JPH06294621A - Optical profile measuring equipment - Google Patents

Optical profile measuring equipment

Info

Publication number
JPH06294621A
JPH06294621A JP5080405A JP8040593A JPH06294621A JP H06294621 A JPH06294621 A JP H06294621A JP 5080405 A JP5080405 A JP 5080405A JP 8040593 A JP8040593 A JP 8040593A JP H06294621 A JPH06294621 A JP H06294621A
Authority
JP
Japan
Prior art keywords
light
measured
intensity distribution
received
irradiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5080405A
Other languages
Japanese (ja)
Inventor
Gakuo Ogawa
岳夫 小川
Shingo Suminoe
伸吾 住江
Yasuhiro Wasa
泰宏 和佐
Akashi Yamaguchi
証 山口
Yuji Kusakabe
裕次 日下部
Kenji Kawamoto
憲二 河本
Yoshiyuki Kawabuchi
義行 川淵
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP5080405A priority Critical patent/JPH06294621A/en
Publication of JPH06294621A publication Critical patent/JPH06294621A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

PURPOSE:To block the influence of disturbance light without sacrifice of mounting/ demounting performance of an object by disposing a shade cover while dividing into the light source side and light receiving side in order to block the disturbance light, condensing the diffused light through a convex lens and passing only the parallel light through an aperture and receiving by means of an image sensor. CONSTITUTION:Light from a light source 1 impinges on a transmission diffuser 2 to produce a diffused light. A cover 3 prevents a disturbance light from impinging on the diffuser 2. The diffused light 4 is condensed through a convex lens 5 and passed through a shade 6 having an aperture 7 thus passing only such component as parallel with the optical axis of the lens 5 through the aperture 5. In other words, only the shade part 12 formed by an object 11 passes through the shade 6 and forms a shade on an image sensor 8. A light shielding chamber 9 shields the light receiving part from disturbance light. An operating section 10 measures the outer diameter D of the object 11 based on a measurement data of peak position when the primary derivative of intensity distribution of light received by the sensor 8 is subjected to curve regression, the center of gravity of the primary derivative, or the zero point when the secondary derivative is subjected to curve regression.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は,光学的形状測定装置に
係り,例えば機械加工物や加工工具等の物体の寸法や形
状を,光学的に測定する装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical shape measuring apparatus, and more particularly to an apparatus for optically measuring the size and shape of an object such as a machined product or a processing tool.

【0002】[0002]

【従来の技術】光学的手法を用いて線材や機械加工物な
どの寸法,形状を測定する装置として一次元イメージセ
ンサを使用する装置が知られている(特告平4−184
5号)。図7はこのような従来の光学的形状測定装置A
0の一例における概略構成を示す模式図,図8は従来の
測定装置A0のある出力例を示すグラフである。図7に
示す如く,LED等の発光源1から発せられた光は棒レ
ンズ13により集光され,拡散光14となり,凸レンズ
5′を通ることによって平行光4となる。平行光4はイ
メージセンサ8上に投影される。凸レンズ5′とイメー
ジセンサ8との間に被測定物11が置かれた場合,被測
定物11によって影12ができるため,イメージセンサ
8の各フォトセル出力のうち暗信号或いは明信号の続く
長さから,被測定物11の外径寸法Dを測定することが
できる。図8に示す横軸がフォトセル位置(フォトセル
の間隔はM),縦軸が出力としたグラフからわかるよう
に,通常フォトセルからの出力は暗信号と明信号とがき
れいに分離するわけではなく,その境界付近で段階的に
変化する。そこで,段階的に変化するフォトセル出力か
ら暗信号あるいは明信号に分割する為,あらかじめ暗信
号と明信号を分ける閾値を設定する。そして,この閾値
を越えたら明信号,越えなければ暗信号とする。この明
信号,暗信号を出力するフォトセルの個数と,フォトセ
ルの並ぶ間隔Mの両者の積から被測定物11の外径寸法
Dが測定されるわけである。
2. Description of the Related Art An apparatus using a one-dimensional image sensor is known as an apparatus for measuring the size and shape of a wire rod or a machined product by using an optical method (Japanese Patent Publication No. 4-184).
No. 5). FIG. 7 shows such a conventional optical shape measuring device A.
0 is a schematic diagram showing a schematic configuration in one example, and FIG. 8 is a graph showing an output example of the conventional measuring apparatus A0. As shown in FIG. 7, the light emitted from the light emitting source 1 such as an LED is condensed by the rod lens 13 and becomes diffused light 14, and becomes parallel light 4 by passing through the convex lens 5 '. The parallel light 4 is projected on the image sensor 8. When the object to be measured 11 is placed between the convex lens 5'and the image sensor 8, a shadow 12 is formed by the object to be measured 11, so that a dark signal or a bright signal of the output of each photocell of the image sensor 8 continues. Therefore, the outer diameter dimension D of the DUT 11 can be measured. As can be seen from the graph in which the horizontal axis shown in FIG. 8 shows the photocell position (photocell spacing is M) and the vertical axis shows the output, the output from the normal photocell does not mean that the dark signal and the bright signal are separated clearly. Instead, it gradually changes near the boundary. Therefore, in order to divide the photocell output that changes stepwise into a dark signal or a bright signal, a threshold for dividing the dark signal and the bright signal is set in advance. Then, if this threshold is exceeded, it is a bright signal, and if it is not, a dark signal. The outer diameter dimension D of the DUT 11 is measured from the product of both the number of photocells outputting the bright signal and the dark signal and the spacing M between the photocells.

【0003】[0003]

【発明が解決しようとする課題】上記したような従来の
光学的形状測定装置A0では,各種の計測を行う際,周
囲の環境によって測定値が変動してしまうことがある。
特に,光を用いた形状測定の場合,周囲からの外乱光が
問題となる。従来装置A0の場合,発光源1や凸レンズ
5′等によって作られた平行光4の他に,測定装置A0
が設置された部屋の照明光や,装置近くに置かれた発光
体からの光(周囲装置からの反射光をも含む)もイメー
ジセンサ8上に照射される可能性がある。平行光4以外
の光(外乱光)は測定に必要な平行光4と重なり合う為
フォトセル出力はその分だけ大きな値となる。フォトセ
ル出力に対して閾値を定め明信号と暗信号を判別する場
合を考えると,フォトセル出力の変動がそのまま測定誤
差に繋がるのは明白である。このような外乱光を考慮し
て閾値を修正する方法や,外乱光による測定値変動分を
後から補正する方法などが考えられるが,外乱光が常に
同じ空間強度分布を示すとは限らない為,有効な解決策
にはならない。又照明部とイメージセンサ8との間を覆
いで囲み,外乱光がイメージセンサ8上に届かないよう
にする方法では,測定装置A0の移動や被測定物11の
取付,取外しの際,覆いの部分がじゃまになりやすいと
いう問題が生じる為実用的ではない。本発明は,このよ
うな従来の技術における課題を解決する為に,光学的形
状測定装置を改良し,外乱光の影響を受けることなく,
また装置の移動や被測定物の取付,取外しを損なうおそ
れのない光学的形状測定装置を提供することを目的とす
るものである。
In the conventional optical profile measuring apparatus A0 as described above, when various measurements are performed, the measured values may fluctuate depending on the surrounding environment.
In particular, in the case of shape measurement using light, ambient light from the surroundings becomes a problem. In the case of the conventional device A0, in addition to the parallel light 4 created by the light source 1 and the convex lens 5 ', the measuring device A0
There is a possibility that the image sensor 8 is also irradiated with the illumination light of the room in which is installed, or the light (including the reflected light from the peripheral device) from the light emitter placed near the device. Light other than the parallel light 4 (disturbance light) overlaps with the parallel light 4 required for measurement, and therefore the photocell output has a correspondingly large value. Considering the case where a threshold value is set for the photocell output and the bright signal and the dark signal are discriminated, it is obvious that the fluctuation of the photocell output directly leads to the measurement error. A method of correcting the threshold value in consideration of such ambient light and a method of correcting the measured value variation due to ambient light afterwards can be considered, but the ambient light does not always show the same spatial intensity distribution. , Not a valid solution. Further, in the method of surrounding the illumination unit and the image sensor 8 with a cover to prevent ambient light from reaching the image sensor 8, when the measuring device A0 is moved or the object 11 to be measured is attached or detached, the cover is not covered. It is not practical because there is a problem that the part easily gets in the way. In order to solve the above-mentioned problems in the conventional technique, the present invention improves the optical shape measuring device and is free from the influence of ambient light.
It is another object of the present invention to provide an optical shape measuring device that does not impair the movement of the device or the attachment or detachment of the object to be measured.

