JPH0462010B2 - - Google Patents

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Publication number
JPH0462010B2
JPH0462010B2 JP59028498A JP2849884A JPH0462010B2 JP H0462010 B2 JPH0462010 B2 JP H0462010B2 JP 59028498 A JP59028498 A JP 59028498A JP 2849884 A JP2849884 A JP 2849884A JP H0462010 B2 JPH0462010 B2 JP H0462010B2
Authority
JP
Japan
Prior art keywords
temperature
sample
spectral
emissivity
thermal radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59028498A
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Japanese (ja)
Other versions
JPS60173430A (en
Inventor
Fukuzen Ko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ulvac Inc
Original Assignee
Ulvac Inc
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Filing date
Publication date
Application filed by Ulvac Inc filed Critical Ulvac Inc
Priority to JP2849884A priority Critical patent/JPS60173430A/en
Publication of JPS60173430A publication Critical patent/JPS60173430A/en
Publication of JPH0462010B2 publication Critical patent/JPH0462010B2/ja
Granted legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/60Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Description

【発明の詳細な説明】 本発明は放射率の測定方法に関する。一般に試
料の放射率は試料の材質、温度、酸化状態、表面
粗さ、波長等により変化するので黒体を試料と同
温度、同状態に設け、黒体からの熱放射と試料か
らの熱放射を夫々測定してその比を求めることに
より求めているが、これには試料及び黒体の温度
を予め知る必要があり、また黒体を設置し同温に
しなければならないので測定が複雑になる欠点が
ある。例えば試料が隔離された個所にあつて接触
式の測温を行なえない場合には放射率の測定が特
に困難で、放射率を知ることによつて得られる試
料の酸化状態、組成等を非接触式で知ることは出
来ない。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for measuring emissivity. In general, the emissivity of a sample changes depending on the material, temperature, oxidation state, surface roughness, wavelength, etc. of the sample, so a blackbody is placed at the same temperature and in the same condition as the sample, and thermal radiation from the blackbody and thermal radiation from the sample are It is determined by measuring each of these and finding the ratio, but this requires knowing the temperatures of the sample and blackbody in advance, and the blackbody must be installed to have the same temperature, making the measurement complicated. There are drawbacks. For example, if the sample is in an isolated location and contact temperature measurement is not possible, it is particularly difficult to measure emissivity. You can't know by formula.

本発明はこうした欠点を解消することを目的と
したもので、試料からの熱放射を分光して3色以
上の波長の分光熱放射を測定する一方、各波長に
於ける分光熱放射率を仮定して各分光熱放射率の
近似式を求め、該近似式に於ける前記各波長の近
似分光熱放射とこれに対応する前記測定の分光熱
放射との誤差を最小とする温度を求めて該試料の
温度とし、この温度と前記近似式とから該試料の
分光熱放射率を求めることを特徴とする。
The purpose of the present invention is to eliminate these drawbacks, and while measuring the spectral thermal radiation of three or more color wavelengths by spectrally dispersing the thermal radiation from the sample, the spectral thermal emissivity at each wavelength is assumed. Find an approximate formula for each spectral thermal emissivity, and then find the temperature that minimizes the error between the approximate spectral thermal radiation of each wavelength in the approximate formula and the corresponding spectral thermal radiation of the measurement. The method is characterized in that the temperature of the sample is taken as the temperature of the sample, and the spectral thermal emissivity of the sample is determined from this temperature and the approximate expression.

本発明の実施例を第1図示のように真空容器1
内に収めた試料2の放射率を測定する場合につき
説明する。同図に於て4は真空窓3を介して該試
料2の熱放射を複数の波長に分光する分光器5
と、分光された分光熱放射の量を検出する検出器
6と、その検出値を演算する計算機例えばマイク
ロプロセツサ7を備えた放射温度計を示し、該分
光器5に於ては好ましくは熱放射を4色の波長若
しくはそれ以上の波長に分光し、各分光熱放射は
分光数に応じた受光部を有する検出器6で同時に
測定され、各測定値はマイクロプロセツサ7に於
て試料2の放射率を求めるための演算に供され
る。
An embodiment of the present invention is shown in a vacuum container 1 as shown in the first diagram.
A case will be explained in which the emissivity of the sample 2 contained in the sample 2 is measured. In the figure, reference numeral 4 denotes a spectroscope 5 that separates the thermal radiation of the sample 2 into multiple wavelengths through the vacuum window 3.
and a radiation thermometer equipped with a detector 6 for detecting the amount of spectrothermal radiation, and a calculator such as a microprocessor 7 for calculating the detected value. The radiation is divided into four color wavelengths or more wavelengths, and each spectral thermal radiation is simultaneously measured by a detector 6 having a light-receiving section corresponding to the number of spectral wavelengths, and each measured value is sent to the sample 2 in a microprocessor 7. is used for calculations to determine the emissivity of.

