JPS6231903A - Material for insulation layer - Google Patents

Material for insulation layer

Info

Publication number
JPS6231903A
JPS6231903A JP17003085A JP17003085A JPS6231903A JP S6231903 A JPS6231903 A JP S6231903A JP 17003085 A JP17003085 A JP 17003085A JP 17003085 A JP17003085 A JP 17003085A JP S6231903 A JPS6231903 A JP S6231903A
Authority
JP
Japan
Prior art keywords
glass
insulating layer
insulating
temperature
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17003085A
Other languages
Japanese (ja)
Other versions
JPH0558201B2 (en
Inventor
金子 恒雄
笠井 則男
江崎 史郎
四ツ柳 眞彦
坂巻 恵
和久 木村
阿井 孝博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
AGC Techno Glass Co Ltd
Original Assignee
Toshiba Corp
Toshiba Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toshiba Glass Co Ltd filed Critical Toshiba Corp
Priority to JP17003085A priority Critical patent/JPS6231903A/en
Publication of JPS6231903A publication Critical patent/JPS6231903A/en
Publication of JPH0558201B2 publication Critical patent/JPH0558201B2/ja
Granted legal-status Critical Current

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  • Glass Compositions (AREA)
  • Inorganic Insulating Materials (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔発明の技術分野〕 この発明は、特に銅系の導体ペーストを用いた厚膜多層
基体の絶縁層に使用して好適する絶縁層用材料の改良に
関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an improvement in an insulating layer material suitable for use in an insulating layer of a thick film multilayer substrate, particularly using a copper-based conductor paste.

〔発明の技術的背景〕[Technical background of the invention]

周知のように、近時では、電子機器等の小形軽量化を図
るために、混成集積回路が多く使用されるようになって
きている。この混成集積回路は、例えばアルミナ等のセ
ラミック材料で表る絶縁基板上に導体材料及び抵抗材料
等を印刷・焼成して配線層を形成してなる厚膜基板に、
チ、′fタイプの受動素子や能動素子を牛田付けして構
成されるものである。そして、近時では電子機器の小形
軽量化のため、なお一層の高密度化が要求されてお夛、
厚膜基板としても上記配線層を絶縁層を介して多層に形
成することが行なわれている。
As is well known, in recent years, hybrid integrated circuits have come into widespread use in order to reduce the size and weight of electronic devices and the like. This hybrid integrated circuit is made of a thick film substrate made of an insulating substrate made of a ceramic material such as alumina, and a wiring layer formed by printing and firing a conductive material, a resistive material, etc.
It is constructed by combining passive elements and active elements of type H and F. Recently, in order to make electronic devices smaller and lighter, there has been a demand for even higher densities.
As for thick film substrates, the wiring layers are formed in multiple layers with insulating layers interposed therebetween.

また、近時では、上記導体材料としても、従来一般に使
用されていた銀−パラジウム系の導一体ペーストに代え
て、銅系の導体ペーストを使用することにより、電気的
特性や信頼性を向上させ、かつ経済的にも有利と々るよ
うに配慮されてきている。
In addition, recently, copper-based conductor paste has been used as the conductor material, instead of the silver-palladium-based conductor paste that was commonly used in the past, to improve electrical characteristics and reliability. At the same time, consideration has been given to making it economically advantageous.

このような銅系の導体ペーストを使用した厚膜多層基板
は、次のようにして製造される。まず、セ9オ、り材料
で形成された絶縁基板に、酸化ルテニウム系の抵抗ペー
ストをスクリーン印刷法を用いて印刷し、空気中で約8
50℃の温度で焼成して抵抗体層を形成する。その後、
銅系の導体ペースト及びガラス系の絶縁ペーストを交互
に積層するように印刷・焼成することにより製造される
ものである。
A thick film multilayer board using such a copper-based conductive paste is manufactured as follows. First, a ruthenium oxide-based resistance paste was printed on an insulating substrate made of a 90% aluminum material using a screen printing method, and
A resistor layer is formed by firing at a temperature of 50°C. after that,
It is manufactured by printing and firing a copper-based conductive paste and a glass-based insulating paste in such a way that they are alternately laminated.

