JPH068532Y2 - High temperature test jig - Google Patents

High temperature test jig

Info

Publication number
JPH068532Y2
JPH068532Y2 JP1988011868U JP1186888U JPH068532Y2 JP H068532 Y2 JPH068532 Y2 JP H068532Y2 JP 1988011868 U JP1988011868 U JP 1988011868U JP 1186888 U JP1186888 U JP 1186888U JP H068532 Y2 JPH068532 Y2 JP H068532Y2
Authority
JP
Japan
Prior art keywords
jig
test
high temperature
holding
test piece
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988011868U
Other languages
Japanese (ja)
Other versions
JPH01118342U (en
Inventor
進 高野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP1988011868U priority Critical patent/JPH068532Y2/en
Publication of JPH01118342U publication Critical patent/JPH01118342U/ja
Application granted granted Critical
Publication of JPH068532Y2 publication Critical patent/JPH068532Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【考案の詳細な説明】 A.産業上の利用分野 本考案は、セラミックスなどの試験片を高温炉にて加熱
しつつ負荷する材料試験機における高温用試験治具に関
する。
Detailed Description of the Invention A. BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test jig for high temperature in a material testing machine that loads a test piece such as ceramics in a high temperature furnace while loading it.

B.従来の技術 この種の高温試験では、試験片を1500〜1600℃
に加熱するのでセラミックス製の高温用試験治具を用い
て試験片を保持している。例えば、特開昭60−120
231号公報には、試験機側に連結されるセラミックス
製の支持台と、この上に着脱可能に設けられるセラミッ
クス製の支持治具とから成る2分割曲げ試験用治具が開
示されている。
B. 2. Description of the Related Art In this kind of high temperature test, a test piece is heated to 1500 to 1600 ° C.
Since it is heated to 1, the test piece is held using a high temperature test jig made of ceramics. For example, JP-A-60-120
Japanese Patent No. 231 discloses a two-division bending test jig including a ceramic support base connected to the testing machine side and a ceramic support jig detachably provided on the support base.

あるいは、引張り試験治具として、試験片を把持するセ
ラミックス製のホルダと、このホルダを試験機側に連結
するセラミックス製のピンとから成るものが知られてい
る。
Alternatively, as a tensile test jig, there is known a jig including a holder made of ceramics for holding a test piece and a pin made of ceramics for connecting the holder to the tester side.

C.考案が解決しようとする問題点 しかしながら、大気中はもちろん、N,Arなどの不
活性ガス中においても微量のOが存在するため、セラ
ミックス、例えばSiCセラミックスは高温下で酸化さ
れてその表面にSiO(シリカ)が生成され、支持台
と支点治具とが接合してしまい、保持台が取り外せなく
なる。また同様に、ホルダとピンとが接合してしまい、
ユニバーサルジョイントの機能を果たさなくなるおそれ
がある。
C. Problems to be Solved by the Invention However, since a trace amount of O 2 exists not only in the atmosphere but also in an inert gas such as N 2 or Ar, ceramics such as SiC ceramics are oxidized at a high temperature and their surface SiO 2 (silica) is generated on the substrate, and the supporting base and the fulcrum jig are bonded to each other, and the holding base cannot be removed. Similarly, the holder and the pin are joined together,
The function of the universal joint may not be fulfilled.

本考案の目的は、高温試験時に試験片取付け用の治具を
構成する2つの部材が互いに接合しないように改良した
高温用試験治具を提供することにある。
An object of the present invention is to provide a high temperature test jig which is improved so that two members constituting a jig for mounting a test piece are not joined to each other during a high temperature test.

D.問題点を解決するための手段 本考案に係る高温用試験治具は、試験片を保持するセラ
ミックス製の保持部材と、この保持部材を試験機に接続
するセラミックス製の接続部材とを備えて成り、更に両
部材の接触面にカーボン製の分離部材を介在させことに
より、上述の問題点を解決する。
D. Means for Solving Problems A high temperature test jig according to the present invention comprises a ceramic holding member for holding a test piece and a ceramic connecting member for connecting the holding member to a testing machine. Further, by interposing a carbon separation member on the contact surface of both members, the above-mentioned problems are solved.

