JPH0733150Y2 - 環境試験装置 - Google Patents
環境試験装置Info
- Publication number
- JPH0733150Y2 JPH0733150Y2 JP1989008686U JP868689U JPH0733150Y2 JP H0733150 Y2 JPH0733150 Y2 JP H0733150Y2 JP 1989008686 U JP1989008686 U JP 1989008686U JP 868689 U JP868689 U JP 868689U JP H0733150 Y2 JPH0733150 Y2 JP H0733150Y2
- Authority
- JP
- Japan
- Prior art keywords
- packing
- door
- linear object
- sample
- closed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989008686U JPH0733150Y2 (ja) | 1989-01-27 | 1989-01-27 | 環境試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989008686U JPH0733150Y2 (ja) | 1989-01-27 | 1989-01-27 | 環境試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02101251U JPH02101251U (da) | 1990-08-13 |
| JPH0733150Y2 true JPH0733150Y2 (ja) | 1995-07-31 |
Family
ID=31214786
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1989008686U Expired - Lifetime JPH0733150Y2 (ja) | 1989-01-27 | 1989-01-27 | 環境試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0733150Y2 (da) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2565136Y2 (ja) * | 1993-09-03 | 1998-03-11 | タバイエスペック株式会社 | 開口を備えた扉付き環境試験装置 |
| JP3580637B2 (ja) * | 1996-05-29 | 2004-10-27 | 東光電気株式会社 | 配電用密閉機器の耐候性試験装置 |
| US7629533B2 (en) | 2006-03-20 | 2009-12-08 | Temptronic Corporation | Temperature-controlled enclosures and temperature control system using the same |
| JP5509169B2 (ja) * | 2011-09-27 | 2014-06-04 | エスペック株式会社 | 環境試験装置 |
| JP5909461B2 (ja) * | 2013-05-16 | 2016-04-26 | エスペック株式会社 | 高温環境形成装置 |
| JP2014232078A (ja) * | 2013-05-30 | 2014-12-11 | エスペック株式会社 | 環境試験装置及びパッキン |
| JP5906225B2 (ja) * | 2013-09-30 | 2016-04-20 | エスペック株式会社 | 環境試験装置 |
| CN116413601B (zh) * | 2023-04-06 | 2026-03-10 | 浙江祺跃科技有限公司 | 电化学发生装置及仪器 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60253884A (ja) * | 1984-05-30 | 1985-12-14 | Mitsubishi Electric Corp | 恒温装置 |
-
1989
- 1989-01-27 JP JP1989008686U patent/JPH0733150Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02101251U (da) | 1990-08-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |