JPH0552672B2 - - Google Patents
Info
- Publication number
- JPH0552672B2 JPH0552672B2 JP59119143A JP11914384A JPH0552672B2 JP H0552672 B2 JPH0552672 B2 JP H0552672B2 JP 59119143 A JP59119143 A JP 59119143A JP 11914384 A JP11914384 A JP 11914384A JP H0552672 B2 JPH0552672 B2 JP H0552672B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor layer
- semiconductor device
- region
- mos type
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
- H10D30/6743—Silicon
- H10D30/6744—Monocrystalline silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6704—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
- H10D30/6708—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device for preventing the kink effect or the snapback effect, e.g. discharging the minority carriers of the channel region for preventing bipolar effect
Landscapes
- Thin Film Transistor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59119143A JPS60263466A (ja) | 1984-06-12 | 1984-06-12 | Mos型半導体装置とその製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59119143A JPS60263466A (ja) | 1984-06-12 | 1984-06-12 | Mos型半導体装置とその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60263466A JPS60263466A (ja) | 1985-12-26 |
| JPH0552672B2 true JPH0552672B2 (2) | 1993-08-06 |
Family
ID=14753980
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59119143A Granted JPS60263466A (ja) | 1984-06-12 | 1984-06-12 | Mos型半導体装置とその製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60263466A (2) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2510710B2 (ja) * | 1988-12-13 | 1996-06-26 | 三菱電機株式会社 | 絶縁体基板上の半導体層に形成されたmos型電界効果トランジスタ |
| JPH04171766A (ja) * | 1990-11-05 | 1992-06-18 | Nec Corp | 薄膜soi―mosfet及びその製造方法 |
| US5982002A (en) * | 1993-01-27 | 1999-11-09 | Seiko Instruments Inc. | Light valve having a semiconductor film and a fabrication process thereof |
| JP3504212B2 (ja) * | 2000-04-04 | 2004-03-08 | シャープ株式会社 | Soi構造の半導体装置 |
-
1984
- 1984-06-12 JP JP59119143A patent/JPS60263466A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60263466A (ja) | 1985-12-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3156300B2 (ja) | 縦型半導体装置 | |
| JP2510710B2 (ja) | 絶縁体基板上の半導体層に形成されたmos型電界効果トランジスタ | |
| JP3293871B2 (ja) | 高耐圧半導体素子 | |
| JP3455452B2 (ja) | 半導体デバイス及びその製造方法 | |
| US7008865B2 (en) | Method of manufacturing a semiconductor device having a high breakdown voltage and low on-resistance | |
| JP4009331B2 (ja) | Mosトランジスタおよびその製造方法 | |
| JPS6331945B2 (2) | ||
| JP3354127B2 (ja) | 高電圧素子及びその製造方法 | |
| JPS60241266A (ja) | 半導体装置及びその製造方法 | |
| JPS60263466A (ja) | Mos型半導体装置とその製造方法 | |
| JPS6143475A (ja) | Mos型半導体装置 | |
| JP3497716B2 (ja) | 横型絶縁ゲートバイポーラトランジスタ | |
| JP3371836B2 (ja) | 半導体装置 | |
| JPH05183153A (ja) | 半導体装置 | |
| JP2858622B2 (ja) | 半導体装置 | |
| JP3143102B2 (ja) | Mis型トランジスタ | |
| JPS6115369A (ja) | 半導体装置及びその製造方法 | |
| JPS63227059A (ja) | 半導体装置およびその製造方法 | |
| JP2594942B2 (ja) | 半導体装置の製造方法 | |
| JPH0548088A (ja) | Misトランジスタ | |
| JP2858623B2 (ja) | 半導体装置及びその製造方法 | |
| JP2880885B2 (ja) | 半導体集積回路装置及びその製造方法 | |
| WO1993020587A1 (en) | Mos structure for reducing snapback | |
| JPH0517713B2 (2) | ||
| JPH01143357A (ja) | 半導体装置およびその製法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |