JPH04184232A - Semiconductor pressure sensor - Google Patents

Semiconductor pressure sensor

Info

Publication number
JPH04184232A
JPH04184232A JP2312675A JP31267590A JPH04184232A JP H04184232 A JPH04184232 A JP H04184232A JP 2312675 A JP2312675 A JP 2312675A JP 31267590 A JP31267590 A JP 31267590A JP H04184232 A JPH04184232 A JP H04184232A
Authority
JP
Japan
Prior art keywords
pressure sensor
diaphragm
diaphragms
semiconductor pressure
strain gauge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2312675A
Other languages
Japanese (ja)
Inventor
Keiji Nagatsu
永津 啓二
Michihiro Mizuno
水野 倫博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2312675A priority Critical patent/JPH04184232A/en
Publication of JPH04184232A publication Critical patent/JPH04184232A/en
Pending legal-status Critical Current

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  • Measuring Fluid Pressure (AREA)

Abstract

PURPOSE:To obtain a sensor with a high sensitivity by arranging a plurality of diaphragms varied in thickness on one surface of a chip while a strain gauge is provided on the other surface thereof corresponding thereto. CONSTITUTION:Thickness of first and second diaphragms are represented by h1 and h2 and radii of first and second strain gauges 11 and 12 by a1 and a2 and a relationship therebetween is expressed by a1/h1=a2/h2. Then, when a pressure is applied to the diaphragms 13 and 14, they are deformed and an equal voltage is obtained form the strain gauges 11 and 12 per pressure. Thus, output is doubled for each one pressure thereby achieving a higher sensitivity.

Description

【発明の詳細な説明】 [産業上の利用分野コ この発明は、チップの一方の面にダイヤフラムが形成さ
れ、またチップの他方の面にそのダイヤフラムに対応し
てひずみゲージが設けられた半導体圧力センサに関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] This invention relates to a semiconductor pressure sensor in which a diaphragm is formed on one side of a chip and a strain gauge is provided on the other side of the chip in correspondence with the diaphragm. It is related to sensors.

[従来の技術] 第3図は従来の半導体圧力センサのチップの平面図であ
り、図において(1)は断面口字状のチップ、(2)は
チップ(1)の表面に円周上に沿って設けられたひずみ
ゲージ、(3)はチップ(1)の中央部に位置した受圧
部分のダイヤフラムである。
[Prior Art] Fig. 3 is a plan view of a chip of a conventional semiconductor pressure sensor. The strain gauge (3) provided along the chip (1) is a diaphragm that is a pressure receiving part located in the center of the chip (1).

上記の半導体圧力センサにおいては、ダイヤフラム(3
)に圧力が加わると、ダイヤフラム(3)は変形し、そ
の変形に伴せてひずみゲージ(2)の電気抵抗が変化し
、その抵抗変化は電圧として出力される。
In the above semiconductor pressure sensor, the diaphragm (3
), the diaphragm (3) deforms, the electrical resistance of the strain gauge (2) changes along with the deformation, and the change in resistance is output as a voltage.

[発明が解決しようとする課題] 従来の半導体圧力センサは以上のように精成されている
ので、1圧力に対して1出力のみであり、微圧力に対す
る感度が悪いという課題があった。
[Problems to be Solved by the Invention] Since the conventional semiconductor pressure sensor has been refined as described above, it has a problem that it has only one output for one pressure, and has poor sensitivity to minute pressure.

この発明は、かかる課題を解決するためになされたもの
で、従来のものと比較して1圧力に対して複数倍の出力
を得ることができ、感度のよい半導体圧力センサを提供
することを目的とする。
This invention was made in order to solve such problems, and an object of the present invention is to provide a highly sensitive semiconductor pressure sensor that can obtain multiple times more output per pressure than conventional ones. shall be.

[課題を解決するための手段] この発明に係る半導体圧力センサは、チップの一方の面
に厚さの異なる複数個のダイヤフラムを形成し、また前
記チップの他方の面にこれらのダイヤフラムにそれぞれ
対応してひずみゲージを設けたものである。
[Means for Solving the Problems] A semiconductor pressure sensor according to the present invention includes a plurality of diaphragms having different thicknesses formed on one surface of a chip, and a plurality of diaphragms having different thicknesses formed on the other surface of the chip, respectively corresponding to these diaphragms. It is equipped with strain gauges.

[作 用] この発明の半導体圧力センサにおいては、ダイヤフラム
に圧力が加わると、複数のダイヤフラムは変形し、1圧
力に対してひずみゲージからはそれぞれ複数の出力が得
られる。
[Function] In the semiconductor pressure sensor of the present invention, when pressure is applied to the diaphragm, the plurality of diaphragms deform, and a plurality of outputs are obtained from each strain gauge for one pressure.

[実施例] 以下、この発明の実施例を図について説明する。[Example] Embodiments of the present invention will be described below with reference to the drawings.

