JPH0456799B2 - - Google Patents

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Publication number
JPH0456799B2
JPH0456799B2 JP11614885A JP11614885A JPH0456799B2 JP H0456799 B2 JPH0456799 B2 JP H0456799B2 JP 11614885 A JP11614885 A JP 11614885A JP 11614885 A JP11614885 A JP 11614885A JP H0456799 B2 JPH0456799 B2 JP H0456799B2
Authority
JP
Japan
Prior art keywords
susceptor
carbon plate
vapor phase
phase growth
growth apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11614885A
Other languages
Japanese (ja)
Other versions
JPS61275193A (en
Inventor
Taisan Goto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibaura Machine Co Ltd
Original Assignee
Toshiba Machine Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Machine Co Ltd filed Critical Toshiba Machine Co Ltd
Priority to JP11614885A priority Critical patent/JPS61275193A/en
Publication of JPS61275193A publication Critical patent/JPS61275193A/en
Publication of JPH0456799B2 publication Critical patent/JPH0456799B2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【発明の詳細な説明】 〔発明の属する技術分野〕 本発明はエピタキシヤル或いはCVD等の気相
成長装置用のサセプタに関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of the Invention] The present invention relates to a susceptor for a vapor phase growth apparatus such as epitaxial or CVD.

〔従来技術〕[Prior art]

このような気相成長装置のうち例えば縦型形式
における従来のサセプタの一例を第3図により述
べる。サセプタ11は通常10mmないし30mm厚さの
円形をしたカーボン製であつて、中央の孔12は
不図示の回転軸及び反応ガス供給管が挿入される
孔であり上面の複数の凹み13は不図示のウエハ
を載置し、さらに高周波コイル14により加熱さ
れウエハを主としてサセプタからの熱伝導によつ
て昇温させるようになつている。この際複数のウ
エハは面内で均一な温度に昇温させることが重要
であり、ウエハ面内での温度分布はサセプタ11
面内での温度分布に強く依存するためサセプタ1
1面内での均一な温度分布は不可欠である。
An example of a conventional susceptor in a vertical type of such a vapor phase growth apparatus will be described with reference to FIG. The susceptor 11 is usually made of carbon and has a circular shape with a thickness of 10 mm to 30 mm, and the central hole 12 is a hole into which a rotating shaft (not shown) and a reaction gas supply pipe are inserted, and a plurality of recesses 13 (not shown) on the top surface are inserted. A wafer is placed on the susceptor, and the wafer is further heated by a high frequency coil 14, and the temperature of the wafer is raised mainly by heat conduction from the susceptor. At this time, it is important to raise the temperature of the multiple wafers to a uniform temperature within the plane, and the temperature distribution within the wafer plane is controlled by the susceptor 11.
Susceptor 1 because it strongly depends on the in-plane temperature distribution
Uniform temperature distribution within one plane is essential.

第3図に示したようにサセプタ11の下面に高
周波コイル14を設けた場合では、高周波コイル
14とサセプタ11下面との距離を調整すること
によりサセプタ11半径方向の温度分布を最適に
し、サセプタ11を回転することによりサセプタ
11の円周方向の温度分布の均一化をはかつてい
る。この場合サセプタ11は誘導電流により加熱
されており良好な温度分布を得るためには、サセ
プタ面方向の熱伝導を良くすることが重要であり
またサセプタ11の熱容量を増加すること従つて
その厚さを一定値以上にすることが必要である。
サセプタ11を厚くすることは、熱電源即ち高周
波コイル14の容量が大きくなりエネルギコスト
を増大させると共に、サセプタ11の昇降温に要
する時間は増加しこの結果シーケンス時間も増加
し生産性を低下させるという欠点があつた。
In the case where the high frequency coil 14 is provided on the lower surface of the susceptor 11 as shown in FIG. By rotating the susceptor 11, the temperature distribution in the circumferential direction of the susceptor 11 is made uniform. In this case, the susceptor 11 is heated by the induced current, and in order to obtain a good temperature distribution, it is important to improve the heat conduction in the direction of the susceptor surface. It is necessary to make it above a certain value.
Increasing the thickness of the susceptor 11 increases the capacity of the thermal power source, that is, the high-frequency coil 14, increasing energy costs, and increases the time required to raise and lower the temperature of the susceptor 11, resulting in an increase in sequence time and a decrease in productivity. There were flaws.

