JPH0357910A - Apparatus for measuring direction of normal line and measuring of direction of normal line - Google Patents

Apparatus for measuring direction of normal line and measuring of direction of normal line

Info

Publication number
JPH0357910A
JPH0357910A JP1195166A JP19516689A JPH0357910A JP H0357910 A JPH0357910 A JP H0357910A JP 1195166 A JP1195166 A JP 1195166A JP 19516689 A JP19516689 A JP 19516689A JP H0357910 A JPH0357910 A JP H0357910A
Authority
JP
Japan
Prior art keywords
laser beam
measurement
normal direction
measuring
point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1195166A
Other languages
Japanese (ja)
Inventor
Hiroyuki Kanematsu
兼松 弘行
Kazumasa Inukai
犬飼 一雅
Morishige Chiyokura
千代倉 守成
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yamazaki Mazak Corp
Original Assignee
Yamazaki Mazak Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yamazaki Mazak Corp filed Critical Yamazaki Mazak Corp
Priority to JP1195166A priority Critical patent/JPH0357910A/en
Publication of JPH0357910A publication Critical patent/JPH0357910A/en
Pending legal-status Critical Current

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  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Machine Tool Copy Controls (AREA)
  • Laser Beam Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To decide the direction of a normal line of a curved surface such as a working surface of a three-dimensional work by setting a reference point on curved surface, and setting at least three measuring points in the vicinity of the reference point on the curved surface. CONSTITUTION:Such reference point setting means to set a reference point CP on a curved surface of a working surface 66a of a work 66 as a filler 41, a reference laser oscillator, a reference optical fiber, etc., are provided. At least three measuring points P are set in the vicinity of the reference point CP on the curved surface. Moreover, a laser oscillator 42A, a photodetector 42B, and distance measuring means such as a measuring optical fiber, a projecting optical fiber, a photodetecting optical fiber, etc., are provided to measure the position of a distance L, or the like of each measuring point P. Based on the position of the measuring point P, a virtual plane 65 is set including the measuring point P. A normal line direction operating part operates the direction of a normal line, for example, a normal line vector N of the virtual plane 65. The direction of a normal line at the reference point CP on the curved surface is calculated proximately as the direction of the normal line of the virtual plane 65 regulated by the measuring point P set in the vicinity of the reference point CP. Accordingly, the direction of the normal line at a predetermined position on the curved surface can be detected.

Description

【発明の詳細な説明】 (a)。産業上の利用分野 本発明は,3次元ワークの加工面等の曲面の法線方向を
測定する法線方向測定装置及び法諜方向測定方法に関す
る. (b).従来の技術 従来、3次元レーザ加工機において3次元ワークの加工
を行うには,加工に先立って作業者が手動でトーチを操
作してティーチングを行い、ティーチングの際の前記ト
ーチの移動量に基づいて加工プログラムを作威し,加工
に際しては前記加工プログラムに基づいてトーチを駆動
してワークの加工を行っていた。また、3次元レーザ加
工機によって3次元ワークの加工を行う際には,当該ワ
ークの加工面に対して垂直にレーザ光を射出する必要が
ある。従来、この調整は,テイーチングの際に、作業者
が目視によって加工面の法線方向を判定し、トーチの傾
斜角度を該方向に一致するようにして調整することによ
り行っていた.(C).発明が解決しようとする問題点
しかし、トーチを法線方向に一致させるvR整は、位置
のvR!l1に比して困難であるため熟練を要し、精度
が悪い.従って,テイーチングの際に、作業者の目視に
より法線方向に一致する形で調整されたトーチの傾斜角
度に基づいて加工を行うと、レーザ光の射出方向をワー
クの加工面の法線方向に一致させることが難しく,加工
効率が低下する不都合があった。また、目視によるvR
整では、ティーチングに要する時間が実際のワークの加
工時間に比して長くなり、レーザ加工機の稼動率が低下
する欠点がある. 本発明は、上記事情に鑑み、3次元ワークの加工面等の
曲面の法線方向を判定することが出来る法線方向測定装
置及び法線方向測定方法を提供することを目的とする. (d).問題点を解決するための手段 本発明は,対象物(66)の曲面(66a)上に基準点
(cp)を設定する基準点設定手段C41.51,57
.61)を設け、前記曲面(66a)上で前記基準点(
C P)近傍に少なくとも3点の測定点(P)を設定し
、前記各測定点(P)の位置(L)を測定する測距手段
(42A,42B、59A、 62A、 62B.  
63A、 63B)を設け,前記測距手段(42A、4
2B、59A.62A.62B.63A.63B)によ
って測定された前記各測定点(P)の位ffi (L)
に基づいて、それ等測定点(P)を含む仮想平面(65
)を設定し,該仮想平面(65)の法線方向( N )
を演算する広線方向演算部(46)を設けて構成される
. また,本発明は、基準軸(CL’)方向に基準用レーザ
光(LB)を射出して,対象物(66)の曲面(66a
)上に基準点(cp)を設定する基準用レーザ光射出手
段(51.57、61)を設け,測定用レーザ光(LS
)を射出して,前記曲面(66a)上で前記基準点(c
p)近傍に少なくとも3点の測定点(P)を設定する測
定用レーザ光射出手段(42A.59A,62A,63
A)を設け,前記各測定点(P)において反射した前記
測定用レーザ光(LS)を受光して、前記各測定点(P
)の位置(L)に対応した信号を出力し得る測定用レー
ザ光受光手段(42B.62B.63B)を設け,前記
測定用レーザ光受光手段(42B、62B、63B)か
ら出力された前記各測定点(P)の位! (L)に対応
した信号に基づいて、それ等測定点(P)を含む仮想平
面(65)を設定し,該仮想平面(65)の法線方向(
N)を演算する法線方向演算部(46)を設けて構成さ
れる. また,本発明は、大径の受光部(55b)と前記受光部
(55b)に接続した形の小径の投光部(55c)から
成る本体(55a)を設け,前記投光部(55c)に、
基準軸(CL’)方向に基準用レーザ光(−L E )
を射出して、対象物(66).の曲面(66a)上に基
準点(cp)を設定する基準用レーザ光射出手段(5工
)を設け,前記投光部(55c)に、測定用レーザ光(
LS)を射出して、前記曲面(66a)上で前記基準点
(cp)近傍に少なくとも3点の測定点(P)を設定す
る測定用レーザ光射出手段(42A)を設け,前記受光
部(55b)に,前記各測定点(P)において反射した
前記測定用レーザ光(LS)を受光して,前記各測定点
(P)の位置(L)に対応した信号を出力し得る受光素
子(42B)を設け,前記受光素子(42B)から出力
された前記各測定点(P)の位fi! (L)に対応し
た信号に基づいて、それ等測定点(P)を含む仮想平面
(65)を設定し,該仮想平面(65)の法線方向(N
)を演算する法線方向演算部(46)を設けて構成され
る. また、本発明は、本体(56a)を設け、該本体(56
a)外に、基準用レーザ光(LB)を出力する基準用レ
ーザ発振器(5l)を設け、前記本体(56a)に、前
記基準用レーザ発振器(5工)から出力された基準用レ
ーザ光(LB)を基準軸(CL’)方向に射出して,対
象物(66)の曲面(66a)上に基準点(cp)を設
定する基準用光ブアイバ(57)を設け、前記本体(5
 6 a)外に、測定用レーザ光(LS)を出力する測
定用レーザ発振器(42A)を設け、前記本体(56a
)に、前記測定用レーザ発振器(42A)から出力され
た測定用レーザ光(LS)を射出して、前記曲面(6 
6 a )上で前記基準点(cp)近傍に少なくとも3
点の測定点(P)を設定する測定用光ファイバ(59A
)を設け、前記本体(56a)に,前記各測定点(P)
において反射した前記測定用レーザ光(LS)を受光し
て、前記各測定点(P)の位置(L)に対応した信号を
出力し得る受光素子(42B)を設け、前記受光素子(
42B)から出力された前記各測定点(P)の位置(L
)に対応した信号に基づいて、それ等測定点(P)を含
む仮想平面(65)を設定し、該仮想平面(65)の法
線方向(N)を演算する法線方向演算部(46)を設け
て構成される. また、本発明は、本体(6Oa)を設け、該本体(60
a)外に、基準用レーザ光(LB)を出力する基準用゛
レーザ発振器(5工)を設け、前記本体(60a)に、
前記基準用レーザ発振器(51)から出力された基準用
レーザ光(LB)を基準軸(CL’)方向に射出して,
対象物(66)の曲面(66a)上に基準点(cp)を
設定する基準用光ファイバ(6工)を設け、前記本体(
60a)外に,測定用レーザ光(LS)を出力する測定
用レーザ発振器(6 3 A)を設け,前記本体(60
a)に,前記測定用レーザ発振器(63A)から出力さ
れた測定用レーザ光(LS)を射出して、前記曲面(6
6a)上で前記基準点(cp)近傍に少なくとも3点の
測定点(P)を設定する投光用光ファイバ(62A)を
設け,前記本体(60a)に、前記各測定点(P)にお
いて反射した前記測定用レーザ光(LS)を受光する受
光用光ファイバ(62B)を設け、前記本体(60a)
外に.前記受光用光ファイバ(62B)で受光した測定
用レーザ光(LS)の光量に基づいて、前記各測定点(
P)の位置(L)に対応した信号を出力し得る受光素子
(63B)を設け、前記受光素子(’63B)から出力
された前記各測定点(P)の位!I (L)に対応した
信号に基づいて,それ等測定点(P)を含む仮想平面(
65)を設定し,該仮想平面(65)の法線方向(N)
を演算する法線方向演算部(46)を設けて構或される
DETAILED DESCRIPTION OF THE INVENTION (a). INDUSTRIAL APPLICATION FIELD The present invention relates to a normal direction measuring device and method for measuring the normal direction of a curved surface such as a machined surface of a three-dimensional workpiece. (b). Conventional technology Conventionally, in order to process a three-dimensional workpiece using a three-dimensional laser processing machine, prior to processing, an operator manually operates a torch to perform teaching, and based on the amount of movement of the torch during teaching. A machining program is created using the machine, and during machining, a torch is driven based on the machining program to machine the workpiece. Furthermore, when processing a three-dimensional workpiece using a three-dimensional laser processing machine, it is necessary to emit laser light perpendicularly to the processing surface of the workpiece. Conventionally, this adjustment was performed by the operator visually determining the normal direction of the machined surface during teaching, and adjusting the inclination angle of the torch to match that direction. (C). Problems to be Solved by the Invention However, the vR alignment that aligns the torch in the normal direction is limited to the vR of the position! It is more difficult than l1, requires skill, and has poor accuracy. Therefore, during teaching, if processing is performed based on the torch inclination angle that has been adjusted to match the normal direction by visual inspection by the worker, the laser beam emission direction will be aligned with the normal direction of the workpiece surface. It was difficult to match, and there was a disadvantage that processing efficiency decreased. In addition, vR by visual inspection
This has the disadvantage that the time required for teaching is longer than the actual machining time of the workpiece, which reduces the operating rate of the laser processing machine. In view of the above circumstances, it is an object of the present invention to provide a normal direction measuring device and a normal direction measuring method capable of determining the normal direction of a curved surface such as a machined surface of a three-dimensional workpiece. (d). Means for Solving Problems The present invention provides a reference point setting means C41.51, 57 for setting a reference point (cp) on the curved surface (66a) of the object (66).
.. 61), and the reference point (61) is provided on the curved surface (66a).
A distance measuring means (42A, 42B, 59A, 62A, 62B.
63A, 63B), and the distance measuring means (42A, 4
2B, 59A. 62A. 62B. 63A. The position ffi (L) of each measurement point (P) measured by 63B)
Based on the above, a virtual plane (65
) and set the normal direction (N) of the virtual plane (65)
It is constructed by providing a wide line direction calculation section (46) that calculates. Further, the present invention emits the reference laser beam (LB) in the direction of the reference axis (CL') to
) is provided with a reference laser beam emitting means (51, 57, 61) for setting a reference point (cp), and a measurement laser beam (LS
) on the curved surface (66a) and set the reference point (c) on the curved surface (66a).
p) Measuring laser beam emitting means (42A, 59A, 62A, 63) that sets at least three measurement points (P) in the vicinity
A) is provided to receive the measurement laser beam (LS) reflected at each measurement point (P), and to receive the measurement laser beam (LS) reflected at each measurement point (P).
) is provided with a measuring laser beam receiving means (42B.62B.63B) capable of outputting a signal corresponding to the position (L) of Measurement point (P) digit! Based on the signal corresponding to (L), a virtual plane (65) including those measurement points (P) is set, and the normal direction of the virtual plane (65) (
The normal direction calculation unit (46) is provided to calculate N). Further, the present invention provides a main body (55a) consisting of a large diameter light receiving section (55b) and a small diameter light projecting section (55c) connected to the light receiving section (55b), and the light projecting section (55c) To,
Reference laser beam (-LE) in the reference axis (CL') direction
Inject the object (66). A reference laser beam emitting means (5 pieces) is provided to set a reference point (cp) on the curved surface (66a) of
A measurement laser beam emitting means (42A) is provided for emitting a laser beam (LS) and setting at least three measurement points (P) on the curved surface (66a) near the reference point (cp), 55b), a light receiving element (55b) capable of receiving the measurement laser beam (LS) reflected at each measurement point (P) and outputting a signal corresponding to the position (L) of each measurement point (P); 42B), and the position fi! of each measurement point (P) output from the light receiving element (42B) is provided. Based on the signal corresponding to (L), a virtual plane (65) including those measurement points (P) is set, and the normal direction (N
) is provided with a normal direction calculation unit (46). Further, the present invention provides a main body (56a), and the main body (56a).
a) A reference laser oscillator (5l) that outputs a reference laser beam (LB) is provided outside, and a reference laser beam (5l) output from the reference laser oscillator (LB) is installed in the main body (56a). LB) in the direction of the reference axis (CL') to set a reference point (cp) on the curved surface (66a) of the object (66).
6 a) A measurement laser oscillator (42A) that outputs a measurement laser beam (LS) is provided outside the main body (56a).
), the measurement laser beam (LS) output from the measurement laser oscillator (42A) is emitted to the curved surface (6
6 a) At least 3 points near the reference point (cp) on
Measurement optical fiber (59A) for setting the measurement point (P)
) is provided on the main body (56a), and each measurement point (P) is provided on the main body (56a).
A light-receiving element (42B) capable of receiving the measurement laser beam (LS) reflected at and outputting a signal corresponding to the position (L) of each measurement point (P) is provided;
42B) of each measurement point (P) output from
), a normal direction calculation unit (46) sets a virtual plane (65) including the measurement points (P) and calculates the normal direction (N) of the virtual plane (65). ). Further, the present invention provides a main body (6Oa), and the main body (600a).
a) A reference laser oscillator (5 units) that outputs a reference laser beam (LB) is provided outside, and the main body (60a) is provided with:
Emitting a reference laser beam (LB) output from the reference laser oscillator (51) in the reference axis (CL') direction,
A reference optical fiber (6 pieces) for setting a reference point (cp) on the curved surface (66a) of the object (66) is provided, and the main body (
60a) A measurement laser oscillator (6 3 A) that outputs a measurement laser beam (LS) is provided outside the main body (60a).
a), the measurement laser beam (LS) output from the measurement laser oscillator (63A) is emitted to form the curved surface (63A).
6a) is provided with a light emitting optical fiber (62A) for setting at least three measurement points (P) near the reference point (cp) on the main body (60a), and at each of the measurement points (P) A light-receiving optical fiber (62B) for receiving the reflected measurement laser beam (LS) is provided, and the main body (60a)
outside. Each of the measurement points (
A light receiving element (63B) capable of outputting a signal corresponding to the position (L) of P) is provided, and the position of each measurement point (P) outputted from the light receiving element ('63B) is ! Based on the signal corresponding to I (L), a virtual plane (
65) and set the normal direction (N) of the virtual plane (65).
A normal direction calculation unit (46) is provided to calculate the normal direction calculation unit (46).

また、本発明は5基準軸(CL’ )方向に基準用レー
ザ光(LB)を射出して、対象物(66)の曲面(66
a)上に基準点CCP>  を設定する基準用レーザ光
射出手段(51.57.61)を設け、測定用レーザ光
(LS)を所定の変調で掛けた形で射出して、前記曲面
(66a)上で前記基準点(cp)近傍に少なくとも3
点の測定点(P)を設定する測定用レーザ光変調射出手
段(42A.59A.62A、63A)を設け.前記各
測定点(P)において反射した前記測定用レーザ光(L
S)を含む光を受光して,受光した光に対応する受光信
号を出力する測定用レーザ光受光手段(42B、62B
、63B)を設け、前記測定用レーザ光受光手段(42
B.62B、63B)から出力さ゛れた前記受光信号の
中から所定の変調を掛けられた前記測定用レーザ光(L
S)に対応する戊分を取り出して復調し、前記各測定点
(P)の位t (L)に対応した位置信号を出力するノ
イズ除去手段(46a.46b)を設け、前記ノイズ除
去手段(46a、46b)から出力された前記各測定点
(P)の位if (L)に対応した位置信号に基づいて
、それ等測定点(P)を含む仮想平面(65)を設定し
、該仮想平面(65)の法線方向(N)を演算する法線
方向演算部(46)を設けて構成される. また.本発明は,基準軸(CL’ )方向に基準用レー
ザ光(LB)を射出して、対象物(66)の曲面(66
a)上に基準恵(CP)を設定する基準用レーザ光射出
手段(51.57、61)を設け、測定用レーザ光(L
S)を射出して,前記曲面(66a)上で前記基準点(
cp)近傍にそれ.ぞれ異なった測定点(P)を設定す
る少なくとも3個の測定用レーザ光射出手段(42A、
59A、62A.63A)を設け.前記各測定用レーザ
光射出手段(’42A.59A、62A、63A)をl
個ずつ、時分割して郭動する時分割駆動手段(47a,
47c)を設け、前記測定点(P)において反射した前
記測定用レーザ光(LS)を受光して,前記測定点(P
)の位置(L)に対応した信号を出力し得る少なくとも
3個の測定用レーザ光受光手段(42B.62B、63
B)をを前記各測定用レーザ光射出手段(42A、59
A、62A.63A)と対応する形で設け、前記各測定
用レーザ光受光手段(42B,62B.63B)の内、
前記時分割駆動手段(47a.47c)によって暇動さ
れた測定用レーザ光射出手段(42A.59A、62A
,63A)に対応する測定用レーザ光受光手段(42B
、62B.63B)を1個ずつ、時分割して選択して,
選択された当該測定用レーザ光受光手段(42B、62
B、63B)のみから前記測定点(P)の位置(L)に
対応した信号を出力させる時分割選択手段(46c、4
7c)を設け、前記時分割選択手段(46c.47C)
によって選択された前記各測定用レーザ光受光手段( 
4 ’2 B、62B.63B)から出力された前記測
定点(P)の位M (L)に対応した信号に基づいて,
少なくとも3点の測定点(P)の位置(L)を求め、そ
れ等測定点(P)を含む仮想平面(65)を設定し、該
仮想平面(65)の法,線方向(N)を演算する法線方
向演算部(46)を設けて構成される。
Further, the present invention emits a reference laser beam (LB) in the direction of the 5 reference axis (CL') to
a) A reference laser beam emitting means (51, 57, 61) is provided for setting a reference point CCP> on the curved surface ( 66a) in the vicinity of the reference point (cp).
Measurement laser beam modulation and emission means (42A, 59A, 62A, 63A) for setting measurement points (P) are provided. The measurement laser beam (L) reflected at each measurement point (P)
Measurement laser beam receiving means (42B, 62B) that receives light containing S) and outputs a light reception signal corresponding to the received light.
, 63B), and the measuring laser beam receiving means (42
B. The measurement laser beam (L
A noise removing means (46a, 46b) is provided for extracting and demodulating the fraction corresponding to S) and outputting a position signal corresponding to the position t(L) of each measurement point (P), 46a, 46b), a virtual plane (65) containing the measurement points (P) is set based on the position signal corresponding to the position if (L) of each of the measurement points (P), and It is configured by providing a normal direction calculation unit (46) that calculates the normal direction (N) of the plane (65). Also. The present invention emits a reference laser beam (LB) in the direction of a reference axis (CL') to
a) A reference laser beam emitting means (51, 57, 61) for setting a reference value (CP) is provided on the top, and a measurement laser beam (L
S) is injected to the reference point (66a) on the curved surface (66a).
cp) nearby it. At least three measuring laser beam emitting means (42A,
59A, 62A. 63A). Each of the measurement laser beam emitting means ('42A.59A, 62A, 63A)
Time division drive means (47a,
47c) is provided to receive the measurement laser beam (LS) reflected at the measurement point (P), and to receive the measurement laser beam (LS) reflected at the measurement point (P).
) at least three measurement laser beam receiving means (42B, 62B, 63
B) the respective measurement laser beam emitting means (42A, 59
A, 62A. 63A), and among the measurement laser beam receiving means (42B, 62B.63B),
The measurement laser beam emitting means (42A, 59A, 62A) are moved by the time division driving means (47a, 47c).
, 63A)
, 62B. 63B) one by one in time division,
The selected measuring laser beam receiving means (42B, 62
time division selection means (46c, 46c) for outputting a signal corresponding to the position (L) of the measurement point (P) only from
7c), and the time division selection means (46c.47C)
Each of the measurement laser beam receiving means (
4'2 B, 62B. Based on the signal corresponding to the position M (L) of the measurement point (P) output from 63B),
Find the positions (L) of at least three measurement points (P), set a virtual plane (65) containing the measurement points (P), and calculate the normal and line direction (N) of the virtual plane (65). It is configured by providing a normal direction calculation unit (46) for calculation.

また、本発明は、基準点設定手段(41,6工、57、
61)及び測距手段(42A.42B、59A.62A
、62B、63A.63B)を設け、前記基準点設定手
段(41、5L、57,6l)により、対象物(66)
の曲面(66a)上に基準点(cp)を設定し.前記測
距手段(42A、42B、59A、62A.62B、6
3A、63B)により,前記曲面(66a)上で前記基
準点(CP)近傍に少なくとも3点の測定点(P)を設
定して、前記各測定点(P)の位置(L)を測定し,測
定された前記各測定点(P)の位置(L)に基づいて.
それ等測定点(P)を含む仮想平面(65)を設定し,
M仮想平面(65)の法線方向(N)を算出し,該算出
された法線方向を基準点の法線方向とするようにしてg
t威される.なお、括弧内の番号等は,図面における対
応する要素を示す,便宜的なものであり,従って、本記
述は図面上の記載に限定拘束されるものではない。以下
のr (e).作用」の欄についても同様である。
The present invention also provides reference point setting means (41, 6, 57,
61) and distance measuring means (42A.42B, 59A.62A
, 62B, 63A. 63B), and the reference point setting means (41, 5L, 57, 6l) sets the target object (66).
A reference point (cp) is set on the curved surface (66a) of . The distance measuring means (42A, 42B, 59A, 62A. 62B, 6
3A, 63B), set at least three measurement points (P) near the reference point (CP) on the curved surface (66a), and measure the position (L) of each measurement point (P). , based on the measured position (L) of each measurement point (P).
Set a virtual plane (65) including those measurement points (P),
The normal direction (N) of the M virtual plane (65) is calculated, and the calculated normal direction is set as the normal direction of the reference point.
t be threatened. Note that the numbers in parentheses are for convenience and indicate corresponding elements in the drawings, and therefore, this description is not limited to the descriptions on the drawings. The following r(e). The same applies to the column "Effect".

(e).作用 上記した構成により,対象物(66)の曲面(66a)
の基準点(cp)における法線方向が.基準点(cp)
近傍の各測定点(P)によって規定される仮想平面(6
5)の法線方向(N)として近似的に算出される。
(e). Effect With the above-described configuration, the curved surface (66a) of the object (66)
The normal direction at the reference point (cp) is . Reference point (cp)
A virtual plane (6
5) is approximately calculated as the normal direction (N).

