JPH0441666A - Method for manufacturing thin films using laser evaporation method - Google Patents
Method for manufacturing thin films using laser evaporation methodInfo
- Publication number
- JPH0441666A JPH0441666A JP14926090A JP14926090A JPH0441666A JP H0441666 A JPH0441666 A JP H0441666A JP 14926090 A JP14926090 A JP 14926090A JP 14926090 A JP14926090 A JP 14926090A JP H0441666 A JPH0441666 A JP H0441666A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- laser
- thin film
- target
- present
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 title claims description 26
- 238000000034 method Methods 0.000 title claims description 20
- 238000001704 evaporation Methods 0.000 title claims description 8
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 239000000758 substrate Substances 0.000 claims description 36
- 238000007740 vapor deposition Methods 0.000 claims description 9
- 239000010408 film Substances 0.000 description 15
- 238000009826 distribution Methods 0.000 description 7
- 230000008020 evaporation Effects 0.000 description 5
- 238000000151 deposition Methods 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、レーザ蒸着法による薄膜の作製方法に関する
。より詳細にはレーザ蒸着法を用いて高品質な薄膜を作
製する方法に関する。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method for producing a thin film by laser vapor deposition. More specifically, the present invention relates to a method of producing a high-quality thin film using a laser vapor deposition method.
従来の技術
薄膜の作製には、各種の方法が使用されるが、レーザ蒸
着法は、組成の制御がやり易く、成膜速度が速い等の利
点がある。また、−切の電磁場を必要としないので、高
品質の薄膜を作製するのに適した方法と考えられている
。BACKGROUND OF THE INVENTION Various methods are used to produce thin films, but the laser deposition method has advantages such as easy control of composition and fast film formation rate. Furthermore, because it does not require a negative electromagnetic field, it is considered to be a suitable method for producing high-quality thin films.
従来、レーザ蒸着法で薄膜を作製する場合は、内部を高
真空に排気可能で、任意の雰囲気ガスを導入できる成膜
室内に基板およびターゲットを配置し、成膜室外部に配
置したレーザ装置の発するレーザ光を光学手段により誘
導し、ターゲットに照射していた。Conventionally, when producing thin films using laser evaporation, the substrate and target are placed inside a deposition chamber that can be evacuated to a high vacuum and any atmospheric gas can be introduced, and the laser device is placed outside the deposition chamber. The emitted laser light was guided by optical means and irradiated onto the target.
発明が解決しようとする課題
レーザ蒸着法で薄膜を作製する場合には、レーザ光をタ
ーゲットに照射した時に発生するロウツク様の形状をし
たプルームと呼ばれるプラズマ状態の先端部で成膜を行
う。これは、プルームの先端には、酸化された活性な成
膜粒子が多く存在するため、この部分で成膜を行うと特
性の良好な薄膜が得られるためである。Problems to be Solved by the Invention When producing thin films using laser vapor deposition, the film is formed at the tip of a plasma state called a wax-like plume that is generated when a target is irradiated with laser light. This is because there are many oxidized and active film-forming particles at the tip of the plume, and a thin film with good properties can be obtained by forming a film at this part.
一方、一般にレーザ蒸着法では、レーザ光の照射面積は
、装置の制約上有限の大きさであり、レーザ光に照射さ
れるターゲットの面積は、ターゲット全体の面積のごく
一部となる。それに伴い、プルームも小さく、特にプル
ームの先端は、非常に微小であるため、従来、レーザ蒸
着法で作製可能な薄膜の面積は非常に小さく、また、通
常の大きさの薄膜を作製すると膜厚の分布が大きくかつ
膜質の分布も顕著であった。On the other hand, in general, in the laser vapor deposition method, the area irradiated with the laser beam is limited in size due to limitations of the apparatus, and the area of the target irradiated with the laser beam is a small portion of the area of the entire target. As a result, the plume is also small, especially the tip of the plume, which is extremely small. The distribution of membrane quality was large and the distribution of membrane quality was also remarkable.
そこで本発明の目的は、レーザ蒸着法の短所である小面
積不均一成膜の問題を解決し、レーザ蒸着法で、膜厚お
よび膜質分布の少ない通常以上の面積の薄膜を作製する
方法を提供することにある。Therefore, the purpose of the present invention is to solve the problem of non-uniform film formation in a small area, which is a disadvantage of laser evaporation, and to provide a method for producing a thin film with a larger area than usual, with a small distribution of film thickness and film quality, using laser evaporation. It's about doing.
