JPH0437896A - Monitor image inspection device - Google Patents

Monitor image inspection device

Info

Publication number
JPH0437896A
JPH0437896A JP2144497A JP14449790A JPH0437896A JP H0437896 A JPH0437896 A JP H0437896A JP 2144497 A JP2144497 A JP 2144497A JP 14449790 A JP14449790 A JP 14449790A JP H0437896 A JPH0437896 A JP H0437896A
Authority
JP
Japan
Prior art keywords
display
monitor
screen
inspection device
image inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2144497A
Other languages
Japanese (ja)
Inventor
Munehiro Oshiro
大城 宗宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Avionics Co Ltd
Original Assignee
Nippon Avionics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Avionics Co Ltd filed Critical Nippon Avionics Co Ltd
Priority to JP2144497A priority Critical patent/JPH0437896A/en
Publication of JPH0437896A publication Critical patent/JPH0437896A/en
Pending legal-status Critical Current

Links

Landscapes

  • Closed-Circuit Television Systems (AREA)
  • Controls And Circuits For Display Device (AREA)

Abstract

PURPOSE:To enable an inexperienced person also to execute accurate inspection reducing measuring dispersion by picking up the image of a surface by a CCD camera and measuring the events of a display image based upon the image pickup data. CONSTITUTION:After connecting the CCD camera 3 to a monitor equipment 2 and setting up the image pickup enabled state of a screen, a keyboard 8 is operated to display a menu screen on a display device 6. Then, automatic measurement is started based upon a command from the keyboard 8 and a testing command is outputted from an arithmetic unit 5 to the monitor equipment 2. At the time of starting automatic measurement, a pattern is displayed on a monitor screen. When data are matched with a rated value as the result of inspection, the result is printed out by a printer 7.

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は、モニタ画面上における表示図形の諸元を測
定するモニタ画像検査装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a monitor image inspection device that measures the specifications of displayed figures on a monitor screen.

[従来の技術] 例えばオシロスコープのように、モニタ画面上に表示さ
れた図形に基づいて各種の測定を行う装置が従来から用
いられている。この装置は製造時点で表示図形に関する
各種諸元、例えば所定の図形を表示したときの寸法、表
示位置等が所定の規格に適合しているか否かを調整、検
査するものである。この検査は従来、ノギス等の測定装
置を画面に当てることによって、表示像の寸法等を直接
測定していた。
[Prior Art] Devices such as oscilloscopes that perform various measurements based on figures displayed on a monitor screen have been used in the past. This device adjusts and inspects at the time of manufacture whether various specifications related to a display figure, such as dimensions and display position when a predetermined figure is displayed, conform to predetermined standards. Conventionally, this inspection has been performed by directly measuring the dimensions of the displayed image by applying a measuring device such as a caliper to the screen.

[発明が解決しようとする課題] しかしながらこのような従来の方法は熟練を要し測定効
率が悪いばかりでなく、読取誤差も発生し易いという課
題があった。
[Problems to be Solved by the Invention] However, such conventional methods not only require skill and have poor measurement efficiency, but also have the problem that reading errors are likely to occur.

[RMを解決するための手段] このような課題を解決するためにこの発明は、表示面を
CCDセンサによって撮像し、その撮像データを基に表
示画像の諸元を測定するようにしたものである。
[Means for Solving RM] In order to solve these problems, the present invention captures an image of the display surface using a CCD sensor, and measures the specifications of the displayed image based on the captured data. be.

[作用コ 表示面の情報がCCDセンサに取り込まれ、電気信号と
して出力されるので、その信号の座標、輝度階調等から
所定の測定が行われる。
[Operation] Information on the display surface is captured by the CCD sensor and output as an electrical signal, so predetermined measurements are performed from the coordinates, brightness gradation, etc. of the signal.

[実施例コ 第1図はこの発明の一実施例を示すブロック図である0
図において、1はテストパターン発生器、2は被試験装
置であるモニタ装置、3はそのモニタ装置3の画面を撮
像するCCDカメラ、4は画像処理装置、5は演算装置
、6は表示器、7はプリンタ、8はキーボードである。
Embodiment FIG. 1 is a block diagram showing an embodiment of the present invention.
In the figure, 1 is a test pattern generator, 2 is a monitor device that is the device under test, 3 is a CCD camera that images the screen of the monitor device 3, 4 is an image processing device, 5 is a calculation device, 6 is a display device, 7 is a printer, and 8 is a keyboard.

