JPH0418219Y2 - - Google Patents

Info

Publication number
JPH0418219Y2
JPH0418219Y2 JP11828986U JP11828986U JPH0418219Y2 JP H0418219 Y2 JPH0418219 Y2 JP H0418219Y2 JP 11828986 U JP11828986 U JP 11828986U JP 11828986 U JP11828986 U JP 11828986U JP H0418219 Y2 JPH0418219 Y2 JP H0418219Y2
Authority
JP
Japan
Prior art keywords
hook
jumper chip
jumper
hooked
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11828986U
Other languages
Japanese (ja)
Other versions
JPS6325469U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11828986U priority Critical patent/JPH0418219Y2/ja
Publication of JPS6325469U publication Critical patent/JPS6325469U/ja
Application granted granted Critical
Publication of JPH0418219Y2 publication Critical patent/JPH0418219Y2/ja
Expired legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)

Description

【考案の詳細な説明】 〔産業上の利用分野〕 本考案は面実装素子のマウントされたプリント
配線基板面上で前記測定用プローブを用いて電圧
を測定する時にプローブ先端鉤状部が係止されて
測定し易いジヤンパーチツプに関する。
[Detailed description of the invention] [Industrial field of application] The present invention has a method in which the hook-shaped portion at the tip of the probe is locked when measuring voltage using the measurement probe on the surface of a printed wiring board on which surface-mounted devices are mounted. This invention relates to a jumper chip that is easy to measure.

〔従来の技術〕[Conventional technology]

従来のジヤンパーチツプ4は第5図に示すよう
に平板状の橋架部13の両端から下方に延設され
た足部14,14から成つている。
As shown in FIG. 5, the conventional jumper chip 4 consists of legs 14, 14 extending downward from both ends of a flat bridge section 13.

一方配線基板5には並設された2本の導電帯
6,6が形成されるとともに、この導電帯6,6
はジヤンパーチツプ4の足部14,14がそれぞ
れはんだ付けされて電気的に接続されている。
On the other hand, two conductive bands 6, 6 arranged in parallel are formed on the wiring board 5, and these conductive bands 6, 6
The legs 14, 14 of the jumper chip 4 are respectively soldered and electrically connected.

また、配線基板5の両導電帯6,6間には導電
帯7が形成されており、この導電帯7をジヤンパ
ーチツプ4の橋架部13が飛び越えている。(実
開昭49−70459) このようなジヤンパーチツプ4は全体が導電体
であつて配線基板上で露出しているためラインの
抜き取りチエツクで適正な電圧値、電流値が出て
いるか調べる場合、あるいは故障解析時に適正な
電圧値、電流値がでているか調べる場合、あるい
は出力電圧を見ながら他の回路定数を調整する場
合等に測定プローブ9で測定するのにジヤンパー
チツプ4の側辺に接触させて活用されることが多
い。
Further, a conductive band 7 is formed between both conductive bands 6, 6 of the wiring board 5, and the bridge portion 13 of the jumper chip 4 jumps over this conductive band 7. (Utility Model Application No. 49-70459) Since the jumper chip 4 is entirely a conductor and is exposed on the wiring board, it can be When checking whether proper voltage and current values are obtained during failure analysis, or when adjusting other circuit constants while checking the output voltage, etc., use the measurement probe 9 to touch the side of the jumper chip 4. Often used.

