JPH0680700B2 - Method for manufacturing semiconductor device - Google Patents

Method for manufacturing semiconductor device

Info

Publication number
JPH0680700B2
JPH0680700B2 JP26819592A JP26819592A JPH0680700B2 JP H0680700 B2 JPH0680700 B2 JP H0680700B2 JP 26819592 A JP26819592 A JP 26819592A JP 26819592 A JP26819592 A JP 26819592A JP H0680700 B2 JPH0680700 B2 JP H0680700B2
Authority
JP
Japan
Prior art keywords
base material
conductor
metal layer
adhesive
electroformed metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP26819592A
Other languages
Japanese (ja)
Other versions
JPH05218132A (en
Inventor
博士 嶋津
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Maxell Ltd
Original Assignee
Hitachi Maxell Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Maxell Ltd filed Critical Hitachi Maxell Ltd
Priority to JP26819592A priority Critical patent/JPH0680700B2/en
Publication of JPH05218132A publication Critical patent/JPH05218132A/en
Publication of JPH0680700B2 publication Critical patent/JPH0680700B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Wire Bonding (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、IC,LSIなどの半
導体素子と接続する導体を多数個フィルム上に担持,配
列して半導体装置を製造する方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a semiconductor device by carrying and arranging a large number of conductors connected to semiconductor elements such as ICs and LSIs on a film.

【0002】[0002]

【従来の技術】従来より半導体素子を樹脂モールドで一
体化して多数のピンを突設した半導体装置の組立には、
金属製のリードフレームが用いられている。そして従来
のリードフレームは、薄い金属板をプレスで打ち抜いた
り、エッチングなどで形成していた。
2. Description of the Related Art Conventionally, when assembling a semiconductor device in which a semiconductor element is integrally molded by resin molding and a large number of pins are projected,
A metal lead frame is used. The conventional lead frame is formed by punching a thin metal plate with a press or etching.

【0003】ところで、リードフレームには極めて細い
タブリード,フィンガやそれの先端のバンプなどの導体
が形成されているが、最近では多数ピンの半導体装置が
要求されることにより、タブリードやフィンガなどの幅
はますます細く、バンプは小さなものとならざるを得な
い。そのため、単なる薄板の打抜きプレス加工では限度
があり、精度の高いリードフレームを得ることは難し
い。
By the way, conductors such as extremely thin tab leads, fingers and bumps at the tips thereof are formed on the lead frame. Recently, the width of tab leads and fingers has been increased due to the demand for a semiconductor device having a large number of pins. It is becoming thinner and smaller, and the bumps must be small. Therefore, there is a limit to the simple punching press work of a thin plate, and it is difficult to obtain a highly accurate lead frame.

【0004】そこで、エッチング加工を用いて微細なフ
ィンガなどを有するリードフレームを製造することが行
われているが、この方法は製造工程が複雑でコスト高と
なる欠点を有している。
Therefore, a lead frame having fine fingers and the like is manufactured by etching, but this method has a drawback that the manufacturing process is complicated and the cost is high.

【0005】これらの欠点を解消し、製造が容易で、微
細な部分が形成できる方法として、最近、電鋳技術を用
いたリードフレームの開発がなされている。そして生産
性の向上を図るため、リードを多数個基材上に担持,配
列する方法が各種検討されている。
As a method of eliminating these drawbacks, facilitating manufacture, and forming a fine portion, a lead frame using an electroforming technique has recently been developed. In order to improve productivity, various methods for supporting and arranging a large number of leads on a base material have been studied.

