JPS6083080A - Frame detection for crt screen quality inspection - Google Patents
Frame detection for crt screen quality inspectionInfo
- Publication number
- JPS6083080A JPS6083080A JP58191613A JP19161383A JPS6083080A JP S6083080 A JPS6083080 A JP S6083080A JP 58191613 A JP58191613 A JP 58191613A JP 19161383 A JP19161383 A JP 19161383A JP S6083080 A JPS6083080 A JP S6083080A
- Authority
- JP
- Japan
- Prior art keywords
- frame
- screen
- display device
- determination
- test pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Controls And Circuits For Display Device (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
(,11)発明の技術分野
本発明はCRT (陰極線表示管)の表示画面が表示装
置の表示枠に対して相対的に正しい位置関係で、しかも
歪な(表示しているかどうかを自動的に検査するCR7
画面品質検査方式に係り、特に該両面品質検査の基準と
なる前記表示枠を照明系のむらや影の影響を受けること
なく検出することを可能とするCRTii!j1面品質
検査の枠検出方法に関する。Detailed Description of the Invention (,11) Technical Field of the Invention The present invention provides a method for displaying a display screen of a CRT (cathode ray display tube) in a correct positional relationship relative to a display frame of a display device, and without distortion (display). CR7 automatically checks whether
CRTii! relates to a screen quality inspection method, and in particular makes it possible to detect the display frame, which serves as a reference for the double-sided quality inspection, without being affected by unevenness or shadows in the illumination system. The present invention relates to a frame detection method for one-sided quality inspection.
(b)従来技術と問題点
ワードプロセンサをはじめとしてCRTを使用した各種
データ処理装置に用いる表示装置では、CRTに表示さ
れる画面が表示装置の表示枠に対して相対的に正しい位
置関係で表示されないときは、画面の品質は著しく低下
するものとなる。(b) Prior art and problems In the display devices used in various data processing devices using CRTs, including word processing sensors, the screen displayed on the CRT does not have the correct positional relationship relative to the display frame of the display device. When it is not displayed, the quality of the screen is significantly degraded.
例えば第1図に示す如き情報処理装置用の表示装置1で
は、オペレータは表示枠4を基準にして画面が止しい位
置にあるか否かを判断するので、CRT2に表示される
画面3は、表示枠4に対して一ヒ下左右に片寄ったり、
傾いたすせず、目、つ画面3に歪が無いことが必要であ
る。家庭用テレビジョンでは画面の多少のずれや歪は利
用者にそれはと品質の低下を(・すしさせないが、情(
・u処理用表示装置では、画面のずれ、領き、歪は表示
されたグラフや文字、記号を変形させるので著しく画面
品質を低下させることになる。このような画面のずれ、
傾き、歪の検査はCRT2が表示装置1に取(=Jけら
れた後行われるが、従来、専ら検査員か目視で行ってい
た上記検査を特11昭57−1.13566、CR′V
l!!!1面品質検査方式により、人手によらず自動的
に行うことが提案されている。このCRT画面品質検査
方式の概要は第1図の表示装置1の機種が決まると枠4
及び画面3の寸法が決まるので、テレビカメラ等の観測
装置により表示画面を観測して、前記枠4と両面3の寸
法より相対的に定まる各種の判定量を測定し、表示装置
lの機種に応して一義的に規定される各判定量の基準量
により表示画面の良否を判定している。この判定量と基
準量とを用いることは、表示装置1と観測装置との距離
や領き等に影響されないようにするためである。この判
定量を測定するには基準となる枠4の検出が重要であり
、特願昭57−113566ではCRT2 ニは何も表
示−Uず、且つCRT2の画面に照明光を投射すること
なく枠4を照らずような照明を行っ゛ζ枠部分の観測を
行うよう提案している。これは表示装置1の筐体部分5
のうち塗装色等のコン1−ラストのとれた直線部分6を
観測して、その寸法を測定することが必要なためである
。CRT2の管面や枠4は通常賄い色であり、筐体部分
5は明るい色で枠4と筐体部分5との境界を示す直線部
分6は検出し易い構成となっている。しかし実際にはこ
の枠部分の観δ(11は必ずしもコンミ−ラストよく安
定には行えぬことが多い。それは照明のむらや照明方向
によっては影が出来たり照明の反射がCRT 2の管面
から起こる、枠4の判定量を測定する観測線上に明るい
色の表示がある等のためである。For example, in a display device 1 for an information processing device as shown in FIG. It may be shifted one step lower or to the left or right with respect to display frame 4,
It is necessary that the screen 3 is not tilted or distorted. In home televisions, slight shifts or distortions on the screen may cause the user to notice a drop in quality, but it may cause some discomfort.
