JPH0455159B2 - - Google Patents
Info
- Publication number
- JPH0455159B2 JPH0455159B2 JP12523085A JP12523085A JPH0455159B2 JP H0455159 B2 JPH0455159 B2 JP H0455159B2 JP 12523085 A JP12523085 A JP 12523085A JP 12523085 A JP12523085 A JP 12523085A JP H0455159 B2 JPH0455159 B2 JP H0455159B2
- Authority
- JP
- Japan
- Prior art keywords
- crucible
- wall
- pbn
- thickness
- walls
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims description 54
- 229910052582 BN Inorganic materials 0.000 claims description 20
- 238000000034 method Methods 0.000 claims description 20
- 238000004519 manufacturing process Methods 0.000 claims description 12
- 239000002994 raw material Substances 0.000 claims description 9
- 238000005229 chemical vapour deposition Methods 0.000 claims description 6
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims description 5
- 229910052796 boron Inorganic materials 0.000 claims description 5
- -1 boron halide Chemical class 0.000 claims description 4
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims 1
- 238000005121 nitriding Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 description 15
- 239000010408 film Substances 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000013078 crystal Substances 0.000 description 11
- 150000001875 compounds Chemical class 0.000 description 10
- 238000006243 chemical reaction Methods 0.000 description 8
- 238000001451 molecular beam epitaxy Methods 0.000 description 8
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 7
- 229910002804 graphite Inorganic materials 0.000 description 6
- 239000010439 graphite Substances 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 239000012535 impurity Substances 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 238000002844 melting Methods 0.000 description 5
- 230000008018 melting Effects 0.000 description 5
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 4
- 230000032798 delamination Effects 0.000 description 4
- 239000000155 melt Substances 0.000 description 4
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 238000003475 lamination Methods 0.000 description 3
- 238000001556 precipitation Methods 0.000 description 3