(f).実施例 以下、図面に基づき、本発明の実施例を説明する. 第工図は,本発明による法線方向測定装置及び法線方向
測定方法が適用されるティーチング装置の一例を示す正
面図、 M2図は、3次元レーザ加工機の一例を示す斜視図、 第3@は、第2図に示すレーザ加工機のトーチ部分の拡
大図, 第4図は,本発明による法線方向測定装置の一例を示す
図, 第5図は、第4図に示す法線方向測定装置の底面図、 M6図は、ティーチング装置のM御装置の一例を示すブ
ロック図, 第7図は,トーチ及び旋回トーチの回転角を求める模式
図、 第8図は,ティーチング装置の制御装置の別の例を示す
ブロノク図、 第9図は、本発明による法線方向測定装置の別の例を示
す図, 第10図は、第9図に示す法線方向測定装置の底面図, 第11図は、本発明による法線方向測定装置の別の例を
示す図、 第l2図は,第11図に示す法線方向測定装置の底面図
, 第13図は,本発明による法線方向測定装置の別の例を
示す図, 第14図は,第13図に示す法線方向測定装置の底面図
、 第15図は、本発明による法線方向測定装置の別の例を
示す図, 第16図は、第15図に示す法線方向測定装置の底面図
, 第17図は、第15図及び第16@に示す法線方向測定
装置における距離の測定原理を示す図,第上8図は、テ
ィーチング装置の制御装置の別の例を示すブロック図で
ある. レーザ加工機1は、第2図に示すように,機体2を有し
ており,機体2にはテーブル3が,酩動モータ5、ボー
ルネジ6によってxm方向である矢印A,B方向に移動
駆動自在に設けられている. 機体2には門型に形或されたコラム7がテーブル3上を
跨ぐ形で設けられており、コラム7にはサドル9が.駆
動モータ10.ボールネジエ1によってY軸方向である
矢印C.D方向に移D酩動自在に設けられている。
(f). Embodiments Hereinafter, embodiments of the present invention will be explained based on the drawings. The 3rd construction drawing is a front view showing an example of a teaching device to which the normal direction measuring device and the normal direction measuring method according to the present invention are applied, M2 is a perspective view showing an example of a three-dimensional laser processing machine, @ is an enlarged view of the torch portion of the laser processing machine shown in Fig. 2, Fig. 4 is a view showing an example of the normal direction measuring device according to the present invention, and Fig. 5 is the normal direction shown in Fig. 4. The bottom view of the measuring device, Figure M6 is a block diagram showing an example of the M control device of the teaching device, Figure 7 is a schematic diagram for determining the rotation angle of the torch and the rotating torch, and Figure 8 is the control device of the teaching device. 9 is a diagram showing another example of the normal direction measuring device according to the present invention. FIG. 10 is a bottom view of the normal direction measuring device shown in FIG. 11 is a diagram showing another example of the normal direction measuring device according to the present invention, FIG. 12 is a bottom view of the normal direction measuring device shown in FIG. 11, and FIG. 13 is a diagram showing another example of the normal direction measuring device according to the present invention. 14 is a bottom view of the normal direction measuring device shown in FIG. 13; FIG. 15 is a diagram showing another example of the normal direction measuring device according to the present invention; Fig. 16 is a bottom view of the normal direction measuring device shown in Fig. 15, Fig. 17 is a diagram showing the principle of distance measurement in the normal direction measuring device shown in Fig. 15 and Fig. 16 @, The figure is a block diagram showing another example of the control device of the teaching device. As shown in FIG. 2, the laser processing machine 1 has a machine body 2, in which a table 3 is driven to move in the directions of arrows A and B, which are the xm directions, by a driving motor 5 and a ball screw 6. It is set up freely. The fuselage 2 is provided with a gate-shaped column 7 that straddles the table 3, and the column 7 has a saddle 9. Drive motor 10. The arrow C. which is the Y-axis direction is drawn by the ball screw 1. It is provided so as to be movable in the D direction.

サドル9には加工ヘッド12が,銀動モータ13.ボー
ルネジエ5によってZ軸(なお、前記したx.y.z軸
は直交座標系を構成している。)方向である矢印E.F
方向に移動駆動自在に設けられている。
A processing head 12 is mounted on the saddle 9, and a silver motor 13. The ball screw 5 moves the arrow E. F
It is provided so that it can be freely moved and driven in the direction.

加工ヘッド12の先端には、第3図に示すように、旋回
トーチ16の胴体17が、位置決めモータエ9によって
2軸に平行な回転軸RA回りの矢印G.H方向に回転酩
動自在に設けられている。
As shown in FIG. 3, at the tip of the processing head 12, the body 17 of the rotating torch 16 is rotated by the positioning motor 9 around the rotation axis RA parallel to the two axes. It is provided so as to be rotatable in the H direction.

そして,胴体L7内には、2枚の反射鏡L 7 cから
構成される光路17bが形成されており,該光路17b
の先端には,トーチ部2oが,位置決めモータ2工によ
って前記回転軸RAに対して45゜傾斜した回転軸RB
回りの矢印I.J方向に旋回駆動自在に設けられている
.トーチ部20の先端には,チップ20aが装着されて
いる.該チップ20aの中心軸CLは前記回転軸RBに
対して45゜傾斜している.また,トーチ部2.0の内
部には,前記した胴体L7内の光路17bとチップ20
aを接統する形で2枚の反射鏡20bからなる光路20
cが形成されている. 一方,ティーチング装置22はレーザ加工機1の旋回ト
ーチ16の移動可能な範囲外、即ちレーザ加工機lの加
工範囲外に設置されており、またティーチング装置22
は,第1図に示すように、図中紙面と直角方向に伸延す
る形で設けられたべ一ス23を有している。ベース23
上には走行フレーム25がベース23に沿ってX′軸方
向である紙面と直角方向に移動自在に支持されており、
走行フレーム25にはL字形のアーム26が設けられて
いる.アーム26にはサドル27がY′軸方向である矢
印C’ .D’方向に移動自在に支持されており、サド
ル27には伸縮アーム29が更に、2′軸方向(なお、
前記したx’ .y’ + z″軸は直交座標系を構成
している.)である矢印E′,F′方向に移動自在に支
持されている.伸縮アーム29の図中下端には,レーザ
加工機上に装着された旋回トーチェ6と同一の外形寸法
を有するダミー旋回トーチ30が設けられており,ダミ
ー旋回トーチ3oは,旋回トーチ16と少なくともその
可動部分の構造において同一な構造となっている(即ち
、ダミー旋回トーチ30と旋回トーチ16は,同一の可
動機能を有する.)。即ち,胴体工7に対応する胴体1
7′はZ′軸に平行な回転軸RA’回りの矢印G’ .
H’方向に、位置決めモータ19’ によって回転Nw
J自在に設けられおり、また,エーチ部20に対応する
トーチ部20′は、前記回転軸R A ’に対して45
@傾斜した回転軸RB″回りの矢印工″,J′方向に、
位置決めモータ21′によって旋回騒動自在に設けられ
ている。そして、トーチ部20’には、旋回1ヘーチL
6のチップ20aに対応する法線方向測定装置40が設
けられている.そして、該法線方向測定装置40は第4
図及び第5図に示すように本体40aを有しており、該
本体40aには,ティーチングの際の基準軸及び基準点
を規定する円錐形のフィラー4lが設けられている。即
ち,第l図に示す前記回転軸RB″に対して45゜傾斜
したフィラー41の中心軸が基準軸CL’ となり、第
4図に示す基準軸CL’上に設けられたフィラ−41の
先端が基準点CPとなる.なお、該基準点CPは、前記
回転軸RA’及び前記回転軸RB’の交点に設けられて
いるので,胴体17′の矢印G’ .H’方向の回転又
はトーチ部20′の矢印工ゝ、J′方向の回転によって
は基準点CPの位置は変化しない。また,本体40aに
は基準面PLが,基準軸CL’ に垂直で、基準点CP
から距離L0の位置に設けられており,本体40の前記
基準面PLに平行な平面上には、前記基準軸CL’から
同一半径r上に3個の半導体レーザ等のレーザ発振器4
2Ai.42A,、42A3が所定の角度間隔で、レー
ザ光LSを基準軸CL’ に平行に射出し得る形で設け
られている。また、3個の位置検出素子(PSD)等の
受光素子42B1、42B2.42B,が、前記基準面
PLに平行な平面上の、基準軸CL’から同一半径上に
前記レーザ発振器42Aと同一の角度間隔で各レーザ発
振器42Aい42A,.42A,に対応する形で設けら
れている.そして、各受光素子42Bには受光面42b
が設けられており,各受光素子42Bは、前記受光面4
2bにおいて光を受光すると5受光した光の当該受光面
42b上の矢印LR方向、即ち、基準軸CL’ を中心
とした放射面と受光面42bとの交線上の位ほに対応す
る信号を出力することが出来る.そして、各受光素子4
2Bの第4図下方には、集光レンズ43が設けられてい
る.また,第1図に示すように.サドル27には該サド
ル27の矢印C’ .D’方向の移動量を検出すること
が出来るエンコーダ31及び伸縮アーム29の矢印E″
,F″方向の移動量を検出することが出来るエンコーダ
32が設けられ、更にダミー旋回トーチ30にも、該ダ
ミー旋回トーチ30の矢印G’ 、H’方向及び矢印I
’ .J’方向の回転角度量を検出することの出来るエ
ンコーダ33、35が設けられている.また、走行フレ
ーム25には,該走行フレーム25の紙面と直角方向の
移動量を検出するエンコーダ34が設けられている.ま
た.ティーチング装置22は,第6図に示すように.主
制御部45が設けられており,該主制御?45には、バ
スi45aを介して,加工プログラム生成装置36,加
工プログラムメモリ37,法線方向測定装置制御部47
,卵動制御部49等が接続している.そして,法線方向
測定装置制御部47には,ドライバ47aエ,47a,
.47a3、変調器47bい47b2、47b,を介し
て,前記各レーザ発振器42Aエ、42A2.42A,
がそれぞれ接続している。また、法線方向測定装置制御
部47には法線方向演算部46が接続しており,法線方
向演算部46には,復調器46b■,46b2、4 6
 b,.バンドパスフィルタ46a,.46a2、46
a,を介して前記各受光素子42B,、42Bよ、42
B,がそれぞれ接続している.また.1!動制御部49
には前記位置決めモータエ9’ .21’ が接続して
おり,加工プログラム生成装′l136には,エンコー
ダ31.32、33、34.35が接続している.また
,主制.御部45には,レーザ加工機工が通信回腺44
を介して接続している. レーザ加工機1及びティーチング装置22は以上のよう
な構成を有するので,ティーチング装置22を用いてレ
ーザ加工機1に関する加工プログラムのティーチングを
行う場合には、第工図に斜線で示すティーチングエリア
39内に加工すべき立体ワーク66を設置し、その状態
で、ティーチング装置22のダミー旋回トーチ30を実
際の加工に即して作業者が移動させることにより、ティ
ーチング動作を行う。なお、ティーチング装置22のx
’ y’ z’座標系は,レーザ加工機工のXYz座標
系に対応している。従って,走行フレーム25はベース
23に対して紙面と直角方向に移動することができるが
,これはレーザ加工機1におけるテーブル3の矢印A.
B方向の移動に対応する。また,アーム26に対するサ
ドル27の矢印C’ 、D’方向に移動は,レーザ加工
機lにおけるサドル9のコラム7に対する矢印C.D方
向の移動に対応する.更に、伸縮アーム29の矢印E’
 .F’方向の移動は、レーザ加工機1における加工ヘ
ッド12の矢印E,F方向の移動に対応する.また,テ
ィーチング装置22の回転軸RA’ .RB’はそれぞ
れレーザ加工機lの回転軸RA,RBに対応するので,
ダミー旋回トーチ30の胴体17’の矢印G’ .H’
方向の回転は、旋回トーチ16の胴体l7の矢印G.H
方向の回転に対応し、トーチ部20′の矢印I’ .J
’方向の回転は、トーチ部20の矢印I.J方向の回転
に対応する。また、テイーチング装置22の法線方向測
定装置40の基準軸CL’は、レーザ加工機1のチップ
20aの中心軸CLに対応している。
An optical path 17b composed of two reflecting mirrors L7c is formed in the body L7, and the optical path 17b is composed of two reflecting mirrors L7c.
At the tip of the torch section 2o, a positioning motor 2 connects a rotary shaft RB inclined at 45 degrees with respect to the rotary shaft RA.
Surrounding arrow I. It is installed so that it can be rotated freely in the J direction. A tip 20a is attached to the tip of the torch section 20. The central axis CL of the chip 20a is inclined at 45 degrees with respect to the rotation axis RB. Furthermore, inside the torch section 2.0, there is the optical path 17b in the body L7 described above and the chip 20.
An optical path 20 consisting of two reflecting mirrors 20b connected to a
c is formed. On the other hand, the teaching device 22 is installed outside the movable range of the rotating torch 16 of the laser processing machine 1, that is, outside the processing range of the laser processing machine 1, and the teaching device 22
As shown in FIG. 1, the base 23 has a base 23 extending in a direction perpendicular to the plane of the drawing. base 23
A traveling frame 25 is supported above the base 23 so as to be movable in the X'-axis direction, which is perpendicular to the plane of the paper.
The traveling frame 25 is provided with an L-shaped arm 26. A saddle 27 is attached to the arm 26 with an arrow C'. The saddle 27 is supported movably in the D' direction, and a telescoping arm 29 is further attached to the saddle 27 in the 2' axial direction (in addition,
x' mentioned above. The y' + z'' axes constitute an orthogonal coordinate system.) It is supported movably in the directions of arrows E' and F'. A dummy rotating torch 30 having the same external dimensions as the attached rotating torch 6 is provided, and the dummy rotating torch 3o has the same structure as the rotating torch 16 at least in the structure of its movable part (i.e., The dummy rotating torch 30 and the rotating torch 16 have the same movable function.) That is, the fuselage 1 corresponding to the fuselage engineer 7
7' is an arrow G' around the rotation axis RA' parallel to the Z' axis.
Rotated Nw by the positioning motor 19' in the H' direction.
The torch section 20' corresponding to the arch section 20 is arranged at an angle of 45 mm with respect to the rotation axis R A'.
@Arrow work around the tilted rotation axis RB'', in the J' direction,
It is provided so that it can be rotated freely by a positioning motor 21'. The torch portion 20' has a swing 1 heave L.
A normal direction measuring device 40 corresponding to the chip 20a of No. 6 is provided. Then, the normal direction measuring device 40
As shown in the drawings and FIG. 5, it has a main body 40a, and the main body 40a is provided with a conical filler 4l that defines a reference axis and a reference point during teaching. That is, the center axis of the filler 41 inclined at 45 degrees with respect to the rotation axis RB'' shown in FIG. 1 becomes the reference axis CL', and the tip of the filler 41 provided on the reference axis CL' shown in FIG. becomes the reference point CP. Since the reference point CP is provided at the intersection of the rotation axis RA' and the rotation axis RB', the rotation of the body 17' in the arrow G' and H' directions or the torch The position of the reference point CP does not change due to the rotation of the portion 20' in the direction of the arrow J'.In addition, the reference plane PL on the main body 40a is perpendicular to the reference axis CL', and the reference point CP is perpendicular to the reference axis CL'.
On a plane parallel to the reference plane PL of the main body 40, there are three laser oscillators 4 such as semiconductor lasers on the same radius r from the reference axis CL'.
2Ai. 42A, 42A3 are provided at predetermined angular intervals so as to be able to emit the laser beam LS in parallel to the reference axis CL'. In addition, three light receiving elements 42B1, 42B2, 42B, such as position detection elements (PSD), are arranged on the same radius from the reference axis CL' on a plane parallel to the reference plane PL as the laser oscillator 42A. Each laser oscillator 42A, 42A, . It is provided in a form corresponding to 42A. Each light receiving element 42B has a light receiving surface 42b.
is provided, and each light receiving element 42B is provided with the light receiving surface 4.
When light is received at 2b, a signal corresponding to the position of the received light in the direction of the arrow LR on the light-receiving surface 42b, that is, on the line of intersection between the radiation surface and the light-receiving surface 42b centered on the reference axis CL' is output. You can. And each light receiving element 4
A condenser lens 43 is provided at the bottom of 2B in FIG. Also, as shown in Figure 1. The saddle 27 has an arrow C'. The arrow E'' of the encoder 31 and the telescopic arm 29 that can detect the amount of movement in the D' direction
, F'' directions, and the dummy rotating torch 30 is also provided with an encoder 32 that can detect the amount of movement in the directions of arrows G', H' and arrow I of the dummy rotating torch 30.
'. Encoders 33 and 35 are provided that can detect the amount of rotation angle in the J' direction. Further, the running frame 25 is provided with an encoder 34 that detects the amount of movement of the running frame 25 in a direction perpendicular to the paper surface. Also. The teaching device 22 is as shown in FIG. A main control section 45 is provided. 45 includes a machining program generation device 36, a machining program memory 37, and a normal direction measuring device control unit 47 via a bus i45a.
, egg movement control unit 49, etc. are connected. The normal direction measuring device control section 47 includes drivers 47a, 47a,
.. The respective laser oscillators 42A, 42A2, 42A,
are connected to each other. Further, a normal direction calculation unit 46 is connected to the normal direction measurement device control unit 47, and the normal direction calculation unit 46 includes demodulators 46b■, 46b2, 46
b,. Bandpass filters 46a, . 46a2, 46
a, to each of the light receiving elements 42B, 42B, 42
B, are connected to each other. Also. 1! Dynamic control section 49
is the positioning motor 9'. 21' is connected, and encoders 31, 32, 33, and 34, 35 are connected to the machining program generator 136. Also, lordship. In the control section 45, the laser processing machine is connected to the communication line 44.
It is connected via. Since the laser processing machine 1 and the teaching device 22 have the above-described configurations, when teaching the processing program related to the laser processing machine 1 using the teaching device 22, the teaching area 39 indicated by diagonal lines in the first engineering drawing is A three-dimensional workpiece 66 to be processed is set up, and in this state, the operator moves the dummy rotating torch 30 of the teaching device 22 according to the actual processing, thereby performing a teaching operation. Note that x of the teaching device 22
The 'y'z' coordinate system corresponds to the XYz coordinate system of the laser processing machine. Therefore, the traveling frame 25 can move relative to the base 23 in a direction perpendicular to the plane of the paper, but this is due to the arrow A on the table 3 in the laser processing machine 1.
Corresponds to movement in the B direction. Further, the movement of the saddle 27 relative to the arm 26 in the directions of arrows C' and D' corresponds to the movement of the saddle 9 relative to the column 7 of the laser processing machine I in the directions indicated by the arrows C' and D'. Corresponds to movement in the D direction. Furthermore, the arrow E' of the telescopic arm 29
.. The movement in the F' direction corresponds to the movement of the processing head 12 in the laser beam machine 1 in the directions of arrows E and F. Also, the rotation axis RA' of the teaching device 22. RB' corresponds to the rotation axes RA and RB of the laser processing machine l, respectively, so
Arrow G' on the body 17' of the dummy rotating torch 30. H'
The direction of rotation is determined by the arrow G. on the body l7 of the rotating torch 16. H
Corresponding to the rotation in the direction, the arrow I' . J
The rotation in the direction indicated by the arrow I. Corresponds to rotation in the J direction. Further, the reference axis CL' of the normal direction measuring device 40 of the teaching device 22 corresponds to the central axis CL of the chip 20a of the laser processing machine 1.

そして、作業者が模擬的な加工動作を行う際には,法線
方向測定装置40の部分を手動で操作し、法線方向測定
装置40のフイラー4lの先端をワーク66の加工面6
6aに接触させ、該フイラー41の先端の基準点CPが
ワーク66の加工の際にレーザ光を照射すべき位置をな
ぞるように移動させる。そして、この際に,法線方向演
算部46は、前記加工面66a上を移動する基準点CP
における法線方向を演算し、駆動制御部49は、法線方
向演算部46の(’ii算結果に基づいて、位置決めモ
ータ19’ .21’ を能動制御してダミー旋回トー
チ30の胴体17′  トーチ部20″をそれぞれ矢印
G’ .H’方向,矢印I’.J″方向に適宜回転させ
、法線方向測定装M40のフイラー41の基準軸CL’
 を基準点CPにおける加工面66a上の法線方向に一
致させる。
When the operator performs a simulated machining operation, the operator manually operates the normal direction measuring device 40 and places the tip of the filler 4l of the normal direction measuring device 40 on the machining surface of the workpiece 66.
6a and moved so that the reference point CP at the tip of the filler 41 traces the position to be irradiated with laser light when processing the workpiece 66. At this time, the normal direction calculation unit 46 calculates the reference point CP moving on the processing surface 66a.
The drive control section 49 actively controls the positioning motor 19'. The torch portion 20'' is appropriately rotated in the directions of arrows G', H' and I', J'', respectively, and the reference axis CL' of the filler 41 of the normal direction measuring device M40 is
is made to coincide with the normal direction on the processing surface 66a at the reference point CP.