【0004】[0004]

【課題を解決するための手段】上記目的を達成する為
に,光源からの平行照射光を被測定物を経由させて受光
し,上記受光された照射光の上記被測定物によって生じ
た強度分布に基づいて該被測定物の形状測定を行う光学
的形状測定装置において,上記光源からの照射光を,上
記被測定物を経由させた後に集光する集光手段と,上記
集光手段の焦点付近に配設され,上記集光手段により集
光された照射光が通過可能な大きさの開口部を有する絞
り手段と,上記絞り手段の開口部を通過した照射光を受
光する受光手段と,上記受光手段によって受光された照
射光の強度分布に基づいて上記被測定物の形状測定を行
う測定手段とを具備してなることを特徴とする光学的形
状測定装置として構成されている。更に,上記光源の周
囲の外乱光を遮断する第1の遮光手段を設けてなること
を特徴とする光学的形状測定装置である。更に,上記受
光手段の周囲の外乱光を遮断する第2の遮光手段を設け
てなることを特徴とする光学的形状測定装置である。
又,光源からの平行照射光を被測定物を経由させて受光
し,上記受光された照射光の上記被測定物によって生じ
た強度分布に基づいて該被測定物の形状測定を行う光学
的形状測定装置において,上記光源の周囲の外乱光を遮
断する第1の遮断光手段と,上記第1の遮断手段により
外乱光を遮断された上記光源からの照射光を,上記被測
定物を経由させた後に集光する集光手段と,上記集光手
段の焦点付近に配設され,上記集光手段により集光され
た照射光が通過可能な大きさの開口部を有する絞り手段
と,上記絞り手段の開口部を通過した照射光を受光する
受光手段と,上記受光手段の周囲の外乱光を遮断する第
2の遮光手段と,上記第2の遮光手段により外乱光を遮
断された上記受光手段によって受光された照射光の強度
分布に基づいて上記被測定物の形状測定を行う測定手段
とを具備してなることを特徴とする光学的形状測定装置
である。更に,上記測定手段が,上記受光手段により受
光された照射光の強度分布の一次微分を曲線回帰した時
のピーク位置からなる測定データに基づいて上記被測定
物の形状測定を行うことを特徴とする光学的形状測定装
置である。更に,上記測定手段が,上記受光手段により
受光された照射光の強度分布の一次微分の重心位置から
なる測定データに基づいて上記被測定物の形状測定を行
うことを特徴とする光学的形状測定装置である。更に,
上記測定手段が,上記受光手段により受光された照射光
の強度分布の二次微分を曲線回帰した時のゼロ点位置か
らなる測定データに基づいて上記被測定物の形状測定を
行うことを特徴とする光学的形状測定装置である。更
に,上記測定手段が,予め設定された校正曲線を用いて
上記測定データを校正する光学的形状測定装置である。
In order to achieve the above object, parallel irradiation light from a light source is received via an object to be measured, and the intensity distribution of the received irradiation light generated by the object to be measured is received. In the optical shape measuring device for measuring the shape of the object to be measured based on the above, a focusing means for focusing the irradiation light from the light source after passing through the object to be measured, and a focus of the focusing means. Diaphragm means arranged in the vicinity and having an opening having a size through which the irradiation light condensed by the condensing means can pass; and light receiving means for receiving the irradiation light passing through the opening of the diaphragm means, The optical shape measuring apparatus comprises: a measuring unit that measures the shape of the object to be measured based on the intensity distribution of the irradiation light received by the light receiving unit. Further, the optical shape measuring device is characterized by further comprising a first light shielding means for shielding ambient light around the light source. Further, the optical shape measuring device is characterized in that a second light shielding means for shielding ambient light around the light receiving means is provided.
Further, an optical shape for receiving parallel irradiation light from a light source through an object to be measured and measuring the shape of the object to be measured based on the intensity distribution of the received irradiation light generated by the object to be measured. In the measuring device, a first blocking light unit that blocks ambient light around the light source, and an irradiation light from the light source that is blocked by the first blocking unit, is passed through the object to be measured. Light collecting means for collecting light after the light collecting means, a diaphragm means arranged near the focal point of the light collecting means and having an opening having a size through which the irradiation light collected by the light collecting means can pass, and the diaphragm. Light receiving means for receiving the irradiation light having passed through the opening of the means, second light blocking means for blocking the ambient light around the light receiving means, and the light receiving means for blocking the ambient light by the second light blocking means. Based on the intensity distribution of the illuminating light received by It is an optical shape measuring apparatus characterized by comprising comprises a measuring means for measuring the shape of the object to be measured. Further, the measuring means measures the shape of the object to be measured based on measurement data composed of peak positions when the first derivative of the intensity distribution of the irradiation light received by the light receiving means is subjected to curve regression. It is an optical shape measuring device that does. Further, the measuring means measures the shape of the object to be measured based on the measurement data consisting of the barycentric position of the first derivative of the intensity distribution of the irradiation light received by the light receiving means. It is a device. Furthermore,
The measuring means measures the shape of the object to be measured based on the measurement data consisting of the zero point position when the second derivative of the intensity distribution of the irradiation light received by the light receiving means is subjected to a curve regression. It is an optical shape measuring device that does. Furthermore, the measuring means is an optical shape measuring device that calibrates the measurement data using a preset calibration curve.

【0005】[0005]

