JPH062147Y2 - Gap switch - Google Patents

Gap switch

Info

Publication number
JPH062147Y2
JPH062147Y2 JP18843987U JP18843987U JPH062147Y2 JP H062147 Y2 JPH062147 Y2 JP H062147Y2 JP 18843987 U JP18843987 U JP 18843987U JP 18843987 U JP18843987 U JP 18843987U JP H062147 Y2 JPH062147 Y2 JP H062147Y2
Authority
JP
Japan
Prior art keywords
gap switch
contact electrode
gdb
mixture
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP18843987U
Other languages
Japanese (ja)
Other versions
JPH0193575U (en
Inventor
文男 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Okaya Electric Industry Co Ltd
Original Assignee
Okaya Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Okaya Electric Industry Co Ltd filed Critical Okaya Electric Industry Co Ltd
Priority to JP18843987U priority Critical patent/JPH062147Y2/en
Publication of JPH0193575U publication Critical patent/JPH0193575U/ja
Application granted granted Critical
Publication of JPH062147Y2 publication Critical patent/JPH062147Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【考案の詳細な説明】 [産業上の利用分野] 本考案は、例えば、サージ吸収素子試験装置の高電圧開
閉のために用いられるギャップスイッチに係り、特に、
接点電極の表面に保護層を形成することにより耐アーク
性を向上させたギャップスイッチに関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to a gap switch used for opening and closing a high voltage of, for example, a surge absorber testing apparatus, and
The present invention relates to a gap switch having improved arc resistance by forming a protective layer on the surface of a contact electrode.

[従来の技術] 従来、アレスタやバリスタ或いはこれらを複合化した素
子等のサージ吸収素子の特性を試験する試験装置は、高
圧電源にCL回路を接続すると共に、上記CL回路にギ
ャップスイッチを介装した構造と成されている。即ち、
上記試験装置は、第3図に示す如く、高圧電源HVに充
電用抵抗Rを介してコンデンサCを並列接続すると共
に、これにギャップスイッチ1を介して波頭長調整用抵
抗R及び波頭長調整用コイルLを直列接続し、更に波
尾長調整用抵抗Rを並列接続した構造を有している。
[Prior Art] Conventionally, a test apparatus for testing the characteristics of a surge absorbing element such as an arrester, a varistor, or an element in which these are combined has connected a CL circuit to a high-voltage power supply and provided a gap switch in the CL circuit. The structure is made. That is,
As shown in FIG. 3, the above-mentioned test apparatus has a capacitor C connected in parallel to a high-voltage power supply HV via a charging resistor R 1 and a wavefront length adjusting resistor R 2 and a wavefront length connected thereto via a gap switch 1. It has a structure in which the adjusting coils L are connected in series and the wave tail length adjusting resistor R 3 is connected in parallel.

而して、上記サージ吸収素子の試験に際しては、上記ギ
ャップスイッチ1を操作してコンデンサCに蓄積された
電荷を放出させ、サージ吸収素子Sに高電圧のインパル
スサージを印加する。
When testing the surge absorbing element, the gap switch 1 is operated to release the electric charge accumulated in the capacitor C, and a high voltage impulse surge is applied to the surge absorbing element S.

上記ギャップスイッチは、例えば、略球状に加工した真
鍮に硬質メッキを施した一対の接点電極3a,3bを対
向配置した構造と成されており、同様の材料より成る第
3の接点電極3cを上記一対の接点電極3a,3bに接
触させたり離したりすることによってギャップスイッチ
1の開閉動作を行っている。
The gap switch has, for example, a structure in which a pair of contact electrodes 3a and 3b made of hard plated brass, which is processed into a substantially spherical shape, are arranged to face each other, and a third contact electrode 3c made of a similar material is used as the contact electrode 3c. The opening / closing operation of the gap switch 1 is performed by bringing the pair of contact electrodes 3a and 3b into and out of contact with each other.

