JPH0328471U - - Google Patents
Info
- Publication number
- JPH0328471U JPH0328471U JP8884489U JP8884489U JPH0328471U JP H0328471 U JPH0328471 U JP H0328471U JP 8884489 U JP8884489 U JP 8884489U JP 8884489 U JP8884489 U JP 8884489U JP H0328471 U JPH0328471 U JP H0328471U
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- probe
- measurement
- switch
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 4
- 239000000523 sample Substances 0.000 claims description 3
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Description
第１図と第２図とは、いずれもこの考案の実施
例を示す回路図であり、このうち、第１図は、四
端子法による接続法に適用した場合の実施例を、
第２図は、二端子法による接続法に適用した場合
の実施例をそれぞれ示す。第３図は、計器本体内
で発生させたクロツクパルスにより電磁継電器方
式による回路切替手段の作用を制御する際のタイ
ミングチヤートを示す。第４図と第５図とは、第
１図と第２図とに対応させた従来例としての回路
図を示す。
１１……計器本体、１２……測定用回路、１３
……定電流回路、１４……定電流源、１５……電
圧検出回路、１６……電圧計、１７……Ａ接点、
２１……短絡用回路、２２……Ｂ接点、２３，２
４……分岐短絡回路、２６，２７……外部コント
ロール端子、２９……プローブ、３１……表示・
制御部、３２……表示器、Ｓ……回路切替手段、
Ｓ１〜Ｓ６……スイツチ手段、Ｃ……コイル、Ｒ
……被測定物。
Both FIG. 1 and FIG. 2 are circuit diagrams showing an embodiment of this invention. Of these, FIG. 1 shows an embodiment when applied to a four-terminal connection method.
FIG. 2 shows examples in which the connection method is applied to a two-terminal method. FIG. 3 shows a timing chart when the action of the electromagnetic relay type circuit switching means is controlled by a clock pulse generated within the meter body. FIG. 4 and FIG. 5 show circuit diagrams as a conventional example corresponding to FIGS. 1 and 2. 11...Meter body, 12...Measurement circuit, 13
... Constant current circuit, 14 ... Constant current source, 15 ... Voltage detection circuit, 16 ... Voltmeter, 17 ... A contact,
21...Short circuit, 22...B contact, 23,2
4... Branch short circuit, 26, 27... External control terminal, 29... Probe, 31... Display/
Control unit, 32...Display device, S...Circuit switching means,
S1 to S6 ...Switch means, C...Coil, R
...Object to be measured.
Claims (1)
るプローブに定電流を供給して電圧の測定を可能
とした測定用回路と、被測定物の二点間に対とな
つて配置される前記プローブ相互の短絡を可能と
した短絡用回路とを有し、これら短絡用回路と測
定用回路とは、各プローブに対応させて配置され
るスイツチ手段を有する回路切替手段を介してそ
の開閉の切替えを可能としたことを特徴とする抵
抗測定器。 A measurement circuit that enables voltage measurement by supplying a constant current to a probe placed to measure the resistance between two points on the object to be measured; The short-circuiting circuit and the measurement circuit can be opened and closed by a circuit switching means having a switch arranged corresponding to each probe. A resistance measuring instrument characterized by being able to switch between.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8884489U JPH0328471U (en) | 1989-07-28 | 1989-07-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8884489U JPH0328471U (en) | 1989-07-28 | 1989-07-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0328471U true JPH0328471U (en) | 1991-03-20 |
Family
ID=31638437
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8884489U Pending JPH0328471U (en) | 1989-07-28 | 1989-07-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0328471U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001079866A1 (en) * | 2000-04-14 | 2001-10-25 | Oht Inc. | Probe unit and measuring instrument |
-
1989
- 1989-07-28 JP JP8884489U patent/JPH0328471U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001079866A1 (en) * | 2000-04-14 | 2001-10-25 | Oht Inc. | Probe unit and measuring instrument |
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