一般に放射温度計を使用して試料の放射率の測
定を行なう場合黒体を併設してこれよりの熱放射
をも測定する必要があるが、本発明に於ては特に
黒体を設けることなく試料の放射率を正確に求め
ることが出来る。
Generally, when measuring the emissivity of a sample using a radiation thermometer, it is necessary to also install a blackbody and measure the thermal radiation from this, but in the present invention, there is no need to provide a blackbody. The emissivity of the sample can be determined accurately.

実施例に於て、試料2の温度がT、熱放射率が
ε、熱放射がLであるとする。このうち温度T及
び熱放射率εは未知数であり、熱放射Lは3色以
上の波長λ1,λ2,……λoに分光され夫々の波長に
於ける分光熱放射L1,L2……Loが放射温度計4
により測定される。
In the example, it is assumed that the temperature of the sample 2 is T, the thermal emissivity is ε, and the thermal radiation is L. Of these, the temperature T and thermal emissivity ε are unknown quantities, and the thermal radiation L is spectrally divided into three or more color wavelengths λ 1 , λ 2 , ... λ o , and the spectral thermal radiation at each wavelength is L 1 , L 2 ...L o is radiation thermometer 4
It is measured by

一方、各波長λ1,…λoに於ける分光熱放射率
ε1,ε2……εoは黒体の熱放射等の比較対象の熱放
射を知らなければ求め得ないものであるが、ある
曲線に沿つて変化するものであることが知られて
おり、第2図示の如く分光熱放射率ε1,ε2……εo
の各点或は各点付近を通る分光熱放射率の曲線εc
を想定することが出来る。この曲線εcは波長λの
m次の多項式で次のように近似的に表現すること
が出来る。勿論この曲線εcは他の関数例えば三角
関数、指数関数でも近似できるが、ここではm次
の多項式で近似した場合について説明する。
On the other hand, the spectral thermal emissivity ε 1 , ε 2 ...ε o at each wavelength λ 1 , ...λ o cannot be determined without knowing the thermal radiation to be compared, such as the thermal radiation of a black body. , is known to change along a certain curve, and as shown in the second figure, the spectral thermal emissivity ε 1 , ε 2 ...ε o
The curve of spectral thermal emissivity passing through each point or near each point ε c
can be assumed. This curve ε c can be approximately expressed as an m-th order polynomial of wavelength λ as follows. Of course, this curve ε c can be approximated by other functions such as a trigonometric function or an exponential function, but here we will explain the case where it is approximated by an m-th order polynomial.

εc=anλm+an-1λm-1+……+a0 …〔〕 この多項式近似を最小自乗誤差法で行なうと
〔〕式の係数an,an-1……a0は次式の連立1次
方程式の解で与えられる。
ε c = a n λ m + a n-1 λ m-1 +……+a 0 …[] If this polynomial approximation is performed using the least square error method, the coefficients of the formula [] a n , a n-1 …a 0 is given by the solution of the following simultaneous linear equations.

|A|・|x|=|b| …〔〕 |A|=Σλ2m j Σλ2m-1 j…Σλm j Σλ2m-1 j Σλ2m-2 j…Σλm-1 j 〓 〓 〓 Σλm j Σλm-1 j…Σλ0 j |x|=an an-1 〓 a0 |b|=Σλm j・ξj Σλm-1 j・ξj 〓 Σξj 〔〕 一方、熱放射率εは黒体の熱放射をL*とすれ
ば ε=L/L* …〔〕 であり、L*はブランクの公式から温度Tの関数
として一般的に次のように表わされる。
|A|・|x|=|b| …[] |A|=Σλ 2m j Σλ 2m-1 j …Σλ m j Σλ 2m-1 j Σλ 2m-2 j …Σλ m-1 j 〓 〓 〓 Σλ m j Σλ m-1 j …Σλ 0 j |x|=a n a n-1 〓 a 0 |b|=Σλ m j・ξj Σλ m-1 j・ξj 〓 Σξj [] On the other hand, thermal emissivity ε If the thermal radiation of a black body is L * , then ε=L/L * ...[], and L * is generally expressed as a function of temperature T from Blank's formula as follows.