〔発明の目的〕[Purpose of the invention]

本発明はこのような観点からなされたものでそ
の目的は、サセプタの厚さを増加させることなく
その面内での温度分布を均一にすることにより、
製品の品質を高くすると共に省エネルギを可能に
しさらに昇降温の時間を短縮して生産性を高くし
た気相成長装置用サセプタを提供することにあ
る。
The present invention was made from this point of view, and its purpose is to make the temperature distribution uniform within the surface of the susceptor without increasing the thickness of the susceptor.
It is an object of the present invention to provide a susceptor for a vapor phase growth apparatus that improves the quality of the product, saves energy, and shortens the time for raising and lowering the temperature to increase productivity.

〔発明の要点〕[Key points of the invention]

本発明の気相成長装置用サセプタは、上下2枚
のカーボン板からなり2枚の間に赤外線を通す熱
不良導帯域を介在させたことを特徴としている。
The susceptor for a vapor phase growth apparatus of the present invention is characterized by comprising two carbon plates, an upper and a lower carbon plate, and a thermally defective conductive band for transmitting infrared rays is interposed between the two plates.

〔発明の実施例〕[Embodiments of the invention]

以下本発明の一実施例を示した第1図について
説明する。サセプタ21は、従来例のサセプタ1
1に対し直径はほぼ同じであるが厚さを1/2ない
し1/3にした下側カーボン板22と、下側カーボ
ン板22に対しほぼ同一形状の上側カーボン板2
3との2枚に分割されている。上側カーボン板2
3は外周のリング状の支持体24と内周のリング
状の支持体25とにより下側カーボン板22に載
置されており、両カーボン板22および23の間
には間隔の比較的狭い密閉された空間26が形成
されている。上記の支持体24および25は熱不
良導体でもよいし両カーボン板24および25の
いづれかと一体にしてもよいし、また外周或いは
内周のいづれか一側にのみ設けるようにしてもよ
いし、さらにリング状ではなくリングを分割した
部分的な形状でもよい。なお12は不図示の回転
軸が挿入される孔であり、13は不図示のウエハ
を載置する凹部であり、そして14は高周波コイ
ルである。このようなサセプタ21において下側
カーボン板22が高周波コイル14により誘導加
熱されると下側カーボン板22の全表面から略均
一な分布で赤外線の輻射光が散乱状に放出され上
側カーボン板23はこれを吸収してさらに均一に
加熱される。このように上側カーボン板の昇温過
程は、先づ高周波コイル14により下側カーボン
板22が直接加熱されるという第1段階と、次い
で下側カーボン板22からの輻射光及び両カーボ
ン板22および23の間の空間26に存在する熱
不良導体の気体による間接的な熱伝導等による上
側カーボン板23の加熱という第2段階とに分け
ることができ、間接加熱であるため上側カーボン
板23の面内での均熱性は大巾に向上する。
FIG. 1, which shows one embodiment of the present invention, will be described below. The susceptor 21 is the conventional susceptor 1
1, the lower carbon plate 22 has approximately the same diameter but 1/2 or 1/3 the thickness, and the upper carbon plate 2 has approximately the same shape as the lower carbon plate 22.
It is divided into two pieces, 3 and 3. Upper carbon plate 2
3 is placed on the lower carbon plate 22 by a ring-shaped support 24 on the outer periphery and a ring-shaped support 25 on the inner periphery, and there is a relatively narrow airtight space between the carbon plates 22 and 23. A space 26 is formed. The supports 24 and 25 described above may be thermally poor conductors, may be integrated with either of the carbon plates 24 and 25, may be provided only on one side of the outer circumference or the inner circumference, and Instead of a ring shape, the shape may be a partial shape obtained by dividing a ring. Note that 12 is a hole into which a rotating shaft (not shown) is inserted, 13 is a recessed portion on which a wafer (not shown) is placed, and 14 is a high frequency coil. In such a susceptor 21, when the lower carbon plate 22 is induction-heated by the high-frequency coil 14, infrared radiation is scattered from the entire surface of the lower carbon plate 22 with a substantially uniform distribution, and the upper carbon plate 23 is heated. This is absorbed and heated evenly. In this way, the process of increasing the temperature of the upper carbon plate includes the first stage in which the lower carbon plate 22 is directly heated by the high-frequency coil 14, and then the radiant light from the lower carbon plate 22 and both carbon plates 22 and The second stage is heating of the upper carbon plate 23 by indirect heat conduction by the gas of the thermally poor conductor existing in the space 26 between the carbon plates 23 and 23. The heat uniformity inside the room is greatly improved.