この場合、上記銅系の導体ペースト及びガラス系の絶縁
ペーストの焼成は、銅の酸化を防ぐために、例えばチ、
素ガス等の不活性ガス中で行なわれなければならず、さ
らに既に形成されている上記抵抗体層の抵抗値変動を抑
えるために、約600℃程度の低温で行なう必要が生じ
る。
In this case, the above-mentioned copper-based conductive paste and glass-based insulating paste are fired in order to prevent oxidation of the copper.
It must be carried out in an inert gas such as a raw gas, and furthermore, it needs to be carried out at a low temperature of about 600° C. in order to suppress fluctuations in the resistance value of the resistor layer that has already been formed.

このため、上記のような低温焼成が可能な絶縁ペースト
用の材料(ガラス組成物)として、一般に、酸化鉛(p
bo)を多量に含ませたものが開発されているが、これ
をチ、素ガス中で焼成すると、鉛が析出して絶縁性能が
著しく劣化してしまい、実用化に不向きとなるものであ
る。
For this reason, lead oxide (p
A product containing a large amount of bo) has been developed, but when this is fired in an elementary gas, lead precipitates and the insulation performance deteriorates significantly, making it unsuitable for practical use. .

そこで、従来よシ、約600℃前後の低温で焼成するこ
とができる非鉛系の絶縁層用ガラス組成物が要求されて
おシ、例えば特開昭59−129455号公報に示され
るように、550〜650℃の結晶化温度をもつ低温焼
成用の組成物を結晶化温度付近で焼成する方法が開発さ
れている。
Therefore, there has been a demand for a lead-free glass composition for an insulating layer that can be fired at a low temperature of about 600°C. A method has been developed in which a composition for low-temperature firing having a crystallization temperature of 550 to 650°C is fired near the crystallization temperature.

〔背景技術の問題点〕[Problems with background technology]

しかしながら、上記のように完全に結晶化したガラスは
、比較的ピンホールが生じ易く、上層及び下層の配線層
間の絶縁不良を生じ易く、また上層の配線層が密着しに
くいという問題を有している。さらに、このような組成
のガラス組成物では、アルミナの絶縁基板に対する濡れ
性が良くなく、密着力も不十分であるという不都合を有
している。
However, completely crystallized glass as described above has problems such as relatively easy pinhole formation, poor insulation between the upper and lower wiring layers, and difficulty in adhesion between the upper wiring layers. There is. Furthermore, a glass composition having such a composition has the disadvantage that the wettability of alumina to an insulating substrate is not good and the adhesion is insufficient.

〔発明の目的〕[Purpose of the invention]

この発明は上記事情を考慮してなされたもので、絶縁性
能及び密着性に優れ、しかも低温焼成可能で、形成済の
抵抗体層の抵抗値を大きく変動させることもない極めて
良好な絶縁層用材  i料を提供することを目的とする
This invention was made in consideration of the above circumstances, and provides an extremely good insulating layer material that has excellent insulating performance and adhesion, can be fired at low temperatures, and does not significantly change the resistance value of the already formed resistor layer. The purpose is to provide i-fees.

〔発明の概要〕[Summary of the invention]

すなわち、この発明に係る絶縁層用材料は、重量%で、
5to2を5〜20、ZnOを45〜60、B2O3を
1B〜30、 R20(Li20+Na2O+に20)
を0、1〜3、Aj205を0.5〜5、B120st
−0,5〜5、Fを0.5〜2.8 no 2を0.5
〜2、CoOt0〜2、ZrO2、P2O5を0〜2、
Z rO2を0〜5、cdo′fr:0〜5、pboを
0〜3の割合で配合させ、650〜750℃の結晶化温
度を持たせるようにしたものである。
That is, the insulating layer material according to the present invention has, in weight%,
5to2 5-20, ZnO 45-60, B2O3 1B-30, R20 (20 for Li20+Na2O+)
0, 1-3, Aj205 0.5-5, B120st
-0.5~5, F 0.5~2.8 no 2 0.5
~2, CoOt0~2, ZrO2, P2O5 0~2,
ZrO2 is blended in a ratio of 0 to 5, cdo'fr: 0 to 5, and pbo is blended in a ratio of 0 to 3, so as to have a crystallization temperature of 650 to 750°C.

ここで、各組成分を、上記のような配合比にした限定理
由は、次の通シである。
Here, the reason for limiting each component to the above-mentioned mixing ratio is as follows.