課題を解決するための手段
本発明に従うと、ターゲットにパルスレーザ光を照射し
て、前記ターゲットに対向して配置した基板上に薄膜を
堆積させて形成するレーザ蒸着法により薄膜を作製する
方法において、基板表面の乱数により決定した位置に主
に薄膜が堆積するよう前記基板をパルスレーザ光の照射
と同期して変位させて蒸着を行うことを特徴とする薄膜
の作製方法が提供される。Means for Solving the Problems According to the present invention, a method for producing a thin film by a laser evaporation method in which a target is irradiated with pulsed laser light and a thin film is deposited on a substrate placed opposite to the target is provided. There is provided a method for producing a thin film, characterized in that vapor deposition is performed by displacing the substrate in synchronization with irradiation with pulsed laser light so that the thin film is mainly deposited at positions determined by random numbers on the surface of the substrate.
k浬
本発明の方法は、成膜室内の基板上の乱数により決定し
た位置に薄膜が主に堆積するよう基板を変位させ、蒸着
を行うところにその主要な特徴がある。この基板の変位
は、パルスレーザ光の照射に同期させて行う。The main feature of the method of the present invention is that vapor deposition is performed by displacing the substrate so that the thin film is mainly deposited at positions determined by random numbers on the substrate in the film forming chamber. This displacement of the substrate is performed in synchronization with the irradiation of pulsed laser light.
レーザ蒸着法では、ターゲットのレーザ光が照射された
位置の上側にプルームといわれる活性な成膜粒子の集ま
りであるプラズマが発生する。このプルームが接する位
置に基板を配置すると、基板のプルームの先端近傍に主
に薄膜が堆積する。In the laser vapor deposition method, plasma, which is a collection of active film-forming particles called a plume, is generated above the position of the target that is irradiated with laser light. When a substrate is placed in a position where this plume contacts, a thin film is mainly deposited on the substrate near the tip of the plume.
従って、本発明の方法では、大きい面積の均一な薄膜を
成膜することが可能になる。Therefore, with the method of the present invention, it is possible to form a uniform thin film over a large area.
本発明の方法では、上記の基板のプルームの先端に接す
べき位置を乱数により決定し、その位置にプルームが当
たるよう基板を移動する。具体的には、基板の表面を格
子状に分割し、各部に番号を付けて、乱数発生器等によ
り乱数を発生させてプルームが当たる位置を決める。本
発明の方法では、プルームが当たる位置を特定の順に移
動するのではなく、乱数により無作為に移動するのでよ
り均質な薄膜が作製可能である。In the method of the present invention, the position where the substrate should touch the tip of the plume is determined using random numbers, and the substrate is moved so that the plume hits that position. Specifically, the surface of the substrate is divided into a grid pattern, each part is numbered, and a random number generator or the like is used to generate random numbers to determine the position where the plume hits. In the method of the present invention, the position of the plume is not moved in a specific order, but is moved randomly using random numbers, so a more homogeneous thin film can be produced.
本発明の方法では、例えば、基板を上記の乱数に対応し
て変位するXYステージに搭載して移動する。本発明の
方法では、基板のみが変位し、レーザ光の光路は一定で
ある。従って、レーザ光を振ってレーザ照射位置を変化
させるのと異なり、基板の位置により、成膜条件が変化
することがない。In the method of the present invention, for example, a substrate is mounted on an XY stage that is displaced in accordance with the random number described above and moved. In the method of the present invention, only the substrate is displaced and the optical path of the laser beam is constant. Therefore, unlike changing the laser irradiation position by waving a laser beam, the film forming conditions do not change depending on the position of the substrate.
また、本発明の方法においては、ターゲットの平面形を
円形にしてターゲットを回転させ、レーザ光をターゲッ
トの周辺部に照射することも好ましい。これは、ターゲ
ットの同じ部分にレーザ光が当たっていると、ターゲッ
トのその部分のみが消耗され、凹むことによりプルーム
の方向が変ゎったすするからである。Further, in the method of the present invention, it is also preferable that the planar shape of the target is circular, the target is rotated, and the peripheral part of the target is irradiated with laser light. This is because if the same part of the target is hit by the laser beam, only that part of the target will be consumed and dented, changing the direction of the plume.