- In a u-processing display device, screen shifts, edges, and distortions deform displayed graphs, characters, and symbols, resulting in a significant deterioration of screen quality. This kind of screen shift,
Inspection of tilt and distortion is carried out after the CRT 2 is mounted on the display device 1. Conventionally, the above inspection was carried out only by inspectors or by visual observation.
l! ! ! It has been proposed that the one-sided quality inspection method be used to automatically perform the inspection without manual intervention. The outline of this CRT screen quality inspection method is as shown in Figure 1.
Since the dimensions of the screen 3 are determined, the display screen is observed with an observation device such as a television camera, and various determination amounts determined relative to the dimensions of the frame 4 and both sides 3 are measured, and the model of the display device 1 is determined. Accordingly, the quality of the display screen is determined based on a uniquely defined reference amount for each determination amount. The purpose of using the determination amount and the reference amount is to avoid being influenced by the distance, distance, etc. between the display device 1 and the observation device. In order to measure this determination amount, it is important to detect frame 4 as a reference, and in Japanese Patent Application No. 57-113566, the CRT 2 can be used without displaying anything and without projecting illumination light onto the screen of the CRT 2. It is proposed to use lighting that does not illuminate the area 4 and observe the area in the ζ frame. This is the housing part 5 of the display device 1.
This is because it is necessary to observe the straight line portion 6 with contrast in paint color, etc., and measure its dimensions. The tube surface and frame 4 of the CRT 2 are usually of a dark color, the housing portion 5 is a bright color, and the straight line portion 6 indicating the boundary between the frame 4 and the housing portion 5 is configured to be easy to detect. However, in reality, the view of this frame part δ (11) is often not always consistent and stable.Depending on the unevenness of the illumination and the direction of the illumination, shadows may be formed or reflections of the illumination may occur from the surface of the CRT 2. This is because a bright color is displayed on the observation line for measuring the determination amount in frame 4.
第2図は枠4の検出を説明する図である。同図[a)の
表示装置1のA−A’ で示す線上で枠4と筐体部分5
との境界線6を検出する場合、特願昭57−11356
6では同図(C1で示す如き濃淡信号が得られるように
説明されている。この場合枠4と筐体部分5との境界を
示す濃淡信号波形から枠4と筐体部分5との境界位置4
Rと4 Lとは明U(fflに検出し得る。従ってXで
示す範囲を測定することで枠寸法が検出出来る。しかし
同図(c+の波形は理想的な状態で得られるものであり
、実際は前記の如き種々の原因で同図(blで示す如(
枠4と筐体部分5との境界を示す波形の検出を困)li
f′にする波形が現れる。特に枠4に7で示す如き明る
い色の記号等があると7゛で示す如き波形が現れ枠4と
筐体部分5との境界検出を誤ることとなるという欠点が
ある。FIG. 2 is a diagram illustrating detection of frame 4. The frame 4 and the casing portion 5 are located on the line indicated by A-A' of the display device 1 in FIG.
When detecting the boundary line 6 with
6, it is explained that a gray level signal as shown in the same figure (C1) is obtained. In this case, the boundary position between the frame 4 and the housing part 5 is determined from the gray signal waveform indicating the boundary between the frame 4 and the housing part 5. 4
R and 4L can be detected clearly in U (ffl). Therefore, the frame size can be detected by measuring the range indicated by In reality, due to various reasons as mentioned above, the same figure (as shown in bl)
It is difficult to detect the waveform indicating the boundary between the frame 4 and the housing part 5)
A waveform of f′ appears. In particular, if there is a brightly colored symbol such as 7 in the frame 4, a waveform such as 7'' will appear, resulting in an error in detecting the boundary between the frame 4 and the housing portion 5.