【作用】本発明によれば,光源からの平行照射光を被測
定物を経由させて受光し,上記受光された照射光の上記
被測定物によって生じた強度分布に基づいて該被測定物
の形状測定を行う際に,上記光源の周囲の外乱光が第1
の遮光手段により遮断される。上記第1の遮光手段によ
り外乱光を遮断された上記光源からの照射光が,上記被
測定物を経由した後に集光手段により集光される。上記
集光手段の焦点付近に,上記集光手段により集光された
照射光が通過可能な大きさの開口部を有する絞り手段が
配設される。上記絞り手段の開口部を通過した照射光が
受光手段により受光される。上記受光手段の周囲の外乱
光が第2の遮光手段により遮断される。上記第2の遮光
手段により外乱光を遮断された上記受光手段によって受
光された照射光の強度分布に基づいて上記被測定物の形
状測定が測定手段により行われる。このようにして,光
源からの平行光成分のみが受光手段に照射される。その
為,外乱光による測定精度への影響がなくなる。又,光
源及び受光手段廻りのみを遮蔽するため,装置の移動や
被測定物の取付,取外しを阻害する恐れもない。更に,
上記測定手段が,上記受光手段により受光された照射光
の強度分布の一次微分を曲線回帰した時のピーク位置か
らなる測定データに基づいて上記被測定物の形状測定を
行う。更に,上記測定手段が,上記受光手段により受光
された照射光の強度分布の一次微分の重心位置からなる
測定データに基づいて,上記被測定物の形状測定を行
う。更に,上記測定手段が,上記受光手段により受光さ
れた照射光の強度分布の二次微分を曲線回帰した時のゼ
ロ点位置からの測定データに基づいて,上記被測定物の
形状測定を行う。更に,上記測定手段が,予め測定され
た校正曲線を用いて上記測定データを校正する。このよ
うに測定データの算出にあたり,一次微分或いは二次微
分演算を施した場合,従来の閾値を用いている場合に比
べ,発光源や除去しきれなかった外乱光(そのほとんど
は測定装置や受光手段での反射した散乱光と思われる)
による光量むらの影響を受けにくくなる。特に外乱光が
受光手段の視野内で一様な強度分布を示す場合にはその
影響を完全に除去できる。又,上記測定データを校正す
ることによって幾何学的誤差をも除去することができ
る。その結果,外乱光の影響を受ける恐れがなく,又装
置の移動や被測定物の取付,取外しの容易な光学的形状
測定装置を得ることができる。
According to the present invention, the parallel irradiation light from the light source is received via the object to be measured, and the object to be measured is based on the intensity distribution of the received irradiation light generated by the object to be measured. When performing shape measurement, the ambient light around the light source is
The light is blocked by the light shielding means. Irradiation light from the light source, which is shielded from ambient light by the first light shielding means, is condensed by the condensing means after passing through the object to be measured. A diaphragm means having an opening having a size through which the irradiation light condensed by the condensing means can pass is disposed near the focus of the condensing means. The irradiation light that has passed through the opening of the diaphragm means is received by the light receiving means. The ambient light around the light receiving means is blocked by the second light blocking means. The shape of the object to be measured is measured by the measuring means on the basis of the intensity distribution of the irradiation light received by the light receiving means, the disturbance light being blocked by the second light shielding means. In this way, only the parallel light component from the light source is applied to the light receiving means. Therefore, the influence of ambient light on the measurement accuracy is eliminated. Further, since only the light source and the area around the light receiving means are shielded, there is no fear of obstructing the movement of the device or the attachment or detachment of the measured object. Furthermore,
The measuring means measures the shape of the object to be measured based on the measurement data composed of peak positions when the first derivative of the intensity distribution of the irradiation light received by the light receiving means is subjected to curve regression. Further, the measuring means measures the shape of the object to be measured based on the measurement data composed of the barycentric position of the first derivative of the intensity distribution of the irradiation light received by the light receiving means. Further, the measuring means measures the shape of the object to be measured based on the measurement data from the zero point position when the second derivative of the intensity distribution of the irradiation light received by the light receiving means is subjected to the curve regression. Further, the measuring means calibrates the measurement data using a calibration curve measured in advance. In this way, when the first derivative or second derivative is applied to the calculation of the measurement data, compared to the case where the conventional threshold value is used, the emission source and the disturbance light that cannot be removed (most of them are the measurement device and the received light). Probably scattered light reflected by means)
It is less likely to be affected by uneven light amount. In particular, when the ambient light has a uniform intensity distribution within the visual field of the light receiving means, the influence can be completely eliminated. Further, by calibrating the above measurement data, it is possible to remove geometrical errors. As a result, it is possible to obtain an optical shape measuring device which is not affected by the ambient light and which is easy to move and attach and detach the object to be measured.

【0006】[0006]

【実施例】以下添付図面を参照して,本発明を具体化し
た実施例につき説明し,本発明の理解に供する。尚,以
下の実施例は,本発明を具体化した一例であって,本発
明の技術的範囲を限定する性格のものではない。ここ
に,図1は本発明の一実施例に係る光学的形状測定装置
A1の概略構成を示す模式図。図2は測定装置A1のあ
る出力例を示すグラフ(a)〜(c),図3は測定装置
A1の他の出力例を示すグラフ(a),(b),図4は
測定装置A1の受光状態を示す説明図(a)〜(c),
図5は本発明の他の実施例に係る光学的形状測定装置A
2の概略構成を示す模式図,図6は本発明の他の実施例
に係る光学的形状測定装置A3の概略構成を示す模式図
である。尚,前記図7に示した従来の光学的形状測定装
置A0の一例における概略構成を示す模式図と共通する
要素には同一符号を付した。図1に示す如く,本実施例
に係る光学的形状測定装置A1は,発光源1(光源に相
当)から照射された平行な光を,被測定物11を経由さ
せて受光し,この受光された光の被測定物11によって
生じた強度分布に基づいて被測定物11の形状寸法を測
定する点で従来例と同様である。しかし本実施例では,
発光源1の周囲の外乱光を遮断するカバー3(第1の遮
光手段に相当)と,このカバー3により外乱光を遮断さ
れた発光源1からの光を被測定物11を経由させた後に
集光する凸レンズ5(集光手段に相当)と,凸レンズ5
の焦点付近に配設されて凸レンズ5により集光された光
が通過可能な大きさの開口部7を有する遮蔽板6(絞り
手段に相当)と,この遮蔽板6の開口部7を通過した光
を受光する一次元受光素子アレー(イメージセンサ)8
(受光手段に相当)と,イメージセンサ8の周囲の外乱
光を遮断する遮光容器9と,遮光容器9により外乱光を
遮断されたイメージセンサ8によって受光された光の強
度分布に基づいて被測定物11の外径寸法Dの測定を行
う演算部10(測定手段に相当)とから構成されている
点で従来例と異なる。又演算部10が,イメージセンサ
8により受光された光の強度分布の一次微分を曲線回帰
した時のピーク位置又はイメージセンサ8により受光さ
れた強度分布の一次微分の重心位置又はイメージセンサ
8により受光された光の強度分布の二次微分を曲線回帰
した時のゼロ点位置からなる測定データに基づいて被測
定物11の外径寸法Dを測定し,予め測定された校正曲
線を用いて測定データを校正する点でも従来例と異な
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments embodying the present invention will be described below with reference to the accompanying drawings for the understanding of the present invention. The following embodiments are examples of embodying the present invention and are not intended to limit the technical scope of the present invention. FIG. 1 is a schematic diagram showing a schematic configuration of an optical shape measuring device A1 according to an embodiment of the present invention. 2 is a graph (a) to (c) showing an output example of the measuring apparatus A1, FIG. 3 is a graph (a), (b) showing another output example of the measuring apparatus A1, and FIG. Explanatory diagrams (a) to (c) showing a light receiving state,
FIG. 5 shows an optical shape measuring apparatus A according to another embodiment of the present invention.
2 is a schematic diagram showing a schematic configuration of FIG. 2, and FIG. 6 is a schematic diagram showing a schematic configuration of an optical shape measuring apparatus A3 according to another embodiment of the present invention. Elements common to those in the schematic view of the conventional optical shape measuring apparatus A0 shown in FIG. 7 are designated by the same reference numerals. As shown in FIG. 1, the optical shape measuring apparatus A1 according to the present embodiment receives parallel light emitted from a light emitting source 1 (corresponding to a light source) via an object to be measured 11 and receives the received light. This is the same as the conventional example in that the shape and dimension of the object to be measured 11 are measured based on the intensity distribution of the light to be measured 11 generated. However, in this embodiment,
A cover 3 (corresponding to a first light-shielding unit) that blocks ambient light around the light source 1 and light from the light source 1 whose ambient light is blocked by the cover 3 is passed through the DUT 11. Convex lens 5 for focusing light (corresponding to light collecting means) and convex lens 5
Of the shielding plate 6 (corresponding to the diaphragm means) having an opening 7 of a size that allows the light condensed by the convex lens 5 to pass therethrough, and has passed through the opening 7 of the shielding plate 6. One-dimensional light receiving element array (image sensor) 8 for receiving light
(Corresponding to light receiving means), a light-shielding container 9 that shields ambient light around the image sensor 8, and an intensity distribution of light received by the image sensor 8 that has been shielded from ambient light by the light-shielding container 9 to be measured. This is different from the conventional example in that it is configured with an arithmetic unit 10 (corresponding to a measuring means) that measures the outer diameter dimension D of the object 11. Further, the calculation unit 10 performs a curve regression of the first derivative of the intensity distribution of the light received by the image sensor 8 or the barycentric position of the first derivative of the intensity distribution received by the image sensor 8 or the image sensor 8 receives the light. The outer diameter dimension D of the object to be measured 11 is measured based on the measurement data composed of the zero point position when the second derivative of the intensity distribution of the light is subjected to the curve regression, and the measurement data is obtained by using the calibration curve measured in advance. The point that calibrates is also different from the conventional example.

