JPH0635187Y2 - 冷熱衝撃試験装置 - Google Patents

冷熱衝撃試験装置

Info

Publication number
JPH0635187Y2
JPH0635187Y2 JP6883188U JP6883188U JPH0635187Y2 JP H0635187 Y2 JPH0635187 Y2 JP H0635187Y2 JP 6883188 U JP6883188 U JP 6883188U JP 6883188 U JP6883188 U JP 6883188U JP H0635187 Y2 JPH0635187 Y2 JP H0635187Y2
Authority
JP
Japan
Prior art keywords
chamber
test
low temperature
heating means
thermal shock
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP6883188U
Other languages
English (en)
Japanese (ja)
Other versions
JPH01171374U (2
Inventor
喜代治 松本
三泰 西沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Orion Machinery Co Ltd
Original Assignee
Orion Machinery Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Orion Machinery Co Ltd filed Critical Orion Machinery Co Ltd
Priority to JP6883188U priority Critical patent/JPH0635187Y2/ja
Publication of JPH01171374U publication Critical patent/JPH01171374U/ja
Application granted granted Critical
Publication of JPH0635187Y2 publication Critical patent/JPH0635187Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP6883188U 1988-05-25 1988-05-25 冷熱衝撃試験装置 Expired - Lifetime JPH0635187Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6883188U JPH0635187Y2 (ja) 1988-05-25 1988-05-25 冷熱衝撃試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6883188U JPH0635187Y2 (ja) 1988-05-25 1988-05-25 冷熱衝撃試験装置

Publications (2)

Publication Number Publication Date
JPH01171374U JPH01171374U (2) 1989-12-05
JPH0635187Y2 true JPH0635187Y2 (ja) 1994-09-14

Family

ID=31294128

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6883188U Expired - Lifetime JPH0635187Y2 (ja) 1988-05-25 1988-05-25 冷熱衝撃試験装置

Country Status (1)

Country Link
JP (1) JPH0635187Y2 (2)

Also Published As

Publication number Publication date
JPH01171374U (2) 1989-12-05

Similar Documents

Publication Publication Date Title
JP3073636B2 (ja) 間接冷却方式の冷蔵庫
US6052999A (en) Method for controlling opening/closing of cool air discharge ports of a refrigerator
JP4088474B2 (ja) 冷蔵庫
JP2801305B2 (ja) 冷熱環境試験装置
JP2000249643A (ja) 冷熱衝撃試験装置
JPH06182235A (ja) 冷熱環境試験装置
JPH10111064A (ja) 冷蔵庫の冷却ファン制御方法
JPH0322579B2 (2)
JPH0635187Y2 (ja) 冷熱衝撃試験装置
JP2999710B2 (ja) ワイドレンジ型環境試験装置
JPH074608Y2 (ja) 冷熱衝撃試験装置
JP2629015B2 (ja) 温度サイクル装置における温度制御方法
JPH02257036A (ja) 冷熱衝撃試験装置
KR100219428B1 (ko) 냉장고의 냉기 토출 제어장치
JP3190793B2 (ja) 冷却貯蔵庫の庫内温度制御装置
JPS63158472A (ja) 冷熱衝撃試験装置
JP3540162B2 (ja) 除湿機
JPH0645913Y2 (ja) 冷熱衝撃試験装置
KR100219429B1 (ko) 냉장고의 냉기 토출 제어장치
JP2001183018A (ja) 空水冷式凝縮器
KR0175339B1 (ko) 냉장고의 냉장실 온도유지장치 및 방법
JPS62125233A (ja) 冷熱環境試験装置
JPH04320946A (ja) 気槽式冷熱衝撃試験装置
KR19980035313A (ko) 냉장고의 집중냉각 방법 및 장치
JPS63292081A (ja) 広域冷熱サイクル試験装置