このように構成された装置は第2図のステップ100に
示すように、モニタ装W2にCCDカメラを取り付は画
面の撮像が可能な状態にした後、キーボード8を操作し
て表示器6にメニュー画面を表示させる。
As shown in step 100 in FIG. 2, the apparatus configured in this way is configured to attach a CCD camera to the monitor W2 and make it possible to take an image of the screen, and then operate the keyboard 8 to display the display 6. Display the menu screen.

そして、キーボード8の指示によってステップ102に
示すように自動計測を開始するとともに、ステップ10
3に示すように演算装置5からモニタ装置2へ試験用の
コマンドを出力する。なお、ステップ102において自
動計測を開始するとき、モニタ画面には計測項目によっ
て第3図または第4図に示すパターンが表示される。
Then, according to instructions from the keyboard 8, automatic measurement is started as shown in step 102, and step 10
3, a test command is output from the arithmetic device 5 to the monitor device 2. Note that when automatic measurement is started in step 102, a pattern shown in FIG. 3 or 4 is displayed on the monitor screen depending on the measurement item.

次にステップ104において検査結果によってデータが
規格値に適合していればステップ105に示すようにそ
の結果をプリンタフにプリントアウトして処理を終了す
る。しかし、ステップ104で検査結果が規格外である
と判断されると、ステップ107に示すように調整モー
ド検査が行われ再度ステップ102以降の検査を繰り返
す。
Next, in step 104, if the data conforms to the standard value according to the inspection result, the result is printed out on a printer as shown in step 105, and the process is terminated. However, if it is determined in step 104 that the test result is out of specification, an adjustment mode test is performed as shown in step 107, and the tests from step 102 onwards are repeated again.

第3図は輝度測定以外の検査を行う場合にモニタ装置2
の画面に表示される画面である。但し、A〜Hの文字は
説明の都合上付した記号であり、管面上には表示されな
い、また、各点の座標は画像処理装W4によって求めら
れる。
Figure 3 shows the monitor device 2 when performing inspections other than brightness measurement.
This is the screen displayed on the screen. However, the letters A to H are symbols added for convenience of explanation and are not displayed on the tube surface, and the coordinates of each point are determined by the image processing device W4.

(4)傾きの測定 第3図のA点の座標を(XI、Yl)、B点の座標を(
χ2.Y2)とすると演算装W5で第1式の演算を行う
ことによって求められる。
(4) Measurement of inclination The coordinates of point A in Figure 3 are (XI, Yl), and the coordinates of point B are (
χ2. Y2), it is obtained by calculating the first equation using the arithmetic unit W5.

(ロ)横長寸法の測定 画像処理装置4かち得られた信号を基に演算装置5で0
点とD点間のドツト数を数え、第2式の演算を行うこと
によって求められる。
(b) Measurement of horizontal dimension Based on the signal obtained from the image processing device 4, the arithmetic device 5
It is obtained by counting the number of dots between the point and point D and calculating the second equation.

横長寸法=a(ドツト)×に1・・−・・・ ■但し、
K1は横方向の分解能定数でありミリ/ド・ントの単位
を有している。
Horizontal dimension = a (dot) x 1... ■However,
K1 is a resolution constant in the lateral direction and has units of millimeters/dots.

(ハ)縦長寸法の測定 画像処理装置4から得られた信号を基に演算装置5でE
点とF点間のドツト数を数え、第3式の演算を行うこと
によって求められる。
(c) Measurement of vertical dimension Based on the signal obtained from the image processing device 4, the arithmetic device 5
It is obtained by counting the number of dots between the point and F point and calculating the third equation.

縦長寸法=b(ドツト)×に2・・・・・・・・・[3
)但し、K2は縦方向の分解能定数でありミリ/ド”y
 )の単位を有している。
Vertical dimension = b (dot) × 2・・・・・・・・・[3
) However, K2 is the resolution constant in the vertical direction, and is expressed in mm/d”y.
) has units.

(ニ)横位置の測定 0点のX座標をX3とし、横位置原点データをHLとす
ると(2)式の演算を行うことにより求められる。
(d) Measurement of lateral position Let X3 be the X coordinate of the 0 point, and let HL be the lateral position origin data, then it can be found by calculating equation (2).

横位置=X1−HL・・・・・・・・・・・・・・・・
・・・・・・・・(4)(ホ)縦位置の測定 E点のY座標をY7とし、縦位置原点データをVとする
と+51式の演算を行うことにより求められる。
Horizontal position = X1-HL・・・・・・・・・・・・・・・
(4) (e) Vertical position measurement If the Y coordinate of point E is Y7 and the vertical position origin data is V, it can be obtained by calculating the +51 formula.

横位置=X7−V・・・・・・・・・・・・・・・・・
・・・・・・・(9(へ)横リニアリティの測定 第5図に示すように横中央ラインである線分CD上の隣
接する交点の幅をH1〜H6、横リニアリティをH17
、交点の幅H1〜H6の平均値をHAV、幅H1〜H6
の代表値をHとすると代表値Hは第16)式あるいは第
(7)式によって、横リニアリティH11,は第8式の
演算を行うことによって求められる。
Horizontal position = X7-V・・・・・・・・・・・・・・・
(9) Measurement of lateral linearity As shown in Figure 5, the width of the adjacent intersections on the line segment CD, which is the lateral center line, is H1 to H6, and the lateral linearity is H17.
, the average value of the widths H1 to H6 of the intersection is HAV, and the width H1 to H6
Assuming that the representative value of is H, the representative value H is obtained by the 16th equation or the 7th equation, and the lateral linearity H11 is obtained by calculating the 8th equation.

HIIIAX−HAV≧HAV−HMINのときH=H
,AX・・・・・・・・・(6)kAx−HAv<HA
v−に+ NのときH=Hyn<・=−・・・−CHI
Av (ト)縦リニアリティの測定 第6図に示すように縦中央ラインである線分EF上の隣
接する交点の幅をV1〜■6、縦リニアリティをV目ヨ
、交点の輻V1〜V6の平均値をVAv、幅■1〜■6
の代表値をVとすると代表値Hは第(9)式あるいは第
(1(1式によって、槓すニアリティ■目カは第(11
)式の演算を行うことによって求められる。
H=H when HIIIAX-HAV≧HAV-HMIN
,AX・・・・・・(6)kAx−HAv<HA
When +N to v-, H=Hyn<・=-...-CHI
Av (g) Measurement of vertical linearity As shown in Figure 6, the width of adjacent intersections on line segment EF, which is the vertical center line, is V1 to ■6, the vertical linearity is V, and the convergence of the intersections is V1 to V6. Average value is VAv, width ■1 to ■6
Let V be the representative value of
) is obtained by calculating the formula.

Vmxx−VAv≧VAv−V+ I N(71ときv
=vlllA×・−・−・・・・・(9)VmAx−V
Av<VAv−Vm I N(’)ときv=v、1.4
・・・・・・・・・(10)■^V (チ〉焦点測定 CCDカメラに取り込み画像処理装置4で得られた信号
の縦線幅平均値を演算装W5で計算してその値を焦点測
定値とする。
Vmxx-VAv≧VAv-V+ I N (71 when v
=vlllA×・−・−・・・・・・・(9)VmAx−V
When Av<VAv-Vm I N('), v=v, 1.4
・・・・・・・・・(10) ■^V (H) Calculate the average value of the vertical line width of the signal taken into the focus measurement CCD camera and obtained by the image processing device 4 using the arithmetic unit W5, and calculate the value. Focus measurement value.

(す)直角度 A点、B点、G点、H点の座標とその隣り合う2点の座
標から作られる角度を三角関数によって求める。
(S) Perpendicularity Find the angle formed from the coordinates of points A, B, G, and H and the coordinates of their two adjacent points using trigonometric functions.

(ヌ〉輝度 モニタ装置2に第4図に示す市松模様状の白黒パターン
を表示させ、各々の白エリア、黒エリアの映像レベル平
均値を求める。映像信号は階調によって変化するので、
実際にはその階調に対応した映像信号の平均値を求める
ことになる。
(N) Display the checkered black and white pattern shown in Fig. 4 on the brightness monitor device 2, and calculate the average video level of each white area and black area.Since the video signal changes depending on the gradation,
Actually, the average value of the video signal corresponding to that gradation is calculated.