[考案が解決しようとする問題点] ところが、上記試験装置が発生するインパルスサージ
は、その電圧値が3〜7[kv]程度と高いため、上記
ギャップスイッチの開閉動作に伴って発生する接点電極
間のアーク放電によって、接点電極の接触部分にスパッ
タして消耗し、甚だしい場合には溶着を生じてギャップ
スイッチの寿命を著しく短いものとしている。
[Problems to be solved by the invention] However, since the voltage value of the impulse surge generated by the test device is as high as about 3 to 7 [kv], the contact electrode generated by the opening / closing operation of the gap switch. Due to the arc discharge between them, the contact portion of the contact electrode is sputtered and consumed, and in extreme cases, welding is caused to shorten the life of the gap switch remarkably.

本考案は、上述の点に鑑み案出されたもので、接点電極
に耐アーク性を付与することにより、寿命特性を向上さ
せたギャップスイッチの実現を目的とする。
The present invention has been devised in view of the above points, and an object thereof is to provide a gap switch having improved life characteristics by imparting arc resistance to a contact electrode.

[問題を解決するための手段] 上述の目的を達成するため、本考案のギャップスイッチ
は、接点電極の表面に、YB、LaB、CeB
GdB、YB、GdBから成る群より選択される
物質の単体又は混合物を少なくとも含む保護層を形成し
たことを特徴とするものである。
[Means for Solving the Problem] In order to achieve the above-mentioned object, the gap switch of the present invention has YB 6 , LaB 6 , CeB 6 , and
It is characterized in that a protective layer containing at least a single substance or a mixture of substances selected from the group consisting of GdB 6 , YB 4 , and GdB 4 is formed.

[作用] 本考案は、アーク放電によるスパッタが少ない導電物質
である希土類元素の六硼化物及び四硼化物であるY
、LaB、CeB、GdB、YB、GdB
から成る群より選択される物質の単体又は混合物を少
なくとも含む保護層を接点電極の表面に形成したので、
ギャップスイッチの開閉動作に伴って発生するアーク放
電による接点電極のスパッタが著しく減少し、接点電極
同士が溶着する恐れがほとんどなくなる。
[Operation] The present invention is a rare earth element hexaboride and tetraboride Y which is a conductive material with less spatter by arc discharge.
B 6, LaB 6, CeB 6 , GdB 6, YB 4, GdB
Since a protective layer containing at least a single substance or a mixture of substances selected from the group consisting of 4 is formed on the surface of the contact electrode,
Sputtering of the contact electrodes due to arc discharge generated by the opening / closing operation of the gap switch is significantly reduced, and there is almost no risk of the contact electrodes being welded to each other.

[実施例] 以下、図面に基づいて本考案の一実施例を説明する。第
1図は、本考案の一実施例に係るギャップスイッチを示
す要部側面図である。図に於いてギャップスイッチ1
は、表面にそれぞれ保護層2a,2bを形成した第1の
接点電極3a及び第2の接点電極3bを基台4a,4b
に取り付けて所定距離はなして対向配置し、更に、同じ
く表面に保護層2cを形成して基台4cに取り付けた第
3の接点電極3cを、上記第1の接点電極3a及び第2
の接点電極3bと対向させて配置した構造を有してい
る。上記第3の接点電極3cは、上記第1の接点電極3
aと第2の接点電極3bの中心を結ぶ線と略直交する方
向に移動自在となされ、第1の接点電極3a及び第2の
接点電極3bと接触させる。(破線)ことによって上記
両接点電極3a,3bを電気的に接続してギャップスイ
ッチ1を閉じる様に構成されている。
[Embodiment] An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a side view of essential parts showing a gap switch according to an embodiment of the present invention. In the figure, gap switch 1
Includes a first contact electrode 3a and a second contact electrode 3b on the surfaces of which protective layers 2a and 2b are respectively formed, and bases 4a and 4b.
The third contact electrode 3c attached to the base 4c and further provided with a protective layer 2c on the surface and facing each other with a predetermined distance between the first contact electrode 3a and the second contact electrode 3a.
The contact electrode 3b is arranged so as to face the contact electrode 3b. The third contact electrode 3c is the first contact electrode 3
The first contact electrode 3a and the second contact electrode 3b are in contact with the first contact electrode 3a and the second contact electrode 3b. By connecting the contact electrodes 3a and 3b to each other (broken line), the gap switch 1 is closed.