- 230000002269 spontaneous effect Effects 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- FAQYAMRNWDIXMY-UHFFFAOYSA-N trichloroborane Chemical compound ClB(Cl)Cl FAQYAMRNWDIXMY-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000000565 sealant Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000004506 ultrasonic cleaning Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Landscapes
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Crucibles And Fluidized-Bed Furnaces (AREA)
Description
〔産業上の利用分野〕
本発明は、改良された窒化ホウ素るつぼとその
製法に関し、特に分子線エピタキシー(MBE)
や、液体封止チヨクラルスキー(LEC)法など
で用いるための金属及び化学物溶融用のるつぼと
その製法に関するものである。
〔従来技術とその問題点〕
熱分解窒化ホウ素(PBN)は高純度・高品質
の窒化ホウ素(BN)として化合物半導体や特殊
合金の製造などの巾広い分野で用いられている材
料である。特にGaAsなどの化合物半導体の製造
においては、PBNのすぐれた耐食性と高純度が
最大限有効に発揮されており、不純物が少く電気
特性の優れた化合物半導体単結晶を育成する上で
不可欠な材料となつている。たとえば、GaAs単
結晶育成においてPBNは、LEC法におけるるつ
ぼとして、またHB法(水平ブリツジマン法)に
おけるボートとしてそれぞれ用いられている。ま
た、GaAs単結晶ウエハー上にGa1-XAlXAsなど
の混晶化合物半導体をエピタキシヤル成長させる
一方法である分子線エピタキシー法における金属
溶融用容器(るつぼ)としてもPBNがほぼ独占
的に用いられている。
PBNは、たとえば米国特許第3152006号明細書
で開示されているように、三塩化ホウ素(BCl3)
のようなハロゲン化ホウ素とアンモニアを気体状
原料とし、温度1450℃〜2300℃、圧力50Tprr未満
の条件下で、適当な基材表面上にBNを析出させ
るいわゆる化学気相蒸着法(CVD法)により合
成される。基材材料とCVD条件を適切に選べば、
析出したPBN膜を基材から分離し、自立型PBN
物品を得ることができる。このようにして得られ
るPBNは膜の成長方向に対し垂直な方向に六方
晶BNのC面が高度に配向した構造をしており、
各種物性に著しい異方性を有している。機械的性
質においては、PBN膜の平面方向では良好な強
度を有するが、膜成長方向の強度はあまり強くな
く、このため膜成長方向に薄膜状に剥離しやすい
という性質を持つ。しかし、このようなPBNの
剥離しやすいという性質は、PBN製るつぼを繰
り返し使用する際の寿命を縮める大きな原因とな
つていた。以下にLEC法用るつぼ、MBE用るつ
ぼで従来発生していた問題点を説明する。
GaAsやInPなどの化合物半導体単結晶棒は、
PBNのるつぼ内でこれら化合物もしくはその原
料を溶融し、その上部を高純度B2O3の融液で封
止した状態で化合物の種結晶をるつぼ内の化合物
融液に付け、融液から徐々に化合物単結晶棒を引
き上げるLEC法により巾広く生産されている。
単結晶の引き上げを完了したるつぼは室温まで冷
却され、再度の使用のため、冷却固化してるつぼ
内壁に付着した封止剤のB2O3を除去する作業が
必要となるが、B2O3除去の際にPBN層の一部が
B2O3に付着したままるつぼ内壁から剥離すると
いう現象が頻繁に発生する。PBN層の剥離がる
つぼ内面全域で均一に起きることは極めて稀で、
多くの場合るつぼ内面のある一部だけが剥離し、
しかも剥離する部分の厚さも不均一である。はな
はだしい場合には局所的剥離がるつぼ外壁面にま
でおよびるつぼの破損に至る。また剥離がそれ程
深くない場合でも、剥離部をそのままにして再使
用すると、積層構造となつているBN層の層間が
融液と接触するために、融液中の微量不純物が層
間に濃縮されて再度の使用時に不純物を放出した
り、B2O3除去時に新たな剥離を起こしたりする
ので好ましくなく、従つて剥離が発生した場合に
は、その剥離部の一番深い部分にあわせて剥離が
起きなかつた部分までも取り除く必要がある。こ
の作業の際に新たな深い剥離部が導入される場合
もある。このため一度の剥離によつてはるつぼの
破損には至らないまでも、るつぼ肉厚が結晶育成
ごとに薄くなつて行き、数回〜十回程度でるつぼ
の寿命が尽きてしまつていた。
またMBE用るつぼとしてPBNを用い、特にア
ルミニウムのようにPBNとの濡れが良い金属な
どを溶融する場合、MBE装置を停止する際には
るつぼの冷却を伴うが、この時るつぼとその内部
の金属との間の熱膨張係数の差が著しいため、る
つぼは苛酷な応力にさらされる。特に溶融金属が