L*=C1/λ5・1/exp(C2/λT)−1 …〔〕 これに於て、C1=1.19196×10-16〔W・m2〕 C2=0.014388〔m・K〕で表わされる係数である。
上記〔〕〔〕式から熱放射率は ε=L・λ5/C1〔exp(C2/λT)−1〕 …〔〕 の関係がある。従つて〔〕式の熱放射率εjも εj=Lj・λ5j/C1〔exp(C2/λjT)−1〕…〔
〕 で表わすことが出来、 exp(C2/λjT)−1=Uj …〔〕 とおけば、さらに εj=Lj・λ5j/C1・Uj …〔〕 と表わせる。このεjを用いて〔〕式のベクトル
bを表現すれば、 となる。〔〕式の|A|のk列を〔〕式の|
b|で置き換えた行列式をΔkとすると、次の通
りである。
L * = C 15・1/exp(C 2T )−1 … [] In this case, C 1 = 1.19196×10 -16 [W・m 2 ] C 2 = 0.014388 [m・K].
From the above formula [] [], the thermal emissivity has the following relationship: ε=L·λ 5 /C 1 [exp(C 2T )−1]...[]. Therefore, the thermal emissivity ε j in the formula [] is also ε j =L j・λ 5 / j /C 1 [exp(C 2j T)−1]...[
] If we set exp(C 2j T)−1=U j … [], we can further express it as ε j =L j・λ 5 / j /C 1・U j … [] Ru. If we use this ε j to express the vector b in the equation [], we get becomes. Column k of |A| in [] equation is |
Letting Δk be the determinant replaced by b|, it is as follows.

従つて連立方程式〔〕の解akは ak=Δk/|A| (k=m,m−1,…,0) …〔XII〕 となり〔〕式の近似は εc=1/|A|(Δmλm+Δm−1λm-1+ ……+Δ1λ+Δ0) …〔〕 で表わされる。このεcを用いて近似分光熱放射Lci
を求めると〔〕〔〕〔〕式から Lci=εci・Li *=εci・C1/λ5i・1/Ui =C1/|A|・λ5i・Ui(Δmλm i+Δm-1λim-1 +……+Δ1λi+Δ0) …〔XI〕 この式に於て、λiは前記試料2からの分光した
λ1……λ1oの波長で既知数であり、|A|はλiの関
数で既知数、C1は定数、Uiはλiと温度Tの関数、
Δkはλi、T及び試料2の熱放射の測定値L1……
Loに相当するLjの関数であるので、結局この式は
未知数Tの関数である。
Therefore, the solution a k of the simultaneous equations [] is a k =Δk/|A| (k=m, m-1,...,0) ...[XII], and the approximation of the equation [] is ε c = 1/|A |(Δmλ m +Δm−1λ m−1 + …+Δ 1 λ+Δ 0 ) … [ ]. Using this ε c , approximate spectral thermal radiation L ci
From the [] [] [] formula, L ci = ε ci・L i * = ε ci・C 1 / λ 5 / i・1/U i = C 1 / |A|・λ 5 / i・U i (Δmλ m i +Δm -1 λi m-1 +...+Δ 1 λ i0 ) ... [XI] In this formula, λ i is the wavelength of λ 1 ... λ 1o spectroscopically from the sample 2 is a known number, |A| is a known number as a function of λ i , C 1 is a constant, U i is a function of λ i and temperature T,
Δk is λ i , T and the measured value of thermal radiation of sample 2 L 1 ...
Since it is a function of L j which corresponds to L o , this equation is a function of the unknown T after all.

