JPH0530227B2 - - Google Patents

Info

Publication number
JPH0530227B2
JPH0530227B2 JP57226616A JP22661682A JPH0530227B2 JP H0530227 B2 JPH0530227 B2 JP H0530227B2 JP 57226616 A JP57226616 A JP 57226616A JP 22661682 A JP22661682 A JP 22661682A JP H0530227 B2 JPH0530227 B2 JP H0530227B2
Authority
JP
Japan
Prior art keywords
circuit
signal
bus1
input
gate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57226616A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59126268A (ja
Inventor
Takeyuki Sudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57226616A priority Critical patent/JPS59126268A/ja
Publication of JPS59126268A publication Critical patent/JPS59126268A/ja
Publication of JPH0530227B2 publication Critical patent/JPH0530227B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57226616A 1982-12-27 1982-12-27 集積回路チップ Granted JPS59126268A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57226616A JPS59126268A (ja) 1982-12-27 1982-12-27 集積回路チップ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57226616A JPS59126268A (ja) 1982-12-27 1982-12-27 集積回路チップ

Publications (2)

Publication Number Publication Date
JPS59126268A JPS59126268A (ja) 1984-07-20
JPH0530227B2 true JPH0530227B2 (fr) 1993-05-07

Family

ID=16847992

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57226616A Granted JPS59126268A (ja) 1982-12-27 1982-12-27 集積回路チップ

Country Status (1)

Country Link
JP (1) JPS59126268A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08163951A (ja) * 1994-12-14 1996-06-25 Meishin Denki Kk 鳥害防止具

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3849872A (en) * 1972-10-24 1974-11-26 Ibm Contacting integrated circuit chip terminal through the wafer kerf
JPS55136969A (en) * 1979-04-13 1980-10-25 Mitsubishi Electric Corp Circuit testing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08163951A (ja) * 1994-12-14 1996-06-25 Meishin Denki Kk 鳥害防止具

Also Published As

Publication number Publication date
JPS59126268A (ja) 1984-07-20

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