JPH0437164U - - Google Patents

Info

Publication number
JPH0437164U
JPH0437164U JP1990078203U JP7820390U JPH0437164U JP H0437164 U JPH0437164 U JP H0437164U JP 1990078203 U JP1990078203 U JP 1990078203U JP 7820390 U JP7820390 U JP 7820390U JP H0437164 U JPH0437164 U JP H0437164U
Authority
JP
Japan
Prior art keywords
scan
pixel
twill
starting point
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1990078203U
Other languages
English (en)
Other versions
JP2521090Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990078203U priority Critical patent/JP2521090Y2/ja
Priority to US07/732,103 priority patent/US5224172A/en
Priority to ITRM910557A priority patent/IT1249818B/it
Publication of JPH0437164U publication Critical patent/JPH0437164U/ja
Application granted granted Critical
Publication of JP2521090Y2 publication Critical patent/JP2521090Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8896—Circuits specially adapted for system specific signal conditioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/102—Video camera
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Quality & Reliability (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Filamentary Materials, Packages, And Safety Devices Therefor (AREA)
  • Spinning Or Twisting Of Yarns (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Winding Filamentary Materials (AREA)
  • Warehouses Or Storage Devices (AREA)

Description

【図面の簡単な説明】
第１図は本考案の一実施例を示す概略斜視図、
第２図は本考案における検出回路のブロツク図、
第３図は本考案における検索を説明する図、第４
図は本考案において二値化された画像情報を示す
要部拡大図、第５図はパツケージの綾落ち糸とＣ
ＣＤ画像で検出される画像の関係を示す図、第６
図は先願の考案を示す斜視図である。 図中、１４はパツケージの端面、１５は綾落ち
糸、２０は光源、２３はＣＣＤカメラ、２５は二
値化回路、２７は検索回路である。

Claims (1)

  1. 【実用新案登録請求の範囲】 パツケージを回転させると共にその端面に光を
    照射し、その端面をＣＣＤカメラで撮影して綾落
    ち糸を検査する綾落ち検査装置において、ＣＣＤ
    カメラの各走査ごと、画像情報を画素毎に二値化
    する二値化回路と、その二値化されたデータを記
    憶する記憶回路と、二値化された画像情報より各
    走査毎の各画素の「１」，「０」を検出し、一の
    走査ｙにおける画素の配列方向ｘで「０」から「
    １」となる点を起点Ｆ，ｘ，ｙとしてこれより数
    画素「１」の有無を検出すると共に「０」を検出
    したとき、その位置ｘ１を基準に、次の走査ｙ＋
    １のｘ方向の起点を Ｆｘ１−１，ｙ＋１としてこれより数画素「１
    」の有無を検出し、以下各走査ごと順次起点を代
    えて円弧状の綾落ち糸を検出する検索回路とを備
    えたことを特徴とする綾落ち検査装置。
JP1990078203U 1990-07-25 1990-07-25 綾落ち検査装置 Expired - Lifetime JP2521090Y2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP1990078203U JP2521090Y2 (ja) 1990-07-25 1990-07-25 綾落ち検査装置
US07/732,103 US5224172A (en) 1990-07-25 1991-07-18 Cobwebbing detection device
ITRM910557A IT1249818B (it) 1990-07-25 1991-07-23 Dispositivo di rivelazione di posizione sfalsata di un filo in una rocca

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990078203U JP2521090Y2 (ja) 1990-07-25 1990-07-25 綾落ち検査装置

Publications (2)

Publication Number Publication Date
JPH0437164U true JPH0437164U (ja) 1992-03-27
JP2521090Y2 JP2521090Y2 (ja) 1996-12-25

Family

ID=13655466

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990078203U Expired - Lifetime JP2521090Y2 (ja) 1990-07-25 1990-07-25 綾落ち検査装置

Country Status (3)

Country Link
US (1) US5224172A (ja)
JP (1) JP2521090Y2 (ja)
IT (1) IT1249818B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07128256A (ja) * 1993-11-09 1995-05-19 Murata Mach Ltd パッケージの綾落ち糸検出方法

