JPH0550841B2 - - Google Patents
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- Publication number
- JPH0550841B2 JPH0550841B2 JP60014532A JP1453285A JPH0550841B2 JP H0550841 B2 JPH0550841 B2 JP H0550841B2 JP 60014532 A JP60014532 A JP 60014532A JP 1453285 A JP1453285 A JP 1453285A JP H0550841 B2 JPH0550841 B2 JP H0550841B2
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- Prior art keywords
- voltage
- value
- correction
- detection
- circuit
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- Apparatuses And Processes For Manufacturing Resistors (AREA)
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明はレーザ光により抵抗体のトリミングを
行なうレーザトリマ装置等で使用する抵抗測定
器、特に、抵抗値を測定しながら目標値に達する
まで続けてレーザを照射してトリミングする方式
において使用される抵抗測定器に関するものであ
る。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a resistance measuring device used in a laser trimmer device etc. that trims a resistor with a laser beam, and in particular, a resistance measuring device that measures a resistance value until a target value is reached. The present invention relates to a resistance measuring device used in a method of trimming by irradiating a laser beam.
従来の上記のような抵抗体のトリミングを行う
ときに用いられる抵抗測定器としては、あとに図
を用いて説明するが、トリミング目標値に相当す
る基準電圧を発する基準回路と、被加工抵抗体の
抵抗値に比例する電圧を検出する手段と、この検
出した電圧が基準回路の発する基準電圧に達する
とトリミング停止を指示する信号を発する比較回
路とから成る測定器がひろく用いられており、従
来における生産規模においては充分その役目を果
してきた。しかしレーザトリマ装置に関しては、
最近になつて被膜タイプの抵抗体の需要が急速に
増大して加工能力として例えば毎秒数十程度の高
速性が要求されるようになり、このため前述の従
来の抵抗測定器を用いてはレーザトリマ装置の加
工精度を必要な値に保つことが困難となつてき
た。それは、レーザ加工には加工中に抵抗値が変
化するいわゆるドリフトの問題があり、従来の加
工速度においては変化した抵抗値がほぼ定常状態
に近づいてから測定できる余裕があつたので特に
問題にならなかつたが、前記のように加工速度を
上げると、まだ十分に定常状態にならない内に測
定を行なわざるを得ないので、より大きなドリフ
トが生じ、加工精度が悪くなるからである。
A conventional resistance measuring device used when trimming a resistor as described above, which will be explained later using a diagram, has a reference circuit that emits a reference voltage corresponding to the trimming target value, and a resistance measuring device that measures the resistance of the resistor to be processed. Measuring instruments are widely used, which consist of means for detecting a voltage proportional to the resistance value of It has fulfilled its role satisfactorily at the scale of production. However, regarding laser trimmer equipment,
Recently, the demand for film-type resistors has increased rapidly, and processing speeds of, for example, several tens of seconds per second are now required. It has become difficult to maintain the processing accuracy of the equipment at the required value. This is because laser processing has the problem of so-called drift, where the resistance value changes during processing, and with conventional processing speeds, there was a margin to measure the changed resistance value after it approached a steady state, so this was not a particular problem. However, if the machining speed is increased as described above, measurements must be taken before the steady state is reached, resulting in larger drifts and poorer machining accuracy.
なお、もしドリフト量が一定であればその分を
見込んで早目にトリミングを終了する補正方法も
採れるが、ドリフト量は一定ではなく、抵抗体の
形状やカツトの形状そして特に切り込みの深さな
どによつて大きく変化するため、従来適切な補正
方法は知られていなくて、加工精度と処理能力を
両立させることは難かしかつた。 If the amount of drift is constant, a correction method can be used to take into account the amount and finish trimming earlier, but the amount of drift is not constant and depends on the shape of the resistor, the shape of the cut, and especially the depth of the cut. Therefore, no suitable correction method has been known so far, and it has been difficult to achieve both machining accuracy and throughput.