るつぼに良く濡れるために冷却固化した金属は非
常に強固にるつぼ内壁に付着しており、このため
しばしばるつぼの破損にまで至ることがあつた。
このような問題を解決する方法として、構造全
体を支えるための肉厚の最外壁と、これに弱く接
合した肉薄の中間壁と内壁からなる多層壁構造る
つぼが提案(特公昭56−17428号公報、特公昭55
−44154号公報)され市販されている。このよう
な多層壁構造るつぼはMBEなどの金属溶融用る
つぼとして一定の成果を上げているが、たとえば
米国ユニオン・カーバイド社のテクニカル・イン
フオメーシヨンにも明記されているように、最内
壁が破損してしまうとるつぼ内の金属が内壁外側
にしみ出して行くため、次回から使用できなくな
つてしまつていた。また、従来の多層壁構造るつ
ぼは、各壁を析出形成する度に、一たん析出反応
を中断し、温度を下げた後、再度温度を析出温度
に戻して析出反応を再開するという方法で製造さ
れており、製造上非常に手間がかかり、かつ時間
を要するという欠点があつた。
本願発明者らは従来のPBNるつぼのこのよう
な欠点を解決するために、るつぼの構造とその製
造方法について検討を加えた結果、BNるつぼを
ある特定範囲の厚さからなる多数の個別壁で構成
することにより従来のPBNの欠点が著しく改善
されることを見出すと共に、多重壁構造PBNる
つぼを容易に製造できる方法を完成したものであ
る。
〔問題点を解決するための手段〕
本発明は、以下を要旨とするものである。
(1) 1層の厚みが5〜100μmである個別的な壁が
少なくとも5層以上互いに結合してなつてお
り、かつ、全体の壁厚が0.5〜3mmであること
を特徴とする多重壁構造からなる窒化ホウ素る
つぼ。
(2) 1層の厚みが5〜100μmである個別的な壁が
少なくとも5層以上互いに結合してなつてお
り、かつ、全体の壁厚が0.5〜3mmである窒化
ホウ素るつぼを、ハロゲン化ホウ素ガスとアン
モニアガスを原料とする化学気相成長法により
製造する際に、第1の壁を1時間あたり10〜
150μmの成長速度で、また、これに隣接する第
2の壁を第1の壁の1.5〜5倍の成長速度で、
それぞれ交互に繰り返しながら形成させていく
ことを特徴とする多重壁構造からなる窒化ホウ
素るつぼの製法。
以下、さらに詳しく本発明について説明する。
第1発明の多重壁構造るつぼは、個別壁の厚み
が5〜100μmの範囲でなければならない。個別壁
の厚みが5μm以下であると個々の壁の間での区分
が明確でなくなり、多重壁構造の効果が得られな
い。また個別壁の厚みが100μmをこえると壁間の
応力により自発的なラミネーシヨン現象が壁間で
起こり、不純物のトラツプなど好ましくない結果
を招く。るつぼ全体は、上記の個別壁が少くとも
5層以上互いに結合、望ましくは互いに弱く結合
して構成される。5層未満ではるつぼ全体の厚み
が薄く、十分な強度が得られない。なお、るつぼ
構成壁の層数は個々の壁の厚みと所望のるつぼ全
体厚みとから定まる。るつぼ全体の壁厚は0.5〜
3mmとする必要がある。0.5mm未満では全体の強
度が不足し、また3mmをこえると内部応力の増大
により自発的なラミネーシヨンの発生を招くこと
になる。
本発明のこのような多重壁構造るつぼを用いる
と、従来のPBNるつぼよりも著しく寿命が延長
される。まず、LEC法用るつぼとして用いた場
合の挙動を説明する。本発明のるつぼは多数の
BN壁が互いに結合しているので、LEC法による
結晶育成後にB2O3を除去する際にBN層の剥離が
起きるとしても、剥離がBNるつぼ作製時に意図
的に好ましく導入された結合力の弱い壁間部分で
選択的に開始され、しかも剥離の伝播が剥離が開
始された壁間にのみ起こるので、従来のPBNる
つぼに認められていたような、伝播しながら同時
に剥離膜厚が増加するという剥離の深化拡大現象
は起こらない。しかも、個々のBN層の厚みを5
〜100μmにすると、理由は未だ良く判明していな
いが、互いに結合した多数のBN層のうち常にる
つぼの最内壁側にある層から剥離して行くことが
見出された。従つてB2O3除去時に発生する剥離
が、常にるつぼ最内壁層で起こり、かつ、剥離が
深くなることなく部分剥離層を除去できるので、
るつぼの寿命が従来のものよりも大巾に伸び、し
かもるつぼ間での寿命のバラツキが少ないという
特徴を有している。
またMBEなど金属溶融用に本発明のるつぼを
用いると、多重壁のうち最内壁のBNは冷却時に
金属と固着しるつぼ内側への引張り応力を受ける
が、その厚みが最大でも100μmと薄いため極めて
柔軟で、しかもその外側の壁とは弱く結合してい
るので、金属が付着した最内壁は破損することな
く、外側の壁からわずかに離れ金属とともに収縮
する。また仮りに最内壁が破損し、溶融金属が壁
間にしみ出したとしてもその外側に最内壁と同様
の特性を有する多数のBN壁が存在するので、従
来とは異なり更に使用を続けることができる。こ
のように本発明のBNるつぼを用いると従来より
も多くの繰り返し使用が可能となる。
次に、第2発明について説明する。この発明
は、多重壁構造BNるつぼのうち、とくにPBNる
つぼの製法に関するものである。まず、多重壁構
造のPBNるつぼを形成する個別的な壁は、三塩
化ホウ素などのハロゲン化ホウ素ガスとアンモニ
アガスとを原料とするCVD法により形成される
が、その時の圧力は0.5〜5Torrの範囲内に、ま
た温度は1850〜1950℃の範囲内にするのが望まし
い。圧力が0.5Torr未満ではPBNの分解が活発に
なり、また5TorrをこえるとBNの微粒子が副生
しPBN膜中に取り込まれて組織の均一性が損な
われ好ましくない。温度が1850℃未満では生成す
る。PBNの強度が低く、るつぼとしての実用強
度が不足する。また1950℃をこえると、基材の黒
鉛とPENとの間で反応が起こり、PBNのB4C化
とPBN中のカーボン不純物量の増大という好ま
しくない結果を招く。最も好ましい圧力、温度条
件は0.75〜3Torr、1900〜1940℃である。このよ
うな条件で形成される個別の壁同志を互いに弱く
結合させるためには、隣接する壁と壁とを互いに
異つた膜成長速度(蒸着速度)で形成する必要が
あるが、この際第1の壁は1時間あたり10〜
150μmの成長速度で、またこれに隣接する第2の
壁は第1の壁の1.5〜5倍の成長速度で形成する
サイクルを繰り返して行う。
第1の壁と第2の壁の成長速度に1.5〜5倍の
差を与える理由は、成長速度が1.5倍未満の差で
あると2つの壁の間の結合力が、単一の一定した
成長速度で形成した連続的な膜の場合とあまり変
わらないため、多重壁構造とする本発明の目的が
達成されず、また成長速度に5倍をこえる差を与
えると2つの壁の間の結合力が弱くなりすぎてる
つぼに自発的ラミネーシヨンが発生してしまうか
らである。また壁の成長速度は最高でも毎時
750μm以下でなければない。これは、毎時750μm
をこえる成長速度で形成されたPBN膜の機械的
強度は著しく低くなるためである。このため第2
の壁に対し、その1/1.5〜1/5の成長速度で形成さ
れる第1の壁の成長速度は必然的に毎時150μm以
下となる。また、第1の壁は、少くとも毎時
10μm以上の成長速度で形成することが好ましい。
これは1個のるつぼを完成させるのに要する時間
が不必要に長くなるのを避けるためである。品質
的に良好で、しかも生産性の点からも好ましい条
件としては、たとえば第1の壁を毎時50〜
150μm、第2の壁を毎時75〜250μmの成長速度で
形成する方法があげられる。
1個のるつぼを作製するためには、上述の第1
及び第2の壁を交互に繰り返し形成する必要があ
るが、第1から第2の、及び第2から第1の壁へ
と変化する際に、膜形成を一時的に中断する必要
は全くなく、連続的に変化させて良いので従来の
るつぼと同等の時間でるつぼを製造することがで
きる。
膜の成長速度を第1の壁と第2の壁とでそれぞ
れ変える方法としては、通常のCVD法において
成長速度に影響するとされている各種の要因を所
定時間ごとに変化させることがあげられる。即
ち、CVD反応室内に導入される原料ガスの濃度、
基材上を流れるガスの流速などの要因を変化させ
れば良いのであつて、たとえば導入するガスの組
成、流量、CVD反応室内の圧力などを所定時間
ごとに繰り返し変化させて行けば良い。
〔実施例〕
実施例 1〜5
5cm巾×60cm長×1cm厚の黒鉛板8枚を使い、
直径20cmの黒鉛板(底板)の上面に8角形の断面
を有する反応室を形成した。底板の中央にはガス
導入のため直径5cmの孔をあけ、原料ガス導入管
として予めPBN被覆した黒鉛パイプ2本(外径
5cm及び2.5cm)を同軸になるよう接続し、反応
室上部から直径5cm、長さ6cmの黒鉛基材を吊り
下げた。この反応室全体を高温抵抗加熱真空炉内
に装入し、原料ガス導入管の黒鉛パイプの内外管
には各々BCl3、NH3ガスを供給できるよう、ス
テンレス製ガス配管を接続した。
炉を10-3Torr台に排気しながら、1900℃にま
で加熱し1Torrの圧力下、表に示す条件で全体壁
厚1mmの様々のPBNるつぼを形成した。成長速
度は原料ガスの濃度をかえて行つた。得られたる
つぼについて、LEC法による単結晶育成を想定
した寿命テストを次の方法により実施した。
即ち、るつぼ内に50gのB2O3を入れ、N2雰囲
気中で1280℃に加熱してB2O3を溶融した後室温
まで冷却する。るつぼ内壁に付着したB2O3は、
るつぼ全体をメタノール中に浸し、20〜40分間超
音波洗浄することにより取り除かれるが、この
際、B2O3の冷却収縮時にB2O3に付着していた
PBNるつぼ内壁面の一部が剥がれる。これをる
つぼが破損するまで繰り返した。各々のるつぼの
破損までの回数は表に示した。同様のテストを市
販るつぼ(比較例5)についても行つた。
[Industrial Field of Application] The present invention relates to an improved boron nitride crucible and a method for manufacturing the same, particularly for molecular beam epitaxy (MBE).
