JPH065641A - Chip carrier type semiconductor device - Google Patents

Chip carrier type semiconductor device

Info

Publication number
JPH065641A
JPH065641A JP4156614A JP15661492A JPH065641A JP H065641 A JPH065641 A JP H065641A JP 4156614 A JP4156614 A JP 4156614A JP 15661492 A JP15661492 A JP 15661492A JP H065641 A JPH065641 A JP H065641A
Authority
JP
Japan
Prior art keywords
glass epoxy
chip carrier
semiconductor device
carrier type
type semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP4156614A
Other languages
Japanese (ja)
Inventor
Takeshi Nakajima
猛 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP4156614A priority Critical patent/JPH065641A/en
Publication of JPH065641A publication Critical patent/JPH065641A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/50—Bond wires
    • H10W72/541—Dispositions of bond wires
    • H10W72/5449—Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/50—Bond wires
    • H10W72/551—Materials of bond wires
    • H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
    • H10W72/5522—Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/90—Bond pads, in general
    • H10W72/931—Shapes of bond pads
    • H10W72/932—Plan-view shape, i.e. in top view

Landscapes

  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

(57)【要約】 【目的】有機系基材を使用したチップキャリア型半導体
装置において、基材の裏面からの水分・湿気の浸入を防
ぐことにより、耐湿性を向上させる。 【構成】半導体ICペレット3が搭載される部分がガラ
スエポキシ層2との積層構造になっているガラスエポキ
シ基板1に半導体ICペレット3を搭載し、ガラスエポ
キシ基板1上に形成されたボンディングパッド4とAu
ワイヤ5で接続し、さらに半導体ICペレット3とAu
ワイヤ5とガラスエポキシ基板1の一部を覆うように充
填されたエポキシ樹脂7より構成される。
(57) [Abstract] [Purpose] In a chip carrier type semiconductor device using an organic base material, moisture resistance is improved by preventing moisture and humidity from entering from the back surface of the base material. [Structure] A semiconductor IC pellet 3 is mounted on a glass epoxy substrate 1 in which a portion on which the semiconductor IC pellet 3 is mounted has a laminated structure with a glass epoxy layer 2, and a bonding pad 4 formed on the glass epoxy substrate 1. And Au
Connected by wire 5, and then semiconductor IC pellet 3 and Au
The wire 5 and the epoxy resin 7 are filled so as to cover a part of the glass epoxy substrate 1.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、チップキャリア型半導
体装置に関し、特に有機系基板上に半導体素子が搭載さ
れて形成されるパッケージ構造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chip carrier type semiconductor device, and more particularly to a package structure formed by mounting a semiconductor element on an organic substrate.

【0002】[0002]

【従来の技術】従来の表面実装タイプのチップキャリア
型半導体装置は、図2(a),(b)に示すようにガラ
スエポキシ基板1に凹形状の座ぐりが設けらており、こ
の座ぐり部分に半導体ICペレット3が搭載されてい
る。半導体ICペレット3はガラスエポキシ基板1の所
望部分に形成されたボンディングパッド4とAuワイヤ
5で接続されている。また、ボンディングパッド4はガ
ラスエポキシ基板1上で配線により電極6に接続されて
いる。さらにガラスエポキシ基板1の周辺部には樹脂枠
8が設けられており、樹脂枠8の内側にはエポキシ樹脂
7が充填されている。
2. Description of the Related Art A conventional surface mounting type chip carrier type semiconductor device has a recessed counterbore provided on a glass epoxy substrate 1 as shown in FIGS. 2 (a) and 2 (b). A semiconductor IC pellet 3 is mounted on the portion. The semiconductor IC pellet 3 is connected to a bonding pad 4 formed on a desired portion of the glass epoxy substrate 1 by an Au wire 5. The bonding pad 4 is connected to the electrode 6 by wiring on the glass epoxy substrate 1. Further, a resin frame 8 is provided in the peripheral portion of the glass epoxy substrate 1, and an epoxy resin 7 is filled inside the resin frame 8.

【0003】[0003]

【発明が解決しようとする課題】この従来のチップキャ
リア型半導体装置では、信頼性上、特に耐湿性において
次のような問題点があった。すなわち、半導体素子の素
子面は樹脂により保護されているものの、有機系基材の
繊維層を通じて外部からの水分又は湿気の浸入により、
良好な耐湿性を確保することが困難であった。
The conventional chip carrier type semiconductor device has the following problems in terms of reliability, particularly in moisture resistance. That is, although the element surface of the semiconductor element is protected by the resin, by the infiltration of moisture or humidity from the outside through the fiber layer of the organic base material,
It was difficult to secure good moisture resistance.

【0004】上記問題点は、例えばチップキャリア型半
導体装置をハンダリフロー装置によりプリント配線基板
上に実装する場合、リフロー前の混成集積回路装置の保
管状態をより厳格に管理しなければならないというよう
な、表面実装部品管理面に影響していた。また、湿気の
浸入により電気的なリーク不良が発生し易く性能面にも
影響していた。
The above problem is that, for example, when a chip carrier type semiconductor device is mounted on a printed wiring board by a solder reflow device, the storage state of the hybrid integrated circuit device before reflow must be controlled more strictly. , It had an influence on the management of surface mount components. In addition, the infiltration of moisture is apt to cause an electrical leak defect, which also affects the performance.

