JPH04147601A - Electrode structure of electronic parts - Google Patents
Electrode structure of electronic partsInfo
- Publication number
- JPH04147601A JPH04147601A JP27058790A JP27058790A JPH04147601A JP H04147601 A JPH04147601 A JP H04147601A JP 27058790 A JP27058790 A JP 27058790A JP 27058790 A JP27058790 A JP 27058790A JP H04147601 A JPH04147601 A JP H04147601A
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- Prior art keywords
- metal
- electrode
- thin film
- electrode structure
- alloy
- Prior art date
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- Details Of Resistors (AREA)
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Abstract
Description
【発明の詳細な説明】
〈産業上の利用分野〉
本発明は、金属有機物ペーストを用いて形成した導電性
薄膜をベースにした電子部品の電極構造に関するもので
ある。DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention relates to an electrode structure of an electronic component based on a conductive thin film formed using a metal-organic paste.
〈従来の技術〉
近年、電子部品の小型化、高密度化、底コスト化の要求
が需要者側から益々強くなっている。この要求に応する
べく、底コストでしがも電気的信頼性の高いAu、Au
/Pt等の金属有機物ペーストを用いて電子部品の電極
部を形成する技術が本発明者によって既に提案されてい
る(特願平1−197936.特願平2−117446
)。<Conventional Technology> In recent years, demand for electronic components to be smaller, more dense, and lower in cost has become increasingly strong. In order to meet this demand, Au
The present inventor has already proposed a technique for forming electrode portions of electronic components using a metal-organic paste such as
).
この電極部には、チップ抵抗器のベース電極部や、或は
ハイブリッドICや抵抗ネットワークを構成する場合、
隣接する回路を互いに接続するための取出し電極部等が
上げられる。これら各電極部を他の導体部と接続する場
合には、
(1)前記金属有機物ペーストを用いて形成した電極部
に、同じ材料による金属有機物ペーストによって導体部
を形成し、前記電極部と導体部とを直接接合する構造。This electrode part may be used as the base electrode part of a chip resistor, or when configuring a hybrid IC or resistance network,
There are lead-out electrode parts and the like for connecting adjacent circuits to each other. When connecting each of these electrode parts to another conductor part, (1) Form a conductor part with a metal organic paste made of the same material on the electrode part formed using the metal organic paste, and connect the electrode part and the conductor part. A structure in which the parts are directly joined.
(2)金属有機物ペーストを用いて形成した電極部をA
g/Pctなどの厚膜導体ペーストで覆った後。(2) Electrode part formed using metal-organic paste
After covering with thick film conductor paste such as g/Pct.
600℃〜850”Cの高温で焼成して厚膜導体を形成
し、この厚膜導体と前記導体部とを接合する構造。A structure in which a thick film conductor is formed by firing at a high temperature of 600° C. to 850”C, and this thick film conductor and the conductor portion are bonded.
等がある。etc.
〈発明が解決しようとする課題〉
しかし、従来のように前記電極部と導体部とを接合し、
S n / P b / A g系のハンダ槽(250
℃)に約10秒間浸漬した場合、前記(1)の電極構造
では、金属有機物ペーストを焼成し形成した導電性薄膜
にハンダが濡れず、しかもハンダくわれを生じて前記導
電性薄膜が前記槽中のハンダに溶解してしまう。また、
前記(2)の電極構造では、前記厚膜導体上にハンダが
濡れるものの、95%以上のハンダ濡れ性を確保できな
いという問題点があった・
本発明は上記欠点を解決すべくなされものであり、その
目的は金属有機物ペーストを用いて形成した電極が、回
路パターン等を形成する導体部と確実に固定し得るよう
に、ハンダ濡れ性が良好で、かつ、機械的強度に優れた
電子部品の電極構造を提供することにある。<Problem to be solved by the invention> However, it is difficult to connect the electrode part and the conductor part as in the past,
S n / P b / A g type solder bath (250
℃) for about 10 seconds, in the electrode structure of (1) above, the solder does not wet the conductive thin film formed by firing the metal-organic paste, and moreover, the solder cracks occur and the conductive thin film does not leak into the bath. It will dissolve into the solder inside. Also,
In the electrode structure (2) above, although the solder wets the thick film conductor, there was a problem in that it was not possible to ensure solder wettability of 95% or more. The present invention was made to solve the above drawback. The purpose of this is to create electronic components with good solder wettability and excellent mechanical strength so that electrodes formed using metal-organic paste can be securely fixed to conductor parts forming circuit patterns, etc. The purpose of this invention is to provide an electrode structure.