したがつて本発明の目的は、レーザトリマ装置
などにおいて、高速でトリミングを行なう場合で
も良好な加工精度が得られるような抵抗測定器を
提供することにある。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a resistance measuring device that can obtain good processing accuracy even when trimming is performed at high speed in a laser trimmer device or the like.
本発明は加工時における抵抗値のドリフト量が
大きい場合でも、その時定数自体はほぼ一定であ
ることに着目したものである。
The present invention focuses on the fact that even when the drift amount of the resistance value during processing is large, the time constant itself remains almost constant.
本発明によれば、トリミング目標値に相当する
基準電圧を発する基準回路と、被加工低抗体の両
端から得られる該抵抗体の抵抗値に比例した電圧
を検出電圧として発生する検出電圧発生手段と、
前記発生された検出電圧に基づく電圧の値を前記
基準電圧と比較し、該検出電圧に基づく電圧の値
が該基準電圧の値に達するとトリミングの終了を
指示する指示信号を発する比較回路とを有し、抵
抗値を測定しながら目標値に達するまで続けてレ
ーザを照射してトリミングする方式で使用される
抵抗測定器において、前記検出電圧発生手段の発
生した検出電圧の時間変化量を求め、この時間変
化量に比例する補正電圧を出力する補正電圧発生
手段と、前記検出電圧に前記出力された補正電圧
を加算して収束電圧を求め、該求められた収束電
圧を前記検出電圧に基づく電圧として出力する加
算回路とを付加して成ることを特徴とする抵抗測
定器が得られる。 According to the present invention, there is provided a reference circuit that generates a reference voltage corresponding to a trimming target value, and a detection voltage generating means that generates a voltage proportional to the resistance value of the resistor obtained from both ends of the processed low antibody as a detection voltage. ,
a comparison circuit that compares the value of the voltage based on the generated detection voltage with the reference voltage, and issues an instruction signal instructing the end of trimming when the value of the voltage based on the detection voltage reaches the value of the reference voltage; In a resistance measuring device that is used in a method of trimming by continuously irradiating a laser until a target value is reached while measuring the resistance value, the amount of change over time of the detection voltage generated by the detection voltage generation means is determined, a correction voltage generating means that outputs a correction voltage proportional to the amount of change over time; and a correction voltage generating means that adds the output correction voltage to the detection voltage to obtain a convergence voltage, and converts the obtained convergence voltage into a voltage based on the detection voltage. A resistance measuring device is obtained, which is characterized in that it further includes an adder circuit that outputs .
次に図面を参照して詳細に説明する。 Next, a detailed description will be given with reference to the drawings.
〔従来装置の具体例〕
第4図は、本発明の特徴を明確にするために示
した、従来の標準的な抵抗測定器の機能構成を示
したブロツク図である。被加工抵抗1には、定電
流源2から一定電流が供給されているので、その
両端には抵抗値とその時点における電流値の積に
よつて決まる電位差が発生する。この電位差を検
出してこの検出電圧と基準回路3によつて作られ
るトリミング目標値に相当する基準電圧とが比較
回路4において比較される。その結果に基づき抵
抗値が目標値に達するかわずかオーバーした時に
トリミングを終了すれば、目標とする抵抗値が得
られる。しかしながらこの構成では、先に説明し
たように、高速でトリミングを行なうときはドリ
フトの影響が大きくなり、充分な加工精度が得ら
れない難点がある。[Specific Example of Conventional Device] FIG. 4 is a block diagram showing the functional configuration of a conventional standard resistance measuring device, which is shown to clarify the features of the present invention. Since a constant current is supplied to the resistor 1 to be processed from a constant current source 2, a potential difference is generated between both ends thereof, which is determined by the product of the resistance value and the current value at that time. This potential difference is detected, and this detected voltage is compared with a reference voltage corresponding to a trimming target value produced by a reference circuit 3 in a comparator circuit 4. Based on the results, if trimming is completed when the resistance value reaches or slightly exceeds the target value, the target resistance value can be obtained. However, with this configuration, as explained above, when trimming is performed at high speed, the influence of drift becomes large, and there is a problem that sufficient processing accuracy cannot be obtained.
