JPH0449859B2 - - Google Patents

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Publication number
JPH0449859B2
JPH0449859B2 JP60098298A JP9829885A JPH0449859B2 JP H0449859 B2 JPH0449859 B2 JP H0449859B2 JP 60098298 A JP60098298 A JP 60098298A JP 9829885 A JP9829885 A JP 9829885A JP H0449859 B2 JPH0449859 B2 JP H0449859B2
Authority
JP
Japan
Prior art keywords
polyamide
film
molded product
polyamide molded
cuprous sulfide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60098298A
Other languages
Japanese (ja)
Other versions
JPS61255848A (en
Inventor
Koyo Matsukawa
Mitsuaki Tanaka
Taizo Uno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Osaka City Government
Original Assignee
Osaka City Government
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osaka City Government filed Critical Osaka City Government
Priority to JP60098298A priority Critical patent/JPS61255848A/en
Publication of JPS61255848A publication Critical patent/JPS61255848A/en
Publication of JPH0449859B2 publication Critical patent/JPH0449859B2/ja
Granted legal-status Critical Current

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  • Coating Of Shaped Articles Made Of Macromolecular Substances (AREA)
  • Treatments Of Macromolecular Shaped Articles (AREA)
  • Laminated Bodies (AREA)
  • Conductive Materials (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