即ち、法線方向測定装置40は、直交座標系であるxy
z座標系を有しており、該xyz座標系は、基準点cp
を原点0 (0.O.O)とし、基準軸CL’ を2軸
とし、また、基準軸CL’ と回転軸RB’ によって
規定される平面上にX軸を設定している.即ち、回転軸
RB’は基準軸CL’に対して45°傾斜しているので
、xyz座標系における回転軸RB’ の直線の方程式
は,x=z,y=0 ?表される. そして,第4図及び第6図に示すように、法線方向測定
装置40の法線方向測定装置制御部47は,ドライバ4
7a■.47a.、47a,、変?器47b■、47b
2、47b,を介して、本体40aに設けられた各レー
ザ発振器42A1、42A,、42A,(なお,第4図
にはレーザ発振器42Aエ、42A2についてのみ示す
.)からレーザ光LSを前記加工面66aに対して基準
軸CL’に平行に射出する。この際に、各変調器4 7
 b1.47b2,47b,によって各レーザ発振器4
2A、、42A2.42A,の電源にそれぞれ異なった
周波数の変調を掛け、各レーザ発振器42Aよ、42A
,.42A,からそれぞれ異なった振幅、変調の掛けら
れたレーザ光LSエ、LS,.LS,を射出させる。そ
して,レーザ光LSエ、LS,、LS,は加工面66a
上の各測定点PいP2、P,で乱反射し、反射したレー
ザ光LSエ、LS2、LS,は各集光レンズ43によっ
て各受光素子42Bよ、42B2、42B,の受光面4
2b上に焦点を結ぶ形で各受光素子42B1.42B1
42B,で受光される.そして、各受光素子42B■,
42B,、42B,は受光されたレーザ光LSエ、LS
2、LS,の受光面42b上の矢印LR方向の焦点の位
?に対応した電圧信号等をバンドパスフィルタ46 a
1. 4 6 a,, 4 6 a,、復調器46b,
、46b2.46b,を介して法線方向演算部46に出
力する.この際に,前記受光素子42Bエから出力され
た電圧信号の中から、バンドパスフィルタ46a■によ
ってレーザ発振器42A1から所定の変調が掛けられた
形で射出されたレーザ光LSXに対応した周波数成分の
電圧信号が取り出され,更に、復調器46b■で復調さ
れて法線方向演算部46に出力される6また,受光素子
42B2、42B,から出力された電圧信号についても
同様にして、各バンドパスフィルタ46a2、46a3
によって各レーザ発振器42A,.42A,からそれぞ
れ所定の変調が掛けられた形で射出されたレーザ光LS
,、LS,に対応した周波数戒分の電圧信号が取り出さ
れて法線方向演算部46に出力される.従って、各受光
素子42Bにおいて、当該受光素子42Bに対応しない
レーザ発振器42Aから射出されたレーザ光LSを受光
した場合や自然光を受光した場合でも,法線方向演算部
46には、?該受光素子42Bに対応するレーザ発振器
42Aから射出されたレーザ光LSに対応した電圧信号
,即ち、各測定点Pまでの距離Lに対応した電圧信号の
みが出力される.そして、法線方向演算部46は,各受
光素子42Bい42B,.42B,からバンドパスフィ
ルタ46a■.46a2.46a,、復調器46b,、
46b2、46b,を介して出力された各電圧信号に基
づいて、本体40a上の基準面PLから加工面66a上
の各測定点P1、P,.P,までの距離Lエ,L2、L
,を求める。
In other words, the normal direction measuring device 40 has an orthogonal coordinate system xy
has a z coordinate system, and the xyz coordinate system has a reference point cp
is the origin 0 (0.O.O), the reference axis CL' is the two axes, and the X-axis is set on the plane defined by the reference axis CL' and the rotation axis RB'. That is, since the rotation axis RB' is inclined at 45 degrees with respect to the reference axis CL', the equation of the straight line of the rotation axis RB' in the xyz coordinate system is x=z, y=0? expressed. As shown in FIGS. 4 and 6, the normal direction measuring device control section 47 of the normal direction measuring device 40 controls the driver 4.
7a■. 47a. , 47a,, strange? Vessel 47b■, 47b
2, 47b, from each laser oscillator 42A1, 42A, 42A, provided in the main body 40a (only laser oscillators 42Ad and 42A2 are shown in FIG. 4). The light is emitted parallel to the reference axis CL' to the surface 66a. At this time, each modulator 4 7
b1.47b2, 47b, each laser oscillator 4
2A, 42A, 2.42A, modulation of different frequencies is applied to each laser oscillator 42A, 42A.
、. The laser beams LS, LS, . Inject LS. Then, the laser beams LS, LS, LS, are processed on the processed surface 66a.
The reflected laser beams LS2, LS, which are diffusely reflected at each measurement point P2, P, on the top, are sent to the light receiving surface 4 of each light receiving element 42B, 42B2, 42B, by each condenser lens 43.
Each light receiving element 42B1.42B1 is focused on 2b.
The light is received at 42B. And each light receiving element 42B■,
42B,, 42B, are the received laser beams LS, LS
2. Where is the focal point in the direction of arrow LR on the light receiving surface 42b of LS? A voltage signal corresponding to the band pass filter 46 a
1. 4 6 a,, 4 6 a,, demodulator 46b,
, 46b2, 46b, to the normal direction calculation unit 46. At this time, a frequency component corresponding to the laser beam LSX emitted from the laser oscillator 42A1 after being modulated in a predetermined manner by the bandpass filter 46a is selected from among the voltage signals output from the light receiving element 42B. The voltage signal is taken out, further demodulated by the demodulator 46b, and outputted to the normal direction calculation unit 466. In addition, the voltage signals output from the light receiving elements 42B2, 42B are similarly processed for each bandpass. Filters 46a2, 46a3
, each laser oscillator 42A, . 42A, each laser beam LS is emitted with a predetermined modulation applied thereto.
, , LS, are extracted and outputted to the normal direction calculation unit 46 . Therefore, even if each light-receiving element 42B receives the laser beam LS emitted from the laser oscillator 42A that does not correspond to the light-receiving element 42B, or receives natural light, the normal direction calculation unit 46 calculates ? Only a voltage signal corresponding to the laser beam LS emitted from the laser oscillator 42A corresponding to the light receiving element 42B, that is, a voltage signal corresponding to the distance L to each measurement point P is output. Then, the normal direction calculation section 46 calculates each of the light receiving elements 42B, 42B, . 42B, to bandpass filter 46a■. 46a2.46a,, demodulator 46b, .
46b2, 46b, each measuring point P1, P, . The distance to P, L, L2, L
Find .

次に、法線方向演算部46は,測定された前記距aLt
. L,,LJIら前記各測定点Pi.P2.P,のx
yz座標系における座標を演算する.即ち、各測定点P
エ、P2、P,のX3!標、y座標は、それぞれレーザ
発振器42A1、42A2、42A,のX座標、y座標
と同一であり、予め設定されているので、各点Pエ、P
2、P1の2座標を測定された距離LいL2、L,と基
準面PLの基準点CPからの距1tl r− aの差か
ら求めることにより,各測定点P1、P2、P,のx.
y.z座標が算出される.すると、法線方向演算部46
は,3点Pエ、P2、P,を含む仮想平面65が規定さ
れるので、該仮想平面65の法線ベクトルNを各測定点
PいP2. P,のx.y,z座標から求める。即ち、
各測定点Pの座標を P 1 = ( X 1 % yz . Z 1)Pz
= (X2,’!2、Z2) P x =  ( X 3 −  :/ 3 −  Z
 s )を演算することにより, Ax+By+Cz+D=0 (A.B.C.Dは定数.) と求められる.そして、前記仮想乎面65の法線ベーク
トルNは, N=  (A.B.C) ?2+B”+C”=1 と表されるので、仮想平面65の当該法線ベクトルNの
方向が加工面66a上の基準点CPにおける法線方向と
一致しているものとみなす,なお、3点の測定点P■,
P2、P,は基準点CPの近傍に設定されるため、仮想
平面65の法線ベクトルNの方向と加工面66a上の基
準点CPにおける実際の法線方向とは大きくずれること
はない。
Next, the normal direction calculation unit 46 calculates the measured distance aLt.
.. L., LJI et al. at each measurement point Pi.L. P2. P, x
Calculate coordinates in the yz coordinate system. That is, each measurement point P
E, P2, P, X3! The target and y coordinates are the same as the x and y coordinates of the laser oscillators 42A1, 42A2, 42A, respectively, and are set in advance, so
2. By finding the two coordinates of P1 from the difference between the measured distance L2, L, and the distance 1tl r- a of the reference plane PL from the reference point CP, x of each measurement point P1, P2, P, ..
y. The z coordinate is calculated. Then, the normal direction calculation unit 46
Since a virtual plane 65 including three points P, P2, and P is defined, the normal vector N of the virtual plane 65 is determined by each measurement point P, P2, and P2. P, x. Determine from the y and z coordinates. That is,
The coordinates of each measurement point P are P 1 = (X 1 % yz . Z 1) Pz
= (X2,'!2,Z2) P x = (X 3 - :/ 3 - Z
By calculating s), Ax+By+Cz+D=0 (A.B.C.D are constants.) is obtained. The normal vector N of the virtual plane 65 is N= (A.B.C)? 2+B"+C"=1, so it is assumed that the direction of the normal vector N of the virtual plane 65 coincides with the normal direction of the reference point CP on the processing surface 66a. Measurement point P■,
Since P2, P, are set near the reference point CP, the direction of the normal vector N of the virtual plane 65 and the actual normal direction at the reference point CP on the processing surface 66a do not deviate greatly.

次に,法線方向演算部46は、トーチ20’を矢印エ′
方向に回転すべき角度α(矢印J′方向に回転すべき角
度でもよい。)及び胴体17’を矢印G′方向に回転す
べき角度β(矢印H′方向に回転すべき角度でもよい。
Next, the normal direction calculation unit 46 moves the torch 20' to the arrow direction.
an angle α at which the body 17' should be rotated in the direction of arrow J' (this may also be an angle at which it should be rotated in the direction of arrow J') and an angle β at which the body 17' should be rotated in the direction of arrow G' (or an angle at which it should be rotated in the direction of arrow H').

)を演算する。) is calculated.

まず.xyz座標系において算出された前記法線ベクト
ルNを,第7図に示す直交座標系であるx’ y’  
z’座標系に座標変換する。該x′y2′座標系は,基
準点cpを原点○(0,0、O)とし,回転軸RA’の
延長線をZ′軸(従って、2′軸方向はZ″軸方向と一
致する。)とし、また,回転軸RA’ と回転軸RB’
によって規定される平面上にX′軸を設定している.従
って,x′y′ z′座標系における回転軸RB’の直
線の方程式は、 x’  =z’  ,y’  =0 と表される。そして,法線方向測定装置40の基準軸C
L’が2′軸方向にある状態(従って、前記基準軸CL
’が回転軸RA’の延長線と一致する状態)を基準とし
て、前記法線ベクトルNを求めた際の基準軸CL’が回
転軸RB’回りの矢印I′方向に角度θ回転した状態で
あるものとし、前記法線ベクトルNが* X’ y’ 
 z’座標系において, N=  (A’  ,B’  .C’  )A’  ”
+B’  ”+C’  ”=1と表されるものとする. 次に、法線方向測定装置40の基準軸CL’と回転軸R
A’の延長線(即ち,z′軸)の成す角度が,法線ベク
トルNと回転軸RA’ の延長線の成す角度η( = 
arccos C″)と同一になるようなトーチ20’
の回転軸RB’回りの矢印I′方向の回転角αを求める
.即ち、トーチ20′が矢印I’   J’方向に回転
すると,基準軸CL’上の単位ベクトルSの先端S0は
,回転軸RB’ に垂直な平面上を回転軸RB’上の点
○’  (1/2、0.1/2)を中心に回転移動する
。そして、単位ベクトルSの先端S0が点Sエの位置に
移動したときに、単位ベクトルSと2′軸の成す角度が
角度ηになるとすれば、単位ベクトルSの先端S0を点
S1に移動させるときの角度が、トーチ20′の矢印I
′方向の回転角αである.そして、回転軸RA’上に点
S.(0.O、1)を規定し,三角形OSIS,と三角
形O″SエS2に余弦定理を適用することにより、回転
角αを求めると,a =arccos ( 2cosη
−1)一〇=arccos (2 C’ − 1)一〇
となる. 更に、基準軸CL’ が法線ベクトルNの方向と一致す
るような胴体17’ の回転軸RA’回りの矢印G′方
向の回転角βを求める。該回転角βは,点S1と法線ベ
クトルNの先端N0の回転軸RA′に対する円周角に等
しいので、回転角βは、となる。
first. The normal vector N calculated in the xyz coordinate system is expressed as x'y' in the orthogonal coordinate system shown in FIG.
Coordinate transformation to z' coordinate system. The x'y2' coordinate system has the reference point cp as the origin ○ (0, 0, O), and the extension line of the rotation axis RA' as the Z' axis (therefore, the 2' axis direction coincides with the Z'' axis direction). ), and the rotational axis RA' and rotational axis RB'
The X' axis is set on the plane defined by . Therefore, the equation of the straight line of the rotation axis RB' in the x'y'z' coordinate system is expressed as x' = z', y' = 0. Then, the reference axis C of the normal direction measuring device 40
L' is in the 2' axis direction (therefore, the reference axis CL
When the reference axis CL' used to calculate the normal vector N is rotated by an angle θ in the direction of the arrow I' around the rotation axis RB', Assume that the normal vector N is *X'y'
In the z' coordinate system, N= (A',B'.C')A'''
It is assumed that +B'``+C'''=1. Next, the reference axis CL' and the rotation axis R of the normal direction measuring device 40 are
The angle formed by the extension line of A' (i.e. z' axis) is the angle η (=
torch 20' which is the same as arccos C'')
Find the rotation angle α in the direction of arrow I' around the rotation axis RB'. That is, when the torch 20' rotates in the direction of the arrow I'J', the tip S0 of the unit vector S on the reference axis CL' moves to the point ○' ( 1/2, 0.1/2). Then, when the tip S0 of the unit vector S moves to the position of point Se, if the angle formed by the unit vector S and the 2' axis becomes the angle η, then move the tip S0 of the unit vector S to the point S1. When the angle is the arrow I of the torch 20'
is the rotation angle α in the ′ direction. Then, a point S. is located on the rotation axis RA'. (0.O, 1) and calculate the rotation angle α by applying the cosine law to triangle OSIS and triangle O″S S2, a = arccos ( 2cosη
-1) 10 = arccos (2 C' - 1) 10. Furthermore, the rotation angle β of the body 17' around the rotation axis RA' in the direction of the arrow G' such that the reference axis CL' coincides with the direction of the normal vector N is determined. Since the rotation angle β is equal to the circumferential angle between the point S1 and the tip N0 of the normal vector N with respect to the rotation axis RA', the rotation angle β is as follows.

次に、法線方向演算部46は、算出された前記回転角α
、βを廃動制御部49に出力する。駆動制御部49は、
前記回転角α、βに基づいて位置決めモータ21’ ,
19’ を駈動制御して,ダミー旋回トーチ30のトー
チ20′を矢印工′方向に角度αだけ回転させ、また、
胴体17′を矢印G′方向に角度βだけ回転させる.す
ると.法線方向測定装置40のフィラー41の先端の基
準点cpのx’ .y’   z’座標の位置が変化せ
ずに,フィラー41の基準軸CL’ の方向が、前記法
線方向演算部46によって算出された法線ベクトルNの
方向に一致する. 従って,作業者が法線方向測定装置40を手動で矢印A
″、B″方向、矢印C’ .D’方向又は矢印E’  
F’方向に移動させ,フィラー4lの先端の基準点CP
がワーク66の加工面66a上をなぞって行くように操
作すると、連続的に変化する基準点CPにおける加工面
66aの法線方向に対して,法線方向測定装置40のフ
ィラー41の基準軸CL’の方向が前記法線方向に一致
するように駆動制御されるので、作業者は法線方向測定
装置40の/!i1斜角をvR整する必要がなく、フィ
ラー4lの先端の基準点CPの位置のみを調整すればよ
い。従って,ティーチング作業は短時間に正確に行われ
る。
Next, the normal direction calculation unit 46 calculates the calculated rotation angle α
, β are output to the decommissioning control section 49. The drive control section 49 is
Based on the rotation angles α and β, the positioning motor 21',
19' is cantered to rotate the torch 20' of the dummy rotating torch 30 by an angle α in the direction of the arrow ', and
Rotate the body 17' by an angle β in the direction of arrow G'. Then... x' of the reference point cp at the tip of the filler 41 of the normal direction measuring device 40. The direction of the reference axis CL' of the filler 41 coincides with the direction of the normal vector N calculated by the normal direction calculation section 46 without changing the position of the y'z' coordinates. Therefore, the operator manually moves the normal direction measuring device 40 to arrow A.
'', B'' direction, arrow C'. D' direction or arrow E'
Move the filler 4l in the F' direction to the reference point CP at the tip of the filler 4l.
When the operator traces the machined surface 66a of the workpiece 66, the reference axis CL of the filler 41 of the normal direction measuring device 40 is Since the drive is controlled so that the direction of ' is coincident with the normal direction, the operator can move the normal direction measuring device 40 to /! There is no need to adjust the i1 oblique angle to vR, and it is only necessary to adjust the position of the reference point CP at the tip of the filler 4l. Therefore, teaching work can be performed accurately in a short time.

そして,作業者又は位置決めモータエ9′21′による
走行フレーム25,サドル27,伸縮アーム29,ダミ
ー旋回トーチ30の各移動量は各エンコーダ34.31
.32、33、35で検出され,加工プログラム生成装
置36に出力される。加工プログラム生成装置36はそ
れ等の検出値をもとに、模擬的な加工動作に対応した加
工プログラムPROを生成し,加工プログラムメモリ3
7に格納する. こうして、作或され、加工プログラムメモリ37に格納
された加工プログラムPROは、主制御部45を介して
オンラインでレーザ加工機1に転送され、レーザ加工機
1は、該加工プログラムPR○に基づく加工を直ちに実
行することができる。なお、レーザ加工機lによる加工
は,ワーク66等のティーチングの完了した加工すべき
ワークをテーブル3上に搭載した状態で、テーブル3を
腿動モータ5により矢印A.B方向に移動關動し、更に
サドル9を駆動モータ10により矢印C、D方向に,ま
た,加工ヘッドl2を岨動モータ13により矢印E.F
方向に移動駆動することにより、更に、第3図に示す位
置決めモータ19を岨動することにより、旋回トーチ1
6の胴体l7を矢印G.H方向に旋回廓動させ、また,
位置決めモータ21を駆動することにより,トーチ部2
0を矢印I,J方向に旋回駆動させることにより行われ
る.そして,レーザ光は,加工ヘッドl2から旋回トー
チ16中の光路17bを介してトーチ部20の光路20
cを通り、チップ20aからワーク66の加工面66a
に向けて,チップ20aの中心軸CLと一致した方向に
、従って、ティーチング時に求められた各加工部位の法
線方向,即ち、該加工面66aに垂直に射出され,所定
の加工が行われる。
The amount of movement of the traveling frame 25, saddle 27, telescopic arm 29, and dummy rotating torch 30 by the operator or the positioning motor 9'21' is determined by each encoder 34.31.
.. It is detected at 32, 33, and 35 and output to the machining program generation device 36. The machining program generation device 36 generates a machining program PRO corresponding to the simulated machining operation based on these detected values, and stores it in the machining program memory 3.
Store it in 7. The machining program PRO created in this way and stored in the machining program memory 37 is transferred online to the laser processing machine 1 via the main control unit 45, and the laser processing machine 1 performs machining based on the machining program PR○. can be executed immediately. Note that processing by the laser processing machine 1 is performed with the workpiece to be machined, which has been taught, such as the workpiece 66, mounted on the table 3, and the table 3 is moved by the thigh movement motor 5 in the direction indicated by the arrow A. The drive motor 10 moves the saddle 9 in the direction of arrows C and D, and the drive motor 13 moves the processing head l2 in the direction of arrow E. F
By driving the rotating torch 1 in the direction and further by driving the positioning motor 19 shown in FIG.
6's body l7 with arrow G. Rotate in the H direction, and
By driving the positioning motor 21, the torch section 2
This is done by rotating the 0 in the directions of arrows I and J. Then, the laser beam is transmitted from the processing head l2 through the optical path 17b in the rotating torch 16 to the optical path 20 in the torch section 20.
c, from the chip 20a to the machining surface 66a of the workpiece 66.
The laser beam is injected toward the center axis CL of the tip 20a in a direction that coincides with the central axis CL of the tip 20a, that is, in the normal direction of each processing portion determined at the time of teaching, that is, perpendicular to the processing surface 66a, and predetermined processing is performed.

なお、上述の実施例においては、各変調器47bによっ
て各レーザ発振器42Aの電源にそれぞれ異なった周波
数の変調を掛け、前記各レーザ発振器42Aからそれぞ
れ異なった振幅変調の掛けられたレーザ光LSを射出し
て、各バンドパスフィルタ46aによってレーザ光LS
を受光した各受光素子42Bから出力された電圧信号の
中から当該受光素子42Bに対応するレーザ発振器42
Aから射出された,所定の変調の掛けられたレーザ光L
Sに対応する戒分の電圧信号を取り出すことにより,各
受光素子42Bが受光したレーザ光LSの内、当該受光
素子42Bに対応しないレーザ発振器42Aから射出さ
れたレーザ光LSによる影響を除去する場合について述
べたが,各受光素子42Bに対応しないレーザ発振器4
2Aか?射出されたレーザ光LSによる影響を除去する
には、3点の測定点P.、P2、P,の基準面PLから
の距離L■、L2、L,を同時に測定せずに、それぞれ
の測定時間をずらして、即ち、時分割して測定すること
により行うこともできる.即ち、第8図に示すティーチ
ング装置22の法線方向測定装置制御部47には、信号
切換器47cが接続しており、該信号切換器47cには
、ドライバ47a,.47a,、47a,を介して各レ
ーザ発振器42Aエ、42A2、42A,が接続してい
る.また、法線方向測定装置制御部47には法線方向演
算部46が接続しており、該法線方向演算部46にはマ
ルチプレクサ46cが接続しており,更に、該マルチプ
レクサ46cには各受光素子42Bい42B2、42B
,が接続している.そして,前記法線方向演算部46及
び前記マルチプレクサ46cには,前記信号切換器47
cが接続している. そして、各レーザ発振器42A及び各受光素子42Bに
よって、各測定点p1, p.、P,の基?面PLから
の距¥VIL■、L2、L,を測定する際には,まず、
測定点Pエの距離L1のみを測定する.即ち,法線方向
測定装置制御部47は,信号切換器47cを介して,マ
ルチプレクサ46cに対して受光素子42Bよと法線方
向演算部46を接続すべき旨の信号を出力すると共に、
レーザ発振器42Aエのドライバ47aエに対してレー
ザ光LSを射出すべき旨の信号を出力する。すると,3
個の受光素子42Bの内、前記受光素子42Bエのみが
マルチプレクサ46cを介して法線方向演算部46と接
続し、また,3個のレーザ発振器42Aの内,前記レー
ザ発振器42A■のみからレーザ光LSが基準軸CL’
 に平行に射出され測定点P1に照射される.そして、
前記受光素子42Bエは、第4図に示す測定点Pエで乱
反射したレーザ光LSを受光し.法線方向演算部46に
対して距離Lエに対応する電圧信号等を、受光素子42
B.のみを法線方向演算部46と接続したマルチプレク
サ46cを介して出力する。そして、法線方向演算部4
6は,受光素子42B1から出力された電圧信号に基づ
いて測定点Pエの距離Lエを求める.この際に,前記受
光素子42Bエ以外の受光素子42B,,42B,にお
いてレーザ光LSを受光する場合があるが、当該各受光
素子42B2、42B,からの電圧信号はマルチプレク
サ46cにおいて遮断されて法線方向演算部46には入
力されず、また,受光素子42Bエは,当該受光素子4
2Bエに対応しないレーザ発振器42A2、42A,か
ら出力されるレーザ光LSを受光することがないので距
lL.に対応する電圧信号のみが前記法線方向演算部4
6に入力されて、前記測定点P、の距Wt L tは正
確に測定される.次に、前述の測定点P.の場合と同様
にして、測定点P2の距離L2を測定する.即ち、法線
方向測定装置制御部47は、信号切換器47cを介して
、レーザ発振器42A2のみからレーザ光LSを射出さ
せると共に、マルチプレクサ46cによって受光素子4
2B2のみを法線方向演算部46と接続する.そして.
測定点P2で反射したレーザ光LSを受光した前記受光
素子42B2から出力されたiaLzに対応する電圧信
号のみが前記法線方向演算部46に入力されて,測定点
P2の距lm Laが正確に測定される. 次に,前述の測定点P、、測定点P2の場合と同様にし
て,測定点P,の距gt Lsを測定する.即ち、法線
方向測定装置制御部47は,信号切換器47cを介して
、レーザ発振器42A,のみからレーザ光LSを射出さ
せると共に.マルチプレクサ46cによって受光素子4
2B,のみを法線方向演算部46と接続する。そして、
測定点P,で反射したレーザ光LSを受光した前記受光
素子42B3から出力された距11i r− sに対応
する電圧信号のみが前記法線方向演算部46に入力され
て. atq定点P,の距離L,が正確に測定される.
従って、各測定点Pエ、P2. P,の基準面PLから
の距離L,、L2、L3をそれぞれ時分割して複数のレ
ーザ発振器42Aによる影響を除去して測定することに
より.各距mLエ,L2、L3を正確に測定することが
できる。
In the above-described embodiment, each modulator 47b modulates the power supply of each laser oscillator 42A with a different frequency, and each laser oscillator 42A emits laser light LS with different amplitude modulation. Then, the laser beam LS is filtered by each bandpass filter 46a.
The laser oscillator 42 corresponding to the light receiving element 42B is selected from among the voltage signals output from each light receiving element 42B that has received the light.
Laser light L emitted from A and subjected to predetermined modulation
When removing the influence of the laser beam LS emitted from the laser oscillator 42A that does not correspond to the light receiving element 42B among the laser beams LS received by each light receiving element 42B by extracting the precept voltage signal corresponding to S. However, the laser oscillator 4 that does not correspond to each light receiving element 42B
Is it 2A? In order to remove the influence of the emitted laser beam LS, three measurement points P. , P2, P, from the reference plane PL can also be measured without measuring the distances L2, L2, L, from the reference plane PL at the same time, by staggering the respective measurement times, that is, measuring them in a time-sharing manner. That is, a signal switch 47c is connected to the normal direction measuring device control section 47 of the teaching device 22 shown in FIG. 8, and the signal switch 47c is connected to the drivers 47a, . Each laser oscillator 42A, 42A2, 42A, is connected via 47a, 47a. Further, a normal direction calculation unit 46 is connected to the normal direction measurement device control unit 47, a multiplexer 46c is connected to the normal direction calculation unit 46, and each of the light receiving units is connected to the multiplexer 46c. Element 42B 42B2, 42B
, are connected. The normal direction calculation unit 46 and the multiplexer 46c include the signal switching unit 47.
c is connected. Then, each measurement point p1, p. The basis of ,P,? When measuring the distance \VIL■, L2, L, from the plane PL, first,
Measure only the distance L1 from measurement point Pe. That is, the normal direction measuring device control section 47 outputs a signal to the multiplexer 46c via the signal switch 47c to the effect that the normal direction calculation section 46 should be connected to the light receiving element 42B, and
A signal indicating that the laser beam LS should be emitted is output to the driver 47a of the laser oscillator 42A. Then, 3
Of the three light-receiving elements 42B, only the light-receiving element 42B is connected to the normal direction calculation unit 46 via a multiplexer 46c, and among the three laser oscillators 42A, only the laser oscillator 42A emit laser light. LS is the reference axis CL'
The beam is emitted parallel to and irradiated to measurement point P1. and,
The light receiving element 42B receives the laser beam LS diffusely reflected at the measurement point P shown in FIG. The light receiving element 42 sends a voltage signal corresponding to the distance L to the normal direction calculation unit 46.
B. Only the normal direction calculation unit 46 is outputted via the multiplexer 46c connected to the normal direction calculation unit 46. Then, the normal direction calculation unit 4
Step 6 calculates the distance Le of the measurement point Pe based on the voltage signal output from the light receiving element 42B1. At this time, the laser beam LS may be received by the light receiving elements 42B, 42B other than the light receiving element 42B, but the voltage signal from each of the light receiving elements 42B2, 42B is blocked by the multiplexer 46c and becomes inactive. It is not input to the linear direction calculation unit 46, and the light receiving element 42B is
Since the laser beams LS output from the laser oscillators 42A2, 42A, which do not correspond to 2B are not received, the distance lL. Only the voltage signal corresponding to
6, the distance WtLt of the measurement point P is accurately measured. Next, the measurement point P. Measure the distance L2 of the measurement point P2 in the same way as in the case of . That is, the normal direction measuring device control unit 47 causes the laser beam LS to be emitted only from the laser oscillator 42A2 via the signal switch 47c, and also causes the multiplexer 46c to emit the laser beam LS from the light receiving element 4.
Only 2B2 is connected to the normal direction calculation section 46. and.
Only the voltage signal corresponding to iaLz outputted from the light receiving element 42B2 that received the laser beam LS reflected at the measurement point P2 is input to the normal direction calculation unit 46, so that the distance lmLa of the measurement point P2 can be accurately determined. It is measured. Next, the distance gt Ls of the measurement point P is measured in the same manner as in the case of the measurement point P and measurement point P2 described above. That is, the normal direction measuring device control unit 47 causes only the laser oscillator 42A to emit the laser beam LS via the signal switch 47c, and also causes the laser beam LS to be emitted only from the laser oscillator 42A. The light receiving element 4 is connected by the multiplexer 46c.
2B, is connected to the normal direction calculation unit 46. and,
Only the voltage signal corresponding to the distance 11ir-s outputted from the light receiving element 42B3 which received the laser beam LS reflected at the measurement point P is input to the normal direction calculation unit 46. The distance L, between atq fixed point P, is accurately measured.
Therefore, each measurement point Pe, P2. By measuring the distances L, , L2, and L3 of P from the reference plane PL in a time-divided manner and removing the influence of the plurality of laser oscillators 42A. Each distance mL, L2, and L3 can be accurately measured.