(C)発明の目的
本発明の目的は上記欠点を除くため、枠4と筐体部分5
との境界を表す直線部分6を或範囲測定し、直線部分6
と平行な方向に複数画素分の画像の濃淡値を加勢するこ
とにより、枠4の検出を安定に行えるC Ri”画面品
質検査の枠検出方法を提供するごとにある。(C) Purpose of the Invention The purpose of the present invention is to eliminate the above-mentioned drawbacks by providing a frame 4 and a housing portion 5.
Measure a certain range of the straight line part 6 representing the boundary between the straight line part 6 and
The object of the present invention is to provide a frame detection method for screen quality inspection in which the frame 4 can be detected stably by adding the grayscale values of the image for a plurality of pixels in a direction parallel to the CRi.
(d)発明の構成
本発明の構成はCRT表示装置と、このCRT表示装置
にテストパターンを発生させるテストパターン発生手段
と、前記CRT表示装置に設b)られて画面品質の良否
を判断する基準線を形成する基準部材と、前記テストパ
ターンともI:〆(βi’!++ +Aを観測して基準
線とテストパターン像のデータを出力する観測手段と、
これら基準線とナストパターン像のデータから基準線に
おける相対的間l(i、、%比に占(づき判定量を算出
する手段と、これらの判定量から画面の品質不良の有無
を判定する品質判定手段を有するCR1画面品質検査方
式において、前記判定量を算出する場合の基準となる枠
寸法の校正を行う手段を設けたものである。(d) Structure of the Invention The structure of the present invention includes a CRT display device, a test pattern generating means for generating a test pattern on the CRT display device, and a standard for determining screen quality that is installed in the CRT display device. a reference member forming a line; an observation means for observing both the test pattern I:〆(βi'!++ +A and outputting data of the reference line and the test pattern image;
A means for calculating a determination amount based on the relative interval l(i,,% ratio) on the reference line from the data of the reference line and the Nast pattern image, and a quality determination method for determining the presence or absence of screen quality defects from these determination amounts. In the CR1 screen quality inspection method having a determination means, means is provided for calibrating the frame size which is a reference when calculating the determination amount.
(e)発明の実施例
第3図は本発明の詳細な説明する図である。同図9で示
す矩形領域に含まれる枠4と筐体部分5の境界を示す直
線9°の位置を測定するために第2図で説明したように
直線9゛と直交する方向に走査して、各画素の濃淡変化
から直線9゛の位置を決定する前に、直線9′以外の部
分からの反射(例えば第2図の7で不すようなf81%
分)による影響をさけて、おおまかな直線9′の位置を
める。そのためには矩形領域9の中で直線9°と平行な
方向にまず走査し、尊画素の濃淡値の和をとった値を直
線9゛と直交する方向にならべてみると第3図dで示す
島うなパターン(投影パターンと呼ぶ)が(与られる。(e) Embodiment of the invention FIG. 3 is a diagram for explaining the invention in detail. In order to measure the position of the straight line 9° indicating the boundary between the frame 4 and the housing portion 5 included in the rectangular area shown in FIG. , before determining the position of straight line 9' from the change in density of each pixel, check the reflections from parts other than straight line 9' (for example, f81% as shown in 7 in Figure 2).
9', avoid the influence of 9'. To do this, first scan the rectangular area 9 in a direction parallel to the straight line 9°, and then line up the sum of the gray values of the respective pixels in the direction orthogonal to the straight line 9°. The island pattern shown (called the projection pattern) is (given).