技術分野 本発明は、新規な導電性ポリアミド成形物及び
その製造法に関する。 発明の背景 ポリアミド成形物への導電性の付与は、従来か
ら主に無電解メツキ法により行なわれている。し
かしながら、無電解メツキ法には、脱脂処理、化
学エツチング処理、感受性化処理、活性化処理、
無電解メツキ処理と多数の処理工程を必要とし極
めて煩雑であるという大きな欠点があるのに加え
て、得られる金属被膜の密着性が劣るという欠点
がある。これらの欠点の内後者については、前処
理の工夫(特開昭56−161432号)、ポリアミドへ
のシリカの配合(特開昭57−158236号)等により
改善し得ることが開示されたが、前者については
何ら改善されるに至つていない。 一方、ポリアクリロニトリル等のニトリル系樹
脂のシアノ基へ1価の銅塩を配位させることによ
り導電性を付与し得ることが開示されている(特
開昭56−112909号、特開昭58−45263号)。 本発明者は、前記無電解メツキ法の欠点を解消
し、ポリアミド成形物に密着性に優れた導電性被
膜を簡便な方法で形成することを目的として研究
し、上記ニトリル系樹脂における方法を試みた所
ポリアミドには1価の銅塩は配位されずこの方法
は適用できないことが判つた。本発明者は、上記
目的達成のため、その後更に鋭意研究を続けた。
その結果、ポリアミド成形物にアミド基の活性化
処理を施した後2価の銅イオンを配位させ、これ
を含硫黄還元剤で1価に還元することにより、目
的が達成でき新規な導電性ポリアミド成形物を収
得できることを見出した。 本発明は、上記知見に基づいて完成されたもの
である。 発明の構成 本発明は、ポリアミド成形物の表面に、該ポリ
アミド成形物のアミド基と硫化第1銅との配位結
合により、硫化第1銅被膜が密着形成されている
ことを特徴とする導電性ポリアミド成形物、及び ヨウ素、臭素、ヨウ化カリウム、ヨウ化ナトリ
ウム、ヨウ化リチウム、臭化カリウム、臭化ナト
リウム、臭化リチウム及びフエノール化合物から
選ばれた少なくとも1種を用いてアミド基の活性
化処理を施したポリアミド成形物を2価の銅イオ
ン溶液で処理し、次いで含硫黄還元剤と接触させ
て銅イオンを1価に還元して、ポリアミド成形物
の表面に、該ポリアミド成形物のアミド基と硫化
第1銅との配位結合により、硫化第1銅被膜を密
着形成せしめることを特徴とする導電性ポリアミ
ド成形物の製造法に係る。 本発明の導電性ポリアミド成形物は、ポリアミ
ド成形物の表面に、該ポリアミド成形物のアミド
基と硫化第1銅との配位結合により、硫化第1銅
被膜が密着形成されているものである。本発明に
おける硫化第1銅被膜の厚さは、特に限定されな
いが、通常0.01〜50μm程度である。硫化第1銅
被膜は、極めて優れた密着性を有しており、又耐
寒性、耐熱性にも優れている。また、硫化第1銅
被膜は、ポリアミド成形物表面を均一に被覆して
いるので導電性が非常に安定している。 本発明の導電性ポリアミド成形物は、例えば以
下の如くして製造される。 本発明におけるポリアミド成形物は、例えばポ
リアミド−6、ポリアミド−6,6、ポリアミド
−6,10、ポリアミド−11、ポリアミド−12等の
アミド基を有するポリマーのフイルム、繊維、
布、或いは直方体、筒状、球状等の各種形状の成
形体等である。また、該成形物は、ポリアミド以
外の樹脂とポリアミドとの多層構造になつている
もの又はこれらの混合物からなるものであつても
良い。 最初にポリアミド成形物に、アミド基の活性化
処理を施す。この活性化処理は、アミド基間に存
在する強固な水素結合を弱めて2価の銅イオンが
配位できる様にするものである。この活性化処理
は、アミド基間に入り込む性質を有するヨウ素、
臭素、ヨウ化カリウム、ヨウ化ナトリウム、ヨウ
化リチウム、臭化カリウム、臭化ナトリウム、及
びポリアミドを膨潤させる性質を有するフエノー
ル、オルトクレゾール、メタクレゾール、パラク
レゾール、オルトクロロフエノール、ケタクロロ
フエノール、パラクロロフエノール、キシレノー
ル等のフエノール化合物の少なくとも1種を用い
て行なうのが好ましい。これらの内特に好ましい
のは、ヨウ素及び臭素から選ばれるハロゲンをヨ
ウ化カリウム、ヨウ化ナトリウム、ヨウ化リチウ
ム、臭化カリウム、臭化ナトリウム及び臭化リチ
ウムから選ばれるハロゲン化合物との併用、又は
フエノール化合物である。また、この活性化処理
は、上記ヨウ素、臭素、ヨウ化カリウム、ヨウ化
ナトリウム、ヨウ化リチウム、臭化カリウム、臭
化ナトリウム、臭化リチウム及びフエノール化合
物の少なくとも1種の水溶液のポリアミド成形物
を浸漬することにより行なうのが好ましい。この
際の水溶液の濃度は、用いた薬剤の種類に応じて
種々変動し一定しないが、一例を挙げるとヨウ素
とヨウ化カリウムの混合水溶液を用いる場合は、
それぞれを通常0.002〜0.5mol/程度の濃度と
するのが適当である。また、メタクレゾールの場
合は、通常0.005〜0.5mol/程度の濃度とする
のが適当である。処理温度は、特に限定されない
が、通常5〜50℃程度とするのが適当である。ま
た、処理時間も種々変動し一定しないが、上記の
場合は通常1秒〜10時間程度とするのが適当であ
る。 アミド基の活性化処理を行なわない場合は、2
価の銅イオンの配位が起こらないので、硫化第1
銅被膜は形成されない。従つて、この活性化処理
の際に、ポリアミド成形物の一部を処理溶液に浸
漬したり又は一部をマスキングしておいたりし
て、ポリアミド成形物の任意の部分に活性化処理
を行なうことにより、所望の部分のみに硫化第1
銅被膜を形成することが容易にできる。例えばフ
イルムの片面にのみ硫化第1銅被膜を形成した
り、成形体の導電化を必要とする面のみに該被膜
を形成したりすることが容易にできる。 尚、アミド基の活性化処理に先立つて、必要な
らば、通常の脱脂処理を行なつても良い。 次に、上記活性化処理を施したポリアミド成形
物を2価の銅イオン溶液で処理し、次いで含硫黄
還元剤と接触処理する。 2価の銅イオン溶液による処理は、特に限定さ
れないが、例えば硝酸第2銅、硫酸第2銅、酢酸
第2銅、塩化第2銅等の第2銅塩の通常0.01〜
10mol/程度好ましくは0.1〜5mol/の水溶
液に、5〜50℃程度の温度下で、1秒〜5時間程
度好ましくは2分〜1時間浸漬することにより行
なうのが良い。 含硫黄還元剤による接触処理は、特に限定され
ないが、例えばチオ硫酸ナトリウム、亜硫酸ナト
リウム、硫化ナトリウム、チオ硫酸カリウム、亜
硫酸カリウム、硫化カリウム等の含硫黄還元剤の
通常0.01〜10mol/程度好ましくは0.1〜
5mol/の水溶液に、10〜100℃程度好ましくは
40〜80℃の温度下で、10分〜1時間程度好ましく
は1〜24時間浸漬することにより行なうのが良
い。 2価の銅イオン溶液による処理と含硫黄還元剤
による接触処理とは、それぞれ別の容器を用いて
行なつても良いが、前者の処理終了後の処理溶液
を特に除去することなく、その容器に後者の処理
溶液を更に加えて連続的に後者の処理を行なうの
がより好適である。これらの処理は、適宜攪拌又
は振とうして行なうのが適当である。 2価の銅イオン溶液による処理次いで含硫黄還
元剤による接触処理を行なうことにより、2価の
銅イオンがアミド基に配位し、次いで該イオンが
1価に還元されると同時に硫黄が結合して、金属
光沢を有する硫化第1銅被膜がポリアミド成形物
表面に密着形成される。硫化第1銅被膜の厚さ
は、前者の処理における第2銅塩の濃度に依存す
るが、前記の通り、通常0.01〜50μm程度である。 かくして、本発明の導電性ポリアミド成形物を
製造、収得できる。 発明の効果 本発明により、下記の如き顕著な効果が奏され
る。 (1) 種々のポリアミド成形物の表面に硫化第1銅
被膜を、極めて簡便に密着形成でき、従来得ら
れたことのない新規導電性ポリアミド成形物を
収得できる。 (2) 硫化第1銅被膜の密着性は、極めて優れてお
り、クロスカツテイング試験では通常100%の
密着率を示す。 (3) 硫化第1銅被膜は、ポリアミド成形物表面を
均一に被覆しているので、導電性が非常に安定
している。また、導電性自体については、被覆
されていないポリアミド成形物が通常1011Ω・
cm程度の電気抵抗を示すのに対して本発明導電
性ポリアミド成形物では電気抵抗が通常104
Ω・cm以下程度になり優れた導電性を示すに至
る。 (4) 硫化第1銅被膜は、耐寒性、耐熱性にも優れ
ている。 実施例 以下、実施例に挙げて、本発明をより具体例に
説明する。 実施例 1 ポリアミド−6の円板状フイルム(厚さ:
50μm、直径:7cm)を、ヨウ素2.5g
(10mmol)、ヨウ化カリウム3.3g(20mmol)を
100ml蒸留水に溶解して調製したヨウ素溶液に室
温で約20秒間浸してアミド基の活性化処理を施
し、約30分間流水で水洗した。硫酸第2銅溶液20
ml(0.4mol/)に室温で数分間浸し、次いで
チオ硫酸ナトリウム溶液20ml(0.4mol/)を
加えて更に室温で数分置き、63℃で加熱し3時間
振とう後、水洗乾燥して、青緑の金属光沢を有す
る硫化第1銅被膜が上記フイルムの両面に密着形
成された本発明導電性ポリアミドフイルムを得
た。 この導電性フイルムの表面固有抵抗値を、ヒユ
ーレツドパツカード社製の「4328Δミリオームメ
ーター」を使用して直流電源四点法により測定し
たところ2.0×102Ωであつた。 また、この導電性フイルムの硫化第1銅被膜の
密着性を下記のクロスカツテイング試験法による
密着率で評価したところ100%であり、密着性が
極めて優れることが判つた。 〇密着率の測定……試験すべき導電性フイルムの
導電面に縦、横1mm間隔で基盤目状にフイルム面
に達する刻線を11本ずつ入れたのち、刻線上に巾
1.0〜1.5cm、長さ3〜5cmの粘着テープ(ニチバ
ン(株)製「メンデイングテープ」)をはり付け、次
いでフイルム面に対して90〜180°の方向にテープ
を一気に引き剥がし、基盤目100個のうち硫化第
1銅被膜が剥がれないで残つた個数の割合を%で
表示した。これらの操作はすべて室温で行なつ
た。 また、この導電性フイルムをX線光電子分光法
(ESCA)(島津製作所(株)製「ESCA750」及びデ
ーター処理装置「ESCAPAC760」を使用)によ
り表面分析を行なつたところ、硫化第1銅のピー
クを確認した。また、アミド基の窒素のピークが
消失し、アミドカルボニル炭素のピーク、特に副
ピークが大きくシフトしていることにより、硫化
第1銅がアミド基上に配位していることが推定で
きる。分析結果を第1表に示す。第1表中の数値
の単位はeVである。
TECHNICAL FIELD The present invention relates to a novel conductive polyamide molded article and a method for producing the same. BACKGROUND OF THE INVENTION Electroconductivity has traditionally been imparted to polyamide molded articles mainly by electroless plating. However, the electroless plating method requires degreasing treatment, chemical etching treatment, sensitization treatment, activation treatment,
In addition to the major disadvantage of being extremely complicated as it requires electroless plating and a large number of processing steps, it also has the disadvantage of poor adhesion of the resulting metal coating. It has been disclosed that the latter of these drawbacks can be improved by devising pretreatment (Japanese Patent Application Laid-open No. 161432/1982), blending silica into polyamide (Japanese Patent Application Laid-open No. 158236/1982), etc. Regarding the former, no improvements have been made. On the other hand, it has been disclosed that conductivity can be imparted by coordinating a monovalent copper salt to the cyano group of a nitrile resin such as polyacrylonitrile (JP-A-56-112909, JP-A-58- No. 45263). The present inventor conducted research with the aim of eliminating the drawbacks of the electroless plating method and forming a conductive film with excellent adhesion on polyamide molded products by a simple method, and tried the method using the above-mentioned nitrile resin. However, it was found that this method could not be applied to polyamide because the monovalent copper salt was not coordinated. In order to achieve the above object, the inventor continued further intensive research.