第1図は本発明の第1の実施例の構成を示す図
であつて、被加工抵抗体1と定電流源2から成
り、抵抗体の抵抗値に比例する電位差を検出する
部分は第4図の従来装置の場合と同じであるが、
あとの説明のために更に具体的に説明すると、こ
の部分は抵抗体1の各時点における抵抗R(t)に比
例する電圧E(t)を検出してこれを検出電圧として
送出する検出電圧発生部である。基準電圧ERを
発する基準回路3および比較回路4も第4図の場
合と全く同じである。
FIG. 1 is a diagram showing the configuration of a first embodiment of the present invention, which consists of a resistor to be processed 1 and a constant current source 2, and a fourth part detects a potential difference proportional to the resistance value of the resistor. It is the same as the case of the conventional device shown in the figure, but
To explain more specifically for later explanation, this part is a detection voltage generation unit that detects a voltage E(t) proportional to the resistance R(t) at each point in time of the resistor 1 and sends it out as a detection voltage. Department. The reference circuit 3 that generates the reference voltage E R and the comparison circuit 4 are also exactly the same as in the case of FIG.
本発明において新規に加えた構成要素は、抵抗
Rと容量Cから成り、上記の電圧E(t)の時間変化
量すなわちE(t)をtで微分した微分係数E′(t)を検
出する時間変化量検出回路(微分回路)5と、こ
の微分した値を所定の値で増幅する増幅回路6
と、加算器7である。次にこれらの動作を本発明
における基本的な考え方と共に説明する。 A newly added component in the present invention consists of a resistor R and a capacitor C, and detects the amount of time change in the voltage E(t), that is, the differential coefficient E'(t) obtained by differentiating E(t) with respect to t. A time change amount detection circuit (differentiation circuit) 5 and an amplifier circuit 6 that amplifies this differentiated value by a predetermined value.
and adder 7. Next, these operations will be explained together with the basic idea of the present invention.
微分回路5の入力信号である検出電圧E(t)に対
応する抵抗体1の抵抗値R(t)は、近似的に時間t
の函数として次の(1)式のように表わされる。 The resistance value R(t) of the resistor 1 corresponding to the detected voltage E(t), which is the input signal of the differentiating circuit 5, is approximately equal to the time t.
The function of is expressed as the following equation (1).
R(t)=R0(1−e-t/〓) ……(1)
ここにR0はトリミングにより一時的に低下又
は上昇した温度が時間の経過と共に実質的に元の
温度に戻つたときの集束抵抗値、τは前記の温度
の戻る速さの時定数をあらわすものとする。した
がつて微分回路5の出力信号E′(t)に相当する抵抗
値の微分係数R′(t)は(1)式を微分することによつ
て得られ、
R′(t)=R0/τe-t/〓 ……(2)
で表わされる。(1)式と(2)式とから時間tを消去す
ると、下記(3)式が得られる。 R(t)=R 0 (1-e -t/ 〓) ...(1) Here, R 0 is the temperature that temporarily decreased or increased due to trimming, but returned to the original temperature over time. The focusing resistance value at that time, τ, represents the time constant of the speed at which the temperature returns. Therefore, the differential coefficient R'(t) of the resistance value corresponding to the output signal E'(t) of the differentiating circuit 5 can be obtained by differentiating equation (1), and R'(t)=R 0 /τe -t/ 〓 ...(2) By eliminating time t from equations (1) and (2), the following equation (3) is obtained.