The present invention relates to a crucible for melting metals and chemicals, and a method for manufacturing the same, for use in the Liquid Encapsulated Czyochralski (LEC) method, etc. [Prior art and its problems] Pyrolytic boron nitride (PBN) is a high-purity, high-quality boron nitride (BN) material that is used in a wide range of fields such as the production of compound semiconductors and special alloys. In particular, in the production of compound semiconductors such as GaAs, PBN's excellent corrosion resistance and high purity are utilized to the maximum extent possible, making it an indispensable material for growing compound semiconductor single crystals with few impurities and excellent electrical properties. It's summery. For example, in GaAs single crystal growth, PBN is used as a crucible in the LEC method and as a boat in the HB method (horizontal Bridgeman method). PBN is also used almost exclusively as a container (crucible) for melting metal in molecular beam epitaxy, which is a method for epitaxially growing mixed crystal compound semiconductors such as Ga 1-X Al X As on GaAs single crystal wafers. It is used. PBN is boron trichloride (BCl 3 ), as disclosed for example in U.S. Pat. No. 3,152,006.
The so-called chemical vapor deposition method (CVD method) uses boron halide and ammonia as gaseous raw materials, and deposits BN on the surface of a suitable substrate at a temperature of 1450℃ to 2300℃ and a pressure of less than 50T prr . ) is synthesized by If you choose the base material and CVD conditions appropriately,
Separate the precipitated PBN film from the substrate and create free-standing PBN.
Goods can be obtained. The PBN obtained in this way has a structure in which the C-plane of hexagonal BN is highly oriented in the direction perpendicular to the film growth direction.
It has remarkable anisotropy in various physical properties. In terms of mechanical properties, the PBN film has good strength in the plane direction, but its strength in the film growth direction is not so strong, and therefore it tends to peel off into thin films in the film growth direction. However, the tendency of PBN to peel off has been a major cause of shortening the lifespan of PBN crucibles when used repeatedly. Below, we will explain the problems that conventionally occurred with crucibles for LEC and MBE. Compound semiconductor single crystal rods such as GaAs and InP are
These compounds or their raw materials are melted in a PBN crucible, the upper part of which is sealed with a melt of high-purity B 2 O 3 , and seed crystals of the compound are attached to the compound melt in the crucible, and gradually extracted from the melt. It is widely produced by the LEC method, which involves pulling single crystal rods of compounds.
After the single crystal has been pulled, the crucible is cooled to room temperature, and in order to be used again, it is necessary to remove the B 2 O 3 sealant that has cooled and solidified and adhered to the inner wall of the crucible . 3During removal, some of the PBN layer
The phenomenon of peeling off from the inner wall of the crucible while remaining attached to B 2 O 3 frequently occurs. It is extremely rare that the PBN layer peels off uniformly over the entire inner surface of the crucible.
In many cases, only a certain part of the inner surface of the crucible peels off,
Moreover, the thickness of the part to be peeled off is also non-uniform. In extreme cases, localized peeling may extend to the outer wall of the crucible, leading to damage to the crucible. In addition, even if the peeling is not that deep, if the peeled part is left as is and reused, the interlayers of the BN layer in the laminated structure will come into contact with the melt, so trace impurities in the melt will be concentrated between the layers. This is undesirable as it may release impurities when used again or cause new flaking when removing B 2 O 3. Therefore, if flaking occurs, remove the flaking at the deepest part of the flaking area. It is necessary to remove even the parts that did not occur. New deep peels may be introduced during this operation. For this reason, even if one peeling does not result in damage to the crucible, the thickness of the crucible becomes thinner each time crystals are grown, and the life of the crucible ends after several to ten times. In addition, when using PBN as a crucible for MBE and melting a metal such as aluminum that has good wettability with PBN, the crucible must be cooled down when the MBE equipment is stopped. The crucible is exposed to severe stress due to the significant difference in coefficient of thermal expansion between In particular, since the molten metal wets the crucible well, the cooled and solidified metal adheres very firmly to the inner wall of the crucible, which often leads to damage to the crucible. As a way to solve these problems, a multilayered wall structure crucible was proposed, consisting of a thick outermost wall to support the entire structure, and a thin middle wall and inner wall weakly connected to this (Japanese Patent Publication No. 17428/1983). , special public service 1977