As a result, by activating the amide group on the polyamide molded product, coordinating divalent copper ions, and reducing this to monovalent with a sulfur-containing reducing agent, the purpose could be achieved and new conductivity could be achieved. It has been found that polyamide molded articles can be obtained. The present invention was completed based on the above findings. Structure of the Invention The present invention provides a conductive material characterized in that a cuprous sulfide coating is closely formed on the surface of a polyamide molded product through coordination bonds between the amide groups of the polyamide molded product and cuprous sulfide. and the activation of the amide group using at least one selected from iodine, bromine, potassium iodide, sodium iodide, lithium iodide, potassium bromide, sodium bromide, lithium bromide, and a phenol compound. The polyamide molded product subjected to the chemical treatment is treated with a divalent copper ion solution, and then brought into contact with a sulfur-containing reducing agent to reduce the copper ion to monovalent, and the polyamide molded product is coated on the surface of the polyamide molded product. The present invention relates to a method for manufacturing a conductive polyamide molded article, characterized in that a cuprous sulfide coating is formed in close contact with the amide group and cuprous sulfide through coordination bonds. The conductive polyamide molded product of the present invention has a cuprous sulfide coating formed in close contact with the surface of the polyamide molded product through coordination bonds between the amide groups of the polyamide molded product and cuprous sulfide. . The thickness of the cuprous sulfide coating in the present invention is not particularly limited, but is usually about 0.01 to 50 μm. The cuprous sulfide coating has extremely excellent adhesion and is also excellent in cold resistance and heat resistance. Furthermore, since the cuprous sulfide coating uniformly covers the surface of the polyamide molded product, its conductivity is extremely stable. The conductive polyamide molded article of the present invention is manufactured, for example, as follows. Polyamide molded articles in the present invention include films, fibers, etc. of polymers having amide groups, such as polyamide-6, polyamide-6,6, polyamide-6,10, polyamide-11, polyamide-12,
These include cloth, or molded bodies of various shapes such as rectangular parallelepipeds, cylinders, and spheres. Further, the molded article may have a multilayer structure of a resin other than polyamide and polyamide, or a mixture thereof. First, a polyamide molded article is subjected to an amide group activation treatment. This activation treatment weakens the strong hydrogen bonds existing between amide groups to allow divalent copper ions to coordinate. In this activation treatment, iodine, which has the property of entering between amide groups,
Bromine, potassium iodide, sodium iodide, lithium iodide, potassium bromide, sodium bromide, and phenols that have the property of swelling polyamides, ortho-cresol, metacresol, para-cresol, orthochlorophenol, ketochlorophenol, para- It is preferable to use at least one phenol compound such as chlorophenol or xylenol. Particularly preferred among these are the combination of a halogen selected from iodine and bromine with a halogen compound selected from potassium iodide, sodium iodide, lithium iodide, potassium bromide, sodium bromide, and lithium bromide, or phenol. It is a compound. In addition, this activation treatment is performed on a polyamide molded product of an aqueous solution of at least one of the above-mentioned iodine, bromine, potassium iodide, sodium iodide, lithium iodide, potassium bromide, sodium bromide, lithium bromide, and a phenol compound. Preferably, this is carried out by immersion. The concentration of the aqueous solution at this time varies depending on the type of drug used and is not constant. For example, when using a mixed aqueous solution of iodine and potassium iodide,
The appropriate concentration of each is usually about 0.002 to 0.5 mol/. Further, in the case of metacresol, it is usually appropriate to set the concentration to about 0.005 to 0.5 mol/. Although the treatment temperature is not particularly limited, it is usually appropriate to set it at about 5 to 50°C. Further, the processing time also varies and is not constant, but in the above case, it is usually appropriate to set it to about 1 second to 10 hours. If the amide group is not activated, 2
Since coordination of valent copper ions does not occur, the first sulfide
No copper coating is formed. Therefore, during this activation treatment, activation treatment may be performed on any part of the polyamide molding by immersing a part of the polyamide molding in a treatment solution or masking a part of the polyamide molding. The first sulfide layer is applied only to the desired areas.
