JPH0558201B2 - - Google Patents

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Publication number
JPH0558201B2
JPH0558201B2 JP60170030A JP17003085A JPH0558201B2 JP H0558201 B2 JPH0558201 B2 JP H0558201B2 JP 60170030 A JP60170030 A JP 60170030A JP 17003085 A JP17003085 A JP 17003085A JP H0558201 B2 JPH0558201 B2 JP H0558201B2
Authority
JP
Japan
Prior art keywords
glass
insulating layer
conductor
temperature
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60170030A
Other languages
Japanese (ja)
Other versions
JPS6231903A (en
Inventor
Tsuneo Kaneko
Norio Kasai
Shiro Ezaki
Masahiko Yotsuyanagi
Megumi Sakamaki
Kazuhisa Kimura
Takahiro Ai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
AGC Techno Glass Co Ltd
Original Assignee
Toshiba Corp
Toshiba Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toshiba Glass Co Ltd filed Critical Toshiba Corp
Priority to JP17003085A priority Critical patent/JPS6231903A/en
Publication of JPS6231903A publication Critical patent/JPS6231903A/en
Publication of JPH0558201B2 publication Critical patent/JPH0558201B2/ja
Granted legal-status Critical Current

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  • Glass Compositions (AREA)
  • Inorganic Insulating Materials (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