上記のジヤンパーチツプ4を利用して電圧値、
電流値を測定する場合、第4図のような測定用プ
ローブ9を用いる。このプローブ9は下方に鉤状
部12を備え、かつ鉤状部12は上方に付勢さ
れ、又プローブ9に設けられたつば部10により
鉤状部12は上下動されるようになつている。そ
して前記つば部10に力が加わつていない状態で
は鉤状部12はホルダ部11内に納まりつば部1
0を押し下げると鉤状部12は突出するようにな
つている。電圧値、電流値の測定をする場合、前
記つば部10を下方に押して前記鉤状部12を突
出させ、被測定部(ジヤンパーチツプ4)に引つ
かけ、その後つば部10から力を抜くと、鉤状部
12は上方に引かれ、被測定物を前記ホルダ部1
1と前記鉤状部12の間に挟み込むことになり、
この状態で測定を行う。
Using the above jumper chip 4, the voltage value,
When measuring the current value, a measuring probe 9 as shown in FIG. 4 is used. This probe 9 is provided with a hook-shaped portion 12 on the lower side, and the hook-shaped portion 12 is biased upward, and the hook-shaped portion 12 is moved up and down by a collar portion 10 provided on the probe 9. . When no force is applied to the flange 10, the hooked portion 12 is housed within the holder 11 and the flange 10 is closed.
When 0 is pushed down, the hooked portion 12 is designed to protrude. When measuring voltage and current values, push the collar 10 downward to make the hook 12 protrude and hook it to the part to be measured (jumper chip 4), and then release the force from the collar 10. The hook-shaped part 12 is pulled upward, and the object to be measured is held in the holder part 1.
1 and the hooked portion 12,
Measurement is performed in this state.

〔考案が解決しようとする問題点〕[Problem that the invention attempts to solve]

このようにして前記ジヤンパーチツプ4を測定
する場合、第5図に示すようにジヤンパーチツプ
4の幅方向が前記鉤状部12の水平方向の幅に比
較して大きいため、前記鉤状部12を引つかけた
時に前記鉤状部12の先端1点だけコンタクトに
なり接触が不安定になる易いという欠点があつ
た。又前記ジヤンパーチツプ4の足部の高さによ
つては前記鉤状部12が前記ジヤンパーチツプ4
が飛び越えている下方の前記導電帯7に接触し目
的と異なる信号を捨つてしまうという欠点もあつ
た。又ジヤンパーチツプ4の形状は、自動マウン
トするために通常のチツプ抵抗の標準寸法と同じ
である必要があり、そこで鉤状部12内に納まる
程度にジヤンパーチツプ4の幅を細くしようとし
てもできない。本考案の目的は、前記欠点を除き
安定した接触を保つて正しい測定のできるジヤン
パーチツプを与えることにある。
When measuring the jumper tip 4 in this way, the width direction of the jumper tip 4 is larger than the horizontal width of the hooked portion 12, as shown in FIG. When hooked, there is a drawback that only one point of the tip of the hook-shaped portion 12 makes contact, and the contact tends to become unstable. Also, depending on the height of the foot of the jumper chip 4, the hooked portion 12 may be attached to the jumper chip 4.
There was also a drawback that the signal came into contact with the conductive band 7 below which it had jumped over and discarded a signal that was not intended for purpose. Further, the shape of the jumper chip 4 must be the same as the standard dimensions of a normal chip resistor in order to be automatically mounted, so even if it is attempted to make the width of the jumper chip 4 thin enough to fit within the hook-shaped portion 12, it is not possible. The object of the present invention is to provide a jumper chip which eliminates the above-mentioned drawbacks and allows accurate measurements while maintaining stable contact.

〔問題点を解決するための手段〕[Means for solving problems]

上記問題点を解決するために先端に鉤状部を持
つた測定用プローブを使用する時、測定用プロー
ブの鉤状部12を両端部に接触させるようにした
ジヤンパーチツプにおいて前期端部の少なくとも
一方に前記鉤状部を位置させる凹部を設けるよう
にする。
In order to solve the above problem, when using a measuring probe having a hook-like portion at the tip, a jumper tip is arranged so that the hook-like portion 12 of the measuring probe comes into contact with both ends. A recess is provided in which the hook-shaped portion is positioned.

〔作用〕[Effect]

上記の技術的手段は次の様に作用する。 The above technical means works as follows.

測定用プローブが位置決めされて安定し、なお
かつ充分にジヤンパーチツプをつかむことができ
るので前記導電帯7に前記鉤状部12が接触する
ことがなく安定した正しい電流値、電圧値の測定
ができる。
Since the measurement probe is positioned and stabilized and can sufficiently grip the jumper chip, the hook-shaped part 12 does not come into contact with the conductive band 7, and stable and correct current and voltage values can be measured.