A copper coating can be easily formed. For example, the cuprous sulfide coating can be easily formed on only one side of the film, or the coating can be easily formed only on the side of the molded body that needs to be made electrically conductive. Incidentally, prior to the activation treatment of the amide group, if necessary, a conventional degreasing treatment may be performed. Next, the activated polyamide molded article is treated with a divalent copper ion solution, and then brought into contact with a sulfur-containing reducing agent. The treatment with a divalent copper ion solution is not particularly limited, but for example, the treatment with a cupric salt such as cupric nitrate, cupric sulfate, cupric acetate, cupric chloride, etc. is usually 0.01~
This is preferably carried out by immersion in an aqueous solution of about 10 mol/preferably 0.1-5 mol/at a temperature of about 5-50° C. for about 1 second to 5 hours, preferably 2 minutes to 1 hour. The contact treatment with a sulfur-containing reducing agent is not particularly limited, but for example, the amount of sulfur-containing reducing agent such as sodium thiosulfate, sodium sulfite, sodium sulfide, potassium thiosulfate, potassium sulfite, potassium sulfide, etc. is usually about 0.01 to 10 mol/preferably 0.1 ~
5 mol/aqueous solution, preferably about 10 to 100℃
This is preferably carried out by immersion at a temperature of 40 to 80°C for about 10 minutes to 1 hour, preferably 1 to 24 hours. The treatment with the divalent copper ion solution and the contact treatment with the sulfur-containing reducing agent may be carried out using separate containers, but the treatment solution after the former treatment is not particularly removed, and the It is more preferable to further add the latter treatment solution to the mixture and perform the latter treatment continuously. These treatments are suitably carried out by stirring or shaking as appropriate. By treatment with a divalent copper ion solution and then contact treatment with a sulfur-containing reducing agent, the divalent copper ion is coordinated to the amide group, and then the ion is reduced to a monovalent one, and at the same time, sulfur is bonded. As a result, a cuprous sulfide coating having metallic luster is formed in close contact with the surface of the polyamide molded article. The thickness of the cuprous sulfide coating depends on the concentration of the cupric salt in the former treatment, but as described above, it is usually about 0.01 to 50 μm. In this way, the conductive polyamide molded article of the present invention can be manufactured and obtained. Effects of the Invention The present invention provides the following remarkable effects. (1) Cuprous sulfide coatings can be formed in close contact with the surfaces of various polyamide moldings in an extremely simple manner, and novel conductive polyamide moldings that have not been previously obtained can be obtained. (2) The adhesion of cuprous sulfide coatings is extremely excellent, and cross-cutting tests usually show 100% adhesion. (3) Since the cuprous sulfide coating uniformly covers the surface of the polyamide molded product, its conductivity is extremely stable. Regarding conductivity itself, uncoated polyamide molded products usually have a conductivity of 10 11 Ω.
The conductive polyamide molded product of the present invention usually has an electrical resistance of 10 cm .
It shows excellent conductivity with a value of Ω・cm or less. (4) Cuprous sulfide coatings also have excellent cold resistance and heat resistance. EXAMPLES Hereinafter, the present invention will be explained in more concrete terms with reference to Examples. Example 1 Polyamide-6 disc-shaped film (thickness:
50 μm, diameter: 7 cm), 2.5 g of iodine
(10 mmol), potassium iodide 3.3 g (20 mmol)
The amide group was activated by immersing it in an iodine solution prepared by dissolving it in 100 ml of distilled water at room temperature for about 20 seconds, followed by washing with running water for about 30 minutes. Cupric sulfate solution 20
ml (0.4 mol/) at room temperature for several minutes, then add 20 ml (0.4 mol/) of sodium thiosulfate solution, leave for a few more minutes at room temperature, heat at 63°C, shake for 3 hours, wash with water and dry. A conductive polyamide film of the present invention was obtained in which a cuprous sulfide coating having a blue-green metallic luster was closely formed on both surfaces of the film. The surface resistivity value of this conductive film was measured using a "4328Δ milli-ohmmeter" manufactured by Heuretsu Card Co., Ltd. using a DC power supply four-point method, and found to be 2.0×10 2 Ω. Further, the adhesion of the cuprous sulfide coating of this conductive film was evaluated by the adhesion rate using the cross-cutting test method described below, and it was found to be 100%, indicating that the adhesion was extremely excellent. 〇Measurement of adhesion rate...After making 11 score lines that reach the film surface in a matrix pattern at 1 mm intervals vertically and horizontally on the conductive surface of the conductive film to be tested,
Attach an adhesive tape of 1.0 to 1.5 cm and a length of 3 to 5 cm ("Mending Tape" manufactured by Nichiban Co., Ltd.), then peel off the tape at once in a direction of 90 to 180 degrees to the film surface to remove the base grain. Out of 100 pieces, the ratio of the number of pieces whose cuprous sulfide coating remained without peeling off was expressed as a percentage. All these operations were performed at room temperature. In addition, when this conductive film was subjected to surface analysis using X-ray photoelectron spectroscopy (ESCA) (using Shimadzu Corporation's ``ESCA750'' and data processing device ``ESCAPAC760''), a peak of cuprous sulfide was found. It was confirmed. Further, the nitrogen peak of the amide group disappears and the peak of the amide carbonyl carbon, especially the subpeak, shifts significantly, so it can be inferred that cuprous sulfide is coordinated on the amide group. The analysis results are shown in Table 1. The unit of numerical values in Table 1 is eV.