-44154) and is commercially available. Such multi-wall structure crucibles have achieved a certain degree of success as metal melting crucibles such as MBE, but as stated in the technical information of Union Carbide Company in the United States, for example, the innermost wall may be damaged. If this happens, the metal inside the crucible will seep out to the outside of the inner wall, making it impossible to use it the next time. In addition, conventional multi-walled crucibles are manufactured by stopping the precipitation reaction every time each wall is deposited, lowering the temperature, and then returning the temperature to the precipitation temperature and restarting the precipitation reaction. However, it has the disadvantage that it is very labor intensive and time consuming to manufacture. In order to solve these drawbacks of conventional PBN crucibles, the inventors of the present application investigated the structure of the crucible and its manufacturing method, and as a result, they developed a BN crucible with a large number of individual walls each having a thickness within a certain range. We have found that the disadvantages of conventional PBN can be significantly improved by this structure, and we have also completed a method for easily producing a multi-walled PBN crucible. [Means for Solving the Problems] The gist of the present invention is as follows. (1) A multi-wall structure characterized by having at least five layers of individual walls each having a thickness of 5 to 100 μm bonded to each other, and having an overall wall thickness of 0.5 to 3 mm. A boron nitride crucible made of. (2) A boron nitride crucible, which has at least five layers of individual walls each having a thickness of 5 to 100 μm bonded to each other, and has a total wall thickness of 0.5 to 3 mm, is heated using boron halide. When manufacturing by chemical vapor deposition using gas and ammonia gas as raw materials, the first wall is
At a growth rate of 150 μm, and a second wall adjacent to this at a growth rate of 1.5 to 5 times that of the first wall,
A method for manufacturing a boron nitride crucible having a multi-walled structure, which is characterized by forming each wall in an alternating manner. The present invention will be explained in more detail below. In the multi-walled crucible of the first invention, the thickness of the individual walls must be in the range of 5 to 100 μm. If the thickness of the individual walls is less than 5 μm, the divisions between the individual walls will not be clear, and the effect of the multi-wall structure will not be obtained. Furthermore, when the thickness of the individual walls exceeds 100 μm, spontaneous lamination occurs between the walls due to stress between the walls, leading to undesirable results such as trapping of impurities. The entire crucible is composed of at least five layers of the above-mentioned individual walls bonded to each other, preferably weakly bonded to each other. If the number of layers is less than 5, the thickness of the entire crucible is too thin and sufficient strength cannot be obtained. Note that the number of layers of the walls constituting the crucible is determined from the thickness of each wall and the desired overall thickness of the crucible. The wall thickness of the entire crucible is 0.5 ~
It needs to be 3mm. If it is less than 0.5 mm, the overall strength will be insufficient, and if it exceeds 3 mm, spontaneous lamination will occur due to increased internal stress. Using such a multi-walled crucible of the present invention significantly extends the life span over conventional PBN crucibles. First, the behavior when used as a crucible for the LEC method will be explained. The crucible of the present invention has a large number of
Since the BN walls are bonded to each other, even if the BN layer peels off when B 2 O 3 is removed after crystal growth by the LEC method, the peeling is due to the bonding force intentionally introduced when making the BN crucible. Since the delamination is selectively initiated at weak interwall regions and the propagation of delamination occurs only between the walls where delamination is initiated, the thickness of the delamination film increases at the same time as it propagates, as observed in conventional PBN crucibles. This phenomenon of deepening and widening of peeling does not occur. Moreover, the thickness of each BN layer is 5
It has been found that when the thickness is set to ~100 μm, the layer on the innermost wall side of the crucible always peels off among the many mutually bonded BN layers, although the reason is not yet clear. Therefore, the peeling that occurs during B 2 O 3 removal always occurs at the innermost wall layer of the crucible, and the partially peeled layer can be removed without deep peeling.