また、上述のレーザ光LSに変調を掛けることによる各
測定点pL.p,、P,の距離Lエ,L2,L,の測定
と、時分割による各測定点Pエ、P2,P,の距離L.
. L2. L,の測定を組合せて行うことも出来る。
Moreover, each measurement point pL by applying modulation to the above-mentioned laser beam LS. Measurement of distance L, L2,L, of p,,P, and distance L. of each measurement point P,P2,P, by time division.
.. L2. It is also possible to perform the measurements of L, in combination.

即ち、第l8図に示すティーチング装置22の法線方向
測定装置制御部47には、信号切換器47cが接続して
おり、該信号切換器47cには、ドライバ47a1、4
7a2、4 7 a,.変調器47b、47b、47b
を介して各レーザ発振器42Aエ、42A2、42A,
が接続している。また,法線方向測定装置制御部47に
は法線方向演算部46が接続しており、該法線方向演算
部46には復調器46b、バンドパスフィルタ46aを
介してマルチプレクサ46cが接続しており、更に、該
マルチプレクサ46cには各受光素子42B,.42B
2、42B3が接続している.そして、前記法線方向演
算部46及び前記マルチプレクサ46cには、前記信号
切換器47cが接続している. そして、各レーザ発振器42A及び各受光素?42Bに
よって,各測定点Pよ、P2、P,の基準面PLからの
距m L .、L2、L,を測定する際には、まず,測
定点P■の距離Lエのみを測定する。
That is, a signal switch 47c is connected to the normal direction measuring device control section 47 of the teaching device 22 shown in FIG.
7a2, 4 7 a, . Modulators 47b, 47b, 47b
via each laser oscillator 42A, 42A2, 42A,
is connected. Further, a normal direction calculation unit 46 is connected to the normal direction measurement device control unit 47, and a multiplexer 46c is connected to the normal direction calculation unit 46 via a demodulator 46b and a bandpass filter 46a. Furthermore, the multiplexer 46c has respective light receiving elements 42B, . 42B
2, 42B3 is connected. The signal switch 47c is connected to the normal direction calculation section 46 and the multiplexer 46c. And each laser oscillator 42A and each photodetector? 42B, the distance m L . of each measurement point P, P2, P, from the reference plane PL. , L2, and L, first measure only the distance L of the measurement point P■.

即ち,法線方向測定装置制御部47は、信号切換器47
cを介して,マルチプレクサ46cに対して受光素子4
2Bよと法線方向演算部46を接続すべき旨の信号を出
力すると共に、レーザ発振器42A,のドライバ47a
■に対してレーザ光LSを射出すべき旨の信号を出力す
る。すると、3個の受光素子42Bの内、前記受光素子
42Bエのみがマルチプレクサ46c、バンドパスフィ
ルタ46a,復調器46bを介して法線方向演算部46
と接続される.また、3個のレーザ発振器42Aの内、
レーザ発振器42A1のみに、ドライバ47aい変調器
47bを介して那動電流を供給すると共に,前記駆動電
流に周波数変調が掛けられ、前記レーザ発振器42A■
のみからレーザ光LSが所定の振幅変調を掛けられた状
態で基準軸CL’ に平行に射出され測定点Pエに照射
される。
That is, the normal direction measuring device control section 47 controls the signal switching device 47.
The light receiving element 4 is connected to the multiplexer 46c via the
2B and the driver 47a of the laser oscillator 42A.
A signal to the effect that the laser beam LS should be emitted is outputted to (2). Then, among the three light receiving elements 42B, only the light receiving element 42B is connected to the normal direction calculation unit 46 via the multiplexer 46c, the bandpass filter 46a, and the demodulator 46b.
is connected to. Moreover, among the three laser oscillators 42A,
A driving current is supplied only to the laser oscillator 42A1 via the driver 47a and the modulator 47b, and frequency modulation is applied to the drive current, so that the laser oscillator 42A1
A laser beam LS is emitted from the center parallel to the reference axis CL' with a predetermined amplitude modulation applied thereto, and is irradiated onto the measurement point Pe.

そして、前記受光素子42Bエは、第4図に示す?定点
P■で乱反射したレーザ光LSを受光し、法線方向演算
部46に対して距JIiL Lに対応する電1圧信号等
を、受光素子42B■のみをバンドバスフィルタ46a
,復調器46bを介して法線方向演算部46と接続した
マルチプレクサ46cを介して出力する。そして、法線
方向演算部46は、受光素子42Bエから出力された電
圧信号に基づいて測定点Pエの距離L1を求める.この
際に,前記受光素子42B1以外の受光素子42B2、
42B,においてレーザ光LSを受光した場合には当該
各受光素子42B2、42B,からの電圧信号はマルチ
プレクサ46cにおいて遮断されて法線方向演算部46
には入力されず、また、受光素子42B1は,当該受光
素子42B1に対応しないレーザ発振器42A2、42
A,から出力されるレーザ光LSを受光することがなく
、更に,前記受光素子42Bエにおいて変調の掛かって
いない自然光やある種の変調の掛けられた電燈光等を受
光した場合でも,前記受光素子42B1から出力された
電圧信号の中から、バンドパスフィルタ46aによって
所定の変調の掛けられたレーザ光LSに対応した戒分の
電圧信号が取り出され、更に、復調器46bにより復調
されて距ILエに対応する電圧信号のみが法線方向演算
部46に対して出力されるので,前記測定点Pエの距’
11 Lzは正確に測定される. 次に,前述の測定点Pエの場合と同様にして、測定点P
2の距’era L 2を測定する。即ち、法線方向測
定装置制御部47は,信号切換器47c、ドライバ47
a2、変調器47bを介して、レーザ発振器42A2の
みに所定の周波数変調を掛けた隠動電流を供給して該レ
ーザ発振器42A2のみから所定の変調を掛けたレーザ
光LSを射出させると共に、マルチプレクサ46cによ
って受光素子42B2のみをバンドパスフィルタ46a
、復調器46bを介して法線方向演算部46と接続する
The light receiving element 42B is shown in FIG. The laser beam LS diffusely reflected at the fixed point P■ is received, and a voltage signal, etc. corresponding to the distance JIiL L is sent to the normal direction calculation unit 46, and only the light receiving element 42B■ is passed through the bandpass filter 46a.
, a demodulator 46b and a multiplexer 46c connected to the normal direction calculation unit 46. Then, the normal direction calculation unit 46 calculates the distance L1 of the measurement point Pe based on the voltage signal output from the light receiving element 42Be. At this time, the light receiving element 42B2 other than the light receiving element 42B1,
42B, when the laser beam LS is received at the respective light receiving elements 42B2, 42B, the voltage signals from the respective light receiving elements 42B2, 42B are blocked at the multiplexer 46c and sent to the normal direction calculation section 46.
The light receiving element 42B1 is not input to the laser oscillator 42A2, 42 which does not correspond to the light receiving element 42B1.
Even if the light receiving element 42B does not receive the laser beam LS output from A, and furthermore, the light receiving element 42B receives unmodulated natural light or some kind of modulated electric light light, the light receiving element 42B From the voltage signal output from the element 42B1, a voltage signal corresponding to the laser beam LS subjected to a predetermined modulation is extracted by the bandpass filter 46a, and further demodulated by the demodulator 46b to obtain the distance IL. Since only the voltage signal corresponding to point P is output to the normal direction calculation unit 46, the distance of the measurement point P
11 Lz is measured accurately. Next, in the same manner as in the case of the measurement point Pd described above, the measurement point P
Measure the distance 'era L 2 of 2. That is, the normal direction measuring device control section 47 includes a signal switch 47c, a driver 47
a2, via the modulator 47b, supplying a hidden current with a predetermined frequency modulation applied only to the laser oscillator 42A2 to emit a laser beam LS with a predetermined modulation from only the laser oscillator 42A2, and multiplexer 46c , only the light receiving element 42B2 is filtered by the bandpass filter 46a.
, are connected to the normal direction calculation unit 46 via a demodulator 46b.

尚,この場合、レーザ光LSに掛ける変調は、自然光、
電燈光等による影響を除去することが目的であるから、
レーザ発振器42A2の電源に掛ける変調の周波数は、
前述のレーザ発振器42Aエの電源に掛ける変調の周波
数と同一でよい.そして、測定点P2で反射したレーザ
光LSを受光した前記受光素子42B2から出力された
電圧信号の中から所定の変調の掛けられたレーザ光LS
に対応した電圧信号が取り出されて距離L2に対応する
電圧信号のみが前記法線方向演算部46に入力されて、
測定点P2の距離L2が正確に測定される。
In this case, the modulation applied to the laser beam LS is natural light,
Since the purpose is to eliminate the influence of electric lights, etc.
The modulation frequency applied to the power supply of the laser oscillator 42A2 is
It may be the same frequency as the modulation frequency applied to the power supply of the laser oscillator 42A described above. Then, the laser beam LS is subjected to a predetermined modulation from among the voltage signals output from the light receiving element 42B2 that received the laser beam LS reflected at the measurement point P2.
A voltage signal corresponding to the distance L2 is extracted, and only the voltage signal corresponding to the distance L2 is inputted to the normal direction calculation section 46,
The distance L2 of the measurement point P2 is accurately measured.

次に、前述の測定点Pエ、測定点P2の場合と同様にし
て,測定点P3の距離L,を測定する.即ち、法線方向
測定装置制御部47は、信号切換器47cを介して、レ
ーザ発振器42A,のみから変調器47bによって所定
の変調を掛けられたレーザ光LSを射出させると共に、
マルチプレクサ46cによって受光素子42B,のみを
パンドパスフィルタ46a、復調器46bを介して法線
方向演算部46と接続する.尚、この場合も、レーザ発
振器42A3の電源に掛ける変調の周波数は、上述のレ
ーザ発振器42Aユ、42A2の電源に掛ける変調の周
波数と同一の周波数でよい.そして、測定点P3で反射
したレーザ光LSを受光した前記受光素子42B,から
出力された電圧信号の中から所定の変調の掛けられたレ
ーザ光LSに対応した電圧信号が取り出されて距mLx
に対応する電圧信号のみが前記法線方向演算部46に入
力されて.測定点P,の距離L,が正確に測定される。
Next, the distance L of the measurement point P3 is measured in the same manner as in the case of the measurement point Pd and the measurement point P2 described above. That is, the normal direction measuring device control unit 47 causes the laser beam LS modulated by the modulator 47b to be emitted only from the laser oscillator 42A via the signal switch 47c, and
A multiplexer 46c connects only the light receiving element 42B to the normal direction calculation unit 46 via a band pass filter 46a and a demodulator 46b. In this case as well, the frequency of modulation applied to the power supply of the laser oscillator 42A3 may be the same frequency as the frequency of modulation applied to the power supply of the laser oscillators 42A and 42A2. Then, a voltage signal corresponding to the laser beam LS subjected to a predetermined modulation is extracted from among the voltage signals output from the light receiving element 42B that received the laser beam LS reflected at the measurement point P3, and a voltage signal corresponding to the laser beam LS subjected to a predetermined modulation is extracted.
Only the voltage signal corresponding to . is input to the normal direction calculation section 46. The distance L between the measurement point P and the measurement point P can be accurately measured.

