JPH0613331A - Vapor phase epitaxy apparatus - Google Patents
Vapor phase epitaxy apparatusInfo
- Publication number
- JPH0613331A JPH0613331A JP19140092A JP19140092A JPH0613331A JP H0613331 A JPH0613331 A JP H0613331A JP 19140092 A JP19140092 A JP 19140092A JP 19140092 A JP19140092 A JP 19140092A JP H0613331 A JPH0613331 A JP H0613331A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- reaction tube
- vapor phase
- reaction
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000927 vapour-phase epitaxy Methods 0.000 title abstract 2
- 238000006243 chemical reaction Methods 0.000 claims abstract description 38
- 239000000758 substrate Substances 0.000 claims abstract description 31
- 238000001947 vapour-phase growth Methods 0.000 claims description 21
- 239000002994 raw material Substances 0.000 claims description 20
- 238000010438 heat treatment Methods 0.000 claims description 10
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 239000007789 gas Substances 0.000 abstract description 24
- 238000011144 upstream manufacturing Methods 0.000 abstract description 6
- 239000000463 material Substances 0.000 abstract 5
- 150000001875 compounds Chemical class 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 238000010574 gas phase reaction Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 238000000034 method Methods 0.000 description 4
- 239000010408 film Substances 0.000 description 3
- RVIXKDRPFPUUOO-UHFFFAOYSA-N dimethylselenide Chemical compound C[Se]C RVIXKDRPFPUUOO-UHFFFAOYSA-N 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 230000002401 inhibitory effect Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000011669 selenium Substances 0.000 description 2
- 231100000331 toxic Toxicity 0.000 description 2
- 230000002588 toxic effect Effects 0.000 description 2
- 239000012808 vapor phase Substances 0.000 description 2
- KAXRWMOLNJZCEW-UHFFFAOYSA-N 2-amino-4-(2-aminophenyl)-4-oxobutanoic acid;sulfuric acid Chemical compound OS(O)(=O)=O.OC(=O)C(N)CC(=O)C1=CC=CC=C1N KAXRWMOLNJZCEW-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- RBFQJDQYXXHULB-UHFFFAOYSA-N arsane Chemical compound [AsH3] RBFQJDQYXXHULB-UHFFFAOYSA-N 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- XOYLJNJLGBYDTH-UHFFFAOYSA-M chlorogallium Chemical compound [Ga]Cl XOYLJNJLGBYDTH-UHFFFAOYSA-M 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- AXAZMDOAUQTMOW-UHFFFAOYSA-N dimethylzinc Chemical compound C[Zn]C AXAZMDOAUQTMOW-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000009036 growth inhibition Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- SPVXKVOXSXTJOY-UHFFFAOYSA-N selane Chemical compound [SeH2] SPVXKVOXSXTJOY-UHFFFAOYSA-N 0.000 description 1
- 229910000058 selane Inorganic materials 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 239000002887 superconductor Substances 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- IBEFSUTVZWZJEL-UHFFFAOYSA-N trimethylindium Chemical compound C[In](C)C IBEFSUTVZWZJEL-UHFFFAOYSA-N 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、半導体や化合物などの
成長層を基板上に結晶成長するための気相成長装置に関
する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a vapor phase growth apparatus for growing a growth layer of a semiconductor or a compound on a substrate.
【0002】[0002]
【従来の技術】気相成長装置は、半導体や酸化物超伝導
薄膜を基板上に成長させるために広く用いられている。
その中でも、化合物半導体を成長するのに適した有機金
属気相成長方法は広く利用され、多くの化合物が成長さ
れている。従来の気相成長装置としては、例えばジャー
ナル・オブ・クリスタル・グロース(Journal of Cryst
al Growth)第69巻,1984年,10頁〜14頁に詳述されて
いるものがある。図3は従来の気相成長装置の一例の概
略構成図である。ガス流量制御装置21から供給される
複数種の成長ガスが、複数の配管22によって独立に輸
送され、反応管23に接続されている。配管22と反応
管23との接続部分は、一般的に、Oリングを用いて配
管が直接反応管に接続されたものと、反応管上流部に固
定されたフランジに配管が接続されたものがある。反応
管23内には、サセプタ24上に置かれた基板25が配
置されており、基板加熱用として高周波コイル26が反
応管23の周りに配置されている。2. Description of the Related Art A vapor phase growth apparatus is widely used for growing a semiconductor or oxide superconducting thin film on a substrate.
