JPH0446537U - - Google Patents

Info

Publication number
JPH0446537U
JPH0446537U JP8748490U JP8748490U JPH0446537U JP H0446537 U JPH0446537 U JP H0446537U JP 8748490 U JP8748490 U JP 8748490U JP 8748490 U JP8748490 U JP 8748490U JP H0446537 U JPH0446537 U JP H0446537U
Authority
JP
Japan
Prior art keywords
marks
mask alignment
photolithography
row
intervals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8748490U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8748490U priority Critical patent/JPH0446537U/ja
Publication of JPH0446537U publication Critical patent/JPH0446537U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例によるマスク合わせ
を示す説明図、第2図は従来広く採られてきたマ
スク合わせの方法の一例を示す説明図である。 1……ウエハ、2……マスク、3,4……マー
ク、5……レーザービームをスキヤンする方向を
示す線。なお各図中同一符号は同一または相当す
るものを示す。
FIG. 1 is an explanatory diagram showing mask alignment according to an embodiment of the present invention, and FIG. 2 is an explanatory diagram showing an example of a conventionally widely used mask alignment method. 1... Wafer, 2... Mask, 3, 4... Mark, 5... Line indicating the direction in which the laser beam is scanned. Note that the same reference numerals in each figure indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体ウエハプロセスのフオトリソグラフイで
使用するマスクに配設されたマスクアライメント
マークで、縦に2列に各列ごとに複数個ずつで左
右対称形状に配設されたマークのうち、左右1個
ずつで構成する各組のマーク間の間隔がそれぞれ
異なることを特徴とするマスクアライメントマー
ク。
Mask alignment marks are placed on masks used in photolithography for semiconductor wafer processes, and are arranged symmetrically in two vertical rows with multiple marks in each row, one on each side. A mask alignment mark characterized in that the intervals between each set of marks made up of are different from each other.
JP8748490U 1990-08-23 1990-08-23 Pending JPH0446537U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8748490U JPH0446537U (en) 1990-08-23 1990-08-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8748490U JPH0446537U (en) 1990-08-23 1990-08-23

Publications (1)

Publication Number Publication Date
JPH0446537U true JPH0446537U (en) 1992-04-21

Family

ID=31819864

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8748490U Pending JPH0446537U (en) 1990-08-23 1990-08-23

Country Status (1)

Country Link
JP (1) JPH0446537U (en)

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