JPH0746347Y2 - Chemical processing equipment - Google Patents
Chemical processing equipmentInfo
- Publication number
- JPH0746347Y2 JPH0746347Y2 JP11190387U JP11190387U JPH0746347Y2 JP H0746347 Y2 JPH0746347 Y2 JP H0746347Y2 JP 11190387 U JP11190387 U JP 11190387U JP 11190387 U JP11190387 U JP 11190387U JP H0746347 Y2 JPH0746347 Y2 JP H0746347Y2
- Authority
- JP
- Japan
- Prior art keywords
- tank
- chemical
- processing
- flow rate
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Weting (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Feeding, Discharge, Calcimining, Fusing, And Gas-Generation Devices (AREA)
Description
【考案の詳細な説明】 本考案は薬品処理装置に係り、さらに詳しく述べるなら
ば半導体製造工程のウエハプロセスにおいて洗浄、エッ
チング、レジスト除去等のウエハ用薬品処理槽の薬品の
微少量制御を容易にした薬品処理装置に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a chemical treatment apparatus, and more specifically, it facilitates the control of minute amounts of chemicals in a chemical treatment tank for wafers such as cleaning, etching and resist removal in a wafer process of a semiconductor manufacturing process. The present invention relates to a chemical processing device.
半導体装置の製造工程の中でシリコンを用いた半導体ウ
エハプロセスにおいてウエハ表面に付着したゴミ等の異
物を酸、アルカリ、有機溶剤等を用いて洗浄したり酸を
用いて絶縁層又はシリコン膜をエッチングしたり又該エ
ッチングの際に使用されたレジスト膜を除去する場合第
1図に示すような装置が用いられている。例えば薬品供
給タンク1内にウエハ洗浄のためのトリクレン1aを適当
量入れておき処理槽5にもトリクレン5aを入れる。次に
該トリクレン5a内に25枚の4インチのシリコンウエハを
浸漬する。該ウエハはキャリヤーによって支持せしめら
れる。一定時間ウエハがトリクレン5a内に浸漬され洗浄
を終えると次の25枚のウエハを同様にトリクレン5a内に
浸漬し洗浄を行なう。このようにして継続してウエハが
洗浄されてゆくにつれて、洗浄されたウエハ表面への付
着、蒸発等により処理槽5内のトリクレン5aが消耗す
る。この消耗した量を補なうため薬品供給タンク1と処
理槽5との間に配設されたエア弁3を手動によって開放
し供給配管を経由して薬品供給タンク1内の薬品が処理
槽5内へ供給される。しかしながらこの従来の装置では
消耗した処理液を処理槽内の薬品の量を微調整すること
が困難であった。During the semiconductor device manufacturing process, in a semiconductor wafer process using silicon, foreign substances such as dust adhering to the wafer surface are cleaned with acid, alkali, organic solvent, etc. or the insulating layer or silicon film is etched with acid. In order to remove the resist film used during the etching, an apparatus as shown in FIG. 1 is used. For example, an appropriate amount of trichlene 1a for wafer cleaning is placed in the chemical supply tank 1 and the trichlene 5a is also placed in the processing tank 5. Next, 25 4-inch silicon wafers are immersed in the trichlene 5a. The wafer is supported by a carrier. When the wafer is immersed in the trichlene 5a for a certain time and the cleaning is completed, the next 25 wafers are similarly immersed in the trichlene 5a to perform the cleaning. As the wafer is continuously cleaned in this way, the trichlene 5a in the processing tank 5 is consumed due to adhesion to the surface of the cleaned wafer, evaporation and the like. In order to make up for this consumed amount, the air valve 3 arranged between the chemical supply tank 1 and the processing tank 5 is manually opened, and the chemical in the chemical supply tank 1 is transferred to the processing tank 5 via the supply pipe. Is supplied in. However, with this conventional apparatus, it was difficult to finely adjust the amount of chemicals in the processing tank for the consumed processing liquid.
そこで本考案は上記問題点を改善し、多量の処理液の初
期供給とそれ以降の微少量の処理液の供給を容易に行な
い得る薬品処理装置を提供することを目的とする。SUMMARY OF THE INVENTION It is therefore an object of the present invention to improve the above-mentioned problems, and to provide a chemical treatment apparatus capable of easily supplying an initial supply of a large amount of processing liquid and thereafter supplying a very small amount of processing liquid.