【0007】以下,この装置A1の動作についてより詳
しく説明する。発光源1からの光は,透過拡散板2を照
明し,空間的に広がりを持った拡散光となる。カバー3
は発光源1以外の光源からの光が,透過拡散板2の背後
から照射されるのを防ぐためにある。透過拡散板2から
の拡散光は凸レンズ5によって集光される。凸レンズ5
の直径に比べ充分小さな開口部7を持った遮蔽板6が,
凸レンズ5の焦点位置と開口部7とが略一致するように
配置されている為,透過拡散板2からの拡散光の内,凸
レンズ5の光軸に対して平行な成分4のみが,遮蔽板6
の開口部7を通過できる。遮蔽板6の開口部7を通過し
た光は,イメージセンサ8の上に照射され,イメージセ
ンサ8で得られた光強度信号が演算部10に入力され
る。遮光容器9は凸レンズ5,遮蔽板6,イメージセン
サ8を覆い,凸レンズ5の部分のみが開口となってい
る。尚,光源としては平行光成分を照射できる構成なら
なんでもよく,従来例のように発光源と凸レンズとを利
用して積極的に平行光を作り出してもよい。透過拡散板
2と凸レンズ5との間に被測定物11が設置された場
合,被測定物11によって影が形づくられるが,平行光
成分4に対する影の成分12だけが遮蔽板6を通過し,
イメージセンサ8上に影を作る。この場合,被測定物1
1の外径寸法Dとイメージセンサ8上の影像の大きさd
との間には,次の関係式が成立する。 d=D*g/f …(1) ここで,fは凸レンズ5の焦点距離,gは遮蔽板6とイ
メージセンサ8との距離を示す。装置A1の周辺に別の
光源があった場合,この別光源からの光の大部分は遮光
容器9によって遮断され,イメージセンサ8上への外乱
光として直接到達することはない。又,凸レンズ5を通
過できる光も大部分が遮蔽板6によって遮断されてしま
う。遮蔽板6によって遮断されず,イメージセンサ8上
に届く光は凸レンズ5の光軸に対して平行な成分4だけ
であるが,そのような成分4を生じ得るような別光源の
配置はほとんどない。あるとすれば例えば,別光源から
の光がイメージセンサ8側から透過拡散板2に向かって
照射され,透過拡散板2の表面で平行光成分4と同じ方
向に反射された場合である。この場合でも透過拡散板2
の透過率を大きくすることによりそのような反射量が少
くなり,更に拡散特性が無方向性に近ければ平行成分4
が残る割合は極めて小さいと考えてよい。以上のよう
に,本実施例では,受光側に工夫をすることにより,投
光側で平行光を作り出す従来例で問題となったような周
囲の外乱光の影響を軽減することができる。しかも,平
行光利用の測定手法の利点である明暗境界領域値に関す
る被測定物11とイメージセンサ8との距離への非依存
性は残したままである。更に,外乱光に対する遮光手段
が,光源側と受光側とで独立しており,被測定物11の
取付の際や測定の際にじゃまになるおそれがない。
The operation of the device A1 will be described in more detail below. The light from the light emission source 1 illuminates the transmission diffusion plate 2 and becomes diffused light having a spatial spread. Cover 3
Is for preventing light from a light source other than the light emitting source 1 from being irradiated from behind the transmissive diffusion plate 2. The diffused light from the transmissive diffusion plate 2 is condensed by the convex lens 5. Convex lens 5
The shield plate 6 with an opening 7 that is sufficiently smaller than the diameter of
Since the focal position of the convex lens 5 and the opening 7 are arranged so as to substantially coincide with each other, only the component 4 parallel to the optical axis of the convex lens 5 in the diffused light from the transmission diffusion plate 2 is shielded. 6
Through the opening 7. The light that has passed through the opening 7 of the shielding plate 6 is applied to the image sensor 8, and the light intensity signal obtained by the image sensor 8 is input to the calculation unit 10. The light shielding container 9 covers the convex lens 5, the shielding plate 6 and the image sensor 8, and only the convex lens 5 is an opening. The light source may have any structure as long as it can emit a parallel light component, and as in the conventional example, a light emitting source and a convex lens may be used to positively generate parallel light. When the DUT 11 is installed between the transmissive diffusion plate 2 and the convex lens 5, a shadow is formed by the DUT 11, but only the shadow component 12 for the parallel light component 4 passes through the shield plate 6,
A shadow is created on the image sensor 8. In this case, the DUT 1
The outer diameter D of 1 and the size d of the image on the image sensor 8
The following relational expression holds between and. d = D * g / f (1) Here, f represents the focal length of the convex lens 5, and g represents the distance between the shielding plate 6 and the image sensor 8. When there is another light source around the device A1, most of the light from this other light source is blocked by the light shielding container 9 and does not directly reach the image sensor 8 as ambient light. Most of the light that can pass through the convex lens 5 is also blocked by the shield plate 6. The light reaching the image sensor 8 without being blocked by the shielding plate 6 is only the component 4 parallel to the optical axis of the convex lens 5, but there is almost no arrangement of another light source that can cause such a component 4. . For example, there is a case where light from another light source is emitted from the image sensor 8 side toward the transmissive diffusion plate 2 and reflected in the same direction as the parallel light component 4 on the surface of the transmissive diffusion plate 2. Even in this case, the transmission diffusion plate 2
By increasing the transmissivity, the amount of such reflection decreases, and if the diffusion characteristics are close to non-directional, the parallel component 4
Can be considered to be extremely small. As described above, in the present embodiment, by devising the light receiving side, it is possible to reduce the influence of the ambient disturbance light, which has been a problem in the conventional example that produces parallel light on the light emitting side. Moreover, the independence of the light-dark boundary region value on the distance between the DUT 11 and the image sensor 8, which is an advantage of the measuring method using parallel light, remains. Further, the light-shielding means for the ambient light is independent on the light source side and the light receiving side, and there is no risk of obstruction during attachment or measurement of the DUT 11.

