JPH0425774A - Inspecting device for sliding resistor - Google Patents

Inspecting device for sliding resistor

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Publication number
JPH0425774A
JPH0425774A JP2130611A JP13061190A JPH0425774A JP H0425774 A JPH0425774 A JP H0425774A JP 2130611 A JP2130611 A JP 2130611A JP 13061190 A JP13061190 A JP 13061190A JP H0425774 A JPH0425774 A JP H0425774A
Authority
JP
Japan
Prior art keywords
resistor
sliding
terminal
sliding resistor
resistors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2130611A
Other languages
Japanese (ja)
Inventor
Koji Kobuchi
小渕 幸二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2130611A priority Critical patent/JPH0425774A/en
Publication of JPH0425774A publication Critical patent/JPH0425774A/en
Pending legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To enable an inspection for defective slide contact easily for everyone by comparing electric potentials at the connecting point of 1st, 2nd resistors and at the slide terminal of a sliding resistor, holding the comparison results, and displaying them. CONSTITUTION:To a fixed terminal 4 of the sliding resistor 1 to be inspected, the 1st, 2nd resistors 13, 14 connected in series are connected, and also a 3rd resistor 15 is connected to the slide terminal 5. Then, the potentials at the connecting point of resistors 13, 14 and at the terminal 5 are compared in a comparator circuit 16, and the output signals are held by a self-holding circuit 17 then displayed by a display circuits 19, 20. Thus, an accurate and cost-saving inspection with high workability, in which high skillfulness and concentrating ability are not requested, is performed in the work for deciding normal/defective articles.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、摺動抵抗器の摺動接触不良を検査する摺動
抵抗器検査装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a sliding resistor testing device for testing sliding contact failure of a sliding resistor.

〔従来の技術〕[Conventional technology]

第2図は従来の摺動抵抗器検査装置を示すブロック図で
ある。図において、1は検査が行われる摺動抵抗器であ
り、2はその摺動子である。3および4はこの摺動抵抗
器1の固定端子であり、5はその摺動端子である。6は
摺動抵抗器1の固定端子の一方、例えば固定端子3が接
続される正電源端子であり、7はこの正電源端子6との
間に図示を省略した電源装置が接続される負電源端子で
ある。8はこの負電源端子7と、摺動抵抗器1の固定端
子の他方、例えば固定端子4との間に接続された固定抵
抗器である。9は摺動抵抗器1の摺動子2より負電源端
子7へ流れる電流を観察するためのシンクロスコープで
あり、10はその表示画面である。
FIG. 2 is a block diagram showing a conventional sliding resistor testing device. In the figure, 1 is a sliding resistor to be tested, and 2 is its slider. 3 and 4 are fixed terminals of this sliding resistor 1, and 5 is its sliding terminal. 6 is a positive power supply terminal to which one of the fixed terminals of the sliding resistor 1, for example, the fixed terminal 3, is connected, and 7 is a negative power supply to which a power supply device (not shown) is connected between this positive power supply terminal 6. It is a terminal. Reference numeral 8 denotes a fixed resistor connected between this negative power supply terminal 7 and the other fixed terminal of the sliding resistor 1, for example, the fixed terminal 4. 9 is a synchroscope for observing the current flowing from the slider 2 of the sliding resistor 1 to the negative power supply terminal 7, and 10 is its display screen.

次に動作について説明する。正電源端子6と負電源端子
7との間に電源装置を接続して所定の電圧を印加すると
、摺動抵抗器1から固定抵抗器8に電流1.が流れ、摺
動抵抗器1の摺動子2からはシンクロスコープ9に電流
1.が分流する。シンクロスコープ9はその電流I、の
値の変化を表示画面10上に表示する。ここで、第3図
はシンクロスコープ9の表示画面10の表示例を示す説
明図であり、図中、11は電流■2の変化を示す表示波
形、12はその摺動接触不良による表示波形11の乱れ
をそれぞれ示している。
Next, the operation will be explained. When a power supply device is connected between the positive power supply terminal 6 and the negative power supply terminal 7 and a predetermined voltage is applied, a current of 1. flows from the slider 2 of the sliding resistor 1 to the synchroscope 9. is divided. The synchroscope 9 displays the change in the value of the current I on the display screen 10. Here, FIG. 3 is an explanatory diagram showing a display example of the display screen 10 of the synchroscope 9. In the figure, 11 is a display waveform showing a change in the current 2, and 12 is a display waveform 11 due to a sliding contact failure. Each shows the disturbance.