E.作用 加熱試験時に分離部材が介在されるので両部材の接合が
防止され、試験後の両部材の分離が容易となる。また、
試験時に両部材は互いに摺動し得るので、所望の機能が
損なわれない。
E. Action Since the separating member is interposed during the heating test, the joining of the both members is prevented, and the separating of the both members after the test becomes easy. Also,
During the test, both parts can slide on each other so that the desired function is not impaired.

F.実施例 第1図および第2図により一実施例を説明する。F. Embodiment An embodiment will be described with reference to FIGS. 1 and 2.

第2図において、試験片TPは高温炉1内に収容されて
いる。この装置はポンチ2によって5つの試験片TPに
曲げ荷重を加え、各試験片TPを連続的に曲げ試験する
ようにしたもので、5つの支持台3に設けられた5つの
曲げ支持治具4を有する。支持台3および支持治具4は
ともにSiCセラミックスから成る。各支点治具4はそ
れぞれ一対の曲げ支点5をもち、各試験片TPは各支点
治具4の曲げ支点5間にかけ渡され、保持されている。
曲げ支点5もSiCセラミックスから成る。第1図に示
すように、曲げ支点治具4と支持台3は互いに分離さ
れ、支持治具4は支持台3の溝6に取外し可能に嵌め込
まれ、組み合わされている。各支持台3も互いに分離さ
れ、順次隣接して接触するよう配列されている。各支点
治具4も互いに分離されている。ここで、支点治具4と
支持台3との間、および曲げ支点5と支持治具4との間
には、それぞれカーボンパウダ7が介在されている。
In FIG. 2, the test piece TP is housed in the high temperature furnace 1. This device applies a bending load to the five test pieces TP by the punch 2 to continuously bend-test each test piece TP. Five bending support jigs 4 provided on five support bases 3 are provided. Have. Both the support base 3 and the support jig 4 are made of SiC ceramics. Each fulcrum jig 4 has a pair of bending fulcrums 5, and each test piece TP is bridged and held between the bending fulcrums 5 of each fulcrum jig 4.
The bending fulcrum 5 is also made of SiC ceramics. As shown in FIG. 1, the bending fulcrum jig 4 and the support base 3 are separated from each other, and the support jig 4 is detachably fitted into the groove 6 of the support base 3 to be assembled. The support bases 3 are also separated from each other, and are arranged so as to be adjacent to and in contact with each other. Each fulcrum jig 4 is also separated from each other. Here, carbon powder 7 is interposed between the fulcrum jig 4 and the support base 3, and between the bending fulcrum 5 and the support jig 4, respectively.

ポンチ2はピン7によって負荷ロッド8に連結され、負
荷ロッド8はロードセル9を介してクロスヘッド10に
連結され、支持されている。各支持台3は移動台11の
保持具12によって保持され、断熱材から成るガイド1
3によって横方向に移動方向に案内されている。さら
に、ハンドル14を有する送りねじ15が横方向に配設
されて移動台11に螺合し、両端がテーブル16に軸支
されている。
The punch 2 is connected to a load rod 8 by a pin 7, and the load rod 8 is connected to and supported by a crosshead 10 via a load cell 9. Each support base 3 is held by a holder 12 of a moving base 11, and is a guide 1 made of a heat insulating material.
3 is guided laterally in the direction of movement. Further, a feed screw 15 having a handle 14 is laterally arranged and screwed into the moving base 11, and both ends are pivotally supported by the table 16.

このように構成された装置において、試験片TPは高温
炉1によって予め定められた設定温度(例えば1500
0℃〜1600℃)まで加熱される。その後、クロスヘ
ッド10を下降させて負荷ロッド8、ロードセル9およ
びクロスヘッド10と一体的にポンチ2を下降する。し
たがって、ポンチ2が試験片TPを押圧し、試験片TP
に曲げ荷重が加えられる。曲げ支点5および支持治具4
は曲げ荷重の反力を受け、試験片TPは曲げ支点5間で
変形する。したがって、試験片TPを高温曲げ試験する
ことができる。
In the apparatus configured as described above, the test piece TP has a preset temperature (for example, 1500) set by the high temperature furnace 1.
It is heated to 0 ° C to 1600 ° C). Then, the crosshead 10 is lowered to lower the punch 2 integrally with the load rod 8, the load cell 9 and the crosshead 10. Therefore, the punch 2 presses the test piece TP,
A bending load is applied to. Bending fulcrum 5 and support jig 4
Receives the reaction force of the bending load, and the test piece TP deforms between the bending fulcrums 5. Therefore, the test piece TP can be subjected to a high temperature bending test.