【0006】図12は従来の導体担持基材としてのリー
ドキャリアフィルムの製造工程を説明するための断面
図、図7はそのリードキャリアフィルムの巻回体の側面
図である。従来のリードキャリアフィルムは、まず図1
2(a)に示すようなアルミニウム板やステンレス板な
どの金属板、あるいはポリエステルフィルムやピリイミ
ドフィルムなどの合成樹脂フィルムの表面に金属の蒸着
や無電解メッキなどで導電性を付与せしめたフィルムな
どの基材51上に、合成樹脂からなる電気絶縁性のレジ
スト層52が印刷によって所望のパターンに形成され
る。この場合、レジスト層52が形成されていない非レ
ジスト部53が製造しようとしているリードやフィン
ガ,バンプのような導体形状と同じパターンになってい
る。
FIG. 12 is a sectional view for explaining a conventional manufacturing process of a lead carrier film as a conductor carrying base material, and FIG. 7 is a side view of a wound body of the lead carrier film. The conventional lead carrier film is first shown in FIG.
A metal plate such as an aluminum plate or a stainless plate as shown in 2 (a), or a synthetic resin film such as a polyester film or a pyrimido film, which is provided with conductivity by metal deposition or electroless plating. An electrically insulating resist layer 52 made of synthetic resin is formed in a desired pattern on the base material 51 by printing. In this case, the non-resist portion 53 in which the resist layer 52 is not formed has the same pattern as the conductor shape such as the lead, finger, or bump to be manufactured.

【0007】次にこの基材51上を亜セレン酸等により
剥離処理したのち、電鋳により銅,ニッケル,金,スズ
などの金属を付着して導電金属層からなる導体54を所
定の形状に作る(同図(b)参照)。しかるのち基材5
1上のレジスト層52を除去し(同図(c)参照)、片
面に接着剤を塗布したキャリアフィルム55を導体54
上に押しつけ、次にそれを剥がすことにより、導体54
は基材51から離れて同図(d)に示すように基材55
上に担持される。
Next, the base material 51 is stripped with selenious acid or the like, and then a metal such as copper, nickel, gold or tin is attached by electroforming to form a conductor 54 made of a conductive metal layer into a predetermined shape. Make (see (b) of the same figure). Subsequent base material 5
1 is removed (see FIG. 2C), and a carrier film 55 having an adhesive applied on one side is formed on the conductor 54.
The conductor 54 by pressing it up and then peeling it off.
Is separated from the base material 51, and as shown in FIG.
Carried on top.

【0008】このようにして多数の導体54を担持,配
列した基材55は、図13に示すように巻き取られて、
半導体装置の製造ラインに搬送,供給される。
The substrate 55 carrying and arranging a large number of conductors 54 in this manner is wound up as shown in FIG.
It is transported and supplied to the semiconductor device manufacturing line.

【0009】[0009]

【発明が解決しようとする課題】ところで従来のリード
キャリアフィルムなどの基材は、図12(d)に示すよ
うに導体54の成長出張り部54bが基材55上に付着
され、電鋳基部54aが外側を向いた配置状態になって
いる。前記成長出張り部54bは導体54の電鋳成形時
に形成されるもので、その表面には微細な凹凸があり、
しかも図に示すように周囲に丸味があり、基材55に対
する接着性が良くない。
By the way, in a conventional base material such as a lead carrier film, a growth protrusion 54b of a conductor 54 is adhered onto the base material 55 as shown in FIG. The arrangement is such that 54a faces outward. The growth protrusion 54b is formed during electroforming of the conductor 54, and has fine irregularities on its surface.
Moreover, as shown in the figure, the circumference is rounded and the adhesiveness to the base material 55 is not good.

【0010】そのためこの導体54を担持した基材55
を巻き取ったり、あるいはその基材巻回体を順次繰り出
して半導体装置の製造ラインに供給するときなどに、導
体54が基材55から脱落し易く、歩留りが悪く、生産
性の低下をきたすなどの欠点を有している。
Therefore, the base material 55 carrying the conductor 54
When the conductor is wound up or the base material wound body is sequentially fed out and supplied to the semiconductor device manufacturing line, the conductor 54 is easily dropped from the base material 55, the yield is poor, and the productivity is lowered. Has the drawback of.

【0011】[0011]