この投影パターンは第2図で説明したような直線9゛と
直交する方向の一ライン分だけの濃淡値ではなく、Yl
からY2までの複数iI!lil素の濃淡値の和である
ため、部分的な反射の影響はうずめられ、連続的な直線
9”が第3図dの如く明瞭に濃淡変化として現れること
となる。しかしこの投影パターンからめた枠位置は、被
測定物である枠部分が傾いていると、正確な位置として
は決定しがたいために、この位置を仮の枠付W3:と定
めておくこととする。そしてその後第2図で説明した如
く直線9゛とは直交する方向に走査して、正fif+i
な直線9゛の位置をめることにするが、その時に、第2
図すのように枠の候補となる位置が数個所(7′で示す
如き位置)出た時に、仮枠位置でめた位が真の枠位置と
して決定される。」−記は矩形部分9の直線9°の位置
決定だけについて説明したが矩形部分8,10.11の
直線部分8’、IO’、II’についても同様である。This projection pattern is not a shading value of only one line in the direction orthogonal to the straight line 9 as explained in Fig. 2, but
Multiple iI from to Y2! Since it is the sum of the shading values of the lil element, the influence of partial reflection is suppressed, and a continuous straight line 9'' appears as a clear change in shading as shown in Figure 3d.However, from this projection pattern, Since it is difficult to determine the exact frame position if the frame part of the object to be measured is tilted, this position is set as a temporary frame W3:.Then, after that, the second As explained in the figure, by scanning in the direction perpendicular to the straight line 9゛,
We will determine the position of the straight line 9゛, but at that time,
As shown in the figure, when several positions (positions as shown by 7') that are candidates for the frame appear, the position that falls between the tentative frame positions is determined as the true frame position. Although only the position determination of the straight line 9° of the rectangular portion 9 has been described, the same applies to the straight line portions 8', IO', and II' of the rectangular portions 8, 10, and 11.
そして直線8゛と9゛より幅Xが10“と11゛により
1uiさYがめられる。Then, from the straight lines 8'' and 9'', the width X is 10'' and 11'', so the width Y is 1ui.
第4図は本発明の一実施例を示す回路のブロック図であ
る。まず制御部20から枠/画面観測切替指示信号を送
出し、照明部50で表示装置1の枠部分を検出出来るよ
うに照明させ、観測位置指示信号を観測部21に送出し
て第3図に示す矩形領域を観測させる。制御部20は仮
走査/実走査切替信号を送出して画像信号りJ替部22
をりjり替えて枠領域格納バッファ23に前記矩形領域
の測定波形を格納する。投影パターン作成回路24は枠
領域格納バッファ23より測定波形を読出し、第3図の
矩形領域8と9についてはY)〜Y2の間の複数の画像
波形を、矩形領域10と11についてはX1〜X2の間
の複数の画像波形を加える。FIG. 4 is a block diagram of a circuit showing one embodiment of the present invention. First, a frame/screen observation switching instruction signal is sent from the control section 20, the illumination section 50 illuminates the frame part of the display device 1 so that it can be detected, and an observation position instruction signal is sent to the observation section 21, as shown in FIG. Observe the rectangular area shown. The control section 20 sends out a temporary scanning/actual scanning switching signal to change the image signal to the J switching section 22.
Then, the measured waveform of the rectangular area is stored in the frame area storage buffer 23. The projection pattern creation circuit 24 reads measurement waveforms from the frame area storage buffer 23, and generates a plurality of image waveforms between Y) and Y2 for rectangular areas 8 and 9 in FIG. 3, and X1 to X1 for rectangular areas 10 and 11. Add multiple image waveforms between X2.