R0=R(t)+R′(t)・τ ……(3)
またこの(3)式を電圧であらわせば、集束抵抗値
R0に対応する電圧をE0とすると、
E0=E(t)+E′(t)τ ……(4)
となる。 R 0 = R(t) + R′(t)・τ ……(3) Also, if we express this equation (3) in terms of voltage, the focusing resistance value
When the voltage corresponding to R 0 is E 0 , E 0 =E(t)+E′(t)τ (4).
(3)式と(4)式から分るように、時定数は一定であ
るから、或る測定時点の抵抗値R(t)を示す検出信
号E(t)に、その抵抗変化の微分係数R′(t)を示す
時間変化量電圧E′(t)に時定数τを掛けたものを加
えれば、最終的な抵抗値R0に対応する集束電圧
E0が得られることを示している。そしてこの時
間変化量電圧を求めるのがはじめに述べたように
時間変化量検出回路(微分回路)5であり、τを
掛けるのが増幅器6であり、検出電圧E(t)に補正
電圧ともいうべきE′(t)τを加えるのが加算器7で
あり、この加算器の出力が集束電圧E0となるわ
けである。そして比較器4において集束電圧E0
と基準電圧ERを比較し、前者の値が後者の値に
達するとトリミングの終了を指示する指示信号
S′が出力する。 As can be seen from equations (3) and (4), the time constant is constant, so the detection signal E(t) indicating the resistance value R(t) at a certain measurement point has the differential coefficient of the resistance change. By adding the time-varying voltage E′(t) representing R′(t) multiplied by the time constant τ, the focused voltage corresponding to the final resistance value R 0 can be obtained.
This shows that E 0 can be obtained. As mentioned at the beginning, the time change detection circuit (differentiation circuit) 5 calculates this time change voltage, and the amplifier 6 multiplies the detected voltage E(t) by τ, which can also be called a correction voltage. The adder 7 adds E′(t)τ, and the output of this adder becomes the focused voltage E 0 . And in comparator 4, the focused voltage E 0
and the reference voltage E R , and when the former value reaches the latter value, an instruction signal that instructs the end of trimming.
S′ outputs.
従つて第1図の実施例の構成によれば、加工直
後であつてもその後に発生するドリフト量を予測
して補正することができ、高速でトリミングを行
うときでも良好な加工精度を得ることができる。 Therefore, according to the configuration of the embodiment shown in FIG. 1, even immediately after machining, it is possible to predict and correct the amount of drift that will occur thereafter, and it is possible to obtain good machining accuracy even when trimming at high speed. I can do it.
なお時定数τの値は被加工抵抗体の材質によつ
て大きく変り、実際にはミリ秒から0.1秒程度ま
で種々あり、また半導体と金属では符号が逆にな
るものである。 Note that the value of the time constant τ varies greatly depending on the material of the resistor to be processed, and actually varies from milliseconds to about 0.1 seconds, and the sign is opposite between semiconductors and metals.
第2図は本発明の第2の実施例で用いる時間変
化量検出回路5の構成を示すブロツク図であり、
それ以外は第1の実施例と同じである。第2図に
おいて、入力信号E(t)は第1のサンプルホールド
回路11においてタイミング発生器12からの周
期的なタイミング信号によりサンプリングされ保
持される。一方第2のサンプルホールド回路13
は、第1のサンプルホールド回路11のサンプリ
ング動作の直前に動作するタイミング信号を受け
て、第1のサンプルホールドの出力信号をサンプ
リングし保持するものである。そうすると、サン
プリングの際の一部期間を除いて、2つのサンプ
ルホールド回路11と13の出力信号の差信号を
演算回路14でとると、その値はサンプリング周
期から決まる時間の間の入力信号変化量電圧E′(t)
すなわち抵抗値変化R′(t)を示すので、この構成
によつても第1の実施例と同様に抵抗値変化の微
係数を求め、補正を行なうこのができ、高速でト
リミングを行なう場合でも、良好な加工精度を得
ることができる。 FIG. 2 is a block diagram showing the configuration of the time variation detection circuit 5 used in the second embodiment of the present invention.