【0008】次に,本実施例では,外乱光による測定誤
差を低減した上で,明暗境界領域幅変動の影響除去と測
定分解能向上の為の工夫も加え,形状測定全体としての
測定精度向上を実現するものである。その為の演算機能
について以下説明する。イメージセンサ8からの出力信
号について表したグラフを図2(a)に示す。図中,横
軸がイメージセンサ8を構成するフォトセルの並び間隔
M毎のフォトセル位置,縦軸が各フォトセル位置からの
信号である。これは光強度分布f(x)を間隔Mで離散
化したものと考えられ,光強度分布f(x)の一次微分
を得ることによって,近似的に隣合う信号の差分で置き
換えることができる。フォトセルのi番目の信号とi+
1番目の信号との差を計算すると図2(b)に示すよう
になる。微分の近似としては,i−1番目とi番目との
差分,i−1番目とi+1番目との差分であってもよ
い。光強度が変化しない領域では,この演算結果が0で
あるが,暗から明あるいは明から暗の境界域で単峰の山
ないし谷となる。図2(b)のグラフに対して正規曲線
関数, y=A*exp〔−(x−x0 2 /σ2 〕 …(2) による曲線近似を行い(Aは係数,σ2 は分散を示
す),得られた近似関数のピーク位置x0 を求めたもの
が図2(c)である。図では谷の底をx1 ,山のピーク
をx2 で表した。ピーク位置は正規曲線関数による近似
計算によってフォトセル間隔Mより小さい精度で計算さ
れる為,測定の分解能はフォトセル間隔Mより向上す
る。このピーク位置を概測定位置(測定データに相当)
とする。被測定物11の外径寸法Dを求めるには(1)
式を参考にすると次式で近似計算される。 D=(x2 −x1 )*f/g …(3)
Next, in the present embodiment, the measurement error due to the ambient light is reduced, and measures for removing the influence of the fluctuation of the light-dark boundary region width and improving the measurement resolution are added to improve the measurement accuracy of the entire shape measurement. It will be realized. The calculation function therefor will be described below. A graph showing the output signal from the image sensor 8 is shown in FIG. In the figure, the horizontal axis is the photocell position for each arrangement interval M of the photocells forming the image sensor 8, and the vertical axis is the signal from each photocell position. This is considered to be obtained by discretizing the light intensity distribution f (x) at intervals M, and by obtaining the first derivative of the light intensity distribution f (x), it can be replaced by the difference between the adjacent signals. I-th signal of photocell and i +
When the difference from the first signal is calculated, it becomes as shown in FIG. As the approximation of the differential, the difference between the i−1th and the ith and the difference between the i−1th and the i + 1th may be used. In the region where the light intensity does not change, the result of this calculation is 0, but it becomes a single peak or valley in the boundary region from dark to bright or from light to dark. Normal curve function for the graph of FIG. 2 (b), y = A * exp [- (x-x 0) 2 / σ 2 ] ... (2) by perform curve approximation (A is a coefficient, sigma 2 is dispersed FIG. 2C shows the peak position x 0 of the obtained approximate function. In the figure, the bottom of the valley is represented by x 1 , and the peak of the mountain is represented by x 2 . Since the peak position is calculated with an accuracy smaller than the photocell distance M by the approximate calculation using the normal curve function, the resolution of measurement is higher than the photocell distance M. This peak position is the approximate measurement position (corresponding to the measurement data)
And To obtain the outer diameter dimension D of the DUT 11 (1)
Approximate calculation is performed using the following equation with reference to the equation. D = (x 2 -x 1) * f / g ... (3)

【0009】しかし,この近似計算で求められる概測定
位置x1 ,x2 と,(3)式からの真の外形寸法Dを与
える測定位置とが一致するとは限らない。主な理由とし
ては光源の空間光強度分布が厳密に一様ではなく,その
一次微分結果が明暗境界領域で左右対象ではない明信号
或いは暗信号よりに歪んだ形状をしていることがあげら
れる。又,明暗境界領域がある程度の幅を有する理由と
して,遮蔽板6の開口部7における回析やイメージセン
サ8上でのフォトセルによる結像が完全ではないことが
あげられるが,これらは遮蔽板6の開口部7の形状(円
形なのか,楕円なのか,方形なのか等)により一次微分
に微妙にきいてくる。更に,凸レンズ5の光軸とイメー
ジセンサ8との面が垂直からズレていたり,イメージセ
ンサ8のフォトセル間隔Mにばらつきがあったりした場
合,これらの影響も補正(校正)する必要も生じる(図
4(a)〜(c)を参照)。正規曲線近似によって得ら
れる概測定位置ではイメージセンサ8のフォトセル間隔
Mの1/10程度の精度を持たせることができるが,こ
れは例えばイメージセンサ8に画素ピッチ5μmのCC
Dセンサを用いた場合,0.5μmの精度に相当し,こ
れだけの形状測定の精度を得ようとすると,先に述べた
影響を無視することができない。これらの影響を補正す
るためにブロックゲージやインゲージ等の標準器を用い
て測定視野中の何箇所かで標準器の空間位置zと近似曲
線のピーク位置x1 ,x2 との関係を測定し,補正関数
(校正曲線に相当)h1 (x),h2 (x)を求めてお
く。ここで,補正関数h1 (x),h2 (x)はピーク
位置x1 ,x2 から空間位置zを求める関数であり,補
正関数h1 (x1 )とh2 (x2 )との差は標準器寸法
に一致する。この場合,近似計算のピーク位置から標準
器より決まる値を算出することになるが,補正関数h1
(x),h2 (x)は(3)式のf/gの項まで含んだ
補正関数となっている。外径寸法Dを求めるには,次式
を計算すればよい。 D=h2 (x2 )−h1 (x1 ) …(4)
However, the approximate measurement positions x 1 and x 2 obtained by this approximate calculation and the measurement position giving the true external dimension D from the equation (3) do not always coincide. The main reason is that the spatial light intensity distribution of the light source is not strictly uniform, and the result of the first derivative has a shape that is distorted from the bright or dark signals that are not symmetrical in the light-dark boundary region. . Further, the reason why the light-dark boundary region has a certain width is that the diffraction at the opening 7 of the shield plate 6 and the image formation by the photocell on the image sensor 8 are not perfect. Depending on the shape of the opening 7 of 6 (whether it is circular, elliptical, rectangular, etc.), the first derivative is subtly influenced. Further, if the surface between the optical axis of the convex lens 5 and the image sensor 8 deviates from the vertical, or if the photocell interval M of the image sensor 8 varies, it is necessary to correct (calibrate) these influences as well (calibration). 4 (a) to (c)). At the approximate measurement position obtained by the normal curve approximation, an accuracy of about 1/10 of the photocell interval M of the image sensor 8 can be provided. This is, for example, when the image sensor 8 has a CC with a pixel pitch of 5 μm.
When the D sensor is used, it corresponds to an accuracy of 0.5 μm, and if it is attempted to obtain such accuracy of shape measurement, the influence described above cannot be ignored. In order to correct these effects, measure the relationship between the spatial position z of the standard and the peak positions x 1 and x 2 of the approximate curve using a standard device such as a block gauge or in-gauge at several points in the measurement field of view. , Correction functions (corresponding to the calibration curve) h 1 (x) and h 2 (x) are obtained. Here, the correction functions h 1 (x) and h 2 (x) are functions for obtaining the spatial position z from the peak positions x 1 and x 2 , and the correction functions h 1 (x 1 ) and h 2 (x 2 ) The difference of is in agreement with the standard size. In this case, the value determined by the standard device is calculated from the peak position of the approximation calculation, but the correction function h 1
(X) and h 2 (x) are correction functions that include the f / g term in the equation (3). To obtain the outer diameter dimension D, the following equation may be calculated. D = h 2 (x 2) -h 1 (x 1) ... (4)