【課題を解決するための手段】本発明の目的は、このよ
うな従来技術の欠点を解消し、導体の担持が確実で、取
扱い性の良い導体担持基材を提供するにある。前述の目
的を達成するため、本発明は、半導体素子と接続される
導体6aを第1の基材1上に形成し、該導体6aを粘着
剤8付着の第2の基材9に転写し、第3の基材4上に前
記粘着剤8より接着強度の高い接着剤11を塗着すると
ともに、前記第2の基材9を、前記導体6aが第3の基
材4上の接着剤11側と対向する向きに重ねて加圧し、
その後前記第2の基材9を剥離して前記導体6aを第3
の基材4に転写し、該導体6aと半導体素子とを接続し
てなることを特徴とするものである。
SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned drawbacks of the prior art and to provide a conductor-carrying base material in which a conductor is surely carried and which is easy to handle. In order to achieve the above-mentioned object, the present invention forms a conductor 6a connected to a semiconductor element on a first substrate 1 and transfers the conductor 6a to a second substrate 9 having an adhesive 8 attached thereto. , An adhesive 11 having a higher adhesive strength than the pressure-sensitive adhesive 8 is applied on the third base material 4, and the second base material 9 and the conductor 6a are applied on the third base material 4. Pressure is applied by stacking in the direction facing the 11 side,
After that, the second base material 9 is peeled off to form the conductor 6a into a third layer.
Is transferred to the base material 4 and the conductor 6a is connected to the semiconductor element.

【0012】[0012]

【実施例】次に本発明の実施例を図とともに説明する。
図1ないし図7は、本発明の実施例に係る導体担持基材
の製造工程を説明するための断面図である。図1に示す
ように、第1の基材1の表面に所望のパターンを有する
レジスト層2が形成されている。第1の基材1として
は、アルミニウム板,ステンレス板あるいは銅板などの
金属板、またはポリエステルフィルムやポリイミドフィ
ルムなどの合成樹脂フィルム上に、銅などの金属を蒸着
や無電解メッキして導電性を付与したものが用いられ
る。レジスト層2は合成樹脂などからなる電気絶縁性の
もので、例えば、スクリーン印刷や通常の露光硬化など
によって形成される。
Embodiments of the present invention will now be described with reference to the drawings.
1 to 7 are cross-sectional views for explaining a manufacturing process of a conductor carrying base material according to an embodiment of the present invention. As shown in FIG. 1, a resist layer 2 having a desired pattern is formed on the surface of a first base material 1. As the first substrate 1, a metal plate such as an aluminum plate, a stainless plate or a copper plate, or a synthetic resin film such as a polyester film or a polyimide film is vapor-deposited or electroless-plated with a metal such as copper to have conductivity. The provided one is used. The resist layer 2 is made of synthetic resin or the like and has an electrical insulation property, and is formed by, for example, screen printing or ordinary exposure curing.

【0013】第1の基材1は例えば同図の紙面に向かっ
て垂直方向に長尽になったテープ状のもので、レジスト
層2が形成されていない中央の非レジスト部3aは製造
すべきリードやフィンガ,バンプのような導体の形状と
同じパターンを有しており、この中央非レジスト部3a
の両側に位置決め突部形成用の非レジスト部3bが形成
される。この非レジスト部3bは第1の基材1の長手方
向に沿って等ピッチに形成され、図10に示す例えばキ
ャリアフィルムのような第3の基材4の両側端に設けら
れているスプロケット穴5のピッチと同じである。
The first base material 1 is, for example, a tape-like material that is exhausted in the vertical direction toward the plane of the drawing, and the central non-resist portion 3a where the resist layer 2 is not formed should be manufactured. It has the same pattern as the shape of a conductor such as a lead, finger, or bump, and this central non-resist portion 3a
Non-resist portions 3b for forming the positioning protrusions are formed on both sides of. The non-resist portions 3b are formed at equal pitches along the longitudinal direction of the first base material 1, and are sprocket holes provided at both ends of the third base material 4 such as a carrier film shown in FIG. It is the same as the pitch of 5.

【0014】次にこの第1の基材1上を亜セレン酸等に
より剥離処理して、第1の基材1の非レジスト部3a,
3bに相当する表面を活性化したのち、電鋳を施し前記
非レジスト部3a,3b上に電鋳金属層6をレジスト層
2より若干厚い目に形成する。図8は電鋳金属層6の一
例を示す図で、ニッケルとコバルトの合金からなる金属
層本体6−1の上にスズとコバルトの合金からなる被膜
6−2が形成されている。また他の例として、銅からな
る金属層本体6−1の上に金や銀の被膜6−2を形成す
ることもできる。この電鋳金属層6はレジスト層2より
若干厚い目に形成されるため、レジスト層2の上部端縁
に若干掛かった成長出張り部7が形成される(図2参
照)。
Next, the first base material 1 is stripped with selenous acid or the like, and the non-resist portion 3a of the first base material 1,
After activating the surface corresponding to 3b, electroforming is performed to form the electroformed metal layer 6 on the non-resist portions 3a and 3b to have a slightly thicker thickness than the resist layer 2. FIG. 8 is a view showing an example of the electroformed metal layer 6, in which a coating 6-2 made of an alloy of tin and cobalt is formed on a metal layer main body 6-1 made of an alloy of nickel and cobalt. As another example, the gold or silver coating 6-2 can be formed on the metal layer body 6-1 made of copper. Since this electroformed metal layer 6 is formed to have a slightly thicker thickness than the resist layer 2, a growth protrusion 7 which is slightly overlapped with the upper edge of the resist layer 2 is formed (see FIG. 2).

