JPH0381107B2 - - Google Patents

Info

Publication number
JPH0381107B2
JPH0381107B2 JP57062408A JP6240882A JPH0381107B2 JP H0381107 B2 JPH0381107 B2 JP H0381107B2 JP 57062408 A JP57062408 A JP 57062408A JP 6240882 A JP6240882 A JP 6240882A JP H0381107 B2 JPH0381107 B2 JP H0381107B2
Authority
JP
Japan
Prior art keywords
test
circuit
signal
under test
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57062408A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58180962A (ja
Inventor
Iku Moriwaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57062408A priority Critical patent/JPS58180962A/ja
Publication of JPS58180962A publication Critical patent/JPS58180962A/ja
Publication of JPH0381107B2 publication Critical patent/JPH0381107B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57062408A 1982-04-16 1982-04-16 論理装置の試験装置 Granted JPS58180962A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57062408A JPS58180962A (ja) 1982-04-16 1982-04-16 論理装置の試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57062408A JPS58180962A (ja) 1982-04-16 1982-04-16 論理装置の試験装置

Publications (2)

Publication Number Publication Date
JPS58180962A JPS58180962A (ja) 1983-10-22
JPH0381107B2 true JPH0381107B2 (2) 1991-12-27

Family

ID=13199280

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57062408A Granted JPS58180962A (ja) 1982-04-16 1982-04-16 論理装置の試験装置

Country Status (1)

Country Link
JP (1) JPS58180962A (2)

Also Published As

Publication number Publication date
JPS58180962A (ja) 1983-10-22

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