即ち、摺動抵抗器1の摺動子2を固定端子3から固定端
子4に向けて漸次移動させてゆくと、摺動子2より分流
される電流12は滑らかに減少してゆく。従って、シン
クロスコープ9の表示画面10上の表示波形11は、実
線で示すように摺動子2の移動に伴う抵抗値の変化に従
って減少してゆく。ここで、摺動子2の移動中に接触不
良が発生すると、摺動子2にて分流される電流I2は瞬
時遮断される。従って、シンクロスコープ9の表示画面
10上の表示波形11には、摺動子2の摺動接触不良に
よる急激な変動が生じて、破線で示すような波形の乱れ
12が瞬間的に発生する。
That is, as the slider 2 of the sliding resistor 1 is gradually moved from the fixed terminal 3 toward the fixed terminal 4, the current 12 shunted by the slider 2 decreases smoothly. Therefore, the displayed waveform 11 on the display screen 10 of the synchroscope 9 decreases as the resistance value changes as the slider 2 moves, as shown by the solid line. Here, if a contact failure occurs while the slider 2 is moving, the current I2 shunted by the slider 2 is instantaneously interrupted. Therefore, the displayed waveform 11 on the display screen 10 of the synchroscope 9 undergoes sudden fluctuations due to poor sliding contact of the slider 2, and waveform disturbances 12 as shown by broken lines occur instantaneously.

作業者はこのシンクロスコープ9の表示画面10に表示
される表示波形11を観察して、波形の乱れ12を確認
するとその摺動抵抗器1を不良品と判定する。
When the operator observes the displayed waveform 11 displayed on the display screen 10 of the synchroscope 9 and confirms the disturbance 12 in the waveform, the operator determines that the sliding resistor 1 is defective.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来の摺動抵抗器検査装置は以上のように構成されてい
るので、シンクロスコープ9の表示画面10に表示され
る波形の乱れ12は瞬間的なものであり、その波形の乱
れ12の発生を監視して摺動抵抗器1の良品/不良品の
判定を行わなければならず、その判定作業には高度な熟
練性が要求され、また、その作業には極めて高い集中力
が必要となるなどの課題があった。
Since the conventional sliding resistor testing device is configured as described above, the waveform disturbance 12 displayed on the display screen 10 of the synchroscope 9 is instantaneous, and the occurrence of the waveform disturbance 12 can be prevented. It is necessary to monitor and determine whether the sliding resistor 1 is a good product or a defective product, and this determination work requires a high level of skill and extremely high concentration. There was a problem.

この発明は上記のような課題を解消するためになされた
もので、良品/不良品の判定作業に高度な熟練性と集中
力が要求されることはなく、誰にでも容易に摺動抵抗器
の摺動接触不良の検査ができる摺動抵抗器検査装置を得
ることを目的とする。
This invention was made in order to solve the above-mentioned problems, and does not require a high degree of skill and concentration to judge whether a good product or a defective product. The object of the present invention is to provide a sliding resistor testing device that can test for sliding contact defects.

C課題を解決するための手段〕 この発明に係る摺動抵抗器検査装置は、検査が行われる
摺動抵抗器の固定端子の一方に、直列接続された第1の
抵抗器と第3の抵抗器とを接続するとともに、摺動端子
に第3の抵抗器を接続し、第1および第2の抵抗器の接
続点と摺動抵抗器の摺動端子との電位を比較する比較回
路、比較回路の出力信号を保持する自己保持回路、およ
び自己保持回路の出力信号を表示する表示器を設けたも
のである。
Means for Solving Problem C] The sliding resistor testing device according to the present invention includes a first resistor and a third resistor connected in series to one of the fixed terminals of the sliding resistor to be tested. A comparator circuit that connects a third resistor to a sliding terminal and compares the potential between the connection point of the first and second resistors and the sliding terminal of the sliding resistor. It is equipped with a self-holding circuit that holds the output signal of the circuit, and a display that displays the output signal of the self-holding circuit.

〔作 用〕[For production]

この発明における摺動抵抗器検査装置は、比較回路によ
って、検査が行われる摺動抵抗器の固定端子の一方に接
続された第1の抵抗器と第2の抵抗器の接続点の電位と
、第3の抵抗器が接続された摺動抵抗器の摺動端子との
電位を比較し、比較結果を自己保持回路にて保持して表
示器に表示することにより、良品/不良品の判定作業に
高度な熟練性と集中力が要求されることのない摺動抵抗
器検査装置を実現する。
The sliding resistor testing device according to the present invention uses a comparison circuit to detect a potential at a connection point between a first resistor and a second resistor connected to one of the fixed terminals of the sliding resistor to be tested; By comparing the potential with the sliding terminal of the sliding resistor to which the third resistor is connected, and holding the comparison result in a self-holding circuit and displaying it on the display, it is possible to determine whether the product is good or defective. To realize a sliding resistor inspection device that does not require a high degree of skill and concentration.