【0015】図9は電鋳の状態を示す一部斜視図で、前
記中央非レジスト部3a上に形成された電鋳金属層6a
は導体の形状をしている。また、両側非レジスト部3b
上に形成された電鋳金属層6bは同図に示すように小さ
な枠形をしており、後述の位置決め突部となる。
FIG. 9 is a partial perspective view showing an electroformed state. The electroformed metal layer 6a formed on the central non-resist portion 3a.
Has the shape of a conductor. In addition, the non-resist portion 3b on both sides
The electroformed metal layer 6b formed above has a small frame shape as shown in the figure, and serves as a positioning protrusion described later.

【0016】次に図3に示すように、下面に粘着剤8を
形成した、第1の基材1とほぼ同じ幅を有する転写テー
プのような第2の基材9を電鋳金属層6の上に圧着し、
第2の基材9を各電鋳金属層6に貼りつける。そして次
に図4に示すように第2の基材9を第1の基材1から剥
がすと、レジスト層2は第1の基材1に残り、各電鋳金
属層6a,6bは粘着剤8に付着した状態で第1の基材
1から離れる。これは前述のように予め非レジスト部3
a,3bの表面に亜セレン酸等による剥離処理が施され
ているためである。
Next, as shown in FIG. 3, a second base material 9 such as a transfer tape having an adhesive 8 formed on the lower surface and having a width substantially the same as that of the first base material 1 is formed on the electroformed metal layer 6. Crimp on,
The second base material 9 is attached to each electroformed metal layer 6. Then, as shown in FIG. 4, when the second base material 9 is peeled off from the first base material 1, the resist layer 2 remains on the first base material 1 and the electroformed metal layers 6a and 6b are adhesive. It is separated from the first substrate 1 while being attached to the substrate 8. This is the non-resist portion 3 as previously described.
This is because the surface of a and 3b has been subjected to a peeling treatment with selenious acid or the like.

【0017】この転写工程により、各電鋳金属層6a,
6bは電鋳によって形成されたときの相互の位置関係を
保持したまま第2の基材9に転写される。なお、電鋳金
属層6は図4,図5に示すように、それの成長出張り部
7が第2の基材9の粘着剤8に付着し、第1の基材1と
接していた電鋳金属層6の電鋳基部10は第2の基材9
の外側を向いている。この場合粘着剤8は柔らかいの
で、導体の上部に丸味があっても接着され易い。
By this transfer process, each electroformed metal layer 6a,
6b is transferred to the second base material 9 while maintaining the mutual positional relationship when formed by electroforming. As shown in FIGS. 4 and 5, the electroformed metal layer 6 had its growth protrusion 7 adhered to the adhesive 8 of the second base material 9 and was in contact with the first base material 1. The electroformed base portion 10 of the electroformed metal layer 6 is the second base material 9
Facing out. In this case, since the pressure-sensitive adhesive 8 is soft, it is easy to adhere even if the upper portion of the conductor has roundness.

【0018】次に第2の基材9は、図5に示すように電
鋳金属層6を下にした状態でキャリアフィルムのような
第3の基材4の上方に供給される。第3の基材4として
キャリアフィルムを用いるときは図10に示すように第
2の基材9とほぼ同じ幅を有するテープ状のものを用
い、例えばポリイミドフィルムやポリエステルフィルム
からなり、それの両側端部には等ピッチにスプロケット
穴5が列設されている。また第3の基材4の中央部に
は、熱圧着型のような前記粘着剤8より接着強度の高い
接着剤11が予め塗着形成されている。
Next, the second base material 9 is supplied above the third base material 4 such as a carrier film with the electroformed metal layer 6 facing down as shown in FIG. When a carrier film is used as the third base material 4, a tape-shaped material having substantially the same width as that of the second base material 9 is used as shown in FIG. Sprocket holes 5 are arranged in rows at the end portions at equal pitches. Further, an adhesive 11 having a higher adhesive strength than the adhesive 8 such as a thermocompression-bonding type is preliminarily applied and formed on the central portion of the third base material 4.