8102: 5 優より少ないと溶融時の粘性が低く、
ガラス化しにくい。また、20俤よシ 多いと軟化温度が上昇し、低温(600C)での焼成が
できなくなる。
8102: If it is less than 5 excellent, the viscosity during melting will be low;
Hard to vitrify. Furthermore, if the temperature is more than 20 degrees, the softening temperature will rise, making it impossible to fire at a low temperature (600C).

Zn0145%より少ないと結晶化ができなくな、D、
60%を越えると結晶化温度が下が多すぎる。
If Zn01 is less than 45%, crystallization will not be possible, D.
If it exceeds 60%, the crystallization temperature is too low.

n2o3$ 15 %よシ少ないと軟化温度が高くなリ
、30優よシ多いと十分に結晶化す ることができなくなる。
If n2o3$ is less than 15%, the softening temperature will be high; if it is more than 30%, sufficient crystallization will not occur.

R20!ガラスの溶融を促進するため、Li2O、Na
2O、R20のうち一種以上添加できるが、これらの総
量が3チを越えると絶縁抵 抗値を低下させる。
R20! To promote glass melting, Li2O, Na
One or more of 2O and R20 can be added, but if the total amount exceeds 3, the insulation resistance value will be lowered.

Aノ。o3to、5*よシ少ないと結晶化温度が下がジ
すぎ、5%より多いとガラスの軟化 温度が上が9すぎる。
A no. o3to, 5* If it is too low, the crystallization temperature will be too low, and if it is more than 5%, the softening temperature of the glass will be too high.

B12O3! 0.5%よし少ないとガラスのアルミナ
基板に対する濡れ性が悪く、5チよp 多いと膨張係数が大きくなシすぎる。
B12O3! If it is less than 0.5%, the wettability of the glass to the alumina substrate will be poor, and if it is more than 5%, the expansion coefficient will be too large.

Pgガラスの溶融を促進するために添加するが、2チを
越えると膨張係数が大き くなる。
It is added to promote the melting of Pg glass, but if it exceeds 2 inches, the expansion coefficient increases.

5nOz 富ガラスの耐水性を向上させるために添加す
る。0.5チよシ少ないと効果がなく、2tsより多く
ても効果は向上しない。
Added to improve the water resistance of 5nOz-rich glass. If the amount is less than 0.5 ts, there will be no effect, and if it is more than 2 ts, the effect will not improve.

CoOe P2()5 * Zr02s CdO* p
boについては、必須成分ではないが、いずれか一種ま
たは二種以上を01%含有させると、絶縁抵抗を劣化さ
せず、ガラスとしての安定性保持に寄与するが、それぞ
れ2,2,5,5.3%を越えると、ガラスが不均質に
カフたり、絶縁抵抗を劣化させたシ、あるいは効果の増
大が期待できなくなる。
CoOe P2()5 * Zr02s CdO * p
As for bo, although it is not an essential component, if one or more of them are contained at 01%, the insulation resistance will not deteriorate and it will contribute to maintaining the stability of the glass. If it exceeds .3%, the glass may become unevenly cuffed, the insulation resistance may deteriorate, or no increase in effectiveness can be expected.

なお、一般的にガラスの溶融を促進するためにRO(M
gO、CaO、BaO、5rO)成分を添加することが
多いが、この発明ではRO酸成分加えると、ガラス絶縁
層上の導体の密着力が低下するので、添加しないように
している。
Note that RO (M
(gO, CaO, BaO, 5rO) components are often added, but in this invention, the addition of the RO acid component reduces the adhesion of the conductor on the glass insulating layer, so it is not added.

〔発明の実施例〕[Embodiments of the invention]

以下、この発明の一実施例について説明する。 An embodiment of the present invention will be described below.

すなわち、表1に示すような組成になるように原料を調
合する。なお、表1において、試料番号(1)〜(3)
までが、この発明に係る絶縁層用材料を示しておシ、試
料番号(4) I (5)はそれぞれ従来の絶縁層用材
料を示している。
That is, the raw materials are mixed to have the composition shown in Table 1. In addition, in Table 1, sample numbers (1) to (3)
Sample numbers (4), I, and (5) indicate conventional materials for insulating layers, respectively.

