JPH0354288B2 - - Google Patents

Info

Publication number
JPH0354288B2
JPH0354288B2 JP58158800A JP15880083A JPH0354288B2 JP H0354288 B2 JPH0354288 B2 JP H0354288B2 JP 58158800 A JP58158800 A JP 58158800A JP 15880083 A JP15880083 A JP 15880083A JP H0354288 B2 JPH0354288 B2 JP H0354288B2
Authority
JP
Japan
Prior art keywords
optical fiber
optical
measuring
measurement
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58158800A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6085351A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15880083A priority Critical patent/JPS6085351A/ja
Publication of JPS6085351A publication Critical patent/JPS6085351A/ja
Publication of JPH0354288B2 publication Critical patent/JPH0354288B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Light Guides In General And Applications Therefor (AREA)
JP15880083A 1983-08-29 1983-08-29 光フアイバの検査ライン Granted JPS6085351A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15880083A JPS6085351A (ja) 1983-08-29 1983-08-29 光フアイバの検査ライン

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15880083A JPS6085351A (ja) 1983-08-29 1983-08-29 光フアイバの検査ライン

Publications (2)

Publication Number Publication Date
JPS6085351A JPS6085351A (ja) 1985-05-14
JPH0354288B2 true JPH0354288B2 (fr) 1991-08-19

Family

ID=15679624

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15880083A Granted JPS6085351A (ja) 1983-08-29 1983-08-29 光フアイバの検査ライン

Country Status (1)

Country Link
JP (1) JPS6085351A (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61102534A (ja) * 1984-10-25 1986-05-21 Sumitomo Electric Ind Ltd 光フアイバの特性測定装置
JPS61155935A (ja) * 1984-12-28 1986-07-15 Sumitomo Electric Ind Ltd 光フアイバの特性測定方法およびその装置
JPS61239137A (ja) * 1985-04-15 1986-10-24 Sumitomo Electric Ind Ltd 単一モ−ド光フアイバの特性測定装置
US4685799A (en) * 1986-01-13 1987-08-11 The United States Of America As Represented By The Secretary Of The Navy Integrated optical time domain reflectometer/insertion loss measurement system
JPS62197740A (ja) * 1986-02-25 1987-09-01 Sumitomo Electric Ind Ltd 光ファイバ特性の測定装置
JPH0346351Y2 (fr) * 1987-05-20 1991-09-30
JP2002071511A (ja) * 2000-08-31 2002-03-08 Ando Electric Co Ltd 光学部品測定装置及び光学部品の試験方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5326815A (en) * 1976-08-25 1978-03-13 Noda Plywood Mfg Co Ltd Method of manufacturing panels of building materials
JPS5337650U (fr) * 1976-09-08 1978-04-03

Also Published As

Publication number Publication date
JPS6085351A (ja) 1985-05-14

Similar Documents

Publication Publication Date Title
CA2199423C (fr) Systeme et procede permettant d'aligner des fibres optiques et de les fixer a des guides d'ondes optiques, et produits ainsi obtenus
US6809823B2 (en) Method for the calibration and alignment of multiple multi-axis motion stages for optical alignment to a planar waveguide device and system
US7196798B2 (en) Optical alignment method and apparatus
US4676635A (en) Optical fiber characteristic measuring method and apparatus
JP2920830B1 (ja) レーザ光を用いた三次元配管組立装置
KR100997763B1 (ko) 위치보정 지지대 및 이를 구비한 측정 장치
US20230332881A1 (en) Optical axis adjustment jig and optical axis adjustment method
JPS6085351A (ja) 光フアイバの検査ライン
US7023550B2 (en) Aligning optical components of an optical measuring system
EP1405034B1 (fr) Alignement de composants optiques d'un systeme de mesure optique
JPS60111206A (ja) 2本の光フアイバの自動突合せ溶接機
JPS60225044A (ja) 光フアイバ特性測定装置
US7070338B1 (en) Method of optically aligning a workholder for connector geometry control and in-line measurement capability and apparatus used therefor
JP2550916B2 (ja) 光モジュール組立装置
CN116465604B (zh) 一种fac镜片耦合测试设备
JP7603873B1 (ja) 加工システム
JPH1126543A (ja) 基板搬送装置の位置決め方法およびその装置
US8824068B2 (en) Rapid optical assembly via simultaneous passive bonding
US20240426700A1 (en) Method and system for performing cleave angle metrology for an optical fiber
JPS59171809A (ja) 位置決め機構
JPH0364815B2 (fr)
JP3348447B2 (ja) 干渉計装置
CN121956265A (zh) 多组多自由度透镜光纤联合耦合机及耦合方法
Lindenmeyer Proposed method of assembly for the BCD silicon strip vertex detector modules
CN117387915A (zh) 透镜光纤的透镜端的参数测量方法和参数测量装置