〔発明の技術分野〕 この発明は、特に銅系の導体ペーストを用いた
厚膜多層基体の絶縁層に使用して好適する絶縁層
用材料の改良に関する。 〔発明の技術的背景〕 周知のように、近時では、電子機器等の小形軽
量化を図るために、混成集積回路が多く使用され
るようになつてきている。この混成集積回路は、
例えばアルミナ等のセラミツク材料でなる絶縁基
板上に導体材料及び抵抗材料等を印刷・焼成して
配線層を形成してなる厚膜基板に、チツプタイプ
の受動素子や能動素子を半田付けして構成される
ものである。そして、近時では電子機器の小形軽
量化のため、なお一層の高密度化が要求されてお
り、厚膜基板としても上記配線層を絶縁層を介し
て多層に形成することが行なわれている。 また、近時では、上記導体材料としても、従来
一般に使用されていた銀−パラジウム系の導体ベ
ーストに代えて、銅系の導体ペーストを使用する
ことにより、電気的特性や信頼性を向上させ、か
つ経済的にも有利となるように配慮されてきてい
る。 このような銅系の導体ペーストを使用した厚膜
多層基板は、次のようにして製造される。まず、
セラミツク材料で形成された絶縁基板に、酸化ル
テニウム系の抵抗ペーストをスクリーン印刷法を
用いて印刷し、空気中で約850℃の温度で焼成し
て抵抗体層を形成する。その後、銅系の導体ペー
スト及びガラス系の絶縁ペーストを交互に積層す
るように印刷・焼成することにより製造されるも
のである。 この場合、上記銅系の導体ペースト及びガラス
系の絶縁ペーストの焼成は、銅の酸化を防ぐため
に、例えばチツ素ガス等の不活性ガス中で行なわ
れなければならず、さらに既に形成されている上
記抵抗体層の抵抗値変動を抑えるために、約600
℃程度の低温で行なう必要が生じる。 このため、上記のような低温焼成が可能な絶縁
ペースト用の材料(ガラス組成物)として、一般
に、酸化鉛(PbO)を多量に含ませたものが開発
されているが、これをチツ素ガス中で焼成する
と、鉛が析出して絶縁性能が著しく劣化してしま
い、実用化に不向きとなるものである。 そこで、従来より、約600℃前後の低温で焼成
することができる非鉛系の絶縁層用ガラス組成物
が要求されており、例えば特開昭59−129455号広
報に示されるように、550〜650℃の結晶化温度を
もつ低温焼成用の組成物を結晶化温度付近で焼成
する方法が開発されている。 〔背景技術の問題点〕 しかしながら、上記のように完全に結晶化した
ガラスは、比較的ピンホールが生じ易く、上層及
び下層の配線層間の絶縁不良を生じ易く、また上
層の配線層が密着しにくいという問題を有してい
る。さらに、このような組成のガラス組成物で
は、アルミナの絶縁基板に対する濡れ性が良くな
く、密着力も不十分であるという不都合を有して
いる。 〔発明の目的〕 この発明は上記事情を考慮してなされたもの
で、絶縁性能及び密着性に優れ、しかも低温焼成
可能で、形成済の抵抗体層の抵抗値を大きく変動
させることもない極めて良好な絶縁層用材料を提
供することを目的とする。 〔発明の概要〕 すなわち、この発明に係る絶縁層用材料は、重
量%で、SiO2を5〜20、ZnOを45〜60、B2O3
15〜30、R2O(Li2O+Na2O+K2O)を0.1〜3、
Al2O3を0.5〜5、Bi2O3を0.5〜5、Fを0.5〜2、
SnO2を0.5〜2、CoOを0〜2、P2O5を0〜2、
ZrO2を0〜5、CdOを0〜5、PbOを0〜3の
割合で配合させ、650〜750℃の結晶化温度を持た
せるようにしたものである。 ここで、各組成分を、上記のような配合比にし
た限定理由は、次の通りである。 SiO2:5%より少ないと溶融時の粘性が低く、
ガラス化しにくい。また、20%より多いと軟化
温度が上昇し、低温(600℃)での焼成ができ
なくなる。 ZnO:45%より少ないと結晶化ができなくなり、
60%を越えると結晶化温度が下がりすぎる。 B2O3:15%より少ないと軟化温度が高くなり、
30%より多いと十分に結晶化することができな
くなる。 R2O:ガラスの溶融を促進するため、Li2O、
Na2O、K2Oのうち一種以上添加できるが、こ
れらの総量が3%を越えると絶縁抵抗値を低下
させる。 Al2O3:0.5%より少ないと結晶化温度が下がりす
ぎ、5%より多いとガラスの軟化温度が上がり
すぎる。 Bi2O3:0.5%より少ないとガラスのアルミナ基板
に対する濡れ性が悪く、5%より多いと膨張係
数が大きくなりすぎる。 F:ガラスの溶融を促進するために添加するが、
2%を越えると膨張係数が大きくなる。 SnO2:ガラスの耐水性を向上させるために添加
する。0.5%より少ないと効果がなく、2%よ
り多くても効果は向上しない。 CoO、P2O5、ZrO2、CdO、PbOについては、
必須成分ではないが、いずれか一種または二種以
上を0.1%含有させると、絶縁抵抗を劣化させず、
ガラスとしてその安定性保持に寄与するが、それ
ぞれ2、2、5、5、3%を越えると、ガラスが
不均質になつたり、絶縁抵抗を劣化させたり、あ
るいは効果の増大が期待できなくなる。 なお、一般的にガラスの溶融を促進するために
RO(MgO、CaO、BaO、SrO)成分を添加する
ことが多いが、この発明ではRO成分を加える
と、ガラス絶縁層上の導体の密着力が低下するの
で、添加しないようにしている。 〔発明の実施例〕 以下、この発明の一実施例について説明する。
すなわち、表1に示すような組成になるように原
料を調合する。なお、表1において、試料番号(1)
〜(3)までが、この発明に係る絶縁層用材料を示し
ており、試料番号(4)、(5)はそれぞれ従来の絶縁層
用材料を示している。 そして、表1に示すように調合したものを、
1300〜1400℃の温度で白金るつぼ中で溶融し、ガ
ラス化する。次に、このガラスを粉砕し篩分した
後、湿式法にて粉砕を行ない、平均粒径5μmの
粉末とする。そして、この粉末と適当量のビヒク
ル(例えばエチルセルロースのテルピネオール
等)とを混練し、ガラスペーストを形成する。 その後、予めアルミナ基板上に印刷・焼成によ
り形成された、第1層目となる、銅系導体及び酸
化ルテニウム(RuO2)系抵抗体よりなる配線層
を覆うように上記ガラスペーストを印刷し、チツ
素ガス雰囲気中で600℃で10分間焼成することに
より、膜厚約40μmの絶縁層を形成する。そし
て、この絶縁層上に第2層目の配線層となる銅系
導体を同様に形成する。 このように上記した絶縁層用のガラス組成分
は、600℃の低温で焼成されるので、絶縁層を完
全に結晶化させないで形成することができ、従来
のようにピンホールが生じることなく、絶縁性を
向上させることができるものである。 上記のようにして製造されたガラス組成物の物
性及び形成された絶縁層の絶縁抵抗値、アルミナ
基板面に対する絶縁層の密着性及び絶縁層上の銅
系導体の半田濡れ性等を、表2に示す。 この場合、絶縁抵抗は、60℃95%の恒温恒湿槽
中に1000時間放置した後、第1層目の配線層と第
2層目の配線層との各導体間に直流50Vを印加し
たときの室温における抵抗値である。 また、密着性は、第2層目の導体にリード線を
半田付けし、これを垂直に引張り、アルミナ基板
面と絶縁層との間、または絶縁層と第2層目の導
体との間の剥離強度を測定したとき、1Kg/mm2
上を良とした。 さらに、半田濡れ性は、Agを2%含有するPb
−Sn共晶半田を用い、230℃で3秒間浸漬した後
引き上げ、第2層目の導体面積の90%以上が半田
に濡れているものを良とした。 ここで、上記実施例では、銅系導体を不活性ガ
ス雰囲気中で焼成することについて説明したが、
この発明に係る絶縁層用材料は、例えば銀−パラ
ジウム系導体を空気中で焼成する厚膜多層基板に
も適用できることはもちろんである。
[Technical Field of the Invention] The present invention relates to an improvement in an insulating layer material suitable for use in an insulating layer of a thick film multilayer substrate using a copper-based conductive paste. [Technical Background of the Invention] As is well known, in recent years, hybrid integrated circuits have come into widespread use in order to reduce the size and weight of electronic devices and the like. This hybrid integrated circuit is
