JPH07129476A - Tester of storage body - Google Patents

Abstract

PURPOSE: To reduce the waste of a memory by applying a new memory inspector in a memory module. CONSTITUTION: The memory inspector 50 is composed of one parity checker 51, one or a few bit storages 52 and one parity generator 53. Then, materials and parity values directly written into the memory module are checked by the parity checker 51 inside the memory module and when it is found out that the setting relation of check agreement is not matched, one bit value of recording error is generated. Further, when the system reads the materials for check, that provided parity generator 53 is directly controlled and one anti-agreement output parity signal is generated. After that signal error is detected by the parity checker 51 in the system, one interrupting signal is generated and applied to the system and the system immediately detects the erroneous state of materials in the module integrated with memory.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention mainly relates to a memory device inspecting whether or not reading and writing of inspection data is accurate in a computer memory type memory module. The present invention relates to the one which can evaluate a memory body inspector for reading or writing accurate data in a memory modular effectively by occupying an extremely small amount of memory.

[0002]

2. Description of the Related Art In a general computer system, for example, shown in FIG. 1, the system 10 and the memory module 20 are normally used to check whether the data of the memory module 20 is accurate. An isotope generator 30 (Parity generator) and an isotope assessor 40 (Parity checker) are provided between them, and a computer is used to check the agreement between the even parity and the odd parity (Odd parity). Checking proto
col) is adopted, the isotope generator 3 when the merged stream 31 (Input data bus) of the input data is written into the memory modular 20 in the system.
0 generates one input parity bit 32 as a result of the inspection of the material merge and discharge sequence 31. The isotope 32 signal and the input data merging / discharging column 31 are simultaneously controlled by the address designated by the address merging / discharging column 11 and the control of the read / write control signal 12 (R / W control sygnal) at the same time, respectively, at the same address in the memory module. It is stored in the set memory body 21 and the inspection position set memory body 22.

As can be seen from the traditional railroad frame design of the memory module 20 as shown in FIG.
Such a memory unit modular has, at the same address, a memory unit 21 of a general 8th source material source set as an example.
In addition to the data memory of the source, the number of inspection source set memory 22 of one source is increased in addition to the number of employees, and the input isotope 32 generated by the isotope generator (Parity generator) 30 is stored. To do. In addition, since the input data merging / discharging sequence 31 of each set is all accompanied by one input isotope 32, the memory module of the general tradition is composed of 8th element or 16th element or 32nd element Regardless of whether the modular 20 is stored or not, in reality,
Be sure to use the same memory with 9 or 17 or 33 or more addresses.

From this, it can be inferred that, from the viewpoint of a memory module having a memory capacity of 16 megabytes, a 16 megabyte memory that is effectively used as a data source set save and retrieve. Besides the body, 16 megabits (me
ga bit) memory capacity is required. The memory capacity of 16 megabits is completely reserved there and used for storing the isotope signal 32. Therefore, in terms of a memory module having a larger capacity, the isotope value is clearly visible. The number of inspection source memory bodies 22 out of the number required for storing and leaving 32 becomes larger and larger.

In addition, in the general computer system, when the system 10 once inspects the material from the memory module 20, the material module set memory body 21 and the inspection module set of the memory module 20 are read. The memory body 22 is composed of the address merge / deliver queue 11 and the R / W control signal 12 transmitted from the system 10.
In accordance with the instruction and control described above, the material stored in the material source set memory body 21 in the memory body modular unit 20 is read from the system 10. At this time, the material in the material source set memory body 21 and the isotope value stored and left in the inspection material set memory body 22 are simultaneously sent to the isotope inspector 40 and inspected by the inspector. If the same address is read from the data merge / arrangement 41, the unit set 41 and the output parity bit 42 (Output parity bit) of each set match the setting relationship of the inspection agreement. Is a miss, one interrupt signal 43 (Interrupt signal) is generated and given to the system 10, and the system is notified of the result of the test error.

As can be seen from the above, whether or not the material stored in the material source set memory body 21 for inspecting the memory body modular 20 by the traditional memory body inspection method is accurate is inevitably read after that at the same address. First, when the isotope inspector 40 is inspected, a mistake is found, and an interruption signal is generated and input to the system to inform the system of the accuracy of the data. Therefore, in terms of such a reaction pattern of mistakes, the traditional memory module itself does not have any other means for checking mistakes, and the mistakes are made to the system when the data is output immediately. Without the ability to react, the system, on the other hand, gets the news of the mistake, but only the next time it reviews the same address material, it can only know. Therefore, such a traditional memory modular 20 is clearly slow and inefficient with respect to the response of the material to the system.

[0007]

The main object of the present invention is to:
The demand for storage capacity can be greatly improved,
In addition, in the process of reading the data with the system, it is possible to immediately respond to the error signal that has been inspected to the system to promptly test the system to quickly and quickly store the data with the possibly missing data in the memory module. It is to provide a memory body inspection device that can perform.