【0019】図6に示すように第3の基材4上に前記第
2の基材9の導体が対向する向きに前記第2の基材9を
重ね、その両側端を軽く押圧部材12で押し下げると、
第2の基材9はそれの可撓性により若干下方に変形し、
両側の電鋳金属層6bの電鋳基部10が第3の基材4の
スプロケット穴5に挿入される。枠形をした電鋳金属層
6bにスプロケット穴5とほぼ同寸に設計されているか
ら、電鋳金属層6bをスプロケット穴5に挿入すること
により、第3の基材4上での電鋳金属層6aの位置決め
がなされ、電鋳金属層6aの位置決めがなされ、電鋳金
属層6bが位置決め突部として機能する。特に電鋳金属
層6bの電鋳基部10側は、レジスト層2の側面に規制
されて形成されるから、高い寸法精度を有している。そ
のため位置決め精度が良好である。なおこの位置決め時
には熱圧着型接着剤11に熱が加えられていないから粘
着性がいまだ高くなく、従って電鋳金属層6aの位置決
めには支障をきたさない。
As shown in FIG. 6, the second base material 9 is superposed on the third base material 4 in the direction in which the conductors of the second base material 9 face each other, and both side ends thereof are lightly pressed by pressing members 12. When pushed down,
The second substrate 9 is slightly deformed downward due to its flexibility,
The electroformed base portions 10 of the electroformed metal layers 6b on both sides are inserted into the sprocket holes 5 of the third base material 4. Since the frame-shaped electroformed metal layer 6b is designed to have substantially the same size as the sprocket hole 5, by inserting the electroformed metal layer 6b into the sprocket hole 5, electroforming on the third base material 4 is performed. The metal layer 6a is positioned, the electroformed metal layer 6a is positioned, and the electroformed metal layer 6b functions as a positioning protrusion. In particular, since the electroformed base layer 10 side of the electroformed metal layer 6b is regulated and formed on the side surface of the resist layer 2, it has high dimensional accuracy. Therefore, the positioning accuracy is good. Since the thermocompression-bonding adhesive 11 is not heated at the time of this positioning, the adhesiveness is not yet high, and therefore the positioning of the electroformed metal layer 6a is not hindered.

【0020】このように第3の基材4上において第2の
基材9の位置決めがなされた後、第2の基材9の中央上
部が第3の基材4側に向けて加熱圧着される。これによ
って接着剤11が軟化,溶融し、その後に冷却すること
により、導体となる電鋳金属層6aが接着剤11に接着
される。次に図7に示すように、第2の基材9を第3の
基材4から剥離する。このとき前記熱圧着型接着剤11
の方が粘着剤8よりも接着強度が強いことと、導体に相
当する電鋳金属層6の電鋳基部10側の方が成長出張り
部7側よりも平坦であることから、電鋳金属層6aは第
3の基材4上に接着,支持され、第2の基材9には位置
決め突部として機能した電鋳金属層6bのみ残る。
After the second base material 9 is positioned on the third base material 4 in this manner, the central upper portion of the second base material 9 is thermocompression bonded toward the third base material 4 side. It As a result, the adhesive 11 is softened and melted, and then cooled, so that the electroformed metal layer 6a serving as a conductor is bonded to the adhesive 11. Next, as shown in FIG. 7, the second base material 9 is peeled off from the third base material 4. At this time, the thermocompression-bonding adhesive 11
Is stronger in adhesive strength than the pressure-sensitive adhesive 8, and the electroformed base portion 10 side of the electroformed metal layer 6 corresponding to the conductor is flatter than the growth protrusion portion 7 side. The layer 6a is adhered and supported on the third base material 4, and only the electroformed metal layer 6b that functions as a positioning protrusion remains on the second base material 9.