The rest is the same as the first embodiment. In FIG. 2, an input signal E(t) is sampled and held in a first sample and hold circuit 11 using a periodic timing signal from a timing generator 12. On the other hand, the second sample hold circuit 13
receives a timing signal that operates immediately before the sampling operation of the first sample-and-hold circuit 11, and samples and holds the output signal of the first sample-and-hold circuit. Then, when the arithmetic circuit 14 takes the difference signal between the output signals of the two sample and hold circuits 11 and 13, except for a part of the period during sampling, the value is the amount of change in the input signal during the time determined from the sampling period. Voltage E′(t)
In other words, since it shows the resistance value change R'(t), this configuration also allows the differential coefficient of the resistance value change to be found and corrected in the same way as in the first embodiment, and even when trimming is performed at high speed. , good machining accuracy can be obtained.
第3図は第3の実施例の構成を示すブロツク図
で、時間変化量検出回路15の出力信号E′(t)を増
幅度を可変できる増幅器16でτ倍増幅したの
ち、この増幅した補正電圧E′(t)・τを加算回路7
で検出電圧E(t)に加算して集束電圧E0になるよ
うにしたものである。この構成では外部からの制
御信号EVにより増幅器16の増幅率を制御でき
るので、トリミングする抵抗体の材質が違つて、
ドリフトの時定数が変つた場合でも、じん速に適
切な補正を行なうことができる。 FIG. 3 is a block diagram showing the configuration of the third embodiment, in which the output signal E'(t) of the time variation detection circuit 15 is amplified by τ times by an amplifier 16 whose amplification degree can be varied, and then the amplified correction is performed. Adding voltage E′(t)・τ circuit 7
is added to the detected voltage E(t) to make the focusing voltage E 0 . In this configuration, the amplification factor of the amplifier 16 can be controlled by an external control signal EV , so the material of the resistor to be trimmed is different.
Even if the drift time constant changes, the velocity can be appropriately corrected.
以上詳述した様に、本発明による抵抗測定器に
よれば、抵抗値に比例した信号の時間変化量を検
出し、この信号から測定后に生じるドリフト分を
求めて予めドリフト分を補正することにより、高
速でトリミングを行なう場合でもドリフトの影響
を除去でき、良好な加工精度を得ることができ
る。
As detailed above, according to the resistance measuring instrument according to the present invention, it is possible to detect the amount of time change in a signal proportional to the resistance value, calculate the drift amount that occurs after measurement from this signal, and correct the drift amount in advance. Therefore, even when trimming is performed at high speed, the influence of drift can be removed and good processing accuracy can be obtained.
第1図は本発明の第1の実施例である抵抗測定
器の構成を示すブロツク図、第2図は本発明の第
2の実施例の抵抗測定器で用いる時間変化率検出
回路の構成を示すブロツク図、第3図は本発明の
第3の実施例の構成を示すブロツク図、第4図は
従来の標準的な抵抗測定器の構成を示すブロツク
図である。
記号の説明:1は被加工抵抗、2は定電流源、
3は基準回路、4は比較回路、5は時間変化量検
出回路(微分回路)、6は増幅器、7は加算器、
11と13はサンプルホールド回路。14は演算
回路、16は可変増幅器をそれぞれあらわしてい
る。
FIG. 1 is a block diagram showing the configuration of a resistance measuring device according to the first embodiment of the present invention, and FIG. 2 shows the configuration of a time rate of change detection circuit used in the resistance measuring device according to the second embodiment of the present invention. 3 is a block diagram showing the configuration of a third embodiment of the present invention, and FIG. 4 is a block diagram showing the configuration of a conventional standard resistance measuring instrument. Symbol explanation: 1 is the resistance to be processed, 2 is the constant current source,
3 is a reference circuit, 4 is a comparison circuit, 5 is a time change detection circuit (differentiator circuit), 6 is an amplifier, 7 is an adder,
11 and 13 are sample and hold circuits. 14 represents an arithmetic circuit, and 16 represents a variable amplifier.