この場合7で示す如き明るい色の記号等があってもその
反射波形7゛は見掛は上域製させられて目立たなくなる
。従って第3図ft11に示1如き波形のrI!lI像
信号が得られる。エツジ検出回路25は該画像信吐より
第3図のX及びYの寸法を検出し、仮の枠位置を決定す
る。該仮枠位置は仮枠位置情報格納部2G!こ格納され
る。制御部20は画像信号切替部22を切り替え観測位
置指示信号により観測部21の観測位;Iグを変更し、
第1図面面3の横方向の中心及び縦方向の中心の各1ラ
イン分の画像信号をラインバッファ27に格納する。エ
ツジ検出回路28はラインバッファ27よりff52図
fb)で示す如き画像信号を読出して、枠寸法を検出し
、枠/ ii!+i面切替部面切全部29エツジ情報格
納部30に格納する。枠情報検出部32は仮枠位置情報
格納部2Gの出力を参照し一ζ枠エツジ情報格納部30
の枠寸法が7゛で示す如き波形により誤った枠寸法を検
出しCいた場合は修正し真の枠寸法を画面位(i−ずれ
検出部34とiI!ji面”づl力検出t++: 35
に送出する。In this case, even if there is a brightly colored symbol as shown by 7, the reflected waveform 7' will appear to be in the upper range and will not be noticeable. Therefore, rI! of the waveform 1 shown in FIG. 3 ft11! An II image signal is obtained. The edge detection circuit 25 detects the X and Y dimensions in FIG. 3 from the image discharge and determines a temporary frame position. The temporary frame position is the temporary frame position information storage section 2G! This is stored. The control unit 20 switches the image signal switching unit 22 and changes the observation position of the observation unit 21 according to the observation position instruction signal,
Image signals for one line each at the horizontal center and the vertical center of the first drawing surface 3 are stored in the line buffer 27. The edge detection circuit 28 reads an image signal as shown in ff52 (fb) from the line buffer 27, detects the frame size, and detects the frame /ii! +i-plane switching section All 29 side-cuts are stored in the edge information storage section 30. The frame information detection unit 32 refers to the output of the temporary frame position information storage unit 2G and detects the 1ζ frame edge information storage unit 30.
If an incorrect frame size is detected by the waveform shown by 7゛, it is corrected and the true frame size is adjusted to the screen position (i-displacement detection unit 34 and iI!ji plane) force detection t++: 35
Send to.
次ぎに照明50を消し、表示装置1のCRT2にテスト
パターンを表示する。観71111部21は該テストパ
ターンから判定量を得るため横方向で中心と画面3のα
111に近い位置の上下各1ラインを走査し、ラインバ
ッファ27、エツジ検出回路28、枠/画面切替部29
を経て格子エツジ情報格納部3]に各ライン毎の格子位
置を格納する。格子情報検出部33は格子間の間隔をめ
て格子間隔検出部36に送る。画面位置すれ検出部34
はテストパターンを走査して得られた前記判定量を左官
1537、中心is+’、 s s、右部39に送出し
て保持さ・已る。画面位置ずれ判定部46は両面の中心
位置のずれ及び画面の傾きの態様を判定して制定表示部
49に送出し判定結果を表示させる。画面寸法検出部3
5も同様にして各判定量を左部40、中心部41、右部
42に送出して保持させる。画1f+iN法歪判定部4
7は垂直振幅歪や水平方向の糸巻挟止の有無を41+1
1定して判定表示部49人出力送り、判定結果を表示さ
せる。格子間隔検出部36は各格子間隔の平均値を夫々
」二部43、中心部44、下部45に送出して保持さ−
せ゛る。直線歪判定部48はこれらの平均値から垂直直
線歪の態様を判定して判定表ボ部49に送出し、判定結
果を表示させる。Next, the illumination 50 is turned off and a test pattern is displayed on the CRT 2 of the display device 1. The view 71111 part 21 is located between the center and α of the screen 3 in the horizontal direction in order to obtain the judgment amount from the test pattern.
The line buffer 27, edge detection circuit 28, frame/screen switching unit 29
Then, the grid position for each line is stored in the grid edge information storage unit 3]. The lattice information detection section 33 determines the spacing between the lattices and sends it to the lattice spacing detection section 36. Screen position shift detection unit 34
The judgment amount obtained by scanning the test pattern is sent to the plasterer 1537, the center is+', ss, and the right part 39, and is held/extracted. The screen position deviation determination unit 46 determines the deviation of the center positions of both sides and the aspect of screen inclination, and causes the establishment display unit 49 to display the sending determination result. Screen size detection section 3
5, similarly, each determination amount is sent to the left portion 40, center portion 41, and right portion 42 and held therein. Image 1f+iN method distortion determination unit 4
7 indicates the presence or absence of vertical amplitude distortion and horizontal pincushion by 41+1
The output of 49 people is sent to the judgment display section at a constant rate, and the judgment results are displayed. The grid spacing detection section 36 sends the average value of each grid spacing to a second section 43, a center section 44, and a lower section 45, where it is held.