く課題を解決するための手段〉
本発明は、上記目的に鑑みてなされたものであり、その
要旨は、金属有機物ペーストを用いた電子部品の電極構
造であって、前記金属有機物ペーストを焼成し、前記電
子部品の絶縁基板上に形成する導電性薄膜と、該導電性
薄膜上に形成し、Cr、Ni又はTiのいずれか或はこ
れらを組み合わせた合金よりなる第1の金属膜と、Cu
。Means for Solving the Problems The present invention has been made in view of the above objects, and its gist is an electrode structure for an electronic component using a metal-organic paste, which comprises firing the metal-organic paste. , a conductive thin film formed on the insulating substrate of the electronic component; a first metal film formed on the conductive thin film and made of Cr, Ni, or Ti or an alloy of a combination thereof; and Cu.
.
Sn又はPbのいずれか或はこれらを組み合わせた合金
よりなり、前記電極構造の最上層に形成する第2の金属
膜とを有し、前記第1及び第2の金属膜を300”C以
下の低温で形成することを特徴とする電子部品の電極構
造にある。a second metal film formed on the top layer of the electrode structure, the first and second metal films being made of either Sn or Pb or an alloy of a combination thereof; The electrode structure of an electronic component is characterized by being formed at a low temperature.
ここで前記金属有機物ペーストとしては、Au。Here, the metal-organic paste is Au.
pt又はPdのいずれか或はこれらを組み合わせた合金
の有機化合物をペースト状にしたものが好ましい。It is preferable to use an organic compound of PT or Pd, or an alloy of a combination thereof, in the form of a paste.
〈作用〉
前記第1の金属膜を形成するCr、Ni又はTiのいず
れか或はこれらを組み合わせた合金は、前記導電性薄膜
やその下の絶縁基板との密着性及び機械的強度に優れて
いる。また、前記第2の金属膜を形成する(:u、Sn
又はPbのいずれか或はこれらを組み合わせた合金は、
ハンダ濡れ性に優れる材質である。従って、これら第1
、第2の金属膜は、前記金属有機物ペーストを焼成し形
成した導電性薄膜を保護し、機械的強度やハンダ濡れ性
などを高めるように作用する。<Function> Any one of Cr, Ni, or Ti, or an alloy of a combination of these, forming the first metal film has excellent adhesion and mechanical strength to the conductive thin film and the underlying insulating substrate. There is. Further, the second metal film is formed (:u, Sn
or Pb or an alloy combining these,
This material has excellent solder wettability. Therefore, these first
The second metal film protects the conductive thin film formed by firing the metal-organic paste and acts to improve mechanical strength, solder wettability, and the like.
また、前記第1.第2の金属膜を、300℃以下の低温
で形成することにより、最下層の前記導電性薄膜との間
において、相互の反応拡散はほとんど生じないように作
用する。In addition, the above-mentioned No. 1. By forming the second metal film at a low temperature of 300° C. or lower, almost no mutual reaction and diffusion occurs between the second metal film and the lowermost conductive thin film.
〈実施例〉
本発明に係る電子部品の電極構造のうち、ハイブリッド
ICや抵抗ネットワークを構成する際の取出し電極の電
極構造Aについて、第1図に基づいて工程順に説明する
。<Example> Among the electrode structures of an electronic component according to the present invention, an electrode structure A of an extraction electrode when configuring a hybrid IC or a resistor network will be explained in order of steps based on FIG. 1.
先ず、アルミナセラミックス製の絶縁基板l。First, an insulating substrate made of alumina ceramics.
上に、回路パターンを構成する導電性薄膜12を形成す
る。この導電性薄膜12は、金属有機物として金を含有
した金レジネートペーストをスクリーン印刷法或はフォ
ト・エツチング法によりパターン化し、850℃程度の
高温で焼成し形成する。A conductive thin film 12 constituting a circuit pattern is formed thereon. This conductive thin film 12 is formed by patterning a gold resinate paste containing gold as a metal organic substance by screen printing or photo etching, and baking it at a high temperature of about 850°C.