Claims (1)
る基準回路と、被加工抵抗体の両端から得られる
該抵抗体の抵抗値に比例した電圧を検出電圧とし
て発生する検出電圧発生手段と、前記発生された
検出電圧に基づく電圧の値を前記基準電圧と比較
し、該検出電圧に基づく電圧の値が該基準電圧の
値に達するとトリミングの終了を指示する指示信
号を発する比較回路とを有し、抵抗値を測定しな
がら目標値に達するまで続けてレーザを照射して
トリミングする方式で使用される抵抗測定器にお
いて、 前記検出電圧発生手段の発生した検出電圧の時
間変化量を求め、この時間変化量に比例する補正
電圧を出力する補正電圧発生手段と、前記検出電
圧に前記出力された補正電圧を加算して収束電圧
を求め、該求められた収束電圧を前記検出電圧に
基づく電圧として出力する加算回路とを付加して
成ることを特徴とする抵抗測定器。 2 補正電圧発生手段における検出電圧の時間変
化量を求める機構が、直列に接続された複数のサ
ンプルホールド回路と、これらサンプルホールド
回路の複数の出力信号の演算回路とを有している
ことを特徴とする特許請求の範囲第1項の抵抗測
定器。 3 補正電圧発生手段における検出電圧の時間変
化量から補正電圧を得る機構が、外部から増幅率
を制御し得る可変増幅機能を有していることを特
徴とする特許請求の範囲第1項もしくは第2項の
抵抗測定器。[Scope of Claims] 1. A reference circuit that generates a reference voltage corresponding to the trimming target value, and a detection voltage generating means that generates, as a detection voltage, a voltage obtained from both ends of the resistor to be processed that is proportional to the resistance value of the resistor. and a comparison circuit that compares the value of the voltage based on the generated detection voltage with the reference voltage, and issues an instruction signal to instruct the end of trimming when the value of the voltage based on the detection voltage reaches the value of the reference voltage. In a resistance measuring device that is used in a method of trimming by continuously irradiating a laser until a target value is reached while measuring the resistance value, the amount of change over time of the detection voltage generated by the detection voltage generation means a correction voltage generating means for outputting a correction voltage proportional to the amount of change over time, a correction voltage generating means for adding the output correction voltage to the detection voltage to obtain a convergence voltage, and adding the obtained convergence voltage to the detection voltage. 1. A resistance measuring device characterized by comprising an additional circuit that outputs a base voltage. 2. The mechanism for determining the amount of time change in the detected voltage in the correction voltage generating means includes a plurality of sample and hold circuits connected in series and a calculation circuit for the plurality of output signals of these sample and hold circuits. A resistance measuring device according to claim 1. 3. Claim 1 or 3, characterized in that the mechanism for obtaining the correction voltage from the amount of time change in the detected voltage in the correction voltage generating means has a variable amplification function capable of controlling the amplification factor from the outside. 2.Resistance measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60014532A JPS61174701A (en) | 1985-01-30 | 1985-01-30 | Resistance measuring apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60014532A JPS61174701A (en) | 1985-01-30 | 1985-01-30 | Resistance measuring apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61174701A JPS61174701A (en) | 1986-08-06 |
| JPH0550841B2 true JPH0550841B2 (en) | 1993-07-30 |
Family
ID=11863750
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60014532A Granted JPS61174701A (en) | 1985-01-30 | 1985-01-30 | Resistance measuring apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61174701A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2683277B2 (en) * | 1989-05-19 | 1997-11-26 | 松下電子工業株式会社 | Trimming method of thin film resistor |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5917208A (en) * | 1982-07-21 | 1984-01-28 | 株式会社日立製作所 | functional trimming device |
-
1985
- 1985-01-30 JP JP60014532A patent/JPS61174701A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61174701A (en) | 1986-08-06 |
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