このような高温試験に際して、高温炉1の雰囲気ガス中
のOにより、SiCセラミックス製の支持台3、支点
治具4および曲げ支点5の表面にはSiO(シリカ)
が生成され、従来のように各部材を直接に接触させると
両部材が互いに接合して取り外せなくなるが、この実施
例のように、カーボンパウダ7を介在させると、例えば
大気中では加熱によりカーボンパウダ7が燃焼しそのカ
スが両部材間に残り接合が防止される。このため、損傷
した支持治具4や曲げ支点の交換作業が容易となる。な
お、真空中や不活性ガス中ではカーボンパウダ7はその
まま残り、接合が防止される。
In such a high temperature test, O 2 in the atmosphere gas of the high temperature furnace 1 was used to form SiO 2 (silica) on the surfaces of the SiC ceramic support base 3, fulcrum jig 4 and bending fulcrum 5.
When both members are brought into direct contact with each other as in the conventional case, both members are joined to each other and cannot be removed. However, when the carbon powder 7 is interposed as in this embodiment, the carbon powder is heated by heating in the atmosphere, for example. 7 burns and the residue remains between both members to prevent joining. Therefore, replacement work of the damaged support jig 4 and the bending fulcrum is facilitated. Note that the carbon powder 7 remains as it is in a vacuum or in an inert gas to prevent bonding.

試験片TPの試験が完了した後、ハンドル14によって
送りねじ15を回転操作すると、そのねじ送り作用によ
って移動台11が移動する。各支点治具4は支持台3、
保持具12および移動台11と一体的に移動する。した
がって、各試験片TPを順次交互にポンチ2と対向させ
ることができ、連続して曲げ試験することができる。
When the feed screw 15 is rotated by the handle 14 after the test of the test piece TP is completed, the moving base 11 is moved by the screw feeding action. Each fulcrum jig 4 is a support base 3,
It moves integrally with the holder 12 and the movable table 11. Therefore, the test pieces TP can be alternately opposed to the punch 2 and the bending test can be continuously performed.

なお、カーボンパウダに代え、カーボン繊維を短くカッ
トして成るカーボントウ、カーボンフエルト、カーボン
ペーパーなどを用いることができ、更に各部材の接触面
にカーボンを溶射してカーボンコーティングを形成して
もよい。
Instead of carbon powder, carbon tow, carbon felt, carbon paper, etc. formed by cutting carbon fibers into short pieces can be used, and carbon may be sprayed on the contact surface of each member to form a carbon coating. .

また、3点曲げ試験用の治具を示したが、第3図に示す
ように、上下プルロッド21,22にSiCセラミック
ス製のピン23を介してSiCセラミックス製の上下ホ
ルダ24,25を連結し、ホルダ24,25間に試験片
TPをピン結合して保持するような引張試験用治具にも
本考案を適用でき、この場合、ピン23とホルダ24,
25との接触面、ピン23とプルロッド21,22との
接触面にカーボンパウダ等の分離部材26を介在させれ
ばよい。この構成によれば、加熱時にピン23がホルダ
24,25に接合せず、ピン23によるユニバーサルジ
ョイン機能が保たれる。
Although a jig for a three-point bending test is shown, as shown in FIG. 3, upper and lower pull rods 21 and 22 are connected to upper and lower holders 24 and 25 made of SiC ceramics via pins 23 made of SiC ceramics. The present invention can also be applied to a jig for tensile test in which a test piece TP is pin-bonded and held between the holders 24 and 25. In this case, the pin 23 and the holder 24,
A separating member 26 such as carbon powder may be interposed between the contact surface with 25 and the contact surface between the pin 23 and the pull rods 21, 22. According to this configuration, the pin 23 is not joined to the holders 24 and 25 during heating, and the universal join function of the pin 23 is maintained.