上記本考案の目的は薬液を供給するメインタンクと該メ
インタンクから供給された薬液を一定量貯える薬品供給
タンクと、該薬品供給タンクから供給された薬液を貯
え、ウエハを処理するウエハ処理槽とを有し、該薬品供
給タンクとウエハ処理槽との間に前記処理槽への薬品供
給のための配管を大流量と小流量の2系統配設すること
により前記処理槽の薬品の消耗に対して微少量の薬品を
前記タンクから処理槽へ供給して、該処理槽内の薬品の
液量を一定に維持することを特徴とする薬品処理装置に
よって達成される。The object of the present invention is to provide a main tank for supplying a chemical solution, a chemical supply tank for storing a certain amount of the chemical solution supplied from the main tank, and a wafer processing tank for storing the chemical solution supplied from the chemical supply tank and processing a wafer. And a pipe for supplying a chemical to the processing tank is provided between the chemical supply tank and the wafer processing tank in two systems, a large flow rate and a small flow rate, against the consumption of the chemical in the processing tank. And a minute amount of the chemical is supplied from the tank to the processing tank to maintain a constant amount of the chemical in the processing tank.
以下本考案を実施例に基いて詳細に説明する。Hereinafter, the present invention will be described in detail based on embodiments.
第2図及び第3図は本考案に係る実施例を示す概略説明
図である。2 and 3 are schematic explanatory views showing an embodiment according to the present invention.
第2図によれば薬品供給用タンク1には処理槽5の必要
量の薬品例えばトリクレン1aが常に貯えられており処理
槽5が空の状態の時に大流量系側のエア弁3を開放して
配管2a及び4を介して薬品供給用タンク1内のトリクレ
ン1aを全て処理槽5に供給し終えた後にエア弁を閉じ
る。その後再びタンク1のにはメインタンク8から供給
管9を介して必要量のトリクレンが貯えられる。以後い
わゆる半導体ウエハプロセスにより、トリクレン(処理
液)5aの自然蒸発ウエハ表面への付着等の消耗により処
理槽5内のトリクレン5aの液面が低下する。この小流量
系のエア弁6を定期的に、例えば4インチの半導体ウエ
ハ25枚の1セットの処理時間6分間毎に、一定時間、例
えば10秒間開放することにより処理槽内5のトリクレン
5aの量を配管2bを介して補なう。流量はニードルバルブ
7により調節しニードルバルブ7とエア弁6を開く間隔
及び開いておく時間を最適な状態に設定することにより
処理槽7の液面を常に一定に維持することが可能とな
る。According to FIG. 2, the chemical supply tank 1 always stores a necessary amount of chemicals such as trichlene 1a in the treatment tank 5, and when the treatment tank 5 is empty, the air valve 3 on the large flow rate system side is opened. After the trichlene 1a in the chemical supply tank 1 is completely supplied to the processing tank 5 through the pipes 2a and 4, the air valve is closed. Thereafter, the required amount of trichlene is again stored in the tank 1 from the main tank 8 via the supply pipe 9. After that, by a so-called semiconductor wafer process, the liquid level of trichlene 5a in the processing tank 5 is lowered due to consumption such as adhesion of trichlene (processing liquid) 5a to the surface of the naturally evaporated wafer. The air valve 6 of this small flow rate system is periodically opened, for example, every 6 minutes for one set of 25 semiconductor wafers of 4 inches for a fixed time, for example, 10 seconds to open the trichlene in the processing tank 5.
The amount of 5a is supplemented via the pipe 2b. By adjusting the flow rate by the needle valve 7 and setting the interval between the needle valve 7 and the air valve 6 to be opened and the time for which the air valve 6 is opened to an optimum state, the liquid level in the processing tank 7 can be always kept constant.