次に導電性薄膜12に、両端部が重なるように所定位置
に厚膜素子としての抵抗体13を形成する。この抵抗体
13は、RuO2系、Pb2Ru、O,、、系等の抵抗
ペーストをスクリーン印刷法によりパターン印刷し、8
50℃程度で焼成する。さらに、このように形成した抵
抗体13の上を覆うように、ガラスコート14を施して
厚膜素子を保護する。Next, a resistor 13 as a thick film element is formed on the conductive thin film 12 at a predetermined position so that both ends overlap. This resistor 13 is made by printing a pattern of RuO2-based, Pb2Ru, O,, etc.-based resistance paste using a screen printing method.
Bake at about 50°C. Further, a glass coat 14 is applied to cover the resistor 13 formed in this manner to protect the thick film element.
また、導電性薄膜12の上に1両端部が重なるように薄
膜素子としての薄膜抵抗15を形成する。Further, a thin film resistor 15 as a thin film element is formed on the conductive thin film 12 so that both ends overlap.
この薄膜抵抗15は、蒸着法やスパッタ法等の従来の薄
膜作成方法により形成し、フォトエツチング法等により
パターン化して形成する。The thin film resistor 15 is formed by a conventional thin film forming method such as a vapor deposition method or a sputtering method, and is patterned by a photoetching method or the like.
次に、抵抗ネットワーク等を構成する際に、隣接する回
路を互いに接続するための取出し電極を形成する。取出
し電極の形成に当っては、まず、導電性薄膜12の所定
箇所に、該導電性薄膜12及び絶縁基板10との密着性
に優れ、かつ機械的強度にも優れるCrによる第1の金
属膜16をスパッタ法或は蒸着法によって形成する。な
お、形成時の温度は90℃〜300℃程度である。さら
に、この第1の金属膜16をエツチング法或はリフト・
オフ法によりパターン化する。ついで、パターン化した
第1の金属膜16の上に、ハンダ濡れ性に優れるCuに
よる第2の金属膜17をスパッタ法或は蒸着法等によっ
て形成する。この形成時の温度け、90℃〜300’C
程度である。Next, when configuring a resistor network or the like, lead-out electrodes are formed to connect adjacent circuits to each other. In forming the extraction electrode, first, a first metal film made of Cr, which has excellent adhesion to the conductive thin film 12 and the insulating substrate 10 and has excellent mechanical strength, is applied to a predetermined location of the conductive thin film 12. 16 is formed by sputtering or vapor deposition. Note that the temperature during formation is approximately 90°C to 300°C. Furthermore, this first metal film 16 is etched or lifted.
Create a pattern using the off method. Next, a second metal film 17 made of Cu, which has excellent solder wettability, is formed on the patterned first metal film 16 by sputtering, vapor deposition, or the like. The temperature during this formation is 90°C to 300'C.
That's about it.
なお、前記第1の金属膜16は、Crの他、Ni又はT
i或はこれらを組み合わせた合金によって形成すること
ができ、また、前記第2の金属膜17は、Cuの他、S
n又はPb或はこれらを組み合わせた合金によって形成
することができる。Note that the first metal film 16 is made of Ni or T in addition to Cr.
In addition to Cu, the second metal film 17 may be formed of Cu or an alloy of a combination thereof.
It can be formed of n, Pb, or an alloy of a combination thereof.
また5本発明に係る電子部品の電極構造のうち、チップ
抵抗器におけるベース電極の電極構造Bについて、第2
図を基に工程順に説明する。In addition, among the electrode structures of electronic components according to the present invention, the electrode structure B of the base electrode in a chip resistor is
The process will be explained in order based on the drawings.
まず、絶縁基板としてのセラミックス製のチップ基板2
0上の両端部に、周知のフォト・エツチング法或はスク
リーン印刷法等により金属有機物材料として金を含有し
た金レジネートペーストをパターン印刷し、850℃程
度の高温で焼成して一対のベース電極21を形成する0
次に、前記−対のベース電極21に、両端部が重なるよ
うにRu系ペーストをスクリーン印刷法により印刷し、
850℃程度で焼成して抵抗膜22を形成する。First, a ceramic chip substrate 2 as an insulating substrate
A pattern of gold resinate paste containing gold as a metal-organic material is printed on both ends of the base electrode 21 by a well-known photo-etching method or screen printing method, and is fired at a high temperature of about 850° C. to form a pair of base electrodes 21. 0 forming
Next, a Ru-based paste is printed on the pair of base electrodes 21 by screen printing so that both ends overlap,
The resistive film 22 is formed by firing at about 850°C.