そして、表1に示すように調合したものを、1300〜
1400℃の温度で白金るつは中で溶融し、ガラス化す
る。次に、このガラスを粉砕し篩分した後、湿式法にて
粉砕を行ない、平均粒径5μmの粉末とする。そして、
この粉末と適当量のビヒクル(例えばエチルセルロース
とテルピネオール等)とを混練し、ガラスペーストを形
成する。
Then, the mixture prepared as shown in Table 1 was prepared at 1300~
The platinum melts at a temperature of 1400°C and becomes vitrified. Next, this glass is crushed and sieved, and then crushed by a wet method to obtain a powder having an average particle size of 5 μm. and,
This powder is kneaded with an appropriate amount of vehicle (eg, ethyl cellulose, terpineol, etc.) to form a glass paste.

その彼、予めアルミナ基板上に印刷・焼成により形成さ
れた、第1層目となる、銅系導体及び酸化ルテニウム(
Ru02 )系抵抗体よシなる配線層を請うように上記
ガラスペーストを印刷し、チッ素ガス雰囲気中で600
℃で10分間焼成することにより、膜厚約40μmの絶
縁層を形成する。そして、この絶縁層上に第2層目の配
線層となる銅系導体を同様に形成する。
The first layer, copper-based conductor and ruthenium oxide (
The above glass paste was printed so as to form a wiring layer similar to that of the Ru02)-based resistor, and then heated at 600° C. in a nitrogen gas atmosphere.
By baking at .degree. C. for 10 minutes, an insulating layer with a thickness of about 40 .mu.m is formed. Then, a copper-based conductor that will become a second wiring layer is similarly formed on this insulating layer.

このように上記した絶縁層用のガラス組成分は、600
℃の低温で焼成されるので、絶縁層を完全に結晶化させ
ないで形成することができ、従来のようにピンホールが
生じることなく、絶縁性を向上させることができるもの
である。  声上記のようにして製造されたガラス組成
物の物性及び形成された絶縁層の絶縁抵抗値、アルミナ
基板面に対する絶縁層の密着性及び絶縁層上の銅系導体
の半田濡れ性等を、表2に示す。
In this way, the above-mentioned glass composition for the insulating layer is 600
Since it is fired at a low temperature of .degree. C., the insulating layer can be formed without being completely crystallized, and the insulating properties can be improved without creating pinholes as in the conventional method. The physical properties of the glass composition produced as described above, the insulation resistance value of the insulating layer formed, the adhesion of the insulating layer to the alumina substrate surface, the solder wettability of the copper-based conductor on the insulating layer, etc. Shown in 2.

この場合、絶縁抵抗は、60℃95俤の恒温恒湿槽中に
1000時間放置した後、第1層目の配線層と第2層目
の配線層との各導体間に直流50Vを印加したときの室
温における抵抗値である。
In this case, the insulation resistance was determined by applying 50 V DC between each conductor of the first wiring layer and the second wiring layer after leaving it in a constant temperature and humidity chamber at 60°C for 1000 hours. This is the resistance value at room temperature.

また、密着性は、第2層目の導体にリード線を半田付け
し、これを垂直に引張り1アルミナ基板面と絶縁層との
間、または絶縁層と第2層目の導体との間の剥離強度を
測定したとき、1ゆ/−以上を良とした。
Adhesion can also be determined by soldering a lead wire to the second layer conductor and pulling it vertically. When the peel strength was measured, a value of 1 Y/- or more was considered good.

さらに、半田濡れ性は、Agを2チ含有するPb−8n
共晶半田を用い、230℃で3秒間浸漬した後引き上げ
、第2層目の導体面積の90チ以上が半田に濡れている
ものを良とした。
Furthermore, the solder wettability was
Using eutectic solder, the sample was immersed at 230° C. for 3 seconds and then pulled out, and the sample was evaluated as good if 90 inches or more of the second layer conductor area was wet with the solder.

ここで、上記実施例では、銅系導体を不活性ガス雰囲気
中で焼成することについて説明したが、この発明に係る
絶縁層用材料は、例えは銀−パラジウム系導体を空気中
で焼成する厚膜多9一 層基板にも適用できることはもちろんである。
Here, in the above embodiment, it was explained that the copper-based conductor is fired in an inert gas atmosphere, but the insulating layer material according to the present invention has a thickness that is similar to that for firing a silver-palladium-based conductor in air. It goes without saying that the present invention can also be applied to a single-layer substrate with multiple layers.