〔実施例〕〔Example〕

以下、本考案の実施例を第1図、第2図、第3
図を用いて説明する。
Examples of the present invention are shown below in Figures 1, 2, and 3.
This will be explained using figures.

第1図に示す様に、帯状金属板を切断まげ加工
したジヤンパーチツプ1は、平板状の橋架部19
の両端から下方に延設された足部15,15から
成つており、前記足部15,15が配線板5の上
の導電帯6,6とはんだ付等の方法で電気的に接
続されており、導電帯6,6の間の導電帯7を飛
び越えている。ジヤンパーチツプ1の橋架部19
の両側辺には円弧状の凹部8,8が設けられてい
る。本考案は上記の如く構成され、次に作用を説
明する。
As shown in FIG. 1, the jumper chip 1 is made by cutting a band-shaped metal plate into a beveled shape.
It consists of legs 15, 15 extending downward from both ends of the board, and the legs 15, 15 are electrically connected to conductive bands 6, 6 on the wiring board 5 by a method such as soldering. and jumps over the conductive band 7 between the conductive bands 6, 6. Bridge part 19 of jumper chip 1
Arc-shaped recesses 8, 8 are provided on both sides. The present invention is constructed as described above, and its operation will now be explained.

測定用プローブ9の鉤状部12をジヤンパーチ
ツプ1の橋架部19に引つかけるようにして橋架
部19を鉤状部12とホルダ11との間で挟持す
る。この時鉤状部12はホルダ11側が拡がつて
いるため、鉤状部12と橋架部19との2箇所の
接触位置は両凹部8,8によつて橋架部19に形
成された最狭部分に移動して位置決めされること
になる。従つて前記鉤状部12がふらつくことが
なくなり、鉤状部12とジヤンパーチツプ1間の
集中接触抵抗が小さくなり安定した正しい測定が
できる。
The bridge portion 19 of the jumper chip 1 is held between the hook portion 12 and the holder 11 so that the hook portion 12 of the measuring probe 9 is attracted to the bridge portion 19 of the jumper chip 1. At this time, since the hooked part 12 is expanding on the holder 11 side, the two contact positions between the hooked part 12 and the bridge part 19 are at the narrowest part formed in the bridge part 19 by both the recesses 8, 8. It will be moved and positioned. Therefore, the hooked portion 12 does not wobble, and the concentrated contact resistance between the hooked portion 12 and the jumper chip 1 is reduced, allowing stable and accurate measurement.

本考案の別の実施例を説明すると、第2図に示
すように、帯状金属板を切断まげしぼり加工した
ジヤンパーチツプ2は、平板状の橋架部20の両
端から下方に延設され、丸くしぼられている足部
16,16から成つている。この場合も第1図の
場合と同様に、ジヤンパーチツプ2はその足部1
6,16を配線基板の上の導電帯6,6にはんだ
付等で電気的に接続して導電帯6,6間の導電帯
7を飛び越している。ジヤンパーチツプ2の側辺
には円弧状の凹部8,8が設けられている。本考
案は上記の如く構成され、次に作用を説明する。
To explain another embodiment of the present invention, as shown in FIG. 2, a jumper chip 2, which is formed by cutting a band-shaped metal plate and performing a bending process, extends downward from both ends of a flat bridge section 20, and is rounded and squeezed. It consists of two legs 16, 16. In this case as well, as in the case of FIG.
6 and 16 are electrically connected to the conductive bands 6 and 6 on the wiring board by soldering or the like, and the conductive band 7 between the conductive bands 6 and 6 is skipped. Arc-shaped recesses 8, 8 are provided on the sides of the jumper chip 2. The present invention is constructed as described above, and its operation will now be explained.