第3図は本考案の他の実施例を示すものであり第2図と
ほゞ同じであるが、第2図と異なるのは微少量供給配管
のニードルバルブ7aがモーター7bを有しており、該ニー
ドルバルブ7aがモーター駆動型であること、処理槽5内
のトリクレン5aの液面に液面レベルセンサー11を有して
いること、センサー信号を入力しモーターに駆動信号を
与えるコントローラー10が具備されている点である。該
実施例ではトリクレン5aの液面の変化に応じて自動的に
供給せしめられる。この場合も大流量供給側のエア弁3
を開放することにより配管2aを介して初期供給がなさ
れ、一方小流量供給側のエア弁6及びニードルバルブ7a
の適当な調節により微量供給が配管2bを介してなされ
る。特に本実施例では液面レベルセンサー11及びセンサ
ー信号を入力しモーターに駆動信号を与えるコントロー
ラー10の具備により液面の変化に応じて、小流量供給側
の流量が可変して供給される。従って、液面の変動が非
周期的な場合や、液の消耗量が大きく、且つ常にある一
定の量の薬品を供給する必要がある場合に特に効果があ
る。FIG. 3 shows another embodiment of the present invention and is almost the same as FIG. 2, except that the needle valve 7a of the minute amount supply pipe has a motor 7b. The needle valve 7a is of a motor drive type, the liquid level sensor 11 is provided on the liquid surface of the trichlene 5a in the processing tank 5, and the controller 10 for inputting the sensor signal and providing the drive signal to the motor is It is a point that is equipped. In this embodiment, the trichlene 5a is automatically supplied according to the change in the liquid level. Also in this case, the air valve 3 on the large flow rate supply side
The initial supply is performed by opening the pipe 2a, while the air valve 6 and the needle valve 7a on the small flow rate supply side are provided.
A minute amount is supplied through the pipe 2b by appropriate adjustment of. Particularly, in this embodiment, the liquid level sensor 11 and the controller 10 for inputting the sensor signal and supplying the drive signal to the motor are provided so that the flow rate on the small flow rate supply side is changed and supplied according to the change of the liquid level. Therefore, it is particularly effective when the fluctuation of the liquid surface is aperiodic, or when the amount of consumption of the liquid is large and it is necessary to constantly supply a certain amount of chemical.
又実施例で使用している薬品はトリクレンであるが半導
体プロセスの目的により種々の薬品が使用出来るのは勿
論である。薬品の種類、温度、使用頻度、処理槽の容積
に応じて、ニードルバルブ7による流量及びエア弁6を
開く間隔、時間を設定することにより、いかなる薬品、
及び処理槽にも適応できる。Although the chemical used in the examples is trichlene, it goes without saying that various chemicals can be used depending on the purpose of the semiconductor process. By setting the flow rate by the needle valve 7 and the interval and time for opening the air valve 6 according to the type of chemical, temperature, frequency of use, volume of processing tank, any chemical,
It can also be applied to processing tanks.
以上の説明により本考案は処理槽への薬品供給のための
配管を大流量と小流量具備することによって初期状態に
おいては短時間で処理槽を薬品で満たし、処理中におい
ては微少量の薬品供給を容易に行うことができるので作
業の能率の向上を図ることが可能である。As described above, the present invention fills the processing tank with the chemicals in a short time in the initial state by providing the large flow rate and the small flow rate piping for supplying the chemicals to the processing vessel, and supplies the minute amount of the chemicals during the processing. It is possible to improve the work efficiency because it can be performed easily.
第1図は従来の実施例を示す説明図であり、第2図、第
3図は本考案の実施例を示す説明図である。 1…薬品供給タンク、1a…トリクレン、2,2a,2b…配
管、3′…エア弁、3…大流量供給側エア弁、4…配
管、5…処理槽、5a…トリクレン、6…小流量供給側エ
ア弁、7,7a…ニードルバルブ、7b…モーター、8…メイ
ンタンク、9…配管、10…コントローラー。FIG. 1 is an explanatory view showing a conventional embodiment, and FIGS. 2 and 3 are explanatory views showing an embodiment of the present invention. 1 ... chemical supply tank, 1a ... trichlene, 2, 2a, 2b ... piping, 3 '... air valve, 3 ... large flow rate supply side air valve, 4 ... piping, 5 ... treatment tank, 5a ... trichlene, 6 ... small flow rate Supply side air valve, 7, 7a ... Needle valve, 7b ... Motor, 8 ... Main tank, 9 ... Piping, 10 ... Controller.