Among them, the metal organic chemical vapor deposition method suitable for growing a compound semiconductor is widely used, and many compounds are grown. As a conventional vapor phase growth apparatus, for example, the Journal of Cryst
al Growth) Vol. 69, 1984, pp. 10-14. FIG. 3 is a schematic configuration diagram of an example of a conventional vapor phase growth apparatus. A plurality of types of growth gas supplied from the gas flow rate control device 21 are independently transported by the plurality of pipes 22 and connected to the reaction pipe 23. The connecting portion between the pipe 22 and the reaction pipe 23 is generally one in which the pipe is directly connected to the reaction pipe using an O-ring and one in which the pipe is connected to a flange fixed to the upstream portion of the reaction pipe. is there. A substrate 25 placed on the susceptor 24 is arranged in the reaction tube 23, and a high frequency coil 26 for heating the substrate is arranged around the reaction tube 23.
【0003】[0003]
【発明が解決しようとする課題】化合物半導体、例えば
InPを成長する際には、成長原料としてトリメチルイ
ンジウム((CH3)3In:TMIn)とフォスフィン
(PH3)を用いる例が多く報告されている。また、Z
nSeを成長させる場合には、成長原料としてジメチル
亜鉛((CH3)2Zn:DMZn)とセレン化水素(H
2Se)を用いる方法が知られている。しかし、従来の
気相成長装置を用いて、これらの原料による成長を行っ
た場合には、気相中で原料同士が反応し、結晶成長が阻
害されることが知られている。つまり、気相反応が生じ
ると、原料が基板に到達する前に消費され、同時に反応
管が汚れてしまう。また、反応生成物が基板に付着して
成長膜の膜質が悪くなるという問題が生じていた。近年
では、InP成長時にPH3/TMIn原料比を150
以上にすることによって、良質なInPが成長すること
が分かっているが、気相反応が除去されたわけではな
く、かつ有毒なPH3を大量に消費するといった問題が
新たに生じた。また、ZnSe成長に対しては、H2S
eの代りにジメチルセレン((CH3)2Se:DMS
e)を用いて気相反応が除去されることが分かってきた
が、原料の熱分解温度が高いため成長温度が高くなって
しまうという問題があった。When growing a compound semiconductor, for example, InP, there are many reports that trimethylindium ((CH 3 ) 3 In: TMIn) and phosphine (PH 3 ) are used as growth raw materials. There is. Also, Z
When nSe is grown, dimethyl zinc ((CH 3 ) 2 Zn: DMZn) and hydrogen selenide (H) are used as growth raw materials.
A method using 2 Se) is known. However, it is known that when the conventional vapor phase growth apparatus is used to grow these raw materials, the raw materials react with each other in the vapor phase to inhibit crystal growth. That is, when the gas phase reaction occurs, the raw material is consumed before reaching the substrate, and at the same time, the reaction tube becomes dirty. Further, there is a problem that the reaction product adheres to the substrate and the quality of the grown film deteriorates. In recent years, the PH 3 / TMIn raw material ratio was set to 150 during InP growth.
By the above, it is known that good-quality InP grows, but the gas-phase reaction was not removed, and a new problem of consuming a large amount of toxic PH 3 occurred. Also, for ZnSe growth, H 2 S
Dimethyl selenium ((CH 3 ) 2 Se: DMS instead of e
Although it has been found that the gas phase reaction is removed by using e), there is a problem that the growth temperature becomes high because the thermal decomposition temperature of the raw material is high.
【0004】一方、基板の加熱方法としては、反応管外
部に設置された電気炉を用いる方法があるが、従来の成
長装置では電気炉の熱輻射により基板上流部で原料が熱
分解され、同時に反応して反応管の内壁に付着し、成長
が阻害される問題があった。また、従来の成長装置に
は、配管と反応管が直接接続された装置があるが、反応
管の形状が複雑になり、かつ接続部で反応管が破損する
場合があった。これは、毒性が高い原料を用いて成長を
行う場合に特に危険であり、安全面に問題があった。本
発明は、このような従来の問題点を解決して、安全で、
かつ成長を阻害しないでいかなる原料をも使用可能な気
相成長装置を提供することを目的とする。On the other hand, as a method of heating the substrate, there is a method of using an electric furnace installed outside the reaction tube. In the conventional growth apparatus, the raw material is thermally decomposed in the upstream portion of the substrate due to heat radiation of the electric furnace, and at the same time, There is a problem in that the reaction reacts and adheres to the inner wall of the reaction tube to hinder the growth. Further, in the conventional growth apparatus, there is an apparatus in which a pipe and a reaction tube are directly connected, but the shape of the reaction tube becomes complicated and the reaction tube may be damaged at the connecting portion. This is particularly dangerous when growing using a highly toxic raw material, and there is a safety problem. The present invention solves such conventional problems and is safe and
Moreover, it is an object of the present invention to provide a vapor phase growth apparatus that can use any raw material without inhibiting growth.