従って、各測定点Pエ,P2、P3の基準面PLからの
距離Lエ,L2、L,をそれぞれ時分割して複数のレー
ザ発振器42Aによる影響を除去して、更に, L/−
ザ光LSに変調を掛けることにより自然光及び電燈光等
による影響を除去して測定することにより,各距HLエ
,L2、L,を正確に測定することができる. また、上述の実施例においては、テイーチング装置22
が,レーザ加工機上とは別個に独立した形で設けられて
いる場合について述べたが、レーザ加工機1に法線方向
測定装置40等を設けて,レーザ加工機上においてテイ
ーチング作業を行うようにしてもよいことは勿論である
.また、法線方向測定装置40を位置決めモータ19’
 .21’によって回転闘動し,その回転角度をエンコ
ーダ33、35によって検出して加工プログラムPRO
を作成する場合について述べたが,法線方向演算部46
によって演算された回転角α、βを直接加工プログラム
生成装置36に出力して(必ずしも法線方向測定装置4
0を回転駆動させなくてもよい.)加工プログラムPR
○を作成するようにしてもよいことは勿論である. また,上述の実施例においては,法線方向測定装置40
にフィラー41を設けて基準点CPを機械的に設定する
ようにした場合について述べたが,基準点CPを設定す
ることができれば機械的なものでなく第9@及び第10
図に示す法線方向測定装置50のように、非接触センサ
等を用いてもよい.尚、法線方向測定装置50の構成要
素の内,法線方向測定装置40と同一の構成要素には、
同一の附号を附して説明を省略する.即ち、法線方向測
定装置50は、略円筒形の本体50aを有しており、該
本体50aは、トーチ部20’の先端に接続している.
そして、本体50aには,第9図下方に、該本?#5 
0 aの中心軸、即ち、基準軸CL’ に垂直なレーザ
光入射面50bが形成されており,更に,該レーザ光入
射面50bの図中下方には,基準軸CL’に垂直なレー
ザ光射出面50cが形成されている.そして、該レーザ
光射出面50cの第工0図中央には、第9図図下方に,
略円錐状の先端部50dが固着している.また,本体5
0a内部の基準軸CL’上には.半導体レーザ等の基準
用レーザ発振器5工が、可視光線である基準用レーザ光
LBを基準軸CL’方向に射出し得る形で設けられてお
り、また、該基準用レーザ発振器5lの第9図下方の基
準軸CL’上には、光路51aが本体50a及び先端部
50dを貫通する形で形成され、更に光路51aの先端
には図中下方に開放される形で基準用光線射出部5lb
が形威されている.また,本体50a内部の前記レーザ
光射出面50cの図中上方には、3個の半導体レーザ等
のレーザ発振器42A,.42A,.42A3が、第1
0図に示すように,基準軸CL’に垂直な平面上の,基
準軸CL’から同一半径上に,基準軸CL’に対して等
角度間隔、即ち、120’間隔で設けられている.そし
て,前記各レーザ発振器42Aは、第9図下端に射出部
42aを有しており,各射出部42aは、前記レーザ光
射出面50c上に、第lO図に示すように,前記基準用
光線射出部5lbの周りに配置される形で設けられてい
る.そして,各レーザ発振器42Aは,前記射出部42
aから基準軸CL’に平行測定用にレーザ光LSを射出
することが出来る.また,前記各射出部42aによって
基準面PLが規定される.そして,前記レーザ光入射面
50b上には、第工0図に示すように、3個のバンドパ
スフィルタ53、53、53が、前記各レーザ発振器4
2Aい42A2,42A3と基準軸CAL’に対して同
一の半径方向に、即ち,120゜間隔で前記各射出部4
2aの周りに配置される形で基準軸CL’ から同一半
径上に設けられている.そして、前記各バンドパスフィ
ルタ53の第9図上方の本体50a内部には、反射#!
52によって構成される光路52aが形威されており,
該光路52a上には、集光レンズ43が設けられている
.そして,各集光レンズ43の第9図上方には,受光素
子42Bい42Bよ、42B,が、基準軸CL′に垂直
な同一平面上の、基準軸CL’から同一半径上で,第l
O図に示すように,前記各レーザ発振器42A,,42
A,、42A,と基準軸CL′に対して同一の半径方向
、即ち、120@間隔で,それぞれ受光面42bを,第
9図に示すように、前記光路52a側,即ち、図中下方
へ向けた形で設けられている.また、上述の法線方向測
定装置40と同様に、前記各レーザ発振器42Aには,
第6図、第8図又は第工8図に示す各変調器47b又は
各ドライバ47aが接続しており、前記各受光素子42
Eには,第6図、第8図又は第l8図に示す各バンドバ
スフィルタ46a又はマルチプレクサ46cが接続して
いる.法線方向測定装置50は以上のような構或を有す
るので,ティーチングに伴って該法線方向測定装置50
によってワーク66の加工面66aにおける法線方向を
測定するには、作業者がティーチング装置22を操作し
てトーチ部20′の先端に設けられた法線方向測定装置
50を加工面66a上を移動させ、法線方向測定装置5
0の基準用レーザ発振器5工から出力され、光路51a
を介して基準用光線射出部5lbから基準軸CL’に一
致した形で射出される基準用レーザ光LBを加工面66
aの法線方向を求めようとする所定の位置に照射させる
.即ち,第9図に示すように,基準用レーザ発振器51
から射出された基準用レーザ光LBの照射された加工面
66a上の点が基準点CPと規定される.そして、各レ
ーザ発振器42Aから、測定用レーザ光LSが基準軸C
L’に平行に加工面66aに射出されると,加工面66
a上の前記基準点CP近傍の各測定点Pにおいて乱反射
した測定用レーザ光LSは.各バンドパスフィルタ53
によって所定の周波数の測定用レーザ光LS以外の光が
除去された形で、光路52a内に入射する.そして、測
定用レーザ光LSは、光路52aを通り,集光レンズ4
3によって集光されて各受光素子42Bの受光面42b
上に、基準面PLから測定点Pまでの距離Lに対応した
矢印LR方向の位置に焦点を結ぶ形で受光される.そし
て、上述の法線方向測定装置40の場合と同様に、各受
光素子42Bから法線方向演算部46へ前記受光した測
定用レーザ光LSの受光面42b上の焦点位置に対応す
る信号が出力され、法線方向演算部46において,各測
定点Pの位置が判定される.そして,各測定点Pによっ
て仮想平面65が規定され、該仮想平面65の法線ベク
トルNを演算することにより,加工面66a上の基準点
CPにおける法線方向が判定される.なお,法線方向測
定装置においては、各レーザ発振器42Aから射出され
加工面66a上の各測定点Pにおいて反射された測定用
レーザ光LSを,各受光素子42Bで受光することが出
来れば、レーザ発振器42A,受光素子42B等の法線
方向測定装置の構成要素の配亘は任意でよい.即ち,第
工1図及び第12図に示す法線方向測定装置55は.構
成要素の配置を変更して本体下部を小型化したものであ
る.尚、法線方向測定装置55の構成要素の内,法線方
向測定装置40、50と同一の構成要素には同一の附号
を附して説明を省略する.法線方向測定装置55は、受
光部55bと投光部55cとから成る本体55aを有し
ており、前記受光部55bは,略円筒形に形成されて、
トーチ部20’ の先端に接続している.そして,前記
受光部55bの第1工図下部には,本体55aの中心軸
,即ち、基準軸CL’に垂直なレーザ光入射面55dが
形成されており,第12図に示すように、該レーザ光入
射面55dの中央には,第1l図下方に前記受光部55
bよりも小径の略円筒形の投光部55cが固着している
.また,前記投光部55cの第11@下部には,基準軸
CL’に垂直なレーザ光射出面55eが形成されており
、該レーザ光射出面55aには,第1工図下方に略円錐
形の先端部55fが接続している,そして、前記投光部
55c内部には,中心軸,即ち、基準軸CL’上に、基
準用レーザ発振器5工が基$軸CL’方向に基準用レー
ザ光LBを射出し得る形で設けられており、また、前記
基準用レーザ発振器51の第工1図下方の基準軸CL’
上には,光路51aが投光部55c及び先端部55fを
貫通する形で形成され、図中下方に開放される形で基準
用光線射出部5lbが形威されている.また,前記投光
部55c内部の前記レーザ光射出面55eの図中上方に
は、3個のレーザ発振器42Aい42A2、42A,が
,第工2図に示すように、基準軸CL’に垂直な平面上
の、基準軸CL’から同一半径上で,基準軸CL’ に
対して等角度間隔,即ち.120’間隔で設けられてい
る.そして,各レーザ発振器42Aは,第11図下端に
、射出部42aを有しており、各射出部42aは,前記
レーザ光射出面55e上に配置されている.そして,各
レーザ発振器42Aは、前記射出部42aから基準軸C
L’ に平行に測定用レーザ光LSを射出することが出
来る.また、前記各射出部42aによって基準面PLが
規定される.そして、前?各射出部42aの第工113
ii1下方には、それぞれ,光路42cが,先端部55
fを貫通する形で基準軸CL′に平行に形威されており
,図中下方に開放される形で測定用光線射出部42dが
形成されている.そして,各測定用光線射出部42dは
、第12図に示すように,前記基準用光線射出部5lb
の周りに配置されている.そして、前記レーザ光入射面
55d上には,第工2図に示すように、3個のバンドパ
スフィルタ53、53、53が、前記各レーザ発振器4
2A■、42A2、42A3と基準軸CL’ に対して
同一の半径方向,即ち、工20゜間隔で、前記各測定用
光線射出部42dの周りに配置される形で、基準軸CL
’ から同一半径上に設けられている.そして,前記各
バンドパスフィルタ53の第1上図上方の受光部55b
内部には,光路52aが形成されており、該光路52a
上には,集光レンズ43が設けられている.そして,前
記光路52aの図中上方には、反射鏡52が設けられて
おり,該反射鏡52の基準軸CL′側,即ち,第11@
左方には,前記光路52aと連通する光路52bが形成
されている.そして,前記各反射tIL52及び前記各
光路52bから基準軸CL’側には、受光素子42Bよ
、42B2、42B3が、第12図に示すように,基準
軸CL’に垂直な平面上の、基準軸CL’から同一半径
上で,前記各レーザ発振器42Ai、42A2、42A
,と基準軸CL’ に対して同一の半径方向、即ち、1
20’間隔で,それぞれ受光面42bを、第11図に示
すように,基準軸CL″の反対側、即ち,前記光路52
b及び前記反射鏡52側へ向けた形で設けられている.
また,上述の法線方向測定装置40.50と同様に、前
記各レーザ発振器42Aには,第6図,第8図又は第1
8図に示す各変調器47b又は各ドライバ47aが接続
しており、前記各受光素子42Bには,第6図、第8図
又は第18図に示す各バンドパスフィルタ46a又はマ
ルチプレクサ46cが接続している。
Therefore, the distances L, L2, and L of the measurement points P, P2, and P3 from the reference plane PL are time-divided to remove the influence of the plurality of laser oscillators 42A, and further, L/-
By modulating the light LS to remove the influence of natural light, electric light, etc., each distance HL, L2, and L can be accurately measured. Furthermore, in the above embodiment, the teaching device 22
Although we have described the case where the laser processing machine 1 is provided separately and independently from the laser processing machine, it is also possible to install a normal direction measuring device 40 etc. on the laser processing machine 1 and perform teaching work on the laser processing machine. Of course, it is also possible to do so. In addition, the normal direction measuring device 40 is connected to the positioning motor 19'.
.. 21', the rotation angle is detected by encoders 33 and 35, and the machining program PRO is executed.
As described above, the normal direction calculation unit 46
The rotation angles α and β calculated by
0 does not need to be rotated. ) Machining program PR
Of course, it is also possible to create ○. In addition, in the above embodiment, the normal direction measuring device 40
We have described the case in which the filler 41 is provided at the base point CP and the reference point CP is mechanically set.
A non-contact sensor or the like may be used, such as the normal direction measuring device 50 shown in the figure. Note that among the components of the normal direction measuring device 50, the same components as the normal direction measuring device 40 include:
The same subtitles will be given and the explanation will be omitted. That is, the normal direction measuring device 50 has a substantially cylindrical main body 50a, and the main body 50a is connected to the tip of the torch section 20'.
And, on the main body 50a, at the bottom of FIG. 9, the book? #5
A laser beam entrance surface 50b is formed perpendicular to the central axis of 0a, that is, the reference axis CL', and further, below the laser beam entrance surface 50b in the figure, a laser beam perpendicular to the reference axis CL' is formed. An exit surface 50c is formed. In the center of FIG. 0 of the laser beam emitting surface 50c, there is a lower part of FIG. 9.
A substantially conical tip 50d is fixed. Also, the main body 5
On the reference axis CL' inside 0a. A reference laser oscillator 5 such as a semiconductor laser is provided in such a manner that it can emit a reference laser beam LB, which is a visible light, in the direction of the reference axis CL'. On the lower reference axis CL', an optical path 51a is formed to pass through the main body 50a and the tip 50d, and at the tip of the optical path 51a, a reference light beam emitting part 5lb is opened downward in the figure.
is in great shape. Also, above the laser beam emitting surface 50c inside the main body 50a in the drawing, there are three laser oscillators 42A, such as semiconductor lasers, . 42A,. 42A3 is the first
As shown in FIG. 0, they are provided on a plane perpendicular to the reference axis CL', on the same radius from the reference axis CL', at equal angular intervals, that is, at 120' intervals with respect to the reference axis CL'. Each of the laser oscillators 42A has an emission part 42a at the lower end of FIG. It is arranged around the injection part 5lb. Each laser oscillator 42A is connected to the emission section 42A.
The laser beam LS can be emitted from a to the reference axis CL' for parallel measurement. Further, a reference plane PL is defined by each of the injection portions 42a. As shown in FIG.
2A 42A2, 42A3 and the respective injection portions 4 in the same radial direction with respect to the reference axis CAL', that is, at 120° intervals.
2a, and are provided on the same radius from the reference axis CL'. Inside the main body 50a of each bandpass filter 53 in the upper part of FIG. 9, there is a reflection #!
The optical path 52a constituted by 52 is shaped,
A condensing lens 43 is provided on the optical path 52a. Above each condensing lens 43 in FIG.
As shown in Figure O, each of the laser oscillators 42A, 42
As shown in FIG. 9, the light receiving surfaces 42b are moved toward the optical path 52a side, that is, downward in the figure, in the same radial direction with respect to the reference axis CL', 42A, and 42A, that is, at intervals of 120@. It is set up in a direction. Further, similarly to the normal direction measuring device 40 described above, each of the laser oscillators 42A includes:
Each modulator 47b or each driver 47a shown in FIG. 6, FIG. 8, or FIG.
Each bandpass filter 46a or multiplexer 46c shown in FIG. 6, FIG. 8, or FIG. 18 is connected to E. Since the normal direction measuring device 50 has the above structure, the normal direction measuring device 50 is
To measure the normal direction on the processing surface 66a of the workpiece 66, the operator operates the teaching device 22 to move the normal direction measuring device 50 provided at the tip of the torch section 20' over the processing surface 66a. and the normal direction measuring device 5
0 from the reference laser oscillator 5, and the optical path 51a
The reference laser beam LB is emitted from the reference beam emitting unit 5lb through the reference beam emitting unit 5lb in a manner consistent with the reference axis CL'.
Irradiate the specified position where the normal direction of a is to be determined. That is, as shown in FIG. 9, the reference laser oscillator 51
A point on the processing surface 66a that is irradiated with the reference laser beam LB emitted from the reference point CP is defined as a reference point CP. Then, from each laser oscillator 42A, the measurement laser beam LS is emitted from the reference axis C.
When injected onto the processing surface 66a parallel to L', the processing surface 66
The measurement laser beam LS diffusely reflected at each measurement point P near the reference point CP on point a is . Each bandpass filter 53
The light other than the measurement laser light LS of a predetermined frequency is removed and enters the optical path 52a. Then, the measurement laser beam LS passes through the optical path 52a and passes through the condenser lens 4.
3, the light is focused on the light receiving surface 42b of each light receiving element 42B.
Above, the light is received in such a way that it is focused at a position in the direction of the arrow LR corresponding to the distance L from the reference plane PL to the measurement point P. Then, as in the case of the normal direction measuring device 40 described above, a signal corresponding to the focal position on the light receiving surface 42b of the received measurement laser beam LS is output from each light receiving element 42B to the normal direction calculation unit 46. Then, the position of each measurement point P is determined in the normal direction calculation unit 46. A virtual plane 65 is defined by each measurement point P, and by calculating the normal vector N of the virtual plane 65, the normal direction at the reference point CP on the processing surface 66a is determined. In addition, in the normal direction measuring device, if the measurement laser beam LS emitted from each laser oscillator 42A and reflected at each measurement point P on the processing surface 66a can be received by each light receiving element 42B, the laser The arrangement of the components of the normal direction measuring device, such as the oscillator 42A and the light receiving element 42B, may be arbitrary. That is, the normal direction measuring device 55 shown in Figs. 1 and 12. The lower part of the main body was made smaller by changing the arrangement of the components. It should be noted that among the components of the normal direction measuring device 55, the same components as those of the normal direction measuring devices 40 and 50 are given the same reference numbers and their explanations are omitted. The normal direction measuring device 55 has a main body 55a consisting of a light receiving section 55b and a light projecting section 55c, and the light receiving section 55b is formed in a substantially cylindrical shape.
It is connected to the tip of the torch section 20'. A laser beam incident surface 55d is formed at the lower part of the first construction of the light receiving section 55b, which is perpendicular to the central axis of the main body 55a, that is, the reference axis CL', and as shown in FIG. At the center of the laser light incident surface 55d, the light receiving section 55 is located at the bottom of FIG.
A substantially cylindrical light projecting portion 55c having a diameter smaller than that of b is fixed. Further, a laser beam emitting surface 55e perpendicular to the reference axis CL' is formed at the eleventh lower part of the light projecting section 55c, and a substantially conical cone is formed on the laser beam emitting surface 55a below the first construction drawing. The tip end portion 55f of the shape is connected, and inside the light projecting portion 55c, a reference laser oscillator 5 is mounted on the central axis, that is, the reference axis CL', and the reference laser oscillator 5 is connected to the reference laser oscillator 5 in the direction of the reference axis CL'. It is provided in a form that can emit the laser beam LB, and the reference axis CL' below the reference laser oscillator 51 in FIG.
At the top, an optical path 51a is formed so as to pass through a light projecting part 55c and a tip part 55f, and a reference light beam emitting part 5lb is formed so as to be open downward in the figure. Further, above the laser beam emitting surface 55e inside the light projecting section 55c, three laser oscillators 42A, 42A2, 42A, are arranged perpendicular to the reference axis CL' as shown in FIG. On the plane, on the same radius from the reference axis CL', at equal angular intervals with respect to the reference axis CL', that is. They are set at 120' intervals. Each laser oscillator 42A has an emission part 42a at the lower end in FIG. 11, and each emission part 42a is arranged on the laser beam emission surface 55e. Each laser oscillator 42A is connected to the reference axis C from the emission section 42a.
The measurement laser beam LS can be emitted parallel to L'. Further, a reference plane PL is defined by each of the injection portions 42a. And before? No. 113 of each injection part 42a
Below the ii1, the optical path 42c is connected to the tip 55.
A measuring light beam emitting portion 42d is formed so as to pass through f and be parallel to the reference axis CL', and open downward in the figure. As shown in FIG.
are arranged around. As shown in FIG. 2, three bandpass filters 53, 53, 53 are provided on the laser beam incident surface 55d for each of the laser oscillators 4.
2A, 42A2, 42A3 are arranged in the same radial direction with respect to the reference axis CL', that is, at intervals of 20 degrees, around each of the measurement light beam emitting portions 42d.
It is located on the same radius from '. Then, the light receiving portion 55b of each of the band pass filters 53 in the upper part of the first upper diagram.
An optical path 52a is formed inside, and the optical path 52a
A condensing lens 43 is provided above. A reflecting mirror 52 is provided above the optical path 52a in the figure, and the reference axis CL' side of the reflecting mirror 52, that is, the 11th@
An optical path 52b communicating with the optical path 52a is formed on the left side. As shown in FIG. 12, on the reference axis CL' side from each reflection tIL52 and each optical path 52b, there are light receiving elements 42B, 42B2, 42B3 on a plane perpendicular to the reference axis CL'. On the same radius from the axis CL', each of the laser oscillators 42Ai, 42A2, 42A
, and the same radial direction with respect to the reference axis CL', that is, 1
As shown in FIG.
b and facing toward the reflecting mirror 52 side.
In addition, similar to the normal direction measuring device 40.50 described above, each of the laser oscillators 42A has a
Each modulator 47b or each driver 47a shown in FIG. 8 is connected, and each light receiving element 42B is connected to each bandpass filter 46a or multiplexer 46c shown in FIG. 6, 8, or 18. ing.

法線方向測定装M55は以上のような構成を有するので
,ティーチングに伴って該法線方向測定装置55によっ
てワーク66の加工面66aにおける法線方向を測定す
るには,作業者がティーチング装置22を操作してトー
チ部20’の先端に設けられた法線方向測定装置55を
加工面66a上を移動させ,法線方向測定装置55の基
準用レーザ発振器51から出力され,光路51aを介し
て基準用光線射出部5lbから基準軸CL″に−aした
形で射出される基準用レーザ光LBを加工面66a上の
法線方向を求める所定の位置に照射させて基準点CPを
設定する。そして,各レーザ発振器42Aから,測定用
レーザ光LSが、光路42c、測定用光線射出部42d
を介して基準軸CL’に平行に射出されると、加工面6
6a上の前記基準点CP近傍の各測定点Pにおいて乱反
射した測定用レーザ光LSは,各バンドパスフィルタ5
3によって所定の周波数のレーザ光以外の光が除去され
た形で、光路52a内に入射する。
Since the normal direction measuring device M55 has the above-described configuration, in order to measure the normal direction on the machined surface 66a of the workpiece 66 using the normal direction measuring device 55 during teaching, the operator must use the teaching device 22. is operated to move the normal direction measuring device 55 provided at the tip of the torch section 20' on the processing surface 66a, and the reference laser oscillator 51 of the normal direction measuring device 55 outputs the signal, which is transmitted through the optical path 51a. A reference point CP is set by irradiating a reference laser beam LB, which is emitted from the reference beam emitting section 5lb in a direction -a to the reference axis CL'', to a predetermined position on the processing surface 66a whose normal direction is determined. Then, a measurement laser beam LS is emitted from each laser oscillator 42A through an optical path 42c and a measurement beam emission section 42d.
When the injection is made parallel to the reference axis CL', the machined surface 6
The measurement laser beam LS diffusely reflected at each measurement point P near the reference point CP on 6a is passed through each bandpass filter 5.
3, the light other than the laser light of a predetermined frequency is removed and enters the optical path 52a.

そして、測定用レーザ光LSは、集光レンズ43によっ
て集光されて、光路52aを通り、反射鏡52、光路5
2bを介して各受光素子42Bの受光面42b上に、基
準面PLから各測定点Pまでの距MLに対応した矢印L
R方向の位置に焦点を結ぶ形で受光される.そして、上
述の法線方向測定装置40、50の場合と同様に、各受
光素子42Bから法線方向演算部46へ受光した測定用
レーザ光LSの受光而42b上の焦点位置に対応する信
号が出力され,法線方向演算部46において、各測定点
Pの位置が判定される。そして、各測定点Pによって仮
想平面65が規定され.該仮想平面65の法線ベクトル
Nを演算することにより、加工面66a上の基準点CP
における法線方向が判定される。なお、前記法線方向測
定装置55は、基準用レーザ光LBが射出される基準用
光線射出部5lbの設けられた先端部55f及び該先端
部55fの接続する投光部55cが小型に形威されてい
るので,上述の基準点CPを設定するために、作業者が
加工面66a上の所定の位置に基準用レーザ光LBを照
射させる際に、基準用レーザ光LBの照射位置を認識し
易く、また、法線方向測定装置55を加工面66a上を
移動させる際の操作性が向上する. また、第13図及び第14図に示す法線方向測定装置5
6は、本体全体を小型化したものである。尚、法線方向
測定装R56の構成要素の内、法線方向測定装置40、
50と同一の構成要素には同一の附号を附して説明を省
略する.即ち、法線方向測定装i!!56は、略円筒形
の本体66aを有しており、該本体56aは、トーチ部
20′の先端に接続している。そして、本体56aには
、第13図下方に、該本体56aの中心軸、即ち,基$
@CL’ に垂直なレーザ光入射面56bが形或されて
おり,更に、該レーザ光入射面56bの図中下方には、
基準軸CL’に垂直なレーザ光射出面56cが形威され
ている.そして,該レーザ光射出面56cの第14図中
央には、第13図下方に、円筒形の先端部56dが固着
している.そして,前記本体56aの外部には,基準用
レーザ光LB&出力する基準用レーザ発振器51が設け
られており,該基準用レーザ発振器5lには,基準用光
ファイバ57が接続している.そして、前?基準用光フ
ァイバ57は、本体56a外部から本体56a内部へ導
かれて基準軸CL″上に設けられている。そして,前記
基準用光ファイバ57は、第13図下端に,射出部57
aを有しており、前記基準用レーザ発振器51から出方
された基準用レーザ光LBを,当該射出部57aから基
準軸CL’方向へ射出することが出来る.そして、前記
射出部57aの第13図下方の基準軸CL’上には、光
路51aが、本体56a及び先端部56dを貫通する形
で形成され.図中下方に開放される形で基準用光線射出
部5lbが形威されている。
The measuring laser beam LS is condensed by the condensing lens 43, passes through the optical path 52a, passes through the reflecting mirror 52, and passes through the optical path 52a.
2b, an arrow L corresponding to the distance ML from the reference plane PL to each measurement point P is drawn on the light receiving surface 42b of each light receiving element 42B.
The light is received in a way that focuses on the position in the R direction. As in the case of the normal direction measuring devices 40 and 50 described above, a signal corresponding to the focal position on the light receiving device 42b of the measurement laser beam LS received from each light receiving element 42B to the normal direction calculating section 46 is transmitted. The position of each measurement point P is determined by the normal direction calculation unit 46. A virtual plane 65 is defined by each measurement point P. By calculating the normal vector N of the virtual plane 65, the reference point CP on the processing surface 66a is
The normal direction at is determined. Note that the normal direction measuring device 55 has a small and compact tip portion 55f provided with a reference beam emitting portion 5lb from which the reference laser beam LB is emitted, and a light projecting portion 55c to which the tip portion 55f is connected. Therefore, in order to set the above-mentioned reference point CP, when the operator irradiates the reference laser beam LB to a predetermined position on the processing surface 66a, it is necessary to recognize the irradiation position of the reference laser beam LB. Moreover, the operability when moving the normal direction measuring device 55 on the processing surface 66a is improved. In addition, the normal direction measuring device 5 shown in FIGS. 13 and 14
6 is a compact version of the entire main body. Note that among the components of the normal direction measuring device R56, the normal direction measuring device 40,
Components that are the same as those in 50 will be given the same numbers and their explanations will be omitted. That is, the normal direction measuring device i! ! 56 has a substantially cylindrical main body 66a, and the main body 56a is connected to the tip of the torch portion 20'. The main body 56a has a central axis, that is, a base $, located at the bottom of FIG. 13.
A laser beam entrance surface 56b perpendicular to @CL' is formed, and below the laser beam entrance surface 56b in the figure,
A laser beam exit surface 56c is formed perpendicular to the reference axis CL'. A cylindrical tip 56d is fixed to the center of the laser beam emitting surface 56c in FIG. 14 and downward in FIG. A reference laser oscillator 51 for outputting a reference laser beam LB& is provided outside the main body 56a, and a reference optical fiber 57 is connected to the reference laser oscillator 5l. And before? The reference optical fiber 57 is guided from the outside of the main body 56a to the inside of the main body 56a and is provided on the reference axis CL''.The reference optical fiber 57 is provided at the lower end of FIG.
a, and the reference laser beam LB emitted from the reference laser oscillator 51 can be emitted from the emission section 57a in the direction of the reference axis CL'. An optical path 51a is formed on the reference axis CL' in the lower part of FIG. 13 of the emission part 57a, passing through the main body 56a and the tip part 56d. In the figure, a reference light beam emitting section 5lb is formed so as to be open downward.

また,前記本体56aの外部には、測定用レーザ光LS
を出力する3個のレーザ発振器42Aエ、42A2、4
2A,が設けられており、前記各レーザ発振器42A■
、42A2、42A,には、それぞれ測定用光ファイバ
59Aい59A2、59A,が接続しており,前記各測
定用光ファイバ59A1.59A,、59A3は,本体
56a外部から本体56a内部へ導かれて基′1!!軸
CL″と平行に設けられている.そして、前記各測定用
光ファイ?59Aは,第13図下端に、射出部59aを
有しており、各射出部59a■、59a2、59a3は
、前記レーザ光射出面56c上に、第14図に示すよう
に、前記基準用光線射出部5lbの周りに、基準軸CL
’ に対して等角度間隔、即ち、l20゜間隔で配置さ
れている。そして,前記各レーザ発振器42Aから出力
された測定用レーザ光LSを、当該各射出部59aから
基準軸CL″に平行に射出することが出来る.また、前
記各射出部59aによって基準面PLが規定される.そ
して,前記レーザ光入射面56b上には、第l4図に示
すように、3個のバンドパスフィルタ53,53、53
が,前記各射出部59a.、59a2、59a,と基準
軸CL’ に対して同一の半径方向、即ち、120’間
隔で,前記各射出部59aの周りに配置される形で、基
準軸CL’ から同一半径上に設けられている.そして
、前記各バンドパスフィルタ53の第13図上方の本体
56a内部には、反射j!52によって構成される光路
52aが形成されており、該光路52a上には、集光レ
ン?43が設けられている.そして、各集光レンズ43
の第工3図上方には,受光素子42B■、42B.,4
2B.が,第工4図に示すように、基準軸CL’ に垂
直な平面上の、基準軸CL’ から同一半径上で、前記
各射出部59aエ.59a2、59a,と基準1i1c
L’ に対して同一の半径方向,即ち.120’間隔で
、それぞれ受光面42bを、第13図に示すように,前
記光路52a側,即ち、図中下方へ向けた形で設けられ
ている.また、上述の法線方向測定装置40.50と同
様に、前記各レーザ発振器42Aには、第6図,第8図
又は第18図に示す各変調器47b又は各ドライバ47
aが接続しており、前記各受光素子42Bには,第6図
,第8図又は第18図に示す各バンドパスフィルタ46
a又はマルチプレクサ46cが接続している. 法線方向測定装置56は以上のような構成を有するので
,ティーチングに伴って該法線方向測定装I!56によ
ってワーク66の加工面66aにおける法線方向を測定
するには、作業者がティーチング装置22を操作してト
ーチ部20’の先端に設けられた法線方向測定装115
6を加工面66a上を移動させ、法線方向測定装@56
の基準用レーザ発振器5lから出力され、基準用光ファ
イバ57、光路51aを介して基準用光線射出部5lb
から基準軸CL’ に一致した形で射出される基準用レ
ーザ光LBを加工面66a上の法線方向を求める所定の
位置に照射させて基準点CPを設定する.そして,各レ
ーザ発振器42Aから.iI9定用レーザ光LSが、測
定用光ファイバ59Aを介して基準軸CL″に平行に射
出されると、加工面66a上の前記基準点CP近傍の各
測定点Pにおいて乱反射した測定用レーザ光LSは.各
バンドパスフィルタ53によって所定の周波数のレーザ
光以外の光が除去された形で、光路52a内に入射する
。そして,測定用レーザ光LSは、光路52aを通り、
集光レンズ43によって集光されて各受光素子42Bの
受光面42b上に.基準面PLから各測定点Pまでの距
離Lに対応した矢印LR方向の位置に焦点を結ぶ形で受
光される。そして,上述の法線方向測定装置40、50
の場合と同様に,各受光素子42Bから法線方向演算部
46へ前記受光した測定用レーザ光LSの受光面42b
上の焦点位置に対応する信号が出力され、法線方向演算
部46において、各測定点Pの位置が判定される。そし
て、各測定点Pによって仮想平面65が規定され,該仮
想平面65の法線ベクトルNを演算することにより,加
工面66a上の基準点CPにおける法線方向が判定され
る。そして,前記法線方向測定装置56は、本体56a
に,基準用レーザ発振器5工及び測定用レーザ発振器4
2Aが設けられていないので,本体56a全体が小型に
形成されており、従って、作業者が法線方向測定装置5
6を加工面66a上を移動させて,加工面66a上の所
定の位置に基準用レーザ光LBを照射させて基準点cp
を設定する際の操作性が向上する。
Additionally, a measuring laser beam LS is provided outside the main body 56a.
Three laser oscillators 42Ad, 42A2, 4 output
2A, is provided, and each of the laser oscillators 42A
, 42A2, 42A, are connected to measurement optical fibers 59A1, 59A2, 59A, respectively, and each of the measurement optical fibers 59A1, 59A, 59A3 is guided from the outside of the main body 56a to the inside of the main body 56a. Base '1! ! Each of the measuring optical fibers 59A has an emitting part 59a at the lower end in FIG. On the laser beam emission surface 56c, as shown in FIG. 14, a reference axis CL is provided around the reference beam emission part 5lb.
' are arranged at equal angular intervals, that is, at 120° intervals. The measurement laser beam LS output from each laser oscillator 42A can be emitted from each emission section 59a in parallel to the reference axis CL''.Furthermore, the reference plane PL is defined by each emission section 59a. As shown in FIG. 14, three band-pass filters 53, 53, and
However, each injection section 59a. , 59a2, 59a, are arranged around each injection part 59a in the same radial direction with respect to the reference axis CL', that is, at intervals of 120', and are provided on the same radius from the reference axis CL'. ing. Then, inside the main body 56a of each of the bandpass filters 53 in the upper part of FIG. 52 is formed, and on the optical path 52a there is a condenser lens. 43 are provided. And each condenser lens 43
At the upper part of Fig. 3, there are light receiving elements 42B■, 42B. ,4
2B. As shown in FIG. 4, each of the injection portions 59a and 59a are located on a plane perpendicular to the reference axis CL' and on the same radius from the reference axis CL'. 59a2, 59a, and standard 1i1c
In the same radial direction with respect to L', ie. As shown in FIG. 13, the light-receiving surfaces 42b are provided at intervals of 120', with the light-receiving surfaces 42b facing toward the optical path 52a, that is, toward the bottom in the figure. Further, similarly to the above-mentioned normal direction measuring device 40.50, each laser oscillator 42A includes each modulator 47b or each driver 47 shown in FIG. 6, FIG. 8, or FIG.
A is connected to each light receiving element 42B, and each band pass filter 46 shown in FIG. 6, FIG. 8 or FIG.
a or multiplexer 46c is connected. Since the normal direction measuring device 56 has the above configuration, the normal direction measuring device I! 56, the operator operates the teaching device 22 to measure the normal direction on the processing surface 66a of the workpiece 66 using the normal direction measuring device 115 provided at the tip of the torch section 20'.
6 on the machined surface 66a, the normal direction measuring device @56
The reference laser oscillator 5l outputs the light beam to the reference light emitting unit 5lb via the reference optical fiber 57 and the optical path 51a.
A reference point CP is set by irradiating a reference laser beam LB emitted from the reference axis CL' in a manner consistent with the reference axis CL' to a predetermined position on the processing surface 66a whose normal direction is determined. And from each laser oscillator 42A. When the iI9 standard laser beam LS is emitted parallel to the reference axis CL'' through the measurement optical fiber 59A, the measurement laser beam is diffusely reflected at each measurement point P near the reference point CP on the processing surface 66a. LS enters the optical path 52a with light other than the laser beam of a predetermined frequency removed by each bandpass filter 53.The measurement laser beam LS passes through the optical path 52a,
The light is focused by the condenser lens 43 onto the light receiving surface 42b of each light receiving element 42B. The light is received with a focus at a position in the direction of arrow LR corresponding to the distance L from the reference plane PL to each measurement point P. And the above-mentioned normal direction measuring devices 40, 50
Similarly to the case, the light receiving surface 42b of the received measurement laser beam LS is sent from each light receiving element 42B to the normal direction calculation unit 46.
A signal corresponding to the upper focal point position is output, and the position of each measurement point P is determined in the normal direction calculation section 46. A virtual plane 65 is defined by each measurement point P, and by calculating the normal vector N of the virtual plane 65, the normal direction at the reference point CP on the processing surface 66a is determined. The normal direction measuring device 56 includes a main body 56a.
5 reference laser oscillators and 4 measurement laser oscillators
2A is not provided, the entire main body 56a is formed in a small size.
6 on the processing surface 66a and irradiating the reference laser beam LB to a predetermined position on the processing surface 66a to set the reference point cp.
Improves operability when setting.