【0005】[0005]

【課題を解決するための手段】本発明のチップキャリア
型半導体装置は、有機系基材と樹脂からなる積層構造の
基板において、基材面側に凹形状の座ぐりを設け、この
座ぐり部分に半導体素子を配置することにより、外部か
らの水分又は湿気の浸入をより少なくすることが可能と
なり、耐湿性が向上した。
A chip carrier type semiconductor device of the present invention is a substrate having a laminated structure composed of an organic base material and a resin, and a concave counterbore is provided on the base material surface side, and the counterbore portion is provided. By arranging the semiconductor element in the above, it becomes possible to further reduce intrusion of moisture or humidity from the outside, and the moisture resistance is improved.

【0006】[0006]

【実施例】次に本発明について図面を参照して説明す
る。図1(a)は本発明の一実施例を示す平面図で、
(b)は(a)のA−A′線の断面図である。ガラスエ
ポキシ基板1は、エポキシ樹脂層2と積層構造になって
おり、半導体ICペレット3が搭載される部分が凹形状
にくり抜かれている。ガラスエポキシ基板1に半導体I
Cペレット3を搭載し、ガラスエポキシ基板3に形成さ
れたボンディングパッド4と半導体ICペレット3とを
ワイヤ5で接続する。ボンディングパッド4はガラスエ
ポキシ基板1上の配線により、外部との接続に使用され
る電極6に引き出されている。エポキシ樹脂7は、電極
6と同じ高さで、かつ表面が平らになるように充填され
ている。
The present invention will be described below with reference to the drawings. FIG. 1A is a plan view showing an embodiment of the present invention.
(B) is a sectional view taken along the line AA 'in (a). The glass epoxy substrate 1 has a laminated structure with the epoxy resin layer 2, and a portion where the semiconductor IC pellet 3 is mounted is hollowed out in a concave shape. Semiconductor I on glass epoxy substrate 1
The C pellet 3 is mounted, and the bonding pad 4 formed on the glass epoxy substrate 3 and the semiconductor IC pellet 3 are connected by the wire 5. The bonding pad 4 is drawn out to the electrode 6 used for connection with the outside by the wiring on the glass epoxy substrate 1. The epoxy resin 7 is filled at the same height as the electrode 6 so that the surface becomes flat.

【0007】[0007]

【発明の効果】以上説明したように、本発明は半導体素
子が搭載される部分を有機系基材と樹脂からなる積層構
造にすることにより、半導体素子裏面側より浸入してく
る水分又は湿気を少なくすることができるため、耐湿性
を向上させることができる。
As described above, according to the present invention, the portion on which the semiconductor element is mounted has a laminated structure composed of the organic base material and the resin, so that the moisture or the moisture entering from the back surface side of the semiconductor element can be prevented. Since it can be reduced, the moisture resistance can be improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】(a)は本発明による一実施例を示す平面図,
(b)は(a)のA−A′線の断面図である。
FIG. 1A is a plan view showing an embodiment according to the present invention,
(B) is a sectional view taken along the line AA 'in (a).

【図2】(a)は従来例を示す平面図,(b)は(a)
のA−A′線の断面図である。
FIG. 2 (a) is a plan view showing a conventional example, and FIG. 2 (b) is (a).
3 is a cross-sectional view taken along the line AA ′ of FIG.

【符号の説明】[Explanation of symbols]

1 ガラスエポキシ基板 2 エポキシ樹脂層 3 半導体ICペレット 4 ボンディングパッド 5 Auワイヤ 6 電極 7 エポキシ樹脂 8 樹脂枠 1 Glass Epoxy Substrate 2 Epoxy Resin Layer 3 Semiconductor IC Pellet 4 Bonding Pad 5 Au Wire 6 Electrode 7 Epoxy Resin 8 Resin Frame

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 有機系基材と樹脂からなる積層構造の基
板において、基材面側に凹形状の座ぐりを設け、この座
ぐり部分に半導体素子を配置し、基板端面の所望部分に
形成された電極と半導体素子をボンディング線で接続
し、半導体素子およびボンディング線を樹脂で被覆する
ことを特徴とするチップキャリア型半導体装置。
1. A substrate having a laminated structure composed of an organic base material and a resin is provided with a concave counterbore on the base material surface side, and a semiconductor element is arranged in the counterbore portion, and formed on a desired portion of the substrate end surface. A chip carrier type semiconductor device, characterized in that the formed electrode and the semiconductor element are connected with a bonding wire, and the semiconductor element and the bonding wire are covered with a resin.
JP4156614A 1992-06-16 1992-06-16 Chip carrier type semiconductor device Withdrawn JPH065641A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4156614A JPH065641A (en) 1992-06-16 1992-06-16 Chip carrier type semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4156614A JPH065641A (en) 1992-06-16 1992-06-16 Chip carrier type semiconductor device

Publications (1)

Publication Number Publication Date
JPH065641A true JPH065641A (en) 1994-01-14

Family

ID=15631585

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4156614A Withdrawn JPH065641A (en) 1992-06-16 1992-06-16 Chip carrier type semiconductor device

Country Status (1)

Country Link
JP (1) JPH065641A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4948972A (en) * 1986-10-14 1990-08-14 Fuji Photo Film Co., Ltd. Read-out device for radiation image storage panel
JPH08255850A (en) * 1995-03-16 1996-10-01 Nec Corp Semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4948972A (en) * 1986-10-14 1990-08-14 Fuji Photo Film Co., Ltd. Read-out device for radiation image storage panel
JPH08255850A (en) * 1995-03-16 1996-10-01 Nec Corp Semiconductor device

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Legal Events

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A300 Application deemed to be withdrawn because no request for examination was validly filed

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 19990831