校正するための校正用の標準液
を濃縮カラムに効率良く供給することができ、実際の金
属成分の分析開始までの準備時間を短縮化して、作業能
率の向上を図ることが可能となるという効果が得られる
。"Effects of the Invention" As explained above, according to the metal component analyzer of the present invention, the processing liquid supply means provided immediately before the concentration means provides a calibration standard for calibrating the detection value of the analysis means. The effect is that the liquid can be efficiently supplied to the concentration column, the preparation time before starting the actual analysis of metal components can be shortened, and work efficiency can be improved.
第1図は本発明の第1実施例を示す概略図、第2図は本
発明の第2実施例を示す概略図、第3図は従来の金属成
分分析装置の構成を示す概略図である。
■・・・・・自動流路切換弁(試料岐供給手段)、7・
・・第1四方切換弁、
8・・・・・・第1a縮カラム(4縮手段)、9・・・
0
2
2
0
1
0
100・
・第2濃縮カラム(濃縮手段)、
・・第2四方切換弁、
・・・・分析手段、
・・・・・第3四方切換弁、
・・・・溶離i(l供給手段、
・・・・標準?夜供給手段、
・・・・・六方切換弁、
101・・・・・・処理液供給手段。FIG. 1 is a schematic diagram showing a first embodiment of the present invention, FIG. 2 is a schematic diagram showing a second embodiment of the present invention, and FIG. 3 is a schematic diagram showing the configuration of a conventional metal component analyzer. . ■・・・Automatic flow path switching valve (sample branch supply means), 7.
...First four-way switching valve, 8...1a condensation column (4 condensation means), 9...0 2 2 0 1 0 100...2nd concentration column (concentration means), ...1st 2 four-way switching valve, ... analysis means, ... third four-way switching valve, ... elution i (l supply means, ... standard? night supply means, ... six-way switching valve, 101...processing liquid supply means;
Claims (1)
と、前記試料液中の金属イオンを吸着する濃縮手段と、
この濃縮手段に吸着された金属イオンを溶出させる溶離
液等の処理液を供給する処理液供給手段と、前記濃縮手
段から溶出された金属イオンを分析する分析手段と、前
記濃縮手段の直前に設けられて、前記濃縮手段に対して
前記試料液供給手段からの試料液と前記処理液供給手段
からの処理液とを、選択的に供給する切換弁とを具備し
、 前記処理液供給手段には、前記濃縮手段に対して溶離液
を供給する溶離液供給手段と、前記濃縮手段に対して既
知濃度の金属イオンが含有される標準液を供給する標準
液供給手段とが設けられていることを特徴とする金属成
分分析装置。[Scope of Claims] A sample liquid supply means for supplying a sample liquid containing metal ions, a concentration means for adsorbing metal ions in the sample liquid,
A processing liquid supply means for supplying a processing liquid such as an eluent to elute the metal ions adsorbed by the concentration means, an analysis means for analyzing the metal ions eluted from the concentration means, and a treatment liquid supply means provided immediately before the concentration means. and a switching valve for selectively supplying the sample liquid from the sample liquid supply means and the processing liquid from the processing liquid supply means to the concentration means, the processing liquid supply means , an eluent supply means for supplying an eluent to the concentration means, and a standard solution supply means for supplying a standard solution containing metal ions of a known concentration to the concentration means. Characteristics of metal component analysis equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3872590A JPH03242549A (en) | 1990-02-20 | 1990-02-20 | Metallic component analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3872590A JPH03242549A (en) | 1990-02-20 | 1990-02-20 | Metallic component analyzer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03242549A true JPH03242549A (en) | 1991-10-29 |
Family
ID=12533305
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3872590A Pending JPH03242549A (en) | 1990-02-20 | 1990-02-20 | Metallic component analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03242549A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11281635A (en) * | 1998-03-31 | 1999-10-15 | Yokogawa Electric Corp | Ion analyzer |
| WO2020084906A1 (en) * | 2018-10-25 | 2020-04-30 | 株式会社島津製作所 | Gas analysis device and gas analysis method |
| WO2022075063A1 (en) * | 2020-10-09 | 2022-04-14 | 三菱重工エンジニアリング株式会社 | Analysis system and management system, analysis method, and analysis program |
-
1990
- 1990-02-20 JP JP3872590A patent/JPH03242549A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11281635A (en) * | 1998-03-31 | 1999-10-15 | Yokogawa Electric Corp | Ion analyzer |
| WO2020084906A1 (en) * | 2018-10-25 | 2020-04-30 | 株式会社島津製作所 | Gas analysis device and gas analysis method |
| WO2022075063A1 (en) * | 2020-10-09 | 2022-04-14 | 三菱重工エンジニアリング株式会社 | Analysis system and management system, analysis method, and analysis program |
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