次に、ベース電極21上に、該ベース電極21及びチッ
プ基板20との密着性に優れ、かつ機械的強度にも優れ
るNiによる第1の金属膜24を無電解メツキ法によっ
て形成する。この形成時の温度は、60℃〜95℃程度
である。このように。Next, a first metal film 24 made of Ni, which has excellent adhesion to the base electrode 21 and the chip substrate 20 and has excellent mechanical strength, is formed on the base electrode 21 by electroless plating. The temperature during this formation is approximately 60°C to 95°C. in this way.
ベース電極21を第1の金属膜24で被覆することによ
り、トリミングを行う際の測定用プローブとベース電極
21との電気的コンタクトが改善されると共に、金を含
有するベース電極、21の摩耗性が弱いという欠点を補
うことができる。By covering the base electrode 21 with the first metal film 24, the electrical contact between the measurement probe and the base electrode 21 during trimming is improved, and the wear resistance of the base electrode 21 containing gold is improved. This can make up for the drawback of being weak.
さらに1周知の方法でトリミングを行い所望の抵抗値に
調節し、この後に行うメツキ処理時における抵抗膜22
の保護及び種々の使用環境に耐え得るためのオーバーコ
ート膜23を公知の方法で形成する。Furthermore, the resistive film 22 is trimmed using a well-known method to adjust the resistance to a desired value, and the resistive film 22 is then trimmed to a desired resistance value.
An overcoat film 23 is formed by a known method to protect the device and withstand various usage environments.
次に、チップ基板20の両端面に端面電極26及び裏面
電極27を形成した後、前記第1の金属膜24及び各電
極26.27の上に、ハンダ濡れ性に優れるSn/Pb
合金による第2の金属膜25を電気メツキ法、無電解メ
ツキ法或は蒸着法等によって形成する。この形成時の温
度は、電気メツキ法では20℃〜60℃程度、無電解メ
ツキ法では、60℃〜95℃程度、蒸着法では90℃〜
300℃程度である。Next, after forming end electrodes 26 and back electrodes 27 on both end surfaces of the chip substrate 20, Sn/Pb, which has excellent solder wettability, is placed on the first metal film 24 and each electrode 26, 27.
A second metal film 25 made of an alloy is formed by electroplating, electroless plating, vapor deposition, or the like. The temperature during this formation is approximately 20°C to 60°C for electroplating, approximately 60°C to 95°C for electroless plating, and 90°C to 90°C for vapor deposition.
The temperature is about 300°C.
なお、前記第1の金属膜24は、前記第1の金属膜16
は、Niの他、Cr又はTi或はこれらの合金によて形
成することができ、また、前記第2の金属膜25は、S
n / P b合金の他、Cu。Note that the first metal film 24 is different from the first metal film 16.
can be formed of Cr, Ti, or an alloy thereof in addition to Ni, and the second metal film 25 can be formed of S
Besides n/Pb alloy, Cu.
Sn又はPb或はこれらの合金によって形成することが
できる。It can be formed of Sn or Pb or an alloy thereof.
また、本実施例では、第1の金属膜と第2の金属膜とを
連続して積層させたが、この第1の金属膜と第2の金属
膜との間に、他の金属膜を介在させても、本発明と同様
な作用効果を発揮するものである。Further, in this example, the first metal film and the second metal film were laminated in succession, but another metal film was formed between the first metal film and the second metal film. Even if it is interposed, the same effects as the present invention can be achieved.
く効果〉
本発明に係る電子部品の電極構造によれば、前記導電性
薄膜の上に形成するCr、Ni又はTiのいずれか或は
これらを組み合わせた合金による第1の金属膜は、前記
導電性薄膜やその下の絶縁基板との密着性及び機械的強
度に優れており、また、Cu、Sn又はPbのいずれか
或はこれらを組み合わせた合金による前記第2の金属膜
は、ハンダ濡れ性に優れた材質である。従って、これら
第1、第2の金属膜は、前記金属有機物ペーストを焼成
し形成した導電性薄膜を保護し;機械的強度やハンダ濡
れ性などを高めることができる。また、前記第1、及び
第2の金属膜は、300℃以下の低温で形成するので、
最下層の前記導電性薄膜との間において、相互の反応拡
散はほとんど生じないため、所望の電気的特性を確実に
得ることができ、電気的信頼性の高い電子部品の電極構
造を提供することができる。According to the electrode structure of the electronic component according to the present invention, the first metal film formed on the conductive thin film and made of any one of Cr, Ni, or Ti, or an alloy of a combination of these, The second metal film is made of Cu, Sn, or Pb, or an alloy of a combination thereof, and has excellent solder wettability. It is an excellent material. Therefore, these first and second metal films protect the conductive thin film formed by firing the metal-organic paste; they can improve mechanical strength, solder wettability, and the like. Further, since the first and second metal films are formed at a low temperature of 300°C or less,
To provide an electrode structure for an electronic component that can reliably obtain desired electrical characteristics and has high electrical reliability since almost no mutual reaction and diffusion occurs between the conductive thin film and the lowermost conductive thin film. I can do it.
