JPH0397673U - - Google Patents
Info
- Publication number
- JPH0397673U JPH0397673U JP546590U JP546590U JPH0397673U JP H0397673 U JPH0397673 U JP H0397673U JP 546590 U JP546590 U JP 546590U JP 546590 U JP546590 U JP 546590U JP H0397673 U JPH0397673 U JP H0397673U
- Authority
- JP
- Japan
- Prior art keywords
- measured
- current
- voltage
- resistance value
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Description
第１図は本考案に係る抵抗測定器の一実施例を
示す要部構成図、第２図および第３図は本考案の
他の実施例図、第４図および第５図は従来の抵抗
測定器の構成と抵抗測定状態を表わす図である。
１…電流源、２…電圧計、３…被測定物、４…
電圧源、５，６…測定端子、７…制御手段、８…
演算手段、９…出力手段、１１，１２，２１，２
２，３１，３２…スイツチ。
Fig. 1 is a main part configuration diagram showing one embodiment of the resistance measuring device according to the present invention, Figs. 2 and 3 are illustrations of other embodiments of the present invention, and Figs. 4 and 5 are diagrams of conventional resistance measuring instruments. FIG. 3 is a diagram showing the configuration of a measuring device and a resistance measurement state. 1... Current source, 2... Voltmeter, 3... Measured object, 4...
Voltage source, 5, 6...Measurement terminal, 7...Control means, 8...
Calculating means, 9... Output means, 11, 12, 21, 2
2, 31, 32...switch.
Claims (1)
測定物に生ずる電圧を内部の電圧計で測定し、電
流と電圧の関係から被測定物の抵抗値を測定する
抵抗測定器において、 前記電流源からの供給電流の極性を切換えるス
イツチと、 供給電流および極性切換えの前後で測定した電
圧値を確保し、それらの値を基に所定の演算を行
い被測定物の抵抗値を求める演算手段と、 求められた前記抵抗値を出力する出力手段と、 測定開始信号が与えられると各部を駆動ないし
制御する制御手段 を具備し、被測定物の内部に電圧源が含まれる場
合にはその影響を受けない抵抗測定ができるよう
に構成したことを特徴とする抵抗測定器。[Claims for Utility Model Registration] Current is supplied from an internal current source to a measured object, the voltage generated in the measured object is measured with an internal voltmeter, and the resistance value of the measured object is determined from the relationship between the current and voltage. In the resistance measuring instrument to be measured, a switch is installed to change the polarity of the supplied current from the current source, and the voltage values measured before and after switching the supplied current and polarity are secured, and predetermined calculations are performed based on these values to determine the voltage to be measured. It is equipped with an arithmetic means for calculating the resistance value of the object, an output means for outputting the obtained resistance value, and a control means for driving or controlling each part when a measurement start signal is given, and a voltage source inside the object to be measured. 1. A resistance measuring device characterized in that it is configured to be able to measure resistance without being affected by the presence of .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP546590U JPH0397673U (en) | 1990-01-24 | 1990-01-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP546590U JPH0397673U (en) | 1990-01-24 | 1990-01-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0397673U true JPH0397673U (en) | 1991-10-08 |
Family
ID=31509176
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP546590U Pending JPH0397673U (en) | 1990-01-24 | 1990-01-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0397673U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009250648A (en) * | 2008-04-02 | 2009-10-29 | Hioki Ee Corp | Measuring device |
-
1990
- 1990-01-24 JP JP546590U patent/JPH0397673U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009250648A (en) * | 2008-04-02 | 2009-10-29 | Hioki Ee Corp | Measuring device |
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