JPH0712946Y2 - IC test equipment - Google Patents

Description

[Detailed description of the device] "Industrial application field" This device supplies an IC element to a slanted rail,
The IC element is transported by its own weight drop, and a stopper is provided in the passage of the IC element in the middle of the inclined rail so that it can move in and out.
The present invention relates to an IC test device capable of temporarily stopping the transportation of elements.

"Prior Art" Fig. 4 shows the flow of IC elements in an IC tester. That is, the IC element (not shown) supplied from the supply magazine 11 is conveyed on the inclined rail 12 by its own weight drop and enters the constant temperature bath 13 to reach the test temperature.
The IC element is sent to the measuring unit 14 by its own weight with the IC element
Various measurements (tests) are performed on the element, and the IC element that has completed the measurement exits the thermostatic chamber 13 by its own weight, is changed in the direction of movement by the direction changing section 15 and is sent to the inclined rail 16 for buffer. It reaches the sorter 17 by passing through 16 by its own weight, and the sorter 17 is different from the storage magazine 18 according to the measurement result.
IC elements are distributed and supplied. Since the sorter 17 moves in the direction in which the plurality of storage magazines 18 are arranged, when the IC elements are supplied to the sorter 17, the inclined rails 16 for buffer having the IC elements are provided.
It is necessary to suspend the IC element by the buffer slant rail 16 until the and the sorter 17 coincide with each other.

Therefore, as shown in FIG. 5, the stopper 19 is projected from the bottom surface of the buffer inclined rail 16 by the control of the stopper cylinder 21, and the IC element 22 is received by the stopper 19 to be temporarily stopped. The stopper 19 is retracted in the state where they are matched with each other, and the IC element 22 is dropped and moved to the sorter 17 by its own weight.

When the IC element 22 is temporarily stopped by the stopper 19 as described above, even if the stopper 19 is retracted, the IC element 22 may not drop by its own weight depending on the type of the IC element 22. Further, in a low temperature environment test in which the temperature inside the constant temperature tank 13 is low, the IC element 22 coming out of the constant temperature tank 13 is suddenly warmed up, water droplets may be attached to the IC element 22, and the IC element 22 may not smoothly flow on the inclined rail. . Therefore, air is blown from the air nozzle 23 to the IC element 22 to move the temporarily stopped IC element 22 or to remove water droplets attached to the IC element 22.

“Problems to be solved by the device” When the IC element 22 is transported by its own weight, the roof 24 facing the sliding surface of the inclined rail 16 is provided to prevent the IC element 22 from protruding from the inclined rail. The IC element 22 is guided from above and below by the roof 24.
Since the shape of the package and pins differ depending on the type of IC element 22, the inclined rail 16 and roof 24 depend on the type of IC element 22.
Are replacing. For example, Figure 6A shows a ZIP package IC.
6 shows the inclined rail 16 and the roof 24 with respect to the element 22,
Figure B shows the tilted rail 16 for the IC device 22 in the DIP package.
And roof 24 are shown. In order to replace and use the inclined rail 16 and the roof 24 suitable for the type of the IC element 22 to be measured in this way, the air nozzle 23 is attached to the fixed portion on the side of the roof 24 that does not need to be replaced, and the rail 16 and the roof 24. It was placed so that it would not interfere with the exchange of the. For this reason the air nozzle 23
Of air will be blown onto the IC element 22 from diagonally above,
That is, the air cannot be blown from the one end side to the center line along the rail of the package of the IC element 22, and the air cannot be blown efficiently. Further, since the air nozzle 23 is fixed, the air blowing efficiency may be extremely deteriorated depending on the package shape and size of the IC element 22.

[Means for Solving the Problems] According to the present invention, a blow-out port capable of blowing air in a direction along the inclined rail is formed at the protruding end of the stopper that can move in and out of the inclined rail. One end of the tube connected to the outlet is attached to a stopper, the other end of the tube is connected to an air source, and a valve whose opening and closing is controlled by a control signal is inserted in the middle of the tube.