また,加工面66a上の各測定点Pまでの距離Lを測定
するには、各受光素子42Bの受光面42b上の測゜定
用レーザ光LSの焦点の位置でなく、第15図及び第工
6図に示す法線方向測定装置60のように、加工面66
a上で反射する測定用レーザ光LSの光量によって測定
することも可能である.なお、法線方向測定装M60の
構或要素の内、法線方向測定装置40、50と同一の構
成要素には同一の附号を附して説明を省略する.即ち,
法線方向測定装置60は、略円筒形の本体60aを有し
ており,該本体60aは、トーチ部20’の先端に接続
している.そして、本体60aの外部には.基準用レー
ザ光LBを出力する基準用レーザ発振器51が設けられ
ており,該基準用レーザ発振器51には、基準用光ファ
イバ61が接続している.そして,前記基準用光ファイ
バ61は、本体60a外部から本体60a内部へ導かれ
て基準軸CL’上に、先端61aが,本体60aの先端
60bから第15図下方へ突出した形で,前記基準用レ
ーザ発振器51から出力された基準用レーザ光LBを、
前記先端61aから基準軸CL″方向へ射出することが
出来る形で設けら?ている。本体60aの外部には,測
定用レーザ光LSを出力する半導体レーザ等のレーザ発
振器63Aエ,63A.、63A3が設けられており、
前記レーザ発振器63A■、63A2.63A3には、
それぞれ投光用光ファイバ62Aエ、62A2、62A
3が接続している。そして、前記各投光用光ファイバ6
2Aは、本体60a外部から本体60a内部へ導かれて
基準軸CL’ と略平行に設けられている。そして、前
記各投光用光ファイバ62Aは,第l5図下端に,先端
62aを有しており、各先端62aい6 2 a2, 
6 2 a,は,本体60aの先端60bから第工5図
下方へ突出した形で、基準軸CAL″に垂直な基準面P
L上の同一半径上に、第16図に示すように、基準軸C
L’に対して等角度間隔、即ち、120゜間隔で前記基
準用光ファイバ61の先端61aの周りに配置されてい
る.そして、前記各レーザ発振器63Aから出力された
測定用レーザ光LSを,当該各先端62aから基準軸C
L’ に平行に射出することが出来る.また,各投光用
光ファイバ62Aの先?62aによって規定される前記
基準面PL上には,本体60a内部に基準軸CL’と略
平行に設けられた受光用光ファイバ62B,.62B,
、62B.の先端62b■,62b■、62b,が,第
16図に示すように、前記投光用光ファイバ62A、、
62A2、62A,の先@62a,、6 2 a,.6
2a,と基準軸CL’に対して同一の半径方向,即ち.
120”間隔で、前記各先端62aと隣接する形で,基
準軸CL’から同一半径上に設けられている.そして、
前記受光用光ファイバ62B、.62B,,62B,は
、それぞれ本体60a内部から本体60a外部へ導かれ
て,本体60a外部に設けられたフォトダイオード等の
受光した光量に応じた信号を出力し得る受光素子63B
よ、63B2、63B,が接続している.また、上述の
法線方向測定装置40、50と同様に、前記各レーザ発
振器63Aには、第6図、第8図又は第18図に示す各
変調器47b又は各ドライバ47aが接続しており,前
記各受光素子42Bには、第6図,第8図又は第18図
に示す各パンドパスフィルタ46a又はマルチプレクサ
46cが接続している. 法線方向測定装i!60は以上のような構成を有するの
で,該法線方向測定装置60によって加工面66a上の
任意の点における法線方向を測定するには、まず、作業
者がティーチング装置22を操作してトーチ部20’の
先端に設けられた法線方向測定装置60を加工面66a
上を移動させ、基準用レーザ発振器5lから出力され、
基準用光ファイバ61によって本体60aへ導かれて基
準用光ファイバ6工の先端61aから基準軸CL’に一
致した形で射出される基準用レーザ光LBを加工面66
a上の法線方向を測定すべき所定の位置に照射させて基
準点CPを設定する.そして、各レーザ発振器63Aか
ら出力され投光用光ファイバ62Aの先端62aから基
準軸CL’ に平行に射出される測定用レーザ光LSは
,加工面66a上の各測定点Pで乱反射し,反射した測
定用レーザ光LSは各受光用光ファイバ62Bの先端6
2bから各受光用光ファイバ62B内に入り,各受光用
光ファイバ62Bを介して各受光素子63Bで受光され
る。この際に,第l7図に示すように、投光用光ファイ
バ62Aの先端62aから射出される測定用レーザ光L
Sの広がる範囲を示す投光円錐面CNAと受光用光ファ
イバ62Bの先端62bの受光可能な範囲を示す受光円
錐面CNBは一致していないため、加工面66a上の各
測定点P(微小面積を有する。)で乱反射した測定用レ
ーザ光LSの内、第17図において斜線で示す前記投光
円錐面CNAと前記受光円錐面CNBの重なる範囲CN
ABにおいて反射した測定用レーザ光LSが受光用光フ
ァイバ62Bの先端62bから受光用光ファイバ62B
内に入射し、受光用光ファイバ62Bを介して受光素子
63Bで受光される.そして、前記投光円錐面CNAと
前記受光円錐面CNBの重なる@@CNABは、投光用
光ファイバ62Aの先端62a及び受光用光ファイバ6
2Bの先端62bから測定点Pまでの距離Lによって変
化するので、投光用光ファイバ62Aの先端82a及び
受光用光ファイバ62Bの先端62bから測定点Pまで
の距il1tLによって受光素子63Bの受光する測定
用レーザ光LSの光量が変化する.そして、各受光素子
63Bは受光した測定用レーザ光LSの光量に対応した
信号を法線方向演算部46に出力し、法線方向演算部4
6において加工面66a上の各測定点Pの位置が判定さ
れる.この際に、受光素子42Bを使用した前述の法線
方向測定装1140等と同様に、各レーザ発振器63A
の電源に周波数変調を掛けることによって各レーザ発振
器63Aから射出される測定用レーザ光LSに所定の変
調を掛けるか、又は、各レーザ発振器63Aを時分割し
て駆動して、各レーザ発振器63Aから射出される測定
用レーザ光LS同士の影響を排除することによって各測
定点Pの位置を正確に求めることが出来る.そして、各
測定点Pによって仮想平面65が規定され,該仮想千面
65の法線ベクトルNを演算することにより、加工面6
6a上の基準点CPにおける法線方向が判定される. なお、上述の各実施例においては、測定用レーザ光LS
の射出方向を基準軸CL’ に対して平行にして,法線
方向演算部46における各測定点Pの位置座標を求める
演算を簡単にした場合について述べたが、測定用レーザ
光LSの射出方向は必ずしも基準軸CL’ に対して平
行でなくてもよい。即ち、測定用レーザ光LSの射出方
向の基準軸CL’に対する角度等を予め法線方向演算部
46に設定しておくことによって各測定点Pの位置座標
を求めることができる。この際に、測定用レーザ光LS
を基準軸CL″側へ傾斜した形で射出すると、測定用レ
ーザ光LSを基準軸CL’に平行に射出した場合に比し
て、各測定点Pを基準軸CPのより近くに設定できるの
で、加工面66a上の基準点CPにおける法線方向をよ
り正確に求めることができる。また,上述の各実施例に
おいては、基準点cpを設定し、更に、基準点cp近傍
に、基準点CP以外の3点の測定点Pを設定する場合に
ついて述べたが、基準点CPと、3点の測定点Pの中の
l点の測定点Pとが、同一の点であってもよいことは勿
論である.即ち、測定点Pの位置を測定する測距手段を
、基準点CPを設定する基準点設定手段として併用して
もよい。また、上述の各実施例においては,法線方向測
定装置40、50,55、56,60をティーチング装
置22に設けて、レーザ加工機1における加工プログラ
ムPROを作成する場合について述べたが,前記法線方
向測定装!40.50.55、56,60は、レーザ加
工機1等の工作機械における加工プログラムを作成する
ためのティーチングを行う場合だけでなく、各種工作機
械における位置決め等に使用できることは勿論である. (g).発明の効果 以上,説明したように、本発明によれば、ワーク66等
の対象物の加工面66a等の曲面上に基準点apt設定
するフィラー41、基準用レーザ発振器51、基準用光
ファイバ57、61等の基準点設定手段を設け、前記曲
面上で前記基準点CP近傍に少なくとも3点の測定点P
ti−l定し,前記各測定点Pの距離L等の位置を測定
するレーザ発振器42A、受光素子42B,測定用光フ
ァイバ59A、投光用光ファイバ62A、受光用光ファ
イバ62B,レーザ発振器63A、受光素子63B等の
測距手段を設け,前記測距手段によって測定された前記
各測定点Pの位置に基づいて、それ等測定点Pを含む仮
想平面65を設定し、該仮想平面65の法線ベクトルN
等の法線方向を演算する法線方向演算部を設けて構成し
たので、対象物の曲面上の基準点設定手段により設定さ
れる基準点CPにおける法線方向が、基準点CP近傍に
測距手段により設定される各測定点Pによって規定され
る仮想平面65の法線方向として近似的に算出される.
従って,基準点設定手段を測距手段と共に曲面上を移動
させ、基準点CPを法線方向を測定すべき曲面上の所定
の位置へ設定することにより,曲面上の所定の位置にお
ける法線方向を求めることができる. また、本発明は、基準軸CL’方向に基準用レーザ光L
Bを射出して,ワーク66等の対象物の加工面66a等
の曲面上に基準点CPを設定する基準用レーザ発振器5
l、基準用光ファイバ57、6工等の基準用レーザ光射
出手段を設け,測定用レーザ光LSを射出して、前記曲
面上で前記基準点CP近傍に少なくとも3点の測定点P
を設定するレーザ発振器42A.測定用光ファイバ59
A、投光用光ファイバ62A,レーザ発振器63A等の
測定用レーザ光射出手段を設け、前記各測定点Pにおい
て反射した前記測定用レーザ光LSを受光して、前記各
測定点Pの距離L等の位置に対応した信号を出力し得る
受光素子42B、受光用光ファイバ62B、受光素子6
3B等の測定用レーザ光受光手段を設け,前記測定用レ
ーザ光受光手段から出力された前記各測定点Pの位置に
対応した信号に基づいて、それ等測定点Pを含む仮想平
面65を設定し、該仮想平面65の法線ベクトルN等の
法線方向を演算する法線方向演算部46を設けて構成し
たので、対象物の曲面上の基準用レーザ光射出手段から
射出される基準用レーザ光LBにより設定される基準点
CPにおける法線方向が、基準点CP近傍の測定用レー
ザ光射出手段から射出される測定用レーザ光LSにより
設定される各測定点Pによって規定される仮想平面65
の法線方向として近似的に算出される.従って、基準用
レーザ光射出手段を測定用レーザ光射出手段、測定用レ
ーザ光受光手段と共に曲面上を移動させ,法線方向を測
定すべき曲面上の所定の位置へ基準用レーザ光LBを照
射させて基準点CPを設定することにより、曲面上の所
定の位置における法線方向を求めることができる.また
、本発明は、大径の受光部55bと前記受光部55bに
接続した形の小径の投光部55cから成る本体55aを
設け、前記投光部55cに、基準軸CL’方向に基準用
レーザ光LBを射出して,ワーク66等の対象物の加工
面66a等の曲面上に基準点CPを設定する基準用レー
ザ発振器51等の基準用レーザ光射出手段を設け、前記
投光部55cに,測定用レーザ光LSを射出して,前記
曲面上で前記基準点cp近傍に少なくとも3点の測定点
Pを設定する測定用レーザ発振器42A等の測定用レー
ザ光射出手段を設け、前記受光部55bに,前記各測定
点Pにおいて反射した前記測定用レーザ光LSを受光し
て、前記各測定点Pの距離L等の位置に対応した信号を
出力し得る受光素子42Bを設け,前記受光素子42B
から出力された前記各測定点Pの位置に対応した信号に
基づいて、それ等測定点Pを含む仮想平面65を設定し
,該仮想平面65の法線ベクトルN等の法線方向を演算
する法線方向演算部46を設けて構成したので、対象物
の曲面上の基準用レーザ光射出手段から射出される基準
用レーザ光LBにより設定される基準点cpにおける法
線方向が、基準点cp近傍の測定用レーザ光射出手段か
ら射出される測定用レーザ光LSにより設定される各測
定点Pによって規定される仮想平面65の法線方向とし
て近似的に算出される.従って、基準用レーザ光射出手
段、測定用レーザ光射出手段及び受光素子42Bの設け
られた本体55aを曲面上を移動させ、基準用レーザ光
LBを法線方向を測定すべき曲面上の所定の位置へ照射
させて基準点CP&H定することにより、曲面上の所定
の位置における法線方向を求めることができる。そして
.投光部55cから受光素子42Bを分離したことによ
り,基準用レーザ光LBが射出される当該投光部55c
が小型に形威されているので,作業者が基準用レーザ光
LBを対象物の曲面上の所定の位置に照射させる際に、
基準用レーザ光LBの照射位置を認識しやすく、また、
本体55aを曲面上を移動させる際の操作性が向上する
In addition, in order to measure the distance L to each measurement point P on the processed surface 66a, it is necessary to measure the distance L from the position shown in FIG. As shown in the normal direction measuring device 60 shown in Fig. 6, the machined surface 66
It is also possible to measure by the light intensity of the measurement laser beam LS reflected on a. It should be noted that, among the structural elements of the normal direction measuring device M60, the same components as those of the normal direction measuring devices 40 and 50 will be given the same reference numerals and their explanation will be omitted. That is,
The normal direction measuring device 60 has a substantially cylindrical main body 60a, and the main body 60a is connected to the tip of the torch section 20'. And, on the outside of the main body 60a. A reference laser oscillator 51 that outputs a reference laser beam LB is provided, and a reference optical fiber 61 is connected to the reference laser oscillator 51. The reference optical fiber 61 is guided from the outside of the main body 60a to the inside of the main body 60a, and is placed on the reference axis CL' with the tip 61a protruding downward in FIG. 15 from the tip 60b of the main body 60a. The reference laser beam LB output from the laser oscillator 51 is
The laser oscillators 63A, 63A, etc., such as semiconductor lasers, are provided outside the main body 60a to emit measurement laser light LS from the tip 61a in the direction of the reference axis CL''. 63A3 is provided,
The laser oscillators 63A■, 63A2 and 63A3 include:
Optical fibers for light projection 62A, 62A2, 62A, respectively
3 is connected. Each of the light emitting optical fibers 6
2A is guided from the outside of the main body 60a into the inside of the main body 60a and is provided substantially parallel to the reference axis CL'. Each of the light emitting optical fibers 62A has a tip 62a at the lower end in FIG.
6 2 a, is a shape that protrudes downward from the tip 60b of the main body 60a in Fig. 5, and is connected to the reference plane P perpendicular to the reference axis CAL''.
On the same radius on L, as shown in FIG.
They are arranged around the tip 61a of the reference optical fiber 61 at equal angular intervals, that is, at 120° intervals with respect to L'. Then, the measurement laser beam LS output from each laser oscillator 63A is transmitted from each tip 62a to the reference axis C.
It can be emitted parallel to L'. Also, the end of each light emitting optical fiber 62A? On the reference plane PL defined by the reference axis 62a, light receiving optical fibers 62B, . 62B,
, 62B. As shown in FIG. 16, the tips 62b■, 62b■, 62b,
62A2, beyond 62A, @62a,, 6 2 a, . 6
2a, and in the same radial direction with respect to the reference axis CL', that is, .
They are provided at intervals of 120'', adjacent to each of the tips 62a, and on the same radius from the reference axis CL'.
The light receiving optical fibers 62B, . 62B, , 62B are light receiving elements 63B which are guided from inside the main body 60a to the outside of the main body 60a and can output a signal according to the amount of light received by a photodiode or the like provided outside the main body 60a.
63B2, 63B, are connected. Further, similarly to the normal direction measuring devices 40 and 50 described above, each modulator 47b or each driver 47a shown in FIG. 6, FIG. 8, or FIG. 18 is connected to each laser oscillator 63A. , each of the light-receiving elements 42B is connected to each bandpass filter 46a or multiplexer 46c shown in FIG. 6, FIG. 8, or FIG. 18. Normal direction measuring device i! Since the normal direction measuring device 60 has the above configuration, in order to measure the normal direction at an arbitrary point on the processing surface 66a using the normal direction measuring device 60, the operator first operates the teaching device 22 to set the torch. The normal direction measuring device 60 provided at the tip of the portion 20' is connected to the machined surface 66a.
is output from the reference laser oscillator 5l,
The reference laser beam LB is guided to the main body 60a by the reference optical fiber 61 and emitted from the tip 61a of the reference optical fiber 6 in a manner consistent with the reference axis CL'.
Set the reference point CP by irradiating the normal direction on a to the predetermined position to be measured. Then, the measurement laser beam LS output from each laser oscillator 63A and emitted from the tip 62a of the light projection optical fiber 62A in parallel to the reference axis CL' is diffusely reflected at each measurement point P on the processing surface 66a. The measured laser beam LS is transmitted to the tip 6 of each light-receiving optical fiber 62B.
2b into each light-receiving optical fiber 62B, and is received by each light-receiving element 63B via each light-receiving optical fiber 62B. At this time, as shown in FIG.
Since the light emitting conical surface CNA indicating the range in which S spreads and the light receiving conical surface CNB indicating the light receiving range of the tip 62b of the light receiving optical fiber 62B do not match, each measurement point P (micro area ) of the measurement laser beam LS diffusely reflected by the light emitting conical surface CNA and the light receiving conical surface CNB shown by diagonal lines in FIG.
The measurement laser beam LS reflected at AB is transferred from the tip 62b of the light receiving optical fiber 62B to the light receiving optical fiber 62B.
and is received by the light-receiving element 63B via the light-receiving optical fiber 62B. And @@CNAB, where the light emitting conical surface CNA and the light receiving conical surface CNB overlap, is the tip 62a of the light emitting optical fiber 62A and the light receiving optical fiber 6.
The distance il1tL from the tip 82a of the light emitting optical fiber 62A and the tip 62b of the light receiving optical fiber 62B to the measuring point P changes depending on the distance il1tL from the tip 62b of the light emitting optical fiber 62A to the measuring point P. The light intensity of the measurement laser beam LS changes. Then, each light receiving element 63B outputs a signal corresponding to the light intensity of the received measurement laser beam LS to the normal direction calculation section 46, and the normal direction calculation section 4
6, the position of each measurement point P on the machined surface 66a is determined. At this time, each laser oscillator 63A is
Either frequency modulation is applied to the power supply of each laser oscillator 63A to apply a predetermined modulation to the measurement laser beam LS emitted from each laser oscillator 63A, or each laser oscillator 63A is driven in a time-division manner to By eliminating the influence of the emitted measurement laser beams LS on each other, the position of each measurement point P can be accurately determined. A virtual plane 65 is defined by each measurement point P, and by calculating the normal vector N of the virtual thousand planes 65, the machined surface 65 is
The normal direction at the reference point CP on 6a is determined. In addition, in each of the above-mentioned embodiments, the measurement laser beam LS
The case has been described in which the emission direction of the measurement laser beam LS is made parallel to the reference axis CL' to simplify the calculation for determining the position coordinates of each measurement point P in the normal direction calculation unit 46. does not necessarily have to be parallel to the reference axis CL'. That is, by setting the angle of the emission direction of the measurement laser beam LS with respect to the reference axis CL' in the normal direction calculation section 46 in advance, the position coordinates of each measurement point P can be determined. At this time, the measurement laser beam LS
If the measurement laser beam LS is emitted at an angle toward the reference axis CL'', each measurement point P can be set closer to the reference axis CP than when the measurement laser beam LS is emitted parallel to the reference axis CL'. , the normal direction at the reference point CP on the machined surface 66a can be determined more accurately.In addition, in each of the above embodiments, the reference point CP is set, and furthermore, the reference point CP is set in the vicinity of the reference point CP. Although we have described the case where three measurement points P other than Of course, the distance measuring means for measuring the position of the measurement point P may also be used as the reference point setting means for setting the reference point CP.In addition, in each of the above embodiments, the normal direction measurement A case has been described in which the devices 40, 50, 55, 56, 60 are provided in the teaching device 22 to create the machining program PRO in the laser processing machine 1. Of course, the 60 can be used not only for teaching to create a machining program for a machine tool such as the laser processing machine 1, but also for positioning in various machine tools. (g). More than the effects of the invention, As described, according to the present invention, the filler 41, the reference laser oscillator 51, the reference optical fibers 57, 61, etc., which set the reference point apt on the curved surface such as the processed surface 66a of the workpiece 66, etc. A point setting means is provided, and at least three measurement points P are provided near the reference point CP on the curved surface.
a laser oscillator 42A, a light receiving element 42B, a measuring optical fiber 59A, a light emitting optical fiber 62A, a light receiving optical fiber 62B, and a laser oscillator 63A. , a distance measuring means such as a light receiving element 63B is provided, and a virtual plane 65 including the measuring points P is set based on the positions of the respective measuring points P measured by the distance measuring means. normal vector N
Since the configuration is provided with a normal direction calculation unit that calculates the normal direction of It is approximately calculated as the normal direction of the virtual plane 65 defined by each measurement point P set by the means.
Therefore, by moving the reference point setting means along with the distance measuring means on the curved surface and setting the reference point CP at a predetermined position on the curved surface whose normal direction is to be measured, the normal direction at a predetermined position on the curved surface can be determined. can be found. Further, the present invention provides a reference laser beam L in the direction of the reference axis CL'.
A reference laser oscillator 5 that emits laser beam B and sets a reference point CP on a curved surface such as a processing surface 66a of an object such as a workpiece 66.
l. A reference laser beam emitting means such as a reference optical fiber 57, 6 is provided, and a measurement laser beam LS is emitted to form at least three measurement points P near the reference point CP on the curved surface.
The laser oscillator 42A. Measurement optical fiber 59
A. A measurement laser beam emitting means such as a light projection optical fiber 62A and a laser oscillator 63A is provided, and the measurement laser beam LS reflected at each measurement point P is received, and the distance L between each measurement point P is determined. A light-receiving element 42B, a light-receiving optical fiber 62B, and a light-receiving element 6 that can output signals corresponding to the positions of
A measuring laser beam receiving means such as 3B is provided, and a virtual plane 65 including the measuring points P is set based on a signal corresponding to the position of each measuring point P outputted from the measuring laser beam receiving means. However, since the configuration is provided with a normal direction calculation unit 46 that calculates the normal direction of the normal vector N of the virtual plane 65, etc., the reference laser beam emitted from the reference laser beam emitting means on the curved surface of the object A virtual plane in which the normal direction at the reference point CP set by the laser beam LB is defined by each measurement point P set by the measurement laser beam LS emitted from the measurement laser beam emitting means near the reference point CP. 65
It is approximately calculated as the normal direction of . Therefore, the reference laser beam emitting means is moved along the curved surface together with the measuring laser beam emitting means and the measuring laser beam receiving means, and the reference laser beam LB is irradiated to a predetermined position on the curved surface whose normal direction is to be measured. By setting the reference point CP, the normal direction at a predetermined position on the curved surface can be determined. Further, the present invention provides a main body 55a consisting of a large-diameter light receiving section 55b and a small-diameter light projecting section 55c connected to the light receiving section 55b. A reference laser beam emitting means such as a reference laser oscillator 51 for emitting a laser beam LB to set a reference point CP on a curved surface such as a processing surface 66a of an object such as a workpiece 66 is provided, and the light projecting section 55c A measuring laser beam emitting means such as a measuring laser oscillator 42A is provided for emitting a measuring laser beam LS to set at least three measuring points P near the reference point CP on the curved surface, and The portion 55b is provided with a light receiving element 42B capable of receiving the measurement laser beam LS reflected at each measurement point P and outputting a signal corresponding to a position such as a distance L of each measurement point P. Element 42B
A virtual plane 65 including the measurement points P is set based on the signal corresponding to the position of each measurement point P outputted from the , and the normal direction such as the normal vector N of the virtual plane 65 is calculated. Since the configuration includes the normal direction calculation unit 46, the normal direction at the reference point cp set by the reference laser beam LB emitted from the reference laser beam emitting means on the curved surface of the object is the reference point cp. It is approximately calculated as the normal direction of the virtual plane 65 defined by each measuring point P set by the measuring laser beam LS emitted from the nearby measuring laser beam emitting means. Therefore, the main body 55a provided with the reference laser beam emitting means, the measuring laser beam emitting means, and the light receiving element 42B is moved on the curved surface, and the reference laser beam LB is directed in the normal direction to a predetermined point on the curved surface to be measured. The normal direction at a predetermined position on the curved surface can be determined by irradiating the light onto the position and determining the reference points CP&H. and. By separating the light receiving element 42B from the light projecting part 55c, the light projecting part 55c emits the reference laser beam LB.
Because it is compact, when the worker irradiates the reference laser beam LB to a predetermined position on the curved surface of the object,
It is easy to recognize the irradiation position of the reference laser beam LB, and
The operability when moving the main body 55a on a curved surface is improved.