【表】 また、この導電性フイルムを走査型電子顕微鏡
(日本電子(株)製「T−100」)により観察したとこ
ろ、厚さ0.2〜0.3μmの硫化第1銅被膜が均一に密
着形成されていることが判つた。この走査型電子
顕微鏡写真(倍率30000倍)を第1図に示した。 更に、この導電性フイルムの耐寒性を液体窒素
(−176℃)に1時間浸漬後前記密着率の測定をす
ることにより、又耐熱性を沸騰水(100℃)に1
時間浸漬後前記密着率の測定をすることにより、
それぞれ調べたところ、いずれにおいても100%
の密着率を示し、耐寒性及び耐熱性に優れること
が判つた。 実施例 2 原料のポリアミド−6の円板状フイルムとして
厚さが150μmのものを用いた他は、実施例1と同
様にして本発明導電性ポリアミドフイルムを得
た。 この導電性フイルムの表面固有抵抗値を、実施
例1と同様にして測定したところ6.4×102Ωであ
つた。また、前記密着率の測定により密着率を調
べたところ100%であつた。 更に、この導電性フイルムを実施例1と同様に
走査型電子顕微鏡を用いて観察した。走査型電子
顕微鏡写真を第2〜4図に示す。第2図(倍率
30000倍)は未処理のポリアミド−6フイルムの
表面を示す。第3図(倍率30000倍)は本実施例
で得た導電性フイルムの表面を示すものであり、
第2図の場合とほぼ同程度に表面が平滑であり硫
化第1銅被膜が均一に密着形成されていることが
判る。第4図(倍率4200倍)は本実施例で得た導
電性フイルムの断面を示すものであり、厚さ約
5μmの硫化第1銅被膜が均一に密着形成されてい
ることが判る。 実施例 3 原料のポリアミド−6の円板状フイルムとして
厚さが5μmのものを用いた他は実施例1と同様に
して本発明導電性ポリアミドフイルムを得た。 この導電性フイルムの表面固有抵抗値を、タケ
ダ理研工業(株)製の「TR6843マルチメーター」を
使用して直流電源二点法により測定したところ
3.2×103Ωであつた。 実施例 4 原料のポリアミド−6の円板状フイルムとして
厚さが150μmのものを用い、アミド基の活性化処
理を0.05mol/のメタクレゾール水溶液に4時
間浸して行なつた他は、実施例1と同様にして本
発明導電性ポリアミドフイルムを得た。 この導電性フイルムの表面固有抵抗値を、実施
例1と同様にして測定したところ6.5×102Ωであ
つた。また、前記密着率の測定により密着率を調
べたところ100%であつた。 実施例 5〜7 原料のポリアミド円板フイルムとして第2表に
示すものを用いた他は、実施例1と同様にして本
発明導電性ポリアミドフイルムを得た。 実施例1と同様にして測定した表面固有抵抗値
及び密着率を第2表に併記した。
[Table] When this conductive film was observed using a scanning electron microscope ("T-100" manufactured by JEOL Ltd.), it was found that a cuprous sulfide coating with a thickness of 0.2 to 0.3 μm was formed in close contact with the film. It turns out that there is. A scanning electron micrograph (magnification: 30,000 times) is shown in FIG. Furthermore, the cold resistance of this conductive film was determined by measuring the adhesion rate after being immersed in liquid nitrogen (-176°C) for 1 hour, and the heat resistance was determined by soaking it in boiling water (100°C) for 1 hour.
By measuring the adhesion rate after soaking for a time,
When I checked each, it was 100% in all cases.
The adhesion rate was found to be excellent in cold resistance and heat resistance. Example 2 A conductive polyamide film of the present invention was obtained in the same manner as in Example 1, except that a disc-shaped polyamide-6 film having a thickness of 150 μm was used as the raw material. The surface resistivity value of this conductive film was measured in the same manner as in Example 1 and was found to be 6.4×10 2 Ω. Further, the adhesion rate was examined by measuring the adhesion rate and found it to be 100%. Furthermore, this conductive film was observed using a scanning electron microscope in the same manner as in Example 1. Scanning electron micrographs are shown in Figures 2-4. Figure 2 (magnification
30,000 times) shows the surface of untreated polyamide-6 film. Figure 3 (30,000x magnification) shows the surface of the conductive film obtained in this example.
It can be seen that the surface is almost as smooth as in the case of FIG. 2, and that the cuprous sulfide coating is uniformly and tightly formed. Figure 4 (magnification: 4200x) shows the cross section of the conductive film obtained in this example, with a thickness of approximately
It can be seen that the 5 μm cuprous sulfide coating is uniformly and tightly formed. Example 3 A conductive polyamide film of the present invention was obtained in the same manner as in Example 1, except that a disc-shaped polyamide-6 film having a thickness of 5 μm was used as the raw material. The surface resistivity value of this conductive film was measured using a "TR6843 multimeter" manufactured by Takeda Riken Kogyo Co., Ltd. using a two-point DC power source method.
It was 3.2×10 3 Ω. Example 4 A disc-shaped film of polyamide-6 having a thickness of 150 μm was used as the raw material, and the amide groups were activated by immersing it in a 0.05 mol/methacresol aqueous solution for 4 hours. A conductive polyamide film of the present invention was obtained in the same manner as in Example 1. The surface resistivity value of this conductive film was measured in the same manner as in Example 1 and was found to be 6.5×10 2 Ω. Further, the adhesion rate was examined by measuring the adhesion rate and found it to be 100%. Examples 5 to 7 Conductive polyamide films of the present invention were obtained in the same manner as in Example 1, except that the polyamide disc films shown in Table 2 were used as raw material polyamide disc films. The surface resistivity value and adhesion rate measured in the same manner as in Example 1 are also listed in Table 2.