【0010】このように,イメージセンサ8の出力に回
帰曲線近似を施し,概測定位置を求め,更に概測定位置
に含まれるズレ量を標準器を用いて決定した補正関数に
よって補正することにより,フォトセル間隔Mよりも高
い分解能を得ることができる。尚,上記実施例で用いた
回帰曲線関数は,正規曲線関数に限ったものでなく,放
物線関数y=A(x−x0 2 ,双曲線関数y=A/
〔e-(x-x0) +e+(x-x0 ) 〕等単峰の関数ならどれでも
よい。又,明境界領域の生ずる原因である結像の不完全
さは,被測定物11と凸レンズ5とイメージセンサ8と
の距離によって決まるが,それは図4(a)〜(c)に
示すように光軸についてほぼ対象である。明暗境界領域
の幅は被測定対象と集光素子との距離に応じて変化する
が,それは明暗境界を中心にして拡大,縮小するだけで
ある。その為,近似曲線のピーク位置は変わらず,予め
求めておく補正関数も1種類だけでよい。次に,他の演
算例について説明する。この例では明暗境界部に生ずる
微分結果の凸部分の重心を計算することにより,概測定
位置を求めるものである。概測定位置を求める為,回帰
曲線近似を用いている。この場合もイメージセンサ8に
より得られた光強度分布を一次微分する演算までは,上
記例と同様である。しかし,図2(b)の微分結果に対
して,予め定めた閾値,例えば山部ピーク高さの20%
を越える山部或いは谷部を切り出す。この切出された領
域について重心を計算する。重心計算には図2(b)の
ような短冊列を想定し,その重心を中心とする。演算に
よって得られる重心はフォトセル間隔Mより高い分解能
を示す為,形状測定の精度向上の効果を奏する。重心を
概測定位置とする場合,上記例と同様,(3)式を基に
被測定物11の形状を算出すると一定のズレを示す可能
性がある。この場合,上記例と同様に,標準器と比較す
ることによって補正関数を求めておくこととし,最終測
定精度を向上させることができる。
In this way, the output of the image sensor 8 is approximated to a regression curve to obtain a rough measurement position, and the deviation amount contained in the rough measurement position is corrected by a correction function determined using a standard device. A resolution higher than the photocell interval M can be obtained. The regression curve function used in the above embodiment is not limited to the normal curve function, but a parabolic function y = A (x−x 0 ) 2 and a hyperbolic function y = A /
[ E- (x-x0) + e + (x-x0 ) ] Any single-peak function may be used. Further, the incompleteness of image formation, which is a cause of the bright boundary region, is determined by the distance between the DUT 11, the convex lens 5, and the image sensor 8, which is as shown in FIGS. 4 (a) to 4 (c). It is almost symmetrical about the optical axis. The width of the light-dark boundary area changes depending on the distance between the object to be measured and the light-collecting element, but it only expands or contracts around the light-dark boundary. Therefore, the peak position of the approximate curve does not change, and only one type of correction function needs to be obtained in advance. Next, another calculation example will be described. In this example, the approximate measurement position is obtained by calculating the center of gravity of the convex portion of the differential result generated at the light-dark boundary. Regression curve approximation is used to obtain the approximate measurement position. In this case as well, the calculation up to the first-order differentiation of the light intensity distribution obtained by the image sensor 8 is the same as in the above example. However, with respect to the differentiation result of FIG. 2B, a predetermined threshold value, for example, 20% of the peak height
Cut out a mountain part or a valley part that exceeds. The center of gravity is calculated for this clipped area. The center of gravity is assumed to be the center of gravity for the calculation of the center of gravity. The center of gravity obtained by the calculation has a resolution higher than that of the photocell interval M, so that the accuracy of shape measurement is improved. When the center of gravity is set as the approximate measurement position, a constant deviation may occur when the shape of the DUT 11 is calculated based on the equation (3), as in the above example. In this case, similarly to the above example, the correction function is obtained by comparing with the standard device, and the final measurement accuracy can be improved.

【0011】更に,他の演算例について説明する。この
例では光強度分布を二次微分することにより得られる明
暗境界部の山谷のゼロクロス点を概測定位置とするもの
である。イメージセンサ8から得られる信号が,光強度
分布をフォトセル間隔Mで離散化したものであるから二
次微分を得るには例えば次のようにすればよい。i−1
番目,i番目,i+1番目のフォトセルの出力値をそれ
ぞれsi-1 ,si ,si+1 とすれば,i番目のフォトセ
ル位置での二次微分結果はsi-1 ,si+1 で求めること
ができる。図3(a)の光強度分布を二次微分すると
(b)のようになる。このような二次微分のゼロクロス
付近を単調関数,例えば直線によって回帰近似し,ゼロ
クロス点を推定した結果が,x1 ,x2 であり,これを
概測定位置をする。上記二つの例と同様に,概測定位置
を明暗境界付近の複数点の情報を基に,連続関数を用い
て回帰推定している為,フォトセル間隔Mにより高い分
解能を実現することができる。引き続いて,本発明の他
の実施例装置A2,A3について述べる。図5は,集光
手段を球面鏡などの反射鏡15とした例A2である。集
光手段はこの他レンズのような透過型素子でもよい。遮
光容器9は,反射鏡15により反射した光だけが遮光板
6の開口部7を通過できるように透過拡散板2の側だけ
が開口部となっている。又,図6は受光手段を二次元イ
メージセンサ16で構成した例A3である。この場合
は,照射光を平行シート光にする従来例と違い,測定方
向が上下左右の区別がない。従って,二次元イメージセ
ンサ16を用いることにより被測定物11の二次元形状
を測定することができる。又この場合,特性関数は縦方
向測定用と横方向測定用の二種類を必要とする。その他
一次元イメージセンサ8を縦や横に複数並べた場合も,
同様であり,更に1つの一次元イメージセンサ8を上下
に移動して等価的に二次元イメージセンサを構成した場
合でもよい。このように本発明は,測定装置A1,A
2,A3に示すように色々な形のものとすることができ
る。以上のように本発明によれば,外乱光の影響を受け
ることなく,又装置の移動や被測定物の取付,取外しが
容易な光学的形状測定装置が得られる。
Further, another calculation example will be described. In this example, the zero-cross points of the peaks and valleys of the light-dark boundary obtained by second-order differentiation of the light intensity distribution are used as the approximate measurement position. Since the signal obtained from the image sensor 8 is obtained by discretizing the light intensity distribution at the photocell interval M, the second derivative can be obtained, for example, as follows. i-1
If the output values of the i- th, i-th, and i + 1-th photocells are s i-1 , s i , and s i + 1 , respectively, the second-order differential results at the i-th photocell position are s i-1 , s It can be calculated by i + 1 . When the light intensity distribution of FIG. 3A is second-order differentiated, it becomes as shown in FIG. The results of estimating the zero-cross points by linearly approximating the vicinity of the zero-cross of the second derivative with a monotone function, for example, a straight line, are x 1 and x 2 , which are used as approximate measurement positions. Similar to the above two examples, since the approximate measurement position is regression estimated using a continuous function based on the information of a plurality of points near the light-dark boundary, a higher resolution can be realized by the photocell interval M. Next, other embodiments A2 and A3 of the present invention will be described. FIG. 5 shows an example A2 in which the condensing means is a reflecting mirror 15 such as a spherical mirror. The condensing means may be a transmissive element such as a lens. The light shielding container 9 has an opening only on the side of the transmission diffusion plate 2 so that only the light reflected by the reflecting mirror 15 can pass through the opening 7 of the light shielding plate 6. FIG. 6 shows an example A3 in which the light receiving means is composed of the two-dimensional image sensor 16. In this case, unlike the conventional example in which the irradiation light is parallel sheet light, there is no distinction between upper, lower, left and right measurement directions. Therefore, by using the two-dimensional image sensor 16, the two-dimensional shape of the DUT 11 can be measured. Also, in this case, two types of characteristic functions are required, one for vertical measurement and the other for horizontal measurement. When a plurality of other one-dimensional image sensors 8 are arranged vertically or horizontally,
In the same manner, the one-dimensional image sensor 8 may be moved up and down to form a two-dimensional image sensor equivalently. Thus, the present invention is based on the measuring devices A1 and A
2, A3 can have various shapes. As described above, according to the present invention, it is possible to obtain an optical shape measuring device which is not affected by ambient light and which is easy to move and attach and detach the object to be measured.

【0012】[0012]