The lifespan of the crucible is significantly longer than that of conventional crucibles, and it has the characteristics that there is little variation in the lifespan between crucibles. Furthermore, when the crucible of the present invention is used for metal melting such as MBE, the BN on the innermost wall of the multiple walls is subjected to tensile stress toward the inside of the crucible as it adheres to the metal during cooling. Because it is flexible and weakly bonded to its outer wall, the innermost wall with metal attached will not break, but will slightly separate from the outer wall and contract with the metal. Furthermore, even if the innermost wall is damaged and molten metal seeps between the walls, there are many BN walls outside that have the same characteristics as the innermost wall, so it is not possible to continue using it, unlike in the past. can. In this way, the use of the BN crucible of the present invention allows for more repeated use than before. Next, the second invention will be explained. The present invention particularly relates to a method for manufacturing a PBN crucible among multi-walled BN crucibles. First, the individual walls forming the multi-walled PBN crucible are formed by a CVD method using boron halide gas such as boron trichloride and ammonia gas as raw materials, at a pressure of 0.5 to 5 Torr. Preferably, the temperature is within the range of 1850 to 1950°C. If the pressure is less than 0.5 Torr, the decomposition of PBN becomes active, and if the pressure exceeds 5 Torr, fine particles of BN are generated as a by-product and incorporated into the PBN film, which is undesirable because the uniformity of the structure is impaired. Forms at temperatures below 1850°C. PBN has low strength and lacks practical strength as a crucible. Moreover, when the temperature exceeds 1950°C, a reaction occurs between the graphite of the base material and PEN, resulting in unfavorable results such as conversion of PBN to B 4 C and an increase in the amount of carbon impurities in PBN. The most preferable pressure and temperature conditions are 0.75 to 3 Torr and 1900 to 1940°C. In order to weakly bond the individual walls formed under such conditions to each other, it is necessary to form adjacent walls at different film growth rates (evaporation rates). wall is 10~ per hour
A cycle of forming the second wall at a growth rate of 150 μm and a second wall adjacent thereto at a growth rate of 1.5 to 5 times that of the first wall is repeated. The reason for the 1.5 to 5 times difference in growth rate between the first wall and the second wall is that when the growth rate is less than 1.5 times different, the bonding force between the two walls becomes a single constant force. Since the growth rate is not much different from that of a continuous film formed, the purpose of the present invention, which is a multi-walled structure, is not achieved, and a difference in growth rate of more than five times causes the bond between the two walls to deteriorate. This is because spontaneous lamination occurs in pots where the force is too weak. Also, the growth rate of the wall is at most every hour.
Must be less than 750μm. This is 750 μm per hour
This is because the mechanical strength of a PBN film formed at a growth rate exceeding For this reason, the second
The growth rate of the first wall, which is formed at a growth rate of 1/1.5 to 1/5 of that of the first wall, is inevitably 150 μm or less per hour. Also, the first wall is that at least every hour
It is preferable to form at a growth rate of 10 μm or more.
This is to avoid unnecessary lengthening of the time required to complete one crucible. For example, as a condition that is good in terms of quality and is also preferable from the point of view of productivity, the first wall should be
150 μm, and a method of forming the second wall at a growth rate of 75 to 250 μm per hour. In order to produce one crucible, the first
Although it is necessary to repeatedly form the first and second walls alternately, there is no need to temporarily interrupt film formation when changing from the first to the second wall and from the second to the first wall. , can be changed continuously, so the crucible can be manufactured in the same time as a conventional crucible. One way to change the growth rate of the film on the first wall and the second wall is to change various factors that are said to affect the growth rate in regular CVD methods at predetermined intervals. That is, the concentration of the raw material gas introduced into the CVD reaction chamber,
Factors such as the flow rate of the gas flowing over the base material may be changed, and for example, the composition of the introduced gas, the flow rate, the pressure inside the CVD reaction chamber, etc. may be changed repeatedly at predetermined intervals. [Example] Examples 1 to 5 Using 8 graphite plates 5 cm wide x 60 cm long x 1 cm thick,
A reaction chamber having an octagonal cross section was formed on the top surface of a graphite plate (bottom plate) with a diameter of 20 cm. A hole with a diameter of 5 cm is made in the center of the bottom plate for gas introduction, and two graphite pipes (outer diameter 5 cm and 2.5 cm) coated with PBN in advance are connected coaxially as raw material gas introduction pipes. A graphite substrate measuring 5 cm and 6 cm in length was suspended. The entire reaction chamber was placed in a high-temperature resistance heating vacuum furnace, and stainless steel gas piping was connected to the inner and outer graphite pipes of the raw material gas introduction pipe so that BCl 3 and NH 3 gas could be supplied, respectively. While the furnace was evacuated to a level of 10 -3 Torr, it was heated to 1900° C. and under a pressure of 1 Torr, various PBN crucibles with an overall wall thickness of 1 mm were formed under the conditions shown in the table. The growth rate was controlled by changing the concentration of the raw material gas. A life test on the obtained crucible assuming single crystal growth by the LEC method was conducted using the following method. That is, 50 g of B 2 O 3 is placed in a crucible, heated to 1280° C. in an N 2 atmosphere to melt the B 2 O 3 , and then cooled to room temperature. B 2 O 3 attached to the inner wall of the crucible is
The entire crucible is immersed in methanol and cleaned by ultrasonic cleaning for 20 to 40 minutes, which removes the residue that was attached to the B2O3 during the cooling contraction of the B2O3.