【表】 実施例 8〜9 ポリアミド−6及びポリアミド−6,6の円形
の織布(直径:7cm)を実施例1で述べたヨウ素
溶液に室温で約20秒間浸してアミド基の活性化処
理を施し、約30分間流水で水洗した後、空気乾燥
した。硝酸第2銅溶液20ml(0.4mol/)に室
温で数分間浸し、次いでチオ硫酸ナトリウム溶液
20ml(0.4mol/)を加えて更に室温で数分置
き、63℃で加熱し3時間振とう後、水洗乾燥し
て、青色の金属光沢を有する本発明導電性ポリア
ミド織布を得た。実施例1と同様にして測定した
表面固有抵抗値を第3表に示す。
[Table] Examples 8 to 9 Circular woven fabrics (diameter: 7 cm) of polyamide-6 and polyamide-6,6 were immersed in the iodine solution described in Example 1 for about 20 seconds at room temperature to activate the amide groups. was applied, rinsed with running water for about 30 minutes, and then air-dried. Soak in 20 ml (0.4 mol/) of cupric nitrate solution for several minutes at room temperature, then soak in sodium thiosulfate solution.
20 ml (0.4 mol/) was added, and the mixture was left at room temperature for several minutes, heated at 63°C, shaken for 3 hours, washed with water, and dried to obtain a conductive polyamide woven fabric of the present invention having a blue metallic luster. Table 3 shows the surface resistivity values measured in the same manner as in Example 1.