【0021】このようにして得られた導体担持基材は、
図11に示すように巻き取られて、半導体装置の製造ラ
インに搬送,供給され、第3の基材4のスプロケット穴
5は今度は導体に相当す電鋳金属層6aを半導体素子上
に転移接続する際の位置決め穴として役立つ。
The conductor-carrying substrate thus obtained is
As shown in FIG. 11, it is wound up, conveyed and supplied to the semiconductor device manufacturing line, and the sprocket hole 5 of the third base material 4 in turn transfers the electroformed metal layer 6a corresponding to the conductor onto the semiconductor element. It serves as a positioning hole when connecting.

【0022】前記実施例では導体となる電鋳金属層6a
と、位置決め突部として機能する電鋳金属層6bとを所
定の位置関係をもつ第1の基板1上に電鋳形成し、前記
電鋳金属層6aと電鋳金属層6bとをそのまま一旦第2
の基材9に転写せしめ、その後、表面精度の高い電鋳金
属層6bの電鋳基部10と第3の基材4のスプロケット
穴5とを利用して、電鋳金属層6aのみを第3の基材4
上に転移する方法を採用した。この方法によれば、第1
の基板1上に形成された電鋳金属層6aと電鋳金属層6
bとの位置関係を、第3の基材4上のスプロケット穴5
と電鋳金属層6bとの位置関係として再現することがで
き、導体となる電鋳金属層6aを第3の基材4上の所定
位置に正確にかつ生産性良く担持せしめることができ
る。
In the above embodiment, the electroformed metal layer 6a which becomes a conductor
And an electroformed metal layer 6b functioning as a positioning projection are electroformed on the first substrate 1 having a predetermined positional relationship, and the electroformed metal layer 6a and the electroformed metal layer 6b are once formed as they are. Two
Of the electroformed metal layer 6b having high surface accuracy and the sprocket hole 5 of the third base material 4 are used to transfer only the electroformed metal layer 6a to the third base material 9. Base material 4
The method of transferring to the top was adopted. According to this method, the first
Electroformed metal layer 6a and electroformed metal layer 6 formed on the substrate 1 of
b with respect to the positional relationship with the sprocket hole 5 on the third substrate 4.
Can be reproduced as a positional relationship between the electroformed metal layer 6b and the electroformed metal layer 6b, and the electroformed metal layer 6a serving as a conductor can be accurately and productively supported at a predetermined position on the third base material 4.

【0023】前記実施例では、第3の基材4と電鋳金属
層6aの接着に熱圧着型接着剤層11を用いたが、第2
の基材1の粘着剤8よりも接着強度が高ければ、他の接
着剤あるいは粘着剤を使用することもできる。本発明で
はこれらを総称して接着剤と表現した。
In the above-mentioned embodiment, the thermocompression-bonding type adhesive layer 11 is used for bonding the third base material 4 and the electroformed metal layer 6a.
Other adhesives or pressure-sensitive adhesives can be used as long as they have higher adhesive strength than the pressure-sensitive adhesive 8 of the substrate 1. In the present invention, these are collectively referred to as an adhesive.

【0024】[0024]

【発明の効果】本発明は前述のように、半導体素子と接
続される導体6aを第1の基材1上に形成し、該導体6
aを粘着剤8付着の第2の基材9に転写し、第3の基材
4上に前記粘着剤8より接着強度の高い接着剤11を塗
着するとともに、前記第2の基材9を、前記導体6aが
第3の基材4上の接着剤11側と対向する向きに重ねて
加圧し、その後前記第2の基材9を剥離して前記導体6
aを第3の基材4に転写し、該導体6aと半導体素子と
を接続してなることを特徴とするものである。
As described above, according to the present invention, the conductor 6a connected to the semiconductor element is formed on the first base material 1, and the conductor 6a is formed.
a is transferred to the second base material 9 to which the pressure sensitive adhesive 8 is attached, and the adhesive 11 having a higher adhesive strength than the pressure sensitive adhesive 8 is applied onto the third base material 4 and the second base material 9 is also applied. Are overlapped and pressed in a direction in which the conductor 6a faces the adhesive 11 side on the third base material 4, and then the second base material 9 is peeled off to separate the conductor 6a.
a is transferred to the third base material 4, and the conductor 6a and a semiconductor element are connected to each other.