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH686779A5 (de) * 1993-10-29 1996-06-28 Luwa Ag Zellweger Vorrichtung zur Ueberpruefung der Wickelqualitaet von Garnspulen und Verwendung der Vorrichtung an einer Spul- oder Spinnmaschine.
TW299035U (en) * 1994-07-11 1997-02-21 Barmag Barmer Maschf Co Ltd Method of optically measuring the surface of yarn packages
DE19836071A1 (de) * 1998-08-10 2000-02-17 Schlafhorst & Co W Verfahren zur Erkennung von Fadenresten auf Spinnkopshülsen
US6633383B1 (en) * 1999-10-25 2003-10-14 Linetech Industries, Inc. Method and apparatus for the automated inspection of yarn packages
WO2002042753A1 (en) * 2000-11-27 2002-05-30 Jensen Denmark A/S An apparatus and a method of inspecting pieces of cloth
US7004421B2 (en) * 2002-05-28 2006-02-28 Fuji Photo Film Co., Ltd. Inspection device of winding appearance of tape and improvement processing method for the same
US20140103190A1 (en) * 2012-10-12 2014-04-17 Samsung Electronics Co., Ltd. Binary image sensor and image sensing method
US9679929B2 (en) 2012-10-12 2017-06-13 Samsung Electronics Co., Ltd. Binary image sensors including quantum dots and unit pixels thereof
JP6253490B2 (ja) * 2014-04-14 2017-12-27 三菱電機株式会社 巻線検査方法および巻線検査装置
ITPO20150002A1 (it) * 2015-02-06 2016-08-06 Ecafil Best Spa Ind Filati Sistema e metodo di controllo e programmazione della produzione di un gomitolo
JP2023032530A (ja) * 2021-08-27 2023-03-09 村田機械株式会社 搬送システム
CN113882075A (zh) * 2021-10-09 2022-01-04 安徽启颜服饰有限公司 一种服装加工针织机纱线调整监控机构及使用方法
CN114549442B (zh) * 2022-02-14 2022-09-20 常州市新创智能科技有限公司 一种运动物体的实时监测方法、装置、设备及存储介质

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63272753A (ja) * 1987-04-27 1988-11-10 Asahi Chem Ind Co Ltd チ−ズ製品端面の糸落ち欠点検出装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2528198B1 (fr) * 1982-06-04 1987-08-07 Centre Nat Rech Scient Systeme de saisie de donnees inscrites sur un support
JPS62170726A (ja) * 1986-01-23 1987-07-27 Mazda Motor Corp 圧力波過給機
JP3014097B2 (ja) * 1987-02-20 2000-02-28 株式会社日立製作所 輪郭追跡方法及びシステム
US4792981A (en) * 1987-09-21 1988-12-20 Am International, Inc. Manipulation of run-length encoded images
JP2688361B2 (ja) * 1988-08-02 1997-12-10 正己 山川 光電センサ
US5077806A (en) * 1989-06-01 1991-12-31 Accuron Corporation Machine vision analysis apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63272753A (ja) * 1987-04-27 1988-11-10 Asahi Chem Ind Co Ltd チ−ズ製品端面の糸落ち欠点検出装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07128256A (ja) * 1993-11-09 1995-05-19 Murata Mach Ltd パッケージの綾落ち糸検出方法

Also Published As

Publication number Publication date
US5224172A (en) 1993-06-29
ITRM910557A0 (it) 1991-07-23
IT1249818B (it) 1995-03-28
JP2521090Y2 (ja) 1996-12-25
ITRM910557A1 (it) 1993-01-23

Similar Documents

Publication Publication Date Title
JPH0437164U (ja)
JPH04220551A (ja) 透明物体の欠陥検査方法とその装置
JP2597370B2 (ja) シート状被検材の有意差検出方法
JP3332208B2 (ja) 網入りガラスの欠陥検出方法および装置
JPH0752161B2 (ja) 透明容器内の粉末中異物の検査装置
JP2005241304A (ja) 外観検査方法
JP2861338B2 (ja) 光学式検査装置
JPH09161056A (ja) 円形容器内面検査方法
JPH043820B2 (ja)
JPH08186808A (ja) 画像処理方法及びその装置
JPS6312987A (ja) 移動物体の検知方法
JPS63292386A (ja) 移動物体計数装置
JPS5920805A (ja) 立体物の形状検査装置
JPH05189598A (ja) ナンバプレート情報読取装置
JPS6027064B2 (ja) ラベルの表裏検査装置
JPH10302107A (ja) 円形物の画像読取装置
JPH0124561Y2 (ja)
JPH0429021B2 (ja)
JPH02187651A (ja) 画像処理方法
JP2019066316A (ja) 検査装置、検査方法、および、検査装置用のプログラム
JP3473800B2 (ja) 欠点検査方法及び装置
JPH06105170B2 (ja) 外観検査機
JPH1091721A (ja) コンテナ番号読取り装置
JP2513528Y2 (ja) 濃淡画像処理装置
JPH0425043A (ja) Ｉｃリード曲り検査装置

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term