Another object of the present invention is to preliminarily reserve one inspection source set memory body at the same address as the data source source set memory body like a traditional memory body modular, and to inspect them for the first time. It is not necessary to say that it is possible to inspect whether the data in the same address material in the source set memory body matches the setting relationship of the inspection agreement by the isotope value stored in the source set memory body. To provide.

Another object of the present invention is not only to effectively and significantly reduce the memory capacity in the memory module, but also to have the traditional memory module having the same set memory capacity. In comparison with the above, the present invention is also to provide a memory body tester in which the capacity of the entire memory body is saved in a large amount and the cost of the entire memory body can be reduced.

Still another object of the present invention is to effectively and quickly find out the address data in the memory module when the computer system is used to read the data from the memory module each time. It is possible to inspect any mistakes that may occur during the writing process of the memory, and, like the traditional memory module, the isotope value in the rank set memory body in the module can be tested through a simple test. Then, we provide a kind of new type memory device tester which does not mean to check whether there is a mistake in the stored data in the source data set memory body of the same address, so that you can see it here. To
The present invention surely and effectively reacts once in advance to possible material error states in the whole memory module, and only one by one like the traditional memory module, and is limited to the material error status of the address corresponding to the position set. There is nothing to do.

[0011]

In view of this, the inventor has researched and developed a kind of new type memory tester, and the memory tester according to the present invention includes one isotope evaluator, one or a few. It is composed of a storage unit and an isotope generator.

The isotope assessor merges and arranges the isotope input signal generated by the isotope generator of the computer and the data written in by the system, and the two data signals under the inspection agreement do not meet the relationship set by the agreement. If not, under the control of the read / write control signal, a signal representing that the value of one of the setting agreements of the assessment agreement does not match is generated, and that value is output to the source saver. To do.

The source storage unit receives the source value generated by the isotope assessor, receives the read / write control signal transmitted from the system, and stores the source value from the isotope assessor. It controls reading from the reservoir or from within the reservoir to the isotope generator and at the same time clears its elemental value in the reservoir.

As the isotope element generation value, the read / write control signal transmitted from the system is received and controlled, and the element value read out from the element store and the material confluence sequence read out from the memory model set. By receiving, by the relation set by the assessment agreement, one unit value is generated and output to reach the system isotope assessor, and the relation set by the system isotope assessor and the assessment agreement is set. By this, the error state of the material read from the memory model set is inspected, and one interruption signal is generated and output to the system.

[0015]

[Function] The isotope assessor in the memory module assesses the data and isotope values written directly in the memory module, and when it is found that the setting relationship of the assessment agreement is not met, one recording error Generates a threshold value, so that when the system reads the data, it directly controls the provided isotope generator, generates an output isotope signal that violates one agreement, and the rank assessor in the system. After detecting the signal error by, the one interrupt signal is generated and given to the system, so that the system immediately detects the error condition of the data in the memory module.

[0016]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention is a kind of new type memory body inspection device, which is used to set the relation of even parity checking protocol generally adopted here, and to execute the computer system of R / W processing. As one concrete example of the invention, it will be described in detail below.

First, referring to FIG. 1, the computer system of the commonly adopted even isotope inspection agreement is that the data is stored in the memory modular unit 20 rather than the system 10.
, The system directly and simultaneously inputs the data merge / disconnect sequence 31 into the memory module 20 and the even parity generator 30. As for the generator 30, the relation set by the even-numbered isotope inspection agreement is input up to one even-numbered isotope input value (Input even parity) 32 generated in the input data confluence sequence (Data bus) 31 and the memory module 20. Based on what I did. At the same time, the system 10 also receives the address bus 11 and the read / write control signal (R / W control).
signal) 12 is input to the memory module 20 to control the data for writing a specific address in the memory module 20.

In addition, referring to FIG. 3, the memory module 20 of the new type memory body inspection device of the present invention is shown.
The modular unit 20 is mainly composed of one data element set memory body 21 and one new type memory body tester 50. Among them, the material source set memory body 21 is mainly used for storing material, so that it serves for R / W of the system. Its capacity depends on the dimensions of the computer system and the size of the memory body. The data source set memory body 21 receives the material merge / disconnect train 11 input from the system to the memory module 20 and simultaneously receives the address merge / disconnect train 11 and the R / W control signal 12 input from the system to the memory module 20. To do. As for the material of the material merging / discharging column 11, the address designated by the system is written in the memory body 21 or read out from the memory body 21.

At this time, the new-type memory body inspector 50 has the data 31 written in the memory body 21 from the system.
Or, in addition to the material 41 read from the memory body 21, the even isotope 32 generated by the even isotope generator 30, and the R / W control signal 12 input from the system 10, are received, and the new type memory body is acquired. Through the processing of the inspector 50, one even isotope output value 42 is generated.