[発明の効果] 以上説明したようにこの発明はモニタ画面上の上方をC
CDカメラによって取り込み、その得られた信号に対し
て測定項目に対応する所定の演算を行うことによって、
従来は手作業で検査していた項目を電気的に行うことが
できるので、熟練をしないものでも正確で測定ばらつき
の少ない検査が行えるという効果を有する。
[Effect of the invention] As explained above, this invention allows the upper part of the monitor screen to be
By capturing the signal with a CD camera and performing predetermined calculations corresponding to the measurement item on the obtained signal,
Items that were conventionally inspected manually can now be electrically inspected, so even unskilled personnel can perform inspections accurately and with little variation in measurement.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例を示すブロック図、第2図
はその動作を示すフローチャート、第3図は輝度側定時
以外のときにモニタ画面上に表示される画像、第4図は
輝度測定時にモニタ画面上に表示される画像、第5図は
横リニアリティ測定時の状態を説明するための、第6図
は縦リニアリティ測定時の状態を説明するための図であ
る。 1・・・・テストパターン発生器、2・・・・モニタ装
置、3・・・・CCDカメラ、4・・・画像処理装置、
5・・ ・演算装置、6・・・・表示器、7・・・・プ
リンタ、8・・・・キーボード。
Fig. 1 is a block diagram showing an embodiment of the present invention, Fig. 2 is a flowchart showing its operation, Fig. 3 is an image displayed on the monitor screen when the brightness side is not set, and Fig. 4 is a diagram showing the brightness. Images displayed on the monitor screen during measurement, FIG. 5 is a diagram for explaining the state when measuring horizontal linearity, and FIG. 6 is a diagram for explaining the state when measuring longitudinal linearity. 1... Test pattern generator, 2... Monitor device, 3... CCD camera, 4... Image processing device,
5... Arithmetic unit, 6... Display, 7... Printer, 8... Keyboard.

Claims (6)

【特許請求の範囲】[Claims] (1)モニタ画像上の離れた部分に2つのスポットを表
示させ、その表示画面をCCDセンサによって検出し、
2点間の画素数を計算し、その計算結果から2点間の長
さを求めるモニタ画像検査装置。
(1) Display two spots on separate parts of the monitor image, and detect the display screen with a CCD sensor,
A monitor image inspection device that calculates the number of pixels between two points and determines the length between the two points from the calculation result.
(2)モニタ画面上のシステム設定値で決まる位置に縦
線を表示させ、その縦線上の任意の位置にスポットを表
示させ、その表示画面をCCDセンサによって検出し、
スポットを座標と基準座標とのずれ量から横位置ずれを
求めるモニタ画像検査装置。
(2) Display a vertical line at a position determined by the system settings on the monitor screen, display a spot at any position on the vertical line, and detect the display screen with a CCD sensor,
A monitor image inspection device that calculates the lateral positional deviation of a spot from the amount of deviation between its coordinates and the reference coordinates.
(3)モニタ画面上のシステム設定値で決まる位置に横
線を表示させ、その横線上の任意の位置にスポットを表
示させ、その表示画面をにCCDセンサによって検出し
、スポットを座標と基準座標とのずれ量から縦位置ずれ
を求めるモニタ画像検査装置。
(3) Display a horizontal line at a position determined by the system settings on the monitor screen, display a spot at any position on the horizontal line, detect the display screen with a CCD sensor, and set the spot to coordinates and reference coordinates. A monitor image inspection device that determines vertical position deviation from the amount of deviation.
(4)モニタ画面上の縦方向および横方向に複数の線を
表示したものをCCDセンサによって検出し、検出結果
のうち任意の縦線に着目し、その縦線と交わる全ての横
線との交点の交点間の長さおよび、任意の横線に着目し
、その横線と交わる全ての縦線との交点の交点間の長さ
を求め、それぞれの平均値をリニアリティとして測定す
るモニタ画像検査装置。
(4) Detect multiple lines displayed vertically and horizontally on the monitor screen using a CCD sensor, focus on any vertical line among the detection results, and find the intersections with all horizontal lines that intersect with that vertical line. A monitor image inspection device that focuses on an arbitrary horizontal line and determines the length between the intersections of all vertical lines that intersect with that horizontal line, and measures the average value of each as linearity.
(5)モニタ画面上の縦方向および横方向に複数の線を
表示したものをCCDセンサによって検出し、少なくと
も最も外側の線が交差する部分の座標とその隣り合う2
点の座標から作られる角度を求め、直角度を測定するモ
ニタ画像検査装置。
(5) A CCD sensor detects multiple lines displayed vertically and horizontally on a monitor screen, and determines the coordinates of at least the intersection of the outermost lines and its adjacent 2 lines.
A monitor image inspection device that determines the angle created from the coordinates of a point and measures the squareness.
(6)モニタ画面上に市松模様状の白黒パターンを表示
させ、その画面をCCDセンサによって撮像したとき得
られる画像信号の階調を検出して輝度および明るさを測
定するモニタ画像検査装置。
(6) A monitor image inspection device that measures luminance and brightness by displaying a checkered black and white pattern on a monitor screen and detecting the gradation of an image signal obtained when the screen is imaged by a CCD sensor.
JP2144497A 1990-06-04 1990-06-04 Monitor image inspection device Pending JPH0437896A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2144497A JPH0437896A (en) 1990-06-04 1990-06-04 Monitor image inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2144497A JPH0437896A (en) 1990-06-04 1990-06-04 Monitor image inspection device