For example, it is constructed by soldering chip-type passive elements and active elements to a thick film substrate made of an insulating substrate made of a ceramic material such as alumina, and then printing and firing conductive materials and resistance materials to form a wiring layer. It is something that Recently, in order to reduce the size and weight of electronic devices, there has been a demand for even higher densities, and the above wiring layers are now formed in multiple layers with insulating layers interposed in thick film substrates. . In recent years, copper-based conductor paste has been used as the conductor material instead of the conventionally commonly used silver-palladium-based conductor base, improving electrical characteristics and reliability. Moreover, consideration has been given to making it economically advantageous. A thick film multilayer board using such a copper-based conductive paste is manufactured as follows. first,
A ruthenium oxide-based resistance paste is printed on an insulating substrate made of ceramic material using a screen printing method, and then baked in air at a temperature of approximately 850°C to form a resistor layer. After that, it is manufactured by printing and firing a copper-based conductive paste and a glass-based insulating paste so as to be alternately laminated. In this case, the firing of the copper-based conductive paste and the glass-based insulating paste must be carried out in an inert gas, such as nitrogen gas, to prevent oxidation of the copper. In order to suppress the resistance value fluctuation of the above resistor layer, approximately 600
It becomes necessary to carry out the process at a low temperature of about ℃. For this reason, materials containing a large amount of lead oxide (PbO) have generally been developed as materials (glass compositions) for insulating pastes that can be fired at low temperatures as mentioned above. If fired inside, lead will precipitate and the insulation performance will deteriorate significantly, making it unsuitable for practical use. Therefore, there has been a demand for lead-free glass compositions for insulating layers that can be fired at low temperatures of about 600°C. A method has been developed in which a composition for low-temperature firing, which has a crystallization temperature of 650°C, is fired near the crystallization temperature. [Problems in the background art] However, completely crystallized glass as described above is relatively prone to pinholes, poor insulation between the upper and lower wiring layers, and the upper wiring layers are not in close contact with each other. It has the problem of being difficult. Furthermore, a glass composition having such a composition has the disadvantage that the wettability of alumina to the insulating substrate is not good and the adhesion is insufficient. [Purpose of the Invention] This invention was made in consideration of the above circumstances, and has excellent insulation performance and adhesion, can be fired at a low temperature, and does not significantly change the resistance value of the resistor layer that has already been formed. The purpose is to provide a good material for an insulating layer. [Summary of the Invention] That is, the insulating layer material according to the present invention contains 5 to 20% by weight of SiO 2 , 45 to 60% of ZnO, and 45 to 60% of B 2 O 3 by weight.
15-30, R 2 O (Li 2 O + Na 2 O + K 2 O) 0.1-3,
Al 2 O 3 0.5-5, Bi 2 O 3 0.5-5, F 0.5-2,
SnO 2 from 0.5 to 2, CoO from 0 to 2, P 2 O 5 from 0 to 2,
ZrO 2 is blended in a ratio of 0 to 5, CdO is 0 to 5, and PbO is blended in a ratio of 0 to 3 to give a crystallization temperature of 650 to 750°C. Here, the reasons for limiting each component to the above-mentioned mixing ratio are as follows. SiO 2 : If it is less than 5%, the viscosity during melting will be low;
Hard to vitrify. Moreover, if the amount is more than 20%, the softening temperature will increase, making it impossible to fire at low temperatures (600°C). ZnO: If it is less than 45%, crystallization will not be possible,
If it exceeds 60%, the crystallization temperature will drop too much. B2O3 : If it is less than 15% , the softening temperature will be high,
If it exceeds 30%, sufficient crystallization will not be possible. R 2 O: Li 2 O, to promote glass melting;