Further, referring to FIG. 4, it is a diagram showing the line structure of the new-type memory body inspecting device of the present invention, in which the new-type memory body inspecting device 50 is mainly one even-isotope inspecting device 51. , One of the original storage (Bit storage) 52
And one isotope generator 53. Once the system writes the material into the inspector 50, the even isotope inspector 51 captures the material confluence sequence 31 input from the system 10 and the even isotope value 32 generated from the even isotope generator 30. And the received R / W control signal 12
Under the control of the inspection agreement 51, the relationship between the material confluence / arrangement 31 and the even-numbered isotope value 32 is inspected under the conditions of the inspection agreement, and the once-written material 31 and the element value 32 are entered.
When the even-numbered isotope relationship set in the agreement does not match, a unit value that does not match the agreement and represents a material error is generated, and it is sent to the source saver 52. The source storage 52 simultaneously receives the R / W control signal 12 transmitted from the system, and thereby controls the writing operation of the source value that does not match the agreement.

When the computer system 10 reads the data from the memory module 20, the original storage 52 receives the stored data under the control of the R / W control signal 12 transmitted from the system. The original value is output to the isotope generator 53, and at the same time, the original value representative of the material error stored in the storage 52 is cleared. The generator 53 is a memory module 2 at the same time.
The material 41 sent from the material position set memory body 21 of 0 is received, and the generator 53 is controlled by the control of the R / W control signal 12 to generate one isotope signal 42 by the generation of the inspection agreement. Output. However, if you are a reservoir 5
If the element value stored in 2 is representative of the element value of the material error, its generator 53 first generates an element signal 42 which does not match one agreement. The signal 42 and the data merging / discharging sequence 41 output from the memory module 20 are simultaneously output to the even isotope tester 40 of the system, and then the isotope tester 40 is used, depending on the conditions of the test agreement.
The isotope generator 5 from the new type memory inspection device 50
3 The miss signal generated is detected, and after detecting the mistake, one interruption signal 43 is issued to the system 10, and the data to be read by the system 10 in advance has a mistake at a certain address. To notify.

[0022]

The effects of the present invention can be summarized as follows.
In the application, when the system read the data, it checks the device of the input data mistake, and the tester is only 1
Since it only uses the space of the memory body of the source,
Therefore, the waste of the memory body in the traditional memory body modular 20 can be significantly reduced, and the manufacturing cost can be effectively saved. In addition, the memory body inspecting device 50 of the present invention, when the material is read from the memory body 20 in the system, immediately displays an incorrect state of the material at any one address in the material source set memory body 21. Since it reacts to the possibility of occurring, it further improves the efficiency and the ability to process the data in the memory body effectively.

The above is only one specific embodiment of the present invention, and a person skilled in the art can make changes in the equal effect such as the element or connection of the present invention or the name thereof, for example, an even number Even when the original inspection agreement is changed to adopt the odd number equality inspection agreement, etc., it belongs to what the people in the line of business feel free to think of, and does not depart from the scope of the claims and protection of the present invention.

[Brief description of drawings]

FIG. 1 is a diagram showing a combined layout relationship between a general computer and its memory module.

FIG. 2 is a view showing a line frame structure of a traditional memory modular unit that is generally used.

FIG. 3 is a view showing a case where a line frame of a memory module of an embodiment of the present invention is used.

FIG. 4 is a diagram showing a line frame according to an embodiment of the present invention.

[Explanation of symbols]

 10 system 11 address merge sequence 12 R / W control signal 20 memory modular 21 data source set memory 30 even isotope generator 31 data merge sequence 32 even isotope input value 40 isotope inspector 41 data 42 isotope output Value 50 New-type memory device tester 51 Isotope tester 52 Rank source storage device 53 Isotope generator

Claims (1)

[Claims] 1. Comprised of one isotope assessor, one or a few element reservoirs and one isotope generator, wherein the isotope assessor is generated by a computer isotope generator. When the two input signals and the data entered by the system are merged and arranged, and the two signal signals that have undergone the inspection agreement do not meet the relationship set by the agreement, they are controlled by the read / write control signal to Generate a representative value that does not match the unit value of the setting relationship of the assessment agreement, and output the unit value to the source reservoir, which is the source of the peer assessor. The original value is received, the read / write control signal transmitted from the system is received, and the relative value is read from the isotope assessor to the reservoir or to the isotope generator from the reservoir. And at the same time its elemental value in the reservoir Cleared, the isotope source value is controlled by the read / write control signal transmitted from the system, and the source value read from the source reservoir and the data confluent sequence read from the memory model set are read. By receiving, by the relation set by the assessment agreement, one unit value is generated and output to reach the system isotope assessor, and the relation set by the system isotope assessor and the assessment agreement is set. The memory inspection device is characterized by inspecting the error state of the material read from the memory model set, generating one interruption signal and outputting it to the system.