I'm selling. The linear distortion determination section 48 determines the mode of vertical linear distortion from these average values and sends it to the determination table board 49 to display the determination results.
次に観測部2jは縦方向で中心と画面;3のm11に近
い位置の左右釜1ラインを走査するが動作ば」二記同様
である。この場合は左部37及び40、右部39及び4
2、上部43、下部45は図示括弧内の名称をとるごと
になる。Next, the observation unit 2j vertically scans the center and one line of the left and right hooks at a position close to m11 of the screen; In this case, left parts 37 and 40, right parts 39 and 4
2. The upper part 43 and the lower part 45 are indicated by the names in parentheses.
([)発明のタノ果
辺土説明した如く、本発明はCRi’両而面品質検査を
自uノ的に行う場合の基準となる枠寸法の検出を、枠イ
」近に設けられた文字やデザイン図形等の明るい色から
の反射や照明系の反射等の影響を除き、確実に行うこと
が出来るため、より確実な品質検査を実施することが出
来る。As explained above, the present invention detects the frame dimensions that serve as a reference when performing CRi' dual quality inspection automatically. Since this can be performed reliably by eliminating the effects of reflections from bright colors such as design figures and reflections from the lighting system, more reliable quality inspection can be performed.
第1図は表示装置の一例を示す図、第2図は枠の検出を
説明する図、第3図は本発明の詳細な説明する図、第4
図は本発明の一実施例を示す回1俗のブロック図である
。
■は表示装置、2ばCRi”、3は画面、4は枠、5ば
筐体部分、21は観測部、22は画像信号切替部、23
は枠領域格納バッファ、24は投影パターン作成回路、
25はエツジ検出回路、26は仮枠位置情報格納部、2
7ばラインバッファ、28はエツジ検出回路、29は枠
/画面切替部、30は枠エツジ情報格納部、31は格子
エツジ情報格納部、32は枠情報検出部、33ば格子情
報検出部、34は画面位置ずれ検出部、35は画面寸法
検出部、36は格子間隔検出部、37,40ば左部、3
8.41.44は中心部、39.42は右部、43ば上
部、45ば下部、46は画面位置ずれ判定部、47は画
面寸法歪判定HUB、48は直線歪判定部、49ば判定
表示部、50ば照明である。
茅1 同
算3 園FIG. 1 is a diagram showing an example of a display device, FIG. 2 is a diagram explaining frame detection, FIG. 3 is a diagram explaining details of the present invention, and FIG.
The figure is a block diagram showing one embodiment of the present invention. 2 is a display device, 2 is a CRi'', 3 is a screen, 4 is a frame, 5 is a housing part, 21 is an observation part, 22 is an image signal switching part, 23
24 is a frame area storage buffer, 24 is a projection pattern creation circuit,
25 is an edge detection circuit, 26 is a temporary frame position information storage unit, 2
7 is a line buffer, 28 is an edge detection circuit, 29 is a frame/screen switching section, 30 is a frame edge information storage section, 31 is a lattice edge information storage section, 32 is a frame information detection section, 33 is a lattice information detection section, 34 35 is a screen size detection unit, 36 is a grid spacing detection unit, 37 and 40 are on the left, 3
8.41.44 is the center part, 39.42 is the right part, 43 is the upper part, 45 is the lower part, 46 is the screen position deviation determination part, 47 is the screen dimension distortion determination HUB, 48 is the linear distortion determination part, 49 is the determination part The display section and 50 are lighting. Kaya 1 Dosun 3 Garden
Claims (1)
ターンを発生させるテストパターン発生手段と、前記C
RT表示装置に設りられて画面品質の良否を判断する基
準線を形成する捕準部材と、前記テストパターンと基準
部材を観測して基準線とナストパターン像のデータを出
力する観測手段と、これら基準線とテストパターン像の
データから基準線における相対的間隔比に基づき判定量
を算出する手段と、これらの判定量から画面の品質不良
の有無を判、定する品質判定手段を有するC RTi8
!!i面品質検査方式において、前記判定量を算出する
場合の基準となる枠寸法の校正を行う手段を設けたこと
を特徴とするCRTllIj1面品5!lj険査の枠検
出方法。c R'r display device, test pattern generating means for generating a test pattern on the CRT display device, and the CRT display device;
a reference member that is installed in the RT display device and forms a reference line for determining whether the screen quality is good or bad; an observation means that observes the test pattern and the reference member and outputs data of the reference line and the Nast pattern image; CRTi8 includes means for calculating a determination amount based on the relative interval ratio of the reference line from the data of the reference line and the test pattern image, and a quality determination means for determining the presence or absence of screen quality defects from these determination amounts.