また、本発明は、本体56aを設け,該本体56a外に
、基準用レーザ光LBを出力する基準用レーザ発振器5
工を設け、前記本体56aに、前記基準用レーザ発振器
51から出力された基準用レーザ光LBを基準軸CL’
方向に射出して、ワーク66等の対象物の加工面66a
等の曲面上に基準点CPを設定する基準用光ファイバ5
7を設け,前記本体56a外に、測定用レーザ光LSを
出力する測定用レーザ発振器42Aを設け,前記本体5
6aに,前記測定用レーザ発振器42Aから出力された
測定用レーザ光LSを射出して,前記曲面上で前記基準
点CP近傍に少なくとも3点の測定点Pを設定する測定
用光ファイバ59Aを設け、前記本体56aに、前記各
測定点Pにおいて反射した前記測定用レーザ光LSを受
光して,前記各測定点Pの距離L等の位置に対応した信
号を出力し得る受光素子42Bを設け、前記受光素子4
2Bから出力された前記各測定点Pの位置に対応した信
号に基づいて、それ等測定点Pを含む仮想千面65を設
定し、該仮想平面65の法線ベクトルN等の法線方向を
演算する法線方向演算部46を設けて構成したので、対
象物の曲面上の基準用光ファイバ57から射出される基
準用レーザ光LBにより設定される基準点CPにおける
法線方向が.基準点CP近傍の測定用光ファイバ59A
から射出される測定用レーザ光LSにより設定される各
測定点Pによって規定される仮想平面65の法線方向と
して近似的に算出される.従って、基準用光ファイバ5
7、測定用光ファイバ59A及び受光素子42Bの設け
られた本体56aを曲面上を移動させ,基準用レーザ光
LBを法線方向を測定すべき曲面上の所定の位置へ照射
させて基準点CPを設定することにより,曲面上の所定
の位置における法線方向を求めることができる.そして
、本体56aから基準用レーザ発振器5l及び測定用レ
ーザ発振器42Aを分離したことにより、基準用レーザ
光LBが射出される本体56aが小型に形戊されている
ので、作業者が基準用レーザ光LBを対象物の曲面上の
所定の位置に照射させる際に、基準用レーザ光LBの照
射位置を認識しやすく、また、本体56aを曲面上を移
動させる際の操作性が向上する. また、本発明は,本体60aを設け、該本体60a外に
、基準用レーザ光LBを出力する基準用レーザ発振器5
lを設け、前記本体60aに.前記基準用レーザ発振器
51から出力された基準用レーザ光LBを基準軸CL’
方向に射出して,ワーク66等の対象物の加工面66a
等の曲面上に基準点cpを設定する基準用光ファイバ6
1を設け,前記本体60a外に、測定用レーザ光LSを
出力する測定用レーザ発振器63Aを設け,前記本体6
0aに、前記測定用レーザ発振器63Aから出力された
測定用レーザ光LSを射出して、前記曲面66a上で前
記基準点CP近傍に少なくとも3点の測定点Pを設定す
る投光用光ファイバ62Aを設け、前記本体60aに,
前記各測定点Pにおいて反射した前記測定用レーザ光L
Sを受光する受光用光ファイバ62Bを設け、前記本体
60a外に.前記受光用光ファイバ62Bで受光した測
定用レーザ光LSの光量に基づいて、前記各測定点Pの
距離L等の位置に対応した信号を出力し得る受光素子6
3Bを設け、前記受光素子63Bから出力された前記各
測定点Pの位置に対応した信号に基づいて,それ等測定
点Pを含む仮想平面65を設定し、該仮想平面65の法
線ベクトルN等の法線方向を演算する法線方向演算部4
6を設けて構成したので、対象物の曲面上の基準用光フ
ァイバ6工から射出される基準用レーザ光LBにより設
定される基準点CPにおける法線方向が,基準点CP近
傍の投光用光ファイバ62Aから射出される測定用レー
ザ光LSにより設定される各測定点Pによって規定され
る仮想平面65の法線方向として近似的に算出される.
従って,基準用光ファイバ6工、投光用光ファイバ62
A及受光用光ファイバ62Bが設けられた本体60aを
曲面上を移動させ,基準用レーザ光LBを法線方向を測
定すべき曲面上の所定の位置へ照射させて基準点CPを
設定することにより、曲面上の所定の位置における法線
方向を求めることができる.そして、本体60aから基
準用レーザ発振器51.測定用レーザ発振器63A及び
受光素子63Bを分離したことにより,基準用レーザ光
LBが射出される本体60aが小型に形成されているの
で、作業者が基準用レーザ光LBを対象物の曲面上の所
定の位置に照射させる際に,基準用レーザ光LBの照射
位置を認識しやすく、また、本体60aを曲面上を移動
させる際の操作性が向上する.また,本発明は,基準軸
CL’方向に基準用レーザ光LBを射出して、ワーク6
6等の対象物の加工面66a等の曲面上に基準点cpを
設定する基準用レーザ発振器51.基準用光ファイバ5
7、6l等の基準用レーザ光射出手段を設け、測定用レ
ーザ光LSを所定の変調を掛けた形で射出して,前記曲
面上で前記基準点CP近傍に少なくとも3点の測定点P
を設定する変調器47b及びレーザ発振器42A、測定
用光ファイバ59A、投光用光ファイバ62A、レーザ
発振器63A等の測定用レーザ光変調射出手段を設け、
前記各測定点Pにおいて反射した前記測定用レーザ光L
Sを含む光を受光して,受光した光に対応する受光信号
を出力する受光素子42B、受光用光ファイバ62B、
受光素子63B等の測定用レーザ光受光手段を設け、前
記測定用レーザ光受光手段から出力された前記受光信号
の中から所定の変調を掛けられた前記測定用レーザ光L
Sに対応する成分を取り出して復調し、前記各測定点P
の距離L等の位置に対応した位置信号を出力するバンド
パスフィルタ46a,復調器46b等のノイズ除去手段
を設け,前記ノイズ除去手段から出力された前記各測定
点Pの位置に対応した位置信号に基づいて、それ等測定
点Pを含む仮想平面65を設定し、該仮想平面65の法
線ベクトルN等の法線方向を演算する法線方向演算部4
6を設けて構成したので、対象物の曲面上の基準用レー
ザ光射出手段から射出される基準用レーザ光LBにより
設定される基準点cpにおける法線方向が、基準点cp
近傍の測定用レーザ光射出手段から射出される測定用レ
ーザ光LSにより設定される各測定点Pによって規定さ
れる仮想平面65の法線方向として近似的に算出される
.従って、基準用レーザ光射出手段を測定用レーザ光射
出手段、測定用レーザ光受光手段と共に曲面上を移動さ
せ、法線方向を測定すべき曲面上の所定の位置へ基準用
レーザ光LBを照射させて基準点CPを設定することに
より、曲面上の所定の位置における法線方向を求めるこ
とができる。また、ノイズ除去手段により、測定用レー
ザ光LS以外の光を受光した場合でも、法線方向演算部
46には前記測定用レーザ光LSに対応した位置信号の
みが出力されるので、各測定点Pの位置が正確に測定さ
れ、従って、曲面の法線方向が正確に判定される。
Further, the present invention provides a main body 56a, and a reference laser oscillator 5 that outputs a reference laser beam LB outside the main body 56a.
The reference laser beam LB output from the reference laser oscillator 51 is directed to the reference axis CL' on the main body 56a.
The machining surface 66a of the object such as the workpiece 66 is
A reference optical fiber 5 for setting a reference point CP on a curved surface such as
A measurement laser oscillator 42A that outputs a measurement laser beam LS is provided outside the main body 56a, and a measurement laser oscillator 42A is provided outside the main body 56a.
6a is provided with a measurement optical fiber 59A that emits the measurement laser beam LS output from the measurement laser oscillator 42A and sets at least three measurement points P near the reference point CP on the curved surface. , the main body 56a is provided with a light receiving element 42B capable of receiving the measurement laser beam LS reflected at each measurement point P and outputting a signal corresponding to a position such as a distance L of each measurement point P, The light receiving element 4
Based on the signal corresponding to the position of each measurement point P output from 2B, a virtual thousand plane 65 including those measurement points P is set, and the normal direction of the normal vector N of the virtual plane 65 is determined. Since the configuration includes the normal direction calculation section 46 for calculation, the normal direction at the reference point CP set by the reference laser beam LB emitted from the reference optical fiber 57 on the curved surface of the object is . Measurement optical fiber 59A near reference point CP
It is approximately calculated as the normal direction of the virtual plane 65 defined by each measurement point P set by the measurement laser beam LS emitted from the . Therefore, the reference optical fiber 5
7. Move the main body 56a provided with the measuring optical fiber 59A and the light receiving element 42B on the curved surface, and irradiate the reference laser beam LB to a predetermined position on the curved surface whose normal direction is to be measured, thereby setting the reference point CP. By setting , you can find the normal direction at a given position on the curved surface. By separating the reference laser oscillator 5l and the measurement laser oscillator 42A from the main body 56a, the main body 56a from which the reference laser beam LB is emitted is made smaller, so that an operator can When irradiating the LB to a predetermined position on the curved surface of the object, the irradiation position of the reference laser beam LB is easily recognized, and the operability when moving the main body 56a on the curved surface is improved. Further, the present invention provides a main body 60a, and a reference laser oscillator 5 that outputs a reference laser beam LB outside the main body 60a.
1 to the main body 60a. The reference laser beam LB output from the reference laser oscillator 51 is aligned with the reference axis CL'.
The machined surface 66a of the object such as the workpiece 66 is
A reference optical fiber 6 for setting a reference point cp on a curved surface such as
1, and a measurement laser oscillator 63A that outputs a measurement laser beam LS is provided outside the main body 60a.
0a, a light projection optical fiber 62A that emits the measurement laser beam LS output from the measurement laser oscillator 63A and sets at least three measurement points P near the reference point CP on the curved surface 66a; is provided in the main body 60a,
The measurement laser beam L reflected at each measurement point P
A light receiving optical fiber 62B for receiving S is provided outside the main body 60a. A light receiving element 6 capable of outputting a signal corresponding to a position such as a distance L of each measurement point P based on the light intensity of the measurement laser beam LS received by the light receiving optical fiber 62B.
3B, and based on the signal corresponding to the position of each measurement point P output from the light receiving element 63B, a virtual plane 65 including the measurement points P is set, and a normal vector N of the virtual plane 65 is set. Normal direction calculation unit 4 that calculates the normal direction of
6, the normal direction at the reference point CP set by the reference laser beam LB emitted from the reference optical fiber 6 on the curved surface of the object is the same as that for light projection near the reference point CP. It is approximately calculated as the normal direction of the virtual plane 65 defined by each measurement point P set by the measurement laser beam LS emitted from the optical fiber 62A.
Therefore, there are 6 optical fibers for reference and 62 optical fibers for light projection.
The main body 60a provided with the optical fiber A and the light receiving optical fiber 62B is moved on a curved surface, and the reference laser beam LB is irradiated to a predetermined position on the curved surface whose normal direction is to be measured to set a reference point CP. The normal direction at a given position on the curved surface can be found by Then, the reference laser oscillator 51. By separating the measurement laser oscillator 63A and the light receiving element 63B, the main body 60a from which the reference laser beam LB is emitted is formed in a small size, so that the operator can direct the reference laser beam LB onto the curved surface of the object. When irradiating a predetermined position, it is easy to recognize the irradiation position of the reference laser beam LB, and the operability when moving the main body 60a on a curved surface is improved. Further, the present invention emits the reference laser beam LB in the direction of the reference axis CL' to
A reference laser oscillator 51 for setting a reference point cp on a curved surface such as a processed surface 66a of an object such as 6 or the like. Reference optical fiber 5
A reference laser beam emitting means such as 7 or 6L is provided, and the measurement laser beam LS is emitted in a predetermined modulated form to locate at least three measurement points P near the reference point CP on the curved surface.
A modulator 47b for setting, a laser oscillator 42A, a measurement optical fiber 59A, a light projection optical fiber 62A, a laser oscillator 63A, and other measurement laser beam modulation and emission means are provided,
The measurement laser beam L reflected at each measurement point P
a light-receiving element 42B that receives light containing S and outputs a light-receiving signal corresponding to the received light; a light-receiving optical fiber 62B;
A measuring laser beam receiving means such as a light receiving element 63B is provided, and the measuring laser beam L is subjected to a predetermined modulation from among the light reception signals outputted from the measuring laser beam receiving means.
The component corresponding to S is extracted and demodulated, and each of the measurement points P
Noise removal means such as a bandpass filter 46a and a demodulator 46b are provided to output a position signal corresponding to a position such as a distance L, and a position signal corresponding to the position of each measurement point P outputted from the noise removal means A normal direction calculation unit 4 that sets a virtual plane 65 including the measurement points P based on the above, and calculates the normal direction such as the normal vector N of the virtual plane 65.
6, the normal direction at the reference point cp set by the reference laser beam LB emitted from the reference laser beam emitting means on the curved surface of the object is the reference point cp.
It is approximately calculated as the normal direction of the virtual plane 65 defined by each measuring point P set by the measuring laser beam LS emitted from the nearby measuring laser beam emitting means. Therefore, the reference laser beam emitting means is moved along the curved surface together with the measuring laser beam emitting means and the measuring laser beam receiving means, and the reference laser beam LB is irradiated to a predetermined position on the curved surface whose normal direction is to be measured. By setting the reference point CP in this manner, the normal direction at a predetermined position on the curved surface can be determined. Furthermore, even if the noise removal means receives light other than the measurement laser beam LS, only the position signal corresponding to the measurement laser beam LS is output to the normal direction calculation unit 46, so that each measurement point is The position of P is accurately measured and therefore the normal direction of the curved surface is accurately determined.

また、本発明は、基準軸CL’方向に基準用レーザ光L
Bを射出して,ワーク66等の対象物の加工面66a等
の曲面上に基準点CPを設定する基準用レーザ発振器5
1、基準用光ファイバ57,61等の基準用レーザ光射
出手段を設け,測定用レーザ光LSを射出して、前記曲
面上で前記基準点CP近傍にそれぞれ異なった測定点P
を設定する少なくとも3個のレーザ発振器42A,測定
用光ファイバ59A、投光用光ファイバ62A、レーザ
発振器63A等の測定用レーザ光射出手段を設け、前記
各測定用レーザ光射出手段をt個ずつ,時分割して駆動
するドライバ47a、信号切換器47c等の時分割酩動
手段を設け、前記測定点Pにおいて反射した前記測定用
レーザ光LSを受光して、前記測定点Pの距離L等の位
置に対応した信号を出力し得る少なくとも3個の受光素
子42B、受光用光ファイバ62B、受光素子63B等
の測定用レーザ光受光手段を前記各測定用レーザ光射出
手段と対応する形で設け、前記各測定用レーザ光受光手
段の内、前記時分割駆動手段によって岨動された測定用
レーザ光射出手段に対応する測定用レーザ光受光手段を
l個ずつ、時分割して選択して、選択された当該測定用
レーザ光受光手段のみから前記測定点Pの位置に対応し
た信号を出力させるマルチプレクサ46c、信号切換器
47c等の時分割選択手段を設け、前記時分割選択手段
によって選択された前記各測定用レーザ光受光手段から
出力された前記測定点Pの位置に対応した信号に基づい
て、少なくとも3点の測定点Pの位置を求め、それ等測
定点Pを含む仮想平面65を設定し、該仮想平面65の
法線ベクトルN等の法線方向を演算する法線方向演算部
46を設けて構成したので、対象物の曲面上の基準用レ
ーザ光射出手段から射出される基準用レーザ光LBによ
り設定される基準点cpにおける法線方向が、基準点C
P近傍の、測定用レーザ光射出手段から射出される測定
用レーザ光LSにより設定される各測定点Pによって規
定される仮想平面65の法線方向として近似的に算出さ
れる.従って、基準用レーザ光射出手段を測定用レーザ
光射出手段.測定用レーザ光受光手段と共に曲面上を移
動させ、法線方向を測定すへき曲面上の所定の位置へ基
準用レーザ光LBを照射させて基準点CPを設定するこ
とにより、曲面上の所定の位置における法線方向を求め
ることができる。また、複数の測定用レーザ光射出手段
5又は,複数の測定用レーザ光受光手段を同時に使用し
ないので、1個の測定用レーザ光射出手段と工個の測定
用レーザ光受光手段とが確実に対応して、各測定用レー
ザ光受光手段が当該測定用レーザ光受光手段に対応しな
い測定用レーザ光射出手段から射出された測定用レーザ
光LSを受光することがないので,各測定点Pの位置が
正確に測定され,従って、曲面の法線方向が正確に判定
される。
Further, the present invention provides a reference laser beam L in the direction of the reference axis CL'.
A reference laser oscillator 5 that emits laser beam B and sets a reference point CP on a curved surface such as a processing surface 66a of an object such as a workpiece 66.
1. A reference laser beam emitting means such as reference optical fibers 57 and 61 is provided, and the measurement laser beam LS is emitted to each different measurement point P near the reference point CP on the curved surface.
At least three measuring laser beam emitting means such as a laser oscillator 42A, a measuring optical fiber 59A, a light projecting optical fiber 62A, and a laser oscillator 63A are provided, and t pieces of each measuring laser beam emitting means are provided. , a time-division driving means such as a driver 47a and a signal switch 47c, which are driven in a time-division manner, receive the measurement laser beam LS reflected at the measurement point P, and determine the distance L of the measurement point P, etc. At least three measurement laser beam receiving means such as a light receiving element 42B, a light receiving optical fiber 62B, and a light receiving element 63B capable of outputting a signal corresponding to the position of are provided in a form corresponding to each of the measuring laser beam emitting means. , selecting in a time-division manner l measurement laser beam receiving means corresponding to the measuring laser beam emitting means driven by the time division driving means among the respective measuring laser beam receiving means; A time-division selection means such as a multiplexer 46c and a signal switch 47c for outputting a signal corresponding to the position of the measurement point P only from the selected measuring laser beam receiving means is provided, and the time-division selection means selected by the time-division selection means is provided. Based on the signals corresponding to the positions of the measurement points P output from each of the measurement laser beam receiving means, the positions of at least three measurement points P are determined, and a virtual plane 65 including the measurement points P is set. However, since the configuration is provided with a normal direction calculation unit 46 that calculates the normal direction of the normal vector N of the virtual plane 65, etc., the reference laser beam emitted from the reference laser beam emitting means on the curved surface of the object The normal direction at the reference point cp set by the laser beam LB is the reference point C
It is approximately calculated as the normal direction of the virtual plane 65 defined by each measuring point P set by the measuring laser beam LS emitted from the measuring laser beam emitting means near P. Therefore, the reference laser beam emitting means is used as the measuring laser beam emitting means. A predetermined point on the curved surface is set by moving the measuring laser beam together with the measuring laser beam receiving means on the curved surface and irradiating the reference laser beam LB to a predetermined position on the curved surface whose normal direction is to be measured. The normal direction at a position can be determined. Furthermore, since a plurality of measuring laser beam emitting means 5 or a plurality of measuring laser beam receiving means are not used at the same time, one measuring laser beam emitting means and a single measuring laser beam receiving means can be reliably used. Correspondingly, since each measuring laser beam receiving means does not receive the measuring laser beam LS emitted from the measuring laser beam emitting means that does not correspond to the measuring laser beam receiving means, the measurement laser beam LS of each measuring point P is The position is accurately measured and therefore the normal direction of the curved surface is accurately determined.