上記第1の接点電極3a、第2の接点電極3b及び第3
の接点電極3cは、それぞれ真鍮を略球状に加工した接
点部31a,32b,32cから基台取付け用のネジ部
32a,32b,32cを突出させた形状を有してお
り、その表面に硬質クロムメッキを施すと共に、更に上
記メッキ上に、六硼化ランタン(LaB)をプラズマ
溶射して保護層2a,2b,2cを形成している。尚、
第1図に於いては、上記保護層2a,2b,2cを接点
電極接点部31a,31b,31c全体に形成している
が、第2図に示す如く接点部31a,31b,31cの
前方部分のみに形成しても良く、要は、ギャップスイッ
チの開閉動作時に於いて接点電極3a,3b,3c同士
が接触する部分に形成されていれば足りる。
The first contact electrode 3a, the second contact electrode 3b and the third
The contact electrode 3c has a shape in which the screw parts 32a, 32b, 32c for mounting the base are projected from the contact parts 31a, 32b, 32c, which are made by processing brass into a substantially spherical shape, and the surface thereof is made of hard chrome. In addition to plating, lanthanum hexaboride (LaB 6 ) is plasma sprayed on the plating to form protective layers 2a, 2b, 2c. still,
In FIG. 1, the protective layers 2a, 2b, 2c are formed on the contact electrode contact portions 31a, 31b, 31c as a whole, but as shown in FIG. 2, the front portions of the contact portions 31a, 31b, 31c. It suffices to form only the contact electrodes 3a, 3b, 3c during the opening / closing operation of the gap switch.

上記保護層2a,2b,2cは、アーク放電による消耗
が少ない導電性を有する層として形成する必要があり、
この条件を満たす材料としては、希土類元素の六硼化物
(YB,LaB,CeB,GdB等)若しくは
四硼化物(YB,GdB等)の単体又は混合物が適
しており、中でも上述した六硼化ランタン(LaB
が最適である。また、アーク放電に対する耐消耗性を有
する導電材料としては、モリブデン、タングステン若し
くは表面にアルミナの薄層が形成されたアルミニウムの
単体又は混合物があるが、これらを上記希土類元素の硼
化物に混合して用いても略同等の効果が得られるもので
ある。
The protective layers 2a, 2b, 2c need to be formed as conductive layers that are less consumed by arc discharge.
As a material satisfying this condition, hexaboride (YB 6 , LaB 6 , CeB 6 , GdB 6, etc.) of a rare earth element or tetraboride (YB 4 , GdB 4, etc.) alone or a mixture is suitable, and among them, Lanthanum hexaboride (LaB 6 ) described above
Is the best. Further, as the conductive material having wear resistance against arc discharge, there are molybdenum, tungsten, or a simple substance or a mixture of aluminum having a thin layer of alumina formed on the surface thereof. These are mixed with a boride of the above rare earth element. Even if it is used, substantially the same effect can be obtained.

本考案のギャップスイッチと従来のギャップスイッチと
の寿命特性を比較するため、ギャップスイッチを開閉し
て電圧値7.5[kv]、電圧波形8×20[μs]、
電流値1,000[A]のサージを1[回/分]の条件
で発生させたところ、従来品が平均3万回で溶着したの
に対し、本考案品は約24万回で溶着が発生し、その寿
命が略8倍となった。
In order to compare the life characteristics of the gap switch of the present invention and the conventional gap switch, the gap switch is opened and closed to a voltage value of 7.5 [kv], a voltage waveform of 8 × 20 [μs],
When a surge with a current value of 1,000 [A] was generated under the condition of 1 [times / minute], the conventional product welded at an average of 30,000 times, whereas the product of the present invention welded at about 240,000 times. It occurred and its life was increased by about 8 times.

尚、上記実施例に於いては、ギャップスイッチをサージ
吸収素子用の試験装置に用いた場合について述べたが、
これに限られることはなく、高電圧、高電流を開閉する
必要のある装置のギャップスイッチとして、広く適用可
能である。
In the above embodiment, the case where the gap switch is used in the test device for the surge absorbing element has been described.
The present invention is not limited to this, and can be widely applied as a gap switch of a device that needs to open and close a high voltage and a high current.