以下、本発明を実施例によりさらに詳しく説明するが、
以下の開示は本発明の単なる実施例に過ぎず、本発明の
技術的範囲を何ら制限するものではない。Hereinafter, the present invention will be explained in more detail with reference to Examples.
The following disclosure is merely an example of the present invention and does not limit the technical scope of the present invention in any way.
実施例
第1図に本発明の方法を実施するレーザ蒸着装置の一例
を示す。第1図のレーザ蒸着装置では、レーザ装置IO
で発生され、集光レンズ9を通ったレーザ光はチャンバ
1のレーザ入射窓7に入射し、チャンバ1内のターンテ
ーブル11に搭載されている原料ターゲット5を照射す
る。ターンブープル11はモータ14により、任意の回
転速度で回転させることが可能である。チャンバlの内
部は高真空に排気可能で、XYステージ12に搭載され
た基板ホルダ3に基板2がターゲット5に対向するよう
に固定されている。基板ボルダ3内には、基板2を加熱
するヒータ4が備えられている。また、チャンバ1内に
酸素を含むガスを供給するノズル6が備えられている。Embodiment FIG. 1 shows an example of a laser vapor deposition apparatus for carrying out the method of the present invention. In the laser evaporation apparatus shown in FIG.
The laser light generated by the laser beam passing through the condensing lens 9 enters the laser entrance window 7 of the chamber 1 and irradiates the raw material target 5 mounted on the turntable 11 inside the chamber 1 . The turnpull 11 can be rotated by a motor 14 at any rotational speed. The inside of the chamber 1 can be evacuated to a high vacuum, and the substrate 2 is fixed to a substrate holder 3 mounted on an XY stage 12 so as to face a target 5. A heater 4 for heating the substrate 2 is provided inside the substrate boulder 3. Further, a nozzle 6 for supplying a gas containing oxygen into the chamber 1 is provided.
本実施例の装置では、レーザ装置10はパルスレーザ光
を発振する。このパルスに対応して、乱数発生器を備え
た制御装置13が、XYステージ12に制御信号を送る
。XYステージ12は、この制御信号に基づきパルス毎
に基板2を変位させて、パルスレーザ光がターゲット5
を照射したときに発生するプルームの先端が1パルスご
とに、基板の乱数により決定された部位に接するように
する。In the device of this embodiment, the laser device 10 oscillates pulsed laser light. In response to this pulse, a control device 13 equipped with a random number generator sends a control signal to the XY stage 12. The XY stage 12 displaces the substrate 2 for each pulse based on this control signal, so that the pulsed laser beam hits the target 5.
The tip of the plume generated when the beam is irradiated is brought into contact with a portion of the substrate determined by a random number for each pulse.
上記のレーザ蒸着装置を使用し、本発明の方法で、YI
Ba2CUsOt−x酸化物超電導薄膜を作製した。Using the above laser evaporation apparatus and the method of the present invention, YI
A Ba2CUsOt-x oxide superconducting thin film was fabricated.
基板2には、MgO単結晶基板および5rTi03単結
晶基板を用い、基板温度は650℃から750℃とした
。ターゲット5には、直径2 cmのY1Ba2CL1
30t−xの焼結体を用いた。また、基板2とターゲッ
ト5間の距離は7 cmとした。チャンバ1の内部を1
×1O−6Torrに排気したのち酸素ガスを導入し1
00mTorrにした。For the substrate 2, an MgO single crystal substrate and a 5rTi03 single crystal substrate were used, and the substrate temperature was 650°C to 750°C. Target 5 is Y1Ba2CL1 with a diameter of 2 cm.
A sintered body of 30t-x was used. Further, the distance between the substrate 2 and the target 5 was 7 cm. Inside of chamber 1
After exhausting to ×1 O-6 Torr, oxygen gas was introduced.
00mTorr.
レーザは、波長193nmのエキシマレーザを使用し、
レーザ出力は3.5 J /cnf、レーザ光の照射面
積を2X4u+n2とし、パルス周波数を5Hzとした
。The laser uses an excimer laser with a wavelength of 193 nm.
The laser output was 3.5 J/cnf, the laser beam irradiation area was 2X4u+n2, and the pulse frequency was 5Hz.