【0005】[0005]
【課題を解決するための手段】本発明は、以上の目的を
達成するために、基板、またはサセプタ上に支持された
基板を挿脱自在に収納する反応管と、該反応管内に複数
種類の成長原料ガスを供給すべく配置されるガス流量制
御装置と、前記反応管の外周側に配置され前記基板を加
熱する加熱装置とを備えた気相成長装置において、反応
管のガス流量制御装置側に設けられたフランジと前記ガ
ス流量制御装置との間に複数種類のガスをそれぞれ独立
に前記反応管内に流通させる複数本の配管を気密性を保
持して架設すると共に、前記各配管の反応管側のガス出
口に導入管の基端側を気密状態でそれぞれ独立に連結
し、前記導入管の先端側を前記基板側に向かって該基板
の近傍まで伸延して配置してなる気相成長装置を構成す
るものである。In order to achieve the above object, the present invention provides a reaction tube for removably accommodating a substrate or a substrate supported on a susceptor, and a plurality of types of reaction tubes in the reaction tube. In a vapor phase growth apparatus comprising a gas flow rate control device arranged to supply a growth source gas and a heating device arranged on the outer peripheral side of the reaction tube to heat the substrate, the gas flow rate control device side of the reaction tube A plurality of pipes for independently circulating a plurality of kinds of gases in the reaction pipe between the flange provided on the gas flow control device and the gas flow control device are installed while maintaining airtightness, and the reaction pipes of the respective pipes are installed. Phase growth apparatus in which the base end side of the introduction pipe is independently connected to the gas outlet on the side in an airtight state, and the tip end side of the introduction pipe is extended toward the substrate side to the vicinity of the substrate. It is what constitutes.
【0006】[0006]
【作用】本発明の気相成長装置は、それぞれの原料ガス
が配管とフランジ内の流路と導入管とをそれぞれ混合す
ることなく流れる構造になっており、気相反応を起こす
ことなく、原料が基板まで輸送される。また、フランジ
が反応管に接続あるいは固定されており、このフランジ
に配管が接続されている。このため、配管が複数あって
も反応管の形状を複雑にする必要がなく、かつ接続が容
易で反応管を破損する心配はない。The vapor phase growth apparatus of the present invention has a structure in which the respective source gases flow without mixing in the pipe, the flow path in the flange and the introducing pipe, and the raw material gas does not cause a gas phase reaction. Are transported to the substrate. Further, the flange is connected or fixed to the reaction tube, and the pipe is connected to this flange. Therefore, even if there are a plurality of pipes, it is not necessary to complicate the shape of the reaction tube, the connection is easy, and there is no fear of damaging the reaction tube.
【0007】[0007]
【実施例】以下、本発明の一実施例を図面を用いて説明
する。図1は本実施例の気相成長装置の概略構成図であ
る。ガス流量制御装置11には複数の成長原料ガスをそ
れぞれ輸送できる複数の配管12が連結される。配管1
2は反応管13の上流端に接続・固定されたフランジ1
4のガス入口に接続されている。従ってフランジ14内
には複数種類の原料ガスがそれぞれ独立な配管12を通
って輸送される。反応管13内のフランジのガス出口に
は導入管15がそれぞれ接続されている。本実施例で
は、フランジ14のガス出口と導入管15の接続部は、
気密性を確保するために、両者の接続部それぞれにネジ
加工が施されており、ネジ部に薄いテフロンテープを巻
いた導入管をフランジのガス出口のネジ部に締めつけ
る。なお、導入管15はその先端側を基板17側に向か
って伸延して配置される。また反応管の外側の基板近傍
には、基板加熱装置として高周波コイル18が配設され
ている。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic configuration diagram of the vapor phase growth apparatus of this embodiment. The gas flow rate control device 11 is connected to a plurality of pipes 12 that can transport a plurality of growth source gases, respectively. Piping 1
2 is a flange 1 connected and fixed to the upstream end of the reaction tube 13.
