JPH0453572U - - Google Patents

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Publication number
JPH0453572U
JPH0453572U JP9633590U JP9633590U JPH0453572U JP H0453572 U JPH0453572 U JP H0453572U JP 9633590 U JP9633590 U JP 9633590U JP 9633590 U JP9633590 U JP 9633590U JP H0453572 U JPH0453572 U JP H0453572U
Authority
JP
Japan
Prior art keywords
input
terminal
pattern
terminal holder
drive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9633590U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9633590U priority Critical patent/JPH0453572U/ja
Publication of JPH0453572U publication Critical patent/JPH0453572U/ja
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例1を示す斜視図、第2
図は本考案の実施例2を示す斜視図、第3図は従
来例を示す斜視図である。 1……クランパー部、3……パターン部、4…
…端子圧下部、4a……端子枠、6……入出力端
子押え、7……駆動端子押え、8……スライドテ
ーブル、9,11……ばね機構、12a……ベー
ス、12b……支柱、13……アーム。
Fig. 1 is a perspective view showing the first embodiment of the present invention; Fig. 2 is a perspective view showing the first embodiment of the present invention;
The figure is a perspective view showing a second embodiment of the present invention, and FIG. 3 is a perspective view showing a conventional example. 1... Clamper section, 3... Pattern section, 4...
...Terminal pressing part, 4a...Terminal frame, 6...I/O terminal holder, 7...Drive terminal holder, 8...Slide table, 9, 11...Spring mechanism, 12a...Base, 12b...Strut, 13...Arm.

Claims (1)

【実用新案登録請求の範囲】 (1) クランパー部と、端子圧下部と、2組のば
ね機構と、パターン部とを含む半導体特性選別用
測定治具であつて、 クランパー部は、ベースと、ベース上に植立さ
れた支柱と、支柱に上下方向に回動可能に枢支さ
れたアームと、支柱に誘導案内されアームに連動
して上下動するスライドテーブルとを有するもの
であり、 端子圧下部は、スライドテーブルに上下変位可
能に支持された端子枠と、駆動端子押えと、入出
力端子押えとを有するものであり、 駆動端子押えは、端子枠に一体に組付けられた
もので、半導体装置の駆動用端子を圧下するもの
であり、 入出力端子押えは、端子枠に上下変位可能に支
持されたもので、半導体装置の入出力用端子を圧
下するものであり、 2組のばね機構は、駆動端子押えと入出力端子
押えとにそれぞれ対応して別個独立に装備され、
かつ個別にばね力が調整されるものであり、 一方のばね機構は、端子枠と一体の駆動端子押
えを付勢するものであり、 他方のばね機構は、入出力端子を付勢するもの
であり、 パターン部は、ベース上に端子圧下部と向き合
せに設けられたもので、駆動端子押えで圧下され
た半導体装置の駆動用端子が電気的に接触する駆
動用パターンと、入出力端子押えで圧下された半
導体装置の入出力用端子が電気的に接触する入出
力パターンとを有するものであることを特徴とす
る半導体特性選別用測定治具。 (2) 前記パターン部は、姿勢調整機構を有する
ものであり、 姿勢調整機構は、パターン部の四隅を支持する
4本の調整ネジ棒からなり、調整ネジ棒で四隅の
高さを調整してパターンと端子との接触状態を均
一化させるものであることを特徴とする請求項第
(1)項記載の半導体特性選別用測定治具。
[Claims for Utility Model Registration] (1) A measuring jig for semiconductor characteristic selection that includes a clamper section, a terminal pressing section, two sets of spring mechanisms, and a pattern section, the clamper section comprising: a base; It has a support that is erected on a base, an arm that is rotatably supported on the support in the vertical direction, and a slide table that is guided by the support and moves up and down in conjunction with the arm. The lower part has a terminal frame supported by a slide table so as to be vertically displaceable, a drive terminal holder, and an input/output terminal holder, and the drive terminal holder is assembled integrally with the terminal frame. The input/output terminal holder is supported by the terminal frame so that it can be moved vertically, and is used to press down the input/output terminals of the semiconductor device. The mechanism is equipped separately and independently corresponding to the drive terminal holder and the input/output terminal holder, respectively.
The spring force is adjusted individually, and one spring mechanism biases the drive terminal holder that is integrated with the terminal frame, and the other spring mechanism biases the input/output terminal. Yes, the pattern part is provided on the base to face the terminal pressing part, and includes the drive pattern with which the drive terminal of the semiconductor device pressed down by the drive terminal holder makes electrical contact, and the input/output terminal holder. 1. A measurement jig for semiconductor characteristic selection, characterized in that the jig has an input/output pattern that electrically contacts input/output terminals of a semiconductor device pressed down. (2) The pattern section has an attitude adjustment mechanism, and the attitude adjustment mechanism consists of four adjustment screw rods that support the four corners of the pattern section, and the height of the four corners can be adjusted with the adjustment screw rods. Claim No. 1, characterized in that the contact state between the pattern and the terminal is made uniform.
The measurement jig for semiconductor characteristic selection described in (1).
JP9633590U 1990-09-13 1990-09-13 Pending JPH0453572U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9633590U JPH0453572U (en) 1990-09-13 1990-09-13

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9633590U JPH0453572U (en) 1990-09-13 1990-09-13

Publications (1)

Publication Number Publication Date
JPH0453572U true JPH0453572U (en) 1992-05-07

Family

ID=31835781

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9633590U Pending JPH0453572U (en) 1990-09-13 1990-09-13

Country Status (1)

Country Link
JP (1) JPH0453572U (en)

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