制御装置13によりXYステージ12上の基板2を乱数
に基づいて変位させ、基板2の3 X 3 crlの領
域をプルームが走査するようにした。また、ターゲット
5は、1.5/秒で回転させた。The substrate 2 on the XY stage 12 was displaced by the control device 13 based on random numbers, so that the plume scanned an area of 3×3 crl on the substrate 2. Further, the target 5 was rotated at 1.5/sec.
上記の条件で、30分開成膜を行ない、得られた酸化物
超電導薄膜の膜厚分布と超電導特性の測定を行なった。Under the above conditions, open film formation was performed for 30 minutes, and the film thickness distribution and superconducting properties of the obtained oxide superconducting thin film were measured.
その結果、本発明の方法で作製した酸化物超電導薄膜の
膜厚分布は、35X35mm2の範囲で±10%であっ
た。一方、他の成膜条件は等しくして、プルームを基板
の一点に当てたままにする従来の方法の場合の膜厚分布
は1010X10”の範囲で±10%であった。本発明
の方法で作製した酸化物超電導薄膜の臨界温度と膜厚の
測定結果を、第1表に示す。As a result, the film thickness distribution of the oxide superconducting thin film produced by the method of the present invention was ±10% in the range of 35×35 mm 2 . On the other hand, with the other film forming conditions being the same, the film thickness distribution in the case of the conventional method in which the plume remains in contact with one point on the substrate was ±10% in the range of 1010 x 10''.In the method of the present invention Table 1 shows the measurement results of the critical temperature and film thickness of the produced oxide superconducting thin film.
第1表
発明の詳細
な説明したように本発明に従うと、従来よりも大面積で
膜厚分布の少ない薄膜を作製することが可能である。こ
れは、本発明の方法に独特な、プルームが基板上の乱数
で決められた位置に当たるよう基板を移動しながら成膜
する効果である。According to the present invention as described in detail in Table 1, it is possible to fabricate a thin film with a larger area and a smaller thickness distribution than before. This is an effect unique to the method of the present invention in which the film is formed while moving the substrate so that the plume hits a position determined by a random number on the substrate.
第1図は、本発明の方法を実現するレーザ蒸着装置の一
例の概略図である。
〔主な参照番号〕
1・・・チャンバ
2・・・基板
3・・・基板ホルダ
4・・・ヒータ
5・・・ターゲット
6・・・ノズル
7・・・入射窓
8・・・ミラー
9・・・集光レンズ
10・・・レーザ装置
11・・・ターンテーブル、
12・・・XYステージ、
13・・・制御装置FIG. 1 is a schematic diagram of an example of a laser deposition apparatus that implements the method of the present invention. [Main reference numbers] 1... Chamber 2... Substrate 3... Substrate holder 4... Heater 5... Target 6... Nozzle 7... Entrance window 8... Mirror 9... ...Condensing lens 10...Laser device 11...Turntable, 12...XY stage, 13...Control device
Claims (1)
ットに対向して配置した基板上に薄膜を堆積させて形成
するレーザ蒸着法により薄膜を作製する方法において、
基板表面の乱数により決定した位置に主に薄膜が堆積す
るよう前記基板をパルスレーザ光の照射と同期して変位
させて蒸着を行うことを特徴とする薄膜の作製方法。In a method of producing a thin film by a laser evaporation method in which a target is irradiated with pulsed laser light and a thin film is deposited on a substrate placed opposite to the target,
A method for producing a thin film, characterized in that vapor deposition is performed by displacing the substrate in synchronization with irradiation with pulsed laser light so that the thin film is deposited mainly at positions determined by random numbers on the surface of the substrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14926090A JPH0441666A (en) | 1990-06-07 | 1990-06-07 | Method for manufacturing thin films using laser evaporation method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14926090A JPH0441666A (en) | 1990-06-07 | 1990-06-07 | Method for manufacturing thin films using laser evaporation method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0441666A true JPH0441666A (en) | 1992-02-12 |
Family
ID=15471365
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14926090A Pending JPH0441666A (en) | 1990-06-07 | 1990-06-07 | Method for manufacturing thin films using laser evaporation method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0441666A (en) |
-
1990
- 1990-06-07 JP JP14926090A patent/JPH0441666A/en active Pending
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