JPH0731496Y2 - Ｉｃｐ質量分析装置 - Google Patents
Ｉｃｐ質量分析装置Info
- Publication number
- JPH0731496Y2 JPH0731496Y2 JP1988144615U JP14461588U JPH0731496Y2 JP H0731496 Y2 JPH0731496 Y2 JP H0731496Y2 JP 1988144615 U JP1988144615 U JP 1988144615U JP 14461588 U JP14461588 U JP 14461588U JP H0731496 Y2 JPH0731496 Y2 JP H0731496Y2
- Authority
- JP
- Japan
- Prior art keywords
- mass
- ions
- output
- mass spectrometer
- channeltron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 150000002500 ions Chemical class 0.000 claims description 21
- 238000005259 measurement Methods 0.000 claims description 19
- 230000010354 integration Effects 0.000 claims description 5
- 238000005070 sampling Methods 0.000 claims description 5
- 238000004458 analytical method Methods 0.000 claims description 2
- 238000009616 inductively coupled plasma Methods 0.000 description 13
- 238000010586 diagram Methods 0.000 description 4
- 230000006866 deterioration Effects 0.000 description 2
- 238000001819 mass spectrum Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000004949 mass spectrometry Methods 0.000 description 1
Landscapes
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988144615U JPH0731496Y2 (ja) | 1988-11-05 | 1988-11-05 | Ｉｃｐ質量分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988144615U JPH0731496Y2 (ja) | 1988-11-05 | 1988-11-05 | Ｉｃｐ質量分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0264155U JPH0264155U (fr) | 1990-05-14 |
| JPH0731496Y2 true JPH0731496Y2 (ja) | 1995-07-19 |
Family
ID=31412477
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988144615U Expired - Lifetime JPH0731496Y2 (ja) | 1988-11-05 | 1988-11-05 | Ｉｃｐ質量分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0731496Y2 (fr) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3430984A1 (de) * | 1984-08-23 | 1986-03-06 | Leybold-Heraeus GmbH, 5000 Köln | Verfahren und vorrichtung zur registrierung von teilchen oder quanten mit hilfe eines detektors |
-
1988
- 1988-11-05 JP JP1988144615U patent/JPH0731496Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0264155U (fr) | 1990-05-14 |
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