〔実施例〕〔Example〕

以下、この発明の一実施例を図について説明する。第1
図において、1は摺動抵抗器、2は摺動子、3,4は固
定端子、5は摺動端子、6は正電源端子、7は負電源端
子であり、第2図に同一符号を付した従来のそれらと同
一、あるいは相当部分であるため詳細な説明は省略する
An embodiment of the present invention will be described below with reference to the drawings. 1st
In the figure, 1 is a sliding resistor, 2 is a slider, 3 and 4 are fixed terminals, 5 is a sliding terminal, 6 is a positive power terminal, and 7 is a negative power terminal. The detailed explanation will be omitted since it is the same as or corresponds to the conventional parts mentioned above.

また、I3および14は互いに直列に接続されて、前記
摺動抵抗器Iの固定端子の一方、例えば固定端子4と前
記負電源端子7との間に接続された、第1の抵抗器およ
び第2の抵抗器としての固定抵抗器である。15は前記
摺動抵抗器1の摺動端子5と負電源端子7との間に接続
された第3の抵抗器としての固定抵抗器である。
Moreover, I3 and 14 are connected in series with each other, and are connected between one of the fixed terminals of the sliding resistor I, for example, the fixed terminal 4, and the negative power supply terminal 7. This is a fixed resistor as the second resistor. Reference numeral 15 denotes a fixed resistor as a third resistor connected between the sliding terminal 5 of the sliding resistor 1 and the negative power supply terminal 7.

16は直列接続された固定抵抗器13と14の接続点の
電位と、摺動抵抗器1の摺動端子5の電位とを比較する
、差動アンプ等による比較回路であり、17は比較回路
16の出力信号を保持するフリップフロップ等による自
己保持回路、18はこの自己保持回路17をリセットす
るためのリセットスイッチである。19はこの自己保持
回路17の出力信号に従って、前記摺動抵抗器1が良品
の間点灯している表示器としての発光ダイオードであり
、20は自己保持回路エフの出力信号に従って摺動抵抗
器1の不良が検出されると点灯する、表示器としての発
光ダイオードである。
Reference numeral 16 indicates a comparison circuit using a differential amplifier or the like, which compares the potential at the connection point of the fixed resistors 13 and 14 connected in series with the potential at the sliding terminal 5 of the sliding resistor 1, and 17 indicates a comparison circuit. 16 is a self-holding circuit such as a flip-flop that holds the output signal; 18 is a reset switch for resetting this self-holding circuit 17; 19 is a light emitting diode as an indicator that lights up while the sliding resistor 1 is in good condition according to the output signal of the self-holding circuit 17; 20 is a light emitting diode that lights up the sliding resistor 1 according to the output signal of the self-holding circuit F; This is a light emitting diode as an indicator that lights up when a defect is detected.

次に動作について説明する。正電源端子6と負電源端子
7との間に電源装置を接続して所定の電圧を印加すると
、従来の場合と同様に摺動抵抗器1から固定抵抗器13
.14に電流1.が流れ、摺動抵抗器1の摺動子2より
固定抵抗器15に電流I2が分流する。比較回路16は
、この電流■2による固定抵抗器15における電圧降下
、即ち、摺動抵抗器1の摺動端子5の電位aと、電流I
による固定抵抗器14における電圧降下、即ち、固定抵
抗器13と14との接続点の電位すとを比較する。
Next, the operation will be explained. When a power supply device is connected between the positive power supply terminal 6 and the negative power supply terminal 7 and a predetermined voltage is applied, the sliding resistor 1 to the fixed resistor 13 are connected as in the conventional case.
.. 14 to the current 1. flows, and a current I2 is shunted from the slider 2 of the sliding resistor 1 to the fixed resistor 15. The comparison circuit 16 compares the voltage drop across the fixed resistor 15 due to this current (2), that is, the potential a of the sliding terminal 5 of the sliding resistor 1, and the current I
The voltage drop across the fixed resistor 14, that is, the potential at the connection point between the fixed resistors 13 and 14 is compared.