Therefore, by blowing air from the outlet of the stopper, the air is blown to one end of the center line along the rail of the IC element package, and the air is efficiently discharged regardless of the type of IC element. Can be sprayed on the IC element.

[Embodiment] FIG. 1 shows the essential part of an embodiment of the present invention. This embodiment is applied to the inclined rail part for the buffer in the front stage of the sorter in the IC tester, and is the same as the part corresponding to FIG. It is marked. In this example, a similar stopper 25 is provided on the upstream side of the stopper 19 so as to be able to move in and out of the IC element passage from the bottom surface of the inclined rail 16, and the stopper 25 is controlled to move in and out by a stopper cylinder 26. As shown in FIG. 2, the stopper cylinder 25 is attached to a shaft 27 of the stopper 25. The shaft 27 moves up and down in the axial direction under the control of the cylinder 26. It has a detent to prevent it from being released. Inclined rail on the protruding end of stopper 25
An outlet 28 is formed so that air can be blown in the direction along 16. The inner end of the outlet 28 is connected to the upper end of an air passage 29 formed at the axial center position of the stopper 25. The lower end of the air passage 29 is connected to the horizontal hole 31, and further connected to the horizontal hole 31 so that the air joint 32 is attached to the stopper 25. One end of the tube 33 is connected to the air joint 32. The other end of the tube 33 is connected to an air source 34 such as an air pump as shown in FIG. The solenoid valve 35 is inserted in the middle of the tube 33. In this example, the outlet 28 is parallel to the inclined rail 16 and faces the downstream direction.

In this configuration, when supplying the IC element 22 stopped by the stopper 19 to the sorter (not shown),
19 is retracted and the solenoid valve 35 is opened by a control signal, so that the air from the air source 34 passes through the tube 33, further passes through the stopper 25, and the air is blown from its outlet 28 to the IC element 22 from its rear side. The IC element 22 slides smoothly and is sent to the sorter. Further, when removing the water droplets attached to the IC element 22, the air from the air source 34 may be blown from the outlet 28 to the IC element 22 stopped by the stopper 19. When removing water droplets in this way, the outlet 28 may be directed to the upstream side, and air may be blown to the IC element from a stopper that temporarily stops the IC element.

Although the stopper is projected from the bottom surface of the rail in the above description, the present invention can be applied to the case where the stopper is projected from the side surface. The air blown from the outlet 28 may be warm or dried.

[Advantage of Device] As described above, according to this device, since the outlet 28 for blowing air in the direction along the inclined rail is provided at the end of the stopper, as shown in FIGS. 3A and 3B, for example. Regardless of the type of IC element 22, the inclined rail 16 of the package of IC element 22 is always
Air can be blown near one end of the center line in the direction along, and when moving the IC element caught on the rail,
Even when removing water droplets from the IC element 22, the blown air acts efficiently. Although the tube 33 is attached to the stopper 25, the length of the stopper 25 coming in and out is only about 5 mm, and the tube 33 may have a slight slack.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a side view showing an essential part of an embodiment of the present invention, FIG. 2 is a sectional view of a stopper 25 thereof, and FIGS. 3A and 3B are IC elements in a suspended state, respectively. FIG. 4 is a diagram showing an example of the relationship with the outlet 28 of the stopper, FIG. 4 is a diagram showing an outline of the IC testing device, FIG. 5 is a side view showing the vicinity of the buffer slant rail 16 in the conventional device, FIG. 6A, B is the IC that is temporarily stopped in the conventional device
FIG. 6 is a diagram showing a relationship between elements and an air nozzle 23.

Claims (1)

[Scope of utility model registration request] 1. An IC element is supplied to an inclined rail,
The IC element is transported by its own weight drop, and a stopper is provided in the path of the IC element in the middle of the inclined rail so that it can move in and out.
In an IC test device that can temporarily stop the transportation of IC elements, an outlet that can blow out air in the direction along the inclined rail is formed at the protruding end of the stopper, and the outlet is connected to the outlet. One end of the tube is attached to the stopper, the other end of the tube is connected to an air source, and a valve whose opening and closing is controlled by a control signal is inserted into the tube.