【0025】したがって本発明によれば、第2の基材9
からなるいわゆる中間転写体を用いるため、第3の基材
4を電鋳工程による汚れ等の存在する第1の基材1と直
接接触させることがなく、また第3の基材4を第1の基
材1と対向させるように反転下向きにする必要がなく、
合理的に転写作業が行える。
Therefore, according to the present invention, the second substrate 9
Since the so-called intermediate transfer member consisting of 3 is used, the third base material 4 does not come into direct contact with the first base material 1 in which dirt or the like is present in the electroforming process, and the third base material 4 is It is not necessary to invert downward so as to face the base material 1 of
Transfer work can be done reasonably.

【0026】しかも粘着剤8と接着剤11との接着力の
差により確実に転写を行うことができ、そのため第3の
基材4の取り扱い時、特に第3の基材4がフィルム状の
ものであれば巻き取り時や繰り出し時に、導体6aが第
3の基材4から脱落することがなく、生産性ならびに歩
留りの向上が図れる。
Moreover, the transfer can be surely performed due to the difference in the adhesive force between the pressure sensitive adhesive 8 and the adhesive 11, so that when the third substrate 4 is handled, especially when the third substrate 4 is in the form of a film. In this case, the conductor 6a does not drop off from the third base material 4 during winding or unwinding, and productivity and yield can be improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例に係る導体担持基材を説明する
ためのもので、製造工程の断面図でレジスト層形成工程
を示す。
FIG. 1 is a view for explaining a conductor-carrying substrate according to an embodiment of the present invention, showing a resist layer forming step in a sectional view of a manufacturing step.

【図2】本発明の実施例に係る導体担持基材を説明する
ためのもので、製造工程の断面図で電鋳工程を示す。
FIG. 2 is a view for explaining a conductor-carrying substrate according to an example of the present invention, showing an electroforming step in a sectional view of a manufacturing step.

【図3】本発明の実施例に係る導体担持基材を説明する
ためのもので、製造工程の断面図で転写工程を示す。
FIG. 3 is a view for explaining a conductor-carrying substrate according to an example of the present invention, showing a transfer step in a sectional view of a manufacturing step.

【図4】本発明の実施例に係る導体担持基材を説明する
ためのもので、製造工程の断面図で剥離工程を示す。
FIG. 4 is a view for explaining a conductor-carrying substrate according to an example of the present invention, showing a peeling step in a cross-sectional view of a manufacturing step.

【図5】本発明の実施例に係る導体担持基材を説明する
ためのもので、製造工程の断面図で再転写工程を示す。
FIG. 5 is a view for explaining a conductor-carrying substrate according to an example of the present invention, and shows a retransfer step in a cross-sectional view of a manufacturing step.

【図6】本発明の実施例に係る導体担持基材を説明する
ためのもので、製造工程の断面図で圧着工程を示す。
FIG. 6 is a view for explaining a conductor-carrying substrate according to an example of the present invention, showing a pressure bonding step in a cross-sectional view of the manufacturing process.

【図7】本発明の実施例に係る導体担持基材を説明する
ためのもので、製造工程の断面図で剥離工程を示す。
FIG. 7 is a view for explaining a conductor-carrying substrate according to an example of the present invention, showing a peeling step in a cross-sectional view of a manufacturing step.

【図8】電鋳金属層の拡大断面図である。FIG. 8 is an enlarged sectional view of an electroformed metal layer.

【図9】電鋳の状態を示す一部斜視図である。FIG. 9 is a partial perspective view showing a state of electroforming.

【図10】第3の基材の平面図である。FIG. 10 is a plan view of a third base material.

【図11】本発明の実施例に係る導体担持基材を説明す
るためのもので、導体担持基材の巻回体の側面図であ
る。
FIG. 11 is a side view of a wound body of the conductor-carrying substrate, for explaining the conductor-carrying substrate according to the embodiment of the invention.

【図12】従来の導体担持基材の製造工程を示す断面図
である。
FIG. 12 is a cross-sectional view showing a manufacturing process of a conventional conductor carrying base material.

【図13】この導体担持基材の巻回体の側面図である。FIG. 13 is a side view of a wound body of this conductor carrying base material.