その結果、比較回路16は電位aが0ボルトにならなけ
れば、その出力信号Cを所定の極性に維持し、電位aが
Oボルトになると出力信号Cを反転させる。即ち、検査
される摺動抵抗器1が良品で、摺動子2を移動させても
摺動接触不良が発生しなければ電流I2は常に正常に流
れるため、電位aがOボルトになることはない。しかし
ながら、摺動接触不良が発生すると当該電流I2が瞬断
され、その間電位aは0ポルトとなる。従って、比較回
路16は摺動抵抗器1に摺動接触不良が発生した時に、
その出力信号Cを瞬間的に反転させる。
As a result, the comparison circuit 16 maintains its output signal C at a predetermined polarity unless the potential a becomes 0 volts, and inverts the output signal C when the potential a becomes O volts. That is, if the sliding resistor 1 to be inspected is a good product and no sliding contact failure occurs even when the slider 2 is moved, the current I2 will always flow normally, so the potential a will never reach O volts. do not have. However, when a sliding contact failure occurs, the current I2 is momentarily cut off, and the potential a becomes 0 port during that time. Therefore, when a sliding contact failure occurs in the sliding resistor 1, the comparison circuit 16
The output signal C is instantaneously inverted.

ここで、自己保持回路17はリセットスイッチ18が閉
成されるとリセット状態に遷移して、出力信号eをハイ
レベル、出力信号fをローレベルにする。このようなリ
セット状態において比較回路16の出力信号Cが反転す
ると自己保持回路17はセット状態に遷移し、出力信号
eがローレベル、出力信号fがハイレベルとなって以後
その状態を維持する。従って、自己保持回路17は、摺
動抵抗器1に摺動接触不良が発生しなければリセット状
態に維持して出力信号fをローレベルとし、途中で摺動
接触不良が発生すればセット状態を変化して出力信号e
をローレベルとする。
Here, when the reset switch 18 is closed, the self-holding circuit 17 transitions to a reset state, and sets the output signal e to a high level and the output signal f to a low level. In such a reset state, when the output signal C of the comparator circuit 16 is inverted, the self-holding circuit 17 transitions to a set state, the output signal e becomes low level, the output signal f becomes high level, and this state is maintained thereafter. Therefore, if a sliding contact failure does not occur in the sliding resistor 1, the self-holding circuit 17 maintains the reset state and sets the output signal f to a low level, and if a sliding contact failure occurs midway through, the self-holding circuit 17 returns to the set state. Changes and output signal e
is set to low level.

発光ダイオード19は出力信号fがローレベルになると
発光して、摺動抵抗器lの正常性を表示し、発光ダイオ
ード20は出力信号eがローレベルになると発光して、
摺動抵抗器1に摺動接触不良が発生したことを表示する
。この発光ダイオード20は自己保持回路17の作用に
よって、摺動抵抗器1の摺動接触不良が解消した後も発
光を継続する。
The light emitting diode 19 emits light when the output signal f becomes low level to indicate the normality of the sliding resistor l, and the light emitting diode 20 emits light when the output signal e becomes low level.
It is displayed that a sliding contact failure has occurred in the sliding resistor 1. Due to the action of the self-holding circuit 17, the light emitting diode 20 continues to emit light even after the sliding contact failure of the sliding resistor 1 is resolved.

作業者はこの発光ダイオード19.20の発光を観察し
て、摺動子2が固定端子3から4へ移動するまで発光ダ
イオード19が発光していればその摺動抵抗器1を良品
と判定し、途中から発光ダイオード20が発光すればそ
れを不良品とする。
The operator observes the light emission from the light emitting diodes 19 and 20, and if the light emitting diode 19 emits light until the slider 2 moves from the fixed terminal 3 to the fixed terminal 4, the operator determines that the sliding resistor 1 is a good product. , if the light emitting diode 20 emits light in the middle, it is determined to be a defective product.

不良品を検出した場合、次の摺動抵抗器1の検査に入る
前にリセットスイッチ18を閉成して自己保持回路17
をリセットする。
If a defective product is detected, the reset switch 18 is closed and the self-holding circuit 17 is activated before inspecting the next sliding resistor 1.
Reset.

なお、上記実施例では、第1〜第3の抵抗器として固定
抵抗器を用いたものを示したが、可変型の抵抗器を用い
てもよく、それらの抵抗値の組み合わせを調整すること
によって、あらゆる抵抗値の摺動抵抗器の検査が可能な
摺動抵抗値検査装置を得ることができる。
In the above embodiment, fixed resistors were used as the first to third resistors, but variable resistors may also be used, and by adjusting the combination of their resistance values. , it is possible to obtain a sliding resistance value testing device capable of testing sliding resistors of any resistance value.