第2図は本発明の第2実施例を示したサセプタ
31は、従来例のサセプタ11に対し直径を若干
大きくし厚さを1/2ないし1/3にした下側のカーボ
ン板32と、下側カーボン板32に対し直径を若
干小さくし厚さを同じにした上側カーボン板33
との2枚に分割されている。両カーボン板32お
よび33は両者の間の直接的な熱伝達を小さくす
るため熱不良導体である石英によるピン状の支持
体34をそれぞれに挿入することにより、上カー
ボン板33を下カーボン板32に載置しかつ両カ
ーボン板32および33の間には間隔の比較的狭
い空間35が形成されている。なおこの空間35
と前記第1実施例の空間26に赤外線は通すが熱
不良導体である石英板(図示せず)を挿入するな
らば、上側カーボン板23,33への下側カーボ
ン板22,32からの輻射光は減少することな
く、かつ下側カーボン板22,32は石英板を通
じたゆつくりした熱伝導により上側カーボン板2
3,33を補助加熱するという効果も加わり、上
側カーボン板23,33の均熱性向上と共に、間
接的に該上側カーボン板23,33の熱容量を増
加したことにもなり、熱的安定性は増大する。
FIG. 2 shows a second embodiment of the present invention. A susceptor 31 has a lower carbon plate 32 which has a slightly larger diameter and 1/2 to 1/3 thickness than the conventional susceptor 11. The upper carbon plate 33 has a slightly smaller diameter and the same thickness as the lower carbon plate 32.
It is divided into two pieces. In order to reduce direct heat transfer between the two carbon plates 32 and 33, pin-shaped supports 34 made of quartz, which is a poor thermal conductor, are inserted into each of them, so that the upper carbon plate 33 is connected to the lower carbon plate 32. A relatively narrow space 35 is formed between the two carbon plates 32 and 33. Furthermore, this space 35
If a quartz plate (not shown), which allows infrared rays to pass through but is a poor thermal conductor, is inserted into the space 26 of the first embodiment, the radiation from the lower carbon plates 22 and 32 to the upper carbon plates 23 and 33 will be reduced. The light does not decrease, and the lower carbon plates 22 and 32 are connected to the upper carbon plate 2 by slow heat conduction through the quartz plate.
3, 33 is added, the heat uniformity of the upper carbon plates 23, 33 is improved, and the heat capacity of the upper carbon plates 23, 33 is indirectly increased, resulting in an increase in thermal stability. do.

〔返明の効果〕[Effect of return]

