JPH057358B2 - - Google Patents
Info
- Publication number
- JPH057358B2 JPH057358B2 JP8824188A JP8824188A JPH057358B2 JP H057358 B2 JPH057358 B2 JP H057358B2 JP 8824188 A JP8824188 A JP 8824188A JP 8824188 A JP8824188 A JP 8824188A JP H057358 B2 JPH057358 B2 JP H057358B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- single crystal
- substrate
- insulating film
- present
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 21
- 239000013078 crystal Substances 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 9
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 claims description 4
- 238000001947 vapour-phase growth Methods 0.000 claims description 3
- 239000007789 gas Substances 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- GQPLMRYTRLFLPF-UHFFFAOYSA-N Nitrous Oxide Chemical compound [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 description 4
- 229910052594 sapphire Inorganic materials 0.000 description 4
- 239000010980 sapphire Substances 0.000 description 4
- 238000002128 reflection high energy electron diffraction Methods 0.000 description 3
- 238000010894 electron beam technology Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000000864 Auger spectrum Methods 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000000635 electron micrograph Methods 0.000 description 1
- 238000001941 electron spectroscopy Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000001272 nitrous oxide Substances 0.000 description 1
- 239000012495 reaction gas Substances 0.000 description 1
- 238000000682 scanning probe acoustic microscopy Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000000927 vapour-phase epitaxy Methods 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8824188A JPH01261300A (ja) | 1988-04-12 | 1988-04-12 | 減圧気相成長法によるSi基板上へのAl↓2O↓3単結晶膜のヘテロエピタキシャル成長方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8824188A JPH01261300A (ja) | 1988-04-12 | 1988-04-12 | 減圧気相成長法によるSi基板上へのAl↓2O↓3単結晶膜のヘテロエピタキシャル成長方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01261300A JPH01261300A (ja) | 1989-10-18 |
| JPH057358B2 true JPH057358B2 (de) | 1993-01-28 |
Family
ID=13937363
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8824188A Granted JPH01261300A (ja) | 1988-04-12 | 1988-04-12 | 減圧気相成長法によるSi基板上へのAl↓2O↓3単結晶膜のヘテロエピタキシャル成長方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01261300A (de) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1037272A4 (de) | 1997-06-19 | 2004-07-28 | Asahi Chemical Ind | Silizium auf isolator (soi) substrat und halbleitenbauelement und verfahren zum deren herstellung |
| JP4654439B2 (ja) * | 2005-09-20 | 2011-03-23 | 国立大学法人豊橋技術科学大学 | 金属酸化物薄膜の形成方法 |
-
1988
- 1988-04-12 JP JP8824188A patent/JPH01261300A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01261300A (ja) | 1989-10-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6270568B1 (en) | Method for fabricating a semiconductor structure with reduced leakage current density | |
| KR100676213B1 (ko) | 실리콘에 대해 안정적인 결정질의 경계면을 구비하는반도체 구조를 제작하기 위한 방법 | |
| US8187377B2 (en) | Non-contact etch annealing of strained layers | |
| US6241821B1 (en) | Method for fabricating a semiconductor structure having a crystalline alkaline earth metal oxide interface with silicon | |
| EP1109212B1 (de) | Halbleiteranordnung mit einem kristallinen Erdalkalimetall - Siliziumnitrid/oxid Interface mit Silizium | |
| TWI382456B (zh) | 鬆弛矽化鍺層的磊晶成長 | |
| US6224669B1 (en) | Method for fabricating a semiconductor structure having a crystalline alkaline earth metal oxide interface with silicon | |
| EP1043427A1 (de) | Halbleiterstruktur mit einen Übergangsbereich aus kristallinem Erdalkalimetalloxid zwischen Silizium und einer monokristallinen Oxidschicht | |
| US5562770A (en) | Semiconductor manufacturing process for low dislocation defects | |
| JPH08191140A (ja) | Soi基板の製造方法 | |
| Hsieh et al. | Silicon homoepitaxy by rapid thermal processing chemical vapor deposition (RTPCVD)—A review | |
| JPH057358B2 (de) | ||
| JPH04233277A (ja) | 立方晶窒化ホウ素の層を有するトランジスター | |
| US7169619B2 (en) | Method for fabricating semiconductor structures on vicinal substrates using a low temperature, low pressure, alkaline earth metal-rich process | |
| KR20030051820A (ko) | 고 유전 상수 재료를 가지는 반도체 구조체 | |
| JPH11233440A (ja) | 半導体装置 | |
| JPH057359B2 (de) | ||
| JPS6012775B2 (ja) | 異質基板上への単結晶半導体層形成方法 | |
| JPH0294415A (ja) | 基板の作成方法 | |
| JPH10242053A (ja) | GaN系半導体装置および、GaN系半導体装置の製造方法 | |
| JPS5982744A (ja) | Sos基板の製造法 | |
| JPH0488627A (ja) | エピタキシャル層の成長法 | |
| JPH06291052A (ja) | 化合物半導体基板およびそれを用いた半導体装置並びに半導体基板の製造方法 | |
| JPH01162324A (ja) | 半導体装置及びその製造方法 | |
| JPH01183825A (ja) | 単結晶シリコン膜の形成方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| LAPS | Cancellation because of no payment of annual fees |