One or more of Na 2 O and K 2 O can be added, but if the total amount exceeds 3%, the insulation resistance value will decrease. Al 2 O 3 : If it is less than 0.5%, the crystallization temperature will be too low, and if it is more than 5%, the softening temperature of the glass will be too high. Bi 2 O 3 : If it is less than 0.5%, the wettability of the glass to the alumina substrate will be poor, and if it is more than 5%, the expansion coefficient will become too large. F: Added to promote melting of glass,
If it exceeds 2%, the expansion coefficient becomes large. SnO 2 : Added to improve the water resistance of glass. If it is less than 0.5%, there is no effect, and if it is more than 2%, the effect does not improve. For CoO, P2O5 , ZrO2 , CdO, PbO ,
Although they are not essential components, if one or more of them are included at 0.1%, the insulation resistance will not deteriorate.
It contributes to maintaining the stability of the glass, but if it exceeds 2, 2, 5, 5, or 3%, the glass becomes inhomogeneous, the insulation resistance deteriorates, or no increase in effectiveness can be expected. Furthermore, in order to promote the melting of glass,
Although RO (MgO, CaO, BaO, SrO) components are often added, in this invention, the addition of RO components reduces the adhesion of the conductor on the glass insulating layer, so it is not added. [Embodiment of the Invention] An embodiment of the invention will be described below.
That is, the raw materials are mixed to have the composition shown in Table 1. In addition, in Table 1, sample number (1)
Sample numbers (4) and (5) indicate conventional insulating layer materials, respectively. Then, the mixture prepared as shown in Table 1,
It is melted and vitrified in a platinum crucible at a temperature of 1300-1400℃. Next, this glass is crushed and sieved, and then crushed by a wet method to obtain a powder having an average particle size of 5 μm. Then, this powder is kneaded with an appropriate amount of vehicle (for example, terpineol of ethyl cellulose) to form a glass paste. After that, the glass paste is printed so as to cover the first layer, which is a wiring layer made of a copper-based conductor and a ruthenium oxide (RuO 2 )-based resistor, which has been previously formed on the alumina substrate by printing and firing, An insulating layer with a thickness of about 40 μm is formed by baking at 600° C. for 10 minutes in a nitrogen gas atmosphere. Then, a copper-based conductor that will become a second wiring layer is similarly formed on this insulating layer. Since the above-mentioned glass composition for the insulating layer is fired at a low temperature of 600°C, the insulating layer can be formed without being completely crystallized, and pinholes do not occur as in the conventional method. It is possible to improve insulation properties. The physical properties of the glass composition produced as described above, the insulation resistance value of the insulating layer formed, the adhesion of the insulating layer to the alumina substrate surface, the solder wettability of the copper-based conductor on the insulating layer, etc. are shown in Table 2. Shown below. In this case, the insulation resistance was determined by applying 50 V DC between each conductor of the first wiring layer and the second wiring layer after leaving it in a constant temperature and humidity chamber at 60°C and 95% for 1000 hours. This is the resistance value at room temperature. In addition, adhesion can be determined by soldering a lead wire to the second layer conductor and pulling it vertically. When the peel strength was measured, a value of 1 Kg/mm 2 or more was considered good. Furthermore, the solder wettability was determined by Pb containing 2% Ag.
-Sn eutectic solder was used, and the sample was immersed at 230°C for 3 seconds and then pulled up. If 90% or more of the second layer conductor area was wet with the solder, it was judged as good. Here, in the above embodiment, it was explained that the copper-based conductor was fired in an inert gas atmosphere.
It goes without saying that the insulating layer material according to the present invention can also be applied to, for example, a thick film multilayer substrate in which a silver-palladium conductor is fired in air.

