JPH04231809A - 機械におけるデジタル式測長系を較正するための方法と　　　　　　　　　　　装置 - Google Patents

機械におけるデジタル式測長系を較正するための方法と　　　　　　　　　　　装置

Info

Publication number
JPH04231809A
JPH04231809A JP14058691A JP14058691A JPH04231809A JP H04231809 A JPH04231809 A JP H04231809A JP 14058691 A JP14058691 A JP 14058691A JP 14058691 A JP14058691 A JP 14058691A JP H04231809 A JPH04231809 A JP H04231809A
Authority
JP
Japan
Prior art keywords
length
reference body
scale
mark
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14058691A
Other languages
English (en)
Japanese (ja)
Inventor
Hans-Joachim Freitag
ハンス　イアヒム　フライターク
Gerd Schuchardt
ゲルト　シュカルツ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
Carl Zeiss Jena GmbH
Original Assignee
Jenoptik Jena GmbH
VEB Carl Zeiss Jena GmbH
Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jenoptik Jena GmbH, VEB Carl Zeiss Jena GmbH, Carl Zeiss Jena GmbH filed Critical Jenoptik Jena GmbH
Publication of JPH04231809A publication Critical patent/JPH04231809A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP14058691A 1990-05-18 1991-05-18 機械におけるデジタル式測長系を較正するための方法と　　　　　　　　　　　装置 Pending JPH04231809A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE01B/3407922 1990-05-18
DD34079290A DD294558A5 (de) 1990-05-18 1990-05-18 Verfahren und anordnung zum kalibrieren eines digitalen laengenmesssystems

Publications (1)

Publication Number Publication Date
JPH04231809A true JPH04231809A (ja) 1992-08-20

Family

ID=5618579

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14058691A Pending JPH04231809A (ja) 1990-05-18 1991-05-18 機械におけるデジタル式測長系を較正するための方法と　　　　　　　　　　　装置

Country Status (6)

Country Link
JP (1) JPH04231809A (de)
AT (1) AT400270B (de)
CH (1) CH683030A5 (de)
DD (1) DD294558A5 (de)
DE (1) DE4113856C3 (de)
ES (1) ES2036444B1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4421372C2 (de) * 1994-06-18 1997-11-20 Bundesrep Deutschland Kalibriergerät
DE19922363A1 (de) * 1999-05-14 2000-11-23 Rexroth Star Gmbh Einrichtung zur Ermittlung der Relativposition zweier relativ zueinander beweglicher Körper und Verfahren zur Herstellung einer solchen Einrichtung
DE10233155A1 (de) * 2002-07-22 2004-02-12 Abb Patent Gmbh Verfahren zur Korrektur systematischer Geometriefehler in einem Drehwinkelmessgerät

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2518745C3 (de) * 1975-04-26 1979-06-21 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Fehlerkompensation in Positioniersystemen
DE3319600A1 (de) * 1983-05-30 1984-12-06 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Laengenmesseinrichtung
DD222106A1 (de) * 1983-08-30 1985-05-08 Zeiss Jena Veb Carl Laengenmesseinrichtung
DE3601945A1 (de) * 1986-01-23 1987-07-30 Heidenhain Gmbh Dr Johannes Laengenmesseinrichtung

Also Published As

Publication number Publication date
ES2036444B1 (es) 1994-01-16
ATA97591A (de) 1995-03-15
DD294558A5 (de) 1991-10-02
AT400270B (de) 1995-11-27
DE4113856C3 (de) 2000-02-10
DE4113856C2 (de) 1997-11-20
CH683030A5 (de) 1993-12-31
DE4113856A1 (de) 1991-11-21
ES2036444A1 (es) 1993-05-16

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