従つて温度Tを適当に与えて近似分光熱放射
Lciを求め、これが放射温度計4で測定した分光
熱放射Liに一致もしくは近似すれば、その温度T
が試料2の温度であると判断することが出来る。
この場合Tを変えて得られる近似分光熱放射Lci
が第3図の曲線T1,T2,T3であり、測定による
分光熱放射Liの値がL1,L2…Loであれば、Lci
Liの自乗誤差の総和Eを最小とする温度例えば
T2が試料2の温度である。これを式で表わせば Emin=minΣ(Lci−Li2 …〔〕 となる。
Therefore, by giving an appropriate temperature T, approximate spectral thermal radiation
If L ci is found and it matches or approximates the spectral heat radiation L i measured by the radiation thermometer 4, then the temperature T
can be determined to be the temperature of sample 2.
In this case, the approximate spectral thermal radiation L ci obtained by changing T
are the curves T 1 , T 2 , T 3 in Fig. 3, and if the values of the measured spectral thermal radiation L i are L 1 , L 2 ...L o , then L ci and
For example, the temperature that minimizes the sum E of the squared errors of L i
T 2 is the temperature of sample 2. Expressing this as a formula, Emin=minΣ(L ci −L i ) 2 …[].

こうした温度Tを変えての演算処理はマイクロ
プロセツサ7に於て約0.5秒以内で簡単迅速に行
なえる。
Such arithmetic processing by changing the temperature T can be easily and quickly performed by the microprocessor 7 within about 0.5 seconds.

以上の方法では仮定により与えた各分光熱放射
εcをm次の多項式で近似させたが、より簡単で実
用的とするために、第4図示のようにεcを次の波
長λの1次式による近似式とすることも出来る。
In the above method, each spectral thermal radiation ε c given by assumption is approximated by an m-th order polynomial, but in order to make it simpler and more practical, ε c is expressed as 1 of the next wavelength λ, as shown in Figure 4. The following equation can also be used as an approximation.

εc=a1λ+a0 …〔〕 これの係数a1,a0は次式の解で与えられる。 ε c = a 1 λ + a 0 ...[] The coefficients a 1 and a 0 are given by the solution of the following equation.

Σλ2 j Σλ1 j Σλ1 j Σλ0 j・a1 a0=Σλj・εj Σεj …〔〕 簡単のために Zλ2 j,Z1=Σλ1 j,Z0=Σλ0 j …〔〕 とおけば、εcは〔〕〔〕からa1,a0を求
めて下式で与えられる。
Σλ 2 j Σλ 1 j Σλ 1 j Σλ 0 j・a 1 a 0 =Σλ j・ε j Σε j …[] For simplicity, Zλ 2 j , Z 1 =Σλ 1 j , Z 0 =Σλ 0 j … [], then ε c is given by the following formula by finding a 1 and a 0 from [] [].

εc=1/Z2Z0−Z21{(Z0λ−Z1)Σλj・εj+(
−Z1λ1+Z2)Σεj}…〔XI〕 これに於てεjは〔〕で与え得るので εc=1/Z2Z0−Z21{(Z0λ−Z1)1/C1ΣLj・λ
6 j・Uj+(−Z1λ+Z2)1/C1ΣLj・λ5 j・Uj}…〔
〕 と書き換えることが出来、〔XI〕の近似分光熱
放射Lciの式は Lci=1/λ5iUi(Z2Z0−Z21)×{(Z0λi−Z1
)×ΣLjλ6 jUj+(−Z1λi+Z2)ΣLjλ1 5 jUj}…〔
XI〕 となる。この式も〔XI〕と同様にUiに含まれる
温度Tを未知数とする関数であるので、Tの値を
各種与え、近似分光熱放射Lciと測定値Liの自乗
誤差の総和Eが最小となるような温度Tを求め、
これが試料2の温度であるとする点は前記のεc
m次の多項式の近似式で与えた場合と同様であ
る。
ε c = 1/Z 2 Z 0 −Z 2 / 1 {(Z 0 λ−Z 1 )Σλ j・ε j +(
−Z 1 λ 1 +Z 2 )Σε j }…[XI] In this case, ε j can be given by [], so ε c = 1/Z 2 Z 0 −Z 2 / 1 {(Z 0 λ−Z 1 )1/C 1 ΣL j・λ
6 j・U j + (−Z 1 λ+Z 2 ) 1/C 1 ΣL j・λ 5 j・U j }…[
[ _ _ _ _ _ _ _ _ _ _ Z 1
)×ΣL j λ 6 j U j + (−Z 1 λ i +Z 2 )ΣL j λ 1 5 j U j }…[
XI]. Like [XI], this equation is also a function with the temperature T included in U i as an unknown quantity, so by giving various values of T, the sum E of the squared errors of the approximate spectral heat radiation L ci and the measured value L i is calculated. Find the minimum temperature T,
The point that this is the temperature of the sample 2 is similar to the case where ε c is given by the approximation of the m-th order polynomial.