【発明の効果】本発明に係る光学的形状測定装置は,上
記したように構成されている為,装置の周囲光の内,集
光手段によって集光される光以外は,受光照射光への外
乱光とならず,測定誤差を減少することができる。又,
外乱光除去のための遮光手段が光源側,受光側とで独立
しており,測定に際してじゃまになるおそれがない。更
に,測定データを算出するにあたり一次微分あるいは二
次微分演算を施している。これにより閾値を用いている
従来例に比べ,発光源や除去しきれなかった外乱光(そ
のほとんどは測定装置や遮光手段表面で反射した散乱光
を思われる)により光量ムラの影響を受けにくくなる。
特に外乱光が受光手段の視野内で一様な強度分布を示す
場合にはその影響を完全に除去できる。ここで,被測定
物から集光手段,受光手段に至る系は厳密には集光手段
による結像光学系である。従って,被測定物と集光手段
との間の距離が変わると受光手段上での像のシャープさ
が変化する。即ち,受光手段上の暗と明との境界におい
て,その中心は平行光線から決定される位置で変わらな
いが,その境界領域の幅は若干変化する。本発明での測
定データ算出の際の微分演算及び曲線回帰演算,重心演
算等においては,このような境界領域の幅変化は測定結
果に直接影響を与えず,測定誤差を増加するおそれがな
い。更に,曲線回帰演算などを用いることにより受光手
段の素子の間隔以下の測定分解能を得ることができる
が,これを投光側で平行光を作り出す従来例に適用した
場合,投光部と受光部相互の位置関係がずれると影の位
置ズレが生じ,その測定分解能を有効に利用できなくな
るおそれがある。それに対し,本発明では,投光部の位
置によらず受光部のみで平行光を取り出す為,投光部と
受光部との相互の位置変動が測定誤差の原因とならず,
上記測定分解能を有効に利用することができる。その結
果,本発明によれば,外乱光の影響を受けることなく,
又装置の移動や被測定物の取付等をも容易に行うことの
できる光学的形状測定装置を得ることができる。
Since the optical shape measuring apparatus according to the present invention is configured as described above, it is possible to receive the received irradiation light other than the light condensed by the condensing means among the ambient light of the apparatus. It does not become ambient light, and measurement errors can be reduced. or,
The light-shielding means for removing ambient light is independent on the light source side and the light-receiving side, so there is no risk of interference during measurement. Further, in calculating the measurement data, a first derivative or a second derivative operation is performed. As a result, compared to the conventional example that uses a threshold value, it is less likely to be affected by uneven light intensity due to the light source and the ambient light that cannot be completely removed (most of them are likely to be scattered light reflected by the surface of the measuring device or the shading means) .
In particular, when the ambient light has a uniform intensity distribution within the visual field of the light receiving means, the influence can be completely eliminated. Here, strictly speaking, the system from the object to be measured to the light collecting means and the light receiving means is an image forming optical system by the light collecting means. Therefore, when the distance between the object to be measured and the light collecting means changes, the sharpness of the image on the light receiving means changes. That is, at the boundary between dark and bright on the light receiving means, the center does not change at the position determined from the parallel rays, but the width of the boundary area changes slightly. In the differential calculation, the curve regression calculation, the barycentric calculation, and the like when calculating the measurement data according to the present invention, such a change in the width of the boundary region does not directly affect the measurement result, and there is no possibility of increasing the measurement error. Further, by using a curve regression operation or the like, a measurement resolution less than the distance between the elements of the light receiving means can be obtained. However, when this is applied to a conventional example that produces parallel light on the light emitting side, the light emitting portion and the light receiving portion If the mutual positional relationship shifts, the shadow may be displaced, and the measurement resolution may not be used effectively. On the other hand, in the present invention, since parallel light is extracted only by the light receiving portion regardless of the position of the light emitting portion, mutual positional fluctuation between the light emitting portion and the light receiving portion does not cause a measurement error.
The above measurement resolution can be effectively used. As a result, according to the present invention, without being affected by ambient light,
Further, it is possible to obtain an optical shape measuring device which can easily move the device and attach an object to be measured.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の一実施例に係る光学的形状測定装置
A1の概略構成を示す模式図。
FIG. 1 is a schematic diagram showing a schematic configuration of an optical shape measuring apparatus A1 according to an embodiment of the present invention.

【図2】 測定装置A1のある出力例を示すグラフ
(a)〜(c)。
FIG. 2 is graphs (a) to (c) showing an output example of the measuring apparatus A1.

【図3】 測定装置A1の他の出力例を示すグラフ
(a),(b)。
FIG. 3 is graphs (a) and (b) showing another output example of the measuring apparatus A1.

【図4】 測定装置A1の受光状態を示す説明図(a)
〜(c)。
FIG. 4 is an explanatory view showing a light receiving state of the measuring device A1 (a).
~ (C).

【図5】 本発明の他の実施例に係る光学的形状測定装
置A2の概略構成を示す模式図。
FIG. 5 is a schematic diagram showing a schematic configuration of an optical shape measuring device A2 according to another embodiment of the present invention.

【図6】 本発明の他の実施例に係る光学的形状測定装
置A3の概略構成を示す模式図。
FIG. 6 is a schematic diagram showing a schematic configuration of an optical shape measuring device A3 according to another embodiment of the present invention.

【図7】 従来の光学的形状測定装置A0の一例におけ
る概略構成を示す模式図。
FIG. 7 is a schematic diagram showing a schematic configuration of an example of a conventional optical shape measuring apparatus A0.

【図8】 従来の測定装置A0の出力例を示すグラフ。FIG. 8 is a graph showing an output example of a conventional measuring apparatus A0.

【符号の説明】[Explanation of symbols]

A1,A2,A3…光学的形状測定装置 1…発光源(光源に相当) 3…カバー(第1の遮光手段に相当) 5…凸レンズ(集光手段に相当) 6…遮蔽板(絞り手段に相当) 7…開口部 8…イメージセンサ(受光手段に相当) 9…遮光容器(第2の遮光手段に相当) 10…演算器(測定手段に相当) A1, A2, A3 ... Optical shape measuring device 1 ... Light emitting source (corresponding to light source) 3 ... Cover (corresponding to first light shielding means) 5 ... Convex lens (corresponding to light converging means) 6 ... Shielding plate (to diaphragm means) 7) Opening 8 ... Image sensor (corresponding to light receiving means) 9 ... Light-shielding container (corresponding to second light-shielding means) 10 ... Arithmetic unit (corresponding to measuring means)

フロントページの続き (72)発明者 山口 証 兵庫県神戸市西区高塚台1丁目5番5号 株式会社神戸製鋼所神戸総合技術研究所内 (72)発明者 日下部 裕次 兵庫県明石市魚住町金ケ崎西大池179番1 株式会社神戸製鋼所明石工場内 (72)発明者 河本 憲二 兵庫県明石市魚住町金ケ崎西大池179番1 株式会社神戸製鋼所明石工場内 (72)発明者 川淵 義行 兵庫県明石市魚住町金ケ崎西大池179番1 株式会社神戸製鋼所明石工場内Front page continuation (72) Inventor Yamaguchi evidence 1-5-5 Takatsukadai, Nishi-ku, Kobe-shi, Hyogo Prefecture Kobe Steel Co., Ltd. Kobe Research Institute (72) Inventor Yuji Kusakabe Kanegasaki Nishi-Oike, Uozumi-cho, Akashi-shi, Hyogo 179-1 Kobe Steel Co., Ltd. Akashi Plant (72) Inventor Kenji Kawamoto Kanegasaki Nishi Oike, Uozumi Town, Akashi City, Hyogo Prefecture 179-1 Kobe Steel Co., Ltd. Akashi Plant (72) Inventor Yoshiyuki Kawabuchi Uozumi, Akashi City, Hyogo Prefecture Town Kanegasaki Nishioike 179-1 Kobe Steel Co., Ltd. Akashi Factory