───────────────────────────────────────────────────── フロントページの続き (72)考案者 藤井 幹雄 神奈川県川崎市中原区上小田中1015番地 富士通株式会社内 (72)考案者 宮地 秀樹 神奈川県川崎市中原区上小田中1015番地 富士通株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Mikio Fujii 1015 Kamiodanaka, Nakahara-ku, Kawasaki City, Kanagawa Prefecture, Fujitsu Limited (72) Inventor, Hideki Miyaji, 1015, Kamiodanaka, Nakahara-ku, Kawasaki City, Kanagawa Prefecture, Fujitsu Limited
Claims (1)
ンクから供給された薬液を一定量貯える薬品供給タンク
と、該薬品供給タンクから供給された薬液を貯え、ウエ
ハを処理するウエハ処理槽とを有し、該薬品供給タンク
とウエハ処理槽との間に前記処理槽への薬品供給のため
の配管を大流量と小流量の2系統配設することにより前
記処理槽の薬品の消耗に対して微少量の薬品を前記タン
クから処理槽へ供給して、該処理槽内の薬品の液量を一
定に維持することを特徴とする薬品処理装置。1. A main tank for supplying a chemical solution, a chemical supply tank for storing a fixed amount of the chemical solution supplied from the main tank, and a wafer processing tank for storing the chemical solution supplied from the chemical supply tank and processing a wafer. By disposing two pipes for supplying chemicals to the processing tank between the chemical supply tank and the wafer processing tank, one having a large flow rate and the other having a small flow rate. A chemical treatment apparatus, characterized in that a very small amount of chemical is supplied from the tank to the treatment tank to maintain a constant amount of the chemical in the treatment tank.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11190387U JPH0746347Y2 (en) | 1987-07-23 | 1987-07-23 | Chemical processing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11190387U JPH0746347Y2 (en) | 1987-07-23 | 1987-07-23 | Chemical processing equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6351638U JPS6351638U (en) | 1988-04-07 |
| JPH0746347Y2 true JPH0746347Y2 (en) | 1995-10-25 |
Family
ID=30992271
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11190387U Expired - Lifetime JPH0746347Y2 (en) | 1987-07-23 | 1987-07-23 | Chemical processing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0746347Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20120049119A (en) * | 2010-11-04 | 2012-05-16 | 도쿄엘렉트론가부시키가이샤 | Apparatus and method for controlling flow rate of liquid, and storage medium |
-
1987
- 1987-07-23 JP JP11190387U patent/JPH0746347Y2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20120049119A (en) * | 2010-11-04 | 2012-05-16 | 도쿄엘렉트론가부시키가이샤 | Apparatus and method for controlling flow rate of liquid, and storage medium |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6351638U (en) | 1988-04-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6145519A (en) | Semiconductor workpiece cleaning method and apparatus | |
| US7997288B2 (en) | Single phase proximity head having a controlled meniscus for treating a substrate | |
| US6004399A (en) | Ultra-low particle semiconductor cleaner for removal of particle contamination and residues from surface oxide formation on semiconductor wafers | |
| US20080073030A1 (en) | Apparatus for manufacturing semiconductor device | |
| JPH08108125A (en) | Liquid supply device | |
| JP3211872B2 (en) | Chemical solution treatment method, semiconductor substrate treatment method, and semiconductor device manufacturing method | |
| US6376390B1 (en) | Methods and apparatuses for removing material from discrete areas on a semiconductor wafer | |
| JPH0746347Y2 (en) | Chemical processing equipment | |
| JPH0341729A (en) | Substrate cleaning | |
| JPH0231785Y2 (en) | ||
| US6497238B1 (en) | Method of manufacturing electronic devices and apparatus for carrying out such a method | |
| JPH03107477A (en) | Method and device for wet-treating semiconductor material | |
| JPH10335231A (en) | Liquid processing equipment | |
| JPH03228328A (en) | Water washing method of semiconductor substrate | |
| US5937878A (en) | Apparatus for removing particles from a wafer and for cleaning the wafer | |
| JPH07283194A (en) | Cleaning / drying method and cleaning device | |
| JPH0263289B2 (en) | ||
| JPS5851972A (en) | Apparatus for treatment with chemical agent | |
| KR100210965B1 (en) | A supplying method and apparatus for fluid used treatment of substrate | |
| JPS63174324A (en) | Chemical processing method for semiconductor wafers | |
| JP3459719B2 (en) | Silicon wafer processing equipment | |
| JPH01244622A (en) | Silicon substrate processor | |
| JPH0294435A (en) | Etching apparatus | |
| US20240404845A1 (en) | Substrate processing apparatus and substrate processing method | |
| JPH0144012B2 (en) |