こうして温度Tが求まると放射率εcの近似式
〔〕は分光熱放射と波長の関数となるので実測
の波長λ1……λoと分光熱放射L1……Loの値を代
入することにより分光熱放射率ε1……εoの近似値
を求めることが出来る。
Once the temperature T is determined in this way, the approximate expression [ ] for the emissivity ε c becomes a function of spectral thermal radiation and wavelength, so substitute the values of the actually measured wavelength λ 1 ...λ o and spectral thermal radiation L 1 ...L o By doing this, an approximate value of the spectral thermal emissivity ε 1 ...ε o can be obtained.

実際的な例に於て試料2からの熱放射を λ1=1064、λ2=1570、λ3=1990,λ4=2200(nn
の各波長に分光して測定した。
In a practical example, the thermal radiation from sample 2 is λ 1 = 1064, λ 2 = 1570, λ 3 = 1990, λ 4 = 2200 (n n ).
It was measured by spectroscopy at each wavelength.

この条件で分光熱放射率のm次の多項式の近似
式から近似分光熱放射Lciを各種の温度に於て求
め、実測した試料2の分光熱放射L1……Loと比
較し、その誤差の自乗の総和が最小となる温度を
試料2の温度Tとした。
Under these conditions, the approximate spectral thermal radiation L ci is calculated at various temperatures from the approximation formula of the m-th order polynomial of the spectral thermal emissivity, and compared with the actually measured spectral thermal radiation L 1 ...L o of sample 2. The temperature at which the sum of the squared errors was the minimum was defined as the temperature T of sample 2.

この温度Tは実測で試料2の温度と一致するこ
とが確認された。放射率εcの近似式〔〕に温度
Tと測定した各波長λ1……λo及び各分光熱放射
L1……Loを夫々代入して分光熱放射率を求めた
ところ黒体を比較対象として測定した分光熱放射
率とほぼ一致した。
It was confirmed through actual measurement that this temperature T coincided with the temperature of Sample 2. Approximate formula for emissivity ε c [] includes temperature T, each measured wavelength λ 1 ...λ o , and each spectral thermal radiation.
When the spectral thermal emissivity was obtained by substituting L 1 ...L o respectively, it almost coincided with the spectral thermal emissivity measured using a blackbody as a comparison object.

また前記の条件で、分光熱放射率を1次式で近
似した場合、近似分光熱放射Lciと実測の分光熱
放射L1……Loとの誤差の自乗の総和Eが例えば
第5図示のように2個所に於て極小値を有するこ
とがあつたが、小さい方の極小値EBの温度TB
全ての場合に於て試料2の実測温度と一致した。
而して両極小値の比EA/EBは一般に70以上であ
り極小値の選択は容易である。この場合放射率εc
の近似式〔〕に温度T、実測の波長λ1……
λo、分光熱放射L1……Loを代入して分光熱放射
率を求めたところ、黒体を比較対象として測定し
た分光熱放射率とほぼ一致した。
Furthermore, when the spectral thermal emissivity is approximated by a linear equation under the above conditions, the sum E of the squares of the errors between the approximate spectral thermal radiation L ci and the actually measured spectral thermal radiation L 1 . Although there were cases where there were two minimum values as shown in the figure, the temperature T B of the smaller minimum value E B coincided with the actually measured temperature of sample 2 in all cases.
Therefore, the ratio E A /E B between the two minimum values is generally 70 or more, and the selection of the minimum value is easy. In this case, the emissivity ε c
In the approximate formula [], the temperature T and the actually measured wavelength λ 1 ...
When the spectral thermal emissivity was determined by substituting λ o , spectral thermal radiation L 1 .