[考案の効果] 以上詳述の如く、本考案のギャップスイッチは、接点電
極の表面に、アーク放電によるスパッタが少ない導電物
質である希土類元素の六硼化物及び四硼化物であるYB
、LaB、CeB、GdB、YB、GdB
から成る群より選択される物質の単体又は混合物を少な
くとも含む保護層を形成しているので、開閉操作による
アーク放電が生じても接点電極がほとんどスパッタしな
いため長期に渡って溶着が発生せず、その寿命特性が格
段に向上するものである。
[Effects of the Invention] As described in detail above, the gap switch of the present invention is a rare earth element hexaboride or tetraboride YB which is a conductive material on the surface of a contact electrode and has a small amount of spatter due to arc discharge.
6 , LaB 6 , CeB 6 , GdB 6 , YB 4 , GdB 4
Since a protective layer containing at least a single substance or a mixture of substances selected from the group consisting of is formed, welding does not occur for a long period of time because the contact electrode hardly sputters even when arc discharge occurs due to opening / closing operation, The life characteristics are remarkably improved.

【図面の簡単な説明】 第1図は、本考案の一実施例に係るギャップスイッチの
要部側面図、第2図は、保護層形成領域例を示す接点電
極の側面図であり、第3図は、ギャップスイッチを用い
たサージ吸収素子試験装置の回路図である。 1・・・ギャップスイッチ、2a,2b,2c・・・保
護層、3a,3b,3c・・・接点電極。
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a side view of a main part of a gap switch according to an embodiment of the present invention, FIG. 2 is a side view of a contact electrode showing an example of a protective layer forming region, and FIG. FIG. 1 is a circuit diagram of a surge absorber testing device using a gap switch. 1 ... Gap switch, 2a, 2b, 2c ... Protective layer, 3a, 3b, 3c ... Contact electrode.

Claims (3)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】接点電極の表面に、YB、LaB、C
eB、GdB、YB、GdBから成る群より選
択される物質の単体又は混合物を少なくとも含む保護層
を形成したことを特徴とするギャップスイッチ。
1. YB 6 , LaB 6 , and C on the surface of the contact electrode.
A gap switch comprising a protective layer containing at least a single substance or a mixture of substances selected from the group consisting of eB 6 , GdB 6 , YB 4 , and GdB 4 .
【請求項2】保護層が、YB、LaB、CeB
GdB、YB、GdBから成る群より選択される
物質の単体又は混合物と、モリブデン、タングステン若
しくは表面にアルミナの薄層が形成されたアルミニウム
の単体又は混合物との混合物より成ることを特徴とする
実用新案登録請求の範囲第1項に記載のギャップスイッ
チ。
2. The protective layer comprises YB 6 , LaB 6 , CeB 6 ,
A single substance or a mixture of substances selected from the group consisting of GdB 6 , YB 4 , and GdB 4 , and a mixture of molybdenum, tungsten, or a single substance or mixture of aluminum with a thin layer of alumina formed on the surface thereof. The gap switch according to claim 1 for utility model registration.
【請求項3】保護層が、プラズマ溶射層であることを特
徴とする実用新案登録請求の範囲第1項又は第2項の何
れかに記載のギャップスイッチ。
3. The gap switch according to claim 1 or 2, wherein the protective layer is a plasma sprayed layer.
JP18843987U 1987-12-11 1987-12-11 Gap switch Expired - Lifetime JPH062147Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18843987U JPH062147Y2 (en) 1987-12-11 1987-12-11 Gap switch

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18843987U JPH062147Y2 (en) 1987-12-11 1987-12-11 Gap switch

Publications (2)

Publication Number Publication Date
JPH0193575U JPH0193575U (en) 1989-06-20
JPH062147Y2 true JPH062147Y2 (en) 1994-01-19

Family

ID=31479531

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18843987U Expired - Lifetime JPH062147Y2 (en) 1987-12-11 1987-12-11 Gap switch

Country Status (1)

Country Link
JP (1) JPH062147Y2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009199804A (en) * 2008-02-20 2009-09-03 Hitoshi Kijima Contact and switch
JP2011128130A (en) * 2010-03-12 2011-06-30 Nissin Electric Co Ltd Impulse current generating device

Also Published As

Publication number Publication date
JPH0193575U (en) 1989-06-20

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