【表】 実施例 10 ポリエチレン(PE)多孔性フイルムの上にギ
酸に溶解したポリアミド−6をキヤストして、薄
膜を形成させた。このフイルムを用い実施例1と
同様にして、PE多孔性フイルムに担持したポリ
アミド−6薄膜の表面に硫化第1銅被膜を密着形
成して本発明導電性ポリアミド−ポリエチレン多
層フイルムを得た。 この導電性フイルムの表面固有抵抗値を、実施
例3と同様にして測定したところ1.7×104Ωであ
つた。 比較例 1 以下の(1)〜(3)の順に、硫化銅処理を行つた。 (1) ポリアミド−6の円板上フイルム(厚さ:
50μm、直径:7cm)を、塩酸水溶液(3.8N)
中に室温で5分間浸漬した。 (2) フイルムを取り出し水洗した後、50℃で30分
間乾燥し、1,6−ヘキサンジアミン10重量%
水溶液中で90℃で10分間浸漬した。フイルムを
取り出し水洗した後、100℃で1時間乾燥した。 (3) このフイルムを硫酸銅(0.25mol/)とチ
オ硫酸ナトリウム(0.25mol/)を含む水溶
液中に浸漬し、室温より94℃まで徐々に昇温
し、94℃で10分間処理した。さらに水洗後100
℃で1時間乾燥した。 得られたフイルムの目視観察並びに密着性の試
験を行つた。 フイルムは(1)の塩酸処理後、その表面の色が、
乳白色から白色に変り、表面がかなり劣化してい
るのが観察された。 (3)の硫化銅処理後の硫化銅のフイルムへの付着
については、ムラが観察された。また、該硫化銅
被膜は、実施例1に記載の粘着テープを張り付け
て引き剥がすことにより密着性を調べた結果、硫
化銅被膜は容易に剥がれ、硫化銅被膜のフイルム
への密着性は極めて弱いことが判明した。 比較例 2 ポリアミド−6の円板上フイルム(厚さ:
50μm、直径:7cm)を、ヨウ素溶液を用いるア
ミド基の活性化処理を行わない以外は、実施例1
と同様に処理を行つた。 即ち、硝酸第2銅溶液20ml(0.4mol/)に室
温で数分間浸し、次いでチオ硫酸ナトリウム溶液
20ml(0.4mol/)を加えて更に室温で数分置
き、63℃で加熱し3時間振とうした。 得られたフイルムを水洗した結果、表面に付着
した硫化銅は剥がれ、また、得られたフイルムを
指でこすると容易に硫化銅は剥がれたことから、
硫化銅はフイルムに密着しておらず、硫化第1銅
被膜が密着形成されていないことが判明した。
[Table] Example 10 Polyamide-6 dissolved in formic acid was cast on a polyethylene (PE) porous film to form a thin film. Using this film, a cuprous sulfide coating was closely formed on the surface of a polyamide-6 thin film supported on a PE porous film in the same manner as in Example 1 to obtain a conductive polyamide-polyethylene multilayer film of the present invention. The surface resistivity value of this conductive film was measured in the same manner as in Example 3 and was found to be 1.7×10 4 Ω. Comparative Example 1 Copper sulfide treatment was performed in the following order (1) to (3). (1) Polyamide-6 disc film (thickness:
50μm, diameter: 7cm) in hydrochloric acid aqueous solution (3.8N)
for 5 minutes at room temperature. (2) Remove the film, wash it with water, dry it at 50℃ for 30 minutes, and add 10% by weight of 1,6-hexanediamine.
It was immersed in an aqueous solution at 90°C for 10 minutes. The film was taken out, washed with water, and then dried at 100°C for 1 hour. (3) This film was immersed in an aqueous solution containing copper sulfate (0.25 mol/) and sodium thiosulfate (0.25 mol/), the temperature was gradually raised from room temperature to 94°C, and the film was treated at 94°C for 10 minutes. 100 more after washing with water
It was dried at ℃ for 1 hour. The obtained film was visually observed and tested for adhesion. After the film is treated with hydrochloric acid in (1), its surface color changes to
It was observed that the color changed from milky white to white and the surface was considerably deteriorated. After the copper sulfide treatment (3), uneven adhesion of copper sulfide to the film was observed. In addition, the adhesion of the copper sulfide coating was examined by applying the adhesive tape described in Example 1 and peeling it off. As a result, the copper sulfide coating was easily peeled off, and the adhesion of the copper sulfide coating to the film was extremely weak. It has been found. Comparative Example 2 Polyamide-6 disc film (thickness:
50 μm, diameter: 7 cm) in Example 1, except that the amide group activation treatment using an iodine solution was not performed.
Processed in the same way. That is, immerse in 20 ml (0.4 mol/) of cupric nitrate solution for several minutes at room temperature, then soak in sodium thiosulfate solution.
20 ml (0.4 mol/) was added, and the mixture was left at room temperature for several minutes, heated at 63°C, and shaken for 3 hours. As a result of washing the obtained film with water, the copper sulfide attached to the surface came off, and when the obtained film was rubbed with a finger, the copper sulfide came off easily.
It was found that the copper sulfide did not adhere to the film and that the cuprous sulfide coating was not formed in close contact with the film.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、実施例1で得た本発明導電性ポリア
ミドフイルムの走査型電子顕微鏡写真(倍率
30000倍)を示す。第2図は、未処理のポリアミ
ド−6フイルムの走査型電子顕微鏡写真(倍率
30000倍)を示す。第3図及び第4図は、実施例
2で得た本発明導電性ポリアミドフイルムの走査
型電子顕微鏡写真(倍率第3図は30000倍、第4
図は4200倍)を示す。
FIG. 1 is a scanning electron micrograph of the conductive polyamide film of the present invention obtained in Example 1 (magnification
30000 times). Figure 2 is a scanning electron micrograph of an untreated polyamide-6 film (magnification
30000 times). Figures 3 and 4 are scanning electron micrographs of the conductive polyamide film of the present invention obtained in Example 2 (magnifications of 30,000x in Figure 3;
Figure shows 4200x).

