JPH0576130B2 - - Google Patents

Info

Publication number: JPH0576130B2
Authority: JP; Japan
Prior art keywords: sample; state; plasma torch; mass spectrometer; inductively coupled
Prior art date: 1988-06-30
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

JP63163260A

Other languages

English (en)

Japanese (ja)

Other versions

JPH0212748A (ja

Inventor

Kazuo Yamanaka

Takeshi Murayama

Kenichi Sakata

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Yokogawa Electric Corp

Original Assignee

Yokogawa Electric Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1988-06-30

Filing date

1988-06-30

Publication date

1993-10-22

1988-06-30 Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp

1988-06-30 Priority to JP63163260A priority Critical patent/JPH0212748A/ja

1990-01-17 Publication of JPH0212748A publication Critical patent/JPH0212748A/ja

1993-10-22 Publication of JPH0576130B2 publication Critical patent/JPH0576130B2/ja

Status Granted legal-status Critical Current

Links

Landscapes

Electron Tubes For Measurement (AREA)

JP63163260A 1988-06-30 1988-06-30 高周波誘導結合プラズマ質量分析装置 Granted JPH0212748A (ja)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP63163260A JPH0212748A (ja)	1988-06-30	1988-06-30	高周波誘導結合プラズマ質量分析装置

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP63163260A JPH0212748A (ja)	1988-06-30	1988-06-30	高周波誘導結合プラズマ質量分析装置

Publications (2)

Publication Number	Publication Date
JPH0212748A JPH0212748A (ja)	1990-01-17
JPH0576130B2 true JPH0576130B2 (cs)	1993-10-22

Family

ID=15770422

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP63163260A Granted JPH0212748A (ja)	1988-06-30	1988-06-30	高周波誘導結合プラズマ質量分析装置

Country Status (1)

Country	Link
JP (1)	JPH0212748A (cs)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
KR960002195Y1 (ko) *	1993-10-30	1996-03-15	주식회사 동일기연	노이즈 필터
DE102009017648A1 (de) *	2009-04-16	2010-10-21	Siemens Aktiengesellschaft	Gasinjektionssystem und Verfahren zum Betrieb eines Gasinjektionssystems, insbesondere für eine Partikeltherapieanlage

1988
- 1988-06-30 JP JP63163260A patent/JPH0212748A/ja active Granted

Also Published As

Publication number	Publication date
JPH0212748A (ja)	1990-01-17

Similar Documents

Publication	Publication Date	Title
US7511268B2 (en)	2009-03-31	Ion mobility spectrometer and its method of operation
JPH07260644A (ja)	1995-10-13	ガス分析におけるサンプリング装置
US20040151622A1 (en)	2004-08-05	Ultra-trace automatic mercury species analyzer
US5185523A (en)	1993-02-09	Mass spectrometer for analyzing ultra trace element using plasma ion source
JPH0212748A (ja)	1990-01-17	高周波誘導結合プラズマ質量分析装置
US4906582A (en)	1990-03-06	Emission analysis method with inductively-coupled radio frequency plasma and apparatus for use in such method
US5130537A (en)	1992-07-14	Plasma analyzer for trace element analysis
JPH0755780A (ja)	1995-03-03	ガスクロマトグラフによる各種ガス中の超微量成分の高感度測定装置
JP3686198B2 (ja)	2005-08-24	誘導結合プラズマ質量分析装置
Ye et al.	1996	Flow-injection on-line column preconcentration for low powered microwave plasma torch atomic emission spectrometry
JPH0320638A (ja)	1991-01-29	分光目的用の試料を前濃縮するための装置
US5071624A (en)	1991-12-10	System for introducing a sample substance into a spectroscopical analytical instrument
JP2836190B2 (ja)	1998-12-14	高周波誘導結合プラズマ分析装置
JP2006145295A (ja)	2006-06-08	実時間ガスクロマトグラフィー質量分析極微量気体検出
JPH0638371Y2 (ja)	1994-10-05	試料導入装置
US20230197431A1 (en)	2023-06-22	Direct Single Particle Compositional Analysis
JPH0542613Y2 (cs)	1993-10-27
JP3038839B2 (ja)	2000-05-08	高周波誘導結合プラズマ質量分析計
JP2789641B2 (ja)	1998-08-20	高周波誘導結合プラズマ質量分析計
JP3707701B2 (ja)	2005-10-19	流路切換え方法
JPH02227653A (ja)	1990-09-10	高周波誘導結合プラズマ質量分析計
JP2874307B2 (ja)	1999-03-24	プロセスガスクロマトグラフの校正方法
JPS6222061A (ja)	1987-01-30	ガスクロマトグラフ装置
WO2024121570A1 (en)	2024-06-13	Detector inlet and sampling method
JPH0716144U (ja)	1995-03-17	熱天秤のガスサンプリング装置

Legal Events

Date	Code	Title	Description
2004-10-05	R250	Receipt of annual fees	Free format text: JAPANESE INTERMEDIATE CODE: R250
2005-10-18	R250	Receipt of annual fees	Free format text: JAPANESE INTERMEDIATE CODE: R250
2006-10-17	R250	Receipt of annual fees	Free format text: JAPANESE INTERMEDIATE CODE: R250
2007-03-02	S111	Request for change of ownership or part of ownership	Free format text: JAPANESE INTERMEDIATE CODE: R313113
2007-03-13	R371	Transfer withdrawn	Free format text: JAPANESE INTERMEDIATE CODE: R371
2007-04-02	S111	Request for change of ownership or part of ownership	Free format text: JAPANESE INTERMEDIATE CODE: R313113
2007-04-02	S531	Written request for registration of change of domicile	Free format text: JAPANESE INTERMEDIATE CODE: R313531
2007-04-20	R360	Written notification for declining of transfer of rights	Free format text: JAPANESE INTERMEDIATE CODE: R360
2007-06-13	R350	Written notification of registration of transfer	Free format text: JAPANESE INTERMEDIATE CODE: R350
2007-11-06	FPAY	Renewal fee payment (event date is renewal date of database)	Free format text: PAYMENT UNTIL: 20081022 Year of fee payment: 15
2008-06-30	EXPY	Cancellation because of completion of term
2008-09-17	FPAY	Renewal fee payment (event date is renewal date of database)	Free format text: PAYMENT UNTIL: 20081022 Year of fee payment: 15