Publications (1)

Publication Number Publication Date
JPH0437896A true JPH0437896A (en) 1992-02-07

Family

ID=15363729

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2144497A Pending JPH0437896A (en) 1990-06-04 1990-06-04 Monitor image inspection device

Country Status (1)

Country Link
JP (1) JPH0437896A (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54142937A (en) * 1978-04-28 1979-11-07 Hitachi Ltd Falut diagnosis system for display unit
JPS594383A (en) * 1982-06-30 1984-01-11 Fujitsu Ltd System for checking quality of crt screen
JPS5987379A (en) * 1982-09-30 1984-05-19 ザ・ベンデイツクス・コ−ポレ−シヨン Device for testing circuit in device
JPS6016088A (en) * 1983-07-06 1985-01-26 Fujitsu Ltd Check device of crt display picture
JPS6053987A (en) * 1983-09-05 1985-03-28 富士通株式会社 Display test system
JPS6083080A (en) * 1983-10-13 1985-05-11 富士通株式会社 Frame detection for crt screen quality inspection

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54142937A (en) * 1978-04-28 1979-11-07 Hitachi Ltd Falut diagnosis system for display unit
JPS594383A (en) * 1982-06-30 1984-01-11 Fujitsu Ltd System for checking quality of crt screen
JPS5987379A (en) * 1982-09-30 1984-05-19 ザ・ベンデイツクス・コ−ポレ−シヨン Device for testing circuit in device
JPS6016088A (en) * 1983-07-06 1985-01-26 Fujitsu Ltd Check device of crt display picture
JPS6053987A (en) * 1983-09-05 1985-03-28 富士通株式会社 Display test system
JPS6083080A (en) * 1983-10-13 1985-05-11 富士通株式会社 Frame detection for crt screen quality inspection

Similar Documents

Publication Publication Date Title
JP3343444B2 (en) LCD panel image quality inspection apparatus and LCD image presampling method
US6621928B1 (en) Image edge detection method, inspection system, and recording medium
CN103927749A (en) Image processing method and device and automatic optical detector
CN110324596A (en) Clarity detection method and detection device
KR101426487B1 (en) Apparatus for inspecting of display panel and method thereof
KR102688199B1 (en) Imaging apparatus and driving method of the same
JP2003167530A (en) Display screen inspection method and display screen inspection device
JPH0875542A (en) Method for measuring light quantity of display pixel and method and apparatus for inspecting display screen
JPH09196637A (en) Bending angle measuring method for long materials
JP2003510568A (en) LCD inspection method and LCD inspection apparatus by pattern comparison
CN112858331A (en) VR screen detection method and detection system
JPH0437896A (en) Monitor image inspection device
CN112261394A (en) Method, device, system and computer storage medium for measuring deflection rate of galvanometer
CN1673708A (en) Lens optical analysis measuring system
JP4401126B2 (en) Method for registering predetermined part of dimension measuring device
CN119649389B (en) An automatic waveform effect detection method and device
KR970012877A (en) Cathode ray tube screen inspection adjusting device and method
JP3495570B2 (en) Tone characteristic measuring device
JPS586426B2 (en) Television screen automatic measurement device
JP4719348B2 (en) Small dimension measurement method
JP2001153615A (en) Image data distortion correction method and video type extensometer
TWI229749B (en) Lens MTF measurement system
KR100274994B1 (en) Focus inspection device of C R T and its inspection method
JPS63128215A (en) Detecting method for inclination of camera optical axis
CN118505675A (en) Surface defect detection method and system thereof