第1図は、本発明に係る電極構造を取出し電極に適用し
た例を示す回路基板の断面図、第2図は、本発明に係る
電極構造をチップ抵抗器のベース電極に適用した例を示
すチップ抵抗器の断面図である。
A・・取出し電極の電極構造、1o・・絶縁基板、12
・・導電性薄膜、16・・第1の金属膜、17・・第2
の金属膜、B・・ベース電極の電極構造、20・・チッ
プ基板(絶縁基板)、21・・ベース電極(導電性薄膜
)、24・・第1の金属膜、25・・第2の金属膜。
特許出願人 三菱鉱業セメント株式会社同 釜屋
電機株式会社FIG. 1 is a cross-sectional view of a circuit board showing an example in which the electrode structure according to the present invention is applied to an extraction electrode, and FIG. 2 is a cross-sectional view showing an example in which the electrode structure according to the present invention is applied to a base electrode of a chip resistor. FIG. 2 is a cross-sectional view of a chip resistor. A... Electrode structure of extraction electrode, 1o... Insulating substrate, 12
...Conductive thin film, 16..First metal film, 17..Second
B... electrode structure of base electrode, 20... chip substrate (insulating substrate), 21... base electrode (conductive thin film), 24... first metal film, 25... second metal film. Patent applicant Mitsubishi Mining Cement Co., Ltd. Kamaya Electric Co., Ltd.
Claims (1)
って、 前記金属有機物ペーストを焼成し、前記電子部品の絶縁
基板上に形成する導電性薄膜と、該導電性薄膜上に形成
し、Cr、Ni又はTiのいずれか或はこれらを組み合
わせた合金よりなる第1の金属膜と、Cu、Sn又はP
bのいずれか或はこれらを組み合わせた合金よりなり、
前記電極構造の最上層に形成する第2の金属膜とを有し
、前記第1及び第2の金属膜を300℃以下の低温で形
成することを特徴とする電子部品の電極構造。[Claims] An electrode structure for an electronic component using a metal-organic paste, comprising: a conductive thin film formed on an insulating substrate of the electronic component by firing the metal-organic paste; a first metal film made of Cr, Ni or Ti, or an alloy of a combination thereof; and Cu, Sn or P.
Consisting of any one of b or an alloy of a combination of these,
and a second metal film formed on the uppermost layer of the electrode structure, the first and second metal films being formed at a low temperature of 300° C. or lower.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2270587A JPH0744084B2 (en) | 1990-10-11 | 1990-10-11 | Electrode structure of electronic parts |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2270587A JPH0744084B2 (en) | 1990-10-11 | 1990-10-11 | Electrode structure of electronic parts |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04147601A true JPH04147601A (en) | 1992-05-21 |
| JPH0744084B2 JPH0744084B2 (en) | 1995-05-15 |
Family
ID=17488200
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2270587A Expired - Lifetime JPH0744084B2 (en) | 1990-10-11 | 1990-10-11 | Electrode structure of electronic parts |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0744084B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108428525A (en) * | 2017-02-13 | 2018-08-21 | 三星电机株式会社 | Resistor element, the method for manufacturing the resistor element and resistor element component |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0217603A (en) * | 1988-07-06 | 1990-01-22 | Matsushita Electric Ind Co Ltd | Chip parts and their manufacturing method |
-
1990
- 1990-10-11 JP JP2270587A patent/JPH0744084B2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0217603A (en) * | 1988-07-06 | 1990-01-22 | Matsushita Electric Ind Co Ltd | Chip parts and their manufacturing method |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108428525A (en) * | 2017-02-13 | 2018-08-21 | 三星电机株式会社 | Resistor element, the method for manufacturing the resistor element and resistor element component |
| US10181367B2 (en) | 2017-02-13 | 2019-01-15 | Samsung Electro-Mechanics Co., Ltd. | Resistor element, method of manufacturing the same, and resistor element assembly |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0744084B2 (en) | 1995-05-15 |
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