測定用プローブ9の鉤状部12をジヤンパーチ
ツプ2の橋架部20に引つかけるようにして、橋
架部20を鉤状部12とホルダ11との間で挟持
する。この時鉤状部12はホルダ11側が拡がつ
ているため、鉤状部12と橋架部20との2箇所
の接触位置は、両凹部8,8によつて橋架部20
に形成された最狭部分に移動して位置決めされる
ことになる。従つて前記鉤状部12がふらつくこ
とがなくなり、鉤状部12とジヤンパーチツプ2
間の接中接触抵抗が小さくなり安定した正しい測
定ができる。
The hook-shaped portion 12 of the measurement probe 9 is pulled onto the bridge portion 20 of the jumper chip 2, and the bridge portion 20 is held between the hook-shaped portion 12 and the holder 11. At this time, since the hook-shaped part 12 is expanded on the holder 11 side, the two contact positions between the hook-shaped part 12 and the bridge part 20 are determined by the two recesses 8, 8.
It will be moved and positioned at the narrowest part formed in the area. Therefore, the hooked portion 12 does not wobble, and the hooked portion 12 and the jumper tip 2
The contact resistance between the two is small, allowing for stable and accurate measurements.

本考案の更に別の実施例を説明すると、第3図
に示す様に、帯状金属板を切断まげ加工したジヤ
ンパーチツプ3は、平板状の橋架部21の両端か
ら下方に延設された足部17,17から成つてお
り、前記足部17,17が配線基板5上の導電帯
6,6とはんだ付等によつて電気的に接続されて
おり、導電帯6,6の間の導電帯7を飛び越えて
いる。ジヤンパーチツプ3の側辺の一方側に三角
形の凹部18が設けられている。本考案の上記の
如く構成され次に作用を説明する。
To explain yet another embodiment of the present invention, as shown in FIG. 3, a jumper chip 3 made by cutting a band-shaped metal plate into a beveled shape has leg portions 17 extending downward from both ends of a flat bridge portion 21. , 17, the leg portions 17, 17 are electrically connected to the conductive bands 6, 6 on the wiring board 5 by soldering or the like, and the conductive band 7 between the conductive bands 6, 6 is jumping over. A triangular recess 18 is provided on one side of the jumper chip 3. The operation of the present invention constructed as described above will now be explained.

測定用プローブ9の鉤状部12をジヤンパーチ
ツプ3の橋架部21に引つかけるようにして、橋
架部21を鉤状部12とホルダ11との間で挟持
する。この時鉤状部12はホルダ11側が拡がつ
ているため、鉤状部12と橋架部21との2箇所
の接触位置は凹部18によつて橋架部21に形成
された最狭部分に移動して位置決めされることに
なる。従つて前記鉤状部12がふらつくことがな
くなり、鉤状部12とジヤンパーチツプ3間の集
中接触抵抗が小さくなり、安定した正しい測定が
できる。
The hook-shaped portion 12 of the measurement probe 9 is pulled onto the bridge portion 21 of the jumper chip 3, and the bridge portion 21 is held between the hook-shaped portion 12 and the holder 11. At this time, since the hooked part 12 is expanding on the holder 11 side, the two contact positions between the hooked part 12 and the bridge part 21 are moved to the narrowest part formed in the bridge part 21 by the recessed part 18. The position will be determined by Therefore, the hooked portion 12 does not wobble, the concentrated contact resistance between the hooked portion 12 and the jumper chip 3 is reduced, and stable and correct measurements can be made.

尚、上記各実施例ではジヤンパーチツプ1,
2,3の側辺の凹部8,18として円弧及び三角
形を使用しているが、この凹部8,18は、当目
的を構成できればどんな形状でもよいし、凹部の
数の当目的を達成できれば何個でもよい。又ジヤ
ンパーチツプの構造も当目的を達成できればどの
ような構造でもよい。
In each of the above embodiments, the jumper chips 1,
Although circular arcs and triangles are used as the recesses 8 and 18 on the sides of 2 and 3, the recesses 8 and 18 may have any shape as long as the desired purpose can be achieved, and any number of recesses can be used as long as the desired purpose can be achieved. It may be one piece. Further, the structure of the jumper chip may be of any structure as long as the purpose can be achieved.