また、本発明は、フィラー4l、基準用レーザ発振器5
工,基準用光ファイバ57、61等の基準点設定手段及
びレーザ発振器42A,受光素子42B,測定用光ファ
イバ59A,投光用光ファイ/<62A、受光用光ファ
イバ62B,レーザ発振器63A.受光素子63B等の
測距手段を設け、前記基準点設定手段により,ワーク6
6等の対象物の加工面66a等の曲面上に基準点CPを
設定し,前記測距手段により、前記曲面上で前記基準点
CP近傍に少なくとも3点の測定点Pを設定して、前記
各測定点Pの距1aL等の位置を測定し、測定された前
記各測定点Pの位置に基づいて、それ等測定点Pを含む
仮想平面65を設定し、該仮想平面65の法線方向Nを
算出し,該算出された法線方向を前記基準点cpの法線
方向とするようにして構成したので、対象物の曲面上の
基準点設定手段により設定される基準点CPにおける法
線方向が、基準点CP近傍に測距手段により設定される
各測定点Pによって規定される仮想平面65の法線方向
として近似的に算出される.従って,基準点設定手段を
測距手段と共に曲面上を移動させ、基準点CPを法線方
向を測定すべき曲面上の所定の位置へ設定することによ
り、曲面上の所定の位置における法線方向を求めること
ができる。
Further, the present invention includes a filler 4l, a reference laser oscillator 5
reference point setting means such as reference optical fibers 57 and 61, laser oscillator 42A, light receiving element 42B, measuring optical fiber 59A, light emitting optical fiber/<62A, light receiving optical fiber 62B, laser oscillator 63A. A distance measuring means such as a light receiving element 63B is provided, and the workpiece 6 is set by the reference point setting means.
A reference point CP is set on a curved surface such as a processed surface 66a of an object such as No. 6, and at least three measurement points P are set near the reference point CP on the curved surface by the distance measuring means. The distance 1aL, etc. of each measurement point P is measured, and based on the measured position of each measurement point P, a virtual plane 65 including the measurement points P is set, and the normal direction of the virtual plane 65 is set. N is calculated and the calculated normal direction is set as the normal direction of the reference point CP, so that the normal at the reference point CP set by the reference point setting means on the curved surface of the object. The direction is approximately calculated as the normal direction of the virtual plane 65 defined by each measurement point P set by the distance measuring means in the vicinity of the reference point CP. Therefore, by moving the reference point setting means along with the distance measuring means on the curved surface and setting the reference point CP at a predetermined position on the curved surface whose normal direction is to be measured, the normal direction at a predetermined position on the curved surface can be determined. can be found.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、本発明による法線方向測定装置及び法線方向
測定方法が適用されるティーチング装置の一例を示す正
面図, 第2図は,3次元レーザ加工機の一例を示す斜視図、 第3図は,第2図に示すレーザ加工機のトーチ部分の拡
大図、 第4図は、本発明による法線方向測定装置の一例を示す
図, 第5図は、第4図に示す法線方向測定装置の底面図, 第6図は、ティーチング装置における制御装置の一例を
示すブロック図、 第7図は,トーチ及び旋回トーチの回転角を求める模式
図、 第8図は,ティーチング装置における制御装置の別の例
を示すブロック図、 第9図は、本発明による法線方向測定装置の別の例を示
す図, 第10図は、第9図に示す法線方向測定装置の底面図、 第1l図は,本発明による法線方向測定装置の別の例を
示す図、 第12図は、第11図に示す法線方向測定装置の底面図
、 第工3図は、本発明による法線方向測定装置の別の例を
示す図、 第14図は、第工3図に示す法線方向測定装置の底面図
、 第工5図は、本発明による法線方向測定装置の別の例を
示す図、 第工6図は、第15図に示す法線方向測定装置の底面図
, 第l7図は、第15図及び第l6図に示す法線方向測定
装置における距離の測定原理を示す図,第工8図は、テ
ィーチング装置における制御装置の別の例を示すブロッ
ク図である.40・・・・・・法線方向測定装置 4l・・・・・・基準点設定手段(フィラー)42A・
・・・・・測距手段、 測定用レーザ光射出手段、 測定用レーザ発振器 42B・・・・・・測距手段、 測定用レーザ光受光手段, 受光素子 46・・・・・・法線方向演算部 46a・・・・・・ノイズ除去手段 (バンドパスフィルタ) 46b・・・・・・ノイズ除去手段(復調器)46c・
・・・・・時分割選択手段 (マルチプレクサ) 47a・・・・・・時分割邸動手段(ドライバ)47b
・・・・・・変調手段(変調器)47c・・・・・・時
分割能動手段(信号切換器)50・・・・・・法線方向
測定装置 51・・・・・・基準点設定手段、 基準用レーザ光射出手段、 基準用レーザ発振器 55・・・・・・法線方向測定装置 55a・・・・・・本体 55b・・・・・・受光部 55c・・・・・・投光部 56・・・・・・法線方向測定装置 56a・・・・・・本体 57・・・・・・基準点設定手段、 基準用レーザ光射出手段, 基準用光ファイバ 59A・・・・・・測距手段, 測定用レーザ光射出手段、 測定用光ファイバ 60・・・・・・法線方向測定装置 60a・・・・・・本体 61・・・・・・基準点設定手段、 基準用レーザ光射出手段、 基準用光ファイバ 62A・・・・・・測距手段、 測定用レーザ光射出手段, 投光用光ファイバ 62B・・・・・・測距手段、 測定用レーザ光受光手段、 受光用光ファイバ 63A・・・・・・測距手段、 測定用レーザ光射出手段、 レーザ発振器 63B・・・・・・測距手段, 測定用レーザ光受光手段, 受光素子 66・・・・・・対象物(ワーク) 66a・・・・・・曲面(加工面) cp・・・・・・基準点 P・・・・・・測定点 L・・・・・・位置(距離) N・・・・・・法線方向(法線ベク CL’・・・・・・基準軸 LB・・・・・・基準用レーザ光 LS・・・・・・測定用レーザ光 トル)
FIG. 1 is a front view showing an example of a teaching device to which the normal direction measuring device and normal direction measuring method according to the present invention are applied; FIG. 2 is a perspective view showing an example of a three-dimensional laser processing machine; 3 is an enlarged view of the torch portion of the laser processing machine shown in FIG. 2, FIG. 4 is a view showing an example of the normal direction measuring device according to the present invention, and FIG. 5 is a view of the normal direction shown in FIG. 4. Figure 6 is a block diagram showing an example of the control device in the teaching device, Figure 7 is a schematic diagram for determining the rotation angle of the torch and the rotating torch, and Figure 8 is the control in the teaching device. A block diagram showing another example of the device; FIG. 9 is a diagram showing another example of the normal direction measuring device according to the present invention; FIG. 10 is a bottom view of the normal direction measuring device shown in FIG. 9; Fig. 1l is a diagram showing another example of the normal direction measuring device according to the present invention, Fig. 12 is a bottom view of the normal direction measuring device shown in Fig. 11, and Fig. 3 is a diagram showing another example of the normal direction measuring device according to the present invention. FIG. 14 is a bottom view of the normal direction measuring device shown in FIG. 3; FIG. 5 is another example of the normal direction measuring device according to the present invention. Figure 6 is a bottom view of the normal direction measuring device shown in Figure 15, Figure 17 is a diagram showing the principle of distance measurement in the normal direction measuring device shown in Figures 15 and 16. FIG. 8 is a block diagram showing another example of the control device in the teaching device. 40...Normal direction measuring device 4l...Reference point setting means (filler) 42A.
... Distance measuring means, measuring laser beam emitting means, measuring laser oscillator 42B... Distance measuring means, measuring laser beam receiving means, light receiving element 46 ... normal direction Arithmetic unit 46a... Noise removal means (band pass filter) 46b... Noise removal means (demodulator) 46c.
...Time division selection means (multiplexer) 47a... Time division operation means (driver) 47b
...Modulation means (modulator) 47c ...Time division active means (signal switch) 50 ...Normal direction measuring device 51 ...Reference point setting Means, reference laser beam emitting means, reference laser oscillator 55...Normal direction measuring device 55a...Main body 55b...Light receiving section 55c...Emission Optical section 56...Normal direction measuring device 56a...Main body 57...Reference point setting means, reference laser beam emitting means, reference optical fiber 59A... ...Distance measuring means, measurement laser beam emitting means, measurement optical fiber 60...Normal direction measuring device 60a...Main body 61...Reference point setting means, standard reference optical fiber 62A... distance measuring means, measuring laser beam emitting means, light projecting optical fiber 62B... distance measuring means, measuring laser beam receiving means , Light-receiving optical fiber 63A... Distance measuring means, Measurement laser beam emitting means, Laser oscillator 63B... Distance measuring means, Measurement laser beam receiving means, Light receiving element 66... ...Target (work) 66a...Curved surface (machined surface) cp...Reference point P...Measurement point L...Position (distance) N. ...Normal direction (Normal vector CL'...Reference axis LB...Reference laser beam LS...Measurement laser light torque)

Claims (8)

【特許請求の範囲】[Claims] (1)、対象物の曲面上に基準点を設定する基準点設定
手段を設け、 前記曲面上で前記基準点近傍に少なくとも 3点の測定点を設定し、前記各測定点の位置を測定する
測距手段を設け、 前記測距手段によって測定された前記各測 定点の位置に基づいて、それ等測定点を含む仮想平面を
設定し、該仮想平面の法線方向を演算する法線方向演算
部を設けて構成した法線方向測定装置。
(1) Providing a reference point setting means for setting a reference point on a curved surface of the object, setting at least three measurement points near the reference point on the curved surface, and measuring the position of each of the measurement points. normal direction calculation for calculating a normal direction of the virtual plane by providing a distance measuring means, setting a virtual plane including the measurement points based on the position of each of the measurement points measured by the distance measuring means; A normal direction measuring device configured by providing a section.
(2)、基準軸方向に基準用レーザ光を射出して、対象
物の曲面上に基準点を設定する基準用レーザ光射出手段
を設け、 測定用レーザ光を射出して、前記曲面上で 前記基準点近傍に少なくとも3点の測定点を設定する測
定用レーザ光射出手段を設け、 前記各測定点において反射した前記測定用 レーザ光を受光して、前記各測定点の位置に対応した信
号を出力し得る測定用レーザ光受光手段を設け、 前記測定用レーザ光受光手段から出力され た前記各測定点の位置に対応した信号に基づいて、それ
等測定点を含む仮想平面を設定し、該仮想平面の法線方
向を演算する法線方向演算部を設けて構成した法線方向
測定装置。
(2) A reference laser beam emitting means is provided for emitting a reference laser beam in the direction of the reference axis to set a reference point on the curved surface of the object, and emitting a measurement laser beam to set a reference point on the curved surface of the object. A measurement laser beam emitting means for setting at least three measurement points near the reference point is provided, and the measurement laser beam reflected at each measurement point is received to generate a signal corresponding to the position of each measurement point. and setting a virtual plane including the measurement points based on a signal corresponding to the position of each of the measurement points outputted from the measurement laser beam reception means, A normal direction measuring device configured by providing a normal direction calculation section for calculating the normal direction of the virtual plane.
(3)、大径の受光部と前記受光部に接続した形の小径
の投光部から成る本体を設け、 前記投光部に、基準軸方向に基準用レーザ 光を射出して、対象物の曲面上に基準点を設定する基準
用レーザ光射出手段を設け、 前記投光部に、測定用レーザ光を射出して、前記曲面上
で前記基準点近傍に少なくとも3点の測定点を設定する
測定用レーザ光射出手段を設け、 前記受光部に、前記各測定点において反射 した前記測定用レーザ光を受光して、前記各測定点の位
置に対応した信号を出力し得る受光素子を設け、 前記受光素子から出力された前記各測定点 の位置に対応した信号に基づいて、それ等測定点を含む
仮想平面を設定し、該仮想平面の法線方向を演算する法
線方向演算部を設けて構成した法線方向測定装置。
(3) A main body consisting of a large-diameter light-receiving section and a small-diameter light-emitting section connected to the light-receiving section is provided, and a reference laser beam is emitted to the light-emitting section in the direction of the reference axis to illuminate the target object. A reference laser beam emitting means for setting a reference point on the curved surface is provided, and a measurement laser beam is emitted to the light projecting section to set at least three measurement points near the reference point on the curved surface. a measuring laser beam emitting means for emitting a measuring laser beam, and the light receiving section is provided with a light receiving element capable of receiving the measuring laser beam reflected at each of the measuring points and outputting a signal corresponding to the position of each of the measuring points. , a normal direction calculation unit that sets a virtual plane including the measurement points based on a signal corresponding to the position of each measurement point output from the light receiving element, and calculates a normal direction of the virtual plane. A normal direction measuring device provided and configured.
(4)、本体を設け、 該本体外に、基準用レーザ光線を出力する 基準用レーザ発振器を設け、 前記本体に、前記基準用レーザ発振器から 出力された基準用レーザ光を基準軸方向に射出して、対
象物の曲面上に基準点を設定する基準用光ファイバを設
け、 前記本体外に、測定用レーザ光を出力する 測定用レーザ発振器を設け、 前記本体に、前記測定用レーザ発振器から 出力された測定用レーザ光を射出して、前記曲面上で前
記基準点近傍に少なくとも3点の測定点を設定する測定
用光ファイバを設け、 前記本体に、前記各測定点において反射し た前記測定用レーザ光を受光して、前記各測定点の位置
に対応した信号を出力し得る受光素子を設け、 前記受光素子から出力された前記各測定点 の位置に対応した信号に基づいて、それ等測定点を含む
仮想平面を設定し、該仮想平面の法線方向を演算する法
線方向演算部を設けて構成した法線方向測定装置。
(4) A main body is provided, and a reference laser oscillator that outputs a reference laser beam is provided outside the main body, and the reference laser beam output from the reference laser oscillator is emitted into the main body in the reference axis direction. a reference optical fiber for setting a reference point on the curved surface of the object; a measurement laser oscillator for outputting a measurement laser beam is provided outside the main body; A measurement optical fiber is provided for emitting an output measurement laser beam to set at least three measurement points on the curved surface near the reference point, and the measurement optical fiber reflected at each measurement point is provided on the main body. a light-receiving element capable of receiving a laser beam and outputting a signal corresponding to the position of each of the measurement points; A normal direction measuring device configured by setting a virtual plane including a measurement point and including a normal direction calculation unit that calculates a normal direction of the virtual plane.
(5)、本体を設け、 該本体外に、基準用レーザ光を出力する基 準用レーザ発振器を設け、 前記本体に、前記基準用レーザ発振器から 出力された基準用レーザ光を基準軸方向に射出して、対
象物の曲面上に基準点を設定する基準用光ファイバを設
け、 前記本体外に、測定用レーザ光を出力する 測定用レーザ発振器を設け、 前記本体に、前記測定用レーザ発振器から 出力された測定用レーザ光を射出して、前記曲面上で前
記基準点近傍に少なくとも3点の測定点を設定する投光
用光ファイバを設け、 前記本体に、前記各測定点において反射し た前記測定用レーザ光を受光する受光用光ファイバを設
け、 前記本体外に、前記受光用光ファイバで受 光した測定用レーザ光の光量に基づいて、前記各測定点
の位置に対応した信号を出力し得る受光素子を設け、 前記受光素子から出力された前記各測定点 の位置に対応した信号に基づいて、それ等測定点を含む
仮想平面を設定し、該仮想平面の法線方向を演算する法
線方向演算部を設けて構成した法線方向測定装置。
(5) A main body is provided, and a reference laser oscillator that outputs a reference laser beam is provided outside the main body, and the reference laser beam output from the reference laser oscillator is emitted into the main body in a reference axis direction. a reference optical fiber for setting a reference point on the curved surface of the object; a measurement laser oscillator for outputting a measurement laser beam is provided outside the main body; A light projecting optical fiber is provided for emitting an output measurement laser beam to set at least three measurement points on the curved surface in the vicinity of the reference point, A light-receiving optical fiber is provided to receive the measurement laser beam, and a signal corresponding to the position of each measurement point is outputted outside the main body based on the amount of the measurement laser beam received by the light-receiving optical fiber. A method in which a virtual plane including the measurement points is set based on a signal corresponding to the position of each measurement point output from the light reception element, and a normal direction of the virtual plane is calculated. A normal direction measuring device configured with a line direction calculation section.
(6)、基準軸方向に基準用レーザ光を射出して、対象
物の曲面上に基準点を設定する基準用レーザ光射出手段
を設け、 測定用レーザ光を所定の変調を掛けた形で 射出して、前記曲面上で前記基準点近傍に少なくとも3
点の測定点を設定する測定用レーザ光変調射出手段を設
け、 前記各測定点において反射した前記測定用 レーザ光を含む光を受光して、受光した光に対応する受
光信号を出力する測定用レーザ光受光手段を設け、 前記測定用レーザ光受光手段から出力され た前記受光信号の中から前記測定用レーザ光に対応する
成分を取り出して復調し、前記各測定点の位置に対応し
た位置信号を出力するノイズ除去手段を設け、 前記ノイズ除去手段から出力された前記各 測定点の位置に対応した位置信号に基づいて、それ等測
定点を含む仮想平面を設定し、該仮想平面の法線方向を
演算する法線方向演算部を設けて構成した法線方向測定
装置。
(6) A reference laser beam emitting means is provided that emits a reference laser beam in the direction of the reference axis to set a reference point on the curved surface of the object, and the measurement laser beam is modulated in a predetermined manner. inject at least 3 points near the reference point on the curved surface.
a measuring laser beam modulating and emitting means for setting measurement points, receiving light including the measuring laser beam reflected at each of the measuring points, and outputting a light reception signal corresponding to the received light; A laser beam receiving means is provided, and a component corresponding to the measuring laser beam is extracted from the light receiving signal outputted from the measuring laser beam receiving means, and a component corresponding to the measuring laser beam is demodulated to generate a position signal corresponding to the position of each of the measuring points. A virtual plane including the measurement points is set based on a position signal corresponding to the position of each measurement point outputted from the noise removal means, and a normal line of the virtual plane is set. A normal direction measuring device that includes a normal direction calculation section that calculates a direction.
(7)、基準軸方向に基準用レーザ光を射出して、対象
物の曲面上に基準点を設定する基準用レーザ光射出手段
を設け、 測定用レーザ光を射出して、前記曲面上で 前記基準点近傍にそれぞれ異なった測定点を設定する少
なくとも3個の測定用レーザ光射出手段を設け、 前記各測定用レーザ光射出手段を1個ずつ、時分割して
駆動する時分割駆動手段を設け、前記測定点において反
射した前記測定用レ ーザ光を受光して、前記測定点の位置に対応した信号を
出力し得る少なくとも3個の測定用レーザ光受光手段を
前記各測定用レーザ光射出手段と対応する形で設け、 前記各測定用レーザ光受光手段の内、前記 時分割駆動手段によって駆動された測定用レーザ光射出
手段に対応する測定用レーザ光受光手段を1個ずつ、時
分割して選択して、選択された当該測定用レーザ光受光
手段のみから前記測定点の位置に対応した信号を出力さ
せる時分割選択手段を設け、 前記時分割選択手段によって選択された前 記各測定用レーザ光受光手段から出力された前記測定点
の位置に対応した信号に基づいて、少なくとも3点の測
定点の位置を求め、それ等測定点を含む仮想平面を設定
し、該仮想平面の法線方向を演算する法線方向演算部を
設けて構成した法線方向測定装置。
(7) A reference laser beam emitting means is provided for emitting a reference laser beam in the direction of the reference axis to set a reference point on the curved surface of the object, and emitting a measurement laser beam to set a reference point on the curved surface of the object. At least three measuring laser beam emitting means each setting a different measuring point in the vicinity of the reference point are provided, and time-sharing driving means for driving each of the measuring laser beam emitting means one by one in a time-divided manner. and at least three measuring laser beam receiving means capable of receiving the measuring laser beam reflected at the measuring point and outputting a signal corresponding to the position of the measuring point; each of the measuring laser beam emitting means; of the measurement laser beam receiving means, one measuring laser beam receiving means corresponding to the measuring laser beam emitting means driven by the time division driving means is time-divided. and a time-division selection means for outputting a signal corresponding to the position of the measurement point only from the selected measurement laser beam receiving means, and each of the measurement lasers selected by the time-division selection means Based on the signal corresponding to the position of the measurement point outputted from the light receiving means, the positions of at least three measurement points are determined, a virtual plane including the measurement points is set, and the normal direction of the virtual plane is determined. A normal direction measuring device configured by providing a normal direction calculation section that calculates.
(8)、基準点設定手段及び測距手段を設け、前記基準
点設定手段により、対象物の曲面 上に基準点を設定し、 前記測距手段により、前記曲面上で前記基 準点近傍に少なくとも3点の測定点を設定して、前記各
測定点の位置を測定し、 測定された前記各測定点の位置に基づいて、それ等測定
点を含む仮想平面を設定し、 該仮想平面の法線方向を算出し、該算出さ れた法線方向を前記基準点の法線方向とするようにして
構成した法線方向測定方法。
(8) A reference point setting means and a distance measuring means are provided, the reference point setting means sets a reference point on a curved surface of the object, and the distance measuring means sets at least a reference point on the curved surface in the vicinity of the reference point. Setting three measurement points, measuring the position of each measurement point, setting a virtual plane including the measurement points based on the measured position of each measurement point, and determining the modulus of the virtual plane. A normal direction measuring method configured to calculate a line direction and set the calculated normal direction as the normal direction of the reference point.
JP1195166A 1989-07-27 1989-07-27 Apparatus for measuring direction of normal line and measuring of direction of normal line Pending JPH0357910A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1195166A JPH0357910A (en) 1989-07-27 1989-07-27 Apparatus for measuring direction of normal line and measuring of direction of normal line

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1195166A JPH0357910A (en) 1989-07-27 1989-07-27 Apparatus for measuring direction of normal line and measuring of direction of normal line

Publications (1)

Publication Number Publication Date
JPH0357910A true JPH0357910A (en) 1991-03-13

Family

ID=16336532

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1195166A Pending JPH0357910A (en) 1989-07-27 1989-07-27 Apparatus for measuring direction of normal line and measuring of direction of normal line

Country Status (1)

Country Link
JP (1) JPH0357910A (en)

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Publication number Priority date Publication date Assignee Title
WO2014112431A1 (en) 2013-01-18 2014-07-24 三菱重工業株式会社 Normal-line detection device, processing device, and normal-line detection method
JP2014137357A (en) * 2013-01-18 2014-07-28 Mitsubishi Heavy Ind Ltd Normal vector detector, processing unit and normal vector detection method
CN104937371A (en) * 2013-01-18 2015-09-23 三菱重工业株式会社 Normal-line detection device, processing device, and normal-line detection method
US20150354950A1 (en) * 2013-01-18 2015-12-10 Mitsubishi Heavy Industries, Ltd. Normal-line detection device, processing device, and normal-line detection method
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US9903714B2 (en) 2013-01-18 2018-02-27 Mitsubishi Heavy Industries. Ltd. Normal-line detection device, processing device, and normal-line detection method
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