Part of the inner wall of the PBN crucible peels off. This was repeated until the crucible was damaged. The number of times until failure of each crucible is shown in the table. A similar test was also conducted on a commercially available crucible (Comparative Example 5).
【表】【table】
本発明のるつぼを用いることにより、MBE法
やLEC法におけるるつぼ寿命が延長できるので、
化合物半導体の製造コストが低減できる。
また本発明の製造方法は、蒸着の中断操作がな
いので効率良く高性能るつぼを製造することがで
きる。
By using the crucible of the present invention, the life of the crucible in the MBE method and LEC method can be extended.
The manufacturing cost of compound semiconductors can be reduced. Furthermore, the manufacturing method of the present invention does not require interruption of vapor deposition, so that a high-performance crucible can be efficiently manufactured.
Claims (1)
少なくとも5層以上互いに結合してなつており、
かつ、全体の壁厚が0.5〜3mmであることを特徴
とする多重壁構造からなる窒化ホウ素るつぼ。 2 1層の厚みが5〜100μmである個別的な壁が
少なくとも5層以上互いに結合してなつており、
かつ、全体の壁厚が0.5〜3mmである窒化ホウ素
るつぼを、ハロゲン化ホウ素ガスとアンモニアガ
スを原料とする化学気相成長法により製造する際
に、第1の壁を1時間あたり10〜150μmの成長速
度で、また、これに隣接する第2の壁を第1の壁
の1.5〜5倍の成長速度で、それぞれ交互に繰り
返しながら形成させていくことを特徴とする多重
壁構造からなる窒化ホウ素るつぼの製法。[Claims] 1. At least five or more layers of individual walls each having a thickness of 5 to 100 μm are bonded to each other,
A boron nitride crucible having a multi-wall structure, characterized in that the total wall thickness is 0.5 to 3 mm. 2 At least five or more layers of individual walls each having a thickness of 5 to 100 μm are bonded to each other,
In addition, when manufacturing a boron nitride crucible with a total wall thickness of 0.5 to 3 mm by chemical vapor deposition using boron halide gas and ammonia gas as raw materials, the first wall is grown at a rate of 10 to 150 μm per hour. A nitriding method consisting of a multi-wall structure, characterized in that the second wall adjacent to this wall is formed at a growth rate of 1.5 to 5 times that of the first wall, alternately and repeatedly. How to make a boron crucible.
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12523085A JPS61285382A (en) | 1985-06-11 | 1985-06-11 | Boron nitride crucible and manufacture thereof |
| US06/866,823 US4773852A (en) | 1985-06-11 | 1986-05-22 | Pyrolytic boron nitride crucible and method for producing the same |
| EP86107961A EP0206120B1 (en) | 1985-06-11 | 1986-06-11 | Pyrolytic boron nitride crucible and method for producing the same |
| DE8686107961T DE3668162D1 (en) | 1985-06-11 | 1986-06-11 | PYROLYTIC BORNITRIDE POT AND METHOD FOR THE PRODUCTION THEREOF. |
| US07/319,902 US4913652A (en) | 1985-06-11 | 1989-03-03 | Pyrolytic boron nitride crucible and method for producing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12523085A JPS61285382A (en) | 1985-06-11 | 1985-06-11 | Boron nitride crucible and manufacture thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61285382A JPS61285382A (en) | 1986-12-16 |
| JPH0455159B2 true JPH0455159B2 (en) | 1992-09-02 |
Family
ID=14905038
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12523085A Granted JPS61285382A (en) | 1985-06-11 | 1985-06-11 | Boron nitride crucible and manufacture thereof |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61285382A (en) |
-
1985
- 1985-06-11 JP JP12523085A patent/JPS61285382A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61285382A (en) | 1986-12-16 |
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