4 gas inlets. Therefore, plural kinds of raw material gases are transported into the flange 14 through the independent pipes 12, respectively. The introduction pipes 15 are connected to the gas outlets of the flanges in the reaction pipes 13, respectively. In the present embodiment, the connection between the gas outlet of the flange 14 and the introduction pipe 15 is
In order to ensure airtightness, both connecting parts are threaded, and the introduction pipe with thin Teflon tape wrapped around the screw part is tightened to the screw part of the gas outlet of the flange. The introduction pipe 15 is arranged such that its tip end side extends toward the substrate 17 side. Further, a high-frequency coil 18 is provided as a substrate heating device near the substrate outside the reaction tube.
【0008】次に、前記の気相成長装置を用いた気相成
長の一例を説明する。本気相成長装置を用いて、TMI
nとPH3を用いてInPの成長を試みた。サセプタ1
6に置かれた基板17は、高周波コイル18の誘導加熱
により加熱した。いかなる成長条件においても基板上流
部が汚れることなく、気相反応が生じないことが分かっ
た。またPH3/TMIn原料比が10以下でも良質な
結晶性のInP膜が得られ、本発明の効果が確認でき
た。図2は図1に示した気相成長装置のうち、基板17
の加熱装置が電気炉19による加熱である場合の気相成
長装置の概略構成図である。本気相成長装置を用いて、
GaAsの成長を試みた。原料としては、ジエチルガリ
ウムクロライド((C2H5)2GaCl)とアルシン
(AsH3)を用いた。いかなる成長条件においても、
基板上流部が汚れることなく、まったく成長の阻害は生
じなかった。また、得られた膜も結晶性に優れていた。Next, an example of vapor phase growth using the above vapor phase growth apparatus will be described. Using this vapor phase growth apparatus, TMI
Attempts were made to grow InP using n and PH 3 . Susceptor 1
The substrate 17 placed on No. 6 was heated by induction heating of the high frequency coil 18. It was found that the vapor phase reaction did not occur under any growth condition without the upstream part of the substrate being contaminated. Further, even if the PH 3 / TMIn raw material ratio is 10 or less, a good quality crystalline InP film was obtained, and the effect of the present invention was confirmed. FIG. 2 shows a substrate 17 of the vapor phase growth apparatus shown in FIG.
3 is a schematic configuration diagram of a vapor phase growth apparatus when the heating apparatus of FIG. Using this vapor phase growth apparatus,
We tried to grow GaAs. Diethyl gallium chloride ((C 2 H 5 ) 2 GaCl) and arsine (AsH 3 ) were used as raw materials. Under any growth conditions
The upstream portion of the substrate was not contaminated and no growth inhibition occurred. The obtained film was also excellent in crystallinity.
【0009】前記実施例では、3本の導入管を有する気
相成長装置を用いたが、本発明はこれに限定されないの
は明らかで、いずれの本数でもよい。また、前記実施例
では、配管と導入管の接続手段としてネジ構造を用いた
が、本発明はこれに限定されず、気密性が保たれればい
かなる手段でもよい。上記実施例では、基板の加熱手段
として、高周波コイルによる誘導加熱や電気炉による熱
輻射加熱を用いたが、本発明はこれらに限定されないの
は明らかである。更に、前記実施例では、InPとGa
Asの成長を試み、また上記に示したような原料を用い
たが、本発明はこれらに限定されず、他のIII−V族化
合物半導体、II−VI族化合物半導体や酸化物超伝導体、
あるいはこれらを順次成長することも可能で、いかなる
成長原料を用いてもよい。Although the vapor phase growth apparatus having three introduction tubes is used in the above embodiment, it is obvious that the present invention is not limited to this, and any number of tubes may be used. Further, although the screw structure is used as the connecting means between the pipe and the introducing pipe in the above-mentioned embodiment, the present invention is not limited to this, and any means may be used as long as airtightness is maintained. In the above embodiments, induction heating using a high frequency coil and thermal radiation heating using an electric furnace were used as the heating means for the substrate, but it is clear that the present invention is not limited to these. Further, in the above embodiment, InP and Ga are used.