【表】【table】

〔発明の効果〕〔Effect of the invention〕

したがつて、以上詳述したようにこの発明によ
れば、絶縁性能及び密着性に優れ、しかも抵温焼
成可能で、形成済の抵抗体層の抵抗値を大きく変
動させることもない極めて良好な絶縁層用材料を
提供することができる。
Therefore, as detailed above, according to the present invention, an extremely good material which has excellent insulation performance and adhesion, which can be fired at a low temperature, and which does not significantly change the resistance value of the resistor layer that has already been formed, can be obtained. A material for an insulating layer can be provided.

Claims (1)

【特許請求の範囲】[Claims] 1 重量%で、SiO2を5〜20、ZnOを45〜60、
B2O3を15〜30、R2O(Li2O+Na2O+K2O)を0.1
〜3、Al2O3を0.5〜5、Bi2O3を0.5〜5、Fを
0.5〜2、SnO2を0.5〜2、CoOを0〜2、P2O5
を0〜2、ZrO2を0〜5、CdOを0〜5、PbO
を0〜3の割合で配合し、650〜700℃の結晶化温
度を持たせるようにしてなることを特徴とする絶
縁層用材料。
1% by weight, SiO 2 5-20, ZnO 45-60,
B 2 O 3 is 15-30, R 2 O (Li 2 O + Na 2 O + K 2 O) is 0.1
~3, Al 2 O 3 0.5 ~ 5, Bi 2 O 3 0.5 ~ 5, F
0.5-2, SnO 2 0.5-2, CoO 0-2, P 2 O 5
0-2, ZrO 2 0-5, CdO 0-5, PbO
A material for an insulating layer, characterized in that the material is blended in a ratio of 0 to 3 to have a crystallization temperature of 650 to 700°C.
JP17003085A 1985-08-01 1985-08-01 Material for insulation layer Granted JPS6231903A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17003085A JPS6231903A (en) 1985-08-01 1985-08-01 Material for insulation layer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17003085A JPS6231903A (en) 1985-08-01 1985-08-01 Material for insulation layer

Publications (2)

Publication Number Publication Date
JPS6231903A JPS6231903A (en) 1987-02-10
JPH0558201B2 true JPH0558201B2 (en) 1993-08-26

Family

ID=15897301

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17003085A Granted JPS6231903A (en) 1985-08-01 1985-08-01 Material for insulation layer

Country Status (1)

Country Link
JP (1) JPS6231903A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2582696Y2 (en) * 1991-01-24 1998-10-08 三菱重工業株式会社 Fiber reinforced plastic wing for windmill
JP2001187313A (en) * 1999-12-28 2001-07-10 Hisao Kojima Wet stack gas desulfurizing device
JP6064298B2 (en) * 2011-08-25 2017-01-25 日本電気硝子株式会社 Glass for semiconductor element coating

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5337715A (en) * 1976-09-21 1978-04-07 Asahi Glass Co Ltd Sealing glass
JPS59129455A (en) * 1983-01-14 1984-07-25 Hitachi Ltd Thick film hybrid integrated circuit board

Also Published As

Publication number Publication date
JPS6231903A (en) 1987-02-10

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