本発明の気相成長装置用サセプタは以上説明し
たように、サセプタを上下2枚に分けることによ
り、先づ下側のカーボン板が加熱され、次いでウ
エハを載置する上側カーボン板が下側カーボン板
から散乱状に放出される輻射熱により間接的に加
熱される。このため上側カーボン板の均熱性が向
上し、この結果気相成長のスリツプ欠陥は大巾に
減少し、かつ気相成長層の膜厚や抵抗率等の均一
性も向上する。さらにサセプタは従来のものより
実質的に薄いため熱容量は小さく省エネルギにな
り、さらに上側サセプタは薄いため降温時間が短
かくなり、サイクルタイムを短縮できるので生産
性を高められる等の利点を有する。
As explained above, in the susceptor for a vapor phase growth apparatus of the present invention, by dividing the susceptor into upper and lower parts, the lower carbon plate is heated first, and then the upper carbon plate on which the wafer is placed is heated, and then the lower carbon plate is heated. It is indirectly heated by radiant heat emitted from the plate in a scattered manner. Therefore, the thermal uniformity of the upper carbon plate is improved, and as a result, slip defects in vapor phase growth are greatly reduced, and the uniformity of the film thickness, resistivity, etc. of the vapor phase growth layer is also improved. Furthermore, since the susceptor is substantially thinner than the conventional one, it has a small heat capacity and saves energy.Furthermore, since the upper susceptor is thin, the temperature drop time is shortened, and the cycle time can be shortened, which has the advantage of increasing productivity.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の断面図、第2図は
本発明の他の実施例の断面図、第3図は従来例の
断面図である。 22,32……下側カーボン板、23,33…
…上側カーボン板、24,25,34……支持
体、26,35……空間(熱不良導帯域)。
FIG. 1 is a sectional view of one embodiment of the present invention, FIG. 2 is a sectional view of another embodiment of the invention, and FIG. 3 is a sectional view of a conventional example. 22, 32... lower carbon plate, 23, 33...
...Upper carbon plate, 24, 25, 34... Support body, 26, 35... Space (thermal failure guide zone).

Claims (1)

【特許請求の範囲】 1 上下2枚のカーボン板からなり2枚の間に赤
外線を通す熱不良導帯域を介在させた気相成長装
置用サセプタ。 2 熱不良導帯域が空間であることを特徴とする
特許請求の範囲第1項記載の気相成長装置用サセ
プタ。 3 熱不良導帯域が石英板であることを特徴とす
る特許請求の範囲第1項記載の気相成長装置用サ
セプタ。 4 下側カーボン板と上側カーボン板の外周部お
よび或いは内周部のみの全周或いは一部が支持体
を介して接触していることを特徴とした特許請求
の範囲第2項記載の気相成長装置用サセプタ。 5 上側カーボン板は下側カーボン板上に熱不良
導体の支持体を介して載置されていることを特徴
とした特許請求の範囲第2項記載の気相成長装置
用サセプタ。
[Scope of Claims] 1. A susceptor for a vapor phase growth apparatus, which is made up of two carbon plates (upper and lower), with a thermally conductive band for transmitting infrared rays interposed between the two plates. 2. The susceptor for a vapor phase growth apparatus according to claim 1, wherein the thermal failure guide zone is a space. 3. The susceptor for a vapor phase growth apparatus according to claim 1, wherein the thermal failure guide zone is a quartz plate. 4. The gas phase according to claim 2, characterized in that the entire circumference or a part of only the outer periphery and/or inner periphery of the lower carbon plate and the upper carbon plate are in contact with each other via a support. Susceptor for growth equipment. 5. The susceptor for a vapor phase growth apparatus according to claim 2, wherein the upper carbon plate is placed on the lower carbon plate via a support made of a thermally poor conductor.
JP11614885A 1985-05-29 1985-05-29 Susceptor for vapor-phase growth device Granted JPS61275193A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11614885A JPS61275193A (en) 1985-05-29 1985-05-29 Susceptor for vapor-phase growth device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11614885A JPS61275193A (en) 1985-05-29 1985-05-29 Susceptor for vapor-phase growth device

Publications (2)

Publication Number Publication Date
JPS61275193A JPS61275193A (en) 1986-12-05
JPH0456799B2 true JPH0456799B2 (en) 1992-09-09

Family

ID=14679938

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11614885A Granted JPS61275193A (en) 1985-05-29 1985-05-29 Susceptor for vapor-phase growth device

Country Status (1)

Country Link
JP (1) JPS61275193A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01120814A (en) * 1987-11-04 1989-05-12 Tokyo Electron Ltd Semiconductor wafer placing table

Also Published As

Publication number Publication date
JPS61275193A (en) 1986-12-05

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