Claims (1)

【特許請求の範囲】 1 ポリアミド成形物の表面に、該ポリアミド成
形物のアミド基と硫化第1銅との配位結合によ
り、硫化第1銅被膜が密着形成されていることを
特徴とする導電性ポリアミド成形物。 2 ヨウ素、臭素、ヨウ化カリウム、ヨウ化ナト
リウム、ヨウ化リチウム、臭化カリウム、臭化ナ
トリウム、臭化リチウム及びフエノール化合物か
ら選ばれた少なくとも1種を用いてアミド基の活
性化処理を施したポリアミド成形物を2価の銅イ
オン溶液で処理し、次いで含硫黄還元剤と接触さ
せて銅イオンを1価に還元して、ポリアミド成形
物の表面に、該ポリアミド成形物のアミド基と硫
化第1銅との配位結合により、硫化第1銅被膜を
密着形成せしめることを特徴とする導電性ポリア
ミド成形物の製造法。
[Scope of Claims] 1. A conductive material characterized in that a cuprous sulfide coating is closely formed on the surface of a polyamide molded product through coordination bonds between the amide groups of the polyamide molded product and cuprous sulfide. polyamide molded product. 2. The amide group was activated using at least one selected from iodine, bromine, potassium iodide, sodium iodide, lithium iodide, potassium bromide, sodium bromide, lithium bromide, and a phenol compound. The polyamide molded product is treated with a divalent copper ion solution, and then brought into contact with a sulfur-containing reducing agent to reduce the copper ions to monovalent ones, so that the amide groups and sulfide groups of the polyamide molded product are coated on the surface of the polyamide molded product. 1. A method for producing a conductive polyamide molded article, characterized in that a cuprous sulfide coating is formed in close contact with cuprous sulfide by coordination bonding with cuprous sulfide.
JP60098298A 1985-05-09 1985-05-09 Dielectric polyamide molded shape and manufacture thereof Granted JPS61255848A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60098298A JPS61255848A (en) 1985-05-09 1985-05-09 Dielectric polyamide molded shape and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60098298A JPS61255848A (en) 1985-05-09 1985-05-09 Dielectric polyamide molded shape and manufacture thereof

Publications (2)

Publication Number Publication Date
JPS61255848A JPS61255848A (en) 1986-11-13
JPH0449859B2 true JPH0449859B2 (en) 1992-08-12

Family

ID=14216010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60098298A Granted JPS61255848A (en) 1985-05-09 1985-05-09 Dielectric polyamide molded shape and manufacture thereof

Country Status (1)

Country Link
JP (1) JPS61255848A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1988003310A1 (en) * 1986-10-29 1988-05-05 Dai Nippon Insatsu Kabushiki Kaisha Draw type optical recording medium

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60160197A (en) * 1984-01-30 1985-08-21 旭化成株式会社 Polymer mold with electromagnetic shielding property
JPS60198004A (en) * 1984-03-21 1985-10-07 旭化成株式会社 Method of producing conductive polymer material

Also Published As

Publication number Publication date
JPS61255848A (en) 1986-11-13

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