第1図はこの発明の一実施例を示す平面図、第2図は第
1図の側断面図であり、図において、(10)はチップ
、(11)はチップ(10)の表面に円周上に沿って設
けられた第1のひずみゲージ、(12)は第1のひずみ
ゲージ(11)の内側に円周上に沿って設けられた第2
のひずみゲージ、(13)はチップ(10)の裏面に第
1のひずみゲージ(11)に対応して形成された第1の
ダイヤフラム、(14)はチップ(10)の裏面に第2
のひずみゲージ(12)に対応して形成された第2のダ
イヤフラムである。そして、第1のダイヤフラム(13
)および第2のダイヤフラム(14)の厚さh l、h
 2と、第1のひずみゲージ(11)および第2のひず
みゲージ(12)の半径at、a、との関係は次式で示
される。
FIG. 1 is a plan view showing an embodiment of the present invention, and FIG. 2 is a side sectional view of FIG. A first strain gauge (12) is provided along the circumference, and a second strain gauge (12) is provided along the circumference inside the first strain gauge (11).
(13) is a first diaphragm formed on the back surface of the chip (10) corresponding to the first strain gauge (11), (14) is a second diaphragm formed on the back surface of the chip (10).
This is a second diaphragm formed to correspond to the strain gauge (12). Then, the first diaphragm (13
) and the thickness of the second diaphragm (14) h l, h
2 and the radius at, a of the first strain gauge (11) and the second strain gauge (12) is shown by the following equation.

a、        a2 1h 2 上記のように精成された半導体圧力センサにおいては、
受圧部である第1のダイヤフラム(13)第2のダイヤ
フラム(14)に圧力が加わると、第1のダイヤフラム
(13)、第2のダイヤフラム(14)は変形し、−圧
力に対して、第1のひずみゲージ(11)および第2の
ひずみゲージ(12)からは等しい電圧がそれぞれ得ら
れる、つまり一圧力に対して二つの同じ出力が得られる
ことになり、出力は2倍となり、それだけ感度が向上す
る。
a, a2 1h 2 In the semiconductor pressure sensor refined as above,
When pressure is applied to the first diaphragm (13) and second diaphragm (14), which are pressure receiving parts, the first diaphragm (13) and the second diaphragm (14) deform, and the Equal voltages are obtained from the first strain gauge (11) and the second strain gauge (12), that is, two equal outputs are obtained for one pressure, the output is doubled, and the sensitivity is increased accordingly. will improve.

なお、上記実施例では第1のダイヤフラム(13)、第
2のダイヤフラム(14)を有する半導体圧力センサに
ついて説明したが、3個以上のダイヤフラムを有し、か
つそれに対応したひずみゲージを有していてもよい、そ
の場合にはダイヤフラムの数に対応して半導体圧力セン
サの感度は上昇する。
In addition, in the above embodiment, a semiconductor pressure sensor having a first diaphragm (13) and a second diaphragm (14) has been described, but a semiconductor pressure sensor having three or more diaphragms and a corresponding strain gauge may also be used. In that case, the sensitivity of the semiconductor pressure sensor increases depending on the number of diaphragms.

[発明の効果] 以上説明したように、この発明の半導体圧力センサによ
れば、チップの一方の面に厚さの異なる複数個のダイヤ
フラムを形成し、またチップの他方の面にこれらのダイ
ヤフラムにそれぞれ対応してひずみゲージを設けたこと
により、−圧力に対して複数倍の出力を得ることができ
、それだけ微圧力に対しても感度が向上するという効果
がある。
[Effects of the Invention] As explained above, according to the semiconductor pressure sensor of the present invention, a plurality of diaphragms with different thicknesses are formed on one surface of the chip, and these diaphragms are formed on the other surface of the chip. By providing strain gauges corresponding to each, it is possible to obtain an output that is several times as large as the negative pressure, which has the effect of improving sensitivity even to minute pressures.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例を示す平面図、第2図は第
1図の側断面図、第3図は従来の半導体圧力センサの一
例を示す平面図、第4図は第3図の側断面図である。 図において、(10)はチップ、(11)は第1のひず
みゲージ、(12)は第2のひずみゲージ、(13)は
第1のダイヤフラム、(14)は第2のダイヤフラムで
ある。 なお、各口中、同一符号は同一または相当部分を示す。
FIG. 1 is a plan view showing an embodiment of the present invention, FIG. 2 is a side sectional view of FIG. 1, FIG. 3 is a plan view showing an example of a conventional semiconductor pressure sensor, and FIG. FIG. In the figure, (10) is a chip, (11) is a first strain gauge, (12) is a second strain gauge, (13) is a first diaphragm, and (14) is a second diaphragm. Note that the same reference numerals in each mouth indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] チップの一方の面に厚さの異なる複数個のダイヤフラム
を形成し、また前記チップの他方の面にこれらのダイヤ
フラムにそれぞれ対応してひずみゲージを設けたことを
特徴とする半導体圧力センサ。
1. A semiconductor pressure sensor comprising: a plurality of diaphragms having different thicknesses formed on one surface of a chip; and strain gauges provided on the other surface of the chip, corresponding to each of the diaphragms.
JP2312675A 1990-11-20 1990-11-20 Semiconductor pressure sensor Pending JPH04184232A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2312675A JPH04184232A (en) 1990-11-20 1990-11-20 Semiconductor pressure sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2312675A JPH04184232A (en) 1990-11-20 1990-11-20 Semiconductor pressure sensor

Publications (1)

Publication Number Publication Date
JPH04184232A true JPH04184232A (en) 1992-07-01

Family

ID=18032071

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2312675A Pending JPH04184232A (en) 1990-11-20 1990-11-20 Semiconductor pressure sensor

Country Status (1)

Country Link
JP (1) JPH04184232A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5160577A (en) * 1974-11-25 1976-05-26 Tokyo Shibaura Electric Co
JPH02256278A (en) * 1987-04-10 1990-10-17 Mitsubishi Electric Corp Semiconductor pressure sensor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5160577A (en) * 1974-11-25 1976-05-26 Tokyo Shibaura Electric Co
JPH02256278A (en) * 1987-04-10 1990-10-17 Mitsubishi Electric Corp Semiconductor pressure sensor

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