また、上記実施例では、表示器として発光ダイオードを
用いた場合について説明したが、ランプ等の他の可視表
示手段を用いても、さらにはブザー等の可聴表示手段を
用いてもよく、上記実施例と同様の効果を奏する。
Further, in the above embodiments, a light emitting diode was used as the indicator, but other visible display means such as a lamp or even an audible display means such as a buzzer may be used. It has the same effect as the example.

〔発明の効果〕〔Effect of the invention〕

以上のようにこの発明によれば、第1および第2の抵抗
器の接続点と、摺動抵抗器の摺動端子との電位を比較し
、比較結果を保持して表示器に表示するように構成した
ので、良品/不良品の判定作業に高度な熟練性、さらに
は高い集中力などが要求されることはなく、また、シン
クロスコープのような高価な機器も必要とせず、作業性
がよく、高精度で安価な摺動抵抗器検査装置が得られる
効果がある。
As described above, according to the present invention, the potentials between the connection point of the first and second resistors and the sliding terminal of the sliding resistor are compared, and the comparison result is held and displayed on the display. Because of this structure, the work of determining good/defective products does not require a high level of skill or concentration, and does not require expensive equipment such as a synchroscope, making the work easier. This has the advantage of providing a highly accurate and inexpensive sliding resistor testing device.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例による摺動抵抗器検査装置
を示すブロック図、第2図は従来の摺動抵抗器検査装置
を示すブロック図、第3図はそのシンクロスコープの表
示画面の表示例を示す説明図である。 1は摺動抵抗器、2は摺動子、3,4は固定端子、5は
摺動端子、13は第1の抵抗器(固定抵抗器)、14は
第2の抵抗器(固定抵抗器)、15は第3の抵抗器(固
定抵抗器)、16は比較回路、 17は自己保持回路、 19゜ 20は表示器 (発光ダイオード) なお、 図中、 同一符号は同一、 又は相当部分を 示す。
FIG. 1 is a block diagram showing a sliding resistor testing device according to an embodiment of the present invention, FIG. 2 is a block diagram showing a conventional sliding resistor testing device, and FIG. 3 is a block diagram showing the display screen of the synchroscope. It is an explanatory diagram showing a display example. 1 is a sliding resistor, 2 is a slider, 3 and 4 are fixed terminals, 5 is a sliding terminal, 13 is a first resistor (fixed resistor), 14 is a second resistor (fixed resistor) ), 15 is the third resistor (fixed resistor), 16 is the comparator circuit, 17 is the self-holding circuit, 19゜20 is the indicator (light emitting diode) In addition, in the diagram, the same reference numerals refer to the same or equivalent parts. show.

Claims (1)

【特許請求の範囲】[Claims] 互いに直列に接続されて、検査が行われる摺動抵抗器の
固定端子の一方に接続された第1の抵抗器および第2の
抵抗器と、前記摺動抵抗器の摺動端子に接続された第3
の抵抗器と、前記第1の抵抗器と第2の抵抗器の接続点
の電位と前記摺動抵抗器の摺動端子の電位とを比較する
比較回路と、前記比較回路の出力信号を保持する自己保
持回路と、前記自己保持回路の出力信号を表示する表示
器とを備えた摺動抵抗器検査装置。
A first resistor and a second resistor are connected in series with each other and are connected to one of the fixed terminals of the sliding resistor to be tested, and a second resistor is connected to the sliding terminal of the sliding resistor. Third
a resistor, a comparison circuit that compares a potential at a connection point of the first resistor and the second resistor with a potential at a sliding terminal of the sliding resistor, and holds an output signal of the comparison circuit. 1. A sliding resistor testing device comprising: a self-holding circuit; and a display displaying an output signal of the self-holding circuit.
JP2130611A 1990-05-21 1990-05-21 Inspecting device for sliding resistor Pending JPH0425774A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2130611A JPH0425774A (en) 1990-05-21 1990-05-21 Inspecting device for sliding resistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2130611A JPH0425774A (en) 1990-05-21 1990-05-21 Inspecting device for sliding resistor

Publications (1)

Publication Number Publication Date
JPH0425774A true JPH0425774A (en) 1992-01-29

Family

ID=15038360

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2130611A Pending JPH0425774A (en) 1990-05-21 1990-05-21 Inspecting device for sliding resistor

Country Status (1)

Country Link
JP (1) JPH0425774A (en)

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