! ! In the i-side quality inspection method, a CRTllIj 1-side product 5! is characterized in that it is provided with means for calibrating frame dimensions that serve as a reference when calculating the determination amount. lj inspection frame detection method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58191613A JPS6083080A (en) | 1983-10-13 | 1983-10-13 | Frame detection for crt screen quality inspection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58191613A JPS6083080A (en) | 1983-10-13 | 1983-10-13 | Frame detection for crt screen quality inspection |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6083080A true JPS6083080A (en) | 1985-05-11 |
| JPS6365947B2 JPS6365947B2 (en) | 1988-12-19 |
Family
ID=16277543
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58191613A Granted JPS6083080A (en) | 1983-10-13 | 1983-10-13 | Frame detection for crt screen quality inspection |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6083080A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0437896A (en) * | 1990-06-04 | 1992-02-07 | Nippon Avionics Co Ltd | Monitor image inspection device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6420660U (en) * | 1987-07-28 | 1989-02-01 |
-
1983
- 1983-10-13 JP JP58191613A patent/JPS6083080A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0437896A (en) * | 1990-06-04 | 1992-02-07 | Nippon Avionics Co Ltd | Monitor image inspection device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6365947B2 (en) | 1988-12-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7019713B2 (en) | Methods and measurement engine for aligning multi-projector display systems | |
| KR0167843B1 (en) | Image checking system and method of lcd | |
| JP4907725B2 (en) | Calibration device, defect detection device, defect repair device, display panel, display device, calibration method | |
| US8340457B2 (en) | Image analysis method, image analysis program and pixel evaluation system having the sames | |
| CN111754906B (en) | Method for detecting brightness uniformity of curved surface display screen | |
| EP0777173A1 (en) | Calibration of an interactive desktop system | |
| CN110324596A (en) | Clarity detection method and detection device | |
| JP2001324413A (en) | Method and device for measuring mtf | |
| JP2005331929A (en) | Image analysis method, image analysis program, and pixel evaluation system therewith | |
| JPS6083080A (en) | Frame detection for crt screen quality inspection | |
| JPH0875542A (en) | Method for measuring light quantity of display pixel and method and apparatus for inspecting display screen | |
| JP2003167530A (en) | Display screen inspection method and display screen inspection device | |
| JP2009250937A (en) | Pattern inspection device and method | |
| JPH0159798B2 (en) | ||
| JPH10133276A (en) | Image projection device | |
| CN109827759A (en) | Defect detection method and detection device applied to optical module | |
| JP3109392B2 (en) | Image processing device | |
| TW471230B (en) | Picture noise measuring method for picture reader, and recording medium therefor | |
| KR20260002173A (en) | Inspection device, inspection method and computer-readable storage medium | |
| JPH059995B2 (en) | ||
| CN1425253A (en) | Automated convergence in projection display apparatus | |
| JPS586426B2 (en) | Television screen automatic measurement device | |
| JP2510480B2 (en) | Image defect determination device | |
| JPH0736005A (en) | LCD panel inspection device | |
| JPS63115035A (en) | Pattern data inspecting device |