すなわち、本考案は、試験片TPを保持するホルダと、
このホルダを材料試験機に接続しいずれかの面がホルダ
と接触する接続部材とを有し、いずれもセラミックスで
形成される各種試験用治具に適用できる。また、SiC
セラミックスに限らず、高温下でセラミックス同志が接
合するものであればいずれのセラミックスにて作製され
る部材についても本考案を適用し得る。
That is, the present invention comprises a holder for holding the test piece TP,
The holder is connected to a material testing machine and has a connecting member whose one surface is in contact with the holder, and can be applied to various test jigs made of ceramics. In addition, SiC
The present invention is not limited to ceramics, and the present invention can be applied to any member made of ceramics as long as the ceramics can be joined at high temperature.

G.考案の効果 本考案によれば、高温用試験治具を構成するセラミック
ス製の2部材間にカーボンから成る分離部材を介在させ
たので、高温試験時に両部材が接合せず、両部材の分
離、あるいは摺動が可能となる。この結果、試験後の分
離作業が不要となり、また試験時に所望の機能が損われ
るのが防止される。
G. Effect of the Invention According to the present invention, since the separating member made of carbon is interposed between the two ceramic members constituting the high temperature test jig, the two members are not joined at the time of the high temperature test, and the two members are separated from each other. Alternatively, sliding is possible. As a result, the separation work after the test becomes unnecessary, and the desired function is prevented from being impaired during the test.

【図面の簡単な説明】[Brief description of drawings]

第1図および第2図は多連式3点曲げ試験用の治具に本
考案を実施した場合の一実施例を説明するもので、第1
図が2分割治具の正面図、第2図はその治具とともに示
す材料試験機の側面図である。 第3図は引張試験に本考案を実施した場合の他の実施例
を示す治具の一部破断面図である。 1:高温炉、2:ポンチ 3:支持台、4:支持治具 5:曲げ支点、7:カーボンパウダ
FIG. 1 and FIG. 2 explain an embodiment in which the present invention is applied to a jig for a multiple type three-point bending test.
FIG. 2 is a front view of the two-division jig, and FIG. 2 is a side view of the material testing machine shown together with the jig. FIG. 3 is a partially broken sectional view of a jig showing another embodiment in which the present invention is applied to a tensile test. 1: High temperature furnace, 2: Punch 3: Support stand, 4: Support jig 5: Bending fulcrum, 7: Carbon powder

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】高温炉内で材料試験機により負荷される試
験片を保持する高温用試験治具において、前記試験片が
把持または載置されて保持されるセラミックス製の保持
部材と、この保持部材を前記材料試験機に接続するセラ
ミックス製の接続部材と、この両部材の接触面に介在さ
れ、加熱時にこれら両部材が接合するのを防止するカー
ボン製の分離部材とを備えることを特徴とする高温用試
験治具。
1. A high-temperature test jig for holding a test piece loaded by a material testing machine in a high-temperature furnace, and a holding member made of ceramics for holding and holding the test piece, and the holding member. A ceramic connecting member for connecting a member to the material testing machine, and a carbon-made separating member interposed between the contact surfaces of the both members to prevent the two members from being joined to each other during heating. High temperature test jig.
JP1988011868U 1988-01-30 1988-01-30 High temperature test jig Expired - Lifetime JPH068532Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988011868U JPH068532Y2 (en) 1988-01-30 1988-01-30 High temperature test jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988011868U JPH068532Y2 (en) 1988-01-30 1988-01-30 High temperature test jig

Publications (2)

Publication Number Publication Date
JPH01118342U JPH01118342U (en) 1989-08-10
JPH068532Y2 true JPH068532Y2 (en) 1994-03-02

Family

ID=31220799

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988011868U Expired - Lifetime JPH068532Y2 (en) 1988-01-30 1988-01-30 High temperature test jig

Country Status (1)

Country Link
JP (1) JPH068532Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021021305A (en) * 2019-07-30 2021-02-18 太平洋マテリアル株式会社 Test backing plate for performance evaluation of large floor tile sticking method and test method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54102186A (en) * 1978-01-30 1979-08-11 Nippon Electrode Kk Material tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021021305A (en) * 2019-07-30 2021-02-18 太平洋マテリアル株式会社 Test backing plate for performance evaluation of large floor tile sticking method and test method

Also Published As

Publication number Publication date
JPH01118342U (en) 1989-08-10

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