尚、近似分光熱放射Lciと試料2から実測した
分光熱放射L1……Loとの比較し、両者の誤差の
最小を求める手段として、例えばミニマツクス法
によることも考えられる。
In addition, as a means of comparing the approximate spectral thermal radiation L ci and the spectral thermal radiation actually measured from sample 2 L 1 .

このように本発明によるときは3色以上の分光
熱放射を実測し、分光熱放射を仮定してその近似
式を求め、試料温度を該近似式の近似分光熱放射
と実測の分光熱放射との誤差を最小とする温度か
ら求めたのち該温度と該近似式とから試料の放射
率を求めることが出来るので特に黒体等を設置す
る必要がなく、試料の熱放射を実測するだけで比
較的正確に放射率を測定出来、簡便に放射率の測
定を行なえる等の効果がある。
In this way, according to the present invention, the spectral thermal radiation of three or more colors is actually measured, an approximate expression is obtained assuming the spectral thermal radiation, and the sample temperature is calculated based on the approximate spectral thermal radiation of the approximate expression and the actually measured spectral thermal radiation. Since the emissivity of the sample can be calculated from the temperature that minimizes the error in , and then the emissivity of the sample can be calculated from that temperature and the approximation formula, there is no need to install a black body, etc., and the comparison can be made by simply measuring the thermal radiation of the sample. It has the advantage of being able to measure emissivity accurately and easily.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の測定方法の1例の線図、第2
図は波長と分光熱放射率のm次の多項式の近似式
との関係を示す線図、第3図は実測の熱放射と近
似熱放射との関係線図、第4図は波長と1次式で
与えた分光熱放射率の近似式との関係線図、第5
図は誤差の自乗の総和の最小を求める曲線図であ
る。
Fig. 1 is a diagram of one example of the measuring method of the present invention, Fig. 2 is a diagram of an example of the measuring method of the present invention;
The figure is a diagram showing the relationship between wavelength and the approximation formula of the m-th order polynomial of spectral thermal emissivity. Figure 3 is a diagram showing the relationship between actually measured thermal radiation and approximate thermal radiation. Figure 4 is a diagram showing the relationship between wavelength and the linear Relationship diagram with the approximation formula for spectral thermal emissivity given by the formula, 5th
The figure is a curve diagram for finding the minimum sum of squared errors.

Claims (1)

【特許請求の範囲】[Claims] 1 試料からの熱放射を分光して3色以上の波長
の分光熱放射を測定する一方、各波長に於ける分
光熱放射率を仮定して各分光熱放射率の近似式を
求め、該近似式に於ける前記各波長の近似分光熱
放射とこれに対応する前記測定の分光熱放射との
誤差を最小とする温度を求めて該試料の温度と
し、この温度と前記近似式とから該試料の分光熱
放射率を求めることを特徴とする放射率測定方
法。
1 Spectral thermal radiation from a sample is spectrally analyzed to measure the spectral thermal radiation of three or more color wavelengths, while assuming the spectral thermal emissivity at each wavelength, find an approximate formula for each spectral thermal emissivity, and calculate the approximation. The temperature that minimizes the error between the approximate spectral thermal radiation of each wavelength in the formula and the corresponding spectral thermal radiation of the measurement is determined as the temperature of the sample, and from this temperature and the approximate formula, the temperature of the sample is determined. An emissivity measurement method characterized by determining the spectral thermal emissivity of.
JP2849884A 1984-02-20 1984-02-20 Method for measuring emissivity Granted JPS60173430A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2849884A JPS60173430A (en) 1984-02-20 1984-02-20 Method for measuring emissivity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2849884A JPS60173430A (en) 1984-02-20 1984-02-20 Method for measuring emissivity

Publications (2)

Publication Number Publication Date
JPS60173430A JPS60173430A (en) 1985-09-06
JPH0462010B2 true JPH0462010B2 (en) 1992-10-02

Family

ID=12250332

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2849884A Granted JPS60173430A (en) 1984-02-20 1984-02-20 Method for measuring emissivity

Country Status (1)

Country Link
JP (1) JPS60173430A (en)

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
HIGH TEMPERATURES-HIGH PRESSURES=1980 *

Also Published As

Publication number Publication date
JPS60173430A (en) 1985-09-06

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