表 1 なお、この発明は上記実施例に限定されるものではなく
、この外その要旨を逸脱しない範囲で種々変形して実施
することができる。
Table 1 Note that the present invention is not limited to the above embodiments, and can be implemented with various modifications without departing from the gist thereof.

〔発明の効果〕〔Effect of the invention〕

したがって、以上詳述したようにこの発明によれば、絶
縁性能及び密着性に優れ、しかも低温焼成可能で、形成
済の抵抗体層の抵抗値を大きく変動させることもない極
めて良好な絶縁層用材料を提供することができる。
Therefore, as detailed above, according to the present invention, an extremely good insulating layer which has excellent insulating performance and adhesion, can be fired at a low temperature, and does not significantly fluctuate the resistance value of the already formed resistor layer. materials can be provided.

出願人代理人  弁理士 鈴 江 武 彦」Applicant’s agent: Patent attorney Takehiko Suzue”

Claims (1)

【特許請求の範囲】[Claims]  重量%で、SiO_2を5〜20、ZnOを45〜6
0、B_2O_3を15〜30、R_2O(Li_2O
+Na_2O+K_2O)を0.1〜3、Al_2O_
3を0.5〜5、Bi_2O_3を0.5〜5、Fを0
.5〜2、SnO_2を0.5〜2、CoOを0〜2、
P_2O_5を0〜2、ZrO_2を0〜5、CdOを
0〜5、PbOを0〜3の割合で配合させるようにして
なることを特徴とする絶縁層用材料。
In weight%, SiO_2 is 5-20, ZnO is 45-6
0, B_2O_3 from 15 to 30, R_2O(Li_2O
+Na_2O+K_2O) from 0.1 to 3, Al_2O_
3 from 0.5 to 5, Bi_2O_3 from 0.5 to 5, F from 0
.. 5-2, SnO_2 0.5-2, CoO 0-2,
A material for an insulating layer, characterized in that P_2O_5 is blended in a ratio of 0 to 2, ZrO_2 is 0 to 5, CdO is 0 to 5, and PbO is 0 to 3.
JP17003085A 1985-08-01 1985-08-01 Material for insulation layer Granted JPS6231903A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17003085A JPS6231903A (en) 1985-08-01 1985-08-01 Material for insulation layer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17003085A JPS6231903A (en) 1985-08-01 1985-08-01 Material for insulation layer

Publications (2)

Publication Number Publication Date
JPS6231903A true JPS6231903A (en) 1987-02-10
JPH0558201B2 JPH0558201B2 (en) 1993-08-26

Family

ID=15897301

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17003085A Granted JPS6231903A (en) 1985-08-01 1985-08-01 Material for insulation layer

Country Status (1)

Country Link
JP (1) JPS6231903A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04103262U (en) * 1991-01-24 1992-09-07 三菱重工業株式会社 Fiber-reinforced plastic blades for wind turbines
JP2001187313A (en) * 1999-12-28 2001-07-10 Hisao Kojima Wet stack gas desulfurizing device
WO2013027636A1 (en) * 2011-08-25 2013-02-28 日本電気硝子株式会社 Glass for covering semiconductor element

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5337715A (en) * 1976-09-21 1978-04-07 Asahi Glass Co Ltd Sealing glass
JPS59129455A (en) * 1983-01-14 1984-07-25 Hitachi Ltd Thick film hybrid integrated circuit board

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5337715A (en) * 1976-09-21 1978-04-07 Asahi Glass Co Ltd Sealing glass
JPS59129455A (en) * 1983-01-14 1984-07-25 Hitachi Ltd Thick film hybrid integrated circuit board

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04103262U (en) * 1991-01-24 1992-09-07 三菱重工業株式会社 Fiber-reinforced plastic blades for wind turbines
JP2001187313A (en) * 1999-12-28 2001-07-10 Hisao Kojima Wet stack gas desulfurizing device
WO2013027636A1 (en) * 2011-08-25 2013-02-28 日本電気硝子株式会社 Glass for covering semiconductor element
JP2013060353A (en) * 2011-08-25 2013-04-04 Nippon Electric Glass Co Ltd Glass for covering semiconductor element
CN103748049A (en) * 2011-08-25 2014-04-23 日本电气硝子株式会社 Glass for covering semiconductor element
TWI615370B (en) * 2011-08-25 2018-02-21 日本電氣硝子股份有限公司 Semiconductor component coated glass

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