Although the growth of As was tried and the raw materials as shown above were used, the present invention is not limited to these, and other III-V group compound semiconductors, II-VI group compound semiconductors and oxide superconductors,
Alternatively, it is possible to grow them sequentially, and any growth raw material may be used.
【0010】[0010]
【発明の効果】以上説明したように、本発明によれば、
原料同士の気相反応が生じるような成長原料を使用する
場合においても、気相反応を生じさせないでそれらを基
板まで輸送できる。従って、いかなる原料の組み合わせ
においても成長を阻害することなく、良質な成長層が得
られる。また、反応管が破損しない構造であるため、安
全性が確保される。As described above, according to the present invention,
Even in the case of using a growth raw material that causes a gas phase reaction between raw materials, it is possible to transport them to the substrate without causing a gas phase reaction. Therefore, a good quality growth layer can be obtained without inhibiting growth in any combination of raw materials. In addition, the structure ensures that the reaction tube is not damaged, thus ensuring safety.
【図1】本発明の一実施例の気相成長装置の概略構成図
である。FIG. 1 is a schematic configuration diagram of a vapor phase growth apparatus according to an embodiment of the present invention.
【図2】本発明の別の一実施例の気相成長装置の概要構
成図である。FIG. 2 is a schematic configuration diagram of a vapor phase growth apparatus according to another embodiment of the present invention.
【図3】従来の気相成長装置の一例の概略構成図であ
る。FIG. 3 is a schematic configuration diagram of an example of a conventional vapor phase growth apparatus.
11 ガス流量制御装置 12 配管 13 反応管 14 フランジ 15 導入管 16 サセプタ 17 基板 18 高周波コイル 19 電気炉 21 ガス流量制御装置 22 配管 23 反応管 24 サセプタ 25 基板 26 高周波コイル 11 Gas Flow Control Device 12 Piping 13 Reaction Pipe 14 Flange 15 Inlet Pipe 16 Susceptor 17 Substrate 18 High Frequency Coil 19 Electric Furnace 21 Gas Flow Control Device 22 Piping 23 Reaction Pipe 24 Susceptor 25 Substrate 26 High Frequency Coil
Claims (1)
板を挿脱自在に収納する反応管と、該反応管内に複数種
類の成長原料ガスを供給すべく配置されるガス流量制御
装置と、前記反応管の外周側に配置され前記基板を加熱
する加熱装置とを備えた気相成長装置において、反応管
のガス流量制御装置側に設けられたフランジと前記ガス
流量制御装置との間に複数種類のガスをそれぞれ独立に
前記反応管内に流通させる複数本の配管を気密性を保持
して架設すると共に、前記各配管の反応管側のガス出口
に導入管の基端側を気密状態でそれぞれ独立に連結し、
前記導入管の先端側を前記基板側に向かって該基板の近
傍まで伸延して配置することを特徴とする気相成長装
置。1. A reaction tube for removably accommodating a substrate or a substrate supported on a susceptor, a gas flow rate control device arranged to supply a plurality of kinds of growth raw material gas into the reaction tube, In a vapor phase growth apparatus provided with a heating device arranged on the outer peripheral side of a reaction tube to heat the substrate, a plurality of types are provided between a flange provided on the gas flow control device side of the reaction tube and the gas flow control device. A plurality of pipes that independently circulate the gas in the reaction tube are erected while maintaining airtightness, and the base end side of the introduction pipe is independently airtightly connected to the gas outlet on the reaction tube side of each pipe. Connected to
A vapor phase growth apparatus, wherein the tip end side of the introduction tube is extended toward the substrate side and arranged near the substrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19140092A JPH0613331A (en) | 1992-06-26 | 1992-06-26 | Vapor phase epitaxy apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19140092A JPH0613331A (en) | 1992-06-26 | 1992-06-26 | Vapor phase epitaxy apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0613331A true JPH0613331A (en) | 1994-01-21 |
Family
ID=16273977
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19140092A Pending JPH0613331A (en) | 1992-06-26 | 1992-06-26 | Vapor phase epitaxy apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0613331A (en) |
-
1992
- 1992-06-26 JP JP19140092A patent/JPH0613331A/en active Pending
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