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 光源からの平行照射光を被測定物を経由
させて受光し,上記受光された照射光の上記被測定物に
よって生じた強度分布に基づいて該被測定物の形状測定
を行う光学的形状測定装置において,上記光源からの照
射光を,上記被測定物を経由させた後に集光する集光手
段と,上記集光手段の焦点付近に配設され,上記集光手
段により集光された照射光が通過可能な大きさの開口部
を有する絞り手段と,上記絞り手段の開口部を通過した
照射光を受光する受光手段と,上記受光手段によって受
光された照射光の強度分布に基づいて上記被測定物の形
状測定を行う測定手段とを具備してなることを特徴とす
る光学的形状測定装置。
1. A parallel irradiation light from a light source is received through an object to be measured, and the shape of the object to be measured is measured based on an intensity distribution of the received irradiation light generated by the object to be measured. In the optical shape measuring apparatus, a light collecting means for collecting the irradiation light from the light source after passing through the object to be measured, and a light collecting means arranged near the focus of the light collecting means. A diaphragm means having an opening having a size through which the emitted irradiation light can pass, a light receiving means for receiving the irradiation light passing through the opening of the diaphragm means, and an intensity distribution of the irradiation light received by the light receiving means. An optical shape measuring device, comprising: a measuring means for measuring the shape of the object to be measured based on the above.
【請求項2】 上記光源の周囲の外乱光を遮断する第1
の遮光手段を設けてなることを特徴とする請求項1記載
の光学的形状測定装置。
2. A first device for blocking ambient light around the light source
The optical shape measuring device according to claim 1, further comprising:
【請求項3】 上記受光手段の周囲の外乱光を遮断する
第2の遮光手段を設けてなることを特徴とする請求項1
記載の光学的形状測定装置。
3. A second light shielding means for shielding ambient light around the light receiving means is provided.
The optical shape measuring device described.
【請求項4】 光源からの平行照射光を被測定物を経由
させて受光し,上記受光された照射光の上記被測定物に
よって生じた強度分布に基づいて該被測定物の形状測定
を行う光学的形状測定装置において,上記光源の周囲の
外乱光を遮断する第1の遮断光手段と,上記第1の遮断
手段により外乱光を遮断された上記光源からの照射光
を,上記被測定物を経由させた後に集光する集光手段
と,上記集光手段の焦点付近に配設され,上記集光手段
により集光された照射光が通過可能な大きさの開口部を
有する絞り手段と,上記絞り手段の開口部を通過した照
射光を受光する受光手段と,上記受光手段の周囲の外乱
光を遮断する第2の遮光手段と,上記第2の遮光手段に
より外乱光を遮断された上記受光手段によって受光され
た照射光の強度分布に基づいて上記被測定物の形状測定
を行う測定手段とを具備してなることを特徴とする光学
的形状測定装置。
4. The parallel irradiation light from a light source is received via an object to be measured, and the shape of the object to be measured is measured based on the intensity distribution of the received irradiation light generated by the object to be measured. In the optical shape measuring device, a first blocking light means for blocking ambient light around the light source, and irradiation light from the light source shielded by ambient light by the first blocking means, Light collecting means for collecting light after passing through, and diaphragm means arranged near the focal point of the light collecting means and having an opening having a size through which the irradiation light collected by the light collecting means can pass. A light receiving means for receiving the irradiation light having passed through the aperture of the diaphragm means, a second light blocking means for blocking ambient light around the light receiving means, and a second light blocking means for blocking the ambient light. Based on the intensity distribution of the irradiation light received by the light receiving means, An optical shape measuring device, comprising: a measuring means for measuring the shape of the object to be measured.
【請求項5】 上記測定手段が,上記受光手段により受
光された照射光の強度分布の一次微分を曲線回帰した時
のピーク位置からなる測定データに基づいて上記被測定
物の形状測定を行うことを特徴とする請求項1又は4記
載の光学的形状測定装置。
5. The shape of the object to be measured is measured by the measuring means based on measurement data composed of peak positions when the first derivative of the intensity distribution of the irradiation light received by the light receiving means is subjected to curve regression. The optical shape measuring apparatus according to claim 1 or 4, characterized in that:
【請求項6】 上記測定手段が,上記受光手段により受
光された照射光の強度分布の一次微分の重心位置からな
る測定データに基づいて上記被測定物の形状測定を行う
ことを特徴とする請求項1又は4記載の光学的形状測定
装置。
6. The shape measuring device measures the shape of the object to be measured based on measurement data composed of a barycentric position of a first derivative of the intensity distribution of the irradiation light received by the light receiving device. Item 5. The optical shape measuring device according to Item 1 or 4.
【請求項7】 上記測定手段が,上記受光手段により受
光された照射光の強度分布の二次微分を曲線回帰した時
のゼロ点位置からなる測定データに基づいて上記被測定
物の形状測定を行うことを特徴とする請求項1又は4記
載の光学的形状測定装置。
7. The shape measurement of the object to be measured based on the measurement data consisting of the zero point position when the measuring means regresses the second derivative of the intensity distribution of the irradiation light received by the light receiving means by curve regression. The optical shape measuring apparatus according to claim 1, wherein the optical shape measuring apparatus is performed.
【請求項8】 上記測定手段が,予め設定された校正曲
線を用いて上記測定データを校正する請求項5,6又は
7記載の光学的形状測定装置。
8. The optical profile measuring apparatus according to claim 5, 6 or 7, wherein said measuring means calibrates said measurement data using a preset calibration curve.
JP5080405A 1993-04-07 1993-04-07 Optical profile measuring equipment Pending JPH06294621A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5080405A JPH06294621A (en) 1993-04-07 1993-04-07 Optical profile measuring equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5080405A JPH06294621A (en) 1993-04-07 1993-04-07 Optical profile measuring equipment

Publications (1)

Publication Number Publication Date
JPH06294621A true JPH06294621A (en) 1994-10-21

Family

ID=13717390

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5080405A Pending JPH06294621A (en) 1993-04-07 1993-04-07 Optical profile measuring equipment

Country Status (1)

Country Link
JP (1) JPH06294621A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004325274A (en) * 2003-04-25 2004-11-18 Institute Of Physical & Chemical Research Statistical error analysis method of measurement data
JP2007010393A (en) * 2005-06-29 2007-01-18 Jfe Steel Kk Screw shape measuring device
JP2008070164A (en) * 2006-09-12 2008-03-27 Inoac Corp Roller testing method
JP2010210292A (en) * 2009-03-06 2010-09-24 Jfe Steel Corp Apparatus and method for measuring screw shape
JP2011075469A (en) * 2009-09-30 2011-04-14 Panasonic Electric Works Sunx Co Ltd Displacement sensor
JP2015001379A (en) * 2013-06-13 2015-01-05 独立行政法人 宇宙航空研究開発機構 Road and structure surface condition monitoring sensor
JP2016004483A (en) * 2014-06-18 2016-01-12 株式会社リコー Image processor, inspection system, image processing method and image processing program
JP2019012006A (en) * 2017-06-30 2019-01-24 株式会社ミツトヨ Optical measuring device
CN116045805A (en) * 2022-12-23 2023-05-02 上海好杰机械设备制造有限公司 Lighting detection device for workpiece opening

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0245886A (en) * 1988-08-08 1990-02-15 Nippon Telegr & Teleph Corp <Ntt> Method for measuring edge position
JPH03261803A (en) * 1990-03-13 1991-11-21 Takaoka Electric Mfg Co Ltd Detection of edge position
JPH0484705A (en) * 1990-07-27 1992-03-18 Ono Sokki Co Ltd Optical size measuring apparatus

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0245886A (en) * 1988-08-08 1990-02-15 Nippon Telegr & Teleph Corp <Ntt> Method for measuring edge position
JPH03261803A (en) * 1990-03-13 1991-11-21 Takaoka Electric Mfg Co Ltd Detection of edge position
JPH0484705A (en) * 1990-07-27 1992-03-18 Ono Sokki Co Ltd Optical size measuring apparatus

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004325274A (en) * 2003-04-25 2004-11-18 Institute Of Physical & Chemical Research Statistical error analysis method of measurement data
JP2007010393A (en) * 2005-06-29 2007-01-18 Jfe Steel Kk Screw shape measuring device
JP2008070164A (en) * 2006-09-12 2008-03-27 Inoac Corp Roller testing method
JP2010210292A (en) * 2009-03-06 2010-09-24 Jfe Steel Corp Apparatus and method for measuring screw shape
JP2011075469A (en) * 2009-09-30 2011-04-14 Panasonic Electric Works Sunx Co Ltd Displacement sensor
JP2015001379A (en) * 2013-06-13 2015-01-05 独立行政法人 宇宙航空研究開発機構 Road and structure surface condition monitoring sensor
JP2016004483A (en) * 2014-06-18 2016-01-12 株式会社リコー Image processor, inspection system, image processing method and image processing program
JP2019012006A (en) * 2017-06-30 2019-01-24 株式会社ミツトヨ Optical measuring device
CN116045805A (en) * 2022-12-23 2023-05-02 上海好杰机械设备制造有限公司 Lighting detection device for workpiece opening

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