〔考案の効果〕[Effect of idea]

以上説明したように、先端に鉤状部をもつた測
定用プローブを使用する時、測定用プローブの鉤
状部を両側部に接触させるようにしたジヤンパー
チツプにおいて、前記端部の少なくとも一方に前
記鉤状部を位置させる凹部を設けたため、凹部に
よつて側面図プローブが位置決めされるので、該
プローブがふらつくことがなくなり、測定用プロ
ーブとジヤンパーチツプの集中接触抵抗が小さく
なり、安定した正しい測定ができ、かつ寸法が標
準チツプと同じなので自動マウントにも対応でき
るという効果を奏する。
As explained above, when using a measurement probe having a hook-shaped portion at the tip, in a jumper chip in which the hook-shaped portion of the measurement probe is brought into contact with both sides, the hook is attached to at least one of the ends. Since the side view probe is positioned by the recess, the probe does not wobble and the concentrated contact resistance between the measurement probe and the jumper chip is reduced, allowing stable and accurate measurements. Moreover, since the dimensions are the same as standard chips, it has the advantage of being compatible with automatic mounting.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例の説明図、第2図、
第3図は本考案の別の実施例の斜視図、第4図は
測定用プローブの斜視図、第5図は従来例の説明
図。 1,2,3……ジヤンパーチツプ、5……プリ
ント配線基板、6,7……導電帯、8,18……
凹部、9……測定用プローブ、12……鉤状部、
15,16,17……足部。
Fig. 1 is an explanatory diagram of an embodiment of the present invention; Fig. 2;
FIG. 3 is a perspective view of another embodiment of the present invention, FIG. 4 is a perspective view of a measuring probe, and FIG. 5 is an explanatory diagram of a conventional example. 1, 2, 3... Jumper chip, 5... Printed wiring board, 6, 7... Conductive band, 8, 18...
Recessed portion, 9...Measurement probe, 12...Hooked portion,
15, 16, 17...foot.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 先端に鉤状部を持つた測定用プローブを使用す
る時測定プローブの鉤状部を両端部に接触させる
ようにしたジヤンパーチツプにおいて前記端部の
少なくとも一方に前記鉤状部を位置させる凹部を
設けたことを特徴とするジヤンパーチツプ。
When using a measurement probe having a hooked portion at the tip, the jumper chip is configured such that the hooked portion of the measurement probe comes into contact with both ends, and a recessed portion for positioning the hooked portion is provided at at least one of the ends. A jumper chip that is characterized by:
JP11828986U 1986-07-31 1986-07-31 Expired JPH0418219Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11828986U JPH0418219Y2 (en) 1986-07-31 1986-07-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11828986U JPH0418219Y2 (en) 1986-07-31 1986-07-31

Publications (2)

Publication Number Publication Date
JPS6325469U JPS6325469U (en) 1988-02-19
JPH0418219Y2 true JPH0418219Y2 (en) 1992-04-23

Family

ID=31004604

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11828986U Expired JPH0418219Y2 (en) 1986-07-31 1986-07-31

Country Status (1)

Country Link
JP (1) JPH0418219Y2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007141909A (en) * 2005-11-15 2007-06-07 Matsushita Electric Ind Co Ltd Resistor and manufacturing method thereof
JP2007141906A (en) * 2005-11-15 2007-06-07 Matsushita Electric Ind Co Ltd Resistor
JP2007220714A (en) * 2006-02-14 2007-08-30 Matsushita Electric Ind Co Ltd Resistor and manufacturing method thereof

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2580132Y2 (en) * 1991-07-05 1998-09-03 コーア株式会社 Chip type janperchiecka

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007141909A (en) * 2005-11-15 2007-06-07 Matsushita Electric Ind Co Ltd Resistor and manufacturing method thereof
JP2007141906A (en) * 2005-11-15 2007-06-07 Matsushita Electric Ind Co Ltd Resistor
JP2007220714A (en) * 2006-02-14 2007-08-30 Matsushita Electric Ind Co Ltd Resistor and manufacturing method thereof

Also Published As

Publication number Publication date
JPS6325469U (en) 1988-02-19

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