【符号の説明】[Explanation of symbols]

1 第1の基材 4 第3の基材 6a 導体(電鋳金属層) 6b 電鋳金属層 8 粘着剤 9 第2の基材 11 接着剤 1 1st base material 4 3rd base material 6a Conductor (electroformed metal layer) 6b Electroformed metal layer 8 Adhesive 9 Second base material 11 Adhesive

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 半導体素子と接続される導体6aを第1
の基材1上に形成し、 該導体6aを粘着剤8付着の第2の基材9に転写し、 第3の基材4上に前記粘着剤8より接着強度の高い接着
剤11を塗着するとともに、前記第2の基材9を、前記
導体6aが第3の基材4上の接着剤11側と対向する向
きに重ねて加圧し、 その後前記第2の基材9を剥離して前記導体6aを第3
の基材4に転写し、 該導体6aと半導体素子とを接続してなる半導体装置の
製造方法。
1. A first conductor 6a connected to a semiconductor element is provided.
Is formed on the base material 1, and the conductor 6a is transferred to the second base material 9 to which the adhesive 8 is attached, and the adhesive 11 having higher adhesive strength than the adhesive 8 is applied on the third base material 4. The second base material 9 is overlapped and pressed in the direction in which the conductor 6a faces the adhesive 11 side on the third base material 4, and then the second base material 9 is peeled off. The conductor 6a to the third
A method of manufacturing a semiconductor device, which comprises transferring the conductor 6a to a semiconductor element and transferring the conductor 6a to the substrate 4.
JP26819592A 1992-09-09 1992-09-09 Method for manufacturing semiconductor device Expired - Lifetime JPH0680700B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26819592A JPH0680700B2 (en) 1992-09-09 1992-09-09 Method for manufacturing semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26819592A JPH0680700B2 (en) 1992-09-09 1992-09-09 Method for manufacturing semiconductor device

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP19773785A Division JPH069216B2 (en) 1985-09-09 1985-09-09 Lead carrier film

Publications (2)

Publication Number Publication Date
JPH05218132A JPH05218132A (en) 1993-08-27
JPH0680700B2 true JPH0680700B2 (en) 1994-10-12

Family

ID=17455245

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26819592A Expired - Lifetime JPH0680700B2 (en) 1992-09-09 1992-09-09 Method for manufacturing semiconductor device

Country Status (1)

Country Link
JP (1) JPH0680700B2 (en)

Also Published As

Publication number Publication date
JPH05218132A (en) 1993-08-27

Similar Documents

Publication Publication Date Title
US20050208788A1 (en) Electrical connector in a flexible host
JP4052915B2 (en) Circuit device manufacturing method
KR20010021029A (en) Semiconductor device and process for manufacturing the same, liquid crystal module and process for mounting the same
JPH0680700B2 (en) Method for manufacturing semiconductor device
JPH069216B2 (en) Lead carrier film
JP2003209342A (en) Wiring board manufacturing method and wiring board
JPS63164327A (en) Manufacture of film carrier with bump
JPS61234060A (en) Manufacture of lead frame of semiconductor device
JPS61240511A (en) Manufacture of anisotropic conducting adhesive sheet
JP4073294B2 (en) Circuit device manufacturing method
JP2509882B2 (en) Method for manufacturing semiconductor device
KR20030027757A (en) Film substrate, semiconductor device, method of manufacturing film substrate, and method of manufacturing circuit board having semiconductor device
JP2822630B2 (en) Method of forming bump electrode on semiconductor device
JPS62183534A (en) Manufacture of lead carrier film
JP2752852B2 (en) Method for manufacturing TAB tape carrier
JP3936060B2 (en) Manufacturing method of grid array
JP3021508B2 (en) Method of forming conductive protrusions
JP2879159B2 (en) Method of forming electrical connection member and metal bump
JPS62241345A (en) Manufacture of film carrier with bump
JP2004061197A (en) Wiring board for electrical connection
JPS5917978B2 (en) Manufacturing method of semiconductor device
JPH031834B2 (en)
JP2005085838A (en) Electrical connection member and manufacturing method thereof
JPH0577936U (en) Semiconductor